Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B3/00—Line transmission systems
  • H04B3/02—Details
  • H04B3/46—Monitoring; Testing
  • H04B3/462—Testing group delay or phase shift, e.g. timing jitter
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
  • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
  • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R31/26—Testing of individual semiconductor devices
  • G01R31/2607—Circuits therefor
  • G01R31/2637—Circuits therefor for testing other individual devices
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
  • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

• Engineering & Computer Science (AREA)
• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Power Engineering (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Condensed Matter Physics & Semiconductors (AREA)
• Signal Processing (AREA)
• Computer Networks & Wireless Communication (AREA)
• Computer Hardware Design (AREA)
• Ceramic Engineering (AREA)
• Manufacturing & Machinery (AREA)
• Testing Or Measuring Of Semiconductors Or The Like (AREA)
• Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Priority Applications (1)

Applications Claiming Priority (2)

Publications (1)

Family

ID=25751478

Family Applications (1)

Country Status (2)

Family Cites Families (1)

• 1965
  • 1965-03-22 DE DEP1271A patent/DE1271840B/de active Pending
• 1966
  • 1966-03-22 JP JP1759766A patent/JPS4322721B1/ja active Pending

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