JPH1186281A - Magnetic recording medium and manufacture thereof - Google Patents

Magnetic recording medium and manufacture thereof

Info

Publication number
JPH1186281A
JPH1186281A JP24500297A JP24500297A JPH1186281A JP H1186281 A JPH1186281 A JP H1186281A JP 24500297 A JP24500297 A JP 24500297A JP 24500297 A JP24500297 A JP 24500297A JP H1186281 A JPH1186281 A JP H1186281A
Authority
JP
Japan
Prior art keywords
substrate
magnetic
film
recording medium
magnetic recording
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24500297A
Other languages
Japanese (ja)
Inventor
Tomoyoshi Aida
倫佳 合田
Fuminobu Maruyama
文信 丸山
Akira Kato
章 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP24500297A priority Critical patent/JPH1186281A/en
Publication of JPH1186281A publication Critical patent/JPH1186281A/en
Pending legal-status Critical Current

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  • Magnetic Record Carriers (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable using of a highly reliable glass substrate with a lower floating which uses an inexpensive electron beam generator to set the diameter of irradiation above a specified micron unit during the irradiation. SOLUTION: A Cr layer is accumulated by 50 nm on a base body made of soda lime by sputtering in an Ar atmosphere at a vacuum pressure of 1×10<-3> Torr to use a substrate 1 for a magnetic disc. Then, it is irradiated with an electron beam for 60 sec. under conditions of a vacuum pressure of 1×10<-3> Torr, acceleration voltage of 10 kV and a beam diameter of 1 micron. A spindle-shaped protrusion with the diameter of 1 micron at a point 2 nm below the topmost point thereof is formed on the surface of the substrate 1 at a height of 100 nm. A ground film 2 for controlling a magnetic film, a magnetic film 3 comprising a main component element Co, a protective film 4 and a perfluoropolyester based lubricating film 5 are formed to obtain a magnetic recording medium 10.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は磁気記録用媒体に関
し、特に高信頼性を有しかつ低浮上を可能とする磁気記
録媒体に関する。さらに、ガラス、セラミックス等の非
磁性基板を有する磁気記録媒体において安価に精度の良
い方法により基板上に突起を形成する方法を提供する。
The present invention relates to a magnetic recording medium, and more particularly, to a magnetic recording medium having high reliability and low flying height. Further, the present invention provides a method for forming projections on a magnetic recording medium having a non-magnetic substrate such as glass or ceramics at low cost and with high accuracy.

【0002】[0002]

【従来の技術】従来、磁気ディスク媒体とヘッドとの吸
着防止あるいは磁気ディスク媒体の磁気的な特性を向上
させるを目的として、磁気ディスク媒体を構成する非磁
性基板の表面を機械加工してテクスチャと呼ばれる凹凸
形状を形成することが一般的である。
2. Description of the Related Art Conventionally, a surface of a non-magnetic substrate constituting a magnetic disk medium is machined to obtain a texture and a magnetic disk medium for the purpose of preventing attraction between the magnetic disk medium and a head or improving magnetic characteristics of the magnetic disk medium. It is general to form a so-called uneven shape.

【0003】また、1991年4月15日付けジャーナ
ル オブ アプライド フィジックス(Journal
of Applyed Physics:Vol.6
9.No.8.5745ページ〜5747ページ)に記
載されているようにレーザーを用いて非磁性基板に突起
を形成する方法も実現されている。
[0003] Also, Journal of Applied Physics (Journal of April 15, 1991)
of Applied Physics: Vol. 6
9. No. (Pages 8.5745 to 5747), a method of forming projections on a non-magnetic substrate using a laser has also been realized.

【0004】ところが、基板が金属で構成される場合は
上記の基板表面の加工は可能であるが、近年使用されつ
つある強化ガラスを基板として用いた場合は機械加工も
レーザーを用いた加工も不可能である。
[0004] However, when the substrate is made of metal, the above-mentioned processing of the substrate surface is possible. However, when tempered glass, which has been used recently, is used as the substrate, neither mechanical processing nor processing using a laser is impossible. It is possible.

【0005】そこで、特開平8−102033に記載さ
れているように、ガラス基板上に機械加工を用いずに真
空中で所定の膜を形成することにより突起を形成する方
法を用いている例がある。また、特開平7−16103
2に記載されているように、保護膜に粒子を塗布する方
法も提案されている。また、少数の突起を有する突起検
出用ヘッド校正用円板において、特開平6−20268
に記載されているように、フォトリソグラフィの技術を
用いて任意の形状のマスクを形成し、このマスクを用い
て突起を形成する方法も提案されている。
Therefore, as described in Japanese Patent Application Laid-Open No. H8-102033, there is an example in which a method of forming projections by forming a predetermined film in a vacuum on a glass substrate without using mechanical processing is used. is there. In addition, Japanese Patent Application Laid-Open No. 7-16103
As described in No. 2, a method of applying particles to a protective film has also been proposed. Also, in a projection detecting head calibration disk having a small number of projections, Japanese Patent Laid-Open No. 6-20268 is disclosed.
As described in Japanese Patent Application Laid-Open No. H11-260, there has been proposed a method of forming a mask having an arbitrary shape by using a photolithography technique and forming a projection using the mask.

【0006】[0006]

【発明が解決しようとする課題】いずれの場合において
も高信頼性と低浮上の両者を兼ね備えたガラス基板を用
いた磁気記録媒体を製造することは、価格が現状に比べ
大幅に上がるため、更にはその形成技術が高度の形成技
術を必要とするために、廉価な磁気記録媒体を提供する
ことは困難である。特に磁気記録媒体の面の一部のみに
突起を付加する際には高度な技術を要する。
In any case, manufacturing a magnetic recording medium using a glass substrate having both high reliability and low flying height requires a great increase in price compared to the current state. However, it is difficult to provide an inexpensive magnetic recording medium because its forming technology requires a high forming technology. In particular, when a projection is added to only a part of the surface of the magnetic recording medium, a high technology is required.

【0007】また、少数の突起を有する突起検出用ヘッ
ド校正用円板においては、突起形成のためにのみマスク
を設計していた。また必要形状が変わる場合にはマスク
を再度設計し直す必要があった。また、その大きさに制
限があり1ミクロン以下の径の突起を形成することは困
難であった。
Further, in a disk for calibrating a head for detecting a protrusion having a small number of protrusions, a mask is designed only for forming the protrusion. If the required shape changes, it is necessary to redesign the mask. Further, the size is limited, and it is difficult to form a projection having a diameter of 1 micron or less.

【0008】[0008]

【課題を解決するための手段】そこで本発明では、電子
線を用いて基板表面に突起を形成することにより、上記
問題点を容易に回避する。本発明において用いられる電
子線は廉価な電子線発生装置を用いて照射時の照射径を
0.1ミクロン以上に任意に設定できる。また、照射時
の加速電圧を任意に設定できることにより、設定条件を
選ぶことにより所望の大きさ、高さを持った突起を形成
することができる。
Therefore, in the present invention, the above problem is easily avoided by forming a projection on the substrate surface using an electron beam. The irradiation diameter of the electron beam used in the present invention can be arbitrarily set to 0.1 μm or more using an inexpensive electron beam generator. In addition, since the acceleration voltage at the time of irradiation can be arbitrarily set, a projection having a desired size and height can be formed by selecting a setting condition.

【0009】また、照射対象となる材料は電子線を使用
することにより自由に選択することができ、いかなる基
板材料に対しても極薄膜の金属層若しくは非金属層を介
して容易に突起を形成することができる。また、基板だ
けでなく媒体構成層のいかなる層に対しても膜堆積後に
突起を形成することができるため、突起の必要な層に突
起を形成することができる。
The material to be irradiated can be freely selected by using an electron beam, and a projection can be easily formed on any substrate material via an extremely thin metal layer or non-metal layer. can do. In addition, since protrusions can be formed after film deposition not only on the substrate but also on any layer of the medium constituting layer, the protrusions can be formed on layers that require protrusions.

【0010】さらには、磁気記録媒体ばかりではなく突
起検出のためのヘッドの浮上量校正用円板においても微
細な径で、必要高さの突起を精度良く任意の位置に形成
できる。また同品質の円板を容易に製造できるため、突
起再現性の良い突起を持った円板を複数用意することが
できる。
Further, not only the magnetic recording medium but also the disk for calibrating the flying height of the head for detecting the protrusion can be formed with a fine diameter and the required height at an arbitrary position with high precision. In addition, since disks of the same quality can be easily manufactured, a plurality of disks having projections with good projection reproducibility can be prepared.

【0011】[0011]

【発明の実施の形態】以下、本発明を詳細に説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail.

【0012】図1は本発明の一実施例である磁気記録媒
体を示す図である。ソーダライムを材料とする直径65
mm、板厚0.635mm、平均中心線粗さRa0.8
nmのガラス板よりなる基体に化学強化を施し洗浄を行
った。この基体上に、真空圧1×10−3TorrのA
r雰囲気にてスパッタリングによりCr層を50nm堆
積して磁気ディスク用基板1として用いた。
FIG. 1 is a diagram showing a magnetic recording medium according to an embodiment of the present invention. Diameter 65 made of soda lime
mm, plate thickness 0.635 mm, average center line roughness Ra 0.8
A substrate made of a glass plate having a thickness of nm was chemically strengthened and washed. On this substrate, A at a vacuum pressure of 1 × 10 −3 Torr was applied.
A Cr layer was deposited to a thickness of 50 nm by sputtering in an r atmosphere and used as a magnetic disk substrate 1.

【0013】次に、真空圧1×10−3Torr、加速
電圧10kV、ビーム径1ミクロンの条件で60秒間電
子線を照射した。このとき図3に示すように、基板1の
表面に高さ100nm、突起最頂点から2nm下がった
点での直径が1ミクロンの紡錘形の突起が形成された。
さらに、磁性膜を制御するための下地膜2、主たる成分
元素をCoからなる磁性膜3、保護膜4及びパーフロロ
ポリエーテル系潤滑膜5を順次形成し、磁気記録媒体1
0とした。
Next, an electron beam was irradiated for 60 seconds under the conditions of a vacuum pressure of 1 × 10 −3 Torr, an acceleration voltage of 10 kV, and a beam diameter of 1 μm. At this time, as shown in FIG. 3, spindle-shaped protrusions having a height of 100 nm and a diameter of 1 μm at a point 2 nm below the protrusion top were formed on the surface of the substrate 1.
Further, a base film 2 for controlling the magnetic film, a magnetic film 3 made of Co as a main component element, a protective film 4 and a perfluoropolyether-based lubricating film 5 are sequentially formed.
0 was set.

【0014】次に、電子線を照射する条件として、真空
圧、加速電圧、ビーム径を一定にして、時間を変化させ
て突起を形成し、各々の条件により形成された突起の高
さを測定した。この結果を図2に示す。電子線の照射時
間が長くなると突起高さは増加することがわかる。
Next, as the conditions for irradiating the electron beam, the projections are formed by changing the time while keeping the vacuum pressure, the acceleration voltage and the beam diameter constant, and the height of the projections formed under each condition is measured. did. The result is shown in FIG. It can be seen that the projection height increases as the irradiation time of the electron beam increases.

【0015】同様に、電子線を照射する条件として、ビ
ーム径、電子線照射時間を一定にして、加速電圧を変化
させて突起を形成し、各々の条件により形成された突起
の高さを測定した場合、加速電圧の増加とともに突起の
高さは増加した。また、電子線を照射する条件として、
加速電圧、照射時間を一定にして、ビーム径を変化させ
た場合には、ビーム径の増加とともに突起径は大きくな
り、その高さは減少した。
Similarly, as the conditions for irradiating the electron beam, the beam diameter and the electron beam irradiation time are kept constant, the acceleration voltage is changed to form the projection, and the height of the projection formed under each condition is measured. In this case, the height of the protrusion increased with an increase in the acceleration voltage. In addition, as conditions for irradiating the electron beam,
When the beam diameter was changed while keeping the acceleration voltage and the irradiation time constant, the diameter of the protrusion increased as the beam diameter increased, and the height decreased.

【0016】また、Cr膜を施した基板1に真空圧1×
10−3Torr、加速電圧30kV、ビーム径1ミク
ロンの条件で0.5秒間電子線を照射し、Cr膜上に高
さ15nmの突起11を形成した。ここで、突起密度1
000個/mm2になるように基板1を一定ピッチで断
続的に回転させながらピッチ間隔時間に同調させて電子
線を断続的に照射して突起11を形成した。この結果、
形が紡錘形であり、突起頂点より2nm下がった点での
直径が1ミクロン、突起の高さが原子間力顕微鏡(AF
M)にて測定した結果で平均15.2nm、標準偏差
0.23nmとなる均一な突起21を形成できた。
Further, a vacuum pressure of 1 × is applied to the substrate 1 provided with the Cr film.
An electron beam was irradiated for 0.5 seconds under the conditions of 10-3 Torr, an acceleration voltage of 30 kV, and a beam diameter of 1 micron to form a projection 11 having a height of 15 nm on the Cr film. Here, the protrusion density 1
The protrusions 11 were formed by intermittently irradiating an electron beam while synchronizing with the pitch interval time while intermittently rotating the substrate 1 at a constant pitch so as to obtain 000 / mm 2. As a result,
The shape is a spindle shape, the diameter at a point 2 nm below the apex of the protrusion is 1 micron, and the height of the protrusion is an atomic force microscope (AF).
As a result of the measurement in M), a uniform projection 21 having an average of 15.2 nm and a standard deviation of 0.23 nm could be formed.

【0017】さらにこの突起11を形成した基板1上に
磁性膜3としてCoCrTa膜を30nm、保護膜4と
して水素を10%添加したカーボンを15nmをスパッ
タリングにより順次形成した。そしてこの上に2nmの
潤滑膜5をパーフロロポリエーテル系潤滑膜を塗布する
ことにより形成し、磁気記録媒体とした。
Further, on the substrate 1 on which the projections 11 were formed, a CoCrTa film was formed as a magnetic film 3 to a thickness of 30 nm, and a protective film 4 was formed from a carbon to which 10% of hydrogen was added to a thickness of 15 nm by sputtering. Then, a 2 nm lubricating film 5 was formed thereon by applying a perfluoropolyether-based lubricating film to obtain a magnetic recording medium.

【0018】本磁気記録媒体のヘッド浮上特性を調査す
るために、アコースティック エミッション(AE)セ
ンサーを搭載した長さ2mm、幅1.7mmで浮上面に
レール加工が施された浮上型磁気ヘッドを突起検出用ヘ
ッドとして突起検出用テスターに設置し、突起検出条件
を突起高さ25nmを検出するように設定した。突起検
出時のヘッドの周速は一定とし、作製した磁気記録媒体
の測定位置での周速における浮上量の変化が影響の出な
いように設定した。本磁気記録媒体の突起検出を行った
ところ、突起検出ヘッド浮上量25nmで突起の検出は
なかった。
In order to investigate the head flying characteristics of the magnetic recording medium, a flying magnetic head having an acoustic emission (AE) sensor mounted thereon, having a length of 2 mm, a width of 1.7 mm, and a rail surface formed on a flying surface is projected. A projection detection tester was installed as a detection head, and the projection detection conditions were set to detect a projection height of 25 nm. The peripheral speed of the head at the time of detecting the protrusion was set to be constant so that the change in the flying height at the peripheral position at the measurement position of the manufactured magnetic recording medium was not affected. When the protrusion of the magnetic recording medium was detected, no protrusion was detected at a flying height of the protrusion detection head of 25 nm.

【0019】さらに本磁気記録媒体と磁気ヘッドとの吸
着特性を調査するために、長さ2mm、幅1.7mm浮
上型磁気ヘッドを本磁気記録媒体上に浮上させることに
より行った。このときの磁気ヘッドを支えるばね荷重は
3gfに設定した。この磁気ヘッドを用いて本磁気記録
媒体との吸着特性を測定したところ最大摩擦力で最大
1.2gf、平均的な動摩擦力は0.8gfであった。
一方、比較のために突起の形成されていない同一構成の
磁気記録媒体について最大摩擦力、動摩擦力を測定した
ところそれぞれ最大80gf、65gfであった。従っ
て、低浮上化しても磁気ヘッドとの耐摩耗性に優れ、吸
着力を低減できる高信頼性を有する磁気記録媒体を得る
ことができる。
Further, in order to investigate the attraction characteristics between the present magnetic recording medium and the magnetic head, a floating magnetic head having a length of 2 mm and a width of 1.7 mm was floated on the present magnetic recording medium. The spring load supporting the magnetic head at this time was set to 3 gf. Using this magnetic head, the attraction characteristics with the present magnetic recording medium were measured. The maximum frictional force was 1.2 gf at maximum, and the average dynamic frictional force was 0.8 gf.
On the other hand, for comparison, when the maximum frictional force and the dynamic frictional force were measured for magnetic recording media having the same configuration without protrusions, the maximum values were 80 gf and 65 gf, respectively. Therefore, it is possible to obtain a highly reliable magnetic recording medium which is excellent in abrasion resistance with the magnetic head even when the flying height is reduced, and which can reduce the attraction force.

【0020】次にソーダライムを材料とする直径65m
m、板厚0.635mm、平均中心線粗さRa0.8n
mのガラス板に化学強化を施し洗浄を行った磁気ディス
ク用ガラス基板上に、真空圧3×10−3TorrのA
r雰囲気にてスパッタリングによりCr膜を5nm堆積
した。
Next, a diameter of 65 m made of soda lime
m, plate thickness 0.635 mm, average center line roughness Ra 0.8 n
m at a vacuum pressure of 3 × 10 −3 Torr on a magnetic disk glass substrate that has been chemically strengthened and washed on a glass plate of
A 5 nm Cr film was deposited by sputtering in an r atmosphere.

【0021】さらにこの基板を真空圧1×10−3To
rr、加速電圧10kV、ビーム径1ミクロンの条件で
0.7秒間電子線を照射し、高さ20nmの突起を形成
した。照射された電子線によりCr膜と同時にガラス基
板まで研削されて突起が形成されていることを確認する
ために、塩酸でCr膜を完全に排除し、ガラス基板上で
の突起高さを確認した。このとき、ガラス基板上に平均
で18nmの高さの突起が形成されていることが確認され
た。ここで、突起密度が3000個/mm2になるよう
に基板を一定ピッチで断続的に回転させながらピッチ間
隔時間に同調させて電子線を断続的に照射して突起を形
成した。このとき、突起の高さは平均で19.8nm、
標準偏差は0.6nmであった。また、ガラス基板上に
突起が形成できていることを再度確認した。その後同一
の製造過程を経た基板にCr膜を40nm、CoCrT
a膜を30nm、保護膜として水素を10%添加したカ
ーボンを15nm形成した。さらに、その上に2nmの
パーフロロポリエーテル系潤滑膜を塗布した。本磁気記
録媒体の最表面の突起高さは16.5nm、標準偏差は
0.7nmであった。
Further, the substrate is vacuumed at a pressure of 1 × 10 −3 To.
An electron beam was irradiated for 0.7 seconds under the conditions of rr, an acceleration voltage of 10 kV, and a beam diameter of 1 micron to form a projection having a height of 20 nm. In order to confirm that the projections were formed by grinding the glass substrate simultaneously with the Cr film by the irradiated electron beam, the Cr film was completely removed with hydrochloric acid, and the projection height on the glass substrate was confirmed. . At this time, it was confirmed that projections having an average height of 18 nm were formed on the glass substrate. Here, the projections were formed by intermittently irradiating an electron beam while synchronizing with the pitch interval time while intermittently rotating the substrate at a constant pitch so that the projection density became 3000 / mm 2. At this time, the height of the projection is 19.8 nm on average,
The standard deviation was 0.6 nm. Further, it was confirmed again that protrusions were formed on the glass substrate. After that, a Cr film of 40 nm and CoCrT
The film a was formed to a thickness of 30 nm, and a protective film formed of carbon to which 10% of hydrogen was added was formed to a thickness of 15 nm. Further, a 2 nm perfluoropolyether-based lubricating film was applied thereon. The projection height of the outermost surface of the magnetic recording medium was 16.5 nm, and the standard deviation was 0.7 nm.

【0022】本磁気記録媒体においても、長さ2mm、
幅1.7mmの浮上面にレール加工が施された浮上型磁
気ヘッドを用いてヘッドとの吸着特性を調査した。この
ときの磁気ヘッドを支えるばね荷重を3gfに設定し
た。このヘッドを用いて吸着特性を測定したところ最大
摩擦力で最大1.3gf、平均的な動摩擦力は0.9g
fであった。この結果、高信頼性を有する低浮上特性に
優れた磁気記録媒体が得られることがわかる。
In the present magnetic recording medium, the length is 2 mm,
Using a floating magnetic head having a 1.7 mm wide floating surface with rail processing applied thereto, adsorption characteristics with the head were investigated. The spring load supporting the magnetic head at this time was set to 3 gf. When the suction characteristics were measured using this head, the maximum frictional force was 1.3 gf at maximum, and the average dynamic frictional force was 0.9 g.
f. As a result, it can be seen that a magnetic recording medium having high reliability and excellent low flying characteristics can be obtained.

【0023】平均中心線粗さRa0.8nmの結晶化ガ
ラス基板に下地膜としてCrを50nm成膜し、さらに
Cr下地膜20nm、CoCrTa磁性膜40nmを順
次成膜した後、電子線を照射しCoCrTa磁性膜の表
面に20nmの突起を形成した。ここで、真空圧1×1
0−3Torr、加速電圧10kV、ビーム径1ミクロ
ンの条件で0.1秒間電子線を照射し、基板の半径15
mmから17mmの領域に突起密度100000個/m
m2で均等に配列させた。また、ガラス基板に突起が形
成されているかを確認するために塩酸によりすべての堆
積膜を取り除いたところガラス基板上には突起は形成さ
れていなかった。
On a crystallized glass substrate having an average center line roughness Ra of 0.8 nm, a 50 nm Cr film is formed as a base film, a 20 nm Cr base film and a 40 nm CoCrTa magnetic film are sequentially formed. A projection of 20 nm was formed on the surface of the magnetic film. Here, vacuum pressure 1 × 1
An electron beam is irradiated for 0.1 second under the conditions of 0-3 Torr, an acceleration voltage of 10 kV, and a beam diameter of 1 micron, and the substrate has a radius of 15 mm.
100000 protrusions / m in the area of 17 mm to 17 mm
They were evenly arranged at m2. Further, when all the deposited films were removed with hydrochloric acid in order to confirm whether or not projections were formed on the glass substrate, no projections were formed on the glass substrate.

【0024】さらに、水素5%添加カーボン保護膜を1
0nm成膜した後、潤滑膜を2.5nm塗布して形成し
た。このとき、すべての膜の形成後の突起高さは原子間
力顕微鏡(AFM)にて平均18.3nmであり標準偏
差は0.4nmであった。
Further, a carbon protective film containing 5% hydrogen was
After forming a 0 nm film, a 2.5 nm lubricating film was applied and formed. At this time, the projection height after formation of all the films was 18.3 nm on average by an atomic force microscope (AFM), and the standard deviation was 0.4 nm.

【0025】本磁気記録媒体においてもヘッド浮上量2
8nmで突起検出を行ったところ、本突起が原因となる
突起検出信号の発生はなかった。
Also in the present magnetic recording medium, the head flying height 2
When the protrusion was detected at 8 nm, no protrusion detection signal was generated due to the main protrusion.

【0026】さらに、本磁気記録媒体の半径15mmか
ら17mmの領域について、長さ2mm、幅1.7mm
の浮上型ヘッドを用いてばね荷重3.5gfとして最大
摩擦力、動摩擦力を測定したところ、それぞれ1.8g
f、1.2gfであった。このとき半径15mmから1
7mmの領域以外の最大摩擦力、動摩擦力はそれぞれ最
大90gf、75gfであった。このように基板上に複
数の薄膜を形成した後、電子線を照射して形成した薄膜
上に突起を形成する場合でも高信頼性で、低浮上を可能
とすることができる。
Further, for a region of a radius of 15 mm to 17 mm of the magnetic recording medium, the length is 2 mm and the width is 1.7 mm.
The maximum frictional force and the dynamic frictional force were measured using a floating type head with a spring load of 3.5 gf.
f, 1.2 gf. At this time, a radius of 15 mm
The maximum frictional force and the dynamic frictional force other than the area of 7 mm were 90 gf and 75 gf at the maximum, respectively. Thus, even when a plurality of thin films are formed on a substrate and then projections are formed on the thin film formed by irradiating an electron beam, high levitation can be achieved with high reliability.

【0027】次に、直径65mm、板厚0.635m
m、平均中心線粗さRa0.8nmの強化ガラス基板上
にCr金属膜を20nm堆積した後、真空圧1×10−3
Torr、加速電圧30kV、ビーム径3ミクロンの条
件で0.5秒間電子線を照射し、高さ25nmの突起を
図4に示すように基板半径15mm、23mm、30m
mの位置にそれぞれ1個ずつ作製した。さらにCr下地
膜を20nmスパッタリング法により堆積した後、保護
膜として10nmの水素20%添加カーボン保護膜をス
パッタリング法により堆積した。その後、1.5nmの
パーフロロポリエーテル系潤滑膜を塗布した。基板半径
15mm、23mm、30mmのそれぞれの位置におけ
る突起の高さを原子間力顕微鏡(AFM)にて測定した
ところそれぞれ23nm、22.5nm、23.4nm
であった。
Next, a diameter of 65 mm and a thickness of 0.635 m
m, a 20 nm thick Cr metal film was deposited on a tempered glass substrate having an average center line roughness Ra of 0.8 nm, and then a vacuum pressure of 1 × 10 −3.
An electron beam was irradiated for 0.5 seconds under the conditions of Torr, an acceleration voltage of 30 kV, and a beam diameter of 3 μm.
One piece was produced at each position of m. Further, after depositing a Cr underlayer by 20 nm by a sputtering method, a 10 nm hydrogen-added 20% carbon protective film was deposited as a protective film by a sputtering method. Thereafter, a 1.5 nm perfluoropolyether-based lubricating film was applied. When the heights of the protrusions at the respective positions of the substrate radii of 15 mm, 23 mm, and 30 mm were measured by an atomic force microscope (AFM), they were 23 nm, 22.5 nm, and 23.4 nm, respectively.
Met.

【0028】本磁気記録媒体を突起検出浮上量を20n
mに設定したアコースティック エミッション付き突起
検出用ヘッドを用いてそれらの突起の検出を行った。こ
のとき、それぞれの突起は検出された。また、そのくり
返し測定において、90%以上の確率で突起を検出する
ことができた。さらに、突起の耐久性を調査するために
半径15mmの位置で一定10000回突起にヘッドを
衝突させたが、その突起検出力は変化せず、長期の突起
の耐久性を確認した。
The magnetic recording medium of the present invention has a protrusion detection flying height of 20 n.
The protrusions were detected using a protrusion detection head with acoustic emission set to m. At this time, each protrusion was detected. Further, in the repeated measurement, protrusions could be detected with a probability of 90% or more. Further, in order to investigate the durability of the projection, the head was caused to collide with the projection at a fixed radius of 10000 times at a position having a radius of 15 mm.

【0029】さらに、同一の製造方法で1突起を半径1
5mm、23mm、30mmnの位置に配置した突起検
出用ヘッド校正用円板を0枚作製した。それらを用いて
同一の突起検出用ヘッドで突起の確認を行ったところ、
その検出精度は90%以上であり突起検出後の突起高さ
の調査では突起高さの平均は23.1nm、標準偏差
0.53nmであった。
Further, one protrusion is formed with a radius of 1 by the same manufacturing method.
Zero protrusion detection head calibration disks arranged at the positions of 5 mm, 23 mm, and 30 mm were manufactured. When using the same to detect protrusions with the same protrusion detection head,
The detection accuracy was 90% or more, and an examination of the projection height after the detection of the projections revealed that the average of the projection heights was 23.1 nm and the standard deviation was 0.53 nm.

【0030】このように、突起検出ヘッドの浮上高さ確
認用として本製造方法にて作製された突起を有する突起
検出用ヘッド校正用円板は高精度であり、耐久性に優れ
ていることがわかった。
As described above, the projection detecting head calibration disk having the projections manufactured by the present manufacturing method for confirming the flying height of the projection detecting head is high in accuracy and excellent in durability. all right.

【0031】また突起径は0.1ミクロンから任意の大
きさに形成でき、また、その形状も角柱形、円錐形など
と任意の形状にすることができる。
The projection diameter can be formed to any size from 0.1 μm, and the shape can be any shape such as a prism or a cone.

【0032】なお、上述の一実施例は基板材料としてガ
ラスを用いた例を記載したが、ソーダライムガラス、石
英ガラス、結晶化ガラスほかなどのガラスおよびセラミ
ックでもよい。さらにはNi−Pなどでメッキされた非
磁性金属基板でも同様の効果を得ることができる。この
場合、基板の持つ最大の表面粗さは突起形成高さよりも
小さいことが重要である。
In the above-described embodiment, an example in which glass is used as a substrate material has been described. However, glass and ceramic such as soda lime glass, quartz glass, crystallized glass and the like may be used. Further, the same effect can be obtained with a non-magnetic metal substrate plated with Ni-P or the like. In this case, it is important that the maximum surface roughness of the substrate is smaller than the projection formation height.

【0033】また、突起の配列については、磁気記録媒
体として必要な突起形、突起高さ、突起密度を設定する
ことにより、高信頼性でかつ低浮上を可能にする磁気記
録媒体を提供することができる。さらには突起の形成さ
れた膜上にさらに突起の形成された膜を配置することも
できる。
Further, with regard to the arrangement of the projections, it is possible to provide a magnetic recording medium having high reliability and low flying height by setting the projection shape, projection height, and projection density required for the magnetic recording medium. Can be. Further, a film on which protrusions are further formed can be arranged on the film on which protrusions are formed.

【0034】さらに、基板上に堆積する膜は本実施例に
記載されている以外にも適切な材料群であればいかなる
材料も使用可能である。
Further, as the film deposited on the substrate, any material can be used as long as it is an appropriate material group other than those described in this embodiment.

【0035】[0035]

【発明の効果】基板或いは基板上に形成された膜の表面
に電子線を照射することにより突起を形成した磁気記録
媒体および突起検出ヘッド校正用円板は、低浮上におい
ても高信頼性を有することができる。また、本発明にお
ける製造方法は基板材質を選ばず特にガラスなど透明な
材料に対して有効であり、安価に高信頼性を有する磁気
記録媒体を製造することが可能となる。
According to the present invention, a magnetic recording medium having projections formed by irradiating an electron beam onto the surface of a substrate or a film formed on the substrate and a disk for calibrating a projection detection head have high reliability even at low flying height. be able to. Further, the manufacturing method according to the present invention is effective for transparent materials such as glass, regardless of the material of the substrate, and makes it possible to manufacture a magnetic recording medium having high reliability at low cost.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例である磁気記録媒体の断面
図。
FIG. 1 is a sectional view of a magnetic recording medium according to an embodiment of the present invention.

【図2】電子線の照射時間を変化させたときの突起高さ
の変化を示す図。
FIG. 2 is a diagram showing a change in projection height when the irradiation time of an electron beam is changed.

【図3】本発明の一実施例における突起形成部分の断面
図。
FIG. 3 is a cross-sectional view of a projection forming portion in one embodiment of the present invention.

【図4】本発明の他の実施例である突起検出用ヘッド校
正用円板の断面図。
FIG. 4 is a sectional view of a disk for calibrating a head for projection detection according to another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 強化ガラス基板、2 下地膜、3 磁性膜 4 保
護膜、5 潤滑膜
1 tempered glass substrate, 2 base film, 3 magnetic film, 4 protective film, 5 lubricating film

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】ガラスまたはセラミックから成る非磁性基
板上に電子線を照射することにより表面に多数の突起を
形成し、該突起の形成された基板上に磁性材料より構成
される磁性膜を形成し、該磁性膜上に保護膜を形成し、
さらに該保護膜上に潤滑膜を塗布することを特徴とする
磁気記録媒体の製造方法。
An electron beam is irradiated on a non-magnetic substrate made of glass or ceramic to form a large number of projections on the surface, and a magnetic film made of a magnetic material is formed on the substrate on which the projections are formed. Forming a protective film on the magnetic film,
A method for manufacturing a magnetic recording medium, further comprising applying a lubricating film on the protective film.
【請求項2】非磁性基体上にクロム堆積層を形成して基
板を形成し、該基板上に電子線を照射することにより表
面に多数の突起を形成し、該突起の形成された基板上に
磁性材料より構成される磁性膜を形成し、該磁性膜上に
保護膜を形成し、さらに該保護膜上に潤滑膜を塗布する
ことを特徴とする磁気記録媒体の製造方法。
2. A chromium deposition layer is formed on a non-magnetic substrate to form a substrate, and a large number of projections are formed on the surface by irradiating the substrate with an electron beam. Forming a magnetic film made of a magnetic material, forming a protective film on the magnetic film, and applying a lubricating film on the protective film.
【請求項3】ガラスまたはセラミックから成る非磁性基
板上に形成された磁性材料より構成される磁性膜、該磁
性膜上に形成された保護膜及び潤滑膜から成る磁気記録
媒体であって、前記基板は表面に多数の突起を有するこ
とを特徴とする磁気記録媒体。
3. A magnetic recording medium comprising a magnetic film made of a magnetic material formed on a non-magnetic substrate made of glass or ceramic, a protective film formed on the magnetic film, and a lubricating film. A magnetic recording medium, wherein the substrate has a large number of protrusions on the surface.
【請求項4】前記基板に形成された多数の突起は前記基
板の表面に電子線を照射することにより形成されること
を特徴とする請求項3記載の磁気記録媒体。
4. The magnetic recording medium according to claim 3, wherein the plurality of protrusions formed on the substrate are formed by irradiating the surface of the substrate with an electron beam.
【請求項5】ガラスまたはセラミックから成る非磁性基
体及び該非磁性基体上に形成された堆積層から構成され
る基板、該基板上に形成された磁性材料より構成される
磁性膜、該磁性膜上に形成された保護膜及び潤滑膜から
成る磁気記録媒体であって、前記基板は表面に多数の突
起を有することを特徴とする磁気記録媒体。
5. A substrate composed of a non-magnetic substrate made of glass or ceramic, a deposited layer formed on the non-magnetic substrate, a magnetic film composed of a magnetic material formed on the substrate, and a magnetic film formed on the substrate. A magnetic recording medium comprising a protective film and a lubricating film formed on the substrate, wherein the substrate has a large number of projections on a surface.
【請求項6】前記基板に形成された多数の突起は前記基
板の表面に電子線を照射することにより形成されること
を特徴とする請求項5記載の磁気記録媒体。
6. The magnetic recording medium according to claim 5, wherein the plurality of projections formed on the substrate are formed by irradiating the surface of the substrate with an electron beam.
JP24500297A 1997-09-10 1997-09-10 Magnetic recording medium and manufacture thereof Pending JPH1186281A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24500297A JPH1186281A (en) 1997-09-10 1997-09-10 Magnetic recording medium and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24500297A JPH1186281A (en) 1997-09-10 1997-09-10 Magnetic recording medium and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH1186281A true JPH1186281A (en) 1999-03-30

Family

ID=17127125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24500297A Pending JPH1186281A (en) 1997-09-10 1997-09-10 Magnetic recording medium and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH1186281A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7064927B2 (en) * 2002-05-13 2006-06-20 Hitachi Global Storage Technologies Netherlands B.V. Disk, method for making it free of asperities utilizing a step of exposing a surface of the disk to a gas cluster ion beam and disk drive unit for using the disk

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7064927B2 (en) * 2002-05-13 2006-06-20 Hitachi Global Storage Technologies Netherlands B.V. Disk, method for making it free of asperities utilizing a step of exposing a surface of the disk to a gas cluster ion beam and disk drive unit for using the disk

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