JPH1183689A - Cleaning method for sample for fluorescent x-ray analysis and device therefor - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve the accuracy of fluorescent X-ray analysis, and to remove small foreign matters on the conveyor carrying surface of a sample for the fluorescent X-ray analysis as well. SOLUTION: In the middle of conveyor-carrying a cement clinker, of an analysis sample into an X-ray irradiation chamber 12 to the surface of the cement clinker, compressed air is jetted toward a conveyor upstream side. The small foreign matters such as rubbish and dust or the like stuck to the surface of the cement clinker are blown away and the surface of the clinker is cleaned. As a result, more highly accurate fluorescent X-ray analysis is performed inside the X-ray irradiation chamber 12. Also, simultaneously with the surface cleaning of the clinker, the small foreign matters or the like dropped on a conveyor belt surface are cleaned.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for cleaning a sample for X-ray fluorescence analysis, and more particularly to a method for X-ray fluorescence analysis of a sample for X-ray fluorescence analysis. The present invention relates to a method for cleaning a fluorescent X-ray analysis sample and an apparatus therefor, which can also remove small foreign matter on a conveyor transport surface of the analysis sample.

[0002]

2. Description of the Related Art A cement kiln for sintering a cement raw material calcined by a preheater at about 1500 ° C. is provided in a cement raw material firing facility. In this kiln, a cement raw material calcined by a preheater is fired with heavy oil or pulverized coal as a fuel while rotating a horizontal cylindrical kiln shell to produce a cement clinker in the middle. Cement clinkers are usually subjected to component analysis for quality control immediately after production. This analysis is generally performed by X-ray fluorescence analysis. X-ray fluorescence analysis refers to the X-ray fluorescence generated when a substance is irradiated with X-rays.
Elemental analysis using lines. This method includes a non-dispersive method in which the intensity of fluorescent X-rays specific to an element is measured without spectral separation, and a wavelength dispersive method in which intensity is measured after spectral separation using an X-ray spectroscope. The substances that can be analyzed are usually all elements that are heavier than sodium, but the wavelength dispersion method may be able to analyze light elements from boron to fluorine. The sample for X-ray fluorescence analysis does not require any special pretreatment.

Since the properties of cement clinkers are massive, they are pulverized during fluorescent X-ray analysis and then loaded into tablets, which are dish-shaped containers. The tablet is transported to the X-ray irradiation room by the fluorescent X-ray analysis line, where the cement clinker is subjected to fluorescent X-ray analysis. Hereinafter, a conventional X-ray fluorescence analysis line will be described with reference to FIGS. FIG.
FIG. 1 is an overall configuration plan view of a fluorescent X-ray analysis line according to a conventional means. As shown in FIG. 4, the conventional fluorescent X-ray analysis line 100 has an on-line belt conveyor 13 that transports the tablet 11 to the X-ray analyzer 12, and a belt end on the unloading side is connected in the middle of the belt conveyor 13. And a belt conveyor 15 for transferring the holder 14 containing the tablet 11.

[0004] A turret 16 which is a turntable type transfer device is disposed between the belt conveyor 13 and the X-ray analyzer 12. The turret 16 rotates the table 11 intermittently by 90 ° so that the tablet 11 and the holder 14 pushed into the take-in stage S1 from the online belt conveyor 13
It is transferred to the supply stage S2 in the line analyzer 12. Further, the tablet 11 and the holder 14 after the analysis are transferred from the supply stage S2 to the discharge stage S3. A belt conveyor 17 for discharging is connected to the discharging stage S3. The separation angle between the stages S1 and S2 is 180 °, and the separation angle between the stages S2 and S3 is 90 °.

[0005] The tablet 11 is conveyed by an on-line belt conveyor 13 and, at a downstream portion of the conveyor, is taken in by an air cylinder 18 to take in the stage S1.
Pushed into. Thereafter, the turret 16 transfers the wafer to the supply stage S2, from which the X-ray analyzer 12
X-ray irradiation room 2 using a swivel arm 19 provided in
Transferred to 0. After the X-ray fluorescence analysis in the X-ray irradiation chamber 20 is completed, the tablet 11 is returned to the supply stage S2 by the swivel arm 19, and then transferred to the discharge stage S3 with the rotation of the table of the turret 16, and discharged therefrom. Is discharged by the belt conveyor 17. On the other hand, the holder 14 is conveyed by the off-line belt conveyor 15, and is pushed onto the on-line belt conveyor 13 by the air cylinder 21 when reaching the downstream of the conveyor. The subsequent route is the same as in the case of the tablet 11. Here, the structures of the tablet 11 and the holder 14 will be described with reference to FIGS.

FIG. 5 is an enlarged perspective view showing a sample for X-ray fluorescence analysis being conveyed on a conveyor, and FIG. 6 is an enlarged perspective view showing another example of a sample for X-ray fluorescence analysis being conveyed on a conveyor.
FIG. 7 is an enlarged exploded perspective view of a sample for X-ray fluorescence analysis of another embodiment. As shown in FIG. 5, the tablet 11 is a tray-shaped low-height container, into which a cement clinker 22, which is finely pulverized and then pressure-formed, is loaded. As shown in FIG. 6, the holder 14 is formed by screwing a cap 24 having a window 24b formed on an upper end plate 24a on an upper portion of a cylindrical holder body 23. Here, the configuration of the holder 14 will be described in more detail with reference to FIG.

As shown in FIG. 7, a spring 25 is housed inside the holder main body 23, and the spring force causes a tablet push-up plate 26 arranged inside the threaded portion 23a of the holder 24 to be moved. It is supported so as to be able to move up and down in the screw portion 23a. The holder body 23 is made of brass, which is relatively weak in abrasion, plated with nickel. The cap 24 is made of nickel. In using the holder 14, the tablet 11 is placed on the tablet push-up plate 26, and then the screw portion 2 of the holder main body 23 is placed.
By screwing the cap 24 on the 3a, the spring 25
The tablet 11 is fixed while being pressed against the back surface of the upper end plate 24a of the cap 24 by the spring force of. The holder 14 is conveyed by a conveyor in this state. In the X-ray analyzer 12, when the holder 14 is positioned in the X-ray irradiation chamber 20, the surface of the cement clinker 22 exposed from the window 24b of the cap 24 is irradiated with X-rays, and the fluorescent X-ray emitted at that time is emitted. , The elemental analysis of the cement clinker 22 is performed (the same applies to the case of the tablet 11 alone).

[0008]

By the way, the tablet 11 and the holder 14 which are conveyed by the online belt conveyor 13 and the offline belt conveyor 15 can be subjected to X-ray fluorescence analysis in the X-ray irradiation chamber 20. In addition, the surface of each of the loaded cement clinkers 22 is exposed to the outside. Thereby, each conveyor 1
Before or during the transportation by the third and the 15th, small foreign substances (for example, dust, dust, sample powder, etc.) in the factory where the fluorescent X-ray analysis line 100 is arranged are removed by the cement clinker 22.
There is a problem in that it may adhere to the surface of the sample and cause an analysis error. This is particularly remarkable in the case of the holder 14.

That is, as described above, the cap 24
When screwing into the screw portion 23a of the holder body 23, the tablet push-up plate 26 is manually operated by an operator.
The upper tablet 11 is made of an aluminum cap 24 having a relatively small hardness by the spring force of the spring 25.
Of the upper end plate 24a. At this time, there was a problem that nickel powder generated from the back surface of the cap 24 and a powdery sample separated from the surface of the compacted sample adhered to the surface of the cement clinker 22 loaded in the tablet 11. .

[0010]

An object of the present invention is to improve the accuracy of X-ray fluorescence analysis of a sample for X-ray fluorescence analysis and to remove small foreign substances on the conveyor conveying surface of the sample for X-ray fluorescence analysis. It is an object of the present invention to provide a method and an apparatus for cleaning a sample for X-ray fluorescence analysis that can be performed.

[0011]

According to a first aspect of the present invention, there is provided an X-ray fluorescence analysis sample which is subjected to elemental analysis by X-ray fluorescence generated by X-ray surface irradiation. In the course of being conveyed to the X-ray irradiation chamber, by blowing compressed air toward the conveyor loading direction onto the surface of the fluorescent X-ray analysis sample, garbage adhering to the surface of the fluorescent X-ray analysis sample can be reduced. This is a method for cleaning a sample for X-ray fluorescence analysis in which small foreign substances such as dust are blown off and removed.

The X-ray fluorescence analyzer used here is an X-ray fluorescence analyzer.
In the X-ray irradiation room, the surface of the sample for X-ray fluorescence analysis is irradiated with X-rays.
This is an apparatus for performing elemental analysis of a sample for line analysis. As a fluorescent X-ray analyzer, a non-dispersive type that measures the intensity without spectrally separating the fluorescent X-rays peculiar to the element or a wavelength dispersive type that measures the intensity using an X-ray spectrometer and then measures the intensity. It may be something. The fluorescent X-ray analysis sample to be analyzed does not require any special pretreatment.

The sample for X-ray fluorescence analysis is usually put in a container such as a tablet and analyzed. Various conveyors such as a belt conveyor, a chain conveyor, and a bucket conveyor can be used as the conveyor used for conveying the sample for X-ray fluorescence analysis. However, in order to smoothly move to the X-ray fluorescence analyzer side,
A belt conveyor is preferred. Further, the conveyor carrying direction means toward the upstream side of the conveyor.

Examples of the sample for X-ray fluorescence analysis include, for example, a cement raw material in a cement production facility, a cement clinker, cement, etc., which are produced intermediately in a firing step. In addition, without being limited to these, if it is possible to perform X-ray fluorescence analysis, for example, as a so-called non-destructive analysis method, automatic analysis of various kinds of samples (various raw materials and prepared raw materials), process control, culture It may be used for any purpose such as a goods survey. The term "small foreign matter" used herein includes, in addition to dust and dust in the air, relatively small foreign matter that is generated for some reason and can adhere to the surface of the fluorescent X-ray analysis sample.

Further, in the apparatus for cleaning a sample for X-ray fluorescence analysis according to claim 2, the X-ray fluorescence generated by surface irradiation of X-rays is provided.
The sample for X-ray fluorescence analysis, which is subjected to elemental analysis by X-rays, is disposed in the middle of a transport conveyor that conveys the sample to the X-ray irradiation chamber for performing X-ray fluorescence analysis. This is a cleaning device for a fluorescent X-ray analysis sample, comprising: an injection nozzle for injecting compressed air in a carrying-in direction; and a compressed air supply device for supplying compressed air to the injection nozzle. The injection pressure of the compressed air injected from the injection nozzle using the compressed air supply device is preferably of a size that can blow off only small foreign substances attached to the surface of the fluorescent X-ray analysis sample as much as possible.

[0016]

According to the first and second aspects of the present invention, while the X-ray fluorescence analysis sample is being conveyed to the X-ray irradiation chamber by the conveyor, the conveyor is loaded onto the surface of the X-ray fluorescence analysis sample. Heading (toward the upstream side of the conveyor)
Since the compressed air is jetted, small foreign matters such as dust, dust, and fine powder attached to the surface of the fluorescent X-ray analysis sample are removed by being blown to the conveyor carry-in side. Thereby, at the time of the fluorescent X-ray analysis performed in the X-ray irradiation room, the possibility of analyzing the small foreign matter attached to the surface of the fluorescent X-ray analysis sample is reduced. That is, in this fluorescent X-ray analysis, the incident angle is set in advance for each analysis element, and thereby, the surface of the sample for the fluorescent X-ray analysis has dust,
If dust, a peeled sample, or the like adheres, the irradiated X-rays are irregularly reflected, and the distance and the value of the incident angle change, which has been a major cause of an analysis error. However, in the present invention, small foreign matter is blown off from the surface of the sample for X-ray fluorescence analysis before the sample is subjected to X-ray analysis, so that the analysis accuracy of X-ray fluorescence analysis can be improved. Moreover, at the same time as the surface cleaning of the fluorescent X-ray analysis sample, the conveyor surface can be cleaned by the compressed air injected to the upstream side of the conveyor.

[0017]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to the drawings. The same components as those of the conventional means shown in FIGS. 4 to 7 are denoted by the same reference numerals, and description thereof will be omitted.
FIG. 1 is a plan view of the entire configuration of a fluorescent X-ray analysis line provided with a fluorescent X-ray analysis sample cleaning apparatus according to an embodiment of the present invention, and FIG. FIG. 3 is an enlarged front view including a partial cross-sectional view showing the sample for X-ray fluorescence analysis during cleaning. In FIG. 1, reference numeral 10 denotes a fluorescent X-ray analysis line according to one embodiment. The main feature of the configuration of the fluorescent X-ray analysis line 10 is that the fluorescent X-ray analysis line 10 is located in the middle of an online belt conveyor 13 which is an example of a transport conveyor. An injection nozzle 30 disposed therein, and a compressed air supply device 31 for supplying compressed air to the injection nozzle 30
The cleaning apparatus A for a fluorescent X-ray analysis sample having the following is provided on the fluorescent X-ray analysis line 10.

The injection nozzle 30 is disposed in the middle of the online belt conveyor 13 and slightly above the connection with the offline belt conveyor 15 which is another example of the conveyor. The injection nozzle 30
Has its nozzle axis oriented in the conveyor width direction. In addition, a compressed air injection port 30a extending along the nozzle axis is formed at an oblique lower portion (position of angle θ (= 30 ° on the left side in FIG. 3)) on the carry-in side of the nozzle peripheral wall. The compressed air from the compressed air supply device 31 is supplied to the injection nozzle 30
Are injected obliquely downward in the conveyor loading direction (toward the upstream side of the conveyor) through the injection ports 30a of the conveyor.

In FIG. 1, reference numeral 32 denotes a compressed air supply pipe connecting the compressed air supply device 31 and the injection nozzle 30, reference numeral 33 denotes a pressure reducing valve, reference numeral 34 denotes a ball valve, and reference numeral 35 denotes an electromagnetic valve. Also, in FIG. 2, 13a is the injection nozzle 3
These side walls are provided at both edges of the belt conveyor 13 in order to more effectively blow out small foreign substances of the fluorescent X-ray analysis sample 22 by the compressed air injected from zero.

Next, a method for cleaning a sample for X-ray fluorescence analysis using the apparatus X for cleaning a sample for X-ray fluorescence analysis will be described.
As shown in FIGS. 1 to 3, first, when carrying in the tablet,
The belt conveyor 13 is operated, and the compressed air from the compressed air supply device 31 is injected from the injection port 30 a of the injection nozzle 30. In this state, the tablet 11 is conveyed to the turret 16 by the online belt conveyor 13. In addition, the holder 14 is configured to transfer the belt conveyor 1 from the offline belt conveyor 15.
3 and then conveyed to the turret 16 side by the on-line conveyor 13 in the same manner.

At this time, the tablet 11 and the holder 14
When the belt reaches the vicinity of the point where the belt conveyor 13 and 15 have passed through, the compressed air that is jetted only during the operation of the belt conveyor 13 from the jet port 30a of the jet nozzle 30 that is disposed diagonally upward in the carry-out direction. Sprayed.
As a result, small foreign matters such as dirt and dust adhering to the surfaces of the tablet 11 and the cement clinker 22 of the holder 14 are blown off to the conveyor carry-in side and removed. As a result, the X-ray fluorescence analysis of the cement clinker 22 in the X-ray irradiation chamber 20 can be performed with high precision thereafter. Since the side walls 13a are provided upright on both edges of the belt conveyor 13 on the online side, the compressed air injected from the injection nozzle 30 is not easily dispersed outside. Thereby, the small foreign matter of the cement clinker 22 can be more effectively blown off.

Also, when the surface of the cement clinker 22 is cleaned, small foreign matter blown off onto the belt conveyor 13 and also during this cleaning, a small amount of the cement clinker blown off from the surface of the cement clinker 22 of the tablet 11 and the holder 14. The powder of 22 falls on the belt surface of the belt conveyor 13. Also,
When the lower surface of the holder main body 23 placed thereon rubs against the transporting surface of the belt conveyor 13 and rubs, the brass powder is generated. At this time, the powder of the cement clinker 22 is sequentially blown off by the compressed air from the injection nozzle 30 toward the upstream side of the belt conveyor 13. Cleaning of the belt surface can also be performed. Note that, as described above, other configurations, operations, and effects are the same as those of the conventional means.

[0023]

According to the method for cleaning a sample for X-ray fluorescence analysis according to the first aspect and the apparatus for cleaning a sample for X-ray fluorescence analysis according to the second aspect, the conveyor is conveyed to the X-ray irradiation chamber. Compressed air is blown from the conveyor carry-out direction to the conveyor carry-in direction on the surface of the fluorescent X-ray analysis sample, so that small foreign matters adhering to the surface of the fluorescent X-ray analysis sample are blown off, and this surface is cleaned. Can be cleaned. As a result, the X-ray fluorescence analysis of the sample for X-ray fluorescence analysis performed in the X-ray irradiation chamber, which is performed thereafter, can be performed with high precision. In addition, the surface of the conveyor belt can be cleaned simultaneously with the surface cleaning of the fluorescent X-ray analysis sample.

[Brief description of the drawings]

FIG. 1 is a plan view of the entire configuration of a fluorescent X-ray analysis line provided with an apparatus for cleaning a sample for fluorescent X-ray analysis according to an embodiment of the present invention.

FIG. 2 is an enlarged plan view showing a state during cleaning of the fluorescent X-ray analysis sample according to one embodiment of the present invention.

FIG. 3 is an enlarged front view including a partial cross-sectional view showing a state during cleaning of the fluorescent X-ray analysis sample according to one embodiment of the present invention.

FIG. 4 is an enlarged perspective view showing a state in which a conventional sample for X-ray fluorescence analysis is being conveyed on a conveyor.

FIG. 5 is an enlarged perspective view showing a state in which another conventional X-ray fluorescence analysis sample is being conveyed on a conveyor.

FIG. 6 is an enlarged perspective view of another conventional sample for X-ray fluorescence analysis.

FIG. 7 is an enlarged exploded perspective view of another conventional sample holder for X-ray fluorescence analysis.

[Explanation of symbols]

13 online belt conveyor (transport conveyor), 15 offline belt conveyor (transport conveyor), 20 X-ray irradiation room, 22 cement clinker (fluorescent X-ray analysis sample), 30 injection nozzle, 31 compressed air supply device, A A sample cleaning device for X-ray fluorescence analysis.

Claims (2)

[Claims] A fluorescent X-ray analysis sample elementally analyzed by fluorescent X-rays generated by X-ray surface irradiation is a fluorescent X-ray sample.
In the course of being conveyed to the X-ray irradiation chamber where the X-ray analysis is performed, compressed air is jetted toward the conveyor loading direction on the surface of the X-ray fluorescence analysis sample, whereby the X-ray fluorescence sample is A method for cleaning a sample for X-ray fluorescence analysis in which small foreign substances such as dust and dust attached to the surface are blown off and removed. 2. A sample for X-ray fluorescence analysis, which is subjected to elemental analysis by X-ray fluorescence generated by X-ray surface irradiation,
An injection nozzle that is disposed above the transfer conveyor that transfers the X-ray to the X-ray irradiation chamber that performs the X-ray analysis, and that injects compressed air toward the conveyor loading direction on the surface of the fluorescent X-ray analysis sample; A fluorescent X-ray analysis sample cleaning apparatus, comprising: a compressed air supply device for supplying compressed air to the injection nozzle.