JPH1155696A - Gradation characteristic measurement device - Google Patents
Gradation characteristic measurement deviceInfo
- Publication number
- JPH1155696A JPH1155696A JP9205990A JP20599097A JPH1155696A JP H1155696 A JPH1155696 A JP H1155696A JP 9205990 A JP9205990 A JP 9205990A JP 20599097 A JP20599097 A JP 20599097A JP H1155696 A JPH1155696 A JP H1155696A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- gradation characteristic
- characteristic measuring
- gradation
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、テレビジョン受像
機などの表示装置の製造工程のうち、調整工程或いは検
査工程において、表示画面の階調特性を計測する階調特
性測定装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a gradation characteristic measuring apparatus for measuring gradation characteristics of a display screen in an adjustment step or an inspection step in a manufacturing process of a display device such as a television receiver. .
【０００２】[0002]
【従来の技術】テレビジョン受信機等の表示装置におい
て、供給される映像信号通りの階調の画像が得られるか
どうかを示す階調特性は、画質を評価する上で重要であ
る。従来、表示装置の階調特性は、例えば特開平４−３
２６２８８号公報にて提案されているように、複数の階
調が階調順にストライプ状に並ぶパターンを表示し、こ
の階調特性測定用パターンをビデオカメラで撮影し、ビ
デオカメラの走査線の特定ラインを抽出し、Ａ／Ｄ変換
して得られたデジタル出力値を特定の演算式に代入して
階調特性を演算していた。2. Description of the Related Art In a display device such as a television receiver, a gradation characteristic indicating whether or not an image having a gradation according to a supplied video signal is obtained is important in evaluating image quality. Conventionally, the gradation characteristics of a display device are described in, for example,
As proposed in Japanese Patent No. 26288, a pattern in which a plurality of gradations are arranged in stripes in the order of gradations is displayed, the gradation characteristic measurement pattern is photographed by a video camera, and the scanning line of the video camera is specified. A line is extracted, and a digital output value obtained by A / D conversion is substituted into a specific arithmetic expression to calculate a gradation characteristic.
【０００３】また、特開平５−３０８６６５号公報にて
提案されているように、明度を同心状に段階的或いは連
続的に変化させたテストパターンを表示画面上に表示
し、明るさを測定するか、または、画面中央に一辺が画
面幅の４０％である窓を表示し、窓以外の部分は０％
（黒）レベルに設定し、窓のレベルを１００％（白）ま
で１０％毎に変化させ、各ステップ毎に窓の中央の明る
さを測定していた。Further, as proposed in Japanese Patent Application Laid-Open No. 5-308665, a test pattern in which the brightness is concentrically changed stepwise or continuously is displayed on a display screen, and the brightness is measured. Alternatively, a window whose one side is 40% of the screen width is displayed at the center of the screen, and a portion other than the window is 0%.
(Black) level, the window level was changed every 10% to 100% (white), and the brightness at the center of the window was measured at each step.
【０００４】[0004]
【発明が解決しようとする課題】一般的に、投写型ディ
スプレイは画面中央が最も明るく、中心から離れるに従
って同心状に暗くなるという特性を持っている（以降、
この特性をＣＣＲ：Corner to Center Ratioと称す）。
このため、同じ映像信号を入力しても画面中の位置によ
って明るさが異なる。Generally, a projection type display has the characteristic that the center of the screen is brightest and darkens concentrically as the distance from the center increases.
This characteristic is called CCR: Corner to Center Ratio).
Therefore, even if the same video signal is input, the brightness differs depending on the position on the screen.
【０００５】従って、特開平４−３２６２８８号公報に
記載のもののように、階調がストライプ状に並ぶパター
ンで測定した場合、図８に示すように、パターン内でＣ
ＣＲの影響を大きく受けてしまい、画面中央が離れるに
従って本来の明るさよりも暗く表示され、暗い部分はよ
り暗く表示され、正確な測定ができない。また、ビデオ
カメラで撮影しているので、測定結果が光電変換特性や
シェーディングなどのビデオカメラの性能に依存し、正
確に測定することができないという問題があった。[0005] Therefore, when the gradation is measured using a pattern in which the gradations are arranged in a stripe pattern as disclosed in JP-A-4-326288, as shown in FIG.
It is greatly affected by the CR, and the farther the center of the screen is, the darker the original brightness is displayed, and the darker part is displayed darker, so that accurate measurement cannot be performed. In addition, since an image is taken with a video camera, the measurement result depends on the performance of the video camera, such as photoelectric conversion characteristics and shading, so that there is a problem that accurate measurement cannot be performed.
【０００６】また、特開平５−３０８６６５号公報に記
載のもののように、明度を同心状に変化させたテストパ
ターンを用いた場合、図９に示すように、異なる明度が
中心から等距離の位置にないので、やはりパターン内で
ＣＣＲの影響を受け、パターンの外側の明度ほど暗くな
り、正確な測定ができないという問題があった。When a test pattern in which lightness is concentrically changed is used, as shown in Japanese Patent Laid-Open No. 5-308665, as shown in FIG. Therefore, there is also a problem that the lightness outside the pattern becomes darker due to the influence of CCR in the pattern, and accurate measurement cannot be performed.
【０００７】さらに、表示画面上に窓を表示し、窓内の
レベルを変化させる方法においては、ＣＣＲの影響を受
けない精度の高い測定が可能であるが、一画面に１レベ
ルしか表示されないので、各ステップの変化が分かりに
くく、階調特性を把握しにくい。また、レベルを一画面
毎に変えて測定する必要があるので、時間、手間がかか
るという問題があった。Further, in the method of displaying a window on the display screen and changing the level in the window, highly accurate measurement not affected by CCR is possible, but only one level is displayed on one screen. It is difficult to understand the change of each step, and it is difficult to grasp the gradation characteristics. In addition, since it is necessary to change the level for each screen and perform measurement, there is a problem that it takes time and effort.
【０００８】本発明は、上述したような点に鑑みてなさ
れたものであり、時間、手間がかからず、精度の高い測
定が可能な階調特性測定装置を提供することを目的とす
る。SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and has as its object to provide a gradation characteristic measuring apparatus capable of performing high-accuracy measurement without requiring time and labor.
【０００９】[0009]
【課題を解決するための手段】本願請求項１に記載の発
明に係る階調特性測定装置は、表示装置の表示画面上に
階調特性測定用パターンを表示し、該階調特性測定用パ
ターンにおけるグレースケールの各ステップの明るさを
センサーにより測定する階調特性測定装置であって、前
記階調特性測定用パターンのグレースケールの各ステッ
プをパターン中心から等距離の位置に配置したものであ
る。According to a first aspect of the present invention, there is provided a gradation characteristic measuring apparatus for displaying a gradation characteristic measuring pattern on a display screen of a display device. A gray scale characteristic measuring device for measuring the brightness of each step of the gray scale by a sensor, wherein each gray scale step of the gray scale characteristic measuring pattern is arranged at a position equidistant from the center of the pattern. .
【００１０】これによって、グレースケールの各ステッ
プがパターン中心から等距離に配置された階調特性測定
用パターンを画面上に表示し、各ステップの明るさをセ
ンサーで測定するので、ＣＣＲの影響を受けにくい階調
特性の測定が可能となり、精度良く階調特性を測定する
ことができる。In this way, a gray scale characteristic measuring pattern in which each step of the gray scale is arranged at the same distance from the center of the pattern is displayed on the screen, and the brightness of each step is measured by the sensor. It is possible to measure the gradation characteristic which is hard to receive, and it is possible to measure the gradation characteristic with high accuracy.
【００１１】また、一画面に同時にグレースケールの各
ステップを表示するので、各ステップの変化が分かりや
すく、階調特性を把握しやすくなる。さらに、一画面に
同時に表示されたグレースケールの各ステップを測定す
ることができるので、時間、手間がかからなくなる。Further, since the steps of the gray scale are simultaneously displayed on one screen, the change of each step can be easily understood, and the gradation characteristics can be easily grasped. Furthermore, since the steps of the gray scale simultaneously displayed on one screen can be measured, time and labor are not required.
【００１２】本願請求項２に記載の発明に係る階調特性
測定装置は、前記請求項１に記載の階調特性測定装置に
おいて、前記階調特性測定用パターンにおける各ステッ
プを、前記センサーが内接する大きさに設定したもので
ある。According to a second aspect of the present invention, there is provided the tone characteristic measuring apparatus according to the first aspect, wherein each step in the tone characteristic measuring pattern is performed by the sensor. It is set to the size that touches.
【００１３】これによって、階調特性測定用パターンに
おける各ステップは、センサーによる明るさの測定が可
能な範囲で、極力小さい面積とすることができるため、
より一層ＣＣＲの影響を受けにくい階調特性の測定が可
能となり、精度良く階調特性を測定することができる。Accordingly, each step in the gradation characteristic measuring pattern can have an area as small as possible within a range in which the brightness can be measured by the sensor.
It is possible to measure the gradation characteristics which are less affected by the CCR, and it is possible to accurately measure the gradation characteristics.
【００１４】本願請求項３に記載の発明に係る階調特性
測定装置は、前記請求項１又は２に記載の階調特性測定
装置において、前記階調特性測定用パターンを、パター
ン内で各ステップの位置が異なる複数種類備え、該複数
種類の階調特性測定用パターンにおける各ステップ毎の
平均値を求める平均値算出手段を設けたものである。According to a third aspect of the present invention, there is provided the tone characteristic measuring apparatus according to the first or second aspect, wherein the tone characteristic measuring pattern is provided in each step in the pattern. Are provided at different positions, and average value calculating means for obtaining an average value for each step in the plurality of types of gradation characteristic measuring patterns is provided.
【００１５】これによって、パターン内におけるグレー
スケールの各ステップの位置をパターン内で変えた複数
の階調特性測定用パターンを用いて測定し、各ステップ
毎に平均をとるので、パターン内のＣＣＲの影響を取り
除くことができ、さらに測定精度を上げることができ
る。In this way, the position of each step of the gray scale in the pattern is measured using a plurality of gradation characteristic measuring patterns in which the position is changed in the pattern, and the average is calculated for each step. The influence can be removed, and the measurement accuracy can be further improved.
【００１６】本願請求項４に記載の発明に係る階調特性
測定装置は、前記請求項１乃至３に記載の階調特性測定
装置において、前記センサーを、前記階調特性測定用パ
ターンにおける各ステップの測定位置に合わせて複数個
配設したものである。According to a fourth aspect of the present invention, there is provided a tone characteristic measuring apparatus according to any one of the first to third aspects, wherein the sensor is connected to each step in the tone characteristic measuring pattern. Are arranged in accordance with the measurement position.
【００１７】これによって、複数のセンサーをパターン
の測定位置に合わせて配置しているので、表示画面のコ
ーナー部、周辺部などにパターンを表示した場合にも、
複数のセンサーを一度に移動することにより、短時間で
局所的な階調特性を測定することができる。また、グレ
ースケールの各ステップにセンサーを移動する必要がな
く、短時間で階調特性を測定することができる。Thus, since the plurality of sensors are arranged in accordance with the measurement position of the pattern, even when the pattern is displayed at a corner portion, a peripheral portion, or the like of the display screen,
By moving a plurality of sensors at a time, local gradation characteristics can be measured in a short time. Further, it is not necessary to move the sensor to each step of the gray scale, and the gradation characteristics can be measured in a short time.
【００１８】[0018]
【発明の実施の形態】以下、本発明の階調特性測定装置
の第１実施形態を、図１乃至図５とともに以下説明す
る。ここで、図１は本実施形態の階調特性測定装置の概
略構成を示す説明図、図２は本実施形態の階調特性測定
装置における階調測定用パターンを示す説明図、図３は
本実施形態の階調特性測定装置におけるセンサー部の配
置例を示す説明図、図４は本実施形態の階調特性測定装
置における測定結果を示す説明図、図５は本実施形態の
階調特性測定装置における測定結果を示す説明図であ
る。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment of a gradation characteristic measuring apparatus according to the present invention will be described below with reference to FIGS. Here, FIG. 1 is an explanatory diagram showing a schematic configuration of the tone characteristic measuring device of the present embodiment, FIG. 2 is an explanatory diagram showing a tone measuring pattern in the tone characteristic measuring device of the present embodiment, and FIG. FIG. 4 is an explanatory diagram showing an example of the arrangement of sensor units in the gradation characteristic measuring device of the embodiment, FIG. 4 is an explanatory diagram showing measurement results in the gradation characteristic measuring device of the present embodiment, and FIG. FIG. 9 is an explanatory diagram showing measurement results in the device.
【００１９】図１において、１はフロントプロジェク
タ、２はフロントプロジェクタ１による表示画面、３は
フロントプロジェクタ１に表示信号を供給する信号発生
器、４は表示画面２との距離が限りなく０に近くなるよ
うに設置されたセンサー部、５はセンサー部４の出力に
基づき表示画面２上の明るさを検知する照度計、６はＡ
／Ｄ変換ボード、７はセンサー部４が表示画面２の横方
向と平行なＸ軸方向及び縦方向と平行なＹ軸方向に移動
可能に取り付けられた移動台、８はパソコンである。In FIG. 1, reference numeral 1 denotes a front projector, 2 denotes a display screen of the front projector 1, 3 denotes a signal generator for supplying a display signal to the front projector 1, and 4 denotes a distance from the display screen 2 as close as possible to zero. The sensor unit 5 is installed so that the illuminometer 5 detects the brightness on the display screen 2 based on the output of the sensor unit 4, and 6 is A
A / D conversion board 7, a movable base 7 on which the sensor unit 4 is movable in an X-axis direction parallel to the horizontal direction of the display screen 2 and a Y-axis direction parallel to the vertical direction, and 8 a personal computer.
【００２０】パソコン８は、信号発生器３よりフロント
プロジェクタ１へ出力する階調特性測定用パターンを制
御するパターン制御手段１１と、センサー部４を表示画
面２上の任意の位置へ移動させるセンサー移動手段１２
と、Ａ／Ｄ変換ボード６を介して照度計５より得られた
測定値に基づいて、階調測定の評価や計算を行う階調特
性計算手段１３と、前記各手段１１〜１３の制御を行う
測定制御手段１４とを有している。The personal computer 8 includes a pattern control means 11 for controlling a gradation characteristic measurement pattern output from the signal generator 3 to the front projector 1 and a sensor movement for moving the sensor unit 4 to an arbitrary position on the display screen 2. Means 12
A gradation characteristic calculation unit 13 for evaluating and calculating gradation measurement based on a measurement value obtained from the illuminometer 5 via the A / D conversion board 6; and controlling the units 11 to 13 And a measurement control unit 14 for performing the measurement.
【００２１】本実施形態で用いる階調特性測定用パター
ンは、図２に示すように、円形状のパターン内にグレー
スケールの各ステップがパターン中心から等距離の位置
になるように配置されている。また、この階調特性測定
用パターンは、ＣＣＲの影響を考慮して極力小さいもの
とするため、各ステップがセンサー部４に内接する大き
さに設定されている。さらに、階調特性測定用パターン
は、図２（ｂ），（ｃ）に示すように、パターン内でグ
レーレベルの各ステップの位置を変えた複数種類を用い
る。As shown in FIG. 2, the gradation characteristic measuring pattern used in the present embodiment is arranged in a circular pattern such that each step of the gray scale is at a position equidistant from the center of the pattern. . In addition, this gradation characteristic measuring pattern is set to a size in which each step is inscribed in the sensor unit 4 in order to minimize the pattern in consideration of the influence of the CCR. Further, as shown in FIGS. 2B and 2C, a plurality of types of gradation characteristic measurement patterns are used in which the position of each step of the gray level is changed in the pattern.
【００２２】次に、本実施形態の階調特性測定装置によ
る測定動作について説明する。まず、フロントプロジェ
クタ１の表示画面２中央部に階調特性測定用パターンを
表示させる。そして、センサー部１０４をパターン内の
グレースケールの各ステップの中央に移動させて照度を
測定し、該照度計５の出力をＡ／Ｄ変換ボード６を介し
てパソコン８に入力する。Next, a measuring operation by the gradation characteristic measuring device of the present embodiment will be described. First, a gradation characteristic measurement pattern is displayed at the center of the display screen 2 of the front projector 1. Then, the sensor unit 104 is moved to the center of each grayscale step in the pattern to measure the illuminance, and the output of the illuminometer 5 is input to the personal computer 8 via the A / D conversion board 6.
【００２３】また、表示画面２のコーナー部、周辺部に
も階調特性測定用パターンを表示し、これにリンクして
センサー部４を移動させれば、局所的な階調特性を自動
的に測定することができる。この場合、階調特性測定用
パターンの表示位置を制御するパソコン８により、セン
サー部４を画面左右方向、画面上下方向に自動的に階調
特性測定用パターンの表示位置まで移動させて測定する
ようにすると良い。Further, a gradation characteristic measuring pattern is also displayed at a corner portion and a peripheral portion of the display screen 2, and when the sensor portion 4 is moved in association with the pattern, the local gradation characteristic is automatically obtained. Can be measured. In this case, the personal computer 8 that controls the display position of the gradation characteristic measurement pattern automatically moves the sensor unit 4 to the display position of the gradation characteristic measurement pattern in the horizontal direction of the screen and the vertical direction of the screen to perform measurement. It is good to
【００２４】すなわち、パソコン８には自動測定動作プ
ログラムを格納し、予め表示画面２の左上コーナー部及
び右下コーナー部等の位置をプリセットしておき、該プ
リセットしたデータに従ってセンサー部４の移動台７を
作動させる。That is, the automatic measurement operation program is stored in the personal computer 8, the positions of the upper left corner and the lower right corner of the display screen 2 are preset in advance, and the moving platform of the sensor unit 4 is set in accordance with the preset data. Activate 7
【００２５】さらに、パターン内で各ステップの位置が
異なるＮ個の階調特性測定用パターンそれぞれに対し
て、上記のように明るさを測定し、パソコン８の階調特
性計算手段１３で各ステップごとの平均値を求めて測定
値とする。あるステップの明るさｂは、ステップの位置
を変えたＮ個の階調測定用パターンで測定された明るさ
をそれぞれｂ1、ｂ2、…、ｂNとすると、 ｂ＝（ｂ1＋ｂ2＋…＋ｂN）／Ｎ で表わされる。Further, the brightness is measured as described above for each of the N gradation characteristic measuring patterns in which the position of each step is different in the pattern, and the gradation characteristic calculating means 13 of the personal computer 8 calculates each step. The average value is calculated for each and used as the measured value. Assuming that the brightness b of a certain step is b 1 , b 2 ,..., B N , respectively, the brightness measured by the N gradation measurement patterns in which the position of the step is changed, b = (b 1 + b 2) + ... + b N ) / N.
【００２６】例えば、図２（ｂ），（ｃ）に示すよう
に、パターン内で各ステップの位置が異なる２個の階調
特性測定用パターンを用いて測定すると、５０％レベル
の照度ｂは、図２（ｂ）に示すパターンの５０％レベル
の照度ｂ1と、図２（ｃ）に示すパターンの５０％レベ
ルの照度ｂ2 の平均値（ｂ1＋ｂ2）／２となる。For example, as shown in FIGS. 2 (b) and 2 (c), when measurement is performed using two gradation characteristic measuring patterns in which the position of each step in the pattern is different, the illuminance b at the 50% level is , an illuminance b 1 50% level of the pattern shown in FIG. 2 (b), the average value of the illuminance b 2 50% level of the pattern shown in FIG. 2 (c) (b 1 + b 2) / 2 to become.
【００２７】このように、同じステップの明るさをパタ
ーン内の異なる位置で測定し、平均することで、パター
ン内での位置の違いによるバラ付きを抑えることがで
き、ＣＣＲの影響をさらに低減することが可能となり、
局所的な階調特性も精度良く測定することができる。As described above, by measuring and averaging the brightness of the same step at different positions in the pattern, it is possible to suppress the variation due to the difference in the position in the pattern and further reduce the influence of the CCR. Is possible,
Local gradation characteristics can also be measured with high accuracy.
【００２８】ここで、図３（ａ）に示すように、センサ
ー部４を１個だけ設けた場合は、該センサー部４を階調
特性測定用パターンの各ステップに順次移動させて測定
を行う。同様に、表示画面２の周辺部に階調特性測定用
パターンを表示するときには、センサー部４を周辺部に
移動させた後、パターンの各ステップに順次移動させる
必要があり、安価にシステムを構築することができる
が、測定に時間を要する。Here, as shown in FIG. 3 (a), when only one sensor unit 4 is provided, measurement is performed by sequentially moving the sensor unit 4 to each step of the gradation characteristic measuring pattern. . Similarly, when displaying the gradation characteristic measuring pattern in the peripheral portion of the display screen 2, it is necessary to move the sensor portion 4 to the peripheral portion and then sequentially move to each step of the pattern. But it takes time to measure.
【００２９】また、図３（ｂ）に示すように、センサー
部４を階調特性測定用パターンの各ステップ個数に合わ
せて複数個設けた場合は、パターン内でセンサー部４を
移動させる必要がなく、一度に各ステップについて測定
することができる。同様に、表示画面２の周辺部に階調
特性測定用パターンを表示するときには、複数のセンサ
ー部４を周辺部に移動させた後、パターンの各ステップ
における明るさを一度に測定することができるので、測
定に要する時間を大幅に短縮することが可能である。As shown in FIG. 3B, when a plurality of sensor units 4 are provided in accordance with the number of steps in the gradation characteristic measuring pattern, it is necessary to move the sensor unit 4 in the pattern. Rather, it can be measured for each step at a time. Similarly, when displaying the gradation characteristic measurement pattern in the peripheral portion of the display screen 2, the brightness in each step of the pattern can be measured at once after moving the plurality of sensor sections 4 to the peripheral portion. Therefore, the time required for the measurement can be greatly reduced.
【００３０】次に、本実施形態による階調特性測定用パ
ターンを用いて測定した結果と、上述した従来のストラ
イプ状のパターンを用いて測定した結果を図４に示す。
従来のストライプ状のパターンを用いて測定した場合、
明部（白）の特性の測定が正しく行われていないのに対
し、本実施形態の階調特性測定装置によれば、ほぼ表示
装置自体の階調特性に近似した測定結果が得られる。Next, FIG. 4 shows the result of measurement using the gradation characteristic measuring pattern according to the present embodiment and the result of measurement using the above-described conventional stripe pattern.
When measured using a conventional striped pattern,
While the measurement of the characteristics of the bright part (white) is not performed correctly, according to the gradation characteristic measuring device of the present embodiment, a measurement result almost similar to the gradation characteristics of the display device itself is obtained.
【００３１】また、本実施形態における階調特性測定用
パターンのように各ステップがセンサー部４に内接する
大きさに設定されたものを用いて測定した結果と、これ
の３倍の面積を有する階調特性測定用パターンを用いて
測定した結果を図５に示す。３倍の大きさのパターンを
用いて測定した場合、ＣＣＲの影響を受け、明部（白）
の特性の測定が正しく行われていないのに対し、本実施
形態の階調特性測定装置によれば、ほぼ表示装置自体の
階調特性に近似した測定結果が得られる。Further, the measurement result is obtained by using a pattern in which each step is inscribed in the sensor section 4 like the gradation characteristic measurement pattern in the present embodiment, and has an area three times as large as the measurement result. FIG. 5 shows the result of measurement using the gradation characteristic measurement pattern. When measured using a pattern of three times the size, it is affected by the CCR and the bright part (white)
Although the characteristic is not correctly measured, according to the gradation characteristic measuring device of the present embodiment, a measurement result almost similar to the gradation characteristic of the display device itself can be obtained.
【００３２】尚、階調特性測定用パターンは、小さい程
ＣＣＲの影響を受けにくく、センサー部４による明るさ
の測定が可能な範囲で小さくすることが望ましい。本実
施形態においては、扇形状の各ステップの大きさはセン
サー部４が内接する大きさとしているので、センサー部
４による測定が可能な範囲で、極力小さい面積とするこ
とができる。The smaller the gradation characteristic measuring pattern is, the less the influence of the CCR is, and it is desirable to make the pattern as small as possible in a range where the sensor section 4 can measure the brightness. In the present embodiment, since the size of each fan-shaped step is set to a size in which the sensor unit 4 is inscribed, the area can be as small as possible within a range where measurement by the sensor unit 4 is possible.
【００３３】さらに、上記本発明の第１実施形態におい
ては、表示装置としてフロントプロジェクタを用いたも
のについて説明したが、リアプロジェクタ、直視型ディ
スプレイに適用したものについて、本発明の階調特性測
定装置の第２実施形態として、図６とともに説明する。
尚、上記第１実施形態と同一部分には同一符号を付し、
その説明は省略する。ここで、図６は本実施形態の階調
特性測定装置の概略構成を示す説明図である。Further, in the first embodiment of the present invention, a description has been given of the case where a front projector is used as a display device. A second embodiment will be described with reference to FIG.
The same parts as those in the first embodiment are denoted by the same reference numerals,
The description is omitted. Here, FIG. 6 is an explanatory diagram showing a schematic configuration of the gradation characteristic measuring device of the present embodiment.
【００３４】図６において、２１はリアプロジェクタま
たは直視型ディスプレイ、２２は表示画面、２４は輝度
計である。輝度計２４はＡ／Ｄ変換ボード６を介してパ
ソコン８に接続されている。また、輝度計２４はパソコ
ン８とリンクして自動的に作動する移動台７に取り付け
られており、表示画面２２の高さＨの３倍の距離だけ離
した位置に限りなく近くなるように設置される。In FIG. 6, 21 is a rear projector or a direct-view display, 22 is a display screen, and 24 is a luminance meter. The luminance meter 24 is connected to the personal computer 8 via the A / D conversion board 6. Further, the luminance meter 24 is attached to the mobile base 7 which automatically operates by linking with the personal computer 8, and is installed so as to be as close as possible to a position three times the height H of the display screen 22. Is done.
【００３５】この表示画面２の高さＨの３倍という数値
は、人が画面を見る時に目を疲労させないために適切な
鑑賞距離とされているものであり、実際に鑑賞される条
件と極力一致させるためにそのように設定している。The value of three times the height H of the display screen 2 is an appropriate viewing distance so that a person does not fatigue his eyes when viewing the screen. We have set it up to match.
【００３６】尚、上記実施形態においては、階調特性測
定用パターンとして、図２に示すような円形状のものを
用いたものについて説明したが、例えば図７に示すよう
に、センサー部と略同一の大きさの各ステップからなる
円環状のパターンを用いても良く、本発明の階調特性測
定装置は、上述した実施形態に限定されるものではな
い。In the above-described embodiment, a pattern using a circular shape as shown in FIG. 2 has been described as a gradation characteristic measuring pattern. However, for example, as shown in FIG. An annular pattern composed of steps having the same size may be used, and the gradation characteristic measuring device of the present invention is not limited to the above-described embodiment.
【００３７】[0037]
【発明の効果】本願請求項１に記載の発明に係る階調特
性測定装置は、上述のような構成としているため、グレ
ースケールの各ステップがパターン中心から等距離に配
置された階調特性測定用パターンを画面上に表示し、各
ステップの明るさをセンサーで測定するので、ＣＣＲの
影響を受けにくい階調特性の測定が可能となり、精度良
く階調特性を測定することができる。Since the tone characteristic measuring apparatus according to the first aspect of the present invention has the above-described configuration, the tone characteristic measuring device in which each step of the gray scale is arranged at an equal distance from the center of the pattern. Since the pattern for use is displayed on the screen and the brightness of each step is measured by the sensor, it is possible to measure the gradation characteristic which is hardly affected by the CCR, and it is possible to measure the gradation characteristic with high accuracy.
【００３８】また、一画面に同時にグレースケールの各
ステップを表示するので、各ステップの変化が分かりや
すく、階調特性を把握しやすくなる。さらに、一画面に
同時に表示されたグレースケールの各ステップを測定す
ることができるので、時間、手間がかからなくなる。Further, since each step of the gray scale is simultaneously displayed on one screen, the change of each step can be easily understood and the gradation characteristics can be easily grasped. Furthermore, since the steps of the gray scale simultaneously displayed on one screen can be measured, time and labor are not required.
【００３９】本願請求項２に記載の発明に係る階調特性
測定装置は、階調特性測定用パターンにおける各ステッ
プは、センサーによる明るさの測定が可能な範囲で、極
力小さい面積とすることができるため、より一層ＣＣＲ
の影響を受けにくい階調特性の測定が可能となり、精度
良く階調特性を測定することができる。In the gradation characteristic measuring apparatus according to the second aspect of the present invention, each step in the gradation characteristic measuring pattern has an area as small as possible within a range where the brightness can be measured by the sensor. CCR
This makes it possible to measure gradation characteristics that are not easily affected by the above, and it is possible to accurately measure gradation characteristics.
【００４０】本願請求項３に記載の発明に係る階調特性
測定装置は、階調特性測定用パターン内におけるグレー
スケールの各ステップの位置をパターン内で変えた複数
の階調特性測定用パターンを用いて測定し、各ステップ
毎に平均をとるので、パターン内のＣＣＲの影響を取り
除くことができ、さらに測定精度を上げることができ
る。According to a third aspect of the present invention, there is provided an apparatus for measuring gradation characteristics, wherein a plurality of gradation characteristic measurement patterns in which the position of each step of the gray scale in the gradation characteristic measurement pattern is changed. Since the measurement is carried out using the above method and the average is obtained for each step, the influence of the CCR in the pattern can be removed, and the measurement accuracy can be further improved.
【００４１】本願請求項４に記載の発明に係る階調特性
測定装置は、複数のセンサーをパターンの測定位置に合
わせて配置しているので、表示画面のコーナー部、周辺
部などにパターンを表示した場合にも、複数のセンサー
を一度に移動することにより、短時間で局所的な階調特
性を測定することができる。また、グレースケールの各
ステップに照度計を移動する必要がなく、短時間で階調
特性を測定することができる。In the gradation characteristic measuring apparatus according to the present invention, since a plurality of sensors are arranged in accordance with the measurement positions of the pattern, the pattern is displayed at a corner portion, a peripheral portion, or the like of the display screen. Also in this case, by moving a plurality of sensors at once, local gradation characteristics can be measured in a short time. Further, it is not necessary to move the illuminometer to each step of the gray scale, and the gradation characteristics can be measured in a short time.
【図１】本発明の階調特性測定装置の第１実施形態の概
略構成を示す説明図である。FIG. 1 is an explanatory diagram showing a schematic configuration of a first embodiment of a gradation characteristic measuring device of the present invention.
【図２】本発明の階調特性測定装置の第１実施形態にお
ける階調特性測定用パターンを示す説明図である。FIG. 2 is an explanatory diagram showing a gradation characteristic measuring pattern in the first embodiment of the gradation characteristic measuring device of the present invention.
【図３】本発明の階調特性測定装置の第１実施形態にお
けるセンサー部の配置例を示す説明図である。FIG. 3 is an explanatory diagram showing an example of the arrangement of sensor units in the first embodiment of the gradation characteristic measuring device of the present invention.
【図４】本発明の階調特性測定装置の第１実施形態にお
ける測定結果を示す説明図である。FIG. 4 is an explanatory diagram showing a measurement result in the first embodiment of the gradation characteristic measuring device of the present invention.
【図５】本発明の階調特性測定装置の第１実施形態にお
ける測定結果を示す説明図である。FIG. 5 is an explanatory diagram showing a measurement result in the first embodiment of the gradation characteristic measuring device of the present invention.
【図６】本発明の階調特性測定装置の第２実施形態の概
略構成を示す説明図である。FIG. 6 is an explanatory diagram showing a schematic configuration of a second embodiment of the gradation characteristic measuring device of the present invention.
【図７】本発明の階調特性測定装置の実施形態における
他の階調特性測定用パターンを示す説明図である。FIG. 7 is an explanatory view showing another gradation characteristic measuring pattern in the embodiment of the gradation characteristic measuring device of the present invention.
【図８】従来の階調特性測定装置における階調特性測定
用パターンと表示される明るさとを示す説明図である。FIG. 8 is an explanatory diagram showing a gradation characteristic measuring pattern and displayed brightness in a conventional gradation characteristic measuring device.
【図９】従来の他の階調特性測定装置における階調特性
測定用パターンと表示される明るさとを示す説明図であ
る。FIG. 9 is an explanatory diagram showing a gradation characteristic measuring pattern and displayed brightness in another conventional gradation characteristic measuring device.
１ フロントプロジェクタ ２ 表示画面 ３ 信号発生器 ４ センサー部 ５ 照度計 ６ Ａ／Ｄ変換ボード ７ センサー部移動台 ８ パソコン １１ パターン制御手段 １２ センサー移動手段 １３ 階調特性計算手段 １４ 測定制御手段 ２１ リアプロジェクタまたは直視型ディスプレイ ２２ 表示画面 ２４ 輝度計 DESCRIPTION OF SYMBOLS 1 Front projector 2 Display screen 3 Signal generator 4 Sensor part 5 Illuminometer 6 A / D conversion board 7 Sensor part moving stand 8 Personal computer 11 Pattern control means 12 Sensor moving means 13 Gradation characteristic calculation means 14 Measurement control means 21 Rear projector Or direct-view display 22 display screen 24 luminance meter
Claims (4)
パターンを表示し、該階調特性測定用パターンにおける
グレースケールの各ステップの明るさをセンサーにより
測定する階調特性測定装置であって、 前記階調特性測定用パターンは、グレースケールの各ス
テップがパターン中心から等距離の位置に配置されてい
ることを特徴とする階調特性測定装置。1. A gradation characteristic measuring device which displays a gradation characteristic measuring pattern on a display screen of a display device and measures the brightness of each step of a gray scale in the gradation characteristic measuring pattern by a sensor. The tone characteristic measuring apparatus according to claim 1, wherein the gray scale characteristic measuring pattern is such that each step of gray scale is arranged at a position equidistant from the center of the pattern.
において、 前記階調特性測定用パターンにおける各ステップを、前
記センサーが内接する大きさに設定したことを特徴とす
る階調特性測定装置。2. The gradation characteristic measurement apparatus according to claim 1, wherein each step in the gradation characteristic measurement pattern is set to a size in which the sensor is inscribed. apparatus.
定装置において、 前記階調特性測定用パターンを、パターン内で各ステッ
プの位置が異なる複数種類備え、 該複数種類の階調特性測定用パターンにおける各ステッ
プ毎の平均値を求める平均値算出手段を設けたことを特
徴とする階調特性測定装置。3. The gradation characteristic measuring device according to claim 1, wherein a plurality of types of the gradation characteristic measuring patterns are provided at different positions of each step in the pattern. A gradation characteristic measuring device comprising an average value calculating means for obtaining an average value for each step in a measurement pattern.
定装置において、 前記センサーを、前記階調特性測定用パターンにおける
各ステップの測定位置に合わせて複数個配設したことを
特徴とする階調特性測定装置。4. The gradation characteristic measuring device according to claim 1, wherein a plurality of said sensors are arranged in accordance with a measurement position of each step in said gradation characteristic measuring pattern. Gradation characteristic measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20599097A JP3495570B2 (en) | 1997-07-31 | 1997-07-31 | Tone characteristic measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20599097A JP3495570B2 (en) | 1997-07-31 | 1997-07-31 | Tone characteristic measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1155696A true JPH1155696A (en) | 1999-02-26 |
| JP3495570B2 JP3495570B2 (en) | 2004-02-09 |
Family
ID=16516086
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20599097A Expired - Fee Related JP3495570B2 (en) | 1997-07-31 | 1997-07-31 | Tone characteristic measuring device |
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| Country | Link |
|---|---|
| JP (1) | JP3495570B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001015129A1 (en) * | 1999-08-25 | 2001-03-01 | Fujitsu Limited | Display measuring method and profile preparing method |
| KR100429799B1 (en) * | 2001-11-10 | 2004-05-03 | 삼성전자주식회사 | Apparatus and method for controlling intensity of projection light in a display unit |
| JPWO2010119588A1 (en) * | 2009-04-16 | 2012-10-22 | シャープ株式会社 | Luminance characteristic measuring method, luminance characteristic measuring apparatus, signal processing system thereof, and display device including the signal processing system |
-
1997
- 1997-07-31 JP JP20599097A patent/JP3495570B2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001015129A1 (en) * | 1999-08-25 | 2001-03-01 | Fujitsu Limited | Display measuring method and profile preparing method |
| US7268913B2 (en) | 1999-08-25 | 2007-09-11 | Fujitsu Limited | Display measuring method and profile generating method |
| KR100429799B1 (en) * | 2001-11-10 | 2004-05-03 | 삼성전자주식회사 | Apparatus and method for controlling intensity of projection light in a display unit |
| JPWO2010119588A1 (en) * | 2009-04-16 | 2012-10-22 | シャープ株式会社 | Luminance characteristic measuring method, luminance characteristic measuring apparatus, signal processing system thereof, and display device including the signal processing system |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3495570B2 (en) | 2004-02-09 |
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