JPH1154667A - Hybrid integrated circuit device - Google Patents

Hybrid integrated circuit device

Info

Publication number
JPH1154667A
JPH1154667A JP21229597A JP21229597A JPH1154667A JP H1154667 A JPH1154667 A JP H1154667A JP 21229597 A JP21229597 A JP 21229597A JP 21229597 A JP21229597 A JP 21229597A JP H1154667 A JPH1154667 A JP H1154667A
Authority
JP
Japan
Prior art keywords
substrate
resin
integrated circuit
circuit device
hybrid integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21229597A
Other languages
Japanese (ja)
Other versions
JP3156642B2 (en
Inventor
Katsunori Takami
勝典 高見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP21229597A priority Critical patent/JP3156642B2/en
Publication of JPH1154667A publication Critical patent/JPH1154667A/en
Application granted granted Critical
Publication of JP3156642B2 publication Critical patent/JP3156642B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/284Applying non-metallic protective coatings for encapsulating mounted components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3405Edge mounted components, e.g. terminals

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To protect a board against cracking by mounting a second board on a first board constituting a major part and resin sealing the first and second boards compactly such that no air gap is present between. SOLUTION: After a second board 2 and a device 7 are mounted on a first board 1, a compact resin 31 is injected into the gap between the first and second boards 1, 2 and a lead terminal 9 is fixed by solder 8 to the first board 1 thus producing a half-finished produced 33 to be packaged. The half-finished produced 33 is then fitted in a case 10 under a state where the lead terminal 9 is directed upward and the first board 1 is held horizontally, and the second board 2 is immersed into a moisture resistant liquid resin 34 along with the device 7 mounted on the same mount surface as the second board 2. The mount surface on the opposite side of the second board 2 is filled with a specified quantity of moisture resistant liquid resin 34 and heat treated for a predetermined. Consequently, the moisture resistant liquid resin 34 is cured and moisture resistant resin 32 sealing is obtained.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、混成集積回路装置
に関し、特に、環境温度の変化に対して信頼性の高い混
成集積回路装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a hybrid integrated circuit device, and more particularly to a hybrid integrated circuit device having high reliability with respect to a change in environmental temperature.

【0002】[0002]

【従来の技術】図4は従来の混成集積回路装置を示す断
面図であり、図において、1は混成集積回路装置の主要
部を構成する第1の基板、2は第1の基板1に実装され
る第2の基板、4は配線を構成する導体材料、5は各種
部品を搭載する部品搭載ランド、6は保護カバー、7は
第1の基板1に実装される各種の実装部品、8は半田、
9はリード端子、10はこれら基板1、2及び実装部品
7を収納するケース、11はケース10内に充填された
熱硬化性樹脂の1種であるウレタン樹脂である。
2. Description of the Related Art FIG. 4 is a cross-sectional view showing a conventional hybrid integrated circuit device. In FIG. 4, reference numeral 1 denotes a first substrate constituting a main part of the hybrid integrated circuit device, and reference numeral 2 denotes a device mounted on the first substrate 1. A second substrate, 4 is a conductor material constituting wiring, 5 is a component mounting land for mounting various components, 6 is a protective cover, 7 is various mounting components mounted on the first substrate 1, and 8 is a mounting component. solder,
Reference numeral 9 denotes a lead terminal, 10 denotes a case for accommodating the substrates 1, 2 and the mounted components 7, and 11 denotes a urethane resin which is a kind of thermosetting resin filled in the case 10.

【0003】この混成集積回路装置では、第2の基板2
及び実装部品7が半田8により第1の基板1に実装さ
れ、リード端子9も半田8により第1の基板1に取り付
けられている。また、外装は、ケース10内にウレタン
樹脂11を充填することによりなされている。ウレタン
樹脂11は耐湿性を維持するとともに、実装部品7の実
装された第1の基板1とケース10とを接着し固定する
機能を有している。
In this hybrid integrated circuit device, the second substrate 2
The mounting components 7 are mounted on the first substrate 1 by solder 8, and the lead terminals 9 are also attached to the first substrate 1 by solder 8. The exterior is made by filling a case 10 with a urethane resin 11. The urethane resin 11 has a function of maintaining moisture resistance and bonding and fixing the first substrate 1 on which the mounting components 7 are mounted and the case 10.

【0004】次に、この混成集積回路装置のケース封止
工程について図5に基づき説明する。まず、同図(a)
に示すように、第2の基板2及び実装部品7を半田8に
より第1の基板1に実装し、リード端子9も半田8によ
り第1の基板1に取り付け、外装前の半製品21とす
る。次いで、同図(b)に示すように、ケース10を水
平に置き、ケース10内に所定量の液状ウレタン樹脂2
2を注入する。
Next, a case sealing step of the hybrid integrated circuit device will be described with reference to FIG. First, FIG.
As shown in (2), the second substrate 2 and the mounted component 7 are mounted on the first substrate 1 by solder 8 and the lead terminals 9 are also attached to the first substrate 1 by solder 8 to obtain a semi-finished product 21 before exterior. . Next, as shown in FIG. 2B, the case 10 is placed horizontally, and a predetermined amount of the liquid urethane resin 2 is placed in the case 10.
Inject 2.

【0005】次いで、同図(c)に示すように、半製品
21をリード端子9を上にしかつ第1の基板1を水平に
保持した状態で、水平に置かれたケース10内に嵌め込
み、第2の基板2及び該第2の基板2の搭載面と同じ実
装面の実装部品7を液状ウレタン樹脂22に浸漬する。
この場合、第1の基板1が水平状態で液状ウレタン樹脂
22に浸漬されるため、第1の基板1と第2の基板2と
の間に液状ウレタン樹脂22が十分に浸透せず、空気1
2が抜けきれず残ってしまうことがある。
Next, as shown in FIG. 1C, the semi-finished product 21 is fitted into a horizontally placed case 10 with the lead terminals 9 facing upward and the first substrate 1 held horizontally. The second substrate 2 and the mounting component 7 on the same mounting surface as the mounting surface of the second substrate 2 are immersed in the liquid urethane resin 22.
In this case, since the first substrate 1 is immersed in the liquid urethane resin 22 in a horizontal state, the liquid urethane resin 22 does not sufficiently penetrate between the first substrate 1 and the second substrate 2 and the air 1
2 may not be completely removed and may remain.

【0006】次いで、同図(d)に示すように、第1の
基板1の第2の基板2と反対側の実装面上に液状ウレタ
ン樹脂22を所定量充填する。その後、所定の温度で所
定時間熱処理を行なうことにより、液状ウレタン樹脂2
2を硬化させてウレタン樹脂11とし、第1の基板1、
第2の基板2及び実装部品7を含む実装部品全体を外装
する。ここでは、第1の基板1と第2の基板2との間に
残った空気12は、そのままボイド(空隙)13として
ウレタン樹脂11中に残存する。
Next, as shown in FIG. 1D, a predetermined amount of liquid urethane resin 22 is filled on the mounting surface of the first substrate 1 opposite to the second substrate 2. Thereafter, a heat treatment is performed at a predetermined temperature for a predetermined time, so that the liquid urethane resin 2
2 is cured to form a urethane resin 11, and the first substrate 1,
The entire mounting component including the second substrate 2 and the mounting component 7 is packaged. Here, the air 12 remaining between the first substrate 1 and the second substrate 2 remains in the urethane resin 11 as a void (gap) 13 as it is.

【0007】[0007]

【発明が解決しようとする課題】第1の問題点は、前記
第1の基板1や第2の基板2にセラミック基板を用いた
場合、例えば、温度サイクル試験等を行った場合のよう
に、高温と低温を繰り返すことによる温度変化によりウ
レタン樹脂に膨張・収縮が繰り返されると、セラミック
基板がこの膨張・収縮に起因する応力を受けるために、
高温と低温を繰り返す熱ストレスによりセラミック基板
にクラックや割れが生じる点である。
A first problem is that when a ceramic substrate is used as the first substrate 1 or the second substrate 2, for example, a temperature cycle test or the like is performed. When the expansion and contraction of the urethane resin is repeated due to the temperature change by repeating the high and low temperatures, the ceramic substrate receives the stress caused by this expansion and contraction,
The point is that cracks and cracks are generated in the ceramic substrate due to thermal stress that is repeated between high and low temperatures.

【0008】この場合、セラミック基板の表裏両面とも
にウレタン樹脂が充填されていれば、ウレタン樹脂の膨
張・収縮によりセラミック基板に及ぼす力は、該基板の
両面で相殺されるが、該基板の一方の面がボイドにより
空洞になっていると、該基板に曲げ応力が加わり、基板
にクラックや割れが発生する。
In this case, if both the front and back surfaces of the ceramic substrate are filled with the urethane resin, the force exerted on the ceramic substrate due to the expansion and contraction of the urethane resin is offset on both surfaces of the substrate, but one side of the substrate does not. If the surface is hollow due to voids, bending stress is applied to the substrate, and cracks and cracks occur in the substrate.

【0009】この問題点は、上述した混成集積回路装置
のケース封止工程では、半製品21をケース10内に嵌
め込み液状ウレタン樹脂22に浸漬した際に、第1の基
板1と第2の基板2との間に空気12が抜けきれず、液
状ウレタン樹脂22を硬化させた際にそのままボイド1
3としてウレタン樹脂11中に残存することにより引き
起こされる不具合である。
The problem is that, in the case sealing step of the hybrid integrated circuit device described above, when the semi-finished product 21 is fitted into the case 10 and immersed in the liquid urethane resin 22, the first substrate 1 and the second substrate When the liquid 12 is hardened, the air 12 cannot be completely removed.
No. 3 is a problem caused by remaining in the urethane resin 11.

【0010】第2の問題点は、ウレタン樹脂11中に残
存するボイド13の影響により、基板にクラックや割れ
が生じないまでも、搭載される実装部品7や第2の基板
2の半田8部分にも機械的ストレスが加わるために、半
田8が剥離や歪等を起こす虞があり、接続部分の信頼性
が懸念される点である。例えば、搭載される実装部品7
については、その周りにボイドが存在すると、ウレタン
樹脂11が膨張することにより実装部品7に対してもボ
イドの方に向かう応力が働くために、この応力がそのま
ま半田8部分へ加わりストレスとなるからである。
The second problem is that even if the substrate is not cracked or cracked by the effect of the voids 13 remaining in the urethane resin 11, the mounted components 7 to be mounted and the solder 8 of the second substrate 2 Also, since mechanical stress is applied, the solder 8 may be peeled or distorted, and the reliability of the connection portion is concerned. For example, mounted components 7
When a void exists around it, the urethane resin 11 expands, so that a stress toward the void acts on the mounted component 7, and this stress is directly applied to the solder 8 and becomes a stress. It is.

【0011】本発明は上記の事情に鑑みてなされたもの
であって、高温と低温を繰り返す熱ストレスが加わった
場合でも、基板にクラックや割れが生じる虞がなく、半
田による接続不良が生じる虞もなく、したがって、信頼
性を向上させることが可能な混成集積回路装置を提供す
ることにある。
The present invention has been made in view of the above circumstances, and does not cause cracks or cracks in a substrate even when a thermal stress that repeats high and low temperatures is applied, and may cause poor connection due to solder. Accordingly, it is an object of the present invention to provide a hybrid integrated circuit device capable of improving reliability.

【0012】[0012]

【課題を解決するための手段】上記課題を解決するため
に、本発明は次の様な混成集積回路装置を採用した。す
なわち、請求項1記載の混成集積回路装置は、主要部を
構成する第1の基板に、少なくとも1枚以上の第2の基
板が実装され、これら第1の基板及び第2の基板が耐湿
性樹脂によりケース内に封止された混成集積回路装置に
おいて、少なくともこれらの基板間を空隙の無い緻密な
樹脂により封止したものである。
In order to solve the above-mentioned problems, the present invention employs the following hybrid integrated circuit device. That is, in the hybrid integrated circuit device according to the first aspect, at least one or more second substrates are mounted on the first substrate constituting the main part, and the first substrate and the second substrate are resistant to moisture. In a hybrid integrated circuit device sealed in a case with a resin, at least the space between these substrates is sealed with a dense resin having no void.

【0013】請求項2記載の混成集積回路装置は、前記
耐湿性樹脂を、ウレタン系樹脂としたものである。
According to a second aspect of the present invention, in the hybrid integrated circuit device, the moisture-resistant resin is a urethane-based resin.

【0014】請求項3記載の混成集積回路装置は、前記
緻密な樹脂を、前記第1の基板及び第2の基板に近い膨
張係数を有する樹脂としたものである。
According to a third aspect of the present invention, in the hybrid integrated circuit device, the dense resin is a resin having an expansion coefficient close to those of the first substrate and the second substrate.

【0015】請求項4記載の混成集積回路装置は、前記
第1の基板及び第2の基板を含む実装部品全体を、前記
第1の基板及び第2の基板に近い膨張係数を有する樹脂
により覆ったものである。
According to a fourth aspect of the present invention, in the hybrid integrated circuit device, the entire mounting component including the first substrate and the second substrate is covered with a resin having an expansion coefficient close to those of the first substrate and the second substrate. It is a thing.

【0016】請求項5記載の混成集積回路装置は、前記
第1の基板および/または第2の基板に実装される実装
部品間、及び該実装部品と該実装部品が実装される前記
基板との間に、前記第1の基板及び第2の基板に近い膨
張係数を有する樹脂を注入したものである。
According to a fifth aspect of the present invention, there is provided the hybrid integrated circuit device, wherein the components mounted on the first substrate and / or the second substrate and between the mounted components and the substrate mounted with the components are mounted. A resin having an expansion coefficient close to that of the first substrate and the second substrate is injected between them.

【0017】請求項6記載の混成集積回路装置は、前記
第1の基板および/または第2の基板の複数の実装部品
が実装される領域に、前記第1の基板及び第2の基板に
近い膨張係数を有する樹脂を注入し前記複数の実装部品
をプリコートしたものである。
According to a sixth aspect of the present invention, there is provided the hybrid integrated circuit device, wherein the first substrate and / or the second substrate are close to the first substrate and the second substrate in a region where a plurality of mounting components are mounted. A resin having an expansion coefficient is injected and the plurality of mounted components are pre-coated.

【0018】請求項7記載の混成集積回路装置は、前記
第1の基板及び第2の基板に近い膨張係数を有する樹脂
を、フェノール系樹脂としたものである。
According to a seventh aspect of the present invention, the resin having an expansion coefficient close to those of the first substrate and the second substrate is a phenolic resin.

【0019】本発明の請求項1、2、3または7記載の
混成集積回路装置では、少なくともこれらの基板間を空
隙の無い緻密な樹脂により封止したことにより、これら
の基板間には空隙が生じる虞が無くなる。これにより、
温度サイクル試験等のように、高温と低温を繰り返すこ
とによる温度変化により耐湿性樹脂に膨張・収縮が起こ
ったとしても、これらの基板の周囲に空隙が無く、基板
に曲げ応力が働く虞が無くなり、基板にクラックや割れ
等の不具合が発生するのを防止する。
In the hybrid integrated circuit device according to the first, second, third or seventh aspect of the present invention, at least the space between these substrates is sealed with a dense resin having no space, so that a space is formed between these substrates. There is no danger of occurrence. This allows
Even if the moisture-resistant resin expands and contracts due to temperature changes due to repeated high and low temperatures, such as in a temperature cycle test, there is no void around these substrates, eliminating the risk of bending stress acting on the substrates. In addition, it is possible to prevent the occurrence of defects such as cracks and cracks in the substrate.

【0020】また、基板間を緻密な樹脂により封止した
ことにより、これら基板同士が固定され、耐湿性樹脂の
膨張・収縮による応力がこれら基板に機械的ストレスを
加えた場合にも、これらの基板の半田部分への機械的ス
トレスが緩和され、半田部分に剥離や歪が生じる虞が無
く、接続部分の信頼性が向上する。
Further, since the substrates are sealed with a dense resin, the substrates are fixed to each other, and even when a mechanical stress is applied to these substrates due to a stress caused by expansion and contraction of the moisture resistant resin. The mechanical stress on the solder portion of the substrate is reduced, and there is no possibility that the solder portion will be peeled or distorted, and the reliability of the connection portion will be improved.

【0021】請求項4記載の混成集積回路装置では、前
記第1の基板及び第2の基板を含む実装部品全体を、前
記第1の基板及び第2の基板に近い膨張係数を有する樹
脂により覆ったことにより、これらの基板を含む実装部
品全体が固定され、耐湿性樹脂の膨張・収縮による応力
がこれら基板を含む実装部品全体に機械的ストレスを加
えた場合にも、これら基板及び各部品の半田部分への機
械的ストレスが緩和され、これら基板及び各部品の半田
部分の信頼性が向上する。
In the hybrid integrated circuit device according to a fourth aspect, the entire mounting component including the first substrate and the second substrate is covered with a resin having an expansion coefficient close to those of the first substrate and the second substrate. As a result, the entire mounting components including these substrates are fixed, and even if the stress due to the expansion and contraction of the moisture-resistant resin applies mechanical stress to the entire mounting components including these substrates, the mounting of these substrates and each component is also possible. The mechanical stress on the solder portion is reduced, and the reliability of the solder portion of these boards and components is improved.

【0022】請求項5記載の混成集積回路装置では、前
記第1の基板および/または第2の基板に実装される実
装部品間、及び該実装部品と該実装部品が実装される前
記基板との間に、前記第1の基板及び第2の基板に近い
膨張係数を有する樹脂を注入したことにより、空隙の出
来易い部分である部品間及び部品と基板との間に樹脂を
注入することで、実装される部品間及び部品と基板との
間に空隙が生じるのを防止する。これにより、耐湿性樹
脂の膨張・収縮による応力がこれら部品及び基板に機械
的ストレスを加えた場合にも、これらの部品の半田部分
への機械的ストレスが緩和され、これらの部品の半田部
分の信頼性が向上する。
In the hybrid integrated circuit device according to the fifth aspect, between the mounted components mounted on the first substrate and / or the second substrate, and between the mounted components and the substrate mounted with the mounted components. In the meantime, by injecting a resin having an expansion coefficient close to that of the first substrate and the second substrate, by injecting the resin between the components and the component and the substrate, which are portions where voids are easily formed, A gap is prevented from being formed between the components to be mounted and between the component and the substrate. As a result, even when the stress due to expansion and contraction of the moisture-resistant resin applies mechanical stress to these components and the substrate, the mechanical stress on the solder portions of these components is reduced, and the solder portions of these components are reduced. Reliability is improved.

【0023】請求項6記載の混成集積回路装置では、前
記第1の基板および/または第2の基板の複数の実装部
品が実装される領域に、前記第1の基板及び第2の基板
に近い膨張係数を有する樹脂を注入し前記複数の実装部
品をプリコートしたことにより、この領域の実装される
部品全体が固定され、耐湿性樹脂の膨張・収縮による応
力がこの領域の各部品に機械的ストレスを加えた場合に
も、この領域の各部品の半田部分への機械的ストレスが
緩和され、この領域の各部品の半田部分の信頼性が向上
する。
According to a sixth aspect of the present invention, in the hybrid integrated circuit device, the first substrate and / or the second substrate are close to the first substrate and the second substrate in a region where a plurality of mounting components are mounted. By injecting a resin having an expansion coefficient and pre-coating the plurality of mounted components, the entire components mounted in this region are fixed, and stress due to expansion and contraction of the moisture-resistant resin causes mechanical stress on each component in this region. Is added, the mechanical stress on the solder portion of each component in this region is reduced, and the reliability of the solder portion of each component in this region is improved.

【0024】[0024]

【発明の実施の形態】以下、本発明の混成集積回路装置
の各実施形態について図面に基づき説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the hybrid integrated circuit device of the present invention will be described with reference to the drawings.

【0025】(第1の実施形態)図1は本発明の第1の
実施形態の混成集積回路装置を示す断面図であり、図に
おいて、31は第1の基板1と第2の基板2との間を封
止するボイド(空隙)の無い緻密な樹脂、32は第1の
基板1、第2の基板2及び実装部品7等の実装部品全体
をケース10内に封止する耐湿性樹脂である。この緻密
な樹脂31は、その膨張係数が第1の基板1及び第2の
基板2とほぼ等しい樹脂であり、フェノール系樹脂が好
適に用いられる。また、耐湿性樹脂32としては、ウレ
タン樹脂(ウレタン系樹脂)が好適に用いられる。
(First Embodiment) FIG. 1 is a sectional view showing a hybrid integrated circuit device according to a first embodiment of the present invention. In the figure, reference numeral 31 denotes a first substrate 1, a second substrate 2 and 32 is a dense resin having no voids (voids) for sealing the space between them, and 32 is a moisture-resistant resin for sealing the entire mounting components such as the first substrate 1, the second substrate 2 and the mounting components 7 in the case 10. is there. The dense resin 31 is a resin whose expansion coefficient is substantially equal to that of the first substrate 1 and the second substrate 2, and a phenol resin is preferably used. As the moisture-resistant resin 32, a urethane resin (urethane-based resin) is preferably used.

【0026】この混成集積回路装置の概略を説明する
と、第1の基板1の両面には導体材料4による配線パタ
ーンが形成されており、導体材料4の部品搭載ランド5
以外は保護カバー6により覆われている。この部品搭載
ランド5には、第2の基板2及び実装部品7が搭載され
ており、半田8で固定されかつ電気的に接続されてい
る。また、リード端子9も半田8で固定されかつ電気的
に接続されている。これら第1の基板1、第2の基板2
及び実装部品7は耐湿性樹脂32によりケース10内に
封止されている。
The outline of this hybrid integrated circuit device will be described. Wiring patterns made of a conductive material 4 are formed on both surfaces of a first substrate 1 and component mounting lands 5 of the conductive material 4 are formed.
Others are covered by a protective cover 6. The second substrate 2 and the mounted component 7 are mounted on the component mounting land 5, and are fixed with solder 8 and electrically connected. The lead terminals 9 are also fixed by solder 8 and are electrically connected. These first substrate 1 and second substrate 2
The mounted component 7 is sealed in the case 10 by the moisture-resistant resin 32.

【0027】この混成集積回路装置では、第1の基板1
と第2の基板2との間は、ボイドの無い緻密な樹脂31
により封止されており、例えば、温度サイクル試験等の
ように、高温と低温を繰り返し加えるストレスを受けた
場合でも、耐湿性樹脂32が膨張・収縮を繰り返しても
基板1、2の曲げ応力にはならず、基板割れやクラック
等の不具合の発生を防止することが可能である。
In this hybrid integrated circuit device, the first substrate 1
Between the first substrate 2 and the second substrate 2 is a dense resin 31 having no voids.
Even when subjected to a stress that repeatedly applies a high temperature and a low temperature as in a temperature cycle test, for example, the bending resistance of the substrates 1 and 2 is reduced even when the moisture resistant resin 32 repeatedly expands and contracts. However, it is possible to prevent problems such as substrate cracks and cracks from occurring.

【0028】また、この緻密な樹脂31は、第1の基板
1と第2の基板2とを機械的に固定する役割を有し、し
かも、その膨張係数がこれら基板1、2の材料のそれと
ほぼ等しいため、温度の繰り返しストレスが加わっても
半田8部分への機械的ストレスを防止することが可能で
ある。したがって、半田8による接続部分の信頼性を向
上させることが可能である。
The dense resin 31 has a role of mechanically fixing the first substrate 1 and the second substrate 2, and its expansion coefficient is different from that of the materials of the substrates 1 and 2. Since they are almost equal, it is possible to prevent mechanical stress on the solder 8 even when repeated stress of temperature is applied. Therefore, it is possible to improve the reliability of the connection part by the solder 8.

【0029】次に、この混成集積回路装置のケース封止
工程について図2に基づき説明する。まず、同図(a)
に示すように、第1の基板1に第2の基板2及び実装部
品7を半田8により実装した後、第1の基板1と第2の
基板2との間に緻密な樹脂31を注入し、リード端子9
を半田8により第1の基板1に取り付け、外装前の半製
品33とする。緻密な樹脂31としてはフェノール樹脂
が好適である。次いで、同図(b)に示すように、外装
用のケース10を水平に置いた状態で、このケース10
内に所定量の熱硬化性の液状の耐湿性樹脂34を注入す
る。液状の耐湿性樹脂34としては液状のウレタン樹脂
が好適である。
Next, a case sealing step of the hybrid integrated circuit device will be described with reference to FIG. First, FIG.
As shown in (2), after mounting the second substrate 2 and the mounting component 7 on the first substrate 1 by soldering 8, a dense resin 31 is injected between the first substrate 1 and the second substrate 2. , Lead terminal 9
Is attached to the first substrate 1 with the solder 8 to obtain a semi-finished product 33 before the exterior. As the dense resin 31, a phenol resin is preferable. Next, as shown in FIG. 2B, the exterior case 10 is placed horizontally, and
A predetermined amount of a thermosetting liquid moisture-resistant resin 34 is injected into the inside. As the liquid moisture-resistant resin 34, a liquid urethane resin is preferable.

【0030】次いで、同図(c)に示すように、半製品
33をリード端子9を上にしかつ第1の基板1を水平に
保持した状態で、水平に置かれた状態のケース10内に
嵌め込み、第2の基板2及び該第2の基板2の搭載面と
同じ実装面の実装部品7を液状の耐湿性樹脂34に浸漬
する。この場合、第1の基板1と第2の基板2との間に
は既に緻密な樹脂31が充填されているので、空気たま
りが発生することはない。
Next, as shown in FIG. 1C, the semi-finished product 33 is placed in the case 10 placed horizontally with the lead terminals 9 facing up and the first substrate 1 held horizontally. The second substrate 2 and the mounting component 7 on the same mounting surface as the mounting surface of the second substrate 2 are immersed in the liquid moisture-resistant resin 34. In this case, the space between the first substrate 1 and the second substrate 2 is already filled with the dense resin 31, so that no air pool is generated.

【0031】次いで、同図(d)に示すように、第1の
基板1の第2の基板2と反対側の実装面上に液状の耐湿
性樹脂34を所定量充填する。その後、所定の温度で所
定時間熱処理を行なうことにより、液状の耐湿性樹脂3
4を硬化させて耐湿性樹脂32とし、第1の基板1、第
2の基板2及び実装部品7を含む実装部品全体を外装す
る。
Next, as shown in FIG. 1D, a predetermined amount of liquid moisture-resistant resin 34 is filled on the mounting surface of the first substrate 1 opposite to the second substrate 2. Thereafter, a heat treatment is performed at a predetermined temperature for a predetermined time so that the liquid moisture-resistant resin 3
4 is cured to form a moisture-resistant resin 32, and the entire mounted component including the first substrate 1, the second substrate 2, and the mounted component 7 is packaged.

【0032】このケース封止工程では、第1の基板1と
第2の基板2との間に緻密な樹脂31を充填したため、
これらの基板1、2間にボイドの無い状態で外装するこ
とができる。また、耐湿性樹脂32からの応力が基板
1、2に加わっても、充填された緻密な樹脂31により
基板1、2間にボイドが存在せず曲げ応力が加わり難い
状態になっているので、基板1、2にクラックや割れが
発生することはない。
In the case sealing step, the space between the first substrate 1 and the second substrate 2 was filled with the dense resin 31.
The packaging can be performed without a void between the substrates 1 and 2. Further, even if the stress from the moisture resistant resin 32 is applied to the substrates 1 and 2, the voids do not exist between the substrates 1 and 2 due to the filled dense resin 31, so that the bending stress is hardly applied. No cracks or cracks occur in the substrates 1 and 2.

【0033】本実施形態の混成集積回路装置によれば、
第1の基板1と第2の基板2との間にボイドの無い緻密
な樹脂31を充填したので、これらの基板1、2の周囲
の耐湿性樹脂32が環境温度の変化により膨張・収縮を
起こしても、基板1、2に対して曲げ応力が働かず、基
板1、2のクラックや割れを防止することができ、耐熱
性に対して信頼性を向上させることができる。
According to the hybrid integrated circuit device of the present embodiment,
Since the dense resin 31 having no void is filled between the first substrate 1 and the second substrate 2, the moisture-resistant resin 32 around these substrates 1 and 2 expands and contracts due to a change in environmental temperature. Even if it occurs, no bending stress acts on the substrates 1 and 2, cracks and cracks of the substrates 1 and 2 can be prevented, and reliability with respect to heat resistance can be improved.

【0034】また、第1の基板1と第2の基板2とを、
膨張係数がこれらの基板1、2とほぼ等しい緻密な樹脂
31で機械的に固定しているので、その周囲の耐湿性樹
脂32が環境温度の変化により膨張・収縮を起こして
も、半田8の部分に機械的ストレスが加わらず、また、
樹脂31の膨張・収縮自体も半田8の部分に影響を与え
ることもなく、実装の半田8の部分に剥離、歪、クラッ
ク等が発生するのを防止することができ、半田8による
接続部分の信頼性を向上させることができる。
Further, the first substrate 1 and the second substrate 2 are
Since it is mechanically fixed with a dense resin 31 having an expansion coefficient substantially equal to those of the substrates 1 and 2, even if the surrounding moisture resistant resin 32 expands and contracts due to a change in environmental temperature, the solder 8 No mechanical stress is applied to the part,
The expansion / contraction of the resin 31 itself does not affect the solder 8 portion, so that peeling, distortion, cracks and the like can be prevented from being generated in the mounted solder 8 portion. Reliability can be improved.

【0035】(第2の実施形態)図3は本発明の第2の
実施形態の混成集積回路装置を示す断面図であり、本実
施形態の混成集積回路装置が上述した第1の実施形態の
混成集積回路装置と異なる点は、第1の基板1及び第2
の基板2にほぼ等しい(近い)膨張係数を有するボイド
の無い緻密な樹脂31を、第1の基板1、第2の基板2
及び実装部品7を含む全体を覆うように塗布した点であ
る。
(Second Embodiment) FIG. 3 is a sectional view showing a hybrid integrated circuit device according to a second embodiment of the present invention. The difference from the hybrid integrated circuit device is that the first substrate 1 and the second substrate
A void-free dense resin 31 having an expansion coefficient substantially equal to (close to) the substrate 2 of the first substrate 1 and the second substrate 2
And that it is applied so as to cover the whole including the mounted components 7.

【0036】この混成集積回路装置では、緻密な樹脂3
1により実装部品全体が固定されるので、耐湿性樹脂3
2の膨張・収縮による応力が実装部品全体に機械的スト
レスを加えた場合であっても、これら基板1、2及び各
実装部品7の半田8部分への機械的ストレスを緩和する
ことができ、これら基板1、2及び各実装部品7の半田
8部分の信頼性を向上させることができる。
In this hybrid integrated circuit device, the dense resin 3
Since the entire mounting component is fixed by 1, the moisture-resistant resin 3
Even when the stress due to expansion and contraction of 2 applies mechanical stress to the entire mounted component, the mechanical stress on the solder 8 of the substrates 1 and 2 and each mounted component 7 can be reduced, It is possible to improve the reliability of the solders 8 of the substrates 1 and 2 and each mounting component 7.

【0037】なお、本実施形態の混成集積回路装置で
は、第1の基板1及び第2の基板2にほぼ等しい膨張係
数を有する緻密な樹脂31を、第1の基板1、第2の基
板2及び実装部品7を含む全体を覆うように塗布した
が、本実施形態に限定されることなく、それぞれの形状
や大きさに合わせて様々な構成とすることが可能であ
る。
In the hybrid integrated circuit device of this embodiment, the dense resin 31 having an expansion coefficient substantially equal to that of the first substrate 1 and the second substrate 2 is applied to the first substrate 1 and the second substrate 2. Although the coating is performed so as to cover the entirety including the mounting components 7, various configurations can be made according to the shapes and sizes without being limited to the present embodiment.

【0038】例えば、第1の基板および/または第2の
基板に実装される実装部品間、及び該実装部品と該実装
部品が実装される基板との間に、前記樹脂31を注入し
た構成、あるいは第1の基板および/または第2の基板
の複数の実装部品が実装される領域に前記樹脂31を注
入し前記複数の実装部品をプリコートした構成としても
よい。
For example, a configuration in which the resin 31 is injected between mounted components mounted on the first substrate and / or the second substrate, and between the mounted components and the substrate on which the mounted components are mounted, Alternatively, the resin 31 may be injected into a region of the first substrate and / or the second substrate where a plurality of mounted components are mounted, and the plurality of mounted components may be pre-coated.

【0039】[0039]

【発明の効果】以上説明した様に、本発明の請求項1、
2、3または7記載の混成集積回路装置によれば、少な
くともこれらの基板間を空隙の無い緻密な樹脂により封
止したので、これらの基板間に空隙が生じる虞が無くな
り、したがって、温度変化により耐湿性樹脂に膨張・収
縮が起こったとしても、これらの基板の周囲に空隙が無
く、基板に曲げ応力が働く虞が無くなるので、基板にク
ラックや割れ等の不具合が発生するのを防止することが
できる。
As described above, according to the first aspect of the present invention,
According to the hybrid integrated circuit device described in 2, 3 or 7, since at least the space between these substrates is sealed with a dense resin having no space, there is no possibility that a space is formed between these substrates. Even if the moisture-resistant resin expands or contracts, there is no gap around these substrates, and there is no risk of bending stress acting on the substrates, so that problems such as cracks and cracks are prevented from occurring on the substrates. Can be.

【0040】また、基板間を緻密な樹脂により封止した
ので、これら基板同士が固定され、耐湿性樹脂の膨張・
収縮による応力がこれら基板に機械的ストレスを加えた
場合においても、これらの基板の半田部分への機械的ス
トレスを緩和することができる。したがって、半田部分
に剥離、歪、クラック等が生じる虞が無くなり、半田に
よる接続部分の信頼性を向上させることができる。
Further, since the substrates are sealed with a dense resin, these substrates are fixed to each other, and the expansion of the moisture-resistant resin is prevented.
Even when a stress due to shrinkage applies a mechanical stress to these substrates, it is possible to reduce the mechanical stress on the solder portions of these substrates. Therefore, there is no possibility that peeling, distortion, cracks, etc. will occur in the solder portion, and the reliability of the connection portion by solder can be improved.

【0041】請求項4記載の混成集積回路装置によれ
ば、前記第1の基板及び第2の基板を含む実装部品全体
を、前記第1の基板及び第2の基板に近い膨張係数を有
する樹脂により覆ったので、耐湿性樹脂の膨張・収縮に
よる応力が実装部品全体に機械的ストレスを加えた場合
においても、これら基板及び各部品の半田部分への機械
的ストレスを緩和することができ、これら基板及び各部
品の半田部分の信頼性を向上させることができる。
According to the hybrid integrated circuit device of the fourth aspect, the entire mounting component including the first substrate and the second substrate is made of a resin having an expansion coefficient close to that of the first substrate and the second substrate. Even when the stress due to the expansion and contraction of the moisture-resistant resin applies mechanical stress to the entire mounted components, the mechanical stress on the solder parts of these boards and components can be alleviated. It is possible to improve the reliability of the solder part of the board and each component.

【0042】請求項5記載の混成集積回路装置によれ
ば、前記第1の基板および/または第2の基板に実装さ
れる実装部品間、及び該実装部品と該実装部品が実装さ
れる前記基板との間に、前記第1の基板及び第2の基板
に近い膨張係数を有する樹脂を注入したので、耐湿性樹
脂の膨張・収縮による応力がこれら部品及び基板に機械
的ストレスを加えた場合においても、これらの部品の半
田部分への機械的ストレスを緩和することができ、これ
ら部品の半田部分の信頼性を向上させることができる。
According to the hybrid integrated circuit device of the fifth aspect, between the mounted components mounted on the first substrate and / or the second substrate and between the mounted components and the substrate mounted with the mounted components Between the first substrate and the second substrate, a resin having an expansion coefficient close to that of the first substrate and the second substrate is injected. In addition, mechanical stress on the solder portion of these components can be reduced, and the reliability of the solder portions of these components can be improved.

【0043】請求項6記載の混成集積回路装置によれ
ば、前記第1の基板および/または第2の基板の複数の
実装部品が実装される領域に、前記第1の基板及び第2
の基板に近い膨張係数を有する樹脂を注入し前記複数の
実装部品をプリコートしたので、耐湿性樹脂の膨張・収
縮による応力がこの領域の各部品に機械的ストレスを加
えた場合においても、この領域の各部品の半田部分への
機械的ストレスを緩和することができ、この領域の各部
品の半田部分の信頼性を向上させることができる。
According to the hybrid integrated circuit device of the sixth aspect, the first substrate and / or the second substrate are provided in a region of the first substrate and / or the second substrate where a plurality of mounting components are mounted.
Since a resin having an expansion coefficient close to that of the substrate is injected and the plurality of mounted components are pre-coated, the stress due to the expansion and contraction of the moisture-resistant resin may cause a mechanical stress on each component in this region. The mechanical stress on the solder portion of each component can be reduced, and the reliability of the solder portion of each component in this region can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の第1の実施形態の混成集積回路装置
を示す断面図である。
FIG. 1 is a sectional view showing a hybrid integrated circuit device according to a first embodiment of the present invention.

【図2】 本発明の第1の実施形態の混成集積回路装置
のケース封止工程を示す過程図である。
FIG. 2 is a process diagram showing a case sealing step of the hybrid integrated circuit device according to the first embodiment of the present invention.

【図3】 本発明の第2の実施形態の混成集積回路装置
を示す断面図である。
FIG. 3 is a cross-sectional view illustrating a hybrid integrated circuit device according to a second embodiment of the present invention.

【図4】 従来の混成集積回路装置を示す断面図であ
る。
FIG. 4 is a cross-sectional view showing a conventional hybrid integrated circuit device.

【図5】 従来の混成集積回路装置のケース封止工程を
示す過程図である。
FIG. 5 is a process diagram showing a case sealing step of a conventional hybrid integrated circuit device.

【符号の説明】[Explanation of symbols]

1 第1の基板 2 第2の基板 4 導体材料 5 部品搭載ランド 6 保護カバー 7 実装部品 8 半田 9 リード端子 10 ケース 11 ウレタン樹脂 12 空気 13 ボイド(空隙) 21 半製品 22 液状ウレタン樹脂 31 緻密な樹脂 32 耐湿性樹脂 33 半製品 34 液状の耐湿性樹脂 REFERENCE SIGNS LIST 1 first substrate 2 second substrate 4 conductive material 5 component mounting land 6 protective cover 7 mounting component 8 solder 9 lead terminal 10 case 11 urethane resin 12 air 13 void (gap) 21 semi-finished product 22 liquid urethane resin 31 dense Resin 32 Moisture resistant resin 33 Semi-finished product 34 Liquid moisture resistant resin

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 主要部を構成する第1の基板に、少なく
とも1枚以上の第2の基板が実装され、これら第1の基
板及び第2の基板が耐湿性樹脂によりケース内に封止さ
れた混成集積回路装置において、 少なくともこれらの基板間を空隙の無い緻密な樹脂によ
り封止したことを特徴とする混成集積回路装置。
At least one or more second substrates are mounted on a first substrate constituting a main part, and the first and second substrates are sealed in a case with a moisture-resistant resin. A hybrid integrated circuit device, characterized in that at least the space between the substrates is sealed with a dense resin having no void.
【請求項2】 前記耐湿性樹脂は、ウレタン系樹脂であ
ることを特徴とする請求項1記載の混成集積回路装置。
2. The hybrid integrated circuit device according to claim 1, wherein said moisture-resistant resin is a urethane-based resin.
【請求項3】 前記緻密な樹脂は、前記第1の基板及び
第2の基板に近い膨張係数を有する樹脂であることを特
徴とする請求項1記載の混成集積回路装置。
3. The hybrid integrated circuit device according to claim 1, wherein said dense resin is a resin having an expansion coefficient close to that of said first substrate and said second substrate.
【請求項4】 前記第1の基板及び第2の基板を含む実
装部品全体を、前記第1の基板及び第2の基板に近い膨
張係数を有する樹脂により覆ったことを特徴とする請求
項1記載の混成集積回路装置。
4. The whole mounting component including the first substrate and the second substrate is covered with a resin having an expansion coefficient close to that of the first substrate and the second substrate. A hybrid integrated circuit device as described.
【請求項5】 前記第1の基板および/または第2の基
板に実装される実装部品間、及び該実装部品と該実装部
品が実装される前記基板との間に、前記第1の基板及び
第2の基板に近い膨張係数を有する樹脂を注入したこと
を特徴とする請求項1記載の混成集積回路装置。
5. The method according to claim 1, wherein the first substrate and / or the second substrate are mounted on the first substrate and / or the second substrate, and between the mounted component and the substrate on which the mounted component is mounted. 2. The hybrid integrated circuit device according to claim 1, wherein a resin having an expansion coefficient close to that of the second substrate is injected.
【請求項6】 前記第1の基板および/または第2の基
板の複数の実装部品が実装される領域に、前記第1の基
板及び第2の基板に近い膨張係数を有する樹脂を注入し
前記複数の実装部品をプリコートしたことを特徴とする
請求項1記載の混成集積回路装置。
6. A resin having an expansion coefficient close to that of the first substrate and the second substrate is injected into a region of the first substrate and / or the second substrate on which a plurality of mounting components are mounted. 2. The hybrid integrated circuit device according to claim 1, wherein a plurality of mounted components are pre-coated.
【請求項7】 前記第1の基板及び第2の基板に近い膨
張係数を有する樹脂は、フェノール系樹脂であることを
特徴とする請求項3ないし6のいずれか1項記載の混成
集積回路装置。
7. The hybrid integrated circuit device according to claim 3, wherein the resin having an expansion coefficient close to those of the first substrate and the second substrate is a phenolic resin. .
JP21229597A 1997-08-06 1997-08-06 Hybrid integrated circuit device Expired - Fee Related JP3156642B2 (en)

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Application Number Priority Date Filing Date Title
JP21229597A JP3156642B2 (en) 1997-08-06 1997-08-06 Hybrid integrated circuit device

Publications (2)

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JPH1154667A true JPH1154667A (en) 1999-02-26
JP3156642B2 JP3156642B2 (en) 2001-04-16

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Country Status (1)

Country Link
JP (1) JP3156642B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019068030A (en) * 2017-09-28 2019-04-25 株式会社デンソー Electronic device and manufacturing method of the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019068030A (en) * 2017-09-28 2019-04-25 株式会社デンソー Electronic device and manufacturing method of the same

Also Published As

Publication number Publication date
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