JPH1151974A - Probe adapter - Google Patents

Probe adapter

Info

Publication number
JPH1151974A
JPH1151974A JP20668597A JP20668597A JPH1151974A JP H1151974 A JPH1151974 A JP H1151974A JP 20668597 A JP20668597 A JP 20668597A JP 20668597 A JP20668597 A JP 20668597A JP H1151974 A JPH1151974 A JP H1151974A
Authority
JP
Japan
Prior art keywords
converter
signal
measured
probe
voltage level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20668597A
Other languages
Japanese (ja)
Inventor
Motoharu Nakasuji
基晴 中筋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP20668597A priority Critical patent/JPH1151974A/en
Publication of JPH1151974A publication Critical patent/JPH1151974A/en
Pending legal-status Critical Current

Links

Landscapes

  • Analogue/Digital Conversion (AREA)

Abstract

PROBLEM TO BE SOLVED: To measure the voltage level of an optional frequency in a wide band without using a spectrum analyzer by storing the A/D converter of a BPF, the frequency band variable volume control of the filter, and a switch by passing them. SOLUTION: When the voltage level of a signal line and the timing of the wave-form are to be confirmed, a BPF is short-circuited by a switch 3, and the signal to be measured is inputted to an input connector 21 via a probe 1. The A/D converter 4 of the BPF digitizes the signal to be measured and outputs it to a microcomputer 5. The microcomputer 5 samples the signal to be measured at the frequency set by a frequency changing volume control 7, calculates it, and outputs the change quantity of the voltage level to a D/A converter 6. The D/A converter 6 again converts it into an analog value and transmits it to an oscilloscope 8. When the digitally converted BPF is inserted, the voltage level of an optional frequency in a wide band can be measured without using a spectrum analyzer.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、プローブアダプタ
に係り、特に、EMI対策を行なった開発業務に使用す
るプローブのプローブアダプタに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe adapter, and more particularly, to a probe adapter for a probe used in a development business in which EMI measures are taken.

【0002】[0002]

【従来の技術】従来の信号線のEMI対策方法は、図2
に示すように、測定器として電圧波形確認用のオシロス
コープ8及びプローブ1、さらに周波数レベル確認用の
スペクトラムアナライザ108及びプローブ101の双
方を使用していた。
2. Description of the Related Art FIG.
As shown in FIG. 5, the oscilloscope 8 and the probe 1 for confirming the voltage waveform and the spectrum analyzer 108 and the probe 101 for confirming the frequency level are both used as measuring instruments.

【0003】[0003]

【発明が解決しようとする課題】上述のように、従来の
プローブ装置では、信号線の対策効果確認にオシロスコ
ープ8とスペクトラムアナライザ108との双方が必要
であり、かつスペクトラムアナライザ108が周波数レ
ベルを減衰量で表示し、実際の電圧レベルが不明である
という課題があった。
As described above, in the conventional probe device, both the oscilloscope 8 and the spectrum analyzer 108 are required to confirm the countermeasure effect of the signal line, and the spectrum analyzer 108 attenuates the frequency level. There is a problem in that the actual voltage level is unknown in terms of the amount.

【0004】そこで、本発明の目的は、スペクトラムア
ナライザを使用せずに広帯域で任意の周波数の電圧レベ
ルの測定ができるプローブアダプタを提供することにあ
る。
An object of the present invention is to provide a probe adapter capable of measuring a voltage level at an arbitrary frequency over a wide band without using a spectrum analyzer.

【0005】[0005]

【課題を解決するための手段】上述の課題を解決するた
めに、本発明のプローブアダプタは、被測定信号を検出
するプローブと、このプローブで検出された被測定信号
をディジタル変換するA/Dコンバータと、このA/D
コンバータでディジタル変換された被測定信号をサンプ
リングするマイクロコンピュータと、このマイクロコン
ピュータでサンプリングされた被測定信号をアナログ変
換するD/Aコンバータと、このD/Aコンバータでア
ナログ変換された被測定信号をオシロスコープへ伝達す
るコネクタと、被測定信号をバイパスする上記A/Dコ
ンバータとD/Aコンバータ間に接続されたスイッチと
で構成されたことを特徴とする。
In order to solve the above-mentioned problems, a probe adapter according to the present invention comprises a probe for detecting a signal to be measured and an A / D for digitally converting the signal to be measured detected by the probe. Converter and this A / D
A microcomputer that samples the signal under test digitally converted by the converter, a D / A converter that converts the signal under test sampled by the microcomputer into an analog signal, and a signal that is analog-converted by the D / A converter. It is characterized by comprising a connector for transmitting to the oscilloscope, and a switch connected between the A / D converter and the D / A converter for bypassing the signal under measurement.

【0006】[0006]

【発明の実施の形態】次に、本発明の一実施の形態によ
るプローブアダプタを図面を参照して説明する。
Next, a probe adapter according to an embodiment of the present invention will be described with reference to the drawings.

【0007】本発明の一実施の形態によるプローブアダ
プタは、図1に示すように、被測定信号を検出するプロ
ーブ1と、このプローブ1で検出された被測定信号をデ
ィジタル変換するA/Dコンバータ4と、このA/Dコ
ンバータ4でディジタル変換された被測定信号をサンプ
リングするマイクロコンピュータ5と、このマイクロコ
ンピュータ5でサンプリングされた被測定信号をアナロ
グ変換するD/Aコンバータ6と、このD/Aコンバー
タ6でアナログ変換された被測定信号をオシロスコープ
8へ伝達するコネクタ22と、被測定信号をバイパスす
るA/Dコンバータ4とD/Aコンバータ6間に接続さ
れたスイッチ3及び周波数変更用のボリューム7とで構
成される。
As shown in FIG. 1, a probe adapter according to an embodiment of the present invention includes a probe 1 for detecting a signal to be measured and an A / D converter for digitally converting the signal to be measured detected by the probe 1. 4, a microcomputer 5 for sampling the signal to be measured digitally converted by the A / D converter 4, a D / A converter 6 for converting the signal to be measured sampled by the microcomputer 5 to analog, A connector 22 for transmitting the signal under test analog-converted by the A converter 6 to the oscilloscope 8, a switch 3 connected between the A / D converter 4 and the D / A converter 6 for bypassing the signal under test, and a switch for changing the frequency. And a volume 7.

【0008】次に、本発明の一実施の形態によるプロー
ブアダプタの動作を図面を参照して説明する。
Next, the operation of the probe adapter according to one embodiment of the present invention will be described with reference to the drawings.

【0009】本発明の一実施の形態によるプローブアダ
プタの動作は、図1に示すように、スイッチ3が信号線
の電圧レベルと波形のタイミングとを確認する場合にバ
ンドパスフィルタを短絡し、被測定信号がプローブ1を
介して入力コネクタ21へ入力され、バンドパスフィル
タのA/Dコンバータ4が被測定信号をディジタル化し
てマイクロコンピュータ5へ出力し、マイクロコンピュ
ータ6が周波数変更用のボリューム7で設定された周波
数で、被測定信号をサンプリング化及び演算して電圧レ
ベルの変化量をD/Aコンバータ6へ出力して再度アナ
ログ化してオシロスコープ8へ伝達する。
As shown in FIG. 1, the operation of the probe adapter according to the embodiment of the present invention is as follows. When the switch 3 checks the voltage level of the signal line and the timing of the waveform, the band-pass filter is short-circuited, and The measurement signal is input to the input connector 21 via the probe 1, the A / D converter 4 of the band-pass filter digitizes the signal to be measured and outputs it to the microcomputer 5, and the microcomputer 6 uses the volume 7 for frequency change. At the set frequency, the signal under measurement is sampled and calculated, and the amount of change in the voltage level is output to the D / A converter 6, converted into an analog signal again, and transmitted to the oscilloscope 8.

【0010】[0010]

【発明の効果】以上説明したように、本発明のプローブ
アダプタによれば、ディジタル変換したバンドパスフィ
ルターを挿入することにより、スペクトラムアナライザ
を使用せずに広帯域な任意の周波数の電圧レベルの測定
ができる効果がある。
As described above, according to the probe adapter of the present invention, by inserting a digital-converted band-pass filter, it is possible to measure the voltage level of an arbitrary frequency over a wide band without using a spectrum analyzer. There is an effect that can be done.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態によるプローブアダプタ
のブロック構成図である。
FIG. 1 is a block diagram of a probe adapter according to an embodiment of the present invention.

【図2】従来のプローブ装置のブロック構成図である。FIG. 2 is a block diagram of a conventional probe device.

【符号の説明】[Explanation of symbols]

1 プローブ 2 プローブアダプタ 3 スイッチ 4 A/Dコンバータ 5 マイクロコンピュータ 6 D/Aコンバータ 7 マイクロコンピュータ(ボリューム) 8 オシロスコープ 21,22 プローブアダプタ(コネクタ) Reference Signs List 1 probe 2 probe adapter 3 switch 4 A / D converter 5 microcomputer 6 D / A converter 7 microcomputer (volume) 8 oscilloscope 21, 22 probe adapter (connector)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 被測定信号を検出するプローブと、この
プローブで検出された被測定信号をディジタル変換する
A/Dコンバータと、このA/Dコンバータでディジタ
ル変換された被測定信号をサンプリングするマイクロコ
ンピュータと、このマイクロコンピュータでサンプリン
グされた被測定信号をアナログ変換するD/Aコンバー
タと、このD/Aコンバータでアナログ変換された被測
定信号をオシロスコープへ伝達するコネクタと、被測定
信号をバイパスする上記A/DコンバータとD/Aコン
バータ間に接続されたスイッチとで構成されたことを特
徴とするプローブアダプタ。
A probe for detecting a signal to be measured, an A / D converter for digitally converting the signal to be measured detected by the probe, and a micro-sampler for sampling the signal to be measured digitally converted by the A / D converter. A computer, a D / A converter for converting a signal under test sampled by the microcomputer into an analog signal, a connector for transmitting the signal under test analog-converted by the D / A converter to an oscilloscope, and bypassing the signal under test. A probe adapter comprising the A / D converter and a switch connected between the D / A converter.
JP20668597A 1997-07-31 1997-07-31 Probe adapter Pending JPH1151974A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20668597A JPH1151974A (en) 1997-07-31 1997-07-31 Probe adapter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20668597A JPH1151974A (en) 1997-07-31 1997-07-31 Probe adapter

Publications (1)

Publication Number Publication Date
JPH1151974A true JPH1151974A (en) 1999-02-26

Family

ID=16527425

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20668597A Pending JPH1151974A (en) 1997-07-31 1997-07-31 Probe adapter

Country Status (1)

Country Link
JP (1) JPH1151974A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1335207A2 (en) * 2002-02-11 2003-08-13 Tektronix, Inc. Method and device for capturing a signal
EP1335208A2 (en) * 2002-02-11 2003-08-13 Tektronix, Inc. Method and apparatus for the digital and analog triggering
JP2015040858A (en) * 2013-08-22 2015-03-02 テクトロニクス・インコーポレイテッドTektronix,Inc. Probe and use method of the same
CN106680618A (en) * 2016-11-17 2017-05-17 上海精密计量测试研究所 Measuring device and measuring method for impulse intensity of EMI measuring system

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1335207A2 (en) * 2002-02-11 2003-08-13 Tektronix, Inc. Method and device for capturing a signal
EP1335208A2 (en) * 2002-02-11 2003-08-13 Tektronix, Inc. Method and apparatus for the digital and analog triggering
EP1335208A3 (en) * 2002-02-11 2003-10-15 Tektronix, Inc. Method and apparatus for the digital and analog triggering
EP1335207A3 (en) * 2002-02-11 2003-10-15 Tektronix, Inc. Method and device for capturing a signal
US6847199B2 (en) 2002-02-11 2005-01-25 Tektronix, Inc. Capturing both digital and analog forms of a signal through the same probing path
US7227349B2 (en) 2002-02-11 2007-06-05 Tektronix, Inc. Method and apparatus for the digital and analog triggering of a signal analysis device
JP2015040858A (en) * 2013-08-22 2015-03-02 テクトロニクス・インコーポレイテッドTektronix,Inc. Probe and use method of the same
CN106680618A (en) * 2016-11-17 2017-05-17 上海精密计量测试研究所 Measuring device and measuring method for impulse intensity of EMI measuring system

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