JPH11353206A - Test support system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To interactively generate data for a test by providing steps wherein test data are restructured for a device to be developed and a simulation test is automatically conducted on the basis of the restructured test data. SOLUTION: In a step 1001, initial setting for the simulation test is performed starting with new test data. In a step 1002, one step of a new control program is read in and interpreted. In a step 1003, the step of the new control program interpreted in the step 1002 is executed. In a step 1004, test data related to the new test data are modified by the execution of the step of the new control program in the step 1003. In a step 1005, it is judged whether or not all the steps of the new control program are completed. The step 1001 is resumed when all the steps are not completed, and the simulation execution terminates when all the steps are completed.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test support system suitable for improving the efficiency of a simulation test particularly in a test process in the development of an embedded microcomputer system.

[0002]

2. Description of the Related Art For example, information processing Vol. 33No. 3 (pp. 2
30-239), the operation of all the devices of the system is simulated by a program, and the same response as that of the actual machine is returned.
An apparatus simulator capable of real-time graphical representation of the operation of an actual machine is known. The test for such a built-in microcomputer system does not consider the internal structure of the program for controlling the device, but focuses on only the input and output of the program, and performs a test by simulation.

[0003]

Generally, in a simulation test, information on the apparatus, a control program, and the like are input. Therefore, it is indispensable to understand these inputs in executing and verifying the test. But,
With the recent increase in the scale of the embedded microcomputer system, it has become difficult to grasp detailed information on the device. Also,
This also affects the means for reusing information.

[0004] Therefore, there has been a problem that a lot of man-hours are required for creating test data and verifying the test in the simulation test.

[0005] In order to solve the above problems, a first object of the present invention is to provide a test support system capable of interactively creating test data without making the user aware of the details of the apparatus. To provide.

A second object of the present invention is to provide a test support system that can reduce the number of test steps by reusing test results, thereby eliminating the need for test verification of a newly developed system. .

[0007]

In order to achieve the above object, the test support system of the present invention comprises: (a) comparing and analyzing input / output information of a device already developed and input / output information of a device to be newly developed; From the input / output information comparison and analysis results of the above steps, the test data consisting of the data given during the test on the already developed device and the test execution procedure is re-tested as the test data of the newly developed device. The method is characterized by comprising a step of constructing and a step of automatically executing a simulation test based on the reconstructed test data.

In addition, (b) the step of reconstructing test data given at the time of testing a device which has already been developed as test data of a device to be newly developed is performed by interactively interacting with a user on a graphical screen. The method is characterized by having a performing step.

(C) comparing and analyzing the input / output information of the already developed device with the input / output information of the newly developed device; The step of comparing and analyzing the test data given to the device to be tested, the step of extracting the setting for test execution and the portion for determining the result in the program for controlling the device to be newly developed, and the above three steps, The method further includes a step of determining that a test result of the device can be used as a test result of a newly developed device.

(D) The step of judging that a test result of a device already developed can be used as a test result of a device to be newly developed includes a step of not executing the test in a test of a device to be newly developed. It is characterized by having.

Further, (e) a step of judging that a test result of an already developed device can be used as a test result of a newly developed device, and a step of not executing the test in a test of a newly developed device. And interactively interacting with the user on a graphical screen.

[0012]

Embodiments of the present invention will be described below with reference to the drawings. The present invention is not limited by the embodiment.

FIG. 1 is a hardware configuration diagram of a test automation support system according to the present invention. In this test automation support system 100, 101 is a processing device, 102 is an input device, 103 is a display device, 104 is a memory, 105
Is an external storage device.

FIG. 2 is a processing outline of the test automation support system 100 of FIG. The new device information 201 is information defining the hardware configuration of a newly developed embedded microcomputer system, and is provided from outside.

As shown in FIG. 3, information defining a hardware configuration for performing a simulation test is described in accordance with the format of device information 301. The device information 301 is a device information definition table 302 that defines detailed information on each sub device in the target device.
And a shape definition table 303 that defines the shape of each sub device, and an I / O that defines the I / O command of each sub device.
An O definition table 304 and a function / operation definition table 305 for defining functions and operations in each sub device.
The shape definition table 303 defines a shape definition, an initial setting position, and an operation mode as information for displaying an animation of a sub device as a simple graphic model on a display screen during a simulation test.

In the I / O definition table 304, the I / O address of the sub device such as the communication mode, communication direction, function / meaning of the device, and I / O address to be accessed for returning the same response as the actual device by the simulation test is stored. Details regarding the O instruction are specified. Function / operation definition table 305
Defines the I / O details for the sub device, and defines what operation is to be performed depending on the value set in the address. The new device information 201 includes device information 301
In accordance with the format shown in FIG.

Returning to FIG. 2, the device information data group 202 includes:
This is a device information database for a system that has already been developed.

As shown in FIG. 4, the apparatus type definition table 401 is provided. The device type definition table 401 includes:
The name of a device that has already been developed is defined, and it is possible to refer to the device information 301 for that device.

Returning to FIG. 2, the test data group 203 is a database of test data for a system that has already been developed.

As shown in FIG. 5, it is composed of a test definition table 501 for each device. Device-specific test definition table 5
01 specifies the name of the already developed device,
Reference to the test data 502 for the device is possible.

FIG. 6 shows the structure of the test data 502. The test data 502 defines each test item according to the test item definition table 601. For test items, it is necessary to set test conditions for multiple sub devices and test samples in the target system,
These are defined in the test condition definition table 602.
The test condition definition table 602 includes an initial setting of each device and a test sample at the time of a simulation test, a constraint condition at the time of performing a simulation test, an activation condition that defines at which timing the condition is activated during the simulation test, and , Test determination conditions are defined, and the simulation test result is a test item definition table 6 with two values of success and failure as results.
01 is stored. The device information and the test sample information are based on the test condition definition table 602 and the device information definition table 302 and the test sample definition table 60.
3 is possible. In the test sample definition table 603, the names and values of all test samples are defined by the attribute definition table 604.

Returning to FIG. 2, the test data rebuilding process 20
4 compares and analyzes the new device information 201 and the device information data group 202, interactively presents the information to the user, and modifies the test data group 203 based on the test data reconstruction support 205 from the user. In addition, this is a process of generating test data and new test data 205 for a newly developed device.

FIG. 7 shows a flowchart of the test data reconstruction process 204. In step 701, the I / O definition table 304 and the function / operation definition table 305 for each device ID in the new device information 201 are obtained. In step 702, based on the table information obtained in step 701, the I / O definition table 304 and the function / operation definition table 3 in the device information data group 202
A search is made for a data value and an operation that match with each other. In step 703, the test data group 203 is searched using the data values and the operations in the table searched in step 702 as keys. By this search, the same or similar test data can be referred to a newly developed sub device.

In step 704, the coincidence points and differences between the tables searched in steps 701 and 702 are analyzed. In step 705, based on the information on the difference analyzed in step 704, all the items of the test data related to the difference are searched to extract an influence part on the test data. In step 706, the information analyzed in steps 704 and 705 is graphically presented to the user. In step 205, step 706
The user interactively generates new test data 206 for the new device based on the information presented in the above.

FIG. 8 shows a flowchart of the test data reconstruction support 205. In step 801, step 7
Reference is made to one item in the test data retrieved in 03. In step 802, the test data referred to in step 801 is newly copied and used as a template for new test data. In step 803, the user corrects the test data copied in step 802 with reference to the differences analyzed in step 704. Here, the equipment information necessary to create test data,
You can see all the information affected by the data correction. In step 804, the data modified in step 803 is searched for the range of influence on other data.
In step 805, the data retrieved in step 804 is modified based on the data value modified in step 803. At step 806, it is determined whether or not there is uncorrected test data.

FIG. 9 shows an example of information presentation to the user regarding test data reconstruction support. Reference numeral 901 denotes information on an already developed device, and reference numeral 902 denotes information on a newly developed device. The change information 903 analyzes the information in 901 and 902 and presents to the user what is different and what item is affected by the difference. In the example of the change information 903, regarding the sub device Arm, the operation is the same, but the value of the I / O address and the value of the operation condition are different, so that the user is informed that the value of the test condition is affected. Presenting. Therefore, the user can interactively correct the data based on the presented information.

Returning to FIG. 2, the new control program 207
Is software for controlling a newly developed device. The simulation execution 208 is a process of automatically executing a simulation test using the new device information 201, the new test data 206, and the new control program 207 as inputs.

FIG. 10 shows a flow chart of the simulation execution. In step 1001, initial settings for a simulation test are performed from the new test data 206. In step 1002, one step of the new control program 207 is read and interpreted. Step 1
At 003, one step of the new control program 206 interpreted at step 1002 is executed. Step 10
04, the new control program 2 in step 1003
06, the new test data 20
Change the test data affecting 6. Step 10
In step 05, it is determined whether or not all the steps of the new control program 206 have been completed.
If the processing ends in 001, the simulation execution ends.

As described in the above embodiment, by paying attention to the I / O operation in the new device information 201 and comparing and analyzing the device information data group 202, even if the user does not have detailed knowledge about the device, New test data 2 for a system newly developed based on the test data group 203
06 can be constructed.

Here, if the newly constructed new test data 206 logically coincides with the test on the already developed device with respect to the I / O operation, the test result can be reused. become.

The second embodiment of the present invention described below takes this problem into consideration. It is determined whether or not the test results can be reused.
By not executing a simulation test related to the test, the number of steps in the test process is reduced.

The hardware configuration of the second embodiment is the same as that of FIG. The functional configuration is as shown in FIG. 11 instead of FIG. Note that the same reference numerals as in FIG.
To 207) are the same as those in FIG. The newly provided test execution determination 1101 is a process for determining whether a test for a newly developed device is unnecessary to execute a test based on confirmation of a test for a device already developed.

FIG. 12 shows a flowchart of the test execution determination. In step 1201, new test data 2
Reference is made to each test condition of one test item in 06. In step 1202, the I / O definition table 304 and the function / operation definition table 305 in the new device information 201 relating to the test data referred to in step 1201 are obtained. In step 1203, the I / O in the device information data group 202 is determined from the table obtained in step 1202.
O definition table 304, function / operation definition table 305
Search for a data value and operation that match. In step 1204, the test data group 203 is set using the data value and the operation in the table searched in step 1203 as keys.
Search for.

At step 1205, step 1201
The part corresponding to each test condition referred to in the above is searched from the new control program 207. In step 1206, from each information obtained in steps 1201 to 1205, a test condition, a data value, a matching point of the operation,
Analyze the differences. Here, if the test conditions, data values, and operations match, it means that the contents of the test items logically match the test contents for the already developed device, and the test results are used as is. Will be able to do that. In step 1207, the information analyzed in step 1206 is presented to the user.

FIG. 13 shows an example of information presentation to the user regarding test execution determination. Reference numeral 1301 denotes information on an already developed device, and 1302 denotes information on a newly developed device. The test execution information 1303 includes 1301,
The information in 1302 is analyzed and the result of the test execution is presented to the user as to whether the result can be reused for a newly developed device. The example of the test execution information 1303 indicates to the user that the test result, the data value, and the operation match with respect to the sub device Arm, so that the test result can be reused for testing a new device. Therefore, the user determines whether to reuse the test based on the presented information.

Returning to FIG. 12, in step 1208, deletion or execution of a test item is determined based on the information presented in step 1207. In step 1209, it is determined whether there is any test item for which the test execution determination process has not been performed. If so, the process returns to step 1201; otherwise, the process ends.

Returning to FIG. 11, simulation execution 11
02 indicates new device information 201 and new test data 20
6. This is a process of automatically executing a simulation test by using the result of the new control program 207 and the result of the test execution determination 1101 as input.

FIG. 14 shows a flowchart of the simulation execution. In step 1401, it is determined whether the test data has been deleted in the test execution determination 1101. If it is deleted, the test result is reused, and the process ends because the simulation test is unnecessary. If not deleted, a simulation test is necessary, and the same processing as in the simulation execution 208 is performed.

[0039]

According to the test support system of the present invention,
A test for a newly-developed device based on test data for an already-developed device based on a comparison analysis result between an I / O operation of a newly-developed device and an I / O operation of an already-developed device. Since the data is reconstructed interactively, it is possible to save the trouble of grasping detailed information of the device.

Further, according to the test support system of the present invention, the already developed I / O operation of the newly developed device and the I / O operation of the already developed device are compared and analyzed based on the analysis result. Guidance on whether test data for equipment and test data for newly developed equipment logically match with each other is provided, so it is possible to judge reuse of test results without grasping detailed information on equipment. It becomes possible.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of hardware for implementing a test automation support system of the present invention.

FIG. 2 is a processing outline of the test automation support system 100 of FIG. 1;

FIG. 3 is an exemplary diagram of device information.

FIG. 4 is an exemplary diagram of a device information data group.

FIG. 5 is an exemplary diagram of a test data group.

FIG. 6 is an exemplary diagram of test data.

FIG. 7 is a flowchart of a test data reconstruction process.

FIG. 8 is a flowchart of test data reconstruction support.

FIG. 9 is a view showing an example of presentation of user information related to test data reconstruction support.

FIG. 10 is a flowchart of a simulation execution.

FIG. 11 is a view corresponding to FIG. 2 in a second embodiment of the present invention.

FIG. 12 is a flowchart of test result reuse determination.

FIG. 13 is a view showing an example of presentation of user information regarding test execution determination.

FIG. 14 is a flowchart of a simulation execution.

[Explanation of symbols]

201: new device information 202: device information data group 203: test data group 204
... test data reconstruction processing, 205 ... test data reconstruction support, 206 ... new test data, 207 ... new control program, 208 ... simulation execution,
1101 ... judge reuse of test result 1102 ... execute simulation

Claims (5)

[Claims] In a system for simulating the operation of a device controlled by a computer, a test support system for efficiently executing a test, wherein input / output information of an already developed device and newly developed devices are provided. The step of comparing and analyzing the input / output information of the device and the result of the comparison and analysis of the input / output information of the above-described step are used to newly add test data consisting of the data given at the time of testing the already developed device and the test execution procedure. A test support system comprising: a step of reconstructing test data of a device to be developed; and a step of automatically executing a simulation test based on the reconstructed test data. 2. The test support system according to claim 1, wherein the step of reconstructing test data given at the time of testing an already developed device as test data of a newly developed device is graphical. A test support system comprising a step of interactively interacting with a user on a screen. 3. The test support system according to claim 1, wherein input / output information of a device already developed and input / output information of a device to be newly developed are compared and analyzed; A step of comparing and analyzing the test data given to the device and the test data given to the newly developed device, and a step of extracting a setting for performing a test and judging a result in a program for controlling the newly developed device. And a step of determining from the above three steps that a test result of an already developed device can be used as a test result of a newly developed device. 4. A test support system according to claim 3, wherein the step of judging that a test result of an already developed device can be used as a test result of a device to be newly developed is newly developed. A test support system comprising a step that is not executed in a test of a device that performs the test. 5. The test support system according to claim 3, wherein a step of judging that a test result of a device already developed can be used as a test result of a device to be newly developed, and that the test is newly performed. A test support system characterized by comprising a step of interactively interacting with a user on a graphical screen, in a step not performed in a test of a device to be developed.