JPH11344471A - イオン化検出器における拡張検出ゾ―ン - Google Patents
イオン化検出器における拡張検出ゾ―ンInfo
- Publication number
- JPH11344471A JPH11344471A JP11115022A JP11502299A JPH11344471A JP H11344471 A JPH11344471 A JP H11344471A JP 11115022 A JP11115022 A JP 11115022A JP 11502299 A JP11502299 A JP 11502299A JP H11344471 A JPH11344471 A JP H11344471A
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- ionization
- source
- detector
- signal electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims abstract description 74
- 239000002245 particle Substances 0.000 claims abstract description 28
- 238000011144 upstream manufacturing Methods 0.000 claims abstract description 8
- 239000012491 analyte Substances 0.000 claims description 34
- 239000012530 fluid Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 4
- 230000004044 response Effects 0.000 abstract description 20
- 150000002500 ions Chemical class 0.000 abstract description 7
- 239000007789 gas Substances 0.000 description 34
- 229910052734 helium Inorganic materials 0.000 description 7
- 239000001307 helium Substances 0.000 description 7
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 7
- 229910052756 noble gas Inorganic materials 0.000 description 7
- 239000012159 carrier gas Substances 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 230000002285 radioactive effect Effects 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 230000005264 electron capture Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000012857 radioactive material Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- OKTJSMMVPCPJKN-IGMARMGPSA-N Carbon-12 Chemical group [12C] OKTJSMMVPCPJKN-IGMARMGPSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000003574 free electron Substances 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 150000002835 noble gases Chemical class 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000013375 chromatographic separation Methods 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000004868 gas analysis Methods 0.000 description 1
- 238000004817 gas chromatography Methods 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000000575 pesticide Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
- G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
- H01J41/02—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US070003 | 1998-04-30 | ||
| US09/070,003 US6107805A (en) | 1998-04-30 | 1998-04-30 | Extended detection zone in an ionization detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11344471A true JPH11344471A (ja) | 1999-12-14 |
| JPH11344471A5 JPH11344471A5 (enExample) | 2006-06-15 |
Family
ID=22092522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11115022A Pending JPH11344471A (ja) | 1998-04-30 | 1999-04-22 | イオン化検出器における拡張検出ゾ―ン |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6107805A (enExample) |
| JP (1) | JPH11344471A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019534995A (ja) * | 2016-08-24 | 2019-12-05 | ザ・リージェンツ・オブ・ザ・ユニバーシティ・オブ・ミシガンＴｈｅ Ｒｅｇｅｎｔｓ Ｏｆ Ｔｈｅ Ｕｎｉｖｅｒｓｉｔｙ Ｏｆ Ｍｉｃｈｉｇａｎ | 小型放電光イオン化検出器 |
| CN115436012A (zh) * | 2022-07-26 | 2022-12-06 | 中国科学院国家空间科学中心 | 一种测量自由分子流空间分布的装置及方法 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2413890B (en) * | 2001-08-20 | 2006-03-29 | Agilent Technologies Inc | Hermetically-sealed miniaturized discharge ionization detector |
| US6448777B1 (en) * | 2001-08-20 | 2002-09-10 | Agilent Technologies, Inc. | Hermetically-sealed miniaturized discharge ionization detector |
| RU2217739C1 (ru) * | 2002-10-18 | 2003-11-27 | Кудрявцев Анатолий Анатольевич | Способ анализа газов и ионизационный детектор для его осуществления |
| EP2028482A1 (de) * | 2007-08-18 | 2009-02-25 | Grundfos Management A/S | Sensorsystem zum Erfassen von Analyten in geringer Konzentration |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4789783A (en) * | 1987-04-02 | 1988-12-06 | Cook Robert D | Discharge ionization detector |
| US4975648A (en) * | 1989-07-24 | 1990-12-04 | Gow-Mac Instrument Co. | Discharge ionization detector |
| US5394091A (en) * | 1991-02-28 | 1995-02-28 | Wentworth; Wayne E. | System for detecting compounds in a gaseous sample by measuring photoionization and electron capture induced by spark excitation of helium |
| US5532599A (en) * | 1991-02-28 | 1996-07-02 | Stearns; Stanley D. | High voltage spark excitation and ionization system including disc detector |
| US5594346A (en) * | 1991-02-28 | 1997-01-14 | Valco Instruments Co., Inc. | Apparatus and methods for identifying and quantifying compounds using a plurality of pulsed rare gas photoionization detectors |
| US5153519A (en) * | 1991-02-28 | 1992-10-06 | Wentworth Wayne E | High voltage spark excitation and ionization detector system |
| US5528150A (en) * | 1991-02-28 | 1996-06-18 | Stearns; Stanley D. | Gas sampling apparatus including a sealed chamber cooperative with a separate detector chamber |
| US5394092A (en) * | 1991-02-28 | 1995-02-28 | Valco Instruments Co., Inc. | System for identifying and quantifying selected constituents of gas samples using selective photoionization |
| US5394090A (en) * | 1991-02-28 | 1995-02-28 | Wentworth; Wayne E. | Improved system for detecting compounds in a gaseous sample using induced photoionizations and electron capture detection |
| US5541519A (en) * | 1991-02-28 | 1996-07-30 | Stearns; Stanley D. | Photoionization detector incorporating a dopant and carrier gas flow |
| US5920072A (en) * | 1997-09-30 | 1999-07-06 | Hewlett-Packard Co. | Ionization detector |
-
1998
- 1998-04-30 US US09/070,003 patent/US6107805A/en not_active Expired - Lifetime
-
1999
- 1999-04-22 JP JP11115022A patent/JPH11344471A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019534995A (ja) * | 2016-08-24 | 2019-12-05 | ザ・リージェンツ・オブ・ザ・ユニバーシティ・オブ・ミシガンＴｈｅ Ｒｅｇｅｎｔｓ Ｏｆ Ｔｈｅ Ｕｎｉｖｅｒｓｉｔｙ Ｏｆ Ｍｉｃｈｉｇａｎ | 小型放電光イオン化検出器 |
| CN115436012A (zh) * | 2022-07-26 | 2022-12-06 | 中国科学院国家空间科学中心 | 一种测量自由分子流空间分布的装置及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6107805A (en) | 2000-08-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060420 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060420 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090203 |
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| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090430 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090630 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20091124 |