JPH11330321A - Overheating protective structure for circuit element - Google Patents

Overheating protective structure for circuit element

Info

Publication number
JPH11330321A
JPH11330321A JP13341198A JP13341198A JPH11330321A JP H11330321 A JPH11330321 A JP H11330321A JP 13341198 A JP13341198 A JP 13341198A JP 13341198 A JP13341198 A JP 13341198A JP H11330321 A JPH11330321 A JP H11330321A
Authority
JP
Japan
Prior art keywords
circuit element
heat
heat spreader
layer
metal substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13341198A
Other languages
Japanese (ja)
Inventor
Susumu Murakami
享 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Mechatronics Corp
Original Assignee
Shibaura Mechatronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibaura Mechatronics Corp filed Critical Shibaura Mechatronics Corp
Priority to JP13341198A priority Critical patent/JPH11330321A/en
Publication of JPH11330321A publication Critical patent/JPH11330321A/en
Pending legal-status Critical Current

Links

Landscapes

  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To improve the operational reliability of a circuit element, by preventing the occurrence of faults by heat in the element by making the detecting timing of the temperature fluctuation of the circuit element faster. SOLUTION: A circuit board 21 is constituted by laminating a metallic substrate 23 upon a radiator 23 and a heat spreader 27 upon the substrate 23 through an insulating layer 24, a wiring pattern layer 25, and a solder layer 26. On the heat spreader 27, a circuit element section 30 is constituted by laminating a circuit element 29 which generates heat upon the heat spreader 27 through another solder layer 28. On the heat spreader 27, in addition, a heat detecting element section 35 is also constituted by laminating an wiring pattern layer 32, a solder layer 33, and a thermistor 34 upon the heat spreader 27 in this order through an insulating layer 31.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、集積回路素子など
の回路素子の過熱防護構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an overheat protection structure for a circuit element such as an integrated circuit element.

【0002】[0002]

【従来の技術】図2は従来技術の回路基板1の断面図で
ある。以下、図2を参照して、従来技術について説明す
る。この従来技術の回路基板1は、放熱器2上に金属基
板3が積層され、金属基板3上には、電気絶縁性材料か
らなる絶縁層4、銅やアルミニウムをプリントして形成
される配線パターン層5、はんだ層6、ヒートスプレッ
ダ7、はんだ層8及び、例として、集積回路素子などの
発熱を伴う回路素子9が順次積層され、回路素子部10
を構成している。
2. Description of the Related Art FIG. 2 is a sectional view of a circuit board 1 according to the prior art. Hereinafter, the related art will be described with reference to FIG. In this conventional circuit board 1, a metal substrate 3 is laminated on a radiator 2, an insulating layer 4 made of an electrically insulating material, and a wiring pattern formed by printing copper or aluminum on the metal substrate 3. The layer 5, the solder layer 6, the heat spreader 7, the solder layer 8 and, for example, a circuit element 9 with heat generation such as an integrated circuit element are sequentially laminated, and a circuit element section 10 is formed.
Is composed.

【0003】また、前記金属基板3上には、前記絶縁層
4を介して、配線パターン層11、はんだ層12及びサ
ーミスタ13がこの順序で積層され、熱検知素子部14
を構成している。
On the metal substrate 3, a wiring pattern layer 11, a solder layer 12 and a thermistor 13 are laminated in this order via the insulating layer 4, and
Is composed.

【0004】このような回路基板1において、通電によ
って回路素子9で発生した熱は、図2に矢符A1で示さ
れるように、回路素子部10において、回路素子9から
はんだ層8、ヒートスプレッダ7、はんだ層6、配線パ
ターン層5及び絶縁層4を介して金属基板3に到達し、
金属基板3中を伝導して、熱検知素子部14における絶
縁層4、配線パターン層11及びはんだ層12を介して
サーミスタ13に到達し、サーミスタ13で熱が検知さ
れ、前記回路素子9の温度が温度信号として出力され
る。
[0004] In such a circuit board 1, heat generated in the circuit element 9 by energization is changed from the circuit element 9 to the solder layer 8 and the heat spreader 7 in the circuit element section 10 as shown by an arrow A 1 in FIG. 2. , Reaches the metal substrate 3 via the solder layer 6, the wiring pattern layer 5, and the insulating layer 4,
Conduction in the metal substrate 3 reaches the thermistor 13 via the insulating layer 4, the wiring pattern layer 11 and the solder layer 12 in the heat detecting element portion 14, and heat is detected by the thermistor 13. Is output as a temperature signal.

【0005】サーミスタ13からの温度信号は、図示し
ない制御装置に入力される。制御装置は、検出された回
路素子9の温度を基準温度と比較し、回路素子9が過熱
状態の場合は、回路素子9への通電を停止する制御を行
なう。
The temperature signal from the thermistor 13 is input to a control device (not shown). The control device compares the detected temperature of the circuit element 9 with a reference temperature, and when the circuit element 9 is in an overheated state, performs control to stop energization of the circuit element 9.

【0006】[0006]

【発明が解決しようとする課題】このような従来技術で
は、サーミスタ13で検出される温度は、回路素子9か
らの熱が、前記はんだ層8、ヒートスプレッダ7、はん
だ層6、配線パターン層5、絶縁層4及び金属基板3を
加熱し、昇温して温度的に定常状態になった金属基板3
の温度になる。従って、温度上昇中の回路素子9の温度
をリアルタイムに検出することができない不具合があっ
た。また、金属基板3から前記放熱器2に熱が放熱され
る現象も、前記不具合の程度を大きくすることになる。
In such prior art, the temperature detected by the thermistor 13 is such that the heat from the circuit element 9 is determined by the solder layer 8, the heat spreader 7, the solder layer 6, the wiring pattern layer 5, The insulating substrate 4 and the metal substrate 3 are heated, and the temperature is raised to a temperature-steady state.
Temperature. Therefore, there is a problem that the temperature of the circuit element 9 during the temperature rise cannot be detected in real time. Further, the phenomenon in which heat is radiated from the metal substrate 3 to the radiator 2 also increases the degree of the problem.

【0007】従って、回路素子9へ通電される電流に関
して、急激な電流変化が生じて回路素子9が急速に昇温
する場合、上記不具合により、サーミスタ13が回路素
子9の加熱状態を検出したときには回路素子9が熱破壊
されている場合があり、回路素子9の動作上の信頼性が
低いという問題点がある。
Therefore, if the current flowing through the circuit element 9 causes a rapid change in current and the temperature of the circuit element 9 rises rapidly, the above-described problem may cause the thermistor 13 to detect the heating state of the circuit element 9. There is a problem that the circuit element 9 may be thermally damaged and the operation reliability of the circuit element 9 is low.

【0008】本発明は、上記問題点を解決しようとして
成されたものであり、その目的は、回路素子の温度変化
を検知するタイミングを早くして、回路素子の熱による
障害の発生を防止して、回路素子の動作上の信頼性を向
上することができる回路素子の過熱防護構造を提供する
ことである。
SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an object of the present invention is to advance the timing of detecting a temperature change of a circuit element to prevent a failure caused by heat of the circuit element. Another object of the present invention is to provide a circuit element overheat protection structure that can improve the operational reliability of the circuit element.

【0009】[0009]

【課題を解決するための手段】本発明の回路素子の過熱
防護構造は、金属基板と、金属基板上に電気絶縁膜を介
して積層されたヒートスプレッダと、ヒートスプレッダ
上に電気絶縁膜を介して積層された発熱を伴う回路素子
と、ヒートスプレッダ上に電気絶縁膜を介して積層され
た熱検知素子とを備えている。
An overheat protection structure for a circuit element according to the present invention comprises a metal substrate, a heat spreader laminated on the metal substrate via an electric insulating film, and a heat spreader laminated on the heat spreader via an electric insulating film. And a heat detecting element laminated on the heat spreader with an electric insulating film interposed therebetween.

【0010】[0010]

【作用】本発明によれば、回路素子からの熱が、比較的
熱容量が大きい金属基板に到達する前に、ヒートスプレ
ッダを介して、熱検知素子に伝達されるようにした。こ
れにより、熱検知素子は回路素子の温度変化を、比較的
早いタイミングで検知することができ、回路素子に急激
な温度変化が発生した場合でも、速やかにこの温度変化
を検知して、回路素子への通電停止や急速冷却などの対
策を実行することができ、回路素子の動作上の信頼性を
向上することができる。
According to the present invention, the heat from the circuit element is transmitted to the heat detecting element via the heat spreader before reaching the metal substrate having a relatively large heat capacity. As a result, the heat detecting element can detect the temperature change of the circuit element at a relatively early timing, and even when a rapid temperature change occurs in the circuit element, the heat detecting element can quickly detect the temperature change and detect the circuit element. Therefore, it is possible to take measures such as stopping power supply to the power supply and rapid cooling, thereby improving the operational reliability of the circuit element.

【0011】[0011]

【発明の実施の形態】本発明を実施例について以下に説
明する。図1に本発明の一実施例を示す。図1は本実施
例の回路基板21の断面図である。以下、図1を参照し
て、本実施例について説明する。本実施例の回路基板2
1は、放熱器22上に金属基板23が積層され、金属基
板23上には、電気絶縁性材料からなる絶縁層24、銅
やアルミニウムをプリントして形成される配線パターン
層25及びはんだ層26を介してヒートスプレッダ27
が積層されている。ヒートスプレッダ27には、はんだ
層28を介して、例として、集積回路素子などの発熱を
伴う回路素子29が積層され、回路素子部30を構成し
ている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to embodiments. FIG. 1 shows an embodiment of the present invention. FIG. 1 is a sectional view of a circuit board 21 according to the present embodiment. Hereinafter, this embodiment will be described with reference to FIG. Circuit board 2 of the present embodiment
1, a metal substrate 23 is laminated on a radiator 22, an insulating layer 24 made of an electrically insulating material, a wiring pattern layer 25 formed by printing copper or aluminum, and a solder layer 26 on the metal substrate 23. Through the heat spreader 27
Are laminated. On the heat spreader 27, for example, a circuit element 29 that generates heat, such as an integrated circuit element, is laminated via a solder layer 28 to form a circuit element section 30.

【0012】また、前記ヒートスプレッダ27上には、
絶縁層31を介して、配線パターン層32、はんだ層3
3及びサーミスタ34がこの順序で積層され、熱検知素
子部35を構成している。
Further, on the heat spreader 27,
The wiring pattern layer 32 and the solder layer 3 via the insulating layer 31
3 and the thermistor 34 are stacked in this order to form a heat detecting element section 35.

【0013】このような回路基板21において、通電に
よって回路素子29で発生した熱は、図1に矢符A2で
示されるように、回路素子部30において、回路素子2
9からはんだ層28を介してヒートスプレッダ27に到
達し、ヒートスプレッダ27中を伝導して、熱検知素子
部34における絶縁層31、配線パターン層32及びは
んだ層33を介してサーミスタ34に到達し、サーミス
タ34で熱が検知され、前記回路素子29の温度が温度
信号として出力される。
In such a circuit board 21, heat generated in the circuit element 29 by energization is, as shown by an arrow A 2 in FIG.
9 reaches the heat spreader 27 via the solder layer 28, conducts through the heat spreader 27, reaches the thermistor 34 via the insulating layer 31, the wiring pattern layer 32, and the solder layer 33 in the heat detecting element 34, and At 34, heat is detected, and the temperature of the circuit element 29 is output as a temperature signal.

【0014】サーミスタ34からの温度信号は、図示し
ない制御装置に入力される。制御装置は、検出された回
路素子29の温度を基準温度と比較し、回路素子29が
過熱状態の場合は、回路素子29への通電を停止した
り、別段の冷却装置を起動して急速冷却するなどの制御
を行なう。
The temperature signal from the thermistor 34 is input to a controller (not shown). The control device compares the detected temperature of the circuit element 29 with the reference temperature, and when the circuit element 29 is in an overheated state, stops the energization of the circuit element 29 or activates another cooling device to perform rapid cooling. Control.

【0015】以上のように、本実施例の回路基板21で
は、回路素子29からの熱が、比較的熱容量が大きく、
また、前記放熱器22に接触していて放熱器22への熱
移動が大きい金属基板23に到達する前に、ヒートスプ
レッダ27を介して、サーミスタ34に伝達されるよう
にした。これにより、サーミスタ34は回路素子29の
温度変化を、比較的早いタイミングで検知することがで
き、回路素子29に急激な温度変化が発生した場合で
も、速やかにこの温度変化を検知して、回路素子29へ
の通電停止や急速冷却などの対策を実行することがで
き、回路素子29の動作上の信頼性を向上することがで
きる。
As described above, in the circuit board 21 of this embodiment, the heat from the circuit element 29 has a relatively large heat capacity,
Further, the heat is transmitted to the thermistor 34 via the heat spreader 27 before reaching the metal substrate 23 which is in contact with the radiator 22 and transfers a large amount of heat to the radiator 22. Thereby, the thermistor 34 can detect the temperature change of the circuit element 29 at a relatively early timing, and even when a sudden temperature change occurs in the circuit element 29, the temperature change is quickly detected and the circuit element 29 is detected. Countermeasures such as stopping power supply to the element 29 and rapid cooling can be performed, and the operational reliability of the circuit element 29 can be improved.

【0016】本発明は、上記実施例に限定されるもので
はなく、本発明の精神を逸脱しない範囲で広範な変形例
を含むものである。
The present invention is not limited to the above embodiment, but includes a wide variety of modifications without departing from the spirit of the present invention.

【0017】[0017]

【発明の効果】以上のように、本発明によれば、回路素
子からの熱が、比較的熱容量が大きい金属基板に到達す
る前に、ヒートスプレッダを介して熱検知素子に伝達さ
れるようにした。これにより、熱検知素子は回路素子の
温度変化を、比較的早いタイミングで検知することがで
き、回路素子に急激な温度変化が発生した場合でも、速
やかにこの温度変化を検知して、回路素子への通電停止
や急速冷却などの対策を実行することができ、回路素子
の動作上の信頼性を向上することができる。
As described above, according to the present invention, the heat from the circuit element is transmitted to the heat detecting element via the heat spreader before reaching the metal substrate having a relatively large heat capacity. . As a result, the heat detecting element can detect the temperature change of the circuit element at a relatively early timing, and even when a rapid temperature change occurs in the circuit element, the heat detecting element can quickly detect the temperature change and detect the circuit element. Therefore, it is possible to take measures such as stopping power supply to the power supply and rapid cooling, thereby improving the operational reliability of the circuit element.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例の回路基板21の断面図であ
る。
FIG. 1 is a sectional view of a circuit board 21 according to one embodiment of the present invention.

【図2】従来技術の回路基板1の断面図である。FIG. 2 is a cross-sectional view of a conventional circuit board 1.

【符号の説明】[Explanation of symbols]

21 回路基板 22 放熱器 23 金属基板 24、31 絶縁層 25、32 配線パターン層 26、28、33 はんだ層 27 ヒートスプレッダ 29 回路素子 30 回路素子部 34 サーミスタ 35 熱検知素子部 DESCRIPTION OF SYMBOLS 21 Circuit board 22 Heat radiator 23 Metal substrate 24, 31 Insulating layer 25, 32 Wiring pattern layer 26, 28, 33 Solder layer 27 Heat spreader 29 Circuit element 30 Circuit element part 34 Thermistor 35 Thermal detection element part

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】金属基板と該金属基板上に電気絶縁膜を介
して積層されたヒートスプレッダと、 該ヒートスプレッダ上に電気絶縁膜を介して積層された
発熱を伴う回路素子と、 該ヒートスプレッダ上に該電気絶縁膜を介して積層され
た熱検知素子とを備える回路素子の過熱防護構造。
A metal substrate, a heat spreader laminated on the metal substrate via an electrical insulating film, a heat-generating circuit element laminated on the heat spreader via an electrical insulating film, and a heat spreader laminated on the heat spreader. An overheat protection structure for a circuit element including a heat detection element stacked with an electric insulating film interposed therebetween.
JP13341198A 1998-05-15 1998-05-15 Overheating protective structure for circuit element Pending JPH11330321A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13341198A JPH11330321A (en) 1998-05-15 1998-05-15 Overheating protective structure for circuit element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13341198A JPH11330321A (en) 1998-05-15 1998-05-15 Overheating protective structure for circuit element

Publications (1)

Publication Number Publication Date
JPH11330321A true JPH11330321A (en) 1999-11-30

Family

ID=15104147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13341198A Pending JPH11330321A (en) 1998-05-15 1998-05-15 Overheating protective structure for circuit element

Country Status (1)

Country Link
JP (1) JPH11330321A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009094130A (en) * 2007-10-04 2009-04-30 Sony Corp Cooling module
JP2012160602A (en) * 2011-02-01 2012-08-23 Honda Motor Co Ltd Semiconductor device
JP2017183530A (en) * 2016-03-30 2017-10-05 株式会社ケーヒン Semiconductor device
JP2017216350A (en) * 2016-05-31 2017-12-07 日産自動車株式会社 Semiconductor device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009094130A (en) * 2007-10-04 2009-04-30 Sony Corp Cooling module
JP2012160602A (en) * 2011-02-01 2012-08-23 Honda Motor Co Ltd Semiconductor device
JP2017183530A (en) * 2016-03-30 2017-10-05 株式会社ケーヒン Semiconductor device
JP2017216350A (en) * 2016-05-31 2017-12-07 日産自動車株式会社 Semiconductor device

Similar Documents

Publication Publication Date Title
JP5579234B2 (en) Electronic circuit component cooling structure and inverter device using the same
JPH08226723A (en) Thermoelectric cooler assembly
US6064801A (en) Heating element assembly for water heater with IC controller and temperature sensor mounted in thermal relation
KR200487209Y1 (en) Protection circuit module
JP6637812B2 (en) Semiconductor device
JPH11330321A (en) Overheating protective structure for circuit element
JP3552539B2 (en) Thermal fuse with resistance
JP6351914B1 (en) Temperature measuring device
JP2005130568A (en) Inspection method of power module
CN112284560A (en) Method for rapidly detecting temperature of power device
JP2008244288A (en) Semiconductor device having temperature controlling device and printed circuit board
JP2010267724A (en) Electronic device
JP2009081100A (en) Induction heating cooker
JP4340890B2 (en) Fever detection device
JP4089887B2 (en) Thermal head
JP2003179196A (en) Power module and protection system thereof
JP2009117188A (en) Connection structure and circuit structure between exothermic circuit element and temperature fuse
TWI806160B (en) Test board with a temperature control function
JPH0652971A (en) Heater
JPH0763619A (en) Temperature detecting apparatus, power controlling apparatus and electric device
JP2003007934A (en) Power semiconductor device
JP2925839B2 (en) Electromagnetic cooker
JPH07245375A (en) Load drive device
JP3277790B2 (en) Electric iron
JP2000188171A (en) Temperature control device for electronic circuit component