JPH11322487A - Single crystal diameter measurement instrument - Google Patents

Single crystal diameter measurement instrument

Info

Publication number
JPH11322487A
JPH11322487A JP12726098A JP12726098A JPH11322487A JP H11322487 A JPH11322487 A JP H11322487A JP 12726098 A JP12726098 A JP 12726098A JP 12726098 A JP12726098 A JP 12726098A JP H11322487 A JPH11322487 A JP H11322487A
Authority
JP
Japan
Prior art keywords
diameter
value
single crystal
threshold
threshold value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12726098A
Other languages
Japanese (ja)
Other versions
JP4006090B2 (en
Inventor
Nobuhiro Saito
信浩 斉藤
Etsuro Yoshida
悦郎 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokai Carbon Co Ltd
Original Assignee
Tokai Carbon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokai Carbon Co Ltd filed Critical Tokai Carbon Co Ltd
Priority to JP12726098A priority Critical patent/JP4006090B2/en
Publication of JPH11322487A publication Critical patent/JPH11322487A/en
Application granted granted Critical
Publication of JP4006090B2 publication Critical patent/JP4006090B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide an instrument capable of continuously and automatically measuring the diameter of a single crystal being grown by a pulling-up method (Czochralski method) with good accuracy over the range from a seed crystal to a straight body. SOLUTION: This instrument 20 for measuring the diameter of a single crystal being grown by a pulling-up method over the range from a seed crystal to a straight body, is provided with: a camera 11 for photographing a growing part of the single crystal and outputting a video signal; a frame memory 12 and a CPU 13, each for executing the operations of a binarization diameter calculation means and an appropriate threshold determination means, wherein the binarization diameter calculation means is used for binarizing the video signal and calculating the diameter by the threshold, and also, the appropriate threshold determination means is used for performing statistical comparison of the diameter value calculated by the binarization diameter calculation means with the values obtained in the past, thereby determining the threshold as an appropriate threshold when the diameter value is a continuous value for a short time, or as an inappropriate threshold when the diameter value is a value other than the above value or an immeasurable value, then automatically detecting a threshold such that the diameter value is continuous to the preceding value before becoming inappropriate and determining the detected threshold as an appropriate threshold; and an analog output means 14 for outputting the diameter value calculated by the appropriate threshold.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、引き上げ法(チョ
クラルスキー法)により育成される単結晶の直径を妥当
閾値決定法により精度よく、種結晶から直胴部にわたり
連続的に測定することが可能な単結晶の直径測定装置に
関するものである。
BACKGROUND OF THE INVENTION The present invention relates to a method for measuring the diameter of a single crystal grown by the pulling method (Czochralski method) from a seed crystal to a straight body continuously with high accuracy by a proper threshold value determining method. It relates to a possible single crystal diameter measuring device.

【0002】[0002]

【従来の技術】従来、引き上げ法により育成される単結
晶の直径を閾値を利用して測定する方法としては、2値
化判定による方法、ピーク位置を検索するピーク判定に
よる方法が挙げられる。これらの方法は、通常、単結晶
の直胴部の直径制御に利用され比較的良好な成果を収め
ている。しかし、近年、安定に且つ精度良く単結晶を製
造するため、単結晶の種結晶から直胴部までの直径を連
続して測定することが求められている。
2. Description of the Related Art Conventionally, methods for measuring the diameter of a single crystal grown by a pulling method using a threshold include a method based on binarization determination and a method based on peak determination for searching for a peak position. These methods are usually used for controlling the diameter of the straight body of a single crystal and have relatively good results. However, in recent years, in order to stably and accurately produce a single crystal, it has been required to continuously measure a diameter from a single crystal seed crystal to a straight body.

【0003】[0003]

【発明が解決しようとする課題】単結晶の種結晶から直
胴部までの直径を連続して測定する場合、従来の上記測
定方法を利用したとしても人手による操作を余儀無くさ
れることが多い。また、2値化判定による方法では、結
晶と溶液との間に明確な輝度差がなければならず、しか
もその閾値は絶えず一定値でなければならない。一方、
実際の引き上げにおいて、ネック部、コーン部及び直胴
部においてはそれぞれ凝固点位置のメニスカス形状が異
なるためフュージョンリングの明るさが大きく異なる。
特にコーン部においてはメニスカスが形成されず、特徴
的なフュージョンリングのピークが無くなることもまま
ある。このような条件下において、従来のような一定値
の閾値では計測を誤る可能性があるという問題がある。
In the case of continuously measuring the diameter from a single crystal seed crystal to a straight body, even if the above-mentioned conventional measuring method is used, manual operation is often required. In the method based on the binarization determination, there must be a clear luminance difference between the crystal and the solution, and the threshold value must be constantly constant. on the other hand,
In the actual lifting, the meniscus shape at the solidification point differs between the neck, the cone and the straight body, so that the brightness of the fusion ring greatly differs.
In particular, no meniscus is formed in the cone portion, and the characteristic fusion ring peak may disappear. Under such conditions, there is a problem that the measurement may be erroneously performed with a constant threshold value as in the related art.

【0004】また、上記ピーク位置を検索するピーク判
定による方法においては、これは必ずフュージョンリン
グが存在するという仮定の上に成り立っている。したが
って、この方法はフュージョンリングが明確に現れる直
胴部の直径を測定するのには向いているものの、その閾
値が決定されるには一度直胴部まで引き上げを行って適
切な閾値を把握する必要がある。この場合、パラメータ
ーを把握するまで数時間を要し、しかも種結晶部やコー
ン部では、固液界面のフュージョンリング以外にも結晶
をつかむホルダーや結晶の段差が坩堝からの放射光を反
射して起きる高輝度部を誤って検出する可能性があると
いう問題がある。
[0004] Further, in the above-described method based on peak determination for searching for a peak position, this is always based on the assumption that a fusion ring exists. Therefore, although this method is suitable for measuring the diameter of the straight body where the fusion ring clearly appears, once the threshold is determined, it is necessary to raise the straight body once and grasp the appropriate threshold. There is a need. In this case, it takes several hours to understand the parameters, and in the seed crystal part and the cone part, in addition to the fusion ring at the solid-liquid interface, the holder holding the crystal and the step of the crystal reflect the radiated light from the crucible and There is a problem that a high-brightness part that occurs may be erroneously detected.

【0005】これを図を用いて説明する。図8〜図11
は単結晶の種結晶部、コーン部及び直胴部における代表
的なラインプロフィールの模式図を示すもので、閾値は
150の一定値とする場合である。図8は種結晶引き上
げ時のラインプロフィールで、明確なフュージョンリン
グが現れ、閾値から直径D1 が求められる。図9はフュ
ージョンリングが消失し、且つ輝度が低下したコーン部
のラインプロフィールで、閾値150では直径が求めら
れない。図10は結晶の一部に反射光が現れたコーン部
のラインプロフィールで、閾値150では誤った径D2
が求められ、正しい直径D3 が求められない。図11は
明確なフュージョンリングが現れた直胴部のラインプロ
フィールで、閾値から直径D4 が求められる。このよう
に、一定閾値では種結晶から直胴部に至までの連続的な
測定が不可能であるか、閾値の決定に細心の注意を払っ
て測定する必要がある。しかも、炉の構造が変わった
り、引き上げ条件が変わった場合はその都度最適閾値を
時間をかけて模索しなければならないという問題があ
る。
This will be described with reference to the drawings. 8 to 11
Is a schematic diagram of a typical line profile in a single crystal seed crystal part, a cone part, and a straight body part, where the threshold value is set to a constant value of 150. FIG. 8 shows a line profile when the seed crystal is pulled up. A clear fusion ring appears, and the diameter D 1 is obtained from the threshold value. FIG. 9 shows a line profile of the cone portion where the fusion ring has disappeared and the brightness has been reduced. Figure 10 is a line profile of the cone portion of the reflected light appears in a part of the crystal, the diameter D 2 erroneous in threshold 150
Is required, it is not required correct diameter D 3. FIG. 11 shows a line profile of the straight body portion where a clear fusion ring appears. The diameter D 4 is obtained from the threshold value. As described above, it is impossible to perform continuous measurement from the seed crystal to the straight body at a certain threshold value, or it is necessary to measure with great care in determining the threshold value. In addition, there is a problem that whenever the furnace structure changes or the pulling conditions change, it is necessary to spend some time searching for the optimum threshold value.

【0006】したがって、本発明の解決しようとする課
題は、引き上げ法(チョクラルスキー法)により育成さ
れる単結晶の直径を精度よく、種結晶から直胴部にわた
り連続的且つ自動的に測定することが可能な単結晶の直
径測定装置を提供することにある。
Therefore, an object of the present invention is to measure the diameter of a single crystal grown by the pulling method (Czochralski method) continuously and automatically from the seed crystal to the straight body portion with high accuracy. It is an object of the present invention to provide an apparatus for measuring the diameter of a single crystal which is capable of measuring the diameter.

【0007】[0007]

【課題を解決するための手段】かかる実情において、本
発明者は鋭意検討を行った結果、引き上げ法により育成
される単結晶の直径を測定する際、測定値を出力する前
に該測定値の妥当性を評価し、単結晶の直径は短期的に
は必ず連続的に変化するという前提のもとに、過去値と
の比較において不適切な値は測定結果から除外して、閾
値の妥当性の評価をしながら自動的に閾値を変更する妥
当閾値決定手段を設ければ上記課題を解決できることを
見出し、本発明を完成するに至った。
Under such circumstances, the present inventors have conducted intensive studies and as a result, when measuring the diameter of a single crystal grown by the pulling method, before outputting the measured value, the measured value was measured. Evaluate the validity and, based on the premise that the diameter of the single crystal always changes continuously in the short term, exclude inappropriate values from the measurement results in comparison with past values, and It has been found that the above problem can be solved by providing a suitable threshold value determining means for automatically changing the threshold value while evaluating the above, and the present invention has been completed.

【0008】すなわち、本発明の請求項1記載の単結晶
の直径測定装置は、引き上げ法により育成される単結晶
の直径を種結晶から直胴部にわたり連続的に測定する単
結晶の直径測定装置において、単結晶の育成部を撮影し
映像信号を出力するカメラと、前記映像信号を2値化し
て閾値により直径を求める2値化直径算出手段と、前記
2値化直径算出手段により求められる直径を過去値との
比較で、短期的に連続的な値である場合には妥当閾値と
決定し、それ以外の値又は測定不能な場合には不適切な
閾値とし、直径が不適切値になる前の値と連続的な値と
なるような閾値を探してこれを変更された妥当閾値と決
定する妥当閾値決定手段と、前記妥当閾値により求めら
れる直径を出力するアナログ出力手段と、を有すること
を特徴とする。これにより、引き上げ法により育成され
る単結晶の直径を、特にコーン部にまま見られるフュー
ジョンリングが消失し、且つ輝度が低下したラインプロ
フィールであっても、また、結晶の一部に反射光が現れ
たラインプロフィールであっても精度よく、種結晶から
直胴部にわたり連続的且つ自動的に測定することが可能
となる。
That is, the single crystal diameter measuring apparatus according to the first aspect of the present invention is a single crystal diameter measuring apparatus for continuously measuring the diameter of a single crystal grown by a pulling method from a seed crystal to a straight body. A camera for photographing a growing portion of a single crystal and outputting a video signal, a binarized diameter calculating means for binarizing the video signal to obtain a diameter by a threshold value, and a diameter obtained by the binarized diameter calculating means In comparison with the past value, if it is a continuous value in the short term, it is determined as an appropriate threshold, and if it is other value or measurement is impossible, it will be an inappropriate threshold, and the diameter will be an inappropriate value A suitable threshold value determining means for searching for a threshold value that is a continuous value from the previous value and determining this as a changed valid threshold value, and an analog output means for outputting a diameter obtained by the valid threshold value It is characterized by. As a result, the diameter of the single crystal grown by the pulling method, especially the fusion ring seen as it is in the cone portion disappears, and even in the case of a line profile in which the luminance is reduced, reflected light is partially reflected in the crystal. Even if the line profile appears, it is possible to measure continuously and automatically from the seed crystal to the straight body with high accuracy.

【0009】また、請求項2記載の単結晶の直径測定装
置は、前記妥当閾値決定手段において、前記妥当閾値に
より求められる測定値を少なくとも平均化処理の計算を
行い過去値のデータとすることを特徴とする。これによ
り、請求項1記載の発明と同様の効果を奏する他、適切
な値と判定された値のみ一定時間の平均化処理が行わ
れ、妥当性評価の過去値となる平均値の信頼性が高めら
れる。例えば真円ではない結晶の代表直径は、計測エラ
ーに引きずられることなく、過去値との比較において高
い精度で求められる。
According to a second aspect of the present invention, in the single crystal diameter measuring apparatus, the appropriate threshold value determining means calculates at least an averaging process of the measured value obtained by the appropriate threshold value to obtain past value data. Features. Thus, in addition to the same effect as the first aspect of the present invention, the averaging process is performed for a certain period of time only for the value determined as an appropriate value, and the reliability of the average value serving as the past value of the validity evaluation is improved. Enhanced. For example, the representative diameter of a crystal that is not a perfect circle is determined with high accuracy in comparison with past values without being dragged by measurement errors.

【0010】また、請求項3記載の単結晶の直径測定装
置は、前記カメラが、800nm以上の波長感度を有す
る2次元CCDカメラであることを特徴とする。これに
より、前記発明と同様の効果を奏する他、蛍光灯等の外
部不要光を検知することがなく、外部光の影響を除去で
きる。また融液の変動、結晶の揺らぎにも追随できるた
め、測定精度が更に向上する。
According to a third aspect of the present invention, in the single crystal diameter measuring apparatus, the camera is a two-dimensional CCD camera having a wavelength sensitivity of 800 nm or more. Thereby, in addition to the same effect as the above invention, the external unnecessary light such as a fluorescent lamp is not detected, and the influence of the external light can be removed. In addition, the measurement accuracy can be further improved because it can follow the fluctuation of the melt and the fluctuation of the crystal.

【0011】[0011]

【発明の実施の形態】本発明の実施の形態における単結
晶の直径測定装置20の全体構成図を図1に示す。図1
中、1は、単結晶引き上げ装置であり、石英坩堝2の中
に入れたシリコン多結晶をヒータ4により加熱溶融し
て、このシリコン溶融液9の中に引き上げワイヤー6の
先端部に支持されたシリコン種結晶を浸漬し、引き上げ
ワイヤー6を回転させながら徐々に引き上げることによ
り単結晶を育成させて、シリコン単結晶ロッド10を製
造する。本発明においては、シリコン単結晶ロッド10
の種結晶部10a、コーン部10b、直胴部10cの直
径を計測するため、カメラ11を用いて、単結晶引き上
げ装置1の斜め上方からシリコン単結晶ロッド10の育
成部を撮影し、映像信号を出力する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an overall configuration diagram of a single crystal diameter measuring apparatus 20 according to an embodiment of the present invention. FIG.
In the drawing, reference numeral 1 denotes a single crystal pulling device, which heats and melts a silicon polycrystal put in a quartz crucible 2 by a heater 4 and is pulled into the silicon melt 9 and supported by the tip of a wire 6. A silicon single crystal rod 10 is manufactured by immersing a silicon seed crystal and gradually pulling it while rotating the pulling wire 6 to grow a single crystal. In the present invention, the silicon single crystal rod 10
In order to measure the diameters of the seed crystal portion 10a, the cone portion 10b, and the straight body portion 10c, a camera 11 is used to photograph the growing portion of the silicon single crystal rod 10 from obliquely above the single crystal pulling apparatus 1, and a video signal Is output.

【0012】カメラ11としては、1次元カメラ(ライ
ンセンサー)、2次元カメラなどが使用でき、このう
ち、種結晶から直胴部までの直径を視野内に納めること
のできるレンズを有し、且つ800nm以上の波長感度
を有する2次元CCDカメラが好ましい。この場合、8
00nm以上の波長に感応させるため800nm以下の
波長をカットするカラーフィルターを装着すればよい。
これにより、蛍光灯等の外部不要光を検知することがな
く外部光の影響を除去できると共に、融液の変動、結晶
の揺らぎにも追随できるため、ラインセンサーでは達成
できない測定精度を得ることができる。また、この2次
元CCDカメラの画面分解能は640×480以上の画
素を有するものが好ましい。
As the camera 11, a one-dimensional camera (line sensor), a two-dimensional camera, or the like can be used, and among them, a lens having a diameter capable of keeping the diameter from the seed crystal to the straight body within the field of view is provided, and A two-dimensional CCD camera having a wavelength sensitivity of 800 nm or more is preferable. In this case, 8
In order to respond to a wavelength of 00 nm or more, a color filter that cuts a wavelength of 800 nm or less may be attached.
As a result, it is possible to eliminate the influence of external light without detecting external unnecessary light such as fluorescent lamps, and to follow the fluctuation of the melt and the fluctuation of the crystal. it can. The two-dimensional CCD camera preferably has a screen resolution of 640 × 480 or more.

【0013】本発明の単結晶の直径測定装置は、更に2
値化直径の算出と、妥当閾値の決定との双方を実行する
フレームメモリー12と演算用CPU13を有する。す
なわち、カメラ11から得られるアナログNTSC又は
PAL規格の映像信号はフレームメモリー12(画像処
理装置)に送られる。このフレームメモリー12として
は分解能8ビット、空間分解能512×480以上のメ
モリーを有し、更にI/Oアクセス又はダイレクトメモ
リマップによりCPUとのデータのやりとりができるも
のが好ましい。
The single crystal diameter measuring apparatus according to the present invention further comprises:
It has a frame memory 12 and an arithmetic CPU 13 for executing both calculation of the quantified diameter and determination of the appropriate threshold value. That is, an analog NTSC or PAL standard video signal obtained from the camera 11 is sent to the frame memory 12 (image processing device). The frame memory 12 preferably has a memory with a resolution of 8 bits and a spatial resolution of 512 × 480 or more, and can exchange data with the CPU by I / O access or direct memory map.

【0014】演算用CPU13は、妥当閾値の決定にお
いて、高速な統計計算を可能にするため、浮動小数点演
算機構を備えたプロセッサを用いることが好ましい。ま
た、アナログ出力部14は12Bit 精度以上のアナログ出
力とすることが好ましい。また、その型としては、電圧
出力型の他、直径制御コントローラ15の種類により、
例えば、電流出力型を用いてもよい。
The arithmetic CPU 13 preferably uses a processor having a floating-point arithmetic mechanism in order to enable a high-speed statistical calculation in determining the appropriate threshold value. Further, it is preferable that the analog output unit 14 outputs 12 bits or more of analog data. In addition, as the type, in addition to the voltage output type, depending on the type of the diameter control controller 15,
For example, a current output type may be used.

【0015】次に、図2に示すフローにて、単結晶の直
径計算を行う。図中、妥当閾値決定手段は追跡モードO
Nから追跡モードOFFまでをいう。また、記号「y」
はYes、記号「n」はNoを示す。なお、説明の便宜
上、以下の説明で使用する項目の数字は図2のフロー中
の数字に相当するものである。 1.1画面の画像を取得する。 2.次に、2値化直径を2値化直径算出手段により算出
する。単結晶の種結晶から直胴部にわたる直径をレンズ
の視野内に納めることができるようにカメラをセットす
る。具体的には、図3に示すように、点線内のすべての
水平ラインについて直径を測定し、全測定値のうち最も
大きな値を測定値D5 とする。2値判定に用いる閾値と
しては、予め指定された妥当閾値又は後述する閾値変更
によって再定義された妥当閾値を用いる。また、適切な
測定値が求められない場合は無効値とする。
Next, the diameter of the single crystal is calculated according to the flow shown in FIG. In the figure, the appropriate threshold value determining means is tracking mode O
It means from N to tracking mode OFF. Also, the symbol "y"
Indicates Yes, and the symbol “n” indicates No. For convenience of explanation, the numbers of items used in the following description correspond to the numbers in the flow of FIG. 1. Acquire a screen image. 2. Next, the binarized diameter is calculated by the binarized diameter calculating means. The camera is set so that the diameter from the single crystal seed crystal to the straight body can be contained within the field of view of the lens. Specifically, as shown in FIG. 3, to measure the diameter of all of the horizontal lines within the dotted line, and the measured value D 5 is the highest value among all the measured values. As the threshold value used for the binary determination, a valid threshold value specified in advance or a valid threshold value redefined by a threshold change described later is used. If an appropriate measurement value cannot be obtained, the value is invalid.

【0016】3.追跡モードがONになっているかどう
か調べる。追跡モードは閾値を再計算中にチェックされ
る。追跡モードの段階では前記測定値が正しい値である
保証はないため、平均化処理は行われず、標準偏差又は
異常値割合などの統計計算のみ行われる。これにより、
前回まで正しく測定されていた平均値は維持され、該平
均値は後述の適切な閾値との比較に用いられる。本発明
において、統計計算は標準偏差、異常値割合、分散等の
計算を意味する。
3. Check whether the tracking mode is ON. The tracking mode is checked during the recalculation of the threshold. In the tracking mode, there is no guarantee that the measured value is a correct value. Therefore, the averaging process is not performed, and only the statistical calculation such as the standard deviation or the abnormal value ratio is performed. This allows
The average value that was correctly measured until the previous time is maintained, and the average value is used for comparison with an appropriate threshold value described later. In the present invention, statistical calculation means calculation of standard deviation, outlier ratio, variance, and the like.

【0017】4.測定値の妥当性の評価を行う。すなわ
ち、前回値又は過去値の平均値と、得られた値を比較し
て、大きく異なる値や明らかに異なる値が得られた場合
は無効値として破棄する。この無効値は標準偏差又は異
常値割合などの統計処理に回され平均化処理は行わな
い。これにより、過去に正しく測定された直径値の平均
の値は破壊されない。
4. Evaluate the validity of the measured values. That is, the average value of the previous value or the past value is compared with the obtained value, and if a significantly different value or a clearly different value is obtained, it is discarded as an invalid value. This invalid value is sent to statistical processing such as a standard deviation or an abnormal value ratio, and is not averaged. This does not destroy the average value of the previously correctly measured diameter values.

【0018】5.妥当な測定値と判断されたら、統計処
理バッファに測定値を与えて標準偏差又は異常値割合な
どの統計処理計算と平均化処理計算の双方を行う。統計
処理バッファは、現在の閾値が妥当であるかどうかの判
定の基となる平均、標準偏差、分散、異常値割合などの
データを求める計算を行うものである。例えば、標準偏
差を求めて、バラツキが大きくなった場合は不適切な閾
値であると判断したり、測定値に対する平均からの上下
限を定めておいてこれから外れる頻度をトレースして閾
値の妥当性を判断したりする。
5. If it is determined that the measured value is appropriate, the measured value is given to the statistical processing buffer, and both statistical processing calculation such as standard deviation or abnormal value ratio and averaging processing calculation are performed. The statistical processing buffer performs calculation for obtaining data such as an average, a standard deviation, a variance, and an abnormal value ratio, which are used as a basis for determining whether or not the current threshold value is appropriate. For example, if the standard deviation is found and the variation is large, it is determined that the threshold is inappropriate, or the upper and lower limits from the average for the measured values are set and the frequency of deviation from this is traced to determine the validity of the threshold. Or to judge.

【0019】6.追跡モードON又は妥当性評価におい
て不適切な閾値と判断されると、該閾値から求められる
測定値は平均化処理データの対象とはならず、統計処理
用のデータとして標準偏差又は異常値割合計算などの統
計計算が行われる。これにより、不適切な閾値により求
められる測定値が平均値に取り込まれることはなく、測
定精度が向上する。 7.上記平均、標準偏差、分散、異常値割合などを基準
に適切不適切を判断するには一定の標本数が必要とな
る。このため、一定数が統計処理にかけられるまでは、
該適切不適切の評価を行わないようにする。
6. If it is determined that the threshold value is inappropriate in the tracking mode ON or the validity evaluation, the measurement value obtained from the threshold value is not included in the averaging processing data, and the standard deviation or abnormal value ratio calculation is used as data for statistical processing. Statistical calculations such as are performed. As a result, the measurement value obtained by the inappropriate threshold value is not taken into the average value, and the measurement accuracy is improved. 7. A certain number of samples is required to judge appropriateness based on the above average, standard deviation, variance, outlier ratio, and the like. Therefore, until a certain number is subjected to statistical processing,
Do not perform the appropriate or inappropriate evaluation.

【0020】8.平均値及び標準偏差又は異常値割合等
の統計量から、現在得られた測定値が過去のデータと連
続性があり、且つ大きくばらついていないか評価する。
シリコン単結晶は数十秒の範囲で必ず連続性があり、且
つ滑らかな径変化しか起こしていない。したがって、不
連続な値を採る場合は、結晶が切れているか、正しく測
定できなくなったときと判断される。
8. From the statistics such as the average value and the standard deviation or the abnormal value ratio, it is evaluated whether the measured value obtained at present has continuity with past data and does not vary greatly.
The silicon single crystal always has continuity within a range of several tens of seconds, and undergoes only a smooth diameter change. Therefore, when a discontinuous value is taken, it is determined that the crystal is broken or that measurement cannot be performed correctly.

【0021】9.標準偏差又は異常値割合が妥当であれ
ば、正しく測定できているものとして、追跡モードであ
ればこれをオフにする。 10.上記8で不適切な測定値であると判断された場
合、閾値を現在の閾値から予め定められたステップ毎に
変更し、適切な閾値を探す。 11.閾値の妥当性を調べるため、データをいったんリ
セットする。 12.上記10で仮に定めた閾値が平均値を破壊しない
よう、追跡モードをONにする。そして、その後、再度
新しい閾値で直径測定を試み、測定値が不適切値になる
前の値と連続的な測定値となるような閾値を探す。 13.すべての条件が満足され、妥当閾値が決定された
場合、そのときの平均値をアナログ出力する。
9. If the standard deviation or the abnormal value ratio is appropriate, it is determined that the measurement has been correctly performed, and the tracking mode is turned off in the tracking mode. 10. If it is determined in step 8 that the measurement value is inappropriate, the threshold value is changed from the current threshold value for each predetermined step to search for an appropriate threshold value. 11. The data is reset once to check the validity of the threshold. 12. The tracking mode is turned on so that the threshold provisionally determined in the above 10 does not destroy the average value. Then, after that, the diameter measurement is tried again with the new threshold value, and a threshold value that is a continuous measurement value before the measurement value becomes an inappropriate value is searched. 13. When all conditions are satisfied and the appropriate threshold value is determined, the average value at that time is output as an analog signal.

【0022】本実施の形態によれば、単結晶の育成部を
撮影し映像信号を出力するカメラ11と、フレームメモ
リ12と、演算用CPU13と、前記妥当閾値により求
められる直径を出力するアナログ出力手段14とを有
し、フレームメモリ12及び演算用CPU13におい
て、前記映像信号を2値化して閾値により直径を求める
2値化直径算出計算、前記2値化直径算出手段により求
められる直径を過去値との統計的な比較で、短期的に連
続的な値である場合には妥当閾値と決定し、それ以外の
値又は測定不能な場合には不適切な閾値とし、直径が不
適切値となる前の値と連続的な値となるような閾値を自
動的に検出してこれを変更された妥当閾値と決定する妥
当閾値決定処理とを実施させるため、引き上げ法により
育成される単結晶の直径を、特にコーン部にまま見られ
るフュージョンリングが消失し、且つ輝度が低下したラ
インプロフィールであっても、また、結晶の一部に反射
光が現れたラインプロフィールであっても精度よく、種
結晶から直胴部にわたり連続的且つ自動的に測定するこ
とが可能となる。また、前記妥当閾値決定手段におい
て、前記妥当閾値により求められる測定値を少なくとも
平均化処理の計算、特に統計処理及び平均化処理の計算
を行い過去値のデータとするため、適切な値と判定され
た値のみ一定時間の平均化処理が行われ、妥当性評価の
過去値となる平均値の信頼性が高められる。例えば真円
ではない結晶の代表直径は、計測エラーに引きずられる
ことなく、過去値との比較において高い精度で求めるこ
とができる。また、カメラ11が、800nm以上の波
長感度を有する2次元CCDカメラであるため、蛍光灯
等の外部不要光を検知することがなく、外部光の影響を
除去できる。また融液の変動、結晶の揺らぎにも追随で
きるため、測定精度が更に向上する。
According to the present embodiment, a camera 11 for photographing a growing portion of a single crystal and outputting a video signal, a frame memory 12, an operation CPU 13, and an analog output for outputting a diameter determined by the appropriate threshold value Means 14, wherein the frame memory 12 and the operation CPU 13 binarize the video signal to obtain a diameter based on a threshold value, and calculate the diameter obtained by the binarized diameter calculation means into a past value. In the statistical comparison with the above, if it is a continuous value in the short term, it is determined as an appropriate threshold, if it is other value or measurement is impossible, it will be an inappropriate threshold, and the diameter will be an inappropriate value In order to automatically detect a threshold value that becomes a continuous value from the previous value and determine the threshold value as a changed appropriate threshold value, a process of determining the appropriate threshold value is performed. Even if the line profile in which the fusion ring seen in the cone part disappears and the brightness is reduced, or the line profile in which reflected light appears in a part of the crystal, the seed crystal From the body to the straight body. Further, in the appropriate threshold value determining means, the measured value obtained by the appropriate threshold value is calculated as at least an averaging process, in particular, a statistical process and an averaging process, and is used as a past value data. The averaging process is performed only for the given value for a certain period of time, and the reliability of the average value serving as the past value of the validity evaluation is enhanced. For example, the representative diameter of a crystal that is not a perfect circle can be determined with high accuracy in comparison with past values without being dragged by measurement errors. Further, since the camera 11 is a two-dimensional CCD camera having a wavelength sensitivity of 800 nm or more, it is possible to eliminate the influence of external light without detecting external unnecessary light such as a fluorescent lamp. In addition, the measurement accuracy can be further improved because it can follow the fluctuation of the melt and the fluctuation of the crystal.

【0023】[0023]

【実施例】次に、実施例を挙げて、本発明を更に具体的
に説明するが、これは単に例示であって、本発明を制限
するものではない。 実施例 種結晶から直胴部までの直径を視野内に納めることので
きるレンズを有する波長を800nm 以上に制限した2次元
CCDカメラ、1画素当たり8Bitの深さを持ち、且つ64
0 ×480 の画面分解能を有する8Bitフレームメモリ、32
BitCISC40MHzのペンティアムプロセッサ及び0〜10V
出力のアナログ出力部をそれぞれ準備し、直径計算が可
能なように接続した。すなわち、図2のフローに示すロ
ジックを組み込んだ単結晶の直径測定装置を用い、6イ
ンチシリコン単結晶引き上げ炉内を撮影して、その出力
を得た。得られた単結晶のラインプロフィールの模式図
(図4〜図6)を参照しつつ説明する。
EXAMPLES Next, the present invention will be described more specifically with reference to examples, but this is merely an example and does not limit the present invention. Example A two-dimensional CCD camera having a lens capable of holding the diameter from the seed crystal to the straight body within the field of view, having a wavelength limited to 800 nm or more, having a depth of 8 Bit per pixel, and having 64 bits.
8 bit frame memory with screen resolution of 0 × 480, 32
BitCISC 40MHz Pentium processor and 0-10V
An analog output section was prepared for each output and connected so that the diameter could be calculated. That is, the inside of a 6-inch silicon single crystal pulling furnace was photographed using a single crystal diameter measuring device incorporating the logic shown in the flow of FIG. 2, and the output was obtained. This will be described with reference to the schematic diagrams of the line profiles of the obtained single crystals (FIGS. 4 to 6).

【0024】始めに、種結晶が育成された段階で種結晶
の直径測定を開始した。この時、閾値が変化しないよう
閾値変化ステップ0、開始閾値150として結晶径の測
定を始めた。種結晶部は図4に示すように、明確なフュ
ージョンリングが現れ、閾値150で種結晶部の直径は
正常に測定できた。種結晶を測定している段階で結晶径
の約1/3の周動(結晶の揺らぎ)があったが安定した
測定値を示した。次いで、コーン部に移行させたとこ
ろ、5分程度後に全体の輝度が下がり、計測不能となっ
た。単結晶のラインプロフィールを観察したところ、図
5に示すようなフュージョンリングが消失して輝度ピー
クは閾値150を下回っていた。この時の最大輝度は1
40程度であった。
First, when the seed crystal was grown, measurement of the diameter of the seed crystal was started. At this time, the measurement of the crystal diameter was started with a threshold change step 0 and a start threshold 150 so that the threshold did not change. As shown in FIG. 4, a clear fusion ring appeared in the seed crystal part, and the diameter of the seed crystal part could be measured normally at a threshold value of 150. At the stage of measuring the seed crystal, there was a rotation (crystal fluctuation) of about 1/3 of the crystal diameter, but the measured value was stable. Next, when the light was transferred to the cone portion, the luminance was reduced after about 5 minutes, and the measurement became impossible. When the line profile of the single crystal was observed, the fusion ring as shown in FIG. 5 disappeared, and the luminance peak was below the threshold value 150. The maximum brightness at this time is 1
It was about 40.

【0025】次に、閾値変化ステップ3に変更したとこ
ろ、種結晶部では適切な測定が閾値変更なく測定でき、
コーン部移行3分後に閾値が不適切となり追跡モードと
なった。数回の閾値変更の後、図6に示すように閾値1
38でコーン部の計測が可能となり安定した。この閾値
判定は4分間で完了した。この測定例を図7に示す。図
7より、本実施例によれば、種結晶部、コーン部及び直
胴部の直径を連続して精度よく測定することができた。
Next, when the step is changed to the threshold change step 3, an appropriate measurement can be performed without changing the threshold in the seed crystal portion.
Three minutes after the transition to the cone section, the threshold became inappropriate and the tracking mode was set. After changing the threshold several times, the threshold 1 is changed as shown in FIG.
At 38, the measurement of the cone became possible and stabilized. This threshold determination was completed in 4 minutes. FIG. 7 shows an example of this measurement. As shown in FIG. 7, according to the present example, the diameters of the seed crystal portion, the cone portion, and the straight body portion could be continuously and accurately measured.

【0026】[0026]

【発明の効果】本発明によれば、引き上げ法により育成
される単結晶の直径を精度よく、種結晶から直胴部にわ
たり連続的且つ自動的に測定することが可能となる。従
って、従来のように、人手を煩わすことがなく生産性が
向上する。また、製品の歩留りが向上する。
According to the present invention, the diameter of a single crystal grown by the pulling method can be measured accurately and continuously and automatically from the seed crystal to the straight body. Therefore, unlike the related art, productivity is improved without labor. Further, the yield of the product is improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態における単結晶の直径測定
装置の全体構成図を示す。
FIG. 1 shows an overall configuration diagram of a single crystal diameter measuring apparatus according to an embodiment of the present invention.

【図2】単結晶の直径計算のフローを示す。FIG. 2 shows a flow of calculating the diameter of a single crystal.

【図3】測定される単結晶直径部の平面の概略図を示
す。
FIG. 3 shows a schematic view of a plane of a single crystal diameter portion to be measured.

【図4】本発明の実施の形態における種結晶部のライン
プロフィールの1例を示す。
FIG. 4 shows an example of a line profile of a seed crystal part in the embodiment of the present invention.

【図5】本発明の実施の形態におけるコーン部のライン
プロフィールの1例を示す。
FIG. 5 shows an example of a line profile of a cone portion according to the embodiment of the present invention.

【図6】図5の閾値を変更した状態を示す。FIG. 6 shows a state in which the threshold value of FIG. 5 is changed.

【図7】実施例における単結晶の直径測定例を示す。FIG. 7 shows an example of measuring the diameter of a single crystal in an example.

【図8】従来の方法による種結晶部のラインプロフィー
ルの1例を示す。
FIG. 8 shows an example of a line profile of a seed crystal part according to a conventional method.

【図9】従来の方法によるコーン部のラインプロフィー
ルの1例を示す。
FIG. 9 shows an example of a line profile of a cone portion according to a conventional method.

【図10】従来の方法によるコーン部のラインプロフィ
ールの他の1例を示す。
FIG. 10 shows another example of a line profile of a cone portion according to a conventional method.

【図11】従来の方法による直胴部のラインプロフィー
ルの1例を示す。
FIG. 11 shows an example of a line profile of a straight body portion according to a conventional method.

【符号の説明】[Explanation of symbols]

1 単結晶引き上げ装置 2 石英坩堝 4 ヒータ 6 ワイヤー 9 シリコン溶融液 10 シリコン単結晶ロッド 10a 種結晶部 10b コーン部 10c 直胴部 11 カメラ 12 フレームメモリ 13 演算用CPU 14 アナログ出力手段 15 直径制御コントローラ 16 フュージョンリング 20 単結晶の直径測定装置 DESCRIPTION OF SYMBOLS 1 Single crystal pulling apparatus 2 Quartz crucible 4 Heater 6 Wire 9 Silicon melt 10 Silicon single crystal rod 10a Seed crystal part 10b Cone part 10c Straight body part 11 Camera 12 Frame memory 13 Operation CPU 14 Analog output means 15 Diameter control controller 16 Fusion ring 20 Single crystal diameter measuring device

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 引き上げ法により育成される単結晶の直
径を種結晶から直胴部にわたり連続的に測定する単結晶
の直径測定装置において、単結晶の育成部を撮影し映像
信号を出力するカメラと、前記映像信号を2値化して閾
値により直径を求める2値化直径算出手段と、前記2値
化直径算出手段により求められる直径を過去値との比較
で、短期的に連続的な値である場合には妥当閾値と決定
し、それ以外の値又は測定不能な場合には不適切な閾値
とし、直径が不適切値になる前の値と連続的な値となる
ような閾値を探してこれを変更された妥当閾値と決定す
る妥当閾値決定手段と、前記妥当閾値により求められる
直径を出力するアナログ出力手段と、を有することを特
徴とする単結晶の直径測定装置。
1. A single crystal diameter measuring device for continuously measuring the diameter of a single crystal grown by a pulling method from a seed crystal to a straight body portion, wherein a camera for photographing the single crystal growth portion and outputting a video signal. And a binarized diameter calculating means for binarizing the video signal to obtain a diameter based on a threshold value, and comparing a diameter obtained by the binarized diameter calculating means with a past value to obtain a continuous value in a short term. In some cases, it is determined to be a reasonable threshold, and when it is not possible to measure other values or it is not appropriate, an inappropriate threshold is used. A single crystal diameter measuring apparatus, comprising: a proper threshold value determining means for determining the changed valid threshold value; and an analog output means for outputting a diameter determined by the valid threshold value.
【請求項2】 前記妥当閾値決定手段において、前記妥
当閾値により求められる測定値を少なくとも平均化処理
の計算を行い過去値のデータとすることを特徴とする請
求項1記載の単結晶の直径測定装置。
2. The diameter measurement of a single crystal according to claim 1, wherein said appropriate threshold value determining means calculates at least an averaging process of the measured value obtained by said appropriate threshold value to obtain past value data. apparatus.
【請求項3】 前記カメラが、800nm以上の波長感
度を有する2次元CCDカメラであることを特徴とする
請求項1又は2記載の単結晶の直径測定装置。
3. The single crystal diameter measuring apparatus according to claim 1, wherein the camera is a two-dimensional CCD camera having a wavelength sensitivity of 800 nm or more.
JP12726098A 1998-05-11 1998-05-11 Single crystal diameter measuring device Expired - Fee Related JP4006090B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12726098A JP4006090B2 (en) 1998-05-11 1998-05-11 Single crystal diameter measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12726098A JP4006090B2 (en) 1998-05-11 1998-05-11 Single crystal diameter measuring device

Publications (2)

Publication Number Publication Date
JPH11322487A true JPH11322487A (en) 1999-11-24
JP4006090B2 JP4006090B2 (en) 2007-11-14

Family

ID=14955649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12726098A Expired - Fee Related JP4006090B2 (en) 1998-05-11 1998-05-11 Single crystal diameter measuring device

Country Status (1)

Country Link
JP (1) JP4006090B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013216556A (en) * 2012-04-12 2013-10-24 Sumco Corp Method for pulling single crystal
CN111733449A (en) * 2020-07-07 2020-10-02 上海新昇半导体科技有限公司 Crystal bar growth equipment and growth method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013216556A (en) * 2012-04-12 2013-10-24 Sumco Corp Method for pulling single crystal
CN111733449A (en) * 2020-07-07 2020-10-02 上海新昇半导体科技有限公司 Crystal bar growth equipment and growth method
CN111733449B (en) * 2020-07-07 2021-04-27 上海新昇半导体科技有限公司 Crystal bar growth equipment and growth method

Also Published As

Publication number Publication date
JP4006090B2 (en) 2007-11-14

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