JPH11309669A - Both-surface polishing machine - Google Patents

Both-surface polishing machine

Info

Publication number
JPH11309669A
JPH11309669A JP11762898A JP11762898A JPH11309669A JP H11309669 A JPH11309669 A JP H11309669A JP 11762898 A JP11762898 A JP 11762898A JP 11762898 A JP11762898 A JP 11762898A JP H11309669 A JPH11309669 A JP H11309669A
Authority
JP
Japan
Prior art keywords
polishing
eccentric
rotation
shaft
rotating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11762898A
Other languages
Japanese (ja)
Inventor
Joichi Takada
穣一 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP11762898A priority Critical patent/JPH11309669A/en
Publication of JPH11309669A publication Critical patent/JPH11309669A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To polish by the small circular movement of polishing discs, without the rotation of the polishing disc. SOLUTION: Polishing discs 15, 25 are contacted to both surfaces of a work 68, while separating them relatively by an approach/separate means 30 and approaching relatively after setting the work 68 to a holding carrier 60. The polishing discs 15, 25 are rotated eccentically by an eccentically turning means 50 and polish both surfaces simultaneously. By the eccentically rotating means 50, eccentric axial centers 14A, 24A can be displacingly rotated around the support axial centers 10A, 20A and the polishing discs 15, 25 are displacingly rotated by a small circle around the support axial centers 10A, 20A without rotating and the contact of the polishing discs 15, 25 for the work 68 is carried out uniformly at entire both surfaces and with a constant polishing speed. The polishing discs 15, 25 can offset the lateral direction load by processing.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、たとえば液晶用の
硝子板、金属板、半導体のシリコン基板、セラミックス
基板など各種の被加工物の両面を研磨するのに使用され
る両面研磨装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a double-side polishing apparatus used for polishing both surfaces of various workpieces such as a liquid crystal glass plate, a metal plate, a semiconductor silicon substrate, and a ceramic substrate. is there.

【0002】[0002]

【従来の技術】従来、この種の両面研磨装置としては、
たとえば特開平6−206159号公報に見られる研磨
装置が提供されている。この従来構成は、公転駆動装置
により上下の支持部材を互いに逆回転させることで各縦
軸を公転軸心の周りで公転させるとともに、自転駆動装
置により各縦軸を自転軸心の周りで自転させ、以て研磨
体群を公転させながら自転させる。さらに被研磨物を貫
装した保持キャリアを横移動させ、その横移動により変
位した軸心を中心として自転させる。したがって上下の
研磨体群を公転軸心に沿った方向に接近移動させて被研
磨物の両面に当接させることで所期の両面研磨を行え
る。
2. Description of the Related Art Conventionally, as a double-side polishing apparatus of this kind,
For example, a polishing apparatus disclosed in Japanese Patent Application Laid-Open No. 6-206159 is provided. In this conventional configuration, each vertical axis is revolved around a revolving axis by rotating the upper and lower support members in opposite directions by a revolving drive device, and each vertical axis is revolved about a revolving axis by a revolving drive device. Then, the polishing body group is rotated while revolving. Further, the holding carrier in which the object to be polished is penetrated is moved laterally, and is rotated around the axis displaced by the lateral movement. Therefore, the desired double-side polishing can be performed by moving the upper and lower polishing bodies close to each other in the direction along the revolving axis and bringing them into contact with both surfaces of the object to be polished.

【0003】このようにして所期の両面研磨を行ったの
ち、上部支持部材を上昇離間させることで、保持キャリ
アの嵌合孔から研磨済みの被研磨物を取り出し、そして
新たな被研磨物を嵌合孔への嵌め込みによりセットさせ
る。
After the intended double-side polishing is performed in this manner, the polished work is taken out from the fitting hole of the holding carrier by raising and separating the upper support member, and a new work is performed. It is set by fitting into the fitting hole.

【0004】[0004]

【発明が解決しようとする課題】上記した従来構成にお
いて研磨体群は、大きな円運動で公転や自転を行うこと
から、被研磨物の全面に亘っての研磨速度が一定になら
ず、したがって均一な研磨は充分に行えない。
In the conventional structure described above, the polishing body group revolves or rotates with a large circular motion, so that the polishing rate over the entire surface of the object to be polished is not constant, and therefore, the polishing rate is not uniform. Polishing cannot be performed sufficiently.

【0005】そこで本発明のうち請求項1記載の発明
は、研磨盤による研磨を、研磨盤を自転させることな
く、小さな円運動をさせながら行える両面研磨装置を提
供することを目的としたものである。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a double-side polishing apparatus capable of performing polishing by a polishing disk while making a small circular motion without rotating the polishing disk. is there.

【0006】[0006]

【課題を解決するための手段】前述した目的を達成する
ために、本発明のうちで請求項1記載の両面研磨装置
は、保持キャリアで保持した被加工物の両面を挟む状態
で、一対の研磨盤を配置するとともに、これら研磨盤を
相対的に接近離間動させる接近離間手段を設け、両研磨
盤を、支持軸心の周りに回転可能な偏心軸心上に遊転可
能に設け、両偏心軸心を変位させた状態で、これら偏心
軸心を支持軸心の周りに回転させる偏心回転手段を設け
たことを特徴としたものである。
In order to achieve the above-mentioned object, a double-side polishing apparatus according to the first aspect of the present invention is provided with a pair of workpieces held by a holding carrier in a state where both faces are sandwiched. Along with disposing the polishing discs, providing an approaching / separating means for relatively moving these polishing discs toward and away from each other, both polishing discs are provided so as to be freely rotatable on an eccentric axis rotatable around the support axis. An eccentric rotation means is provided for rotating these eccentric shafts around the support shaft while the eccentric shaft is displaced.

【0007】したがって請求項1の発明によると、接近
離間手段により両研磨盤を相対的に離間させた状態で、
保持キャリアに被加工物をセットさせる。この状態で接
近離間手段により両研磨盤を相対的に接近させることに
より、被加工物の両面に対して各研磨盤を当接し得る。
このような当接の前後において、偏心回転手段により両
研磨盤を偏心回転させて、所期の両面同時の研磨を行
う。
Therefore, according to the first aspect of the present invention, in a state where the two polishing machines are relatively separated by the approach / separation means,
The workpiece is set on the holding carrier. In this state, the two polishing discs are brought closer to each other by the approaching / separating means, whereby each polishing disc can be brought into contact with both surfaces of the workpiece.
Before and after such contact, both polishing machines are eccentrically rotated by the eccentric rotating means, and the desired simultaneous polishing on both surfaces is performed.

【0008】すなわち、偏心回転手段による回転によ
り、偏心軸心を支持軸心の周りに変位回転(公転)させ
得、これによって両研磨盤を、自転させることなく、支
持軸心の周りの小さな円上で変位回転させ得、以て被加
工物の両面に対する研磨盤の当接は、両面全域で均一状
にかつ研磨速度を一定状として行える。その際に、両研
磨盤は、両偏心軸心を互いに変位させた状態で変位回転
することから、加工による横方向荷重を相殺し得る。
That is, the eccentric shaft can be displaced and rotated (revolved) around the support shaft by the rotation of the eccentric rotation means, so that both polishing machines do not rotate, and a small circle around the support shaft is formed. In this manner, the polishing disk can be brought into contact with both surfaces of the workpiece in a uniform manner and at a constant polishing rate over both surfaces. At that time, the two polishing machines are displaced and rotated with the two eccentric shafts displaced from each other, so that the lateral load due to the processing can be offset.

【0009】[0009]

【発明の実施の形態】以下に、本発明の実施の形態を図
1〜図4に基づいて説明する。1はフレームで、下部空
間2を形成する箱枠状の下部フレーム3と、この下部フ
レーム3の一側上面から立設され上部空間4を形成する
箱枠状の上部フレーム5とから構成される。前記下部フ
レーム3は、上板の中央部に開口6が形成されるととも
に、その下部空間2は前記上部空間4に連通されてい
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIGS. Reference numeral 1 denotes a frame, which comprises a box-frame-shaped lower frame 3 forming a lower space 2 and a box-frame-shaped upper frame 5 erected from one upper surface of the lower frame 3 to form an upper space 4. . The lower frame 3 has an opening 6 formed at the center of the upper plate, and the lower space 2 communicates with the upper space 4.

【0010】前記フレーム1には、縦方向の上部回転軸
10と下部回転軸20とが設けられ、これら回転軸1
0,20は、同一線上に位置される回転軸心(支持軸心
の一例)10A,20Aの周りに回転自在に構成されて
いる。すなわち、上部回転軸10は、上部筒体11に軸
受12を介して回転自在に支持されており、そして上部
筒体11は、上部フレーム5側からの上部支持体13の
遊端に固定されている。また下部回転軸20は、下部筒
体21に軸受22を介して回転自在に支持されており、
そして下部筒体21は、下部フレーム3から連設された
下部支持体23の遊端に固定されている。
The frame 1 is provided with an upper rotating shaft 10 and a lower rotating shaft 20 in the vertical direction.
Reference numerals 0 and 20 are configured to be rotatable around rotation axes (an example of a support axis) 10A and 20A located on the same line. That is, the upper rotation shaft 10 is rotatably supported by the upper cylinder 11 via the bearing 12, and the upper cylinder 11 is fixed to the free end of the upper support 13 from the upper frame 5 side. I have. The lower rotation shaft 20 is rotatably supported by a lower cylinder 21 via a bearing 22.
The lower cylinder 21 is fixed to a free end of a lower support 23 provided continuously from the lower frame 3.

【0011】両回転軸10,20の相対向端側には、そ
れぞれ偏心軸14,24が一体に設けられ、これら偏心
軸14,24は前記回転軸心10A,20Aの周りに回
転可能に構成される。そして、上部偏心軸14には上部
研磨盤15が、軸受16を介して偏心軸心14A上に遊
転自在に支持されており、また、下部偏心軸24には下
部研磨盤25が、軸受26を介して偏心軸心24A上に
遊転自在に支持されている。
Eccentric shafts 14 and 24 are integrally provided on the opposite ends of the rotating shafts 10 and 20, respectively, and these eccentric shafts 14 and 24 are configured to be rotatable around the rotating shafts 10A and 20A. Is done. An upper polishing machine 15 is supported on the upper eccentric shaft 14 via a bearing 16 so as to freely rotate on an eccentric shaft 14A, and a lower polishing machine 25 is mounted on the lower eccentric shaft 24 with a bearing 26. And is freely rotatably supported on the eccentric shaft center 24A through the shaft.

【0012】両研磨盤15,25を相対的に接近離間動
させる接近離間手段30が設けられる。この接近離間手
段30は、上部フレーム5の上端と上部支持体13の基
端との間に介在されるシリンダー装置31と、上部支持
体13の昇降を案内するガイドロッド(またはガイドレ
ール)32などにより、その一例が構成される。したが
って、シリンダー装置31を伸縮動させることで、下部
研磨盤25に対して上部研磨盤15が接近離間動され
る。
An approach / separation means 30 for relatively moving the polishing machines 15 and 25 toward / away from each other is provided. The approach / separation means 30 includes a cylinder device 31 interposed between the upper end of the upper frame 5 and the base end of the upper support 13, and a guide rod (or guide rail) 32 for guiding the upper support 13 to move up and down. Constitutes one example. Therefore, by moving the cylinder device 31 in and out, the upper polishing plate 15 is moved closer to and away from the lower polishing plate 25.

【0013】両研磨盤15,25には、研磨材供給手段
34,37が設けられる。すなわち、上部研磨材供給手
段34は、上部研磨盤15に形成された供給路35と、
この供給路35に接続された供給ホース36などにより
構成され、研磨材(水や油の研磨液など)は、たとえば
自重流下により供給される。また、下部研磨材供給手段
37は、下部研磨盤25に形成された供給路38と、こ
の供給路38に接続された供給ホース39などにより構
成され、研磨材は、たとえば圧入により供給される。そ
の際に研磨材は、両研磨盤15,25の面に対して均一
状に供給されるように構成されている。
The polishing machines 15 and 25 are provided with abrasive supply means 34 and 37, respectively. That is, the upper abrasive supply means 34 includes a supply passage 35 formed in the upper polishing plate 15,
An abrasive (a polishing liquid such as water or oil) is supplied by a supply hose 36 connected to the supply passage 35, for example, and is supplied by gravity. The lower abrasive supply means 37 includes a supply passage 38 formed in the lower polishing plate 25, a supply hose 39 connected to the supply passage 38, and the like. The abrasive is supplied, for example, by press-fitting. At that time, the polishing material is configured to be uniformly supplied to the surfaces of both polishing disks 15 and 25.

【0014】前記偏心軸14,24を回転軸心10A,
20Aの周りで回転させる際に、上部研磨盤15の回転
軸心10Aの周りでの偏心回転を支持しかつ規制する上
部研磨盤規制手段40と、下部研磨盤25の回転軸心2
0Aの周りでの偏心回転を支持しかつ規制する下部研磨
盤規制手段46とが設けられる。
[0014] The eccentric shafts 14, 24 are connected to the rotating shaft center 10A,
The upper polishing disc regulating means 40 which supports and regulates the eccentric rotation of the upper polishing disc 15 around the rotation axis 10A when rotating around the 20A, and the rotation axis 2 of the lower polishing disc 25.
Lower polishing disc regulating means 46 for supporting and regulating the eccentric rotation about 0A is provided.

【0015】すなわち、上部筒体11の下面側に矩形状
の支持板41が設けられ、この支持板41の中央貫通部
42に前記上部回転軸10が挿通される。そして支持板
41の下面と前記上部研磨盤15の上面との間には、9
0度置きの四箇所に上部スライドユニット43が設けら
れる。ここで各上部スライドユニット43は、上位のX
方向スライド部(前後方向スライド部)44と、下位の
Y方向スライド部(左右方向スライド部)45とからな
る。以上の41〜45などにより上部研磨盤規制手段4
0の一例が構成される。
That is, a rectangular support plate 41 is provided on the lower surface side of the upper cylindrical body 11, and the upper rotary shaft 10 is inserted into a central through portion 42 of the support plate 41. 9 is provided between the lower surface of the support plate 41 and the upper surface of the upper polishing plate 15.
Upper slide units 43 are provided at four positions at 0-degree intervals. Here, each upper slide unit 43 is a
It comprises a direction sliding section (front-back direction sliding section) 44 and a lower Y-direction sliding section (left-right direction sliding section) 45. By means of the above 41 to 45, etc., the upper polishing disc regulating means 4
0 is configured.

【0016】また、下部フレーム3における上板の上面
と前記下部研磨盤25の下面との間には、90度置きの
四箇所に下部スライドユニット47が設けられる。ここ
で各下部スライドユニット47は、下位のX方向スライ
ド部(前後方向スライド部)48と、上位のY方向スラ
イド部(左右方向スライド部)49とからなる。以上の
47〜49などにより下部研磨盤規制手段46の一例が
構成される。
Further, between the upper surface of the upper plate of the lower frame 3 and the lower surface of the lower polishing plate 25, lower slide units 47 are provided at four positions at intervals of 90 degrees. Here, each lower slide unit 47 includes a lower X-direction slide unit (front-rear slide unit) 48 and an upper Y-direction slide unit (left-right slide unit) 49. An example of the lower polishing disc regulating means 46 is constituted by the above 47 to 49 and the like.

【0017】両偏心軸心14A,24Aを、回転軸心1
0A,20Aに対して相対的に180度変位させた状態
で、これら偏心軸心14A,24Aを回転軸心10A,
20Aの周りで同方向に等速状で変位回転させる偏心回
転手段50が設けられる。
The two eccentric shafts 14A and 24A are connected to the rotating shaft 1
With the eccentric shafts 14A and 24A displaced by 180 degrees relative to 0A and 20A, the eccentric shafts 14A and 24A are
An eccentric rotation means 50 is provided for rotating and displacing at the same speed in the same direction around 20A.

【0018】すなわち、下部空間2から上部空間4に亘
って回転駆動軸51が配設され、この回転駆動軸51
は、軸受52を介してフレーム1側に回転自在に支持さ
れている。そしてフレーム1側には回転駆動装置(モー
タ)53が設けられ、その出力軸54と前記回転駆動軸
51とが巻き掛け連動装置55を介して連動連結されて
いる。
That is, the rotary drive shaft 51 is provided from the lower space 2 to the upper space 4, and the rotary drive shaft 51 is provided.
Is rotatably supported on the frame 1 side via a bearing 52. A rotation drive device (motor) 53 is provided on the frame 1 side, and an output shaft 54 and the rotation drive shaft 51 are linked and connected via a winding link device 55.

【0019】前記上部回転軸10の上部と前記回転駆動
軸51とがタイミングベルト形式などの巻き掛け連動装
置56を介して連動連結されている。また、前記下部回
転軸20の下部と前記回転駆動軸51とがタイミングベ
ルト形式などの巻き掛け連動装置57を介して連動連結
されている。以上の51〜57などにより、偏心回転手
段50の一例が構成される。
The upper part of the upper rotary shaft 10 and the rotary drive shaft 51 are linked and connected via a winding link device 56 such as a timing belt type. Further, the lower portion of the lower rotary shaft 20 and the rotary drive shaft 51 are interlockingly connected via a winding interlocking device 57 such as a timing belt type. An example of the eccentric rotation means 50 is configured by the above 51 to 57 and the like.

【0020】前記フレーム1側には、被加工物(被研磨
物)68を貫装自在な保持キャリア60が配設され、こ
の保持キャリア60は横方向に移動自在に構成されてい
る。すなわち保持キャリア60には、矩形状の嵌合孔6
1が形成され、この嵌合孔61に、矩形板状の被加工物
68を貫装自在としている。そして下部フレーム3上に
は、左右方向のガイドロッド67が前後一対に配設さ
れ、これらガイドロッド67に保持キャリア60が左右
方向に移動自在に支持案内される。
On the frame 1 side, there is provided a holding carrier 60 through which a workpiece (polished object) 68 can be inserted. The holding carrier 60 is configured to be movable in the lateral direction. That is, the holding carrier 60 has a rectangular fitting hole 6.
A rectangular plate-shaped workpiece 68 can be inserted through the fitting hole 61. A pair of left and right guide rods 67 are disposed on the lower frame 3, and the holding carrier 60 is supported and guided by these guide rods 67 so as to be movable in the left and right directions.

【0021】前記保持キャリア60を左右動させる左右
動手段62が設けられ、この左右動手段62は、前記下
部フレーム3に取付けられた移動用モータ63と、この
移動用モータ63の上向きの出力軸64に固定した円板
体65と、この円板体65の偏心位置と前記保持キャリ
ア60の遊端とを相対揺動自在に連結するリンク体66
などにより構成されている。
Left and right moving means 62 for moving the holding carrier 60 right and left are provided. The left and right moving means 62 includes a moving motor 63 mounted on the lower frame 3 and an upward output shaft of the moving motor 63. And a link body 66 for connecting the eccentric position of the disc body 65 and the free end of the holding carrier 60 so as to be relatively swingable.
Etc.

【0022】以下に、上記した実施の形態における作用
を説明する。接近離間手段30におけるシリンダー装置
31の収縮動で上部支持体13を上昇させ、下部研磨盤
25に対して上部研磨盤15を上昇離間させた状態で、
保持キャリア60の嵌合孔61に対して矩形の被加工物
68が嵌め込みによりセットされる。このとき被加工物
68は、下部研磨盤25に、その下面を介して当接され
る。
The operation of the above embodiment will be described below. In a state where the upper support 13 is raised by the contraction movement of the cylinder device 31 in the approach / separation means 30 and the upper polishing plate 15 is moved up and away from the lower polishing plate 25,
A rectangular workpiece 68 is set in the fitting hole 61 of the holding carrier 60 by fitting. At this time, the workpiece 68 abuts on the lower polishing plate 25 via the lower surface thereof.

【0023】この状態でシリンダー装置31を伸展動さ
せ、上部支持体13を介して上部研磨盤15を下降させ
ることにより、被加工物68の上面に対して上部研磨盤
15を軽く当接し得る。このような当接の前後において
回転駆動装置53が稼働され、両研磨盤15,25を偏
心回転させて所期の研磨を行う。
In this state, the cylinder device 31 is extended and the upper polishing plate 15 is lowered via the upper support 13 so that the upper polishing plate 15 can lightly contact the upper surface of the workpiece 68. Before and after such contact, the rotation driving device 53 is operated, and the polishing machines 15 and 25 are eccentrically rotated to perform intended polishing.

【0024】すなわち、偏心回転手段50における回転
駆動装置53の回転は、巻き掛け連動装置55を介して
回転駆動軸51に伝達され、さらに回転駆動軸51の回
転は、巻き掛け連動装置56を介して上部回転軸10に
伝達されるとともに、巻き掛け連動装置57を介して下
部回転軸20に伝達される。
That is, the rotation of the rotation driving device 53 in the eccentric rotation means 50 is transmitted to the rotation driving shaft 51 via the winding interlocking device 55, and the rotation of the rotation driving shaft 51 is further transmitted through the winding interlocking device 56. And transmitted to the lower rotating shaft 20 via the winding interlocking device 57.

【0025】そして上部回転軸10の回転により、前記
偏心軸心14A、すなわち上部偏心軸14を、回転軸心
10Aの周りに変位回転(公転)Aさせる。この変位回
転Aの際に上部研磨盤15は、上部スライドユニット4
3のX方向スライド部44により前後方向のスライドが
許され、かつY方向スライド部45により左右方向のス
ライドが許される状態で支持板41側に支持されている
ことで、両スライドの複合運動によって、自転すること
なく、回転軸心10Aの周りの小さな円上で変位回転A
を行うことになる。このとき、上部偏心軸14と上部研
磨盤15との相対回転は軸受16により許容される。
The rotation of the upper rotation shaft 10 causes the eccentric shaft 14A, ie, the upper eccentric shaft 14, to be displaced and rotated (revolved) A around the rotation shaft 10A. At the time of this displacement rotation A, the upper polishing machine 15
3 is supported by the support plate 41 in a state where sliding in the front-rear direction is allowed by the X-direction sliding portion 44 and sliding in the left-right direction is allowed by the Y-direction sliding portion 45. Without rotation, displacement A on a small circle around the rotation axis 10A
Will be done. At this time, relative rotation between the upper eccentric shaft 14 and the upper polishing machine 15 is allowed by the bearing 16.

【0026】また下部回転軸20の回転により、前記偏
心軸心24A、すなわち下部偏心軸24を、回転軸心2
0Aの周りに、前記上部偏心軸14と同方向に等速状で
変位回転Aさせる。この変位回転Aの際に下部研磨盤2
5は、下部スライドユニット47のX方向スライド部4
8により前後方向のスライドが許され、かつY方向スラ
イド部49により左右方向のスライドが許される状態で
下部フレーム3側に支持されていることで、両スライド
の複合運動によって、自転することなく、回転軸心20
Aの周りの小さな円上で変位回転Aを行うことになる。
このとき、下部偏心軸24と下部研磨盤25との相対回
転は軸受26により許容される。
The rotation of the lower rotary shaft 20 causes the eccentric shaft 24A, that is, the lower eccentric shaft 24, to be rotated by the rotary shaft 2
It is displaced and rotated around 0A in the same direction as the upper eccentric shaft 14 at a constant speed. In the case of this displacement rotation A, the lower polishing machine 2
5 is the X-direction slide portion 4 of the lower slide unit 47
8, the slide in the front-rear direction is allowed by the Y-direction slide portion 49, and the slide in the left-right direction is supported by the lower frame 3 side. Rotation axis 20
The displacement rotation A will be performed on a small circle around A.
At this time, the relative rotation between the lower eccentric shaft 24 and the lower polishing machine 25 is allowed by the bearing 26.

【0027】そして移動用モータ63の回転は、円板体
65とリンク体66とからなるクランク機構によって、
このリンク体66の押し引き動に換えられ、以て保持キ
ャリア60を、ガイドロッド67の支持案内により左右
方向に往復移動Bさせる。
The rotation of the moving motor 63 is performed by a crank mechanism including a disc 65 and a link 66.
The holding carrier 60 is reciprocated B in the left-right direction by the support and guide of the guide rod 67 in response to the pushing and pulling movement of the link body 66.

【0028】上述したような各部の動作に基づいて、被
加工物68の両面が同時に研磨される。すなわち、上下
の研磨盤15,25は、互いに180度変位した状態で
同方向に等速状で変位回転Aし、そして被加工物68を
貫装した保持キャリア60は横に往復移動Bすることに
なる。
Based on the operation of each part as described above, both surfaces of the workpiece 68 are polished simultaneously. That is, the upper and lower polishing disks 15 and 25 are displaced and rotated A at the same speed in the same direction while being displaced by 180 degrees from each other, and the holding carrier 60 in which the workpiece 68 is inserted is reciprocated B sideways. become.

【0029】したがって、この状態でシリンダー装置3
1の伸展により荷重を掛けることにより、研磨盤15,
25の小さな円上での公転Aと、被加工物68の往復移
動Bとの複合移動によって、被加工物68の両面に対す
る研磨盤15,25の当接は、両面全域で均一状にかつ
研磨速度を一定状として行え、以て研磨残りの生じない
均一な研磨加工を行える。
Therefore, in this state, the cylinder device 3
By applying a load by extension of No. 1, the polishing machine 15,
Due to the combined movement of the revolution A on the small circle 25 and the reciprocating movement B of the workpiece 68, the abutment of the polishing plates 15, 25 on both surfaces of the workpiece 68 is uniform and polished over the entire area of both surfaces. The speed can be kept constant, so that a uniform polishing process can be performed without remaining polishing.

【0030】しかも上下の研磨盤15,25は、それぞ
れ規制手段40,46により支持されて運動、すなわち
公転Aを行うことから、これら研磨盤15,25の研磨
面の運動は同一平面で行え、その均一研磨はより向上し
得る。さらに、上下の研磨盤15,25が、互いに18
0度変位した状態で同方向に等速状で変位回転Aされる
ことで、加工による横方向荷重を相殺し得る。しかも、
被加工物68の両面を同時に研磨するので、板状物の研
磨の場合、歪んだ板状物を平面に研磨加工できる。
Further, since the upper and lower polishing disks 15 and 25 perform the movement, that is, the revolution A, supported by the regulating means 40 and 46, respectively, the movement of the polishing surfaces of these polishing disks 15 and 25 can be performed on the same plane. The uniform polishing can be further improved. Furthermore, the upper and lower polishing disks 15 and 25 are
By performing the displacement rotation A at the same speed in the same direction in the state of being displaced by 0 degrees, the lateral load due to the processing can be offset. Moreover,
Since both surfaces of the workpiece 68 are polished at the same time, in the case of polishing a plate, a distorted plate can be polished into a flat surface.

【0031】なお研磨盤15,25による研磨は、上部
研磨材供給手段34や下部研磨材供給手段37により研
磨材を供給しながら(かけながら)行われる。次に、本
発明の別の実施の形態を、図5、図6に基づいて説明す
る。
The polishing by the polishing plates 15 and 25 is performed while supplying (spreading) the abrasive by the upper abrasive supply means 34 and the lower abrasive supply means 37. Next, another embodiment of the present invention will be described with reference to FIGS.

【0032】すなわち、保持キャリア60に複数の嵌合
孔61が形成されており、これら嵌合孔61にそれぞれ
被加工物68を嵌合させている。これによると、複数個
の被加工物68を同時に研磨し得る。なお、同時に研磨
される被加工物68の数や大小の形状は任意に設定され
るものである。
That is, a plurality of fitting holes 61 are formed in the holding carrier 60, and a workpiece 68 is fitted into each of the fitting holes 61. According to this, a plurality of workpieces 68 can be polished simultaneously. The number and the size of the workpieces 68 to be polished at the same time are arbitrarily set.

【0033】上記した両実施の形態では、矩形板状の被
加工物68の研磨を行っているが、これは丸形など種々
な形状の被加工物を取り扱えるものであり、それに応じ
て嵌合孔61の形状が決定される。
In the above-described embodiments, the workpiece 68 having a rectangular plate shape is polished. However, the workpiece 68 can handle workpieces of various shapes such as a round shape. The shape of the hole 61 is determined.

【0034】上記した両実施の形態において、回転駆動
装置53の回転速度、すなわち両研磨盤15,25の回
転数は、たとえば操作盤の操作により任意に調整し得、
これにより、被加工物68に対する出来るだけ均一な滑
り速度を得られる。
In both of the above-described embodiments, the rotation speed of the rotary drive device 53, that is, the rotation speed of the polishing plates 15, 25 can be arbitrarily adjusted by operating the operation panel, for example.
As a result, a sliding speed as uniform as possible with respect to the workpiece 68 can be obtained.

【0035】上記した両実施の形態において、両面研磨
装置を複数台設置して、共通(1台)のロボットによ
り、被加工物68の供給や取出しなど、各種の作業を行
う形式であってもよい。
In the above-described embodiments, a plurality of double-side polishing apparatuses are installed, and various operations such as supply and removal of the workpiece 68 are performed by a common (one) robot. Good.

【0036】上記した両実施の形態において、上下の研
磨盤15,25は、互いに180度変位して配設されて
いるが、この180度は、最も好ましい角度であって、
この角度に限定されるものではない。
In both of the above-described embodiments, the upper and lower polishing disks 15 and 25 are disposed so as to be displaced from each other by 180 °. This 180 ° is the most preferable angle, and
It is not limited to this angle.

【0037】[0037]

【発明の効果】上記した本発明の請求項1によると、接
近離間手段により両研磨盤を相対的に離間させたのち、
保持キャリアに被加工物をセットした状態で、接近離間
手段により両研磨盤を相対的に接近させることにより、
被加工物の両面に対して各研磨盤を当接でき、このよう
な当接の前後において、偏心回転手段により両研磨盤を
偏心回転させることで、所期の両面同時の研磨を行うこ
とができる。
According to the first aspect of the present invention, after the two polishing disks are relatively separated by the approaching / separating means,
With the work piece set on the holding carrier, the two polishing machines are relatively approached by the approach / separation means,
Each polishing disc can be brought into contact with both surfaces of the workpiece, and before and after such contacting, by eccentrically rotating both polishing discs by the eccentric rotating means, it is possible to perform the desired simultaneous polishing on both sides. it can.

【0038】すなわち、偏心回転手段による回転によ
り、偏心軸心を支持軸心の周りに変位回転(公転)で
き、これによって両研磨盤を、自転させることなく、支
持軸心の周りの小さな円上で変位回転できて、被加工物
の両面に対する研磨盤の当接を、両面全域で均一状にか
つ研磨速度を一定状として行うことができ、以て研磨残
りの生じない均一な研磨加工を行うことができる。その
際に加工による横方向荷重は、両研磨盤の偏心軸心を互
いに変位させた状態で両研磨盤を変位回転させること
で、容易にかつ好適に相殺できる。
That is, the rotation of the eccentric shaft can be displaced and rotated (revolved) around the support shaft by the rotation of the eccentric rotation means, so that both polishing machines can be rotated on a small circle around the support shaft without rotating. , The contact of the polishing machine to both surfaces of the workpiece can be performed uniformly and the polishing speed is constant over the entire area of both surfaces, thereby performing a uniform polishing process with no remaining polishing. be able to. At that time, the lateral load due to the processing can be easily and suitably canceled by displacing and rotating the two polishing machines while the eccentric axes of the two polishing machines are mutually displaced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態を示し、両面研磨装置の一
部切り欠き側面図である。
FIG. 1 shows an embodiment of the present invention and is a partially cutaway side view of a double-side polishing apparatus.

【図2】同両面研磨装置の平面図である。FIG. 2 is a plan view of the double-side polishing apparatus.

【図3】同両面研磨装置の要部の縦断側面図である。FIG. 3 is a vertical sectional side view of a main part of the double-side polishing apparatus.

【図4】同両面研磨装置の要部の平面図である。FIG. 4 is a plan view of a main part of the double-side polishing apparatus.

【図5】本発明の別の実施の形態を示し、両面研磨装置
の要部の縦断側面図である。
FIG. 5 shows another embodiment of the present invention and is a longitudinal sectional side view of a main part of a double-side polishing apparatus.

【図6】同両面研磨装置の要部の平面図である。FIG. 6 is a plan view of a main part of the double-side polishing apparatus.

【符号の説明】[Explanation of symbols]

1 フレーム 10 上部回転軸 10A 回転軸心(支持軸心) 11 上部筒体 14 上部偏心軸 14A 偏心軸心 15 上部研磨盤 20 下部回転軸 20A 回転軸心(支持軸心) 21 下部筒体 24 下部偏心軸 24A 偏心軸心 25 下部研磨盤 30 接近離間手段 34 上部研磨材供給手段 37 下部研磨材供給手段 40 上部研磨盤規制手段 46 下部研磨盤規制手段 50 偏心回転手段 53 回転駆動装置 60 保持キャリア 61 嵌合孔 62 左右動手段 68 被加工物 A 変位回転 B 往復移動 Reference Signs List 1 frame 10 upper rotation axis 10A rotation axis (support axis) 11 upper cylinder 14 upper eccentric axis 14A eccentric axis 15 upper polishing machine 20 lower rotation axis 20A rotation axis (support axis) 21 lower cylinder 24 lower Eccentric shaft 24A Eccentric shaft center 25 Lower polishing disc 30 Approaching / separating means 34 Upper polishing material supply means 37 Lower polishing material supply means 40 Upper polishing disc regulating means 46 Lower polishing disc regulating means 50 Eccentric rotating means 53 Rotary driving device 60 Holding carrier 61 Fitting hole 62 Left and right moving means 68 Workpiece A Displacement rotation B Reciprocation

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 保持キャリアで保持した被加工物の両面
を挟む状態で、一対の研磨盤を配置するとともに、これ
ら研磨盤を相対的に接近離間動させる接近離間手段を設
け、両研磨盤を、支持軸心の周りに回転可能な偏心軸心
上に遊転可能に設け、両偏心軸心を変位させた状態で、
これら偏心軸心を支持軸心の周りに回転させる偏心回転
手段を設けたことを特徴とする両面研磨装置。
1. A pair of polishing disks are arranged in a state where both surfaces of a workpiece held by a holding carrier are sandwiched, and approaching / separating means for relatively moving the polishing disks toward / away from each other is provided. , Provided rotatably on an eccentric shaft rotatable around the support axis, with both eccentric shafts displaced,
A double-side polishing apparatus comprising eccentric rotating means for rotating these eccentric shafts around the support shaft.
JP11762898A 1998-04-28 1998-04-28 Both-surface polishing machine Pending JPH11309669A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11762898A JPH11309669A (en) 1998-04-28 1998-04-28 Both-surface polishing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11762898A JPH11309669A (en) 1998-04-28 1998-04-28 Both-surface polishing machine

Publications (1)

Publication Number Publication Date
JPH11309669A true JPH11309669A (en) 1999-11-09

Family

ID=14716440

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11762898A Pending JPH11309669A (en) 1998-04-28 1998-04-28 Both-surface polishing machine

Country Status (1)

Country Link
JP (1) JPH11309669A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007083337A (en) * 2005-09-21 2007-04-05 Speedfam Co Ltd Surface polishing device
JP2009034812A (en) * 2007-07-11 2009-02-19 Saichi Industries Inc Both-plane-face polishing method and both-plane-face polishing device
JP2011167824A (en) * 2010-02-22 2011-09-01 Akita Prefecture Method and device of finishing both-plane-face

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007083337A (en) * 2005-09-21 2007-04-05 Speedfam Co Ltd Surface polishing device
JP4614851B2 (en) * 2005-09-21 2011-01-19 スピードファム株式会社 Surface polishing equipment
JP2009034812A (en) * 2007-07-11 2009-02-19 Saichi Industries Inc Both-plane-face polishing method and both-plane-face polishing device
JP2011167824A (en) * 2010-02-22 2011-09-01 Akita Prefecture Method and device of finishing both-plane-face

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