JPH1129744A - Coating solution for formation of silica-based film, its preparation and silica-based film - Google Patents

Coating solution for formation of silica-based film, its preparation and silica-based film

Info

Publication number
JPH1129744A
JPH1129744A JP9183755A JP18375597A JPH1129744A JP H1129744 A JPH1129744 A JP H1129744A JP 9183755 A JP9183755 A JP 9183755A JP 18375597 A JP18375597 A JP 18375597A JP H1129744 A JPH1129744 A JP H1129744A
Authority
JP
Japan
Prior art keywords
silica
film
based film
coating solution
coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9183755A
Other languages
Japanese (ja)
Inventor
Yasuhiro Yamamoto
靖浩 山本
Hiroyuki Morishima
浩之 森嶋
Takenori Narita
武憲 成田
Shigeru Nobe
茂 野部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co Ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP9183755A priority Critical patent/JPH1129744A/en
Publication of JPH1129744A publication Critical patent/JPH1129744A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To obtain a coating solution for formation of a silica-based film which forms a film having high storage stability, thick-film formability, crack resistance and surface smoothness, and a silica-based film with high crack resistance and surface smoothness the thickness, of which can be increased, and to provide its preparation method. SOLUTION: A coating solution for formation of a silica-based film comprises (A) a siloxane polymer obtained by allowing an alkoxysilane compound of the formula Rn Si(OR)4-n (wherein R is a 1-4C alkyl; (n) is an integer of from 0 to 2) to undergo hydrolysis and polycondensation, and (B) a hexaalkyldisiloxane compound of the formula R'3 Si-O-SiR'3 (wherein R' is a 1-4C alkyl). A silica-based film is formed by using this coating solution.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、シリカ系被膜形成
用塗布液、その製造法及びシリカ系被膜に関し、更に詳
しくは高濃度でも液状安定性に優れかつ厚膜成膜性の良
好なシリカ系被膜を調整することができるシリカ系被膜
形成用塗布液、その製造法及びシリカ系被膜に関する。
The present invention relates to a coating solution for forming a silica-based film, a method for producing the same, and a silica-based film. More specifically, the present invention relates to a silica-based film having excellent liquid stability even at a high concentration and good film-forming properties. The present invention relates to a coating solution for forming a silica-based film capable of adjusting a film, a method for producing the same, and a silica-based film.

【0002】[0002]

【従来の技術】従来、IC、LSI等の半導体素子の層
間絶縁膜の平坦化方法として、パターン形成された配線
層を有する基盤上に真空蒸着、CVD等の気相成長法に
よりSiO2、SiN等からなる1層目の層間絶縁膜を
形成し、2層目にSOG液(オルガノシロキサンのオリ
ゴマー液)を回転塗布し、その後熱処理することにより
オルガノシロキサン系被膜を形成する。次に1層目と同
様の方法により3層目の層間絶縁膜を形成する3層層間
膜によるSOG平坦化プロセスが広く用いられている。
2. Description of the Related Art Conventionally, as a method of flattening an interlayer insulating film of a semiconductor element such as an IC or an LSI, SiO 2 , SiN is formed on a substrate having a patterned wiring layer by a vapor deposition method such as vacuum deposition or CVD. The first layer of an interlayer insulating film is formed, and the second layer is spin-coated with an SOG solution (oligomer of organosiloxane), followed by heat treatment to form an organosiloxane-based film. Next, an SOG planarization process using a three-layer interlayer film in which a third interlayer insulating film is formed in the same manner as the first layer is widely used.

【0003】近年、益々、配線の多層化の要求が高ま
り、また、微細配線加工プロセスでのフォーカスマージ
ン向上の要求から従来のシリカ系被膜形成用塗布液を用
いた平坦化技術に替わるより広域平坦化に優れた新たな
平坦化技術が不可欠となってきた。この要求に応えるた
め、近年、CVD等の気相成長法により形成したSiO
2のCMP法による平坦化が提唱されている。しかし、
スループットの向上、コストの低減、研磨後の洗浄技術
の確立などの問題がある。
In recent years, there has been an increasing demand for multilayer wiring, and a demand for an improvement in a focus margin in a fine wiring processing process has led to a flattening technique that can replace a conventional flattening technique using a silica-based coating liquid. A new flattening technology that is excellent in lithography has become indispensable. In order to meet this demand, in recent years, SiO formed by a vapor phase growth method such as CVD has been used.
Planarization by the CMP method 2 has been proposed. But,
There are problems such as improvement in throughput, reduction in cost, and establishment of a cleaning technique after polishing.

【O004】現在、これらの問題を解決するため、シロ
キサンオリゴマー(SOG)を基板上に回転塗布したあ
と、硬化し、その後CMP法を用いて平坦化することに
よりスループットを向上させることができ、また、コス
トの低減が可能であると考えられている。しかし、SO
Gから作製された被膜をCMP法により平坦化させるた
めには、例えば、配線段差に対してシリカ系被膜の膜厚
を同様かそれ以上形成しないと、研磨後の平坦性も不十
分となるため、配線段差が1μm以上になるとシリカ被
膜形成用塗布液は厚膜成膜性を有するものでなくてはな
らない。シリカ系被膜を1μm以上形成するためには、
塗布回転数の制御だけでなくシリカ系被膜形成用塗布液
の樹脂分濃度を上げなくては、厚膜成膜性、塗布性の良
好な被膜が形成されにくい。ところが、樹脂分濃度を高
濃度にするとシリカ系被膜形成用塗布液の保存安定性が
低下するという問題がある。
At present, in order to solve these problems, it is possible to improve the throughput by spin-coating a siloxane oligomer (SOG) on a substrate, curing it, and then flattening it by a CMP method. It is considered that the cost can be reduced. However, SO
In order to flatten the film made from G by the CMP method, for example, the flatness after polishing becomes insufficient unless the film thickness of the silica-based film is equal to or larger than the wiring step. When the wiring step is 1 μm or more, the coating liquid for forming a silica film must have a thick film forming property. In order to form a silica coating of 1 μm or more,
It is difficult to form a film having good film-forming properties and good applicability unless the resin component concentration of the silica-based film-forming coating solution is increased in addition to controlling the number of coating revolutions. However, when the concentration of the resin component is increased, there is a problem that the storage stability of the coating solution for forming a silica-based film decreases.

【0005】[0005]

【発明が解決しようとする課題】請求項1に記載の発明
は、保存安定性及び厚膜成膜性に優れ、耐クラック性及
び表面平滑性に優れる被膜を形成することができるシリ
カ系被膜形成用塗布液を提供するものである。請求項2
に記載の発明は、保存安定性及び厚膜成膜性に優れ、耐
クラック性及び表面平滑性に優れる被膜を形成すること
ができるシリカ系被膜形成用塗布液の製造法を提供する
ものである。請求項3に記載の発明は、膜厚を大きくす
ることができ、耐クラック性、表面平滑性に優れるシリ
カ系被膜を提供するものである。
SUMMARY OF THE INVENTION The first aspect of the present invention is to form a silica-based film capable of forming a film excellent in storage stability and thick film forming property, and excellent in crack resistance and surface smoothness. To provide a coating solution for use. Claim 2
The invention described in (1) provides a method for producing a coating solution for forming a silica-based film, which is capable of forming a film having excellent storage stability and thick film-forming properties, and excellent crack resistance and surface smoothness. . The third aspect of the present invention is to provide a silica-based coating which can increase the film thickness and is excellent in crack resistance and surface smoothness.

【0006】[0006]

【課題を解決するための手段】本発明は、(A)一般式
(I)
According to the present invention, there is provided (A) a compound represented by the following general formula (I):

【化5】 (式中Rは、炭素数1〜4のアルキル基、nは0〜2の
整数を意味し、複数個のRは同一でも異なっていてもよ
い)で表されるアルコキシシラン化合物を加水分解、重
縮合させて得られるシロキサンポリマー及び(B)一般
式(II)
Embedded image (Wherein R is an alkyl group having 1 to 4 carbon atoms, n is an integer of 0 to 2, and a plurality of Rs may be the same or different), Siloxane polymer obtained by polycondensation and (B) general formula (II)

【化6】 (式中R′は、炭素数1〜4のアルキル基を意味し、6
個のR′は同一でも異なっていてもよい)で表されるヘ
キサアルキルジシロキサン化合物を含有してなるシリカ
系被膜形成用塗布液に関する。
Embedded image (Wherein R ′ represents an alkyl group having 1 to 4 carbon atoms;
R's may be the same or different.) The present invention relates to a coating solution for forming a silica-based film, comprising a hexaalkyldisiloxane compound represented by the following formula:

【0007】また、本発明は、(A)前記一般式(I)
で表されるアルコキシシラン化合物を加水分解、重縮合
させて得られるシロキサンポリマーの水溶液及び(B)
前記一般式(II)で表されるヘキサアルキルジシロキサ
ン化合物を混合することを特徴とするシリカ系被膜形成
用塗布液の製造法に関する。また、本発明は、上記のシ
リカ系被膜形成用塗布液を用いて形成されてなるシリカ
系被膜に関する。
Further, the present invention relates to (A) the above-mentioned general formula (I)
An aqueous solution of a siloxane polymer obtained by hydrolyzing and polycondensing an alkoxysilane compound represented by the formula (B):
The present invention relates to a method for producing a coating liquid for forming a silica-based film, which comprises mixing a hexaalkyldisiloxane compound represented by the general formula (II). The present invention also relates to a silica-based coating formed using the above-described coating liquid for forming a silica-based coating.

【0008】[0008]

【発明の実施の形態】前記一般式(I)で表されるアル
コキシシラン化合物は、具体的には
BEST MODE FOR CARRYING OUT THE INVENTION The alkoxysilane compound represented by the general formula (I) is specifically described below.

【化7】 等のテトラアルコキシシラン、Embedded image Such as tetraalkoxysilane,

【化8】 等のモノアルキルトリアルコキシシラン、Embedded image Monoalkyl trialkoxysilane such as,

【化9】 等のジアルキルジアルコキシシランがあげられ、これら
は1種または2種以上が用いられる。
Embedded image And the like, and one or more of these may be used.

【0009】本発明に用いられる前記一般式(I)で表
されるアルコキシシランオリゴマーとしてはテトラアル
コキシシラン、モノアルキルトリアルコキシシラン、ジ
アルキルジアルコキシシランの割合に制限はないが、良
質なシリカ系被膜を形成するためにジアルキルジアルコ
キシシランは使用するアルコキシシラン化合物の総量に
対し50モル%以下であることが好ましい。
The alkoxysilane oligomer represented by the general formula (I) used in the present invention is not limited in the proportion of tetraalkoxysilane, monoalkyltrialkoxysilane and dialkyldialkoxysilane, but it has good silica coating. The dialkyldialkoxysilane is preferably used in an amount of 50 mol% or less based on the total amount of the alkoxysilane compound to be used.

【0010】本発明におけるシロキサンポリマーは、前
記した一般式(I)で表されるアルコキシシラン化合物
を加水分解、重縮合して製造されるが、このとき、触媒
としては、塩酸、硫酸、リン酸、硝酸、フッ酸等の無機
酸、シュウ酸、マレイン酸、スルホン酸、ギ酸等の有機
酸を使用することが好ましく、アンモニア、トリメチル
アンモニウムなどの塩基性触媒を用いることもできる。
これら触媒は、一般式(I)で表されるアルコキシシラ
ン化合物の量に応じて適当量用いられるが、好適には一
般式(I)で表されるアルコキシシラン化合物1モルに
対し0.001〜0.5モルの範囲で用いられる。
[0010] The siloxane polymer in the present invention is produced by hydrolyzing and polycondensing the alkoxysilane compound represented by the above general formula (I). It is preferable to use inorganic acids such as nitric acid and hydrofluoric acid, and organic acids such as oxalic acid, maleic acid, sulfonic acid and formic acid, and basic catalysts such as ammonia and trimethylammonium.
These catalysts are used in an appropriate amount in accordance with the amount of the alkoxysilane compound represented by the general formula (I), and preferably from 0.001 to 1 mol per mol of the alkoxysilane compound represented by the general formula (I). It is used in a range of 0.5 mol.

【0011】また、上記の加水分解・重縮合は、無溶媒
中で行うことが好ましい。また、この反応に際して、水
が存在させられる。水の量も適宜決められるが、余り少
ない場合や多すぎる場合には塗布液の保存安定性が低下
するなどの問題があるので、水の量は、一般式(I)で
表されるアルコキシシラン化合物1モルに対して0.5
〜4モルの範囲とすることが好ましい。以上のようにし
て得られる加水分解・重縮合生成物(アルコキシシラン
オリゴマー)は、加水分解で生成するアルコール及び未
反応で残る水が溶媒となって溶液として得られ、これ
(反応液)をそのままアルコキシシランオリゴマー液と
して使用することができる。また、これに他の溶媒を添
加して使用してもよく、上記の反応液からいったん溶媒
を除去し、アルコキシシランオリゴマーとして使用して
もよく、これを改めて溶媒に溶解してアルコキシシラン
オリゴマー液として使用してもよい。
The above-mentioned hydrolysis / polycondensation is preferably carried out without solvent. In this reaction, water is present. The amount of water is also determined as appropriate. However, if the amount is too small or too large, there is a problem that the storage stability of the coating solution is lowered. Therefore, the amount of water is determined by the alkoxysilane represented by the general formula (I). 0.5 to 1 mole of compound
It is preferably in the range of 4 to 4 mol. The hydrolysis / polycondensation product (alkoxysilane oligomer) obtained as described above is obtained as a solution using the alcohol produced by hydrolysis and the water remaining unreacted as a solvent, and this (reaction liquid) is used as it is. It can be used as an alkoxysilane oligomer liquid. Further, another solvent may be added to this, and the solvent may be once removed from the above reaction solution and used as an alkoxysilane oligomer. You may use as.

【0012】本発明に用いられる一般式(II)で表され
るヘキサアルキルジシロキサン化合物は、具体的には
The hexaalkyldisiloxane compound represented by the general formula (II) used in the present invention is specifically described below.

【化10】 などがある。Embedded image and so on.

【0013】本発明に用いられる一般式(II)で表され
るヘキサアルキルジシロキサン化合物の添加量は、一般
式(I)で表されるアルコキシシラン化合物の加水分解
・重縮合物(アルコキシシランオリゴマー)の保存安定
性及びシリカ系被膜の膜質の点からアルコキシシランオ
リゴマーの原料アルコキシシラン化合物1モルに対して
に対し1.8モル〜2.8モルの範囲の割合とすること
が好ましい。
The amount of the hexaalkyldisiloxane compound represented by the general formula (II) used in the present invention is determined by the amount of hydrolysis / polycondensate (alkoxysilane oligomer) of the alkoxysilane compound represented by the general formula (I). From the viewpoint of the storage stability of (1) and the film quality of the silica-based coating film, the ratio is preferably in the range of 1.8 mol to 2.8 mol with respect to 1 mol of the raw material alkoxysilane compound of the alkoxysilane oligomer.

【0014】前記アルコキシシランオリゴマーと一般式
(II)で表されるヘキサアルキルジシロキサン化合物を
混合してシリカ系被膜形成用塗布液として使用される。
この場合、アルコキシシランオリゴマーはそのものとし
て又は前記アルコキシシランオリゴマー液の形態で使用
される。アルコキシシランオリゴマーそのものを使用し
たときは、適当な溶媒に溶解させてシリカ系被膜塗布液
として使用される。を使用した場合は、一般式(II)で
表されるヘキサアルキルジシロキサン化合物と混合して
シリカ系被膜塗布液が形成されるが、さらに、溶媒を添
加してもよい。溶媒としては、有機溶媒を使用すること
が好ましい。有機溶媒としては、メタノール、エタノー
ル、プロパノール、ブタノール等のアルコール系、酢酸
メチル、酢酸エチル、酢酸プロピル、酢酸ブチル等の酢
酸エステル系、エチレングリコールモノメチルアセテー
ト、エチレングリコールジアセテート等のグリコールア
セテート系溶媒、N,N−メチル−2ピロリドン等のア
ミド系溶媒、グリコールエーテル系溶媒等種々の溶媒が
あげられ、これらは1種または2種以上が用いられる。
The above alkoxysilane oligomer and a hexaalkyldisiloxane compound represented by the general formula (II) are mixed and used as a coating solution for forming a silica-based film.
In this case, the alkoxysilane oligomer is used as it is or in the form of the alkoxysilane oligomer liquid. When the alkoxysilane oligomer itself is used, it is dissolved in an appropriate solvent and used as a silica-based coating solution. Is used, a silica-based coating liquid is formed by mixing with a hexaalkyldisiloxane compound represented by the general formula (II), but a solvent may be further added. It is preferable to use an organic solvent as the solvent. Examples of the organic solvent include alcohols such as methanol, ethanol, propanol and butanol; acetates such as methyl acetate, ethyl acetate, propyl acetate and butyl acetate; glycol acetate solvents such as ethylene glycol monomethyl acetate and ethylene glycol diacetate; Various solvents such as amide solvents such as N, N-methyl-2-pyrrolidone and glycol ether solvents are used, and one or more of these solvents are used.

【0015】溶媒は、シリカ系被膜形成用塗布液中に、
前記アルコキシシランオリゴマーとヘキサアルキルジシ
ロキサン化合物の総量が15〜50重量%となるような
量で使用されることが好ましい。作製したシリカ系被膜
形成用塗布液が二層に分離したとき、上層はほとんどの
場合溶剤であり、従って下層を分離してシリカ系被膜形
成性塗布液として使用することが好ましい。
The solvent is contained in a coating solution for forming a silica-based film.
It is preferable to use the alkoxysilane oligomer and the hexaalkyldisiloxane compound in an amount such that the total amount is 15 to 50% by weight. When the prepared coating solution for forming a silica-based film is separated into two layers, the upper layer is almost always a solvent. Therefore, it is preferable that the lower layer is separated and used as a silica-based film-forming coating solution.

【0016】このようにして得られた塗布液を用いて酸
化物被膜を形成するには、該塗布液をシリコンウエハ
ー、アルミニウム等の金属板、表面に金属を形成したシ
リコンウエハー、回路の形成されたシリコンウエハー等
の基体上に、浸漬法、回転塗布法などの方法で塗布した
後、50〜200℃、好ましくは、100〜150℃で
乾燥し、ついで、窒素雰囲気中で300〜500℃、好
ましくは300〜450℃で焼成する。このシリカ系被
膜を多層配線構造の層間膜(絶縁層間膜)として半導体
装置を得ることができる。
In order to form an oxide film using the coating solution thus obtained, the coating solution is formed by forming a silicon wafer, a metal plate such as aluminum, a silicon wafer having a metal formed on its surface, and a circuit. After coating on a substrate such as a silicon wafer by a dipping method, a spin coating method, or the like, drying is performed at 50 to 200 ° C., preferably 100 to 150 ° C., and then 300 to 500 ° C. in a nitrogen atmosphere. Preferably, firing is performed at 300 to 450 ° C. A semiconductor device can be obtained by using this silica-based coating as an interlayer film (insulating interlayer film) having a multilayer wiring structure.

【0017】本発明の塗布液を用いて得られる酸化物被
膜は、従来のアルコキシシランの加水分解縮合物を用い
て得られる酸化物被膜と比較して、金属との接着性が向
上しており、また熱的安定性、成膜性は従来のアルコキ
シシランの加水分解縮合物を用いて得られる酸化物被膜
と同等の酸化膜が形成される。
The oxide film obtained by using the coating solution of the present invention has improved adhesion to metal as compared with an oxide film obtained by using a conventional hydrolysis condensate of alkoxysilane. In addition, an oxide film having the same thermal stability and film formability as an oxide film obtained by using a conventional hydrolysis condensate of alkoxysilane is formed.

【0018】[0018]

【実施例】以下、本発明を実施例により詳しく説明す
る。 実施例1 テトラメトキシシラン 51.0g、ジメチルジメトキ
シシラン 45.0g、トリメチルトリメトキシシラン
40.0gを混合し、この混合物(液状)に水50.
0gにマレイン酸0.5gを溶解した水溶液を撹拌下で
1時間かけて滴下した。滴下終了後5時間撹拌した後、
ヘキサメチルジシロキサン32gを添加し、更に1時間
撹拌してシリカ系被膜形成用塗布液を得た。この塗布液
をビーカーに入れて23℃の恒温槽内に1週間放置した
ところ、塗布液は2層に分離した。この塗布液は23℃
の恒温槽内で1カ月放置しても2層に分離したままゲル
化せず、安定であった。この2層に分離した塗布液の上
層をデカンテーションで下層の液から分離除去した。
The present invention will be described below in more detail with reference to examples. Example 1 51.0 g of tetramethoxysilane, 45.0 g of dimethyldimethoxysilane, and 40.0 g of trimethyltrimethoxysilane were mixed, and 50.50 g of water was added to the mixture (liquid).
An aqueous solution in which 0.5 g of maleic acid was dissolved in 0 g was added dropwise over 1 hour under stirring. After stirring for 5 hours after dropping,
32 g of hexamethyldisiloxane was added, and the mixture was further stirred for 1 hour to obtain a coating solution for forming a silica-based film. When this coating solution was placed in a beaker and kept in a constant temperature bath at 23 ° C. for one week, the coating solution was separated into two layers. This coating solution is 23 ° C
Even when left in a constant temperature bath for 1 month, it was stable without separating into two layers and gelling. The upper layer of the coating liquid separated into the two layers was separated and removed from the lower layer liquid by decantation.

【0019】残った下層を塗布液としてスピナーを用い
て2000回転/分でシリコンウエハー上に塗布した後
150℃に制御されたホットプレート上で5分聞乾燥
し、続いて250℃に制御されたホットプレート上で5
分聞乾燥し、450℃で窒素雰囲気の電気炉中で1時間
焼成したところ無色透明でクラックがなく表面に凹凸の
ない被膜が得られた。この被膜の膜厚を測定したところ
2.7μmであった。
The remaining lower layer was coated on a silicon wafer at 2,000 rpm using a spinner as a coating solution, dried for 5 minutes on a hot plate controlled at 150 ° C., and subsequently controlled at 250 ° C. 5 on hot plate
After drying for 1 minute and sintering at 450 ° C. for 1 hour in an electric furnace under a nitrogen atmosphere, a colorless and transparent coating having no cracks and no irregularities on the surface was obtained. When the film thickness of this film was measured, it was 2.7 μm.

【0020】実施例2 テトラメトキシシラン 75.0g、ジメチルジメトキ
シシラン 70.0g、を混合し、この混合物(液状)
に水55.0gにマレイン酸0.6gを溶解した水溶液
を撹拌下に1時間かけて滴下した。滴下終了後5時間撹
拌した後、ヘキサエチルジシロキサン49gを添加し、
更に1時間撹拌してシリカ系被膜形成用塗布液を得た。
この塗布液をビーカーに入れて23℃の恒温槽内に1週
間放置したところ、塗布液は2層に分離した。この塗布
液は23℃の恒温槽内で1カ月放置しても2層に分離し
たままゲル化せず、安定であった。この2層に分離した
塗布液の上層をデカンテーションで下層の液から分離除
去した。
Example 2 75.0 g of tetramethoxysilane and 70.0 g of dimethyldimethoxysilane were mixed, and this mixture (liquid) was mixed.
An aqueous solution in which 0.6 g of maleic acid was dissolved in 55.0 g of water was added dropwise over 1 hour with stirring. After stirring for 5 hours after the completion of the dropwise addition, 49 g of hexaethyldisiloxane was added,
The mixture was further stirred for 1 hour to obtain a coating liquid for forming a silica-based film.
When this coating solution was placed in a beaker and kept in a constant temperature bath at 23 ° C. for one week, the coating solution was separated into two layers. This coating solution was stable without being gelled while being separated into two layers even when left in a thermostat at 23 ° C. for one month. The upper layer of the coating liquid separated into the two layers was separated and removed from the lower layer liquid by decantation.

【0021】残った下層を塗布液としてスピナーを用い
て3000回転/分でシリコンウエハー上に塗布した後
150℃に制御されたホットプレート上で5分聞乾燥
し、続いて250℃に制御されたホットプレート上で5
分聞乾燥し、450℃で窒素雰囲気の電気炉中で1時間
焼成したところ無色透明でクラックがなく表面に凹凸の
ない被膜が得られた。この被膜の膜厚を測定したところ
1.8μmであった。
The remaining lower layer was coated on a silicon wafer at 3000 rpm using a spinner as a coating solution, dried on a hot plate controlled at 150 ° C. for 5 minutes, and then controlled at 250 ° C. 5 on hot plate
After drying for 1 minute and sintering at 450 ° C. for 1 hour in an electric furnace under a nitrogen atmosphere, a colorless and transparent coating having no cracks and no irregularities on the surface was obtained. When the film thickness of this film was measured, it was 1.8 μm.

【0022】比較例1 テトラメトキシシラン 51.0g、ジメチルジメトキ
シシラン 45.0g、トリメチルトリメトキシシラン
40.0gを混合し、この混合物(液状)に水50.
0gにリン酸2.0gを溶解した水溶液を撹拌下で1時
間かけて滴下し、滴下終了後5時間撹拌した後、この塗
布液をビーカーに入れて23℃の恒温槽内に3日間放置
したところ、塗布液はゲル化した。
Comparative Example 1 51.0 g of tetramethoxysilane, 45.0 g of dimethyldimethoxysilane and 40.0 g of trimethyltrimethoxysilane were mixed, and 50.50 g of water was added to the mixture (liquid).
An aqueous solution in which 2.0 g of phosphoric acid was dissolved in 0 g was added dropwise over 1 hour with stirring, and after the completion of the addition, the mixture was stirred for 5 hours. Then, the coating solution was put into a beaker and left in a thermostat at 23 ° C. for 3 days. However, the coating solution gelled.

【0023】比較例2 テトラメトキシシラン 75.0g、ジメチルジメトキ
シシラン 70.0g、を混合し、この混合物(液状)
に水55.0gにマレイン酸0.5gを溶解した水溶液
を撹拌下で1時間かけて滴下した。滴下終了後5時間撹
拌した後、ヘキサメチルジシロキサン80gを添加し、
更に1時間撹拌してシリカ系被膜形成用塗布液を得た。
この塗布液をビーカーに入れて23℃の恒温槽内に1週
間放置したところ、塗布液は2層に分離した。この2層
に分離した塗布液の上層をデカンテーションで下層の液
から分離除去した。
Comparative Example 2 75.0 g of tetramethoxysilane and 70.0 g of dimethyldimethoxysilane were mixed, and this mixture (liquid) was mixed.
An aqueous solution in which 0.5 g of maleic acid was dissolved in 55.0 g of water was added dropwise over 1 hour with stirring. After stirring for 5 hours after completion of the dropping, 80 g of hexamethyldisiloxane was added,
The mixture was further stirred for 1 hour to obtain a coating liquid for forming a silica-based film.
When this coating solution was placed in a beaker and kept in a constant temperature bath at 23 ° C. for one week, the coating solution was separated into two layers. The upper layer of the coating liquid separated into the two layers was separated and removed from the lower layer liquid by decantation.

【0024】残った下層を塗布液としてスピナーを用い
て3000回転/分でシリコンウエハー上に塗布した後
150℃に制御されたホットプレート上で5分聞乾燥
し、続いて250℃に制御されたホットプレート上で5
分聞乾燥し、450℃で窒素雰囲気の電気炉中で1時間
焼成したところ被膜の表面に凹凸が発生した。
The remaining lower layer was applied as a coating liquid on a silicon wafer at 3000 rpm using a spinner, dried on a hot plate controlled at 150 ° C. for 5 minutes, and then controlled at 250 ° C. 5 on hot plate
After drying for 1 minute and firing for 1 hour at 450 ° C. in an electric furnace in a nitrogen atmosphere, irregularities were generated on the surface of the coating.

【0025】[0025]

【発明の効果】請求項1におけるシリカ系被膜形成用塗
布液は、保存安定性及び厚膜成膜性に優れ、耐クラック
性及び表面平滑性に優れる被膜を形成することができ
る。請求項2における方法により、保存安定性及び厚膜
成膜性に優れ、耐クラック性及び表面平滑性に優れる被
膜を形成することができるシリカ系被膜形成用塗布液が
得られる。請求項3におけるシリカ系被膜は、膜厚を大
きくすることができ、耐クラック性、表面平滑性に優れ
る。
According to the first aspect of the present invention, the coating liquid for forming a silica-based film can form a film having excellent storage stability and excellent film-forming properties, and excellent crack resistance and surface smoothness. According to the method of the second aspect, a coating liquid for forming a silica-based film, which can form a film having excellent storage stability and thick film-forming properties, and excellent crack resistance and surface smoothness, can be obtained. The silica-based coating according to claim 3 can have a large thickness, and is excellent in crack resistance and surface smoothness.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 成田 武憲 茨城県日立市東町四丁目13番1号 日立化 成工業株式会社半導体・液晶材料事業部開 発センタ内 (72)発明者 野部 茂 茨城県日立市東町四丁目13番1号 日立化 成工業株式会社半導体・液晶材料事業部開 発センタ内 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Takenori Narita 4-3-1-1, Higashicho, Hitachi City, Ibaraki Pref. Hitachi Chemical Co., Ltd. Semiconductor & Liquid Crystal Materials Division Development Center (72) Inventor Shigeru Nobe Ibaraki 3-1 Higashi-cho, Hitachi City, Hitachi Pref. Hitachi Chemical Co., Ltd.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 (A)一般式(I) 【化1】 (式中Rは、炭素数1〜4のアルキル基、nは0〜2の
整数を意味する)で表されるアルコキシシラン化合物を
加水分解、重縮合させて得られるシロキサンポリマー及
び(B)一般式(II) 【化2】 (式中R′は、炭素数1〜4のアルキル基を意味する)
で表されるヘキサアルキルジシロキサン化合物を含有し
てなるシリカ系被膜形成用塗布液。
(A) General formula (I) (Wherein R represents an alkyl group having 1 to 4 carbon atoms, and n represents an integer of 0 to 2). A siloxane polymer obtained by hydrolyzing and polycondensing an alkoxysilane compound represented by the formula (B): Formula (II) (Wherein R ′ represents an alkyl group having 1 to 4 carbon atoms)
A coating liquid for forming a silica-based film, comprising a hexaalkyldisiloxane compound represented by the formula:
【請求項2】 (A)一般式(I) 【化3】 (式中Rは、炭素数1〜4のアルキル基、nは0〜2の
整数を意味する)で表されるアルコキシシラン化合物を
加水分解、重縮合させて得られるシロキサンポリマーの
水溶液及び(B)一般式(II) 【化4】 (式中R′は、炭素数1〜4のアルキル基を意味する)
で表されるヘキサアルキルジシロキサン化合物を混合す
ることを特徴とするシリカ系被膜形成用塗布液の製造
法。
(A) General formula (I) Wherein R represents an alkyl group having 1 to 4 carbon atoms, and n represents an integer of 0 to 2. An aqueous solution of a siloxane polymer obtained by hydrolyzing and polycondensing an alkoxysilane compound represented by the formula (B): ) General formula (II) (Wherein R ′ represents an alkyl group having 1 to 4 carbon atoms)
A method for producing a coating solution for forming a silica-based film, characterized by mixing a hexaalkyldisiloxane compound represented by the formula:
【請求項3】 請求項1記載のシリカ系被膜形成用塗布
液を用いて形成されてなるシリカ系被膜。
3. A silica-based coating formed using the coating solution for forming a silica-based coating according to claim 1.
JP9183755A 1997-07-09 1997-07-09 Coating solution for formation of silica-based film, its preparation and silica-based film Pending JPH1129744A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9183755A JPH1129744A (en) 1997-07-09 1997-07-09 Coating solution for formation of silica-based film, its preparation and silica-based film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9183755A JPH1129744A (en) 1997-07-09 1997-07-09 Coating solution for formation of silica-based film, its preparation and silica-based film

Publications (1)

Publication Number Publication Date
JPH1129744A true JPH1129744A (en) 1999-02-02

Family

ID=16141418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9183755A Pending JPH1129744A (en) 1997-07-09 1997-07-09 Coating solution for formation of silica-based film, its preparation and silica-based film

Country Status (1)

Country Link
JP (1) JPH1129744A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006126264A1 (en) * 2005-05-26 2006-11-30 Sony Chemical & Information Device Corporation Method for producing optically anisotropic material
JP2013014764A (en) * 2011-07-01 2013-01-24 Wacker Chemie Ag Method for producing organopolysiloxane

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006126264A1 (en) * 2005-05-26 2006-11-30 Sony Chemical & Information Device Corporation Method for producing optically anisotropic material
JP2013014764A (en) * 2011-07-01 2013-01-24 Wacker Chemie Ag Method for producing organopolysiloxane

Similar Documents

Publication Publication Date Title
EP0992556B1 (en) Coating liquid for forming silica-based film having low dielectric constant and substrate having film of low dielectric constant coated thereon
EP1559761B1 (en) Porous-film-forming composition, preparation method of the composition, porous film and semiconductor device
JP3813268B2 (en) Coating liquid for forming low dielectric constant silica-based film and substrate with low dielectric constant film
JP2004307694A (en) Composition for forming porous film, method for producing porous film, porous film, interlayer dielectric film and semiconductor device
JP4473352B2 (en) Low dielectric constant silica-based coating, coating liquid for forming the same, and method for preparing the coating liquid
JPH0410418A (en) Semiconductor device
TWI234787B (en) Silica-based coating film on substrate and coating solution therefor
JP4162060B2 (en) Coating liquid for forming low dielectric constant silica-based film and substrate with low dielectric constant film
JPH1150007A (en) Coating liquid for forming low-permittivity silica-based coating film and substrate with coating film
JPH11340220A (en) Coating liquid for forming silica film and its manufacture
JPH03188179A (en) Coating liquid for forming silica film, preparation of semiconductor substrate and semiconductor device
JP2004307693A (en) Composition for forming porous film, method for producing porous film, porous film, interlayer dielectric film and semiconductor device
JP4079383B2 (en) Silica-based coating solution
JPH1129744A (en) Coating solution for formation of silica-based film, its preparation and silica-based film
JPH1129743A (en) Coating solution for formation of silica-based film, its preparation and silica-based film
KR100444650B1 (en) Substrate with a low dielectric constant coating film and low dielectric constant coating
JP2000336312A (en) Coating solution for forming silica-based coating film, production of silica-based coating film and semiconductor device
JPH07173434A (en) Coating fluid for forming oxide film and production of oxide film
JP4241880B2 (en) Coating liquid for forming low dielectric constant silica coating
JPH05214296A (en) Coating fluid for forming oxide film and formation of oxide film
US20030152784A1 (en) Process for forming hydrogen silsesquioxane resins
JPH10313002A (en) Formation of sio2 coatings
JP3227359B2 (en) Semiconductor device
JPH0819380B2 (en) Method for producing thick film insulator forming composition
JPH1112542A (en) Coating liquid for forming silica-based coating film, silica-based coating film and semiconductor device using the same