JPH11291151A - Automatic flaw removing method of long size material - Google Patents

Automatic flaw removing method of long size material

Info

Publication number
JPH11291151A
JPH11291151A JP9875698A JP9875698A JPH11291151A JP H11291151 A JPH11291151 A JP H11291151A JP 9875698 A JP9875698 A JP 9875698A JP 9875698 A JP9875698 A JP 9875698A JP H11291151 A JPH11291151 A JP H11291151A
Authority
JP
Japan
Prior art keywords
flaw
position information
flawed
circumferential
chucking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9875698A
Other languages
Japanese (ja)
Other versions
JP3630552B2 (en
Inventor
Junichi Ishibashi
淳一 石橋
Hiroto Kobayashi
比呂人 小林
Koji Kawamura
皓二 河村
Minoru Nakakusu
実 中楠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON FUERUSUTAA KK
Sanyo Special Steel Co Ltd
Nippon Steel Texeng Co Ltd
Original Assignee
NIPPON FUERUSUTAA KK
Sanyo Special Steel Co Ltd
Nittetsu Elex Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON FUERUSUTAA KK, Sanyo Special Steel Co Ltd, Nittetsu Elex Co Ltd filed Critical NIPPON FUERUSUTAA KK
Priority to JP9875698A priority Critical patent/JP3630552B2/en
Publication of JPH11291151A publication Critical patent/JPH11291151A/en
Application granted granted Critical
Publication of JP3630552B2 publication Critical patent/JP3630552B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To quickly, accurately and automatically remove a flaw by storing flaw lengthwise directional position information obtained by a whole cross-sectional surface flaw inspection device in a storage device, and specifying a flaw circumferential directional position by a circumferential directional flaw detector. SOLUTION: Flaw position information on a flaw existent material 8 is processed by a signal processor 15 of a rotary leakage flux flaw detector 4 to be stored. A flaw detector 10 moves to a central position of a lengthwise directional flaw by this stored flaw map information, the flaw existent material 8 is chucked in the end part by a chucking device 12, and the material is rotated by a material rotating device 13 to detect and specify a circumferential position of a flaw. A grinding tool of an automatic grinder 11 directly connected to the flaw detector 10 descends on the flaw existent material 8 to remove the flaw while moving in the lengthwise direction. When there is a flaw in the chucking part, the material 8 is clamped by a clamp device 16 by turning the flaw just above, and chucking is released to grind the flaw by the automatic grinder 11.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は丸棒鋼、鋼管等の長
尺材料の表面疵を全断面疵検査装置により検査し、選別
された疵有り材料の疵位置情報をもとに自動研削する長
尺材料の自動疵取り方法に関する。とりわけ本発明は、
疵が長尺材料のどの位置にあっても、迅速かつ正確な自
動疵取りができる長尺材料の自動疵取り方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting the surface flaws of a long material such as a round bar steel, a steel pipe or the like by a full-section flaw inspection apparatus, and automatically grinding the flawed material based on the flaw position information. The present invention relates to a method for automatically removing a flaw material. In particular, the present invention
The present invention relates to a method for automatically removing a flaw in a long material, which enables quick and accurate automatic flaw removal regardless of the position of the flaw in the long material.

【0002】[0002]

【従来の技術】この種の従来技術として、例えば特公昭
52−15054号「分離型自動疵取り装置における疵
位置規定方法」がある。
2. Description of the Related Art As a prior art of this kind, there is, for example, Japanese Patent Publication No. 52-15054 entitled "Method of defining a flaw position in a separation type automatic flaw removing apparatus".

【0003】この方法は、疵検査装置と研削機が分離配
置されており、検査時に被処理材に光学的手段により検
出できるラベルなどの基準点を設け、研削時に光学的検
出器で検出し疵位置情報の基準とさせ、研削機の研削位
置制御を行なうものである。
In this method, a flaw inspection device and a grinder are separately arranged, a reference point such as a label which can be detected by an optical means is provided on a workpiece at the time of inspection, and a flaw is detected by an optical detector during grinding. The position of the grinding machine is controlled based on the position information.

【0004】[0004]

【発明が解決しようとする課題】前記「従来の技術」に
示す例のような、丸棒鋼などの被検材に、ラベルを張り
付けたり、即乾性のインクやペイントを吹き付けたりす
る方法は、現実には、位置の正確さ、種々の疵模様に対
する精度等の点で決して十分なものではなかった。特
に、探傷速度の速い(例えば100m/min以上)ラ
インや細径の曲がりの有る材料等における適用が困難で
あった。
The method of attaching a label to a test material such as a round steel bar or spraying quick-drying ink or paint on the test material such as the example shown in the above-mentioned "prior art" is not practical. However, in terms of the accuracy of the position, the accuracy with respect to various flaws and the like, it was never sufficient. In particular, it has been difficult to apply the method to a line having a high flaw detection speed (for example, 100 m / min or more) or a material having a small diameter bend.

【0005】また、表面検査装置の直後には、水を使う
超音波探傷機が有る場合が有り、このようなライン構成
では、ラベルの外れ、マーキングのにじみ等が発生し、
原点位置の精度や確実性を要する自動疵取り装置への適
用が困難である。
[0005] Further, there is a case where there is an ultrasonic flaw detector using water immediately after the surface inspection apparatus, and in such a line configuration, label separation, marking bleeding, and the like occur.
It is difficult to apply it to an automatic flaw removal device that requires accuracy and certainty of the origin position.

【0006】さらに、疵探傷中、搬送ロールの磨耗など
で材料がねじれ走行する場合が有り、基準マークが1ケ
所の場合疵の位置情報マップもねじれ不正確となり、自
動研削の位置ズレを起こす。
Further, during flaw detection, the material may be twisted due to abrasion of a transport roll, etc., and when there is only one reference mark, the position information map of the flaw becomes inaccurate, causing a positional shift in automatic grinding.

【0007】[0007]

【課題を解決するための手段】本発明は前記課題を解決
し、迅速かつ正確な自動疵取りができる長尺材料の自動
疵取りラインを提供するものであり、その要旨は特許請
求の範囲に記載のとおりである。すなわち、 1.丸棒鋼、鋼管等の長尺材料の表面疵を全断面疵検査
装置により検査し、疵有り材料と疵無し材料を選別し、
次いで疵有り材料について、前記全断面疵検査装置によ
り得られた疵長手方向位置情報を記憶装置に記憶して、
材料順にトラッキング処理をし、次いで疵有り材料が疵
研削位置に到達した際、研削機と直結された周方向疵探
査機を、当該疵有り材料について前記の記憶装置に記憶
した疵長手方向位置情報に基いて、当該疵有り材料の長
手方向疵座標位置に移動し、さらに当該疵有り材料の一
端部をチャッキングして回転させ、前記周方向疵探査機
によって疵周方向位置を特定し、次いでチャッキング部
分に疵が有る材料と無い材料を分別し、チャッキング部
分に疵が無い材料の場合はチャッキングしたまま前記の
特定された疵位置情報に基いて疵を自動研削し、チャッ
キング部分に疵の有る材料の場合は、チャッキング部分
の疵を研削する際、該材料をクランプ装置により支持し
てチャッキング装置を逃がし疵を自動研削することを特
徴とする長尺材料の自動疵取り方法。
SUMMARY OF THE INVENTION The present invention has been made to solve the above problems and provides an automatic flaw removing line for long materials capable of quick and accurate automatic flaw removal. It is as described. That is, 1. Inspection of surface flaws of long materials such as round bars and steel pipes by a total cross-section flaw inspection device, and sorting of flawed and flawless materials,
Next, for the flawed material, the flaw longitudinal position information obtained by the all-section flaw inspection device is stored in a storage device,
The tracking process is performed in the order of the materials, and then, when the flawed material reaches the flaw grinding position, the circumferential flaw detector directly connected to the grinder is used to generate the flaw longitudinal position information stored in the storage device for the flawed material. Based on, move to the longitudinal flaw coordinate position of the flawed material, further chuck and rotate one end of the flawed material, specify the flaw circumferential position by the circumferential flaw detector, and then The material having a flaw in the chucking portion is separated from the material having no flaw, and in the case of a material having no flaw in the chucking portion, the flaw is automatically ground based on the above-specified flaw position information while being chucked. In the case of a material having flaws, when grinding the flaws in the chucking portion, the material is supported by a clamp device, the chucking device is released, and the flaws are automatically ground. Auto flaws up method.

【0008】2.丸棒鋼、鋼管等の長尺材料の表面疵を
全断面疵検査装置により検査し、疵有り材料と疵無し材
料を選別し、次いで疵有り材料について、前記全断面疵
検査装置により得られた疵長手方向位置情報および第一
の疵周方向位置情報を記憶装置に記憶して、材料順にト
ラッキング処理をし、次いで疵有り材料が疵研削位置に
到達した際、研削機と直結された周方向疵探査機を、当
該疵有り材料について前記の記憶装置に記憶した疵長手
方向位置情報に基いて、当該疵有り材料の長手方向疵座
標位置に移動し、さらに当該疵有り材料の一端部をチャ
ッキングして回転させ、前記周方向疵探査機によって第
二の疵周方向位置情報を得、該第二の疵周方向位置情報
を前記の記憶装置に記憶した第一の疵周方向位置情報と
照合し、該照合結果に基いて疵位置を特定し、次いでチ
ャッキング部分に疵が有る材料と無い材料を分別し、チ
ャッキング部分に疵が無い材料の場合はチャッキングし
たまま前記の特定された疵位置情報に基いて疵を自動研
削し、チャッキング部分に疵の有る材料の場合は、チャ
ッキング部分の疵を研削する際、該材料をクランプ装置
により支持してチャッキング装置を逃がし疵を自動研削
することを特徴とする長尺材料の自動疵取り方法。
[0008] 2. Surface flaws of long materials such as round bar steel and steel pipes are inspected by a total cross-sectional flaw inspection device, materials having flaws and materials having no flaws are selected, and then, for flawed materials, flaws obtained by the total cross-sectional flaw inspection device. The longitudinal position information and the first flaw circumferential position information are stored in the storage device, and the tracking processing is performed in the order of the materials. Then, when the flawed material reaches the flaw grinding position, the circumferential flaw directly connected to the grinding machine. The probe is moved to the longitudinal flaw coordinate position of the flawed material based on the flaw longitudinal position information stored in the storage device for the flawed material, and one end of the flawed material is chucked. And rotate it to obtain second flaw circumferential position information by the circumferential flaw detector, and collate the second flaw circumferential position information with the first flaw circumferential position information stored in the storage device. And the position of the flaw is determined based on the matching result. Identify and then separate the material with and without the flaw in the chucking part.If the material has no flaw in the chucking part, the flaw is automatically ground based on the specified flaw position information while chucking. In the case of a material having a flaw in the chucking portion, when grinding the flaw in the chucking portion, the material is supported by a clamp device, the chucking device is released, and the flaw is automatically ground. Automatic scratch removal method.

【0009】である。[0009]

【0010】本発明において用いる全断面疵検査装置と
しては、漏洩磁束探疵装置、あるいは渦流探疵装置が用
いられ、センサーが回転し材料が直進する形態のもの
と、逆にセンサーが固定で材料が回転する形態のものが
有り、両者共に適用できる。
As the whole cross-sectional flaw inspection apparatus used in the present invention, a leakage magnetic flux flaw detection apparatus or an eddy current flaw detection apparatus is used. There is a type in which is rotated, and both can be applied.

【0011】この全断面疵検査装置による疵の長手方向
の疵位置情報、あるいは加えて疵の周方向の疵位置情報
を、当該疵有り材料の研削テーブルまでの搬送と同期さ
せて、トラッキング処理する。この全断面疵検査装置に
よる疵位置情報は、本願請求項1に記載の発明のよう
に、疵の長手方向の疵位置情報のみであっても後に研削
機と直結された周方向疵探査機が疵周方向位置を特定で
きるので疵研削が可能であるが、本願請求項2に記載の
発明のように、疵の周方向位置情報も記憶しておき(第
一の疵周方向位置情報)、後の研削機と直結された周方
向疵探査機により得られる疵周方向位置情報(第二の疵
周方向位置情報)と照合して疵位置を特定する方法も実
際的である。すなわち、この後者の方法によれば、例え
ば複数の疵が存する場合に、初めの全断面疵検査装置に
よる疵位置情報(いわゆる疵マップ)を主に利用し、一
か所の疵位置情報を照合するのみで、全疵位置を特定で
き自動研削することが可能となるといった利点がある。
The tracking processing is performed by synchronizing the flaw position information in the longitudinal direction of the flaw or the flaw position information in the circumferential direction of the flaw with the whole cross-section flaw inspection apparatus with the conveyance of the flawed material to the grinding table. . Even if the flaw position information by this whole cross-section flaw inspection apparatus is only the flaw position information in the longitudinal direction of the flaw as in the invention described in claim 1 of the present application, a circumferential flaw detector directly connected to a grinding machine later is used. Since the flaw circumferential position can be specified, flaw grinding is possible. However, as in the invention described in claim 2 of the present application, flaw circumferential position information is also stored (first flaw circumferential position information). It is also practical to match the flaw circumferential position information (second flaw circumferential position information) obtained by a circumferential flaw detector directly connected to a subsequent grinding machine to specify the flaw position. That is, according to the latter method, for example, when there are a plurality of flaws, the flaw position information (a so-called flaw map) by the first whole cross-sectional flaw inspection apparatus is mainly used to collate one flaw position information. There is an advantage that the position of all the flaws can be specified and the automatic grinding can be performed only by performing the operation.

【0012】周方向に細かく分割した疵位置情報も一緒
に取り込んでおくと予め疵の個数分布が分かり、その情
報を元に、効率的な研削機の制御の情報源として活用で
きるものである。
If the flaw position information finely divided in the circumferential direction is also taken in, the number distribution of flaws can be known in advance, and the information can be used as an information source for efficient grinding machine control based on the information.

【0013】研削機と直結された周方向疵探査機は、通
常全断面疵検査装置と同等の疵検出能力を持つ探傷装置
を用いることが好ましい。また、自動研削機と周方向疵
探査機は直結させてあり、これにより探査機と研削機の
機械的位置ズレはほとんど無くなり、探査した疵を確実
に研削出来る。
As the circumferential flaw detector directly connected to the grinding machine, it is preferable to use a flaw detector having a flaw detection capability equivalent to that of a full-section flaw detector. In addition, the automatic grinding machine and the circumferential flaw detector are directly connected to each other, so that there is almost no mechanical displacement between the probe and the grinder, and the detected flaw can be surely ground.

【0014】この研削機と直結された周方向疵探査機に
より疵を探査する際、当該疵有り材料の一端部をチャッ
キングして回転させる。これにより、疵の周方向位置を
特定することができるものである。しかし、疵位置が材
料のチャッキング部分に重なる場合があり、そのままで
は自動研削が困難となる。
When a flaw is detected by a circumferential flaw detector directly connected to the grinding machine, one end of the flawed material is chucked and rotated. Thereby, the circumferential position of the flaw can be specified. However, the flaw position may overlap the chucking portion of the material, and automatic grinding becomes difficult as it is.

【0015】そこで本発明においては、次いでチャッキ
ング部分に疵が有る材料と無い材料を分別し、チャッキ
ング部分に疵が無い材料の場合はチャッキングしたまま
前記の特定された疵位置情報に基いて疵を自動研削し、
チャッキング部分に疵の有る材料の場合は、チャッキン
グ部分の疵を研削する際、該材料をクランプ装置により
支持してチャッキング装置を逃がし疵を自動研削できる
ように構成したものである。
Therefore, in the present invention, a material having a flaw in the chucking portion and a material having no flaw are then separated, and in the case of a material having no flaw in the chucking portion, the material is left chucked and based on the specified flaw position information. To automatically grind the flaws,
In the case of a material having a flaw in the chucking portion, when the flaw in the chucking portion is ground, the material is supported by a clamp device, the chucking device is released, and the flaw is automatically ground.

【0016】本願請求項2に記載の本発明は、全断面疵
検査装置により得られた第一の疵周方向位置情報と、研
削機と直結された周方向疵探査機により得られた第二の
疵周方向位置情報を照合し、該照合結果に基いて自動研
削することを特徴とする。これにより、より正確な自動
研削を行うことができるものである。
The present invention according to claim 2 of the present application provides the first flaw circumferential position information obtained by the entire cross-sectional flaw inspection apparatus and the second flaw circumferential position detector obtained by the circumferential flaw detector directly connected to the grinding machine. Is characterized by collating the flaw circumferential position information and performing automatic grinding based on the collation result. Thereby, more accurate automatic grinding can be performed.

【0017】例えば、全断面疵検査装置により得られた
第一の疵周方向位置情報(疵マップ)において、同一円
周上に2個以上の疵がある場合、研削機と直結された周
方向疵探査機により得られた第二の疵周方向位置情報に
おける各々の疵が、第一の疵周方向位置情報(疵マッ
プ)のどちらに相当するか判別する方法が必要である
が、両者の位置情報(疵マップ)において円周方向の基
準点が明確でないので、それぞれの疵の相対位置情報で
照合する必要があり、その判別が適切でないと間違った
研削を行うことになる。
For example, if there are two or more flaws on the same circumference in the first flaw circumferential position information (flaw map) obtained by the all-section flaw inspection apparatus, the circumferential direction directly connected to the grinding machine A method is required to determine which of the flaws in the second flaw circumferential position information obtained by the flaw detector corresponds to the first flaw circumferential position information (flaw map). Since the reference point in the circumferential direction is not clear in the position information (flaw map), it is necessary to collate based on the relative position information of each flaw. If the discrimination is not appropriate, wrong grinding will be performed.

【0018】また、例えば、図1に示すように3個の疵
がある場合でGの位置を探査する時、図2に示すよう
に、疵のレベルよりも材料肌によるノイズレベルの
方が信号が高い時、の方を3ケ目の疵と判定し、やは
り間違った研削を行うこととなる。さらに、図2に示す
ように、判定レベルを通常の判定レベルIからコンピュ
ータにより徐々に判定レベル下限IIまで下げても3ケ目
の疵が発見できない場合も同様である。
Further, for example, when the position of G is searched in the case where there are three flaws as shown in FIG. 1, as shown in FIG. Is higher, it is determined to be the third flaw, and the wrong grinding is also performed. Further, as shown in FIG. 2, the same applies to the case where the third flaw cannot be found even if the judgment level is gradually lowered from the normal judgment level I to the judgment level lower limit II by a computer.

【0019】そこで、全断面疵検査装置により得られた
第一の疵周方向位置情報と、研削機と直結された周方向
疵探査機により得られた第二の疵周方向位置情報を照合
する方法を開発したものである。
Then, the first flaw circumferential position information obtained by the total cross-sectional flaw inspection apparatus is compared with the second flaw circumferential position information obtained by the circumferential flaw detector directly connected to the grinding machine. The method was developed.

【0020】このように構成することにより、効果的な
自動疵取りが可能となる。
With this configuration, effective automatic flaw removal can be achieved.

【0021】[0021]

【実施例】図3は本願発明の自動疵取り方法の一実施例
を示すレイアウト図である。
FIG. 3 is a layout diagram showing an embodiment of the automatic flaw removal method of the present invention.

【0022】この実施例では、丸棒鋼Φ20〜Φ80に
適用した。材料1は、デバリングテーブル2から検査テ
ーブル3にキックインされ、回転型漏洩磁束探傷機4で
全断面全長探傷され、疵有り材料(不合格材、手入れ要
材)8は、跳ね出しテーブル14上に設けた疵研削ステ
ーション6にトラッキングされ移送される。このとき、
各疵有り材料8の疵位置情報(長手方向および周方向)
も各疵有り材料8のトラッキング(順送り)と同期され
てトラッキング処理される。
In this embodiment, the present invention is applied to round steel bars Φ20 to Φ80. The material 1 is kicked in from the deburring table 2 to the inspection table 3 and inspected by a rotary type leakage magnetic flux detector 4 over the entire length of the entire cross-section. The wafer is tracked and transferred to a flaw grinding station 6 provided at the station. At this time,
Flaw position information of each flawed material 8 (longitudinal direction and circumferential direction)
The tracking process is also performed in synchronization with the tracking (forward feeding) of each flawed material 8.

【0023】検査テーブル3の検査速度は、80〜12
0m/minと早く、また、後面に接触媒質として水を
使う回転超音波探傷機6が有るため、正確な原点マー
ク、あるいはラベル貼りは適用できない。マーキング装
置5によるマークは確認用である。
The inspection speed of the inspection table 3 is 80 to 12
Since the rotary ultrasonic flaw detector 6 uses water as a couplant at a speed as fast as 0 m / min and has a rear surface, accurate origin mark or labeling cannot be applied. The mark by the marking device 5 is for confirmation.

【0024】回転型漏洩磁束探傷機4で合格となった材
料は、疵無し材料(合格材、手入れ不要材)7として跳
ね出されずに直進する。すなわち、疵有り材料(不合格
材、手入れ要材)8のみが、跳ね出しテーブル14上に
並ぶライン配置である。疵無し材料(合格材、手入れ不
要材)7は、研削テーブル9をスルーさせれば良く、必
ずしも良品、不良品を振り分ける必要はないが、効率的
にはこのように分けたほうが好ましい。
The material passed by the rotary type magnetic flux leakage detector 4 goes straight without being bounced out as a flawless material (passing material, maintenance-free material) 7. That is, only the flawed material (rejected material, required maintenance material) 8 is arranged in a line on the spring-out table 14. The flaw-free material (passing material, maintenance-free material) 7 may be passed through the grinding table 9, and it is not necessary to sort out good or defective products.

【0025】この疵有り材料(不合格材、手入れ要材)
8の疵位置情報は、回転型漏洩磁束探傷機4の信号処理
装置15により加工されて記憶され、トラッキングによ
り疵有り材料(不合格材、手入れ要材)8が研削テーブ
ル9上に来たとき、研削機11の制御装置に制御信号が
送信される。
[0025] This flawed material (rejected material, required maintenance material)
The flaw position information 8 is processed and stored by the signal processing device 15 of the rotary type magnetic flux leakage detector 4, and when the flawed material (rejected material, required maintenance material) 8 comes to the grinding table 9 by tracking. Then, a control signal is transmitted to the control device of the grinding machine 11.

【0026】すなわち、信号処理装置15に記憶された
疵マップ情報により、疵探査機10が長手方向の疵中心
位置に移動し、疵有り材料8は、その端部をチャッキン
グ装置12によりチャッキングされ材料回転装置13に
より材料回転されて疵の円周位置を探査特定される。そ
の後、疵有り材料8は疵位置を真上に向けて固定され
る。しかる後、疵探査機10と直結された自動研削機1
1の研削工具が疵有り材料8に下降し、長手方向に移動
しながら疵取りを行なう。複数個の疵があれば、その都
度疵毎に周方向の位置を特定し疵位置を真上に向け研削
作業を繰り返す。
That is, based on the flaw map information stored in the signal processing device 15, the flaw detector 10 moves to the center position of the flaw in the longitudinal direction, and the end of the flawed material 8 is chucked by the chucking device 12. The material is rotated by the material rotating device 13 and the circumferential position of the flaw is searched and specified. Thereafter, the flawed material 8 is fixed with the flaw position facing up. Thereafter, the automatic grinding machine 1 directly connected to the flaw detector 10
The grinding tool 1 descends on the flawed material 8 and removes flaws while moving in the longitudinal direction. If there are a plurality of flaws, the position in the circumferential direction is specified for each flaw, and the grinding operation is repeated with the flaw position facing up.

【0027】チャッキング部に疵がある場合は、図4に
示すように、該疵の研削の際、疵を真上に向けて材料8
をクランプ装置17により側面からクランプして支持
し、チャッキングをはずし、チャックを逃がしておい
て、自動研削機11により疵を研削する。
If there is a flaw in the chucking portion, as shown in FIG.
Is clamped and supported from the side by the clamping device 17, the chucking is released, the chuck is released, and the flaw is ground by the automatic grinding machine 11.

【0028】疵有り材料8のチャッキング部における疵
の有無による作業の流れの一例を図5に示す。
FIG. 5 shows an example of a work flow based on the presence or absence of a flaw in the chucking portion of the flawed material 8.

【0029】このように疵毎に疵周方向位置を特定しな
がら研削を行なっていくことにより、材料の曲がりの影
響やチャッキングによる材料のズレ等の影響もなく確実
な疵取り作業が可能となった。
By performing the grinding while specifying the circumferential position of each flaw for each flaw as described above, a reliable flaw removal operation can be performed without the influence of bending of the material or the displacement of the material due to chucking. became.

【0030】また、回転型漏洩磁束探傷機4による疵デ
ータ採取時に材料1のねじれ走行による周方向の位置ズ
レについても従来の原点マーク方式では対応できない
が、本方式では疵毎に位置を特定でき研削可能となっ
た。
In addition, the conventional origin mark method cannot cope with the positional deviation in the circumferential direction due to the torsional running of the material 1 when the flaw data is collected by the rotary leakage magnetic flux detector 4, but the position can be specified for each flaw in the present method. Grinding is now possible.

【0031】尚、本実施例における信号処理装置15の
主な機能は、疵マップの作成・記憶、疵マップのトラッ
キング、疵探査機10の位置コントロール、研削機11
の位置、研削条件のコントロールなどを一括して行なう
ことである。
The main functions of the signal processing device 15 in this embodiment include creation and storage of a flaw map, tracking of a flaw map, position control of the flaw detector 10, and a grinder 11.
And the control of the grinding conditions and the grinding conditions are performed collectively.

【0032】次に、本実施例の、複数個の疵がある場合
の疵の周方向位置の特定方法について説明する。
Next, a description will be given of a method of specifying the circumferential position of a flaw when there are a plurality of flaws in this embodiment.

【0033】図6は本発明の疵照合方法の説明図であ
る。
FIG. 6 is an explanatory diagram of the flaw collation method of the present invention.

【0034】図6(a)は第一の疵検査装置(すなわち
回転型漏洩磁束探傷機4)における円周方向の疵分布で
疵研削機11の研削幅を目安に円周16分割したマップ
上に疵の有無が記されており、この場合A、B、Cと3
ケ所の疵が探傷されている。それを第二の疵検査装置
(すなわち疵探査機10)で探傷した結果、図4(b)
のような分布D、E、Fのような結果となったとする。
この図6(a)の疵マップと図6(b)の疵マップを1
6分割した区分(1区分22.5度)ピッチで時計方向
に回転させ疵位置を照合させていく。例えばこの場合θ
1=θ3、θ2≠θ4なので各疵の一致照合状況は下記
のようになる。
FIG. 6 (a) shows the distribution of flaws in the circumferential direction in the first flaw inspection device (that is, the rotary type magnetic flux detector 4) on a map obtained by dividing the circumference into 16 parts using the grinding width of the flaw grinder 11 as a guide. Indicates the presence or absence of flaws. In this case, A, B, C and 3
Flaws at several places have been detected. FIG. 4 (b) shows the result of flaw detection using the second flaw inspection device (that is, flaw detector 10).
It is assumed that distributions D, E, and F as shown in FIG.
The flaw map shown in FIG. 6A and the flaw map shown in FIG.
It is rotated clockwise at a pitch of 6 divided sections (12.5 degrees), and the flaw positions are collated. For example, in this case θ
Since 1 = θ3, θ2 ≠ θ4, the matching verification status of each flaw is as follows.

【0035】 (1)疵Aと疵Dが一致した時 B=E C≠F (2)疵Aと疵Eが一致した時 B≠F C≠A (3)疵Aと疵Fが一致した時 B≠D C≠E これらのうち二カ所以上の一致した場合を研削可とし、
この場合A=D、B=Eとして研削を行うように判断さ
せる。
(1) When flaw A and flaw D match B = E C F (2) When flaw A and flaw E match B ≠ FC C ≠ A (3) Flaw A and flaw F match Time B ≠ D ≠ C ≠ E If two or more of these coincide, grinding is possible,
In this case, it is determined that grinding is performed with A = D and B = E.

【0036】このように第一の疵検査装置による探傷デ
ータ疵位置情報として、周方向には周方向研削幅以下に
分割した疵位置情報を移送し、第二の疵検査装置による
周方向複数個の疵位置関係(疵間角度差)の情報を照合
し、一致した部分を研削用にすることにより、信頼性の
高い自動疵取り作業が可能となった。
As described above, as the flaw detection data flaw position information by the first flaw inspection device, the flaw position information divided into the circumferential grinding width or less is transferred in the circumferential direction. The information on the positional relationship between the flaws (angle difference between flaws) is compared, and the matched portion is used for grinding, thereby enabling highly reliable automatic flaw removal work.

【0037】[0037]

【発明の効果】従来不可能であった高速自動表面疵検査
装置と自動研削機を連動させた表面疵除去作業の自動化
が可能となった。これにより従来オペレーターの熟練を
要する磁粉探傷による疵見作業・疵除去作業が不要とな
り、またこれら人の技量に依存していた官能検査、手動
疵取り作業が機械化され、見落としなどの作業ミスが軽
減され、製品の品質向上に寄与するところ大となった。
According to the present invention, it is possible to automate the operation of removing surface flaws by linking a high-speed automatic surface flaw inspection apparatus and an automatic grinding machine, which was impossible in the past. This eliminates the need for the operator to inspect and remove flaws using magnetic powder flaw detection, which requires the skill of the conventional operator.The sensory inspection and manual flaw removal work that depended on the skills of these people are mechanized, and work errors such as oversight are reduced. And contributed to the improvement of product quality.

【0038】さらに、複数個疵が存在し、更に第一の疵
検査装置での疵信号分布と第二の疵検査装置の疵信号分
布と一致しない場合であっても、自動研削の位置ずれを
起こすことなく、より信頼性の高い自動疵取りシステム
の提供が可能となった。
Further, even when a plurality of flaws exist and the flaw signal distribution in the first flaw inspection device does not match the flaw signal distribution in the second flaw inspection device, the positional deviation of the automatic grinding is not changed. It has become possible to provide a more reliable automatic flaw removal system without causing any trouble.

【図面の簡単な説明】[Brief description of the drawings]

【図1】疵探査における、疵の位置情報(疵マップ)の
一例を示す図。
FIG. 1 is a diagram showing an example of flaw position information (flaw map) in flaw detection.

【図2】疵探査における、疵の信号レベル及びノイズ信
号レベルと判定レベルとの関係を示す図。
FIG. 2 is a diagram showing a relationship between a signal level of a flaw, a noise signal level, and a determination level in flaw detection.

【図3】本願発明の一実施例を示すレイアウト図。FIG. 3 is a layout diagram showing one embodiment of the present invention.

【図4】疵有り材料とチャッキング装置およびクランプ
装置の関係を示す図。
FIG. 4 is a diagram showing a relationship between a flawed material, a chucking device, and a clamp device.

【図5】疵有り材料のチャッキング部における疵の有無
による作業の流れの一例を示すフローチャート。
FIG. 5 is a flowchart showing an example of a work flow based on the presence / absence of a flaw in a chucking portion of flawed material.

【図6】本願発明の一実施例の第二の疵周方向位置情報
と第一の疵周方向位置情報の照合方法の一例を示す説明
図。
FIG. 6 is an explanatory diagram showing an example of a method of collating second flaw circumferential direction position information and first flaw circumferential direction position information according to one embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1…材料(丸棒鋼)[ワーク] 2…デバリングテーブル 3…検査テーブル 4…回転型漏洩磁束探傷機 5…マーキング装置 6…回転超音波探傷機 7…疵無し材料(合格材、手入れ不要材) 8…疵有り材料(不合格材、手入れ要材) 9…研削テーブル 10…疵探査機 11…自動研削機 12…チャッキング装置 13…材料回転装置 14…跳ね出しテーブル 15…信号処理装置 16…クランプ装置 DESCRIPTION OF SYMBOLS 1 ... Material (round bar) [Work] 2 ... Deburring table 3 ... Inspection table 4 ... Rotating type magnetic flux leakage detector 5 ... Marking device 6 ... Rotating ultrasonic flaw detector 7 ... Flaw-free material (passing material, maintenance-free material) 8) Flawed material (rejected material, required maintenance material) 9 ... Grinding table 10 ... Flaw detector 11 ... Automatic grinder 12 ... Chucking device 13 ... Material rotating device 14 ... Bounce table 15 ... Signal processing device 16 … Clamping device

───────────────────────────────────────────────────── フロントページの続き (72)発明者 石橋 淳一 兵庫県姫路市飾磨区中島字一文字3007番地 山陽特殊製鋼株式会社内 (72)発明者 小林 比呂人 兵庫県姫路市飾磨区中島字一文字3007番地 山陽特殊製鋼株式会社内 (72)発明者 河村 皓二 神奈川県相模原市淵野辺5−10−1 株式 会社日鉄エレックス内 (72)発明者 中楠 実 大阪府八尾市萱振町7丁目73番2号 日本 フェルスター株式会社大阪支社内 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Junichi Ishibashi 3007 one-letter Nakajima character in Shima, Himeji City, Hyogo Prefecture Inside Sanyo Special Steel Co., Ltd. Sanyo Special Steel Co., Ltd. (72) Inventor Koji Kawamura 5-10-1 Fuchinobe, Sagamihara City, Kanagawa Prefecture Nippon Steel Elex Co., Ltd. (72) Inventor Minoru Nakakusu 773-2 Kayubashicho, Yao City, Osaka Prefecture No. Japan Felster Co., Ltd. Osaka branch office

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 丸棒鋼、鋼管等の長尺材料の表面疵を全
断面疵検査装置により検査し、疵有り材料と疵無し材料
を選別し、次いで疵有り材料について、前記全断面疵検
査装置により得られた疵長手方向位置情報を記憶装置に
記憶して、材料順にトラッキング処理をし、次いで疵有
り材料が疵研削位置に到達した際、研削機と直結された
周方向疵探査機を、当該疵有り材料について前記の記憶
装置に記憶した疵長手方向位置情報に基いて、当該疵有
り材料の長手方向疵座標位置に移動し、さらに当該疵有
り材料の一端部をチャッキングして回転させ、前記周方
向疵探査機によって疵周方向位置を特定し、次いでチャ
ッキング部分に疵が有る材料と無い材料を分別し、チャ
ッキング部分に疵が無い材料の場合はチャッキングした
まま前記の特定された疵位置情報に基いて疵を自動研削
し、チャッキング部分に疵の有る材料の場合は、チャッ
キング部分の疵を研削する際、該材料をクランプ装置に
より支持してチャッキング装置を逃がし疵を自動研削す
ることを特徴とする長尺材料の自動疵取り方法。
1. A surface flaw of a long material such as a round bar steel or a steel pipe is inspected by a total cross-section flaw inspection apparatus, and a flawed material and a flawless material are selected. The flaw longitudinal position information obtained by is stored in the storage device, tracking processing in the order of the material, then, when the flawed material reaches the flaw grinding position, the circumferential flaw detector directly connected to the grinder, The flawed material is moved to the longitudinal flaw coordinate position of the flawed material based on the flaw longitudinal position information stored in the storage device, and one end of the flawed material is chucked and rotated. The position of the circumferential direction of the flaw is specified by the circumferential flaw detector, and then the material having the flaw in the chucking portion is separated from the material having no flaw. Is In the case of a material having a flaw in the chucking portion, the material is supported by a clamp device and the chucking device is released when the material has a flaw in the chucking portion. Automatic grinding method for a long material, characterized by automatically grinding the surface.
【請求項2】 丸棒鋼、鋼管等の長尺材料の表面疵を全
断面疵検査装置により検査し、疵有り材料と疵無し材料
を選別し、次いで疵有り材料について、前記全断面疵検
査装置により得られた疵長手方向位置情報および第一の
疵周方向位置情報を記憶装置に記憶して、材料順にトラ
ッキング処理をし、次いで疵有り材料が疵研削位置に到
達した際、研削機と直結された周方向疵探査機を、当該
疵有り材料について前記の記憶装置に記憶した疵長手方
向位置情報に基いて、当該疵有り材料の長手方向疵座標
位置に移動し、さらに当該疵有り材料の一端部をチャッ
キングして回転させ、前記周方向疵探査機によって第二
の疵周方向位置情報を得、該第二の疵周方向位置情報を
前記の記憶装置に記憶した第一の疵周方向位置情報と照
合し、該照合結果に基いて疵位置を特定し、次いでチャ
ッキング部分に疵が有る材料と無い材料を分別し、チャ
ッキング部分に疵が無い材料の場合はチャッキングした
まま前記の特定された疵位置情報に基いて疵を自動研削
し、チャッキング部分に疵の有る材料の場合は、チャッ
キング部分の疵を研削する際、該材料をクランプ装置に
より支持してチャッキング装置を逃がし疵を自動研削す
ることを特徴とする長尺材料の自動疵取り方法。
2. A surface defect of a long material such as a round bar steel or a steel pipe is inspected by a total cross-sectional defect inspection device, and a flawed material and a non-flawed material are selected. The flaw longitudinal position information and the first flaw circumferential direction position information obtained by the above are stored in a storage device, and tracking processing is performed in the order of the materials. Then, when the flawed material reaches the flaw grinding position, it is directly connected to the grinding machine. Moved the circumferential flaw detector to the longitudinal flaw coordinate position of the flawed material based on the flaw longitudinal position information stored in the storage device for the flawed material, and further moves the flawed material. One end is chucked and rotated, and the second flaw circumferential direction position information is obtained by the circumferential flaw detector, and the second flaw circumferential direction position information is stored in the storage device. Collate with the direction position information, and Based on the specified flaw position information, the flaw position is specified based on the specified flaw position, and then the material having the flaw in the chucking portion is separated from the material having no flaw. Automatically grinds flaws, and in the case of a material having a flaw in the chucking part, when grinding the flaw in the chucking part, the material is supported by a clamp device, the chucking device is released, and the flaw is automatically ground. Method for automatically removing long materials.
JP9875698A 1998-04-10 1998-04-10 Automatic stripping method for long materials Expired - Lifetime JP3630552B2 (en)

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Application Number Priority Date Filing Date Title
JP9875698A JP3630552B2 (en) 1998-04-10 1998-04-10 Automatic stripping method for long materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9875698A JP3630552B2 (en) 1998-04-10 1998-04-10 Automatic stripping method for long materials

Publications (2)

Publication Number Publication Date
JPH11291151A true JPH11291151A (en) 1999-10-26
JP3630552B2 JP3630552B2 (en) 2005-03-16

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ID=14228290

Family Applications (1)

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Country Status (1)

Country Link
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