JPH11285601A - Treating device - Google Patents

Treating device

Info

Publication number
JPH11285601A
JPH11285601A JP11029188A JP2918899A JPH11285601A JP H11285601 A JPH11285601 A JP H11285601A JP 11029188 A JP11029188 A JP 11029188A JP 2918899 A JP2918899 A JP 2918899A JP H11285601 A JPH11285601 A JP H11285601A
Authority
JP
Japan
Prior art keywords
processing
gutter
processing liquid
tank
wall
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11029188A
Other languages
Japanese (ja)
Other versions
JP3424119B2 (en
Inventor
Yuji Tanaka
裕司 田中
Kenji Yokomizo
賢治 横溝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP02918899A priority Critical patent/JP3424119B2/en
Publication of JPH11285601A publication Critical patent/JPH11285601A/en
Application granted granted Critical
Publication of JP3424119B2 publication Critical patent/JP3424119B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To enable to install a trough to be provided below a cooling body for cooling and condensing vapor of treating liquid in a treating tank, at a right position. SOLUTION: A trough supporting member 40 constructed in the shape of a frame is supported on trough receiving seats 50 made of quartz provided projectingly by weld in several places, for example, six places on the inner wall surface of a treating tank 14 at prescribed intervals. On the trough supporting members 40, quartered plate trough 38 (38A, 38B, 38C and 38D) is arranged so that the outer peripheral surfaces thereof is approached the inner peripheral surface of the treating tank 14 as much as possible (for example, 0-0.5 mm). By such construction, since even if there is variance of the dimensional precision of the plate trough pieces 38A, 38B, 38C and 38D, their positioning can be individually performed, installation can be also performed at right position as a whole. Then, a treating liquid fallen to the plate trough 38 from a spiral tube 36 flows down smoothly along the inner wall of the treating tank 14 from a little gap between plate trough 38 and the inner wall surface to prevent it from splashing to the sides of the object to be treated and a saucer 24 and being struck on them.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、処理液の蒸気を用
いて被処理体表面より水分を除去する処理を行う処理装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a processing apparatus for performing a process of removing water from the surface of an object to be processed using vapor of a processing solution.

【0002】[0002]

【従来の技術】この種の処理装置では、処理槽の底部で
揮発性を有する所定の処理液たとえばIPA(イソプロ
ピルアルコール)を加熱して気化させ、このIPAの蒸
気を被処理体たとえば半導体ウエハの表面に付着してい
る水分と置換させることによって、ウエハ表面から水分
を落下させるようにしている。
2. Description of the Related Art In a processing apparatus of this type, a predetermined processing liquid having a volatile property, for example, IPA (isopropyl alcohol) is heated and vaporized at the bottom of a processing tank, and the vapor of the IPA is applied to an object to be processed, for example, a semiconductor wafer. The water is dropped from the wafer surface by replacing the water with the surface.

【0003】処理槽の上部には、IPAの蒸気が処理槽
の外へ逃げるのを防ぐための、たとえばスパイラル状の
蛇管(冷却蛇管)からなる冷却体が処理槽の内壁に沿っ
て配設される。この冷却蛇管は、その管内に供給される
冷却媒体たとえば冷却水によって低温に保たれ、蒸気処
理部より上昇してきたIPAの蒸気を冷却して凝縮(液
化)させる。
At the upper part of the processing tank, a cooling body composed of, for example, a spiral serpentine tube (cooling serpentine pipe) for preventing the vapor of IPA from escaping from the processing tank is arranged along the inner wall of the processing tank. You. The cooling snake tube is kept at a low temperature by a cooling medium, for example, cooling water supplied in the tube, and cools and condenses (liquefies) the IPA vapor that has risen from the steam processing section.

【0004】冷却蛇管の下方には、冷却蛇管から自然落
下する処理液の液滴を受ける樋が処理槽の内壁に沿って
設けられる。冷却蛇管からこの樋に落下した処理液は、
さらに樋と処理槽内壁との間の隙間から処理槽底部の処
理液溜部へ落ちて回収されるようになっている。
[0004] Below the cooling tube, a gutter is provided along the inner wall of the processing tank for receiving a droplet of the processing solution that falls naturally from the cooling tube. The processing liquid that has fallen from the cooling snake into this gutter,
Further, the liquid is dropped from a gap between the gutter and the inner wall of the processing tank into a processing liquid reservoir at the bottom of the processing tank and is collected.

【0005】[0005]

【発明が解決しようとする課題】従来のこの種処理装置
では、上記したような処理液回収用の樋が枠状に形成さ
れた一体的樋構造であるため、寸法精度のばらつきの影
響を受けやすく、処理槽内に正しい位置合せで設置する
のが難しい。樋の設置に位置ずれがあると、冷却蛇管か
ら落下した処理液の液滴が樋に正しく受けとめられなか
ったり、あるいは樋から(特に、樋と処理槽内壁との間
の隙間から)処理液溜部への落ち方がスムースにいかく
なくなったり、液滴が半導体ウエハに掛かるおそれもあ
る。
In this type of conventional processing apparatus, since the above-described processing liquid recovery gutter has an integral gutter structure formed in a frame shape, it is affected by variations in dimensional accuracy. Easy to install in the processing tank with correct alignment. If there is a misalignment in the installation of the gutter, the processing liquid droplets dropped from the cooling tube will not be properly received by the gutter, or the processing liquid will be collected from the gutter (particularly from the gap between the gutter and the inner wall of the processing tank). There is also a possibility that the way of dropping into the part may be lost smoothly, or that the droplet may fall on the semiconductor wafer.

【0006】本発明は、かかる従来技術の問題点に鑑み
てなされたもので、処理槽内で処理液の蒸気を冷却して
凝縮させる冷却体の下方に設けられる処理液回収用の樋
を正しい位置合せで設置できるようにした処理装置を提
供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and a gutter for collecting a processing liquid provided below a cooling body for cooling and condensing the vapor of the processing liquid in a processing tank is properly provided. It is an object of the present invention to provide a processing apparatus that can be installed in alignment.

【0007】[0007]

【課題を解決するための手段】上記の目的を達成するた
めに、本発明の処理装置は、処理槽の中で所定の揮発性
処理液の蒸気を用いて被処理体の表面より水分を脱離さ
せる蒸気処理部と、前記蒸気処理部よりも上の位置で前
記処理槽の内壁に沿って配置され、前記蒸気処理部より
上昇してくる前記処理液の蒸気を冷却して凝縮させる冷
却体と、前記冷却体から落下する前記処理液を受けるよ
うに前記冷却体より下の位置でそれぞれ前記処理槽の内
壁に沿って配置された複数個の樋片から構成される分割
式の樋構造とを有する構成とした。
In order to achieve the above object, a processing apparatus according to the present invention removes moisture from the surface of a processing object using a predetermined volatile processing liquid vapor in a processing tank. A steam processing unit to be separated, and a cooling unit disposed along the inner wall of the processing tank at a position above the steam processing unit and cooling and condensing the vapor of the processing liquid rising from the steam processing unit. And a split gutter structure comprising a plurality of gutter pieces respectively arranged along the inner wall of the processing tank at a position below the cooling body so as to receive the processing liquid falling from the cooling body. .

【0008】本発明の一態様によれば、前記処理槽の内
壁に沿って配置された各々の前記樋片が、前記冷却体か
らの前記処理液を集めるための底部を有する。この場
合、処理液回収用の管がいずれかの前記樋片の底部に接
続される構成であってよい。
According to one aspect of the present invention, each of the gutter pieces disposed along the inner wall of the processing tank has a bottom portion for collecting the processing liquid from the cooling body. In this case, a configuration may be adopted in which a pipe for collecting the processing liquid is connected to the bottom of any of the gutter pieces.

【0009】また、本発明の別の態様によれば、各々の
前記樋片が前記処理槽の内壁との間に前記処理液を落と
すための隙間を設けて配設される。この場合、前記処理
槽の内壁に所定の間隔を置いて固定取付された複数個の
受座部材と、前記複数個の樋片を支持するために前記複
数個の受座部材に取付された枠状の樋支持部材とを設け
る構成としてよい。
According to another aspect of the present invention, each of the gutter pieces is provided with a gap for dropping the processing liquid between the gutter piece and an inner wall of the processing tank. In this case, a plurality of seat members fixedly attached to the inner wall of the processing tank at predetermined intervals, and a frame attached to the plurality of seat members to support the plurality of gutter pieces. It is good also as a structure provided with a trough-shaped support member.

【0010】[0010]

【発明の実施の形態】以下、添付図を参照して本発明の
実施例を説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the accompanying drawings.

【0011】図1および図2は、本発明の一実施例によ
る処理装置の構成を示す一部断面正面図および一部断面
側面図である。なお、図解の簡略化のため、図1におけ
る搬送アーム22は、図2では省かれて図示されていな
い。
FIGS. 1 and 2 are a partial sectional front view and a partial sectional side view, respectively, showing the structure of a processing apparatus according to an embodiment of the present invention. For simplicity of illustration, the transfer arm 22 in FIG. 1 is not shown in FIG.

【0012】この処理装置は、たとえばステンレスから
なる有底角筒状の容器10の底に加熱装置12を配置
し、この加熱装置12の上に容器10の内壁と幾らか隙
間を空けてたとえば石英からなる有底角筒状の処理槽1
4を載置してなる。
In this processing apparatus, for example, a heating device 12 is disposed at the bottom of a bottomed rectangular cylindrical container 10 made of stainless steel, and for example, quartz is provided on the heating device 12 with some gap from the inner wall of the container 10. Square processing tank 1 with bottom
4 is placed.

【0013】処理槽14の底には、揮発性を有する所定
の処理液たとえばIPA(イソプロピルアルコール)1
6が所定の液面レベルまで貯留され、処理槽14の側壁
または底に設けられた処理液導入口および排出口(図示
せず)を介して必要に応じて処理液16の入れ替えまた
は補充が行なわれるようになっている。このように、処
理槽14の底部が処理液溜部18を形成している。
At the bottom of the processing tank 14, a predetermined processing liquid having a volatile property, for example, IPA (isopropyl alcohol) 1
6 is stored to a predetermined liquid level, and the processing liquid 16 is replaced or replenished as necessary through a processing liquid inlet and a discharge port (not shown) provided on the side wall or bottom of the processing tank 14. It is supposed to be. Thus, the bottom of the processing tank 14 forms the processing liquid reservoir 18.

【0014】この処理装置に電源が投入されている間は
常時つまり処理中でも待機中でも処理液溜部18の処理
液16は加熱装置12からの加熱で蒸発し、処理液溜部
18の上方に処理液16の蒸気の雰囲気が形成される。
しかして、処理槽14内のほぼ中間の高さ位置に蒸気処
理部または空間20が設定されており、処理時にはこの
蒸気処理部20に複数枚たとえば50枚の被処理体たと
えば半導体ウエハW1〜W50が搬送アーム22に把持ま
たは担持された状態で置かれるようになっている。
The processing liquid 16 in the processing liquid reservoir 18 is evaporated by heating from the heating device 12 while the power is supplied to the processing apparatus, that is, both during processing and during standby, and the processing liquid is stored above the processing liquid storage 18. An atmosphere of the vapor of the liquid 16 is formed.
A steam processing section or space 20 is set at a substantially intermediate height position in the processing tank 14, and a plurality of, for example, 50 workpieces such as semiconductor wafers W1 to W50 are provided in the steam processing section 20 during processing. Is held while being held or carried by the transfer arm 22.

【0015】処理槽14の底部には、蒸気処理部20の
真下で、かつ処理液16の液面よりは高い位置に、たと
えば石英製の受皿24が設置されている。受皿24の下
面に一体に取付された脚24aは処理槽14の底に付い
ている。図3に示すように、受皿24の上面(水分受
面)は被処理体Wの蒸気処理部20よりも広い面積に選
ばれており、処理中に半導体ウエハW1〜W50より脱離
・落下した処理液を含む水分は真下の受皿24に受けら
れるようになっている。
At the bottom of the processing tank 14, a receiving tray 24 made of, for example, quartz is installed immediately below the vapor processing section 20 and at a position higher than the level of the processing liquid 16. The legs 24 a integrally attached to the lower surface of the tray 24 are attached to the bottom of the processing tank 14. As shown in FIG. 3, the upper surface (moisture receiving surface) of the tray 24 is selected to have a larger area than the vapor processing section 20 of the workpiece W, and has been detached and dropped from the semiconductor wafers W1 to W50 during processing. The water containing the processing liquid is received in the receiving tray 24 directly below.

【0016】受皿24の底には排液口24bが設けら
れ、この排液口24bに排液管26が接続されている。
排液管26は、処理液溜部18内を通り、処理槽14お
よび装置容器10を貫通して、外部の排液回収部たとえ
ばドレインタンク(図示せず)に通じている。排液管2
6は、少なくとも処理槽14内では石英またはテフロン
製の管で構成されるのが好ましい。また、排液管26を
通す処理槽14および処理容器10の壁穴には適当なシ
ール部材(図示せず)が設けられてよい。
A drain 24b is provided at the bottom of the tray 24, and a drain pipe 26 is connected to the drain 24b.
The drainage pipe 26 passes through the inside of the processing liquid reservoir 18, penetrates the processing tank 14 and the apparatus container 10, and communicates with an external drainage recovery part, for example, a drain tank (not shown). Drain pipe 2
6 is preferably made of a tube made of quartz or Teflon at least in the processing tank 14. Further, a suitable sealing member (not shown) may be provided in the wall holes of the processing tank 14 and the processing container 10 through which the drainage pipe 26 passes.

【0017】本実施例では、装置容器10の外で排液管
26にU字状のトラップ部26aが設けられるととも
に、このトラップ部26aよりも下流側つまりドレイン
タンク側にたとえばエアオペバルブからなる開閉弁30
が設けられている。そして、処理槽14内で該トラップ
部26aの上端よりも高い排液管26の位置(箇所)か
ら斜め上方に分岐する処理液回収用の枝管32が排液管
26に一体形成されており、この枝管32の上端は受皿
排液口24bよりも低い位置にて開口している。後述す
るように、待機時間中に受皿24に凝縮した処理液は枝
管32を通って処理液溜部18へ回収されるようになっ
ている。
In this embodiment, a U-shaped trap portion 26a is provided in the drain pipe 26 outside the apparatus container 10, and an on-off valve such as an air-operated valve is provided downstream of the trap portion 26a, that is, on the drain tank side. 30
Is provided. A branch pipe 32 for collecting the processing liquid is formed integrally with the drain pipe 26, and branches off obliquely upward from a position (place) of the drain pipe 26 higher than the upper end of the trap portion 26a in the processing tank 14. The upper end of the branch pipe 32 is open at a position lower than the tray drain port 24b. As will be described later, the processing liquid condensed in the receiving tray 24 during the standby time passes through the branch pipe 32 and is collected in the processing liquid reservoir 18.

【0018】受皿24の下側には、処理液溜部18を覆
うように無数の通孔を有するたとえばテフロンからなる
保護版34が設置されている。この保護板34の各脚3
4aも処理槽14の底に付いている。誤って半導体ウエ
ハWiが搬送アーム22から脱落しても、この保護板3
4で受け止められ、処理槽12の底には当たらないよう
になっている。
A protective plate 34 made of, for example, Teflon and having a myriad of through holes is provided below the receiving tray 24 so as to cover the processing liquid reservoir 18. Each leg 3 of this protection plate 34
4a is also attached to the bottom of the processing tank 14. Even if the semiconductor wafer Wi falls out of the transfer arm 22 by mistake, the protection plate 3
4 so as not to hit the bottom of the processing tank 12.

【0019】処理槽14の上部にはスパイラル状の冷却
蛇管36が内壁に沿って延在するように設けられてい
る。この冷却蛇管36には冷却媒体たとえば冷却水が循
環供給されており、蒸気処理部20より上昇してきた処
理液の蒸気は冷却蛇管36で冷やされて凝縮(液化)す
ることで処理槽14の外へ逃げないようになっている。
At the top of the processing tank 14, a spiral cooling snake tube 36 is provided so as to extend along the inner wall. A cooling medium, for example, cooling water is circulated and supplied to the cooling snake tube 36, and the vapor of the processing liquid that has risen from the steam processing part 20 is cooled by the cooling snake tube 36 and condensed (liquefied) so as to be outside the processing tank 14. Not to escape.

【0020】冷却蛇管36の下には、蛇管36より落ち
た処理液を受けるためのたとえば石英からなる板樋38
が処理槽14の内壁に沿って回廊状に設けられている。
この板樋38は、その外周縁部を処理槽14の内壁に密
着させて内周縁部に向かうほど板面が高くなるように、
つまり外周縁部側に底を形成するように傾いた姿勢で支
持部材40に固定支持されており、内周縁部38aを起
立させて返し部38aを形成している。また、板樋38
は周回方向において高低差をもって延在しており、最も
低い板樋部分付近の処理槽14の内壁に処理液排出口1
4aが形成されている。
Below the cooling tube 36, a plate gutter 38 made of, for example, quartz for receiving the processing liquid dropped from the tube 36 is provided.
Are provided in a corridor along the inner wall of the processing tank 14.
The plate gutter 38 is so arranged that its outer peripheral edge is in close contact with the inner wall of the processing tank 14 so that the plate surface becomes higher toward the inner peripheral edge.
In other words, it is fixedly supported by the support member 40 in a posture inclined so as to form a bottom on the outer peripheral edge side, and the inner peripheral edge 38a is raised to form a return portion 38a. In addition, sheet gutter 38
Extends in the circumferential direction with a height difference, and the processing liquid discharge port 1 is provided on the inner wall of the processing tank 14 near the lowest plate gutter portion.
4a are formed.

【0021】板樋38の処理液排出口14aは処理液回
収用の排出管42を介して装置容器10の外に配置され
ているフィルタ44の入口に接続され、フィルタ44の
出口は処理液回収用の導入管46を介して処理槽14の
側壁の処理液導入口14bに接続されている。この処理
液導入口14bは、処理液溜部18に貯留される処理液
16の液面よりも高い位置に形成されている。
The processing liquid discharge port 14a of the plate gutter 38 is connected to an inlet of a filter 44 disposed outside the apparatus container 10 through a discharge pipe 42 for collecting the processing liquid. Is connected to the processing liquid inlet 14b on the side wall of the processing tank 14 through an inlet pipe 46 for use. The processing liquid inlet 14 b is formed at a position higher than the level of the processing liquid 16 stored in the processing liquid storage 18.

【0022】図4に示すように、この実施例における板
樋38は、複数たとえば4つの板樋片38A,38B,
38C,38Dに分割形成されており、各板樋片38i
(i=A,B,C,D)が別々に処理槽14の各内壁に
取付される。かかる分割式の樋構造においては、各板樋
片38iの寸法精度にバラツキがあっても、個々に位置
合わせできるため、全体的にも正しい位置合せで設置で
きる。
As shown in FIG. 4, a plurality of, for example, four sheet gutter pieces 38A, 38B,
38C and 38D, each of which is provided with a plate gutter piece 38i.
(I = A, B, C, D) are separately attached to each inner wall of the processing tank 14. In such a split gutter structure, even if the dimensional accuracy of each plate gutter piece 38i varies, it can be individually positioned, so that it can be installed with the correct positioning as a whole.

【0023】次に、本処理装置における作用を説明す
る。
Next, the operation of the present processing apparatus will be described.

【0024】搬送アーム22は、たとえば純水スプレー
による洗浄処理を受けた直後の1ロット分の半導体ウエ
ハW1〜W50を搬送してきて、図1に示すように処理槽
14内の蒸気処理部20まで下ろし、処理時間中その位
置20で半導体ウエハW1〜W50を保持する。処理の開
始に先立って、図示しない制御装置により開閉弁30が
開けられる。上記したように、この処理装置に電源が入
っている間は、つまり加熱装置12が作動している間
は、処理槽14の底部の処理液溜部18より処理液16
の蒸気が立ち篭めて槽内とりわけ蒸気処理部20付近は
処理液の蒸気がほぼ飽和状態で充満している。この雰囲
気の中に半導体ウエハWiが被処理体として置かれるこ
とによって、ウエハ表面に付着している水分が処理液の
蒸気で置換され、ウエハ表面から脱離した水分は真下の
受皿24に落ちる。
The transfer arm 22 transfers one lot of semiconductor wafers W1 to W50 immediately after being subjected to a cleaning process by pure water spray, for example, and reaches the steam processing section 20 in the processing tank 14 as shown in FIG. Then, the semiconductor wafers W1 to W50 are held at the position 20 during the processing time. Prior to the start of the process, the control device (not shown) opens the on-off valve 30. As described above, while the power of the processing apparatus is turned on, that is, while the heating apparatus 12 is operating, the processing liquid 16 is stored in the processing liquid reservoir 18 at the bottom of the processing tank 14.
And the inside of the tank, especially near the steam processing section 20, is substantially saturated with the steam of the processing liquid. When the semiconductor wafer Wi is placed as an object to be processed in this atmosphere, the moisture adhering to the wafer surface is replaced by the vapor of the processing liquid, and the moisture desorbed from the wafer surface falls to the tray 24 directly below.

【0025】このようにして受皿24に溜った水分は、
皿底の排液口24bより出て排液管26を流れ、開閉弁
30を通ってドレインタンク側へ送られる。また、処理
中に受皿24付近で処理液の蒸気が凝縮して生じた処理
液は、水分に混じって排液管26を通って排液される。
The water collected in the pan 24 in this manner is
The liquid flows out of the drain port 24b at the bottom of the plate, flows through the drain pipe 26, and is sent to the drain tank through the on-off valve 30. The processing liquid generated by the condensation of the processing liquid near the receiving tray 24 during the processing is mixed with the water and discharged through the drain pipe 26.

【0026】処理が終わると、搬送アーム22は半導体
ウエハW1〜W50を持ち上げて処理槽14から取り出
す。この際に、ウエハ表面に付着していた処理液の蒸気
が拡散分離して、ウエハ表面は乾燥状態になる。もっと
も、被処理体の乾燥を速めるために、処理槽14の上部
開口付近で被処理体に向けてエアまたはN2ガス等の不
活性ガスを吹き付けるような乾燥機構を設けてもよい。
When the processing is completed, the transfer arm 22 lifts the semiconductor wafers W1 to W50 and removes them from the processing bath 14. At this time, the vapor of the processing liquid adhering to the wafer surface is diffused and separated, and the wafer surface is in a dry state. Of course, a drying mechanism for blowing air or an inert gas such as N2 gas toward the object to be processed may be provided near the upper opening of the processing tank 14 in order to speed up drying of the object to be processed.

【0027】処理槽14内では、半導体ウエハW1〜W5
0が搬出されると、もはや蒸気処理部20から受皿24
に水分は落ちなくなるが、しばらく受皿24に残ってい
る水分が排液管26を介して排液される。そして、処理
終了時から所定時間が経過した後、つまり受皿24から
水分が完全に排出され、かつ排液管26内の水分が少な
くとも枝管32よりも低い位置まで下がった頃合に、制
御部によって開閉弁30が閉じられる。なお、開閉弁3
0が閉じる前に、排液管26内の水分が枝管32よりも
低い位置まで下がったときは、トラップ部26aよりも
上流部分に排液が滞留するので、外気の雰囲気はここで
遮断され、処理槽14内に上がってくることはない。
In the processing bath 14, the semiconductor wafers W1 to W5
When 0 is carried out, the saucer 24 is no longer
However, the water remaining in the pan 24 for a while is drained through the drain pipe 26. Then, after a predetermined time has elapsed from the end of the process, that is, when the moisture has been completely drained from the receiving pan 24 and the moisture in the drainage pipe 26 has dropped to at least a position lower than the branch pipe 32, the control unit The on-off valve 30 is closed. The on-off valve 3
If the water in the drainage pipe 26 drops to a position lower than the branch pipe 32 before 0 is closed, the drainage remains in the upstream portion of the trap portion 26a, so that the atmosphere of the outside air is shut off here. , Does not rise into the processing tank 14.

【0028】開閉弁30が閉じた後、受皿24に溜る液
は処理液16の蒸気が冷えて凝縮したものであり、水分
を含んでいない処理液16である。この受皿24に溜ま
った処理液16は、受皿排液口24bより排液管26に
送られるや否や枝管32に入り、枝管32の口から液滴
16bとして落下し、処理液溜部18へ回収される。
After the on-off valve 30 is closed, the liquid remaining in the receiving tray 24 is a liquid obtained by cooling and condensing the vapor of the processing liquid 16 and is a processing liquid 16 containing no water. The processing liquid 16 stored in the receiving pan 24 enters the branch pipe 32 as soon as it is sent to the drain pipe 26 from the receiving drain port 24b, drops as a droplet 16b from the opening of the branch pipe 32, and the processing liquid storage section 18 To be collected.

【0029】一方、処理槽14内の上部では、処理時間
中も待機時間中も本処理装置が運転している間は、処理
液16の蒸気が冷却蛇管36で冷やされて凝縮液化す
る。
On the other hand, in the upper part of the processing tank 14, the vapor of the processing liquid 16 is cooled by the cooling pipe 36 and condensed and liquefied while the processing apparatus is operating both during the processing time and during the standby time.

【0030】図5に示すように、冷却蛇管36の各段の
管の表面に凝縮して付いた処理液の滴は、垂直方向に下
段の管の外周面を順次伝って、最下段の管付近で大きな
液滴16aに成長して蛇管から脱離し落下する。その脱
離落下の際に、処理液の液滴16aが管の側方へ跳ねる
ことがある。本実施例では、蛇管36の内側つまり処理
槽中心部側へ跳ねた液滴16aは、板樋38の返し部3
8aで捕捉されるようになっており、被処理体Wや受皿
24等にかかるおそれはない。
As shown in FIG. 5, the droplets of the processing liquid condensed on the surface of each tube of the cooling serpentine tube 36 are successively transmitted along the outer peripheral surface of the lower tube in the vertical direction. In the vicinity, the droplet grows into a large droplet 16a, detaches from the flexible tube, and falls. At the time of the detachment and drop, the droplet 16a of the processing liquid may jump to the side of the tube. In the present embodiment, the droplets 16a that bounce toward the inside of the flexible pipe 36, that is, toward the center of the processing bath,
8a, there is no possibility of the object W to be processed, the tray 24, or the like.

【0031】冷却蛇管36より板樋38に落ちた処理液
は、板樋38を周回方向に低い方へ移動して処理液排出
口14aより排出管42を通ってフィルタ44に送ら
れ、そこで不純物や塵埃等を除去されてから、導入管4
6を通って処理液導入口14bへ導かれ、そこから処理
槽14の壁伝いに処理液溜部18に落ちるようになって
いる。なお、処理液導入管46を処理液導入口14bよ
り内側に突出させ、管46の出口から処理液が処理液溜
部18へ直接落ちるようにしてもよい。
The processing liquid that has dropped into the plate gutter 38 from the cooling snake tube 36 moves downward in the circumferential direction along the plate gutter 38 and is sent from the processing liquid discharge port 14a to the filter 44 through the discharge pipe 42, where it is subjected to impurities. After removing dust and dust, the introduction pipe 4
6, the liquid is guided to the processing liquid inlet 14b, from which the water falls along the wall of the processing tank 14 into the processing liquid reservoir 18. Note that the processing liquid introduction pipe 46 may be protruded inward from the processing liquid introduction port 14b, and the processing liquid may directly drop into the processing liquid reservoir 18 from the outlet of the pipe 46.

【0032】このように、本実施例の処理装置では、冷
却蛇管36で凝縮液化した処理液16が、正しい位置合
わせで設置された板樋38によって安全確実に捕捉され
るとともに、処理液回収用の排出管42および導入管4
6ならびにフィルタ44によって不純物や塵埃等を除去
してから処理液溜部18に回収されるので、処理槽14
において処理液16は劣化しにくく、そのぶん処理液1
6の入れ替えが少なくなり、処理液16の消費量が少な
くなっている。
As described above, in the processing apparatus of the present embodiment, the processing liquid 16 condensed and liquefied by the cooling coil 36 is safely and reliably captured by the plate gutter 38 installed at the correct position, and the processing liquid for collecting the processing liquid is collected. Discharge pipe 42 and introduction pipe 4
6 and the filter 44 remove impurities and dust and the like, and then collect them in the processing liquid reservoir 18.
, The processing liquid 16 is hardly deteriorated.
6 is reduced, and the consumption of the processing liquid 16 is reduced.

【0033】図6および図7に、本発明の第二の実施例
による分割式樋構造を示す。この実施例は、板樋38と
処理槽14との間に隙間を設けてその隙間から処理液を
落とす方式に本発明を適用したものである。
FIGS. 6 and 7 show a split gutter structure according to a second embodiment of the present invention. In this embodiment, the present invention is applied to a system in which a gap is provided between the plate gutter 38 and the processing tank 14 and the processing liquid is dropped from the gap.

【0034】図6に示すように、この実施例では、枠状
に構成された樋支持部材40が処理槽14の内壁面に所
定の間隔を置いて数箇所たとえば6箇所に溶接で突設さ
れた石英製の樋受座50に担持され、この樋支持部材4
0の上に4分割式の板樋38(38A,38B,38
C,38D)がその外周面を処理槽14の内周面に可及
的に(たとえば0〜0.5mm)に接近させて配設され
る。
As shown in FIG. 6, in this embodiment, a gutter supporting member 40 formed in a frame shape is welded at several places, for example, six places at predetermined intervals on the inner wall surface of the processing tank 14. This gutter supporting member 4 is supported by a quartz gutter seat 50 made of
0, a four-part plate gutter 38 (38A, 38B, 38
C, 38D) is disposed with its outer peripheral surface as close to the inner peripheral surface of the processing tank 14 as possible (for example, 0 to 0.5 mm).

【0035】この実施例においても、各板樋片38iが
別々に処理槽14の各内壁に取付される分割式の樋構造
であるため、各板樋片38iに個々の寸法誤差があって
も個々に位置合わせが可能であり、全体的にも正しい位
置合せで設置できる。
Also in this embodiment, since each plate gutter piece 38i has a divided gutter structure separately attached to each inner wall of the processing tank 14, even if each plate gutter piece 38i has an individual dimensional error. Positioning can be performed individually, and can be installed with correct positioning as a whole.

【0036】図7に示すように、この実施例において
は、蛇管36から板樋38に落ちた処理液が、板樋38
と処理槽14の内壁面との間のわずかな隙間から内壁伝
いにスムースに流れ落ち、被処理体Wや受皿24側へ跳
ねてそれらに付着するようなことはない。
As shown in FIG. 7, in this embodiment, the processing liquid dropped from the flexible pipe 36 to the plate gutter 38 is
It does not flow down smoothly along the inner wall from a slight gap between the inner wall of the processing tank 14 and the inner wall of the processing tank 14, and does not jump to the workpiece W or the tray 24 and adhere to them.

【0037】本発明における樋手段は、上記した実施例
の板樋38に限らず、本発明の技術思想の範囲内で任意
の形状・構造が可能であり、たとえば断面が湾曲したも
のでもよい。また、周回方向における傾斜を連続的にし
て処理液をより迅速・円滑に排出口14a側に送るよう
にしてもよく、排出口14aの個数または処理液回収用
の管42,46の本数を複数にすることも可能である。
また、必要に応じて、処理液回収用の管42,46にボ
ンプを取りつけてもよく、フィルタ44を省くことも可
能である。また、冷却体も蛇管構造に限るものではな
く、たとえばパネル構造のものでも可能である。
The gutter means in the present invention is not limited to the plate gutter 38 of the above-described embodiment, and may have any shape and structure within the scope of the technical idea of the present invention. For example, the gutter means may have a curved cross section. Further, the processing liquid may be sent to the discharge port 14a side more quickly and smoothly by continuously tilting in the circumferential direction, and the number of the discharge ports 14a or the number of the pipes 42 and 46 for collecting the processing liquid may be plural. It is also possible to
If necessary, a pump may be attached to the processing liquid collecting tubes 42 and 46, and the filter 44 can be omitted. Further, the cooling body is not limited to the flexible tube structure, but may be a panel structure, for example.

【0038】[0038]

【発明の効果】以上説明したように、本発明の処理装置
によれば、処理液の蒸気を冷却して凝縮させる冷却体の
下方に設けられる処理液回収用の樋を分割式の樋構造と
することにより、樋部材における寸法精度の誤差を補正
して処理槽内に正しい位置合せで設置することができ、
処理液の回収を安全確実に行うことができる。
As described above, according to the processing apparatus of the present invention, the gutter structure for collecting the processing liquid provided below the cooling body for cooling and condensing the vapor of the processing liquid has a split gutter structure. By doing so, it is possible to correct the dimensional accuracy error in the gutter member and install it in the processing tank with correct alignment,
Recovery of the processing liquid can be performed safely and reliably.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例による処理装置の全体構成を
示す一部断面正面図である。
FIG. 1 is a partial cross-sectional front view showing an entire configuration of a processing apparatus according to an embodiment of the present invention.

【図2】実施例による処理装置の全体構成を示す一部断
面側面図である。
FIG. 2 is a partial cross-sectional side view showing the entire configuration of the processing apparatus according to the embodiment.

【図3】実施例の処理装置において水分脱離位置に対す
る受皿の面積を示す略断面図である。
FIG. 3 is a schematic cross-sectional view showing an area of a receiving tray with respect to a water desorption position in the processing apparatus of the embodiment.

【図4】実施例の処理装置における分割式の樋構造を示
す略断面図である。
FIG. 4 is a schematic sectional view showing a divided gutter structure in the processing apparatus of the embodiment.

【図5】実施例における板樋の作用を示す略断面図であ
る。
FIG. 5 is a schematic sectional view showing an operation of a plate gutter in the embodiment.

【図6】本発明の第二の実施例による分割式の樋構造を
示す略斜視図である。
FIG. 6 is a schematic perspective view showing a split gutter structure according to a second embodiment of the present invention.

【図7】第二の実施例による分割式の樋構造の作用を示
す略断面図である。
FIG. 7 is a schematic sectional view showing the operation of the split gutter structure according to the second embodiment.

【符号の説明】[Explanation of symbols]

12 加熱装置 14 処理槽 16 処理液 18 処理液溜部 20 蒸気処理部 36 冷却蛇管 38 板樋 38A,38B,38C,38D 板樋片 40 樋支持部材 50 樋受座 DESCRIPTION OF SYMBOLS 12 Heating apparatus 14 Processing tank 16 Processing liquid 18 Processing liquid storage part 20 Steam processing part 36 Cooling snake tube 38 Plate gutter 38A, 38B, 38C, 38D Plate gutter piece 40 Gutter support member 50 Gutter seat

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 処理槽の中で所定の揮発性処理液の蒸
気を用いて被処理体の表面より水分を脱離させる蒸気処
理部と、 前記蒸気処理部よりも上の位置で前記処理槽の内壁に沿
って配置され、前記蒸気処理部より上昇してくる前記処
理液の蒸気を冷却して凝縮させる冷却体と、 前記冷却体から落下する前記処理液を受けるように前記
冷却体より下の位置でそれぞれ前記処理槽の内壁に沿っ
て配置された複数個の樋片から構成される分割式の樋構
造とを有する処理装置。
1. A steam processing section for removing moisture from the surface of an object to be processed using a vapor of a predetermined volatile processing liquid in a processing tank, and the processing tank at a position above the steam processing section. A cooling body that is disposed along an inner wall of the processing body and cools and condenses the vapor of the processing liquid that rises from the vapor processing section; and a cooling body that is below the cooling body to receive the processing liquid that falls from the cooling body. And a split type gutter structure comprising a plurality of gutter pieces arranged along the inner wall of the processing tank at the position (1).
【請求項2】 前記処理槽の内壁に沿って配置された各
々の前記樋片が、前記冷却体からの前記処理液を集める
ための底部を有することを特徴とする請求項1に記載の
処理装置。
2. The process according to claim 1, wherein each of said gutter pieces disposed along an inner wall of said processing tank has a bottom portion for collecting said processing liquid from said cooling body. apparatus.
【請求項3】 処理液回収用の管がいずれかの前記樋片
の底部に接続されていることを特徴とする請求項2に記
載の処理装置。
3. The processing apparatus according to claim 2, wherein a pipe for collecting a processing liquid is connected to a bottom of any of the gutter pieces.
【請求項4】 各々の前記樋片が前記処理槽の内壁との
間に前記処理液を落とすための隙間を設けて配設される
ことを特徴とする請求項1に記載の処理装置。
4. The processing apparatus according to claim 1, wherein each of said gutter pieces is provided with a gap for dropping said processing solution between said gutter piece and an inner wall of said processing tank.
【請求項5】 前記処理槽の内壁に所定の間隔を置いて
固定取付された複数個の樋受座部材と、前記複数個の樋
片を支持するために前記複数個の樋受座部材に取付され
た枠状の樋支持部材とを有することを特徴とする請求項
4に記載の処理装置。
5. A plurality of gutter seat members fixedly mounted on an inner wall of the processing tank at predetermined intervals, and a plurality of gutter seat members for supporting the plurality of gutter pieces. The processing apparatus according to claim 4, further comprising a frame-shaped gutter supporting member attached.
JP02918899A 1999-02-05 1999-02-05 Processing equipment Expired - Fee Related JP3424119B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP02918899A JP3424119B2 (en) 1999-02-05 1999-02-05 Processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02918899A JP3424119B2 (en) 1999-02-05 1999-02-05 Processing equipment

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP04039694A Division JP3273282B2 (en) 1993-10-29 1994-02-15 Processing equipment

Publications (2)

Publication Number Publication Date
JPH11285601A true JPH11285601A (en) 1999-10-19
JP3424119B2 JP3424119B2 (en) 2003-07-07

Family

ID=12269240

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02918899A Expired - Fee Related JP3424119B2 (en) 1999-02-05 1999-02-05 Processing equipment

Country Status (1)

Country Link
JP (1) JP3424119B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6807972B2 (en) * 2002-03-29 2004-10-26 Applied Materials, Inc. Gutter and splash-guard for protecting a wafer during transfer from a single wafer cleaning chamber

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201A (en) * 1981-06-24 1983-01-05 島田理化工業株式会社 Drying tank for vapor of "flon(r)"
JPH04171026A (en) * 1990-11-02 1992-06-18 Daicel Chem Ind Ltd Organic solvent reproducing apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58201A (en) * 1981-06-24 1983-01-05 島田理化工業株式会社 Drying tank for vapor of "flon(r)"
JPH04171026A (en) * 1990-11-02 1992-06-18 Daicel Chem Ind Ltd Organic solvent reproducing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6807972B2 (en) * 2002-03-29 2004-10-26 Applied Materials, Inc. Gutter and splash-guard for protecting a wafer during transfer from a single wafer cleaning chamber

Also Published As

Publication number Publication date
JP3424119B2 (en) 2003-07-07

Similar Documents

Publication Publication Date Title
KR100338534B1 (en) Substrate Drying Equipment and Substrate Drying Method
KR100452542B1 (en) Method and apparatus for driving washed objects
EP0198169B1 (en) Vapor drying apparatus
KR102354361B1 (en) Substrate liquid processing device, tank cleaning method, and storage medium
US20170084470A1 (en) Substrate processing apparatus and cleaning method of processing chamber
US5657553A (en) Substrate drying apparatus
JP6728358B2 (en) Substrate processing apparatus, substrate processing method and storage medium
TW502332B (en) Substrate processing unit
JPH06283496A (en) Dryer of substrate after washing
US5535525A (en) Vapor/liquid phase separator for an open tank IPA-dryer
JP2014130940A (en) Substrate processing device and substrate processing method
JPH11285601A (en) Treating device
JP5996424B2 (en) Substrate processing apparatus and substrate processing method
JP3273282B2 (en) Processing equipment
JPS62106630A (en) Processing device
JP2000315673A (en) Cleaning processor and method for reusing atmospheric fluid
KR100862704B1 (en) Apparatus and method for treating waste liquid
JP3040306B2 (en) Steam cleaning equipment
US5454390A (en) Vapor rinse-vapor dry process tool
JP5021364B2 (en) Suction drying apparatus and control method thereof
JP4155871B2 (en) Vacuum evaporation concentrator
KR0118207B1 (en) Cleaning apparatus and wafer cassette
JP2002035668A (en) Coating device and coating method
KR0180344B1 (en) Drying apparatus of semiconductor wafer
JP3506851B2 (en) Steam drying apparatus and method for drying semiconductor wafer

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120502

Year of fee payment: 9

LAPS Cancellation because of no payment of annual fees