JPH11251370A - Method and device for supplying conductive adhesive and chip mounter - Google Patents

Method and device for supplying conductive adhesive and chip mounter

Info

Publication number
JPH11251370A
JPH11251370A JP10053785A JP5378598A JPH11251370A JP H11251370 A JPH11251370 A JP H11251370A JP 10053785 A JP10053785 A JP 10053785A JP 5378598 A JP5378598 A JP 5378598A JP H11251370 A JPH11251370 A JP H11251370A
Authority
JP
Japan
Prior art keywords
conductive adhesive
bump
plate
supplying
bumps
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10053785A
Other languages
Japanese (ja)
Inventor
Katsuhide Tsukamoto
勝秀 塚本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP10053785A priority Critical patent/JPH11251370A/en
Publication of JPH11251370A publication Critical patent/JPH11251370A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/11Manufacturing methods
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/118Post-treatment of the bump connector
    • H01L2224/1182Applying permanent coating, e.g. in-situ coating
    • H01L2224/11822Applying permanent coating, e.g. in-situ coating by dipping, e.g. in a solder bath
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H01L2224/13001Core members of the bump connector
    • H01L2224/13099Material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01004Beryllium [Be]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Wire Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To shorten process time and to considerably reduce the amount of used conductive adhesive, by forming conductive adhesive on the surface of a plate, and forming the conductive adhesive of prescribed thickness on bumps formed on a device. SOLUTION: The layer 103 of conductive adhesive is formed on a plate 101 whose surface is plane in a pattern form corresponding to bumps by using the trace supply device 102 of conductive adhesive. A semiconductor chip 201 with bumps 202 is pushed into the layer 103 of conductive adhesive. Then, the semiconductor chip 201 is pulled up and the bumps 202 are detached from the layer of conductive adhesive. The bumps 202 to which prescribed amount of conductive adhesive 107 is adhered are formed and they are used for loading the semiconductor chip 201 on a circuit board. Then, conductive adhesive left on the plate 101 is scratched away. Then, conductive adhesive using solvent whose boiling point is low can be used and therefore process time can be shortened.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体デバイスな
どを電気的に接合するためにデバイス上に形成したバン
プに導電性接着剤の供給方法と供給装置及びチップマウ
ンタに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for supplying a conductive adhesive to bumps formed on a device for electrically connecting a semiconductor device or the like, and a chip mounter.

【0002】[0002]

【従来の技術】半導体チップの実装方法に最近はフリッ
プチップ実装する方法が注目されてきている。裸の半導
体チップのパッド(電極端子)に電気的導体の突起(バ
ンプ)を形成し、このバンプと回路基板上の電極とを電
気的に接合する方法である。
2. Description of the Related Art In recent years, attention has been paid to a flip chip mounting method as a semiconductor chip mounting method. In this method, a projection (bump) of an electric conductor is formed on a pad (electrode terminal) of a bare semiconductor chip, and the bump is electrically connected to an electrode on a circuit board.

【0003】従来のQFP(Quad Flat Package)のように
リードのついたパッケージに比較して小さく実装できる
ことや配線が短くなるために高速動作に適している等の
ために最近はこの技術の開発が著しい。フリップチップ
実装技術の中でスタッドバンプボンディング(Stud Bum
p Bonding)による実装は信頼性が高く実用化も始まっ
ている。
Recently, this technology has been developed because it can be mounted smaller than a package with leads like a conventional QFP (Quad Flat Package), and is suitable for high-speed operation because of shorter wiring. Remarkable. Stud bump bonding (Stud Bum)
Mounting with p bonding is highly reliable and practical use has begun.

【0004】図2(A)〜(C)にスタッドバンプボン
ディング技術によるフリップチップ実装のプロセスを示
す。この方法は文献トムラ ヨシヒロら「アドヴァンス
ドフリップ チップ ボンディング テクニック フォ
ア エムシーエムーエル」(Yoshihiro Tomura et. al,
"Advanced Flip Chip Bonding Technique For MCM-
L"), 1996 プロシーディング オブ ファースト パン
パシフック マイクロエレクトロニクス シンポジウ
ム(Proceedings of First Pan Pacific Microelectroni
cs Symposium), p125-131 (1996) に開示されている。
この方法は、バンプ上に導電性接着剤を供給することを
基本としている。図2(A)〜(C)において半導体チ
ップ201にはバンプ202が形成されている。第1のステッ
プとして、表面に浅い堀込み204のあるプレート203に、
スキージ205を用いて導電性接着剤206を、堀込み204が
いっぱいでかつ平面になるように入れる(図2
(A))。次に第2のステップで半導体チップ上のバン
プ202を上記プレート205上の導電性接着剤の層206に浸
け接触させる(図2(B))。第3のステップとして半
導体チップ201を引き上げてバンプ202表面に導電性接着
剤部207を付着させる(図2(C))。このようにし
て、導電性接着剤部207が所定量付着したバンプ202を形
成し、この半導体チップ201を回路基板(図示せず)に
搭載するのに用いる。その後に次の半導体チップのため
に第1ステップからくり返す。表面に浅い堀込み204の
あるプレート203を使わずに平坦なプレートと表面から
所望の距離だけ離したスキージにより導電性接着剤の層
を作る方法もある。
FIGS. 2A to 2C show a flip-chip mounting process using a stud bump bonding technique. This method is described in the literature, Tomura Yoshihiro et al., "Advanced Flip Chip Bonding Technique for MC Emuel" (Yoshihiro Tomura et. Al,
"Advanced Flip Chip Bonding Technique For MCM-
L "), 1996 Proceedings of First Pan Pacific Microelectroni
cs Symposium), p125-131 (1996).
This method is based on supplying a conductive adhesive on the bump. 2A to 2C, a semiconductor chip 201 has a bump 202 formed thereon. As a first step, a plate 203 with a shallow trench 204
The squeegee 205 is used to insert the conductive adhesive 206 so that the trench 204 is full and flat (FIG. 2).
(A)). Next, in a second step, the bumps 202 on the semiconductor chip are immersed in contact with the conductive adhesive layer 206 on the plate 205 (FIG. 2B). As a third step, the semiconductor chip 201 is pulled up and a conductive adhesive 207 is attached to the surface of the bump 202 (FIG. 2C). In this manner, bumps 202 having a predetermined amount of conductive adhesive 207 attached thereto are formed, and are used to mount semiconductor chip 201 on a circuit board (not shown). Thereafter, the first step is repeated for the next semiconductor chip. There is also a method of forming a conductive adhesive layer by using a flat plate and a squeegee at a desired distance from the surface without using the plate 203 having a shallow trench 204 on the surface.

【0005】[0005]

【発明が解決しようとする課題】前記従来の方法は非常
に簡単であるが、一方において大きな問題を抱えてい
る。バンプ上への導電性接着剤の供給を安定して行うた
めには、作業時間中導電性接着剤の性状は変わらないこ
とが要求される。ところが、上記方法は導電性接着剤を
薄くスキージで平面状に広げるために乾燥しやすく、作
業時間中、導電性接着剤の性状を一定不変に保つことは
難しい。できるだけ一定に保つために導電性接着剤に使
用する溶剤は沸点の高いものを用いている。しかしそう
すると、当然のことであるが次の工程で半導体チップを
回路基板に搭載し、導電性接着剤を乾燥する時に乾燥時
間が長くなってしまう。例えば、沸点が250℃位の溶剤
を用いれば乾燥に2時間ぐらいは必要になる。この時間
は工程上大きな障害になる。すなわち、時間がかかり過
ぎて生産性が悪くなる。また、バッチ処理が必要にな
り、量産において工程のインライン化を阻害する。ま
た、広げた導電性接着剤を使い切る前に導電性接着剤の
性状が変わってしまうために、導電性接着剤の利用率が
悪く、大部分を捨ててしまっているという問題がある。
Although the above conventional method is very simple, it has a major problem. In order to stably supply the conductive adhesive onto the bump, it is required that the properties of the conductive adhesive do not change during the operation time. However, in the above method, since the conductive adhesive is thinly spread in a plane with a squeegee, it is easy to dry, and it is difficult to keep the property of the conductive adhesive constant during operation time. The solvent used for the conductive adhesive has a high boiling point in order to keep it as constant as possible. However, in that case, as a matter of course, the drying time becomes longer when the semiconductor chip is mounted on the circuit board in the next step and the conductive adhesive is dried. For example, if a solvent having a boiling point of about 250 ° C. is used, it takes about 2 hours for drying. This time becomes a major obstacle in the process. In other words, it takes too much time and productivity is deteriorated. Also, batch processing is required, which hinders in-line processing in mass production. In addition, since the properties of the conductive adhesive are changed before the expanded conductive adhesive is used up, there is a problem that the utilization rate of the conductive adhesive is poor and most of the conductive adhesive is discarded.

【0006】本発明は、前記従来の問題を解決するた
め、沸点の低い溶剤を混合した導電性接着剤を使用で
き、そのために工程時間が短くなりまた使用する導電性
接着剤の量を極端に減らせることができる導電性接着剤
の供給方法と供給装置及びチップマウンタを提供する。
According to the present invention, in order to solve the above-mentioned conventional problems, a conductive adhesive mixed with a solvent having a low boiling point can be used, so that the process time is shortened and the amount of the conductive adhesive used is extremely reduced. Provided are a method and apparatus for supplying a conductive adhesive that can be reduced, and a chip mounter.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
に、本発明の導電接着剤の供給方法は、デバイスのバン
プ表面に所定の形状の導電性接着剤を形成する方法にお
いて、プレートの表面に導電接着剤を微量供給装置を用
いて所定のパターン状に供給して導電接着剤層を形成
し、前記導電性接着剤層にデバイス上に形成したバンプ
を接触させて、バンプ上に所定の厚みの導電接着剤部を
形成することを特徴とする。
In order to achieve the above object, a method of supplying a conductive adhesive according to the present invention is a method for forming a conductive adhesive having a predetermined shape on a bump surface of a device. A conductive adhesive is supplied in a predetermined pattern using a micro-supply device to form a conductive adhesive layer, and a bump formed on a device is brought into contact with the conductive adhesive layer, and a predetermined It is characterized in that a conductive adhesive portion having a thickness is formed.

【0008】前記方法においては、プレートの表面が、
平面または曲面であることが好ましい。また前記方法に
おいては、導電接着剤の微量供給装置が、塗布前の導電
接着剤を密閉しておく貯留部を有することが好ましい。
また前記方法においては、デバイス上に形成したバンプ
に導電性接着剤を供給した後に、プレート上の導電性接
着剤を除去し、次いで微量供給装置にて新しい導電性接
着剤をパターン状に供給することが好ましい。
In the above method, the surface of the plate is:
It is preferably flat or curved. Further, in the above method, it is preferable that the device for supplying a small amount of the conductive adhesive has a storage section for sealing the conductive adhesive before application.
Further, in the above method, after supplying the conductive adhesive to the bumps formed on the device, the conductive adhesive on the plate is removed, and then a new conductive adhesive is supplied in a pattern by a micro supply device. Is preferred.

【0009】次に本発明の導電性接着剤の供給装置は、
デバイスのバンプ表面に所定の形状の導電性接着剤を形
成する装置において、プレートの表面に導電接着剤を所
定のパターン状に供給して導電接着剤層を形成するため
の微量供給装置と、デバイス上に形成したバンプを導電
性接着剤の層に接触させる手段と、バンプを導電性接着
剤の層から離す手段と、残った導電性接着剤をナイフエ
ッジで掻き取る手段とを含むことを特徴とする。
Next, an apparatus for supplying a conductive adhesive according to the present invention comprises:
A device for forming a conductive adhesive of a predetermined shape on a bump surface of a device, a micro-supply device for forming a conductive adhesive layer by supplying a conductive adhesive in a predetermined pattern on a surface of a plate, and a device Means for contacting the bump formed on the layer of conductive adhesive, means for separating the bump from the layer of conductive adhesive, and means for scraping off the remaining conductive adhesive with a knife edge. And

【0010】前記装置においては、プレートの表面が、
平面または曲面であることが好ましい。また前記装置に
おいては、導電接着剤の微量供給装置が、塗布前の導電
接着剤を密閉しておく貯留部を有することが好ましい。
In the above apparatus, the surface of the plate is:
It is preferably flat or curved. Further, in the above device, it is preferable that the device for supplying a small amount of the conductive adhesive has a storage section for sealing the conductive adhesive before application.

【0011】次に本発明の導電性接着剤の供給装置を内
蔵するチップマウンタは、デバイスのバンプ表面に所定
の形状の導電性接着剤を形成するチップマウンタにおい
て、プレートの表面に導電接着剤を所定のパターン状に
供給して導電接着剤層を形成するための微量供給装置
と、デバイス上に形成したバンプを導電性接着剤の層に
接触させる手段と、バンプを導電性接着剤の層から離す
手段と、残った導電性接着剤をナイフエッジで掻き取る
手段とを含むことを特徴とする。
Next, a chip mounter incorporating the conductive adhesive supply device of the present invention is a chip mounter for forming a conductive adhesive having a predetermined shape on a bump surface of a device. A micro-supply device for supplying a predetermined pattern to form a conductive adhesive layer, means for contacting the bump formed on the device with the conductive adhesive layer, and a method for transferring the bump from the conductive adhesive layer It is characterized by including means for separating and means for scraping off the remaining conductive adhesive with a knife edge.

【0012】前記構成を有することにより、沸点の低い
溶剤を混合した導電性接着剤を使用でき、そのために工
程時間が短くなりまた使用する導電性接着剤の量を極端
に減らせることができる導電性接着剤の供給方法と供給
装置及びチップマウンタを提供できる。
With the above-mentioned structure, a conductive adhesive mixed with a solvent having a low boiling point can be used, and therefore the process time can be shortened and the amount of the conductive adhesive used can be extremely reduced. A method and apparatus for supplying a conductive adhesive and a chip mounter can be provided.

【0013】[0013]

【発明の実施の形態】以下、本発明の一実施の形態につ
いて、図面を用いてより具体的に説明する。図1(A)
に示すように本発明においては、第1ステップとして、
表面が平面のプレート101の上に、導電性接着剤104の微
量供給装置102を用いてバンプに対応したパターン状に
導電性接着剤の層103を形成する。厚さは、バンプの高
さの半分位で、バンプの高さが40μm位のとき、導電
性接着剤の層103の厚さは15〜25μm程度が好まし
い。微量供給装置102は密閉型の貯留部をもち、この中
に導電性接着剤を貯留しているので、200℃以下の沸
点の溶剤を用いても揮発を防ぐことができる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below more specifically with reference to the drawings. FIG. 1 (A)
As shown in the following, in the present invention, as a first step,
A conductive adhesive layer 103 is formed on a flat surface of a plate 101 using a small amount supply device 102 of a conductive adhesive 104 in a pattern corresponding to the bumps. The thickness is about half the height of the bump, and when the height of the bump is about 40 μm, the thickness of the conductive adhesive layer 103 is preferably about 15 to 25 μm. Since the micro-supply device 102 has a closed storage portion in which the conductive adhesive is stored, volatilization can be prevented even if a solvent having a boiling point of 200 ° C. or lower is used.

【0014】次に第2ステップとして、バンプ202のつ
いた半導体チップ201を導電性接着剤の層103に接触さ
せ、バンプ202を導電性接着剤の層103に押し込む(図1
(B))。第3ステップとして、半導体チップ201を引
き上げ、バンプ202を導電性接着剤の層から離す(図1
(C))。このようにして、導電性接着剤部107が所定
量付着したバンプ202を形成し、この半導体チップ201を
回路基板(図示せず)に搭載するのに用いる。導電性接
着剤107部の付着量は、バンプの先端から数μm〜5μ
mくらい付着するのが好ましい。
Next, as a second step, the semiconductor chip 201 having the bumps 202 is brought into contact with the conductive adhesive layer 103, and the bumps 202 are pushed into the conductive adhesive layer 103 (FIG. 1).
(B)). As a third step, the semiconductor chip 201 is lifted and the bump 202 is separated from the conductive adhesive layer (FIG. 1).
(C)). In this way, the bump 202 to which the conductive adhesive portion 107 is adhered by a predetermined amount is formed, and this semiconductor chip 201 is used for mounting on a circuit board (not shown). The adhesion amount of the conductive adhesive 107 parts is several μm to 5 μm from the tip of the bump.
m.

【0015】第4ステップとして、プレート101上に残
った導電性接着剤103をナイフエッジ106で掻き取り、掻
き取った残存導電性接着剤105は捨てる(図1
(D))。導電性接着剤の微量供給装置102としては、
突出量の制御が容易なディスペンサーが好ましい。突出
量並びにニードル先端とプレート間の距離並びに送り速
度を調節することにより、導電性接着剤の層の厚みを制
御することができる。この厚みは、バンプを接触させて
導電性接着剤を転写(供給)する際に導電性接着剤の量
に関係し、均一な供給をするために厳しく管理する必要
がある。ディスペンサーでプレート上に導電性接着剤を
供給する本実施形態の方法によれば、層の厚みを精度よ
く管理できる。例えば従来法のスキージを用いる方法
(層の厚みの変動±数μm)と同程度の管理は簡単に行
える。
As a fourth step, the conductive adhesive 103 remaining on the plate 101 is scraped with a knife edge 106, and the scraped remaining conductive adhesive 105 is discarded (FIG. 1).
(D)). As the conductive adhesive micro-supply device 102,
A dispenser that can easily control the amount of protrusion is preferable. The thickness of the conductive adhesive layer can be controlled by adjusting the amount of protrusion, the distance between the needle tip and the plate, and the feed speed. This thickness is related to the amount of the conductive adhesive when transferring (supplying) the conductive adhesive by contacting the bumps, and must be strictly controlled for uniform supply. According to the method of the present embodiment in which the conductive adhesive is supplied onto the plate by the dispenser, the thickness of the layer can be accurately controlled. For example, the same level of management as the conventional method using a squeegee (fluctuation in layer thickness ± several μm) can be easily performed.

【0016】また、導電性接着剤がプレート上に供給さ
れるまでは密閉された容器内に保持されているために、
溶剤が揮発することなくその性状が変化することがな
い。例えば、沸点が160〜200℃位までのエステル
系やケトン系の溶剤を用いることができる。このような
溶剤であれば、乾燥は10分程度で行うことができる。
従って乾燥工程のインライン化(またはオンライン化)
が可能になる。もっと沸点の低い溶剤を用いて導電性接
着剤を作成することもできるが、乾燥が速すぎて微量の
供給が困難になる傾向となる。
Further, since the conductive adhesive is held in a sealed container until it is supplied onto the plate,
The solvent does not evaporate and its properties do not change. For example, an ester or ketone solvent having a boiling point of about 160 to 200 ° C. can be used. With such a solvent, drying can be performed in about 10 minutes.
Therefore, in-line (or on-line) drying process
Becomes possible. Although a conductive adhesive can be prepared using a solvent having a lower boiling point, drying tends to be too fast and it becomes difficult to supply a small amount.

【0017】上記の例では表面が平面のプレートを用い
たが必ずしも平面である必要はない。円筒の表面を使っ
てもよい。回転運動が使えるために装置を安価にするこ
とができる。このときはもちろんバンプの先端の包絡面
は円筒の面にフィットする必要がある。二列に並んだバ
ンプなどがこれにあたる。バンプ先端の包絡面が平面で
あっても円筒を転がすことにより目的は達せられる。上
記の例ではバンプに導電性接着剤を供給する毎に残った
導電性接着剤を掻き取ってしまうとしたが、必ずしもそ
うではなく導電性接着剤の性状が変化しない限り何回も
転写(供給)する事ができる。一度バンプを接触させて
導電性接着剤の表面の凹んだところを避けて次の半導体
チップのバンプを接触させればよい。また、図1では導
電性接着剤のパターンを連続した導電性接着剤の層とし
て説明したが、バンプの位置に対応したドット状として
もよい。本発明の導電性接着剤供給方法は少なくとも上
記に説明したステップを実行する導電性接着剤供給装置
により実現できる。そのような装置は単独で導電性接着
剤の層を作るだけの装置であることもあるが、チップマ
ウンタに併設されていてもよい。以上の説明において導
電性接着剤を供給する対象のデバイスとして半導体チッ
プのみをとりあげたが、必ずしもこれらに限られること
なく、チップコンデンサーやチップ抵抗等にも応用でき
る。また、高密度実装のためにチップコンデンサーやチ
ップ抵抗にバンプを形成する際にも応用できる。
In the above example, a plate having a flat surface is used, but the plate need not always be flat. A cylindrical surface may be used. The device can be inexpensive because rotational motion is available. In this case, the envelope surface at the tip of the bump must fit the surface of the cylinder. Two rows of bumps correspond to this. Even if the envelope surface at the tip of the bump is flat, the object can be achieved by rolling the cylinder. In the above example, the remaining conductive adhesive was scraped off every time the conductive adhesive was supplied to the bumps. However, this is not always the case, and the transfer (supply) is performed many times unless the properties of the conductive adhesive change. ) Can do it. The bump may be once contacted to avoid the recessed portion on the surface of the conductive adhesive, and then contact the bump of the next semiconductor chip. Further, in FIG. 1, the pattern of the conductive adhesive is described as a continuous layer of the conductive adhesive, but may be a dot shape corresponding to the position of the bump. The conductive adhesive supply method of the present invention can be realized by a conductive adhesive supply device that performs at least the steps described above. Such an apparatus may be an apparatus that only forms a layer of a conductive adhesive by itself, or may be provided alongside a chip mounter. In the above description, only the semiconductor chip is taken as the device to which the conductive adhesive is supplied, but the present invention is not necessarily limited to these, and can be applied to chip capacitors, chip resistors, and the like. Further, it can be applied to forming bumps on chip capacitors and chip resistors for high-density mounting.

【0018】[0018]

【発明の効果】以上説明したように本発明によれば、使
用する導電性接着剤の量を極端に減らせると同時に沸点
の低い溶剤を用いた導電性接着剤を使用でき、そのため
に工程時間が短くする事ができる。
As described above, according to the present invention, the amount of the conductive adhesive to be used can be extremely reduced, and at the same time, the conductive adhesive using a solvent having a low boiling point can be used. Can be shortened.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 A〜Dは本発明の一実施の形態の導電性接着
剤供給方法を説明する工程断面図。
FIGS. 1A to 1D are process cross-sectional views illustrating a method for supplying a conductive adhesive according to an embodiment of the present invention.

【図2】 A〜Cは従来の導電性接着剤供給方法を説明
する工程断面図。
FIGS. 2A to 2C are process cross-sectional views illustrating a conventional conductive adhesive supply method.

【符号の説明】[Explanation of symbols]

101 プレート 102 導電性接着剤の微量供給装置 103 パターン状に形成した導電性接着剤の層 104 導電性接着剤 105 残存導電性接着剤 106 ナイフエッジ 107 導電性接着剤部 201 半導体チップ 202 バンプ 203 プレート 204 浅い堀込み 205 スキージ 206 導電性接着剤層 207 導電性接着剤部 DESCRIPTION OF SYMBOLS 101 Plate 102 Conductive adhesive small amount supply apparatus 103 Patterned conductive adhesive layer 104 Conductive adhesive 105 Remaining conductive adhesive 106 Knife edge 107 Conductive adhesive part 201 Semiconductor chip 202 Bump 203 Plate 204 Shallow engraving 205 Squeegee 206 Conductive adhesive layer 207 Conductive adhesive part

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 デバイスのバンプ表面に所定の形状の導
電性接着剤を形成する方法において、プレートの表面に
導電接着剤を微量供給装置を用いて所定のパターン状に
供給して導電接着剤層を形成し、前記導電性接着剤層に
デバイス上に形成したバンプを接触させて、バンプ上に
所定の厚みの導電接着剤部を形成することを特徴とする
導電接着剤の供給方法。
1. A method for forming a conductive adhesive in a predetermined shape on a bump surface of a device, comprising supplying a conductive adhesive to a surface of a plate in a predetermined pattern using a minute supply device. Forming a conductive adhesive portion having a predetermined thickness on the bump by contacting the conductive adhesive layer with a bump formed on a device.
【請求項2】 プレートの表面が、平面または曲面であ
る請求項1に記載の導電接着剤の供給方法。
2. The method according to claim 1, wherein the surface of the plate is flat or curved.
【請求項3】 導電接着剤の微量供給装置が、塗布前の
導電接着剤を密閉しておく貯留部を有する請求項1に記
載の導電接着剤の供給方法。
3. The method for supplying a conductive adhesive according to claim 1, wherein the device for supplying a small amount of the conductive adhesive has a storage section for sealing the conductive adhesive before application.
【請求項4】 デバイス上に形成したバンプに導電性接
着剤を供給した後に、プレート上の導電性接着剤を除去
し、次いで微量供給装置にて新しい導電性接着剤をパタ
ーン状に供給する請求項1に記載の導電接着剤の供給方
法。
4. A method of supplying a conductive adhesive to a bump formed on a device, removing the conductive adhesive on a plate, and then supplying a new conductive adhesive in a pattern by a micro supply device. Item 4. A method for supplying a conductive adhesive according to Item 1.
【請求項5】 デバイスのバンプ表面に所定の形状の導
電性接着剤を形成する装置において、プレートの表面に
導電接着剤を所定のパターン状に供給して導電接着剤層
を形成するための微量供給装置と、デバイス上に形成し
たバンプを導電性接着剤の層に接触させる手段と、バン
プを導電性接着剤の層から離す手段と、残った導電性接
着剤をナイフエッジで掻き取る手段とを含むことを特徴
とする導電性接着剤の供給装置。
5. An apparatus for forming a conductive adhesive having a predetermined shape on a surface of a bump of a device, wherein the conductive adhesive is supplied to the surface of a plate in a predetermined pattern to form a conductive adhesive layer. A supply device, means for contacting the bump formed on the device with the conductive adhesive layer, means for separating the bump from the conductive adhesive layer, and means for scraping off the remaining conductive adhesive with a knife edge; A supply device for a conductive adhesive, comprising:
【請求項6】 プレートの表面が、平面または曲面であ
る請求項5に記載の導電接着剤の供給装置。
6. The conductive adhesive supply device according to claim 5, wherein the surface of the plate is flat or curved.
【請求項7】 導電接着剤の微量供給装置が、塗布前の
導電接着剤を密閉しておく貯留部を有する請求項5に記
載の導電接着剤の供給装置。
7. The conductive adhesive supply apparatus according to claim 5, wherein the conductive adhesive minute supply apparatus has a storage section for sealing the conductive adhesive before application.
【請求項8】 デバイスのバンプ表面に所定の形状の導
電性接着剤を形成するチップマウンタにおいて、プレー
トの表面に導電接着剤を所定のパターン状に供給して導
電接着剤層を形成するための微量供給装置と、デバイス
上に形成したバンプを導電性接着剤の層に接触させる手
段と、バンプを導電性接着剤の層から離す手段と、残っ
た導電性接着剤をナイフエッジで掻き取る手段とを含む
ことを特徴とする導電性接着剤の供給装置を内蔵するチ
ップマウンタ。
8. A chip mounter for forming a conductive adhesive of a predetermined shape on a bump surface of a device, wherein the conductive adhesive is supplied to the surface of a plate in a predetermined pattern to form a conductive adhesive layer. A micro-supply device, means for contacting the bump formed on the device with the conductive adhesive layer, means for separating the bump from the conductive adhesive layer, and means for scraping off the remaining conductive adhesive with a knife edge A chip mounter incorporating a conductive adhesive supply device, comprising:
JP10053785A 1998-03-05 1998-03-05 Method and device for supplying conductive adhesive and chip mounter Pending JPH11251370A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10053785A JPH11251370A (en) 1998-03-05 1998-03-05 Method and device for supplying conductive adhesive and chip mounter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10053785A JPH11251370A (en) 1998-03-05 1998-03-05 Method and device for supplying conductive adhesive and chip mounter

Publications (1)

Publication Number Publication Date
JPH11251370A true JPH11251370A (en) 1999-09-17

Family

ID=12952485

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10053785A Pending JPH11251370A (en) 1998-03-05 1998-03-05 Method and device for supplying conductive adhesive and chip mounter

Country Status (1)

Country Link
JP (1) JPH11251370A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103325697A (en) * 2012-03-22 2013-09-25 南茂科技股份有限公司 Semiconductor packaging structure and manufacturing method thereof
US8551275B2 (en) 2005-03-30 2013-10-08 Brother Kogyo Kabushiki Kaisha Adhesive application method and terminal joining method
KR20190062667A (en) * 2017-11-28 2019-06-07 삼성디스플레이 주식회사 Display device and method for manufacturing the same

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8551275B2 (en) 2005-03-30 2013-10-08 Brother Kogyo Kabushiki Kaisha Adhesive application method and terminal joining method
CN103325697A (en) * 2012-03-22 2013-09-25 南茂科技股份有限公司 Semiconductor packaging structure and manufacturing method thereof
KR20190062667A (en) * 2017-11-28 2019-06-07 삼성디스플레이 주식회사 Display device and method for manufacturing the same
KR20220124133A (en) * 2017-11-28 2022-09-13 삼성디스플레이 주식회사 Display device

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