JPH11226863A - Surface polishing device with work fluid removing mechanism and work fluid removing method - Google Patents

Surface polishing device with work fluid removing mechanism and work fluid removing method

Info

Publication number
JPH11226863A
JPH11226863A JP4433498A JP4433498A JPH11226863A JP H11226863 A JPH11226863 A JP H11226863A JP 4433498 A JP4433498 A JP 4433498A JP 4433498 A JP4433498 A JP 4433498A JP H11226863 A JPH11226863 A JP H11226863A
Authority
JP
Japan
Prior art keywords
work
surface plate
water absorbing
working fluid
absorbing head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4433498A
Other languages
Japanese (ja)
Inventor
Shiyunji Hakomori
守 駿 二 箱
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SpeedFam Co Ltd
Original Assignee
SpeedFam Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SpeedFam Co Ltd filed Critical SpeedFam Co Ltd
Priority to JP4433498A priority Critical patent/JPH11226863A/en
Publication of JPH11226863A publication Critical patent/JPH11226863A/en
Pending legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable a work fluid of polishing fluid, rinse fluid, etc., left on a work surface of a surface plate to be removed easily and automatically. SOLUTION: A suction water head 17 of a work fluid removing mechanism 6 set up in a surface polishing device is connected to a suction pump 22, the suction water head 17 is brought into contact with a work surface of a surface plate 2 after a work-finished workpiece is removed, the surface plate 2 is rotated, also while moving the suction water head 17 in the radial direction of the surface plate, a work fluid on the work surface is sucked by the suction pump 22.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体ウエハや磁
気ディスク基板のような実質的に平板形をしたワークを
表面研磨するための研磨装置において、ワークの加工終
了後に定盤の作業面に残留する加工液を除去するための
手段に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing apparatus for polishing the surface of a substantially flat work such as a semiconductor wafer or a magnetic disk substrate. The present invention relates to a means for removing a working fluid to be removed.

【0002】[0002]

【従来の技術】例えば、半導体ウエハの表面を研磨する
ポリッシング装置等の表面研磨装置においては、研磨が
終了したあとウエハを取り出す際に該ウエハの表面が乾
燥したり酸化等の化学変化を起こし易いため、研磨終了
時に純水等のリンス液を供給してウエハを洗浄したり表
面を濡らすなどしたあと取り出すようにしている。
2. Description of the Related Art For example, in a surface polishing apparatus such as a polishing apparatus for polishing the surface of a semiconductor wafer, when the wafer is taken out after polishing is completed, the surface of the wafer is liable to dry or undergo chemical changes such as oxidation. Therefore, at the end of polishing, a rinse liquid such as pure water is supplied to clean the wafer or wet the surface, and then take out the wafer.

【0003】上記ウエハの取り出しが完了すると、各キ
ャリヤに次の未加工ウエハが供給されて再び研磨が行わ
れるが、その際、リンス液が定盤の作業面上に残留して
いると、ウエハが浮き上がって横滑りし易いため、キャ
リヤの保持穴内にうまく収容されずに該保持穴からはみ
出したり、加工開始時にキャリヤから飛び出して破損す
る恐れがある。
[0003] When the removal of the wafer is completed, the next unprocessed wafer is supplied to each carrier and polishing is performed again. At this time, if the rinsing liquid remains on the work surface of the platen, the wafer is removed. Is easily lifted and slides sideways, so that it may not be well accommodated in the holding hole of the carrier and may protrude from the holding hole, or may jump out of the carrier at the start of processing and be damaged.

【0004】そこで従来では、スポンジや布等の吸水性
のある素材を使用して手作業で液を拭き取っていたが、
非能率的で多くの手間と時間とが必要であった。しか
も、研磨剤が混じったリンス液で手や衣服が汚染され易
いなど、衛生的な面でも問題があった。
Therefore, conventionally, the liquid was manually wiped off using a water-absorbing material such as sponge or cloth.
It was inefficient and required a lot of labor and time. In addition, there is a problem in terms of hygiene, such as that hands and clothes are easily contaminated by a rinse liquid mixed with an abrasive.

【0005】[0005]

【発明が解決しようとする課題】本発明の技術的課題
は、ワークの表面を研磨する表面研磨装置において、定
盤の作業面上に残留する研磨液やリンス液等の加工液を
簡単且つ自動的に除去できるようにすることにある。
A technical object of the present invention is to provide a surface polishing apparatus for polishing a surface of a work, in which a processing liquid such as a polishing liquid or a rinsing liquid remaining on a work surface of a surface plate is simply and automatically processed. In order to be able to be removed.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するた
め、本発明によれば、同心状に位置する太陽歯車及び内
歯歯車と、これら両歯車に噛合して太陽歯車の回りを遊
星運動する複数のワークキャリヤと、該ワークキャリヤ
に保持されたワークを両側から挟んで研磨する上下の定
盤と、研磨部に加工液を供給するための加工液供給機構
と、定盤の作業面に残留する加工液を除去するための加
工液除去機構とを有していて、上記加工液除去機構が、
吸引ポンプに連通する吸水口を備えた吸水ヘッドを有
し、該吸水ヘッドが、定盤面上の加工液を吸い込む吸水
位置と、定盤から離れた待機位置との間を変移自在であ
ることを特徴とする加工液除去機構付き平面研磨装置が
提供される。
According to the present invention, there is provided a sun gear and an internal gear which are concentrically arranged, and meshes with both gears to perform planetary movement around the sun gear. A plurality of work carriers, upper and lower surface plates for polishing the work held by the work carriers from both sides, a processing liquid supply mechanism for supplying a processing liquid to the polishing portion, and a work surface remaining on the work surface of the surface plate. A machining fluid removal mechanism for removing the machining fluid to be removed, and the machining fluid removal mechanism is
A suction head having a water suction port communicating with the suction pump, wherein the water suction head is movable between a water suction position for sucking the processing liquid on the surface of the surface plate and a standby position away from the surface plate. A feature is provided a planar polishing apparatus with a working fluid removing mechanism.

【0007】本発明において上記加工液除去機構におけ
る吸水ヘッドは、定盤の円周方向の定位置において該定
盤の半径方向に移動しながら加工液を吸い込むように構
成されていることが望ましい。また、上記吸水ヘッドに
は、定盤の作業面に当接するブラシを設けることができ
る。
In the present invention, it is desirable that the water absorbing head in the working fluid removing mechanism is configured to suck the working fluid while moving in a radial direction of the base at a fixed position in a circumferential direction of the base. Further, the water absorbing head may be provided with a brush that comes into contact with the work surface of the surface plate.

【0008】本発明の1つの具体的な実施態様によれ
ば、上記加工液除去機構が1組設けられていて、上下に
反転可能な吸水ヘッドを備えることにより、上下両定盤
の作業面上の加工液を吸水可能となっている。
According to one specific embodiment of the present invention, the working fluid removing mechanism is provided in one set, and is provided with a water-absorbing head which can be turned upside down, so that the working surface of the upper and lower stools can be removed. Can absorb the processing fluid.

【0009】本発明の他の具体的な実施態様によれば、
上記加工液除去機構が2組設けられていて、これらの除
去手段によって上下の定盤の作業面上の加工液が個別に
吸水可能となっている。
According to another specific embodiment of the present invention,
Two sets of the above-mentioned machining fluid removing mechanisms are provided, and the machining fluids on the working surfaces of the upper and lower platens can be individually absorbed by these removing means.

【0010】また、本発明の加工液除去方法は、吸引ポ
ンプに通じる吸水口を備えた上記吸水ヘッドを定盤の円
周方向の定位置において該定盤の作業面に当接させ、該
定盤を回転させながら上記吸水ヘッドで作業面上の加工
液を吸い込むことを特徴とするものである。
Further, in the method for removing a working fluid according to the present invention, the water absorbing head provided with a water suction port communicating with a suction pump is brought into contact with a work surface of the surface plate at a fixed position in a circumferential direction of the surface plate. The processing liquid on the work surface is sucked by the water absorbing head while rotating the board.

【0011】この場合、上記吸水ヘッドを定盤の半径方
向に移動させながら加工液を吸い込むようにすることが
望ましい。
In this case, it is desirable to suck the working fluid while moving the water absorbing head in the radial direction of the surface plate.

【0012】このように本発明によれば、定盤の作業面
上に残留する研磨液やリンス液等の加工液を、吸引ポン
プに通じる吸水ヘッドによって簡単且つ自動的に除去す
ることができる。このため除去効率が非常に良いばかり
でなく、加工液が手や衣服に付着することがないため安
全且つ衛生的である。
As described above, according to the present invention, the processing liquid such as the polishing liquid and the rinsing liquid remaining on the work surface of the platen can be easily and automatically removed by the water suction head connected to the suction pump. For this reason, not only the removal efficiency is very good, but also the processing liquid does not adhere to hands or clothes, so that it is safe and sanitary.

【0013】[0013]

【発明の実施の形態】図1は本発明に係る平面研磨装置
の一例を示すもので、この研磨装置は、定盤の作業面に
残留する研磨液やリンス液等の加工液を除去するための
加工液除去機構6が付設されている点を除けば、公知の
研磨装置と実質的に同じ構成を持つものである。即ち、
1は機体、2は該機体1上の定位置に回転自在に配設さ
れた下定盤、3は該下定盤2の上方に昇降自在且つ回転
自在なるように配設された上定盤、4は上記下定盤2の
中心部に位置する回転自在の太陽歯車、5は下定盤2の
外周を取り囲む回転自在の内歯歯車である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an example of a planar polishing apparatus according to the present invention. This polishing apparatus removes a processing liquid such as a polishing liquid or a rinsing liquid remaining on a work surface of a surface plate. It has substantially the same configuration as a known polishing apparatus except that a machining fluid removing mechanism 6 is provided. That is,
1 is an airframe, 2 is a lower surface plate rotatably arranged at a fixed position on the airframe 1, 3 is an upper surface plate arranged above the lower surface plate 2 so as to be able to move up and down and rotate freely, 4 Reference numeral denotes a rotatable sun gear located at the center of the lower stool 2, and reference numeral 5 denotes a rotatable internal gear surrounding the outer periphery of the lower stool 2.

【0014】上記下定盤2及び両歯車4,5は、図示し
ない駆動源に接続されて所要の方向に所要の速度で駆動
されるようになっており、一方上定盤3は、ワークWを
研磨するための下降位置においてフック7がドライバ8
の外周の溝に係合し、このドライバ8を介して図示しな
い駆動源により所要の方向に所要の速度で駆動されるよ
うになっている。図中9は上定盤3を昇降させるための
エアシリンダである。
The lower platen 2 and the two gears 4 and 5 are connected to a drive source (not shown) so that the lower platen 2 is driven at a required speed in a required direction. In the lowered position for polishing, the hook 7 is
, And is driven at a required speed in a required direction by a drive source (not shown) via the driver 8. In the figure, reference numeral 9 denotes an air cylinder for moving the upper stool 3 up and down.

【0015】上記下定盤2上には、図3からも分かるよ
うに、外周にギヤ10aを有する複数のワークキャリヤ
10が太陽歯車4を取り囲んで等間隔に配設され、これ
らのワークキャリヤ10は外周のギヤ10aで太陽歯車
4と内歯歯車5とに噛合し、両歯車4,5の回転により
自転しながら太陽歯車4の回りを公転するようになって
いる。そして、遊星運動する各キャリヤ10のワーク保
持穴10b内に収容されたワークWの両面が、回転する
上下の定盤2,3の作業面に貼着された研磨パッド11
によって研磨加工されるように構成されている。
As can be seen from FIG. 3, a plurality of work carriers 10 having a gear 10a on the outer periphery are arranged at equal intervals around the sun gear 4 on the lower surface plate 2, as shown in FIG. The outer gear 10 a meshes with the sun gear 4 and the internal gear 5, and revolves around the sun gear 4 while rotating by rotation of the two gears 4, 5. Then, both surfaces of the work W accommodated in the work holding holes 10b of the respective carriers 10 that move in the planetary motion are polished to the polishing pads 11 adhered to the working surfaces of the rotating upper and lower platens 2 and 3.
It is configured to be polished.

【0016】上記上定盤3には、ワークWに研磨液及び
リンス液を供給するための加工液供給機構13が付設さ
れている。この加工液供給機構13は、上定盤3の作業
面に開口する給液口14から、給液源に通じる樋15及
び給液チューブ16を通じてワークWに研磨液又はリン
ス液を選択的に供給するもので、研磨液による研磨加工
が行われたあと、リンス液が供給されるようになってい
る。
The upper surface plate 3 is provided with a processing liquid supply mechanism 13 for supplying a polishing liquid and a rinsing liquid to the work W. The machining liquid supply mechanism 13 selectively supplies a polishing liquid or a rinsing liquid to the workpiece W from a liquid supply port 14 opened on a work surface of the upper surface plate 3 through a gutter 15 and a liquid supply tube 16 communicating with a liquid supply source. After the polishing with the polishing liquid is performed, a rinse liquid is supplied.

【0017】上記機体1には、定盤2,3の作業面(パ
ッド面)に残留する加工液を除去するための上記加工液
除去機構6が設けられている。この実施例における加工
液除去機構6は、下定盤2上の加工液を除去するための
もので、図2からも分かるように、1つ又は複数の吸水
口18を下面の吸水面17aに備えた吸水ヘッド17を
有し、この吸水ヘッド17を支持する支持アーム19
を、支持装置20に上下動自在且つ伸縮自在に支持させ
ると共に、該支持アーム19の内部の通孔21を通じて
上記吸水口18を吸引ポンプ22に接続したもので、上
記支持アーム19の昇降及び伸縮によって上記吸水ヘッ
ド17が、下定盤2上の加工液を吸い込む吸水位置(図
2に示す位置)と、下定盤2から離れた待機位置(図1
に示す位置)との間を変移自在となっている。そして、
上記吸水位置においては、吸水ヘッド17の下面の吸水
面17aを下定盤2の作業面に接触させた状態で、該下
定盤2の半径方向に移動しながら上記吸水口18から加
工液を吸い取るように構成されている。
The machine body 1 is provided with the machining fluid removing mechanism 6 for removing machining fluid remaining on the work surfaces (pad surfaces) of the surface plates 2 and 3. The working fluid removing mechanism 6 in this embodiment is for removing the working fluid on the lower stool 2, and as shown in FIG. 2, has one or a plurality of water absorbing ports 18 on a lower water absorbing surface 17 a. Arm 19 for supporting the water absorbing head 17
Is supported by a supporting device 20 so as to be vertically movable and extendable and contractable, and the water suction port 18 is connected to a suction pump 22 through a through hole 21 inside the support arm 19. As a result, the water absorption head 17 sucks the processing liquid on the lower surface plate 2 (the position shown in FIG. 2) and the standby position away from the lower surface plate 2 (FIG. 1).
(Position shown in FIG. 2). And
In the water absorbing position, the working fluid is sucked from the water absorbing port 18 while moving in the radial direction of the lower stool 2 with the water absorbing surface 17a of the lower surface of the water absorbing head 17 in contact with the work surface of the lower stool 2. Is configured.

【0018】上記吸水ヘッド17の吸水面17aには、
比較的長さの短いブラシ23が設けられていて、このブ
ラシ23を介して吸水面17aが定盤の作業面に接触す
るようになっており、これにより、該吸水面17aと作
業面との間に吸水用の適度の間隙を確保すると同時に、
パッドの目立ても行うことができる。また、異物が無差
別に吸引されるのを防止することもできる。
The water absorbing surface 17a of the water absorbing head 17 has
A brush 23 having a relatively short length is provided, and the water absorption surface 17a comes into contact with the work surface of the surface plate through the brush 23, whereby the water absorption surface 17a and the work surface are separated. While securing a moderate gap for water absorption between,
Pads can also be dressed. In addition, it is possible to prevent foreign substances from being indiscriminately sucked.

【0019】上記構成を有する研磨装置において、ワー
クWの研磨は、公知の研磨装置と同様にして行われる。
即ち、各ワークキャリヤ10のワークW保持穴10b内
にワークWを保持させ、これらのキャリヤ10を太陽歯
車4及び内歯歯車5の回転により太陽歯車4の回りに遊
星運動させながら、回転する上下の定盤2,3により上
記ワークWを両側から挟んで研磨加工する。このとき研
磨部には、加工液供給機構13から上定盤3を通じて研
磨液が供給される。
In the polishing apparatus having the above configuration, the work W is polished in the same manner as a known polishing apparatus.
That is, the work W is held in the work W holding hole 10 b of each work carrier 10, and the carriers 10 are planetary-moved around the sun gear 4 by the rotation of the sun gear 4 and the internal gear 5, while rotating the upper and lower carriers. The work W is polished by sandwiching the work W from both sides by the surface plates 2 and 3. At this time, the polishing liquid is supplied to the polishing section from the processing liquid supply mechanism 13 through the upper surface plate 3.

【0020】上記研磨液によるワークWの研磨が終了す
ると、加工液供給機構13からの研磨液の供給が停止さ
れ、その代りに純水等のリンス液がワークWに供給され
て研磨液が洗い流されたあと、両定盤2,3及び両歯車
4,5の回転が停止される。そして、上定盤3が上昇
し、図示しないローディング機構により加工済ワークの
搬出が行われる。
When the polishing of the workpiece W by the polishing liquid is completed, the supply of the polishing liquid from the working liquid supply mechanism 13 is stopped, and instead, a rinse liquid such as pure water is supplied to the work W to wash out the polishing liquid. After that, the rotation of both the stools 2 and 3 and the two gears 4 and 5 are stopped. Then, the upper platen 3 is raised, and the processed work is carried out by a loading mechanism (not shown).

【0021】上記加工済ワークの搬出が終了すると、図
2及び図3に示すように、加工液除去機構6における支
持アーム19が伸長して吸水ヘッド17が下定盤2上の
吸水位置に移動し、該吸水ヘッド17に設けられたブラ
シ23が下定盤2の作業面に当接する。そして、下定盤
2がゆっくりとした速度で回転すると共に、吸水ヘッド
17が該下定盤2の半径方向に1回又は複数回移動する
ことにより、作業面上のリンス液が吸水口18から吸い
込まれて除去される。このとき、上記吸水ヘッド17の
下面のブラシ23が、該吸水ヘッド17と下定盤2の作
業面との間に適度の吸引間隙を保つと同時に、作業面上
にあるスラッジ等の異物を除去し、且つ作業面を摺擦し
てパッドの目立てを行う。また、吸引動作が行われてい
る間上記各ワークキャリヤ10は、太陽歯車4及び内歯
歯車5の回転数及び回転方向の制御により定位置におい
て自転のみさせられ、上記吸水ヘッド17による吸水の
邪魔にならないように保持されている。
When the unloading of the processed work is completed, as shown in FIGS. 2 and 3, the support arm 19 of the working fluid removing mechanism 6 is extended, and the water absorbing head 17 moves to the water absorbing position on the lower surface plate 2. The brush 23 provided on the water absorbing head 17 contacts the work surface of the lower stool 2. When the lower platen 2 rotates at a slow speed and the water absorbing head 17 moves once or plural times in the radial direction of the lower platen 2, the rinsing liquid on the work surface is sucked from the water inlet 18. Removed. At this time, the brush 23 on the lower surface of the water absorbing head 17 keeps an appropriate suction gap between the water absorbing head 17 and the work surface of the lower stool 2 and removes foreign substances such as sludge on the work surface. The pad is dressed by rubbing the work surface. Further, while the suction operation is being performed, each of the work carriers 10 is caused to rotate only at a fixed position by controlling the number of rotations and the rotation direction of the sun gear 4 and the internal gear 5, and obstructs water absorption by the water absorption head 17. It is held so that it does not become.

【0022】上記リンス液の吸い込みが完了すると、支
持アーム19が後退して吸水ヘッド17が待機位置に変
移し、各ワークキャリヤ10に未加工ワークが供給され
て次の加工が行われる。
When the suction of the rinsing liquid is completed, the support arm 19 is retracted, the water absorbing head 17 is shifted to the standby position, and the unprocessed work is supplied to each work carrier 10 to perform the next processing.

【0023】上記第1実施例では、加工液除去機構6に
おける吸水ヘッド17が、下定盤2の作業面の幅より小
さく形成されていて、該作業面上を半径方向に移動する
ことによって加工液を吸い込むようになっているが、上
記吸水ヘッド17は作業面の幅と同じ長さに形成するこ
ともでき、これにより、該吸水ヘッドを作業面上に静止
させたまま下定盤2を回転させるだけで加工液を吸い込
むことができる。
In the first embodiment, the water absorbing head 17 of the working fluid removing mechanism 6 is formed to be smaller than the width of the working surface of the lower stool 2, and the working fluid is moved in the radial direction on the working surface. However, the water absorption head 17 can be formed to have the same length as the width of the work surface, whereby the lower platen 2 is rotated while the water absorption head is stationary on the work surface. The working fluid can be sucked in only by itself.

【0024】また、上記実施例では、吸水ヘッド17の
吸水面17aにブラシ23を設けているが、必ずしもこ
のようなブラシ23を設ける必要はなく、適度な高さを
持つ突起を設けることによって吸引間隙を確保するよう
にしても良い。
Further, in the above embodiment, the brush 23 is provided on the water absorbing surface 17a of the water absorbing head 17, but it is not always necessary to provide such a brush 23, and by providing a projection having an appropriate height, the suction is performed. A gap may be ensured.

【0025】更に、上記実施例でにおいては、加工液除
去機構6の吸水ヘッド17が、支持アーム19の伸縮に
よって吸水位置と待機位置とに変移するように構成され
ているが、支持アーム19を支軸25を中心にして旋回
させることにより、吸水位置と待機位置とに変移させる
ように構成することもできる。
Further, in the above embodiment, the water absorbing head 17 of the machining fluid removing mechanism 6 is configured to shift between the water absorbing position and the standby position by the expansion and contraction of the support arm 19. By turning around the support shaft 25, it is also possible to configure so as to shift between the water absorption position and the standby position.

【0026】更にまた、上記実施例では、加工液除去機
構6で下定盤2上の加工液を吸い込むものについて説明
したが、上記吸水ヘッド17を上下反転自在に構成する
ことにより、1つの加工液除去機構6で上下両定盤2,
3の作業面に残留する加工液を吸い取ることができる。
Further, in the above-described embodiment, the processing fluid removal mechanism 6 sucks the processing fluid on the lower platen 2. However, by configuring the water absorbing head 17 so as to be able to be turned upside down, one processing fluid is removed. The upper and lower platens 2,
The working fluid remaining on the work surface of No. 3 can be sucked.

【0027】しかし、同様の加工液除去機構6をもう一
組別に設け、これで上定盤3の作業面に付着した加工液
を吸い込むように構成することもできる。この場合、上
定盤3用の加工液除去機構6では、吸水ヘッド17が上
向きに設けられることは言うまでもないことである。
However, it is also possible to provide another working fluid removing mechanism 6 similar to that of the first embodiment so that the working fluid adhering to the work surface of the upper stool 3 is sucked. In this case, it goes without saying that in the working fluid removing mechanism 6 for the upper stool 3, the water absorbing head 17 is provided upward.

【0028】[0028]

【発明の効果】このように本発明によれば、定盤の作業
面上に残留する研磨液やリンス液等の加工液を、吸引ポ
ンプに通じる吸水ヘッドによって簡単且つ自動的に除去
することができる。このため除去効率が非常に良いばか
りでなく、加工液が手や衣服に付着することがないため
安全且つ衛生的である。
As described above, according to the present invention, a processing liquid such as a polishing liquid or a rinsing liquid remaining on the work surface of the surface plate can be easily and automatically removed by a water absorbing head connected to a suction pump. it can. For this reason, not only the removal efficiency is very good, but also the processing liquid does not adhere to hands or clothes, so that it is safe and sanitary.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る平面研磨装置の一実施例を示す断
面図である。
FIG. 1 is a cross-sectional view showing one embodiment of a planar polishing apparatus according to the present invention.

【図2】図2の要部拡大断面図である。FIG. 2 is an enlarged sectional view of a main part of FIG.

【図3】図1の要部平面図である。FIG. 3 is a plan view of a main part of FIG. 1;

【符号の説明】[Explanation of symbols]

2 下定盤 3 上定盤 4 太陽歯車 5 内歯歯車 6 加工液除去機構 10 ワークキャリ
ヤ 13 加工液供給機構 17 吸水ヘッド 18 吸水口 22 吸引ポンプ 23 ブラシ
2 Lower surface plate 3 Upper surface plate 4 Sun gear 5 Internal gear 6 Working fluid removing mechanism 10 Work carrier 13 Working fluid supply mechanism 17 Water absorption head 18 Water absorption port 22 Suction pump 23 Brush

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】同心状に位置する太陽歯車及び内歯歯車
と、これら両歯車に噛合して太陽歯車の回りを遊星運動
する複数のワークキャリヤと、該ワークキャリヤに保持
されたワークを両側から挟んで研磨する上下の定盤と、
研磨部に加工液を供給するための加工液供給機構と、定
盤の作業面に残留する加工液を除去するための加工液除
去機構とを有し、 上記加工液除去機構が、吸引ポンプに連通する吸水口を
備えた吸水ヘッドを有していて、該吸水ヘッドが、定盤
面上の加工液を吸い込む吸水位置と、定盤から離れた待
機位置との間を変移自在であることを特徴とする加工液
除去機構付き平面研磨装置。
1. A sun gear and an internal gear which are concentrically located, a plurality of work carriers which mesh with these two gears and perform planetary motion around the sun gear, and a work held by the work carrier is moved from both sides. Upper and lower platens that are sandwiched and polished,
A machining fluid supply mechanism for supplying a machining fluid to the polishing unit, and a machining fluid removal mechanism for removing a machining fluid remaining on the work surface of the surface plate, wherein the machining fluid removal mechanism is connected to a suction pump. It has a water absorbing head provided with a communicating water inlet, and the water absorbing head is freely movable between a water absorbing position on the surface of the surface plate for sucking the working fluid and a standby position away from the surface plate. Polishing machine with a working fluid removal mechanism.
【請求項2】請求項1に記載の平面研磨装置において、
上記加工液除去機構における吸水ヘッドが、定盤の円周
方向の定位置において該定盤の半径方向に移動しながら
加工液を吸い込むように構成されていることを特徴とす
るもの。
2. The planar polishing apparatus according to claim 1, wherein
The water absorbing head in the machining fluid removing mechanism is configured to suck the machining fluid while moving in a radial direction of the surface plate at a fixed position in a circumferential direction of the surface plate.
【請求項3】請求項1又は2に記載の平面研磨装置にお
いて、上記加工液除去機構における吸水ヘッドが、定盤
の作業面に当接するブラシを有していることを特徴とす
るもの。
3. The planar polishing apparatus according to claim 1, wherein the water absorbing head in the working fluid removing mechanism has a brush that comes into contact with a work surface of the surface plate.
【請求項4】請求項1ないし3の何れかに記載の平面研
磨装置において、上記加工液除去機構を1組備えてい
て、上下に反転可能な吸水ヘッドを備えることにより、
上下の定盤の作業面上の加工液を吸水可能であることを
特徴とするもの。
4. The planar polishing apparatus according to claim 1, further comprising a set of the working fluid removing mechanism, and a water absorbing head which can be turned upside down.
It is characterized by being able to absorb the working fluid on the working surfaces of the upper and lower platens.
【請求項5】請求項1ないし3の何れかに記載の平面研
磨装置において、上記加工液除去機構を2組備えてい
て、これらの除去手段によって上下の定盤の作業面上の
加工液を個別に吸水可能であることを特徴とするもの。
5. The planar polishing apparatus according to claim 1, further comprising two sets of said working fluid removing mechanisms, wherein said removing means removes working fluid on the working surfaces of the upper and lower platens. It is characterized by being able to absorb water individually.
【請求項6】同心状に位置する太陽歯車及び内歯歯車
と、これら両歯車に噛合して太陽歯車の回りを遊星運動
する複数のワークキャリヤと、該ワークキャリヤに保持
されたワークを両側から挟んで表面研磨する上下の定盤
とを備えた平面研磨装置において、ワークの加工終了後
に定盤の作業面に残留する加工液を除去するための方法
であって、 吸引ポンプに通じる吸水口を備えた吸水ヘッドを定盤の
円周方向の定位置において該定盤の作業面に当接させ、
該定盤を回転させながら上記吸水ヘッドで作業面上の加
工液を吸い取ることを特徴とする加工液除去方法。
6. A sun gear and an internal gear which are concentrically arranged, a plurality of work carriers which mesh with these two gears and make a planetary movement around the sun gear, and a work held by the work carrier from both sides. A method for removing a working fluid remaining on a work surface of a surface plate after processing of a work in a flat surface polishing apparatus having upper and lower surface plates for sandwiching and polishing the surface, wherein a water suction port communicating with a suction pump is provided. The water absorbing head provided is brought into contact with the work surface of the surface plate at a fixed position in the circumferential direction of the surface plate,
A method for removing a working fluid, wherein the working fluid on the work surface is sucked by the water absorbing head while rotating the surface plate.
【請求項7】請求項6に記載の加工液除去方法におい
て、上記吸水ヘッドを定盤の半径方向に移動させながら
加工液を吸い取ることを特徴とするもの。
7. The method according to claim 6, wherein the processing liquid is sucked while moving the water absorbing head in a radial direction of the surface plate.
JP4433498A 1998-02-10 1998-02-10 Surface polishing device with work fluid removing mechanism and work fluid removing method Pending JPH11226863A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4433498A JPH11226863A (en) 1998-02-10 1998-02-10 Surface polishing device with work fluid removing mechanism and work fluid removing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4433498A JPH11226863A (en) 1998-02-10 1998-02-10 Surface polishing device with work fluid removing mechanism and work fluid removing method

Publications (1)

Publication Number Publication Date
JPH11226863A true JPH11226863A (en) 1999-08-24

Family

ID=12688627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4433498A Pending JPH11226863A (en) 1998-02-10 1998-02-10 Surface polishing device with work fluid removing mechanism and work fluid removing method

Country Status (1)

Country Link
JP (1) JPH11226863A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10060697B4 (en) * 2000-12-07 2005-10-06 Siltronic Ag Double-sided polishing method with reduced scratch rate and apparatus for carrying out the method
JP2006334744A (en) * 2005-06-03 2006-12-14 Fuji Electric Device Technology Co Ltd Polishing device and polishing method
KR100757138B1 (en) 2006-07-27 2007-09-10 동부일렉트로닉스 주식회사 Chemical mechanical polish equipment with wafer rinse unit on polishing head and rinse method
JP2010231854A (en) * 2009-03-27 2010-10-14 Hoya Corp Method for manufacturing substrate for magnetic disk
CN115287661A (en) * 2022-08-23 2022-11-04 广州安博新能源科技有限公司 Pickling device for producing and welding high-power module

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10060697B4 (en) * 2000-12-07 2005-10-06 Siltronic Ag Double-sided polishing method with reduced scratch rate and apparatus for carrying out the method
JP2006334744A (en) * 2005-06-03 2006-12-14 Fuji Electric Device Technology Co Ltd Polishing device and polishing method
JP4529136B2 (en) * 2005-06-03 2010-08-25 富士電機デバイステクノロジー株式会社 Polishing apparatus and polishing method
KR100757138B1 (en) 2006-07-27 2007-09-10 동부일렉트로닉스 주식회사 Chemical mechanical polish equipment with wafer rinse unit on polishing head and rinse method
JP2010231854A (en) * 2009-03-27 2010-10-14 Hoya Corp Method for manufacturing substrate for magnetic disk
CN115287661A (en) * 2022-08-23 2022-11-04 广州安博新能源科技有限公司 Pickling device for producing and welding high-power module

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