JPH11224141A - Arithmetic unit - Google Patents

Abstract

PROBLEM TO BE SOLVED: To make continuable the operation over a wide operation range outside an operation guarantee temperature range without using an electronic component of a wide operation guarantee temperature range, a cooling device or a heating device by changing a power supply voltage to be supplied to an arithmetic processing circuit based on voltage information supplied from a temperature measurement circuit. SOLUTION: The temperature measurement circuit 3b measures the ambient temperature, surface temperature and peripheral substrate temperature, etc., of an arithmetic processing unit 1 by temperature sensors such as a thermistor or the like and sends the voltage information to a power source circuit 5 based on the temperature. The temperature measurement circuit 3b is provided with a temperature/voltage conversion table inside and the voltage information for keeping the electronic moving speed of the arithmetic processing circuit 1 is analog/digital converted in the temperature/voltage conversion table and outputted from the temperature/voltage conversion table. Then, in the power source circuit 5, the power supply voltage is changed based on the voltage information outputted from the temperature measurement circuit 3 and the power supply voltage is supplied to the arithmetic processing circuit 1.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an arithmetic unit capable of continuous operation in a temperature range wider than an operation guarantee temperature range of components.

[0002]

2. Description of the Related Art With the shrinking of the defense industry market and the expansion of the consumer market in recent years, semiconductor manufacturers have started to produce electronic components such as ICs and LSIs having a wide operation guarantee temperature range represented by defense and industrial applications. There is a tendency to withdraw, making it difficult to obtain. However, the operation assurance temperature range mentioned here indicates the allowable temperature range near the electronic component.
Beyond this range, the electronic component is more likely to malfunction due to a decrease in the response speed of the internal element and the like. In addition, when the degree of the overshoot becomes large, it may lead to destruction. Such electronic components may be used in special vehicles such as aircraft and tanks for defense applications, and in places with poor thermal environment such as near steelworks production facilities for industrial applications. The guaranteed temperature is widely secured. For example, the operation guarantee temperature range of an IC for consumer use is 0 ° C. to 70 ° C., whereas the operation guarantee temperature range of an IC for defense use is −55.
C. to 125.degree. C. and -20.degree. C. to 85.degree. C. for industrial use are common. Also, such ICs currently on the market are expensive because they are sorted by environmental tests. for that reason,
An arithmetic unit composed of these electronic components and having a wide operation guarantee temperature range is inevitably expensive.

In the case where an arithmetic unit which operates without using electronic parts having such a wide operation guarantee temperature range and operates at a temperature outside the operation guarantee temperature range is provided, a cooling device and a heating device are provided, The device had to be kept within the operating temperature range.

FIG. 11 shows a conventional arithmetic unit which can operate outside the operation guarantee temperature range using electronic parts for consumer use. In FIG. 11, 1 is an arithmetic processing circuit, 2 is a power supply circuit, and 3 is an arithmetic unit. A temperature measuring circuit for measuring the temperature of the inside of the housing or the temperature of the substrate and components; 4, a cooling device such as a cooler for cooling the arithmetic processing circuit 1, a heating device such as a heater for heating the arithmetic processing circuit 1, and a temperature. This is a temperature adjustment device including a temperature controller that controls on / off and strength of the cooling device and the heating device based on information on the temperature measured by the measurement circuit 3.

The conventional arithmetic unit is constructed as described above. For example, when the temperature around the arithmetic processing circuit 1 measured by the temperature measuring circuit 3 is lower than the operation guarantee temperature, the temperature adjusting device 4
Is turned off, power is supplied to the heater, and the arithmetic processing circuit 1 is heated. When the temperature around the processing unit 1 is higher than the operation guarantee temperature, the heater is turned off and power is supplied to the cooler to cool the processing unit 1.

[0006]

The conventional arithmetic unit has the above-described configuration. To widen the operation guaranteed temperature range of the arithmetic unit, the operation guaranteed temperature range used for defense applications is increased. It is necessary to select a wide and expensive electronic component to form the arithmetic processing circuit 1 or to additionally provide a temperature measuring circuit or a temperature adjusting device for measuring and controlling the temperature of the arithmetic device. In this case, the cooling device and the heating device often require a large amount of power, so that the power consumption increases and the components of the power supply, the cooling device, and the heating device increase. In a cooling device, a condenser, a compressor, and the like are often added as constituent elements, so that the size of the device is increased. This can cause a decrease in reliability.

The present invention has been made in order to solve such a problem, and in particular, does not use an electronic component having a wide operation guarantee temperature range, and does not use a cooling device or a heating device. It is an object of the present invention to configure an arithmetic device capable of continuing its operation over a temperature range.

[0008]

An arithmetic unit according to a first aspect of the present invention measures an arithmetic processing circuit composed of components operating in an operation guarantee temperature range, and measures the temperature around or inside the arithmetic processing circuit, and measures the temperature. A temperature measurement circuit that obtains voltage information to be supplied to the arithmetic processing circuit so as to keep the electron moving speed of the arithmetic processing circuit within a predetermined range based on the voltage information supplied from the temperature measurement circuit. And a power supply circuit for changing a power supply voltage supplied to the arithmetic processing circuit.

The arithmetic unit according to the second aspect of the present invention measures an arithmetic processing circuit composed of components operating in an operation guarantee temperature range, and measures the temperature around or inside the arithmetic processing circuit, and based on the measured temperature, A temperature measurement circuit that obtains clock frequency information according to an operation speed in an operation processing circuit; and a clock generation circuit that changes a clock frequency supplied to the operation processing circuit based on the clock frequency information supplied from the temperature measurement circuit. It is provided with.

An arithmetic unit according to a third aspect of the present invention includes an arithmetic processing circuit composed of components operating in an operation guarantee temperature range, an electronic moving speed measuring circuit for measuring a moving speed of electrons in the arithmetic processing circuit. A power supply circuit for changing a power supply voltage supplied to the arithmetic processing circuit based on the electronic moving speed information supplied from the electron moving speed measuring circuit so as to keep the electronic moving speed of the arithmetic processing circuit within a predetermined range. It is provided with.

Further, the arithmetic unit according to the fourth aspect of the present invention has a third aspect.
In the invention, the electronic moving speed measurement circuit includes a clock generation circuit that outputs a pulse at fixed intervals, a delay circuit that causes a delay from the clock generation circuit in accordance with the temperature, and a clock signal from the clock generation circuit. A counter that counts a clock corresponding to a time difference between a pulse and a pulse delayed by the delay circuit; and a count number-voltage value conversion unit that converts a count value of the counter into a voltage, and the power supply circuit further includes: A switching control circuit that changes a frequency or a duty ratio of an output signal based on an output voltage from the count number-voltage value conversion unit, a switch circuit that performs switching based on an output signal from the switching control circuit, and the switch circuit A constant voltage source for supplying power to the power supply, and smoothing the output of the switch circuit; It is obtained by a smoothing circuit for outputting to the serial arithmetic processing circuit.

Further, the arithmetic unit according to the fifth aspect of the present invention has a third aspect.
In the invention, the electron moving speed measurement circuit includes a delay circuit that causes a delay according to a temperature of the pulse from the clock generation circuit, and a pulse from the clock generation circuit and a pulse delayed by the delay circuit. An oscillator that changes an output frequency according to a time difference, and a frequency-voltage conversion unit that converts an output frequency from the oscillator to a voltage value, and the power supply circuit further includes an output voltage from the frequency-voltage conversion unit. A switching control circuit that controls a frequency or a duty ratio of an output signal in accordance with the switching signal; a switch circuit that switches based on an output signal from the switching control circuit; a constant voltage source that supplies power to the switch circuit; and the switch circuit. And a smoothing circuit for smoothing the output of the arithmetic processing circuit and outputting the result to the arithmetic processing circuit.

The arithmetic device according to a sixth aspect of the present invention includes an arithmetic processing circuit composed of components operating in an operation-guaranteed temperature range, and an electronic moving speed measuring circuit for measuring a moving speed of electrons in the arithmetic processing circuit. And a clock generation circuit for changing a clock frequency output to the arithmetic processing circuit based on the electron moving speed information supplied from the electron moving speed measuring circuit.

Further, the arithmetic unit according to the seventh aspect of the present invention provides the arithmetic unit according to the sixth aspect.
In the invention, the electronic moving speed measurement circuit includes a clock generation circuit that outputs a pulse at fixed intervals, a delay circuit that causes a delay from the clock generation circuit in accordance with the temperature, and a clock signal from the clock generation circuit. A counter for counting a clock corresponding to a time difference between a pulse and a pulse delayed by the delay circuit; and a count number-clock division ratio conversion for converting a count value of the counter into a digital value indicating a division ratio of a clock frequency. Means, and a control circuit for controlling the count number-clock division ratio conversion means, the clock generation circuit further divides an output clock from the reference clock generation circuit and the reference clock generation circuit, And a frequency divider for outputting to the arithmetic processing circuit.

Further, in the arithmetic device according to an eighth aspect of the present invention, in the sixth aspect, the electronic moving speed measuring circuit includes a clock generating circuit that outputs pulses at regular intervals; A delay circuit that causes a corresponding delay, an oscillator that changes an output frequency according to a time difference between a pulse from the clock generation circuit and a pulse delayed by the delay circuit, and an output frequency from the oscillator to a voltage value. A frequency-voltage conversion circuit for converting, and the clock generation circuit further includes a frequency sweep circuit for sweeping an output frequency according to an input voltage and outputting the output frequency to the arithmetic processing circuit.

[0016]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiment 1 FIG. 1 is a diagram of an arithmetic unit according to Embodiment 1 of the present invention.
Is the same as the conventional device, 3b is a temperature measurement circuit,
Reference numeral 5 denotes a power supply circuit that can change the output voltage to the arithmetic processing circuit 1.

In the arithmetic unit configured as described above, the temperature measuring circuit 3b measures the ambient temperature, surface temperature, peripheral substrate temperature, etc. of the arithmetic processing unit 1 by using a temperature sensor such as a thermistor, and based on the temperature, a power supply is measured. The voltage information is sent to the circuit 5. If this temperature sensor is of a type that changes its resistance value, a reference voltage is applied to both ends to obtain a voltage corresponding to the temperature. The temperature measurement circuit 3b has a temperature
The temperature-voltage conversion table has a voltage conversion table. Based on the voltage corresponding to the temperature measured by the temperature sensor, the temperature-voltage conversion table is used to determine the electron moving speed of the arithmetic processing circuit 1 from a predetermined range. Is converted from analog to digital and output. In the power supply circuit 5, the temperature measurement circuit 3
The power supply voltage is changed based on the voltage information output from the power supply, and the power supply voltage is supplied to the arithmetic processing circuit 1.

In an electronic circuit, when the power supply voltage is reduced, the moving speed of electrons is reduced, and the operation of the circuit is slowed down. Also, it has been found that when the ambient temperature is lowered, the electron movement speed increases, and the operation as a circuit increases.
In particular, if the ambient temperature falls below the operation guarantee temperature range in the arithmetic processing device 1, malfunction occurs because the electron movement speed in the arithmetic processing device exceeds the margin, so that the power supply voltage is reduced and the electron movement speed is reduced to the operation guarantee temperature. Malfunction can be prevented by making appropriate corrections so as to maintain the speed within the predetermined range when the speed is within the range. Similarly, when the ambient temperature exceeds the operation guarantee temperature range in the arithmetic processing unit 1, the moving speed of electrons in the arithmetic processing unit falls below the margin. Therefore, the power supply voltage is increased to correct the moving speed of the electrons. Operation can be prevented. The power supply circuit 5 uses this phenomenon to reduce the voltage at a low temperature and raise the voltage at a high temperature based on the voltage information obtained from the temperature measurement circuit 3b, thereby keeping the moving speed of the electrons within a predetermined range, thereby obtaining an arithmetic processing circuit. 1 is kept constant.

Since this embodiment is configured as described above, the power supply voltage is changed in accordance with the temperature of the arithmetic processing circuit to keep the electron moving speed within a predetermined range.
It is possible to operate the arithmetic processing circuit at a constant speed over a temperature range wider than the operation guarantee temperature range without causing the arithmetic processing circuit to malfunction.

Embodiment 2 FIG. 2 is a diagram of an arithmetic unit according to a second embodiment of the present invention, in which 1 is the same as the conventional device, 3c is a temperature measuring circuit, and 6 is an output clock frequency to the arithmetic processing circuit 1. It is a clock generation circuit that can be changed.

In the arithmetic device configured as described above, the temperature measuring circuit 3c calculates a temperature-voltage conversion table based on the temperature obtained by the temperature sensor, similarly to the temperature measuring circuit 3b in the first embodiment. A clock frequency corresponding to the calculation speed of the processing circuit 1 is determined, and the information is output. The clock generation circuit 6 is supplied with information on the clock frequency determined by the temperature measurement circuit 3, and outputs a clock of that frequency to the arithmetic processing circuit 1 based on the information.

In an electronic circuit, when the ambient temperature is increased, the moving speed of electrons decreases, and the operation of the circuit is delayed. In addition, when the ambient temperature is decreased, the moving speed of electrons is increased, and the operation as a circuit is accelerated.

Based on this phenomenon, the clock generating circuit 6
When the temperature is high, the operation of the circuit is slowed down, and the clock frequency cannot be kept up with the clock frequency up to that time. At a low temperature, the operation of the circuit becomes faster, so the clock frequency is increased. This allows the arithmetic processing circuit 1 to continue processing without malfunctioning.

Embodiment 3 FIG. FIG. 3 is a diagram of an arithmetic unit showing a third embodiment of the present invention, in which 1 is the same as the conventional device, and 7 is the moving speed of electrons near or inside the components in the arithmetic processing circuit 1. Is the same as that in the first embodiment.

In the arithmetic unit configured as described above, the power supply circuit 5 is based on the information indicating the electron moving speed obtained from the electron moving speed measuring circuit 7 and outputs the voltage value to be output when the electron moving speed increases. Is reduced, and when the moving speed of electrons decreases, the output voltage value is increased, and the power supply voltage is output to the arithmetic processing circuit 1. This makes it possible to keep the operation speed of the arithmetic processing circuit 1 constant.

Here, the electron moving speed measuring circuit 7 operates in the same manner as the temperature measuring circuit 3b in the first embodiment. That is, since the electron moving speed changes in accordance with the temperature, the electron moving speed is measured, and the arithmetic processing circuit 1 controls the power supply circuit 5 so as to keep the electron moving speed within a predetermined range.
Control the output voltage supplied to the Since the measurement of the electron moving speed can be realized without using a special element or the like, this part can be integrated in the same semiconductor.

Embodiment 4 FIG. 4 is a diagram of an electronic moving speed measuring circuit and a power supply circuit showing a fourth embodiment of the present invention. A clock generation circuit 9 for delaying a signal in accordance with a change in resistance characteristics due to a temperature change in a long wiring, a gate, or the like;
Is supplied with a pulse generated by the clock generation circuit 8 that has passed through the delay circuit 9 and a pulse that has not passed through the counter, and counts the time difference between them. A counter 11 generates a reference clock C serving as a reference for the counter 10 to count. The clock generation circuit 12 is a count number-voltage value conversion table comprising a memory which previously stores a conversion table for converting the count value of the counter 9 into a voltage value.
A control circuit for controlling the operation of the voltage value conversion table 12;
4 is a digital-to-analog conversion circuit for converting a digital signal from the count number-voltage value conversion table 12 into an analog signal;
A switching control circuit 15 controls a switching cycle and a duty ratio to obtain a desired output voltage.
6 is a constant voltage source, 17 is a switch circuit for switching, and 18 is a smoothing circuit for smoothing the switched signal to make it a DC power supply voltage.

In the electronic moving speed measuring circuit and the power supply circuit configured as described above, the clock generating circuit 8 outputs a pulse at a constant cycle. However, the cycle here is the same as the cycle for switching the power supply voltage. The counter 10 starts counting when a pulse A without delay is supplied as a count start signal, and counts based on the number of reference clocks C until a pulse B passing through the delay circuit is supplied as a count end signal. The time difference T from the start to the end of counting is counted. For example, the count result increases when the temperature around the arithmetic processing device 1 rises above the operation guarantee temperature range and the electron moving speed decreases, and the count result decreases when the temperature falls below the operation guarantee temperature and the electron movement speed increases. At this time, the reference clock C for counting
Is output from the clock generator 11 and its frequency must be sufficiently high with respect to the signal delay time in the delay circuit 9. After receiving the count end signal, the counter 9 counts the time difference T, and inputs the count result to the count number-voltage value conversion table 12, and the count number-voltage value conversion table 12 outputs the corresponding voltage value. Count number-
The voltage value conversion table 12 is composed of a memory. For example, when the count number is supplied from the counter 9 using the count number as an address and the corresponding voltage value as data of the address, the control circuit 13 controls the input / output, and Get the action. For example, when the ambient temperature around the arithmetic processing circuit 1 is low, a low count value corresponding to a high electron moving speed that causes the arithmetic processing circuit 1 to malfunction is supplied from the counter 11 to the count number-voltage conversion table 12. At this time, the count number-voltage value conversion table 12 shows the power supply voltage value for lowering the electron moving speed so as to keep the operation processing circuit 1 within a predetermined speed range when the operation processing temperature range is within the operation guarantee temperature range. Output to the power supply circuit 5. As a result, the operation speed of the arithmetic processing circuit 1 is kept constant and stable operation is performed. The power supply voltage value D is converted into an analog signal by the digital-to-analog conversion circuit 14 and input to the switching control circuit 13, whereby the switching is controlled by changing the switching frequency or duty ratio of the switch circuit 17, and the electronic moving speed measurement circuit 7 The specified power supply voltage E is output.

FIG. 5 is a diagram showing the manner in which a pulse A having no delay, a pulse B passing through the delay circuit 9, and a reference clock C are input to the counter 11. In FIG.
T3 indicates the delay time in the delay circuit 9 when the ambient temperature of the processing device 1 is higher than that in the case of T1, and T3 indicates the delay time in the delay circuit 9 when the ambient temperature of the processing device 1 is lower than in the case of T1. Is shown. Where T1, T2, T3
Has a relationship of T3 <T1 <T2, and by changing the power supply voltage as described above, T3 = T1 = T2
To a certain degree. As a result, the arithmetic processing circuit 1 can be operated at a constant speed without malfunction.

Embodiment 5 FIG. 6 is a diagram of an electron moving speed measuring circuit showing a fifth embodiment of the present invention. In the drawing, reference numerals 5 and 7 are the same as those of the third embodiment, and reference numeral 19 denotes a frequency according to the output of the delay circuit 9. An oscillator that changes
0 is a frequency-voltage conversion circuit for converting a frequency into a voltage,
9, 15 to 18 are the same as in the fourth embodiment.

In the electronic moving speed measuring circuit and the power supply circuit configured as described above, the oscillator 19 generates a signal having a frequency corresponding to the signal delay by the delay circuit 9, and this signal is sent to the frequency-voltage conversion circuit 20. Input and output voltage F
Convert to By changing the switching frequency and the duty ratio with this voltage, the power supply voltage G can be changed continuously.

FIG. 7 shows an example of the oscillator 19.
21 is a one-shot multivibrator, and 9 is a delay circuit. The pulse from the one-shot multivibrator 21 is input to the one-shot multivibrator 21 as a command to pass through the delay circuit 9 and transmit an output again. As a result, a signal H having a lower frequency is generated when the electron moving speed is decreased, and a signal H having a higher frequency is generated when the electron moving speed is increased.

Embodiment 6 FIG. FIG. 8 is a diagram of an arithmetic unit showing a sixth embodiment of the present invention, in which 1 is the same as the conventional device, 7 is the same as the third embodiment, and 6 is the embodiment. It is the same as 2.

In the arithmetic unit configured as described above, the operation of the circuit becomes slow at high temperatures and cannot be made with the clock frequency up to that time. Therefore, the clock processing circuit 1 lowers the clock frequency, so that the arithmetic processing circuit 1 malfunctions. It is possible to continue processing without doing so.
In addition, since the operation of the circuit becomes faster at low temperatures, the clock processing circuit 6 increases the clock frequency, so that the arithmetic processing circuit 1 continues processing without malfunction.

Embodiment 7 FIG. FIG. 9 is a diagram of an electronic moving speed measurement circuit and a clock generation circuit showing a seventh embodiment of the present invention. In the drawings, 6 and 7 are the same as those of the sixth embodiment, and 8 to 11 and 13 are the same. 22 is a count number-clock division ratio conversion table for converting the count value of the counter 10 into the division ratio of the clock frequency, 23 is a reference clock generation circuit, and 24 is a reference clock generation circuit. This is a frequency dividing circuit that divides the frequency of the output clock from the F.23.

In the electronic moving speed measuring circuit and the clock generating circuit configured as described above, the clock generating circuit 8 outputs a pulse at a constant cycle. However, the cycle here is the same as the cycle for switching the clock frequency. The counter 11 counts the time difference between the pulse A having no delay and the pulse B passing through the delay circuit as a count end signal. At this time, the reference clock C for counting is output from the clock generator 10, and its frequency must be sufficiently high with respect to the signal delay time in the delay circuit 9. This count result is counted number-
It is input to the clock frequency dividing ratio conversion table 22 and the corresponding frequency dividing ratio I is output. The count number-clock division ratio conversion table 22 is formed of a memory, and the input / output is controlled by the control circuit 13 using the count number as an address and the corresponding division ratio as data of the address, thereby obtaining a desired operation. The dividing ratio I is output to the dividing circuit 24, which divides the output from the reference clock generator 23 and outputs the clock J.

Embodiment 8 FIG. FIG. 10 is a diagram of an electronic moving speed measurement circuit and a clock generation circuit showing an eighth embodiment of the present invention. In the drawings, 6 and 7 are the same as those of the sixth embodiment, and 9, 19, and 20 are the same. 25 is a frequency sweep circuit.

In the electronic moving speed measurement circuit and the clock generation circuit configured as described above, the oscillator 19 generates a signal having a frequency corresponding to the delay of the signal by the delay circuit 9, and converts the signal into a frequency-voltage conversion circuit 20. And converts it to an output voltage K. By inputting this to the frequency sweep circuit 25, the frequency of the output clock L can be changed continuously.

[0039]

According to the first aspect of the invention, the power supply voltage is changed according to the temperature of the arithmetic processing circuit to keep the electron moving speed constant, so that the arithmetic processing circuit does not malfunction over a wide temperature range. It is possible to operate at speed.

According to the second aspect, it is possible to reduce the operating speed by changing the clock frequency in accordance with the temperature of the arithmetic processing circuit, and to operate the arithmetic processing circuit over a wide temperature range without malfunctioning. Become.

According to the third aspect, the power supply voltage is changed in accordance with the electron moving speed in the arithmetic processing circuit to keep the electron moving speed constant, thereby preventing the arithmetic processing circuit from malfunctioning over a wide temperature range. It is possible to operate at a constant speed.

According to the fourth aspect of the present invention, the power supply voltage is switched in several steps according to the electron moving speed in the arithmetic processing circuit to keep the electron moving speed constant, thereby causing the arithmetic processing circuit to malfunction over a wide temperature range. It is possible to operate at a constant speed without the need.

According to the fifth aspect, the power supply voltage is continuously changed in accordance with the electron moving speed in the arithmetic processing circuit to keep the electron moving speed constant, thereby causing the arithmetic processing circuit to malfunction over a wide temperature range. It is possible to operate at a constant speed without causing the operation.

According to the sixth aspect, the operating speed is reduced by changing the clock frequency in accordance with the electron moving speed in the arithmetic processing circuit, and the arithmetic processing circuit is operated over a wide temperature range without malfunctioning. Becomes possible.

According to the seventh aspect, the operating speed is reduced by switching the clock frequency in several stages according to the electron moving speed in the arithmetic processing circuit, and the operation is performed without causing the arithmetic processing circuit to malfunction over a wide temperature range. It is possible to do.

According to the eighth aspect, the operating speed is reduced by continuously changing the clock frequency according to the electron moving speed in the arithmetic processing circuit, and the arithmetic processing circuit does not malfunction over a wide temperature range. It can be operated.

[Brief description of the drawings]

FIG. 1 is a diagram showing Embodiment 1 of an arithmetic unit according to the present invention.

FIG. 2 is a diagram showing a second embodiment of the arithmetic unit according to the present invention;

FIG. 3 is a diagram showing a third embodiment of the arithmetic unit according to the present invention;

FIG. 4 is a diagram showing a fourth embodiment of the arithmetic unit according to the present invention;

FIG. 5 is a diagram illustrating an operation of an arithmetic unit according to a fourth embodiment of the present invention.

FIG. 6 is a diagram showing Embodiment 5 of an arithmetic unit according to the present invention.

FIG. 7 is a diagram illustrating an example of an oscillator according to a fifth embodiment of the arithmetic device according to the present invention;

FIG. 8 is a diagram showing a sixth embodiment of the arithmetic unit according to the present invention;

FIG. 9 is a diagram showing Embodiment 7 of an arithmetic unit according to the present invention.

FIG. 10 is a diagram showing an eighth embodiment of an arithmetic unit according to the present invention.

FIG. 11 is a diagram illustrating a conventional arithmetic device.

[Explanation of symbols]

Reference Signs List 1 arithmetic processing circuit, 3 temperature measurement circuit, 3b temperature measurement circuit, 3c temperature measurement circuit, 5 power supply circuit, 6 clock generation circuit, 7 electron movement speed measurement circuit, 8 clock generation circuit, 9 delay circuit, 10 counter, 11 clock Generating circuit, 12 count-voltage conversion table, 13
Control circuit, 14 digital-analog conversion circuit, 15
Switching control circuit, 16 constant voltage source, 17 switch circuit, 18 smoothing circuit, 19 oscillator, 20 frequency-voltage conversion circuit, 22 count-clock division ratio conversion table, 23 reference clock generation circuit, 24 frequency division circuit,
25 Frequency sweep circuit.

Claims (8)

[Claims] An arithmetic processing circuit comprising components operating in an operation guarantee temperature range, and a temperature around or inside the arithmetic processing circuit is measured, and an electronic moving speed of the arithmetic processing circuit is determined based on the temperature. A temperature measurement circuit that obtains voltage information to be supplied to the arithmetic processing circuit so as to keep it within the range of
A power supply circuit for changing a power supply voltage supplied to the arithmetic processing circuit based on voltage information supplied from the temperature measurement circuit. 2. An arithmetic processing circuit composed of components operating in an operation guarantee temperature range, and measuring a temperature around or inside the arithmetic processing circuit, and according to an arithmetic speed in the arithmetic processing circuit based on the measured temperature. And a clock generation circuit for changing a clock frequency supplied to the arithmetic processing circuit based on the clock frequency information supplied from the temperature measurement circuit. 3. An arithmetic processing circuit comprising components operating in an operation guarantee temperature range, an electronic moving speed measuring circuit for measuring a moving speed of electrons in the arithmetic processing circuit, and a supply from the electronic moving speed measuring circuit. And a power supply circuit for changing a power supply voltage to be supplied to the arithmetic processing circuit based on the obtained electronic moving speed information so as to keep the electronic moving speed of the arithmetic processing circuit within a predetermined range. 4. An electronic moving speed measurement circuit, comprising: a clock generation circuit that outputs pulses at regular intervals; a delay circuit that causes a pulse from the clock generation circuit to cause a delay according to a temperature; A counter that counts a clock corresponding to the time difference between the pulse of the delay circuit and the pulse delayed by the delay circuit, and a count number-voltage value conversion unit that converts the count value of the counter into a voltage, and the power supply circuit further includes: A switching control circuit that changes a frequency or a duty ratio of an output signal based on an output voltage from the count number-voltage value conversion means, a switch circuit that switches based on an output signal from the switching control circuit, and the switch A constant voltage source for supplying power to the circuit, and smoothing the output of the switch circuit; The arithmetic device according to claim 3, further comprising a smoothing circuit that outputs the result to the arithmetic processing circuit. 5. An electronic moving speed measuring circuit, comprising: a delay circuit for causing a pulse from the clock generation circuit to delay in accordance with a temperature; a pulse from the clock generation circuit and a pulse delayed by the delay circuit. An oscillator that changes an output frequency in accordance with a time difference between the two, and a frequency-voltage conversion unit that converts an output frequency from the oscillator into a voltage value, and the power supply circuit further includes an output voltage from the frequency-voltage conversion unit. A switching control circuit that controls a frequency or a duty ratio of an output signal in accordance with a switching circuit that switches based on an output signal from the switching control circuit, a constant voltage source that supplies power to the switch circuit, and the switch. Smoothing the output of the circuit,
The arithmetic device according to claim 3, further comprising a smoothing circuit that outputs to the arithmetic processing circuit. 6. An arithmetic processing circuit composed of components operating in an operation guarantee temperature range, an electronic moving speed measuring circuit for measuring a moving speed of electrons in the arithmetic processing circuit, and a signal supplied from the electronic moving speed measuring circuit. A clock generating circuit for changing a clock frequency output to the arithmetic processing circuit based on the obtained electron moving speed information. 7. An electronic moving speed measurement circuit comprising: a clock generation circuit that outputs a pulse at a constant interval; a delay circuit that causes a pulse from the clock generation circuit to cause a delay according to a temperature; A counter that counts a clock corresponding to the time difference between the pulse of the clock signal and the pulse delayed by the delay circuit, and a count number−clock division ratio that converts a count value of the counter into a digital value indicating a division ratio of a clock frequency. Conversion means, and a control circuit for controlling the count-clock division ratio conversion means, the clock generation circuit further divides an output clock from the reference clock generation circuit and the reference clock generation circuit, 7. The arithmetic unit according to claim 6, further comprising a frequency divider for outputting to said arithmetic processing circuit. 8. The electronic moving speed measurement circuit includes: a clock generation circuit that outputs pulses at regular intervals; a delay circuit that causes a pulse from the clock generation circuit to cause a delay according to a temperature; An oscillator that changes the output frequency according to the time difference between the pulse and the pulse delayed by the delay circuit, and a frequency-voltage conversion circuit that converts the output frequency from the oscillator to a voltage value,
7. The clock generating circuit according to claim 6, further comprising: a frequency sweep circuit that sweeps an output frequency according to an input voltage and outputs the output frequency to the arithmetic processing circuit.
The arithmetic unit according to the above.