JPH11183337A - Sample holder - Google Patents

Sample holder

Info

Publication number
JPH11183337A
JPH11183337A JP9324860A JP32486097A JPH11183337A JP H11183337 A JPH11183337 A JP H11183337A JP 9324860 A JP9324860 A JP 9324860A JP 32486097 A JP32486097 A JP 32486097A JP H11183337 A JPH11183337 A JP H11183337A
Authority
JP
Japan
Prior art keywords
sample
movable member
donut
holder
shaped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP9324860A
Other languages
Japanese (ja)
Inventor
Hiroaki Fukuda
浩章 福田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP9324860A priority Critical patent/JPH11183337A/en
Publication of JPH11183337A publication Critical patent/JPH11183337A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To position a sample, taking the inner periphery of the doughnut-like sample as a reference, by fitting a partial cylindrical surface to the inner periphery of the doughnut-like sample to position the sample, and abutting the center hole contact surface of a movable member against the inner periphery of the doughnut-like sample. SOLUTION: A doughnut-like sample Sd is supported by a sample placing surface 4c of an upper sample support member 4. The diameter of a partial cylindrical surface 3i of a pair of projecting part 3h is fitted to the inner periphery of the sample Sd. Therefore, the sample Sd placed on the sample placing surface 4c is fixed by a center hole contact surface 14e of a movable member 12. The sample on the sample placing surface 4c is thus positioned by using the center hole of the sample Sd, so that a sample Sd larger than the outside diameter of the sample placing surface 4c is placed and positioned. Accordingly, a sample Sd with a large outside diameter can be observed and analyzed by use of the sample holder with a small outside diameter.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、試料に対する精密
作業を行う装置(電子顕微鏡装置、電子、X線等を用い
た分析装置)で使用する試料ホルダに関し、特に、ドー
ナツ状の試料を支持する試料ホルダに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample holder for use in an apparatus for performing precision work on a sample (an electron microscope, an analyzer using electrons, X-rays, etc.), and more particularly, to a donut-shaped sample. It relates to a sample holder.

【0002】[0002]

【従来の技術】X線マイクロアナライザーやEDS(En
ergy Dispersive X-ray Spectrometry:エネルギー分散
X線分光法)付走査型電子顕微鏡等でコンパクトディス
クやハードディスクのようなドーナツ状で薄片の形状の
試料の定量分析や観察を行う場合、最初に約100%純
度の標準試料が装着してある試料ホルダを使用して、前
記標準試料を元にして検量用のスペクトルを作成する。
次に、対象となる試料(ドーナツ状で薄片の形状の試
料)が装着できる別の試料ホルダと交換して、目標物を
観察し、前記検量用のスペクトルを用いて定量分析を行
う。前記ドーナツ状で薄片の形状の試料を分析および観
察する際に使用される試料ホルダとして、従来、下記
(J01)の技術が知られている。
2. Description of the Related Art X-ray microanalyzers and EDS (En
Quantitative analysis and observation of donut-shaped and thin-shaped specimens such as compact disks and hard disks using a scanning electron microscope with ergy dispersive X-ray spectrometry) is about 100% at first. Using a sample holder on which a standard sample of purity is mounted, a spectrum for calibration is created based on the standard sample.
Next, the target sample is replaced with another sample holder to which a target sample (a doughnut-shaped thin sample-shaped sample) can be mounted, a target object is observed, and quantitative analysis is performed using the calibration spectrum. As a sample holder used when analyzing and observing the donut-shaped sample in the form of a flake, the following technique (J01) is conventionally known.

【0003】(J01)図12〜図14に示す技術 図12は試料に対して精密作業を行う装置(電子顕微鏡
等)で使用される試料ホルダの一従来例の概略説明図で
ある。図13は試料ホルダを支持する試料ステージの説
明図で、前記図12の矢印XIII方向から見た図であ
る。図14は従来の試料ホルダの拡大説明図で、図14
Aは試料ホルダの平面図、図14Bは試料ホルダの正面
図である。なお、以後の説明の理解を容易にするため
に、図面において、前後方向をX軸方向、左右方向をY
軸方向、上下方向をZ軸方向とし、矢印X,−X,Y,
−Y,Z,−Zで示す方向または示す側をそれぞれ、前
方、後方、左方、右方、上方、下方、または、前側、後
側、左側、右側、上側、下側とする。また、図中、
「○」の中に「・」が記載されたものは紙面の裏から表
に向かう矢印を意味し、「○」の中に「×」が記載され
たものは紙面の表から裏に向かう矢印を意味するものと
する。
(J01) Technology shown in FIGS. 12 to 14 FIG. 12 is a schematic explanatory view of a conventional example of a sample holder used in an apparatus (such as an electron microscope) for performing precision work on a sample. FIG. 13 is an explanatory view of a sample stage supporting a sample holder, as viewed from the direction of the arrow XIII in FIG. FIG. 14 is an enlarged explanatory view of a conventional sample holder.
A is a plan view of the sample holder, and FIG. 14B is a front view of the sample holder. In order to facilitate understanding of the following description, in the drawings, the front-back direction is the X-axis direction, and the left-right direction is the Y-axis direction.
The axis direction and the vertical direction are defined as the Z-axis direction, and arrows X, -X, Y,
The directions or sides indicated by −Y, Z, and −Z are front, rear, left, right, upper, lower, or front, rear, left, right, upper, and lower, respectively. In the figure,
The one with "•" in "O" means an arrow heading from the back of the paper to the front, and the one with "X" in "O" means an arrow pointing from the front to the back of the paper. Shall mean.

【0004】図12、図13において、試料に対して精
密作業を行う際に使用される真空試料室(真空作業室)
A1内には、試料ステージSTが配置されている。試料
ステージSTは、X軸方向(前後方向)に延びる軸01
(図13参照)周りに回転可能を揺動アーム02に連結
された傾斜テーブル03を有している。この傾斜テーブ
ル03にはY軸方向に平行移動するY軸移動テーブル0
4、前記Y軸移動テーブル上面に支持されたX軸移動テ
ーブル06がそれぞれ支持されている。X軸移動テーブ
ル06上には、ホルダ保持テーブル07が設けられてい
る。図13に示すように前記上下軸回りに回転可能なホ
ルダ保持テーブル07上面には、上底の幅が下底の幅よ
りも広く形成された台形凸条08(図13参照)が形成
されている。この台形凸条08の上面には位置決め用凹
部08aが形成されている。前記符号02〜08で示さ
れた要素により、前記試料ステージSTが構成されてい
る。
In FIG. 12 and FIG. 13, a vacuum sample chamber (vacuum work chamber) used when performing precision work on a sample.
A sample stage ST is arranged in A1. The sample stage ST has an axis 01 extending in the X-axis direction (front-back direction).
(See FIG. 13) There is a tilt table 03 connected to the swing arm 02 so as to be rotatable around it. The tilt table 03 has a Y-axis moving table 0 that moves in parallel in the Y-axis direction.
4. The X-axis moving table 06 supported on the Y-axis moving table upper surface is respectively supported. On the X-axis movement table 06, a holder holding table 07 is provided. As shown in FIG. 13, a trapezoidal ridge 08 (see FIG. 13) is formed on the upper surface of the holder holding table 07 rotatable about the vertical axis, the upper base having a width larger than the lower base. I have. On the upper surface of the trapezoidal ridge 08, a positioning recess 08a is formed. The elements indicated by reference numerals 02 to 08 constitute the sample stage ST.

【0005】図12において、前記真空試料室(真空作
業室)A1には、試料交換室(予備排気室)A2が接続さ
れている。真空試料室A1と試料交換室A2の間には内部
仕切弁013が設けられている。内部仕切弁013は、
断面くさび型部材014,016およびそれらを連結す
る引張バネ017,017により構成されている。くさ
び型部材014上面には仕切弁開閉用シャフト018が
接続されている。仕切弁開閉用シャフト018上端部に
は油圧シリンダのピストン019が連結されている。ピ
ストン019は通常図12に示す位置にあり、油圧によ
り上下方向に移動可能になっている。
[0005] In FIG. 12, a sample exchange chamber (preliminary exhaust chamber) A2 is connected to the vacuum sample chamber (vacuum working chamber) A1. An internal gate valve 013 is provided between the vacuum sample chamber A1 and the sample exchange chamber A2. The internal gate valve 013 is
It is composed of cross-section wedge-shaped members 014, 016 and tension springs 017, 017 connecting them. A gate valve opening / closing shaft 018 is connected to the upper surface of the wedge-shaped member 014. A piston 019 of a hydraulic cylinder is connected to an upper end of the gate 018 for opening and closing the gate valve. The piston 019 is normally at the position shown in FIG. 12, and can be moved vertically by hydraulic pressure.

【0006】前記くさび型部材014上方には押圧バネ
021が設けられている。くさび型部材014は通常押
圧バネ021により下方に押圧されおり、くさび型部材
014が下方に押圧される押圧力は、くさび型部材01
4とくさび型部材016との当接面においてくさび型部
材016を図12において前方に押圧するように作用す
る。このとき、くさび型部材016は前記真空試料室0
1の外壁022に圧接し、内部仕切弁013が閉塞状態
になる。内部仕切弁013を開くときは、前記ピストン
019を上方に移動させる。ピストン019の上方への
移動に伴い前記くさび型部材014が上方へ移動され
る。このとき、引張バネ017,017により連結され
ているくさび型部材014も上方へ移動し、内部仕切弁
013が開放状態になる。また、試料交換室A2は外部
仕切弁(図示せず)を介して外部の大気と接続されてい
る。そして、試料交換室A2は図示しない真空装置によ
り真空にすることが可能に構成されている。
[0006] A pressing spring 021 is provided above the wedge-shaped member 014. The wedge-shaped member 014 is normally pressed downward by the pressing spring 21, and the pressing force with which the wedge-shaped member 014 is pressed downward is the wedge-shaped member 01.
At the contact surface between the wedge-shaped member 4 and the wedge-shaped member 016, the wedge-shaped member 016 acts to press forward in FIG. At this time, the wedge-shaped member 016 is connected to the vacuum sample chamber 0.
1 is pressed against the outer wall 022 and the internal gate valve 013 is closed. When opening the internal gate valve 013, the piston 019 is moved upward. As the piston 019 moves upward, the wedge-shaped member 014 moves upward. At this time, the wedge-shaped member 014 connected by the extension springs 017, 017 also moves upward, and the internal gate valve 013 is opened. The sample exchange chamber A2 is connected to the outside atmosphere via an external gate valve (not shown). The sample exchange chamber A2 is configured to be evacuated by a vacuum device (not shown).

【0007】前記試料交換室A2の外壁023に着脱可
能な交換棒支持部材023aにスライド可能に支持され
た試料交換棒024は、その内端部が前記試料交換室A
2内に配置され、その外端部は試料交換室A2外側に配置
されている。試料交換棒024の内端部にはホルダ支持
部026が設けられている。ホルダ支持部026にはネ
ジが形成されており、このネジが試料ホルダ027の被
支持孔028(図14参照)に螺合し、試料ホルダ02
7が保持される。前記試料交換棒024外端部には操作
部029が設けられている。
A sample exchange rod 024 slidably supported by an exchange rod support member 023a which is detachably attached to the outer wall 023 of the sample exchange chamber A2 has an inner end portion which is connected to the sample exchange chamber A2.
2 and its outer end is located outside the sample exchange chamber A2. A holder support portion 026 is provided at the inner end of the sample exchange rod 024. A screw is formed in the holder support portion 026, and the screw is screwed into a supported hole 028 (see FIG. 14) of the sample holder 027, and the sample holder 02 is screwed.
7 is held. An operation unit 029 is provided at the outer end of the sample exchange rod 024.

【0008】図14において、試料ホルダ027の下部
には、前記図13の台形凸条8に嵌合する台形溝031
が形成されている。図12、図14において、前記試料
ホルダ027の内部にはホルダ固定部材収容孔032が
形成されており、前記ホルダ固定部材収容孔032には
ホルダ固定球033が収容されている。前記ホルダ固定
球033は圧縮バネ034によって押圧されており、前
記台形溝031が前記試料ステージSTの台形凸条08
とスライド可能に嵌合した際に前記台形凸条08の位置
決め用凹部08a(図13参照)に当接して試料ホルダ
027が位置決めされる。図14において、試料ホルダ
027は、上部に円形の試料載置部035を有してい
る。試料載置部035にはドーナツ状の試料036が支
持されている。試料載置部035側面には試料位置決め
プレート037,037および試料押圧プレート038
が設けられている。試料押圧プレート038は引張バネ
039により円形の試料載置部035の中心側に引張ら
れており、前記試料036の外周が試料押圧プレート0
38により前記試料位置決めプレート037,037に
押圧されている。
In FIG. 14, a trapezoidal groove 031 fitted in the trapezoidal ridge 8 shown in FIG.
Are formed. 12 and 14, a holder fixing member receiving hole 032 is formed inside the sample holder 027, and a holder fixing ball 033 is received in the holder fixing member receiving hole 032. The holder fixing ball 033 is pressed by a compression spring 034, and the trapezoidal groove 031 is formed in the trapezoidal ridge 08 of the sample stage ST.
When the sample holder 027 is slidably fitted to the sample holder 027, the sample holder 027 is positioned by contacting the positioning recess 08a (see FIG. 13) of the trapezoidal ridge 08. In FIG. 14, the sample holder 027 has a circular sample mounting part 035 on the upper part. The sample mounting portion 035 supports a donut-shaped sample 036. A sample positioning plate 037, 037 and a sample pressing plate 038 are provided on the side surface of the sample mounting portion 035.
Is provided. The sample pressing plate 038 is pulled toward the center side of the circular sample mounting portion 035 by a tension spring 039.
38 presses against the sample positioning plates 037, 037.

【0009】[0009]

【発明が解決しようとする課題】前記(J01)の技術に
おいて、次の問題点がある。 (a)前記ドーナツ状の試料036の多くは内周側を基
準にして作製されている。したがって前記試料ホルダ0
27の試料位置決めプレート037,037によって前
記ドーナツ状の試料036の外周基準で試料ホルダ02
7に固定すると、試料ホルダ027の座標軸と前記内周
を基準にした前記試料036上の座標軸とが一致せず、
試料ホルダ027を移動して前記試料036上の観察お
よび分析をする際、前記試料036上の観察および分析
箇所の位置を精度良く位置決めできないという問題があ
る。 (b)前記試料ホルダ027は前記試料036の外周を
位置決めして試料ホルダ027に固定するため、前記試
料036の大きさより前記試料ホルダ027の試料載置
部035が大きくなる。前記試料載置部035が大きく
なると前記試料ホルダ027が大きくなり重くなる。ま
た、試料載置部035が試料よりも大きい場合には、前
記真空試料室A1内での試料ホルダ027に固定された
前記試料036のXY方向の移動範囲が狭くなるという
問題がある。
The technique (J01) has the following problems. (A) Most of the donut-shaped samples 036 are manufactured with reference to the inner peripheral side. Therefore, the sample holder 0
The sample holder 02 is set on the basis of the outer periphery of the donut-shaped sample 036 by the 27 sample positioning plates 037, 037.
7, the coordinate axes of the sample holder 027 and the coordinate axes on the sample 036 based on the inner circumference do not match,
When observing and analyzing the sample 036 by moving the sample holder 027, there is a problem in that the position of the observation and analysis point on the sample 036 cannot be accurately positioned. (B) Since the sample holder 027 positions the outer periphery of the sample 036 and fixes it to the sample holder 027, the sample mounting portion 035 of the sample holder 027 becomes larger than the size of the sample 036. When the sample mounting part 035 becomes large, the sample holder 027 becomes large and heavy. Further, when the sample mounting portion 035 is larger than the sample, there is a problem that the moving range of the sample 036 fixed to the sample holder 027 in the vacuum sample chamber A1 in the XY directions is narrowed.

【0010】(c)前記試料ホルダ027が大きくなり
且つ重くなると、前記試料ステージSTに固定した際、
試料ステージSTに負荷がかかるという問題点や、試料
ホルダ027および試料ステージSTに加わった振動の
減衰特性が悪くなるという問題がある。 (d)標準試料付き試料ホルダに前記ドーナツ状の試料
が装着できないので、最初に約100%純度の標準試料
が装着してある試料ホルダを使用した後、別の試料ホル
ダを用いて前記ドーナツ状の試料を観察、分析するた
め、時間がかかるとともに作業効率が悪いという問題が
ある。
(C) When the sample holder 027 is large and heavy, when it is fixed to the sample stage ST,
There is a problem that a load is applied to the sample stage ST, and a problem that attenuation characteristics of vibration applied to the sample holder 027 and the sample stage ST deteriorates. (D) Since the donut-shaped sample cannot be mounted on the sample holder with the standard sample, a sample holder on which a standard sample of about 100% purity is mounted first is used, and then the donut-shaped sample is mounted on another sample holder. Since the sample is observed and analyzed, there is a problem that it takes time and work efficiency is poor.

【0011】本発明は、前述の事情に鑑み、下記の記載
内容を課題とする。 (O01)ドーナツ状の試料の内周を基準にして前記試料
を位置決めすることができる試料ホルダを提供するこ
と。 (O02)試料ホルダを取替えることなく、標準試料と前
記ドーナツ状の試料の両方の測定が連続して行えるよう
にすること。
[0011] The present invention has been made in view of the above circumstances, and has the following content as an object. (O01) To provide a sample holder capable of positioning the sample with reference to the inner periphery of the donut-shaped sample. (O02) To be able to continuously measure both the standard sample and the donut-shaped sample without replacing the sample holder.

【0012】[0012]

【課題を解決するための手段】次に、前記課題を解決し
た本発明を説明するが、本発明の説明において本発明の
構成要素の後に付記したカッコ内の符号は、本発明の構
成要素に対応する後述の実施例の構成要素の符号であ
る。なお、本発明を後述の実施例の構成要素の符号と対
応させて説明する理由は、本発明の理解を容易にするた
めであり、本発明の範囲を実施例に限定するためではな
い。
Next, a description will be given of the present invention which has solved the above-mentioned problems. In the description of the present invention, reference numerals in parentheses added after constituent elements of the present invention denote constituent elements of the present invention. Reference numerals of corresponding components of the embodiment described later. The reason why the present invention is described in correspondence with the reference numerals of the components of the embodiments described later is to facilitate understanding of the present invention, and not to limit the scope of the present invention to the embodiments.

【0013】(本発明)前記課題を解決するために、本
発明の試料ホルダは、下記の要件を備えたことを特徴と
する、(A01)中央部に円形の中心孔が形成されたドー
ナツ状の試料(Sd)を載置する試料載置面(4c)と、
前記試料載置面(4c)に載置された前記試料(Sd)の
前記中心孔に嵌合する部分円筒面(3i)を有し且つ半
径方向に延びる可動部材ガイド溝(3g)を挟んで互い
に反対側に配置された一対の突出部(3h)と、前記突
出部(3h)上面に形成された標準試料(Ss)を収容す
る標準試料収容孔(3l)とを有する試料支持部材
(2)、(A02)前記半径方向に延びる可動部材ガイド
溝(3g)にスライド可能に配置されて、前記ドーナツ
状の試料(Sd)の前記中心孔に当接して前記試料(S
d)を固定する中心孔当接面(14e)を有する可動部材
(12)、(A03)前記可動部材(12)を半径方向外
方に付勢する試料固定用付勢手段(18)、(A04)前
記試料載置面(4c)に試料が載置されていないときに
前記可動部材(12)の半径方向外方への移動を規制す
る移動規制部材(4)、(A05)前記試料固定用付勢手
段(18)の付勢力に抗して前記可動部材(12)を半
径方向内方に移動させるための可動部材操作部(13
b)。
(The present invention) In order to solve the above problems, a sample holder of the present invention has the following requirements. (A01) A donut shape having a circular center hole formed in the center. A sample mounting surface (4c) on which the sample (Sd) is mounted;
The sample (Sd) mounted on the sample mounting surface (4c) has a partial cylindrical surface (3i) fitted into the center hole and has a movable member guide groove (3g) extending in the radial direction. A sample supporting member (2) having a pair of protrusions (3h) arranged on opposite sides of each other and a standard sample accommodation hole (31) for accommodating a standard sample (Ss) formed on the upper surface of the protrusion (3h). ), (A02) slidably disposed in the movable member guide groove (3g) extending in the radial direction, and comes into contact with the center hole of the donut-shaped sample (Sd) so as to contact the sample (S2).
(a) a movable member (12) having a center hole contact surface (14e) for fixing d), and (A03) a sample fixing urging means (18) for urging the movable member (12) outward in the radial direction; A04) A movement restricting member (4) for restricting the movement of the movable member (12) outward in the radial direction when no sample is mounted on the sample mounting surface (4c), (A05) the sample fixing. Movable member operating section (13) for moving the movable member (12) radially inward against the urging force of the urging means (18).
b).

【0014】(本発明の作用)前述の特徴を備えた本発
明の試料ホルダでは、試料支持部材(2)の試料載置面
(4c)には中央部に円形の中心孔が形成されたドーナ
ツ状の試料(Sd)が載置される。試料支持部材(2)
の半径方向に延びる可動部材ガイド溝(3g)を挟んで
互いに反対側に配置された一対の突出部(3h)は部分
円筒面(3i)を有しており、前記部分円筒面(3i)
は、前記試料載置面(4c)に載置された前記試料(S
d)の前記中心孔に嵌合して前記試料(Sd)を位置決め
する。前記試料支持部材(2)の一対の突出部(3h)
上面に形成された標準試料収容孔(3l)は、標準試料
(Ss)を収容する。前記半径方向に延びる可動部材ガ
イド溝(3g)にスライド可能に配置された可動部材
(12)は、試料固定用付勢手段(18)により、半径
方向外方に付勢される。前記試料載置面(4c)に試料
が載置されていないときには、前記可動部材(12)の
半径方向外方への移動は、移動規制部材(4)により規
制される。前記試料載置面(4c)に試料が載置されて
いる場合には、前記半径方向外方に付勢される前記可動
部材(12)の中心孔当接面(14e)は、前記ドーナ
ツ状の試料(Sd)の前記中心孔に当接して、ドーナツ
状試料(Sd)を固定する。したがって、前記部分円筒
面(3i)がドーナツ状の試料(Sd)の内周に嵌合して
前記試料(Sd)の位置決めをし、前記可動部材(1
2)の中心孔当接面(14e)が、ドーナツ状の試料
(Sd)の内周に当接して前記試料(Sd)を固定するの
で、ドーナツ状の試料(Sd)の内周を基準にして前記
試料(Sd)を位置決めすることができる。
(Operation of the present invention) In the sample holder of the present invention having the above-mentioned features, a donut in which a circular center hole is formed in the center of the sample mounting surface (4c) of the sample support member (2). A sample (Sd) in a shape of is placed. Sample support member (2)
A pair of protrusions (3h) arranged on opposite sides of the movable member guide groove (3g) extending in the radial direction has a partial cylindrical surface (3i), and has a partial cylindrical surface (3i).
Is the sample (S) mounted on the sample mounting surface (4c).
The sample (Sd) is positioned by fitting into the center hole of d). A pair of protrusions (3h) of the sample support member (2)
The standard sample accommodation hole (3l) formed on the upper surface accommodates the standard sample (Ss). The movable member (12) slidably disposed in the movable member guide groove (3g) extending in the radial direction is urged radially outward by the sample fixing urging means (18). When the sample is not placed on the sample placing surface (4c), the movement of the movable member (12) outward in the radial direction is regulated by the movement regulating member (4). When a sample is placed on the sample placing surface (4c), the center hole contact surface (14e) of the movable member (12) urged outward in the radial direction is the donut shape. The donut-shaped sample (Sd) is fixed by contacting the center hole of the sample (Sd). Accordingly, the partial cylindrical surface (3i) is fitted to the inner periphery of the donut-shaped sample (Sd) to position the sample (Sd), and the movable member (1
Since the center hole contact surface (14e) of 2) abuts on the inner periphery of the donut-shaped sample (Sd) to fix the sample (Sd), the inner periphery of the donut-shaped sample (Sd) is used as a reference. Thus, the sample (Sd) can be positioned.

【0015】前記試料載置面(4c)に対する試料(S
d)の脱着作業を行う際には、可動部材操作部(13b)
を半径方向内方に押圧すると、前記可動部材(12)
は、前記試料固定用付勢手段(18)の付勢力に抗して
半径方向内方に移動する。このとき、前記可動部材(1
2)の中心孔当接面(14e)および前記部分円筒面
(3i)は、前記ドーナツ状試料(Sd)の中心孔内に容
易に配置可能となる。したがって、この状態で前記試料
載置面(4c)への試料の着脱を行う。また、本発明の
試料ホルダ(1)には標準試料(Ss)を収容するため
の収容孔(31)も形成されているので、従来のように
標準試料(Ss)を支持するための試料ホルダとドーナ
ツ状の試料(Sd)を支持する試料ホルダを別々に使用
する必要がない。このため、標準試料(Ss)用の試料
ホルダとドーナツ状の試料(Sd)用の試料ホルダとを
交換する手間が省け、観察分析作業の効率が向上する。
The sample (S) on the sample mounting surface (4c)
When performing the desorption work of d), the movable member operation unit (13b)
Is pressed inward in the radial direction, the movable member (12)
Moves radially inward against the urging force of the urging means (18) for fixing the sample. At this time, the movable member (1
The center hole contact surface (14e) and the partial cylindrical surface (3i) of 2) can be easily arranged in the center hole of the donut-shaped sample (Sd). Therefore, the sample is attached to and detached from the sample mounting surface (4c) in this state. Further, since the sample holder (1) of the present invention is also provided with an accommodation hole (31) for accommodating the standard sample (Ss), the sample holder for supporting the standard sample (Ss) is different from the conventional one. There is no need to separately use a sample holder for supporting the donut-shaped sample (Sd). For this reason, it is not necessary to replace the sample holder for the standard sample (Ss) with the sample holder for the donut-shaped sample (Sd), and the efficiency of the observation and analysis work is improved.

【0016】[0016]

【発明の実施の形態】BEST MODE FOR CARRYING OUT THE INVENTION

【実施例】次に図面を参照しながら、本発明の実施の態
様の例(実施例)を説明するが、本発明は以下の実施例
に限定されるものではない。 (実施例1)図1は本発明の実施例1の試料ホルダの全
体説明図で、図1Aは同実施例1の試料ホルダの平面
図、図1Bは前記図1AのIB−IB線断面図である。図
2は前記図1で示した試料ホルダの説明図で、図2Aは
前記図1Aの矢印IIA方向から見た図、図2Bは前記図
1Bの矢印IIBで示された部分の拡大図である。図3は
試料ホルダを構成する下側試料支持部材の説明図で、図
3Aは下側試料支持部材の平面図、図3Bは前記図3A
の矢印IIIB方向から見た図である。図4は前記図3で
示した下側試料支持部材の他の方向から見た図で、図4
Aは前記図3AのIVA−IVA線断面図、図4Bは前記
図4Aの矢印IVB方向から見た図、図4Cは前記図4
Aの部分拡大図である。図5は試料ホルダを構成する上
側試料支持部材の説明図で、図5Aは上側試料支持部材
の平面図、図5Bは前記図5AのVB−VB線断面図で
ある。図6は操作用可動部材の斜視図である。図7は可
動部材の説明図で、図7Aは可動部材の平面図、図7B
は前記図7AのVIIB−VIIB線断面図である。図8は
本発明の実施例1の試料ホルダの作用説明図で、図8A
は試料ホルダにドーナツ状の試料を装着しようとする状
態を示す図、図8Bは試料ホルダにドーナツ状の試料を
装着した状態を示す図である。
Next, examples (embodiments) of embodiments of the present invention will be described with reference to the drawings, but the present invention is not limited to the following embodiments. (Embodiment 1) FIG. 1 is an overall explanatory view of a sample holder of Embodiment 1 of the present invention. FIG. 1A is a plan view of the sample holder of Embodiment 1, and FIG. It is. 2 is an explanatory view of the sample holder shown in FIG. 1, FIG. 2A is a view seen from the direction of arrow IIA in FIG. 1A, and FIG. 2B is an enlarged view of a part shown by arrow IIB in FIG. 1B. . FIG. 3 is an explanatory view of a lower sample supporting member constituting a sample holder, FIG. 3A is a plan view of the lower sample supporting member, and FIG. 3B is FIG.
FIG. 3 is a diagram viewed from the direction of arrow IIIB. FIG. 4 is a view of the lower sample supporting member shown in FIG.
4A is a cross-sectional view taken along the line IVA-IVA in FIG. 3A, FIG. 4B is a view as viewed from the direction of the arrow IVB in FIG. 4A, and FIG.
It is the elements on larger scale of A. FIG. 5 is an explanatory view of an upper sample supporting member constituting the sample holder. FIG. 5A is a plan view of the upper sample supporting member, and FIG. 5B is a cross-sectional view taken along line VB-VB of FIG. 5A. FIG. 6 is a perspective view of the operation movable member. 7A and 7B are explanatory views of the movable member, FIG. 7A is a plan view of the movable member, and FIG.
FIG. 7B is a sectional view taken along the line VIIB-VIIB in FIG. 7A. FIG. 8 is an operation explanatory view of the sample holder according to the first embodiment of the present invention.
FIG. 8B is a diagram illustrating a state in which a donut-shaped sample is to be mounted on the sample holder, and FIG. 8B is a diagram illustrating a state in which a donut-shaped sample is mounted on the sample holder.

【0017】図1において、本実施例の試料ホルダ1は
試料支持部材2(図1B参照)を有している。試料支持
部材2は下側試料支持部材3および前記下側試料支持部
材3の上面に固定される上側試料支持部材4により構成
される。図1〜図4において、下側試料支持部材3の下
部には台形溝3aが形成されている。この台形溝3aは前
記従来技術の図12、図13に示す試料ステージSTの
台形凸条08と同様の台形凸条(図示せず)に嵌合する
溝である。前記台形溝3aは、図4Bに示すように前記
図示しない台形凸条と嵌合し易いように前記台形溝3a
の前端部の幅は前端(X端)に行くに従って大きくなる
ように形成されている。
In FIG. 1, the sample holder 1 of the present embodiment has a sample support member 2 (see FIG. 1B). The sample support member 2 includes a lower sample support member 3 and an upper sample support member 4 fixed to the upper surface of the lower sample support member 3. 1 to 4, a trapezoidal groove 3a is formed in the lower part of the lower sample supporting member 3. The trapezoidal groove 3a is a groove that fits into a trapezoidal ridge (not shown) similar to the trapezoidal ridge 08 of the sample stage ST shown in FIGS. As shown in FIG. 4B, the trapezoidal groove 3a is formed so that the trapezoidal groove 3a can be easily fitted with the trapezoidal ridge (not shown).
Is formed so that the width of the front end portion of the front end portion becomes larger toward the front end (X end).

【0018】前記下側試料支持部材3の中心部には前記
台形溝3a側に開口するホルダ固定部材収容孔3bが形成
されている。ホルダ固定部材収容孔3bの内周面には雌
ネジ(図4C参照)が形成されている。図1〜図4にお
いて、前記下側試料支持部材3には交換棒装着孔3c
(図2A参照)が形成されている。この交換棒装着孔3
cは前記従来技術の図12の試料交換棒024と同様の
試料交換棒(図示せず)が装着される孔である。また、
前記下側試料支持部材3の左右両側面には圧縮バネ支持
面3d,3d(図3B、図4B参照)が形成されている。
At the center of the lower sample supporting member 3, a holder fixing member receiving hole 3b opening toward the trapezoidal groove 3a is formed. A female screw (see FIG. 4C) is formed on the inner peripheral surface of the holder fixing member receiving hole 3b. 1 to 4, the lower sample support member 3 has an exchange rod mounting hole 3c.
(See FIG. 2A). This replacement rod mounting hole 3
c is a hole in which a sample exchange rod (not shown) similar to the sample exchange rod 024 of FIG. Also,
Compression spring support surfaces 3d, 3d (see FIGS. 3B and 4B) are formed on both left and right side surfaces of the lower sample support member 3.

【0019】前記下側試料支持部材3はその上部にフラ
ンジ部3eを有している。図3、図4において、前記フ
ランジ部3eは左右両側面は平面に形成されており、前
後両側面は円弧面に形成され、前記各円弧面の中央部に
は切除部3f,3fが形成されている。図3Aにおいて、
前記フランジ部3eの上面には上面中央部を通り且つ左
右方向に延びるガイド溝3gが形成されている。前記フ
ランジ部3eの上面中央部で前記ガイド溝3gの前後両側
には上方(Z方向)に突出する一対の突出部3hが形成
されており、各突出部3hは部分円筒面3iを有してい
る。また、前記フランジ部3eの上面には4個のネジ孔
3jが形成されている。
The lower sample support member 3 has a flange portion 3e on its upper part. 3 and 4, the left and right side surfaces of the flange portion 3e are formed as flat surfaces, the front and rear side surfaces are formed as circular arc surfaces, and cut portions 3f and 3f are formed at the center of each of the circular arc surfaces. ing. In FIG. 3A,
A guide groove 3g is formed on the upper surface of the flange 3e so as to pass through the center of the upper surface and extend in the left-right direction. A pair of protrusions 3h projecting upward (in the Z direction) are formed on both front and rear sides of the guide groove 3g at the center of the upper surface of the flange 3e, and each protrusion 3h has a partial cylindrical surface 3i. I have. Four screw holes 3j are formed on the upper surface of the flange 3e.

【0020】図2B、図4Cにおいて前記一対の突出部
3hの上面には、上下方向(Z軸方向)すなわち前記一
対の突出部3hの上面から前記下側試料支持部材3の台
形溝3a方向に貫通する複数の標準試料収容孔3lが形成
されている。図4Cにおいて、前記標準試料収容孔3l
は前記一対の突出部3hの上面側に形成された開口部3l
1と、前記開口部3l1の下方(−Z方向)で前記開口部
3l1の内径より径の大きい標準試料収容部3l2と、前記
標準試料収容部3l2の下方(−Z方向)の内周面にネジ
が形成されたネジ部3l3とを有している。
2B and 4C, the upper surfaces of the pair of protrusions 3h are arranged in the vertical direction (Z-axis direction), that is, in the direction of the trapezoidal groove 3a of the lower sample support member 3 from the upper surface of the pair of protrusions 3h. A plurality of standard sample accommodation holes 31 penetrating therethrough are formed. In FIG. 4C, the standard sample receiving hole 3l
Is an opening 3l formed on the upper surface side of the pair of protrusions 3h.
1, a standard sample container 312 having a diameter larger than the inner diameter of the opening 311 below the opening 311 (in the -Z direction), and an inner peripheral surface below the standard sample container 312 (in the -Z direction). And a screw portion 3l3 in which a screw is formed.

【0021】前記下側試料支持部材3のフランジ部3e
上面には略円板状の上側試料支持部材4が配置されてい
る。図5において、前記上側試料支持部材4の前後方向
には前記フランジ部3eの切除部3f,3fに対応する位
置に上側試料支持部材4の切除部4a,4aが形成されて
いる。前記上側試料支持部材4の中心部には突出部嵌合
孔4bが形成されており、前記下側試料支持部材3の一
対の突出部3hが嵌合する。前記上側試料支持部材4の
上面には、その中央部の前記突出部嵌合孔4bの外周部
に沿ってリング状の内側試料載置面4c1が形成され、そ
の外周縁に沿ってリング状の外側試料載置面4c2が形成
されている。前記リング状の内側試料載置面4c1および
外側試料載置面4c2により試料載置面4cが形成されて
いる。前記上側試料支持部材4の上面は、前記リング状
の内側試料載置面4c1および外側試料載置面4c2の間に
は下方に凹んだ平坦な凹部4dに形成されている。前記
凹部4dには、前記フランジ部3e上面のネジ孔3jと対
応する位置にネジ貫通孔4eが形成されており、前記上
側試料支持部材4は前記各ネジ貫通孔4eおよび前記フ
ランジ部3e上面の各ネジ孔3jに螺合するネジ6(図1
参照)によって前記フランジ部3e上面に固定される。
前記試料支持部材2は、前記ネジ6により固定された下
側試料支持部材3および上側試料支持部材4により構成
されている。
The flange portion 3e of the lower sample supporting member 3
A substantially disk-shaped upper sample support member 4 is disposed on the upper surface. In FIG. 5, in the front-rear direction of the upper sample support member 4, cut portions 4a, 4a of the upper sample support member 4 are formed at positions corresponding to the cut portions 3f, 3f of the flange portion 3e. A protrusion fitting hole 4b is formed at the center of the upper sample support member 4, and a pair of protrusions 3h of the lower sample support member 3 are fitted. On the upper surface of the upper sample support member 4, a ring-shaped inner sample mounting surface 4c1 is formed along the outer peripheral portion of the projecting portion fitting hole 4b at the center thereof, and a ring-shaped inner sample mounting surface 4c is formed along the outer peripheral edge thereof. An outer sample mounting surface 4c2 is formed. The ring-shaped inner sample mounting surface 4c1 and outer sample mounting surface 4c2 form a sample mounting surface 4c. The upper surface of the upper sample support member 4 is formed as a flat concave portion 4d which is recessed downward between the ring-shaped inner sample mounting surface 4c1 and the outer sample mounting surface 4c2. In the recess 4d, a screw through hole 4e is formed at a position corresponding to the screw hole 3j on the upper surface of the flange 3e, and the upper sample support member 4 is provided on the upper surface of each of the screw through holes 4e and the upper surface of the flange 3e. A screw 6 (see FIG. 1) that is screwed into each screw hole 3j
) Is fixed to the upper surface of the flange portion 3e.
The sample support member 2 includes a lower sample support member 3 and an upper sample support member 4 fixed by the screws 6.

【0022】図1Bに示すように雌ネジが形成されたホ
ルダ固定部材収容孔3bにはホルダ固定球7が収容され
ている。前記ホルダ固定球7は圧縮バネ8によって下方
に押圧されており、圧縮バネ8によって押圧されたホル
ダ固定球7は外に飛びださないように球支持部材9によ
って支持されている。前記球支持部材9はその中央の貫
通孔から前記ホルダ固定球7の球面の一部が出るに支持
しており、前記球支持部材9はホルダ固定部材収容孔3
bの下端部の雌ネジに螺合して装着されている。図1
B、図2Bに示すように前記標準試料収容部3l2には標
準試料Ssを装着した標準試料保持部材11が収容され
ている。前記標準試料保持部材11はその上端部に標準
試料Ssを収容する凹部を有し、下部には前記ネジ部3l
3に螺合する雄ネジを有している。
As shown in FIG. 1B, a holder fixing ball 7 is accommodated in the holder fixing member accommodating hole 3b formed with a female screw. The holder fixing ball 7 is pressed downward by a compression spring 8, and the holder fixing ball 7 pressed by the compression spring 8 is supported by a ball support member 9 so as not to jump out. The sphere support member 9 is supported so that a part of the spherical surface of the holder fixing sphere 7 comes out of the central through hole.
It is screwed into the female screw at the lower end of b. FIG.
B, As shown in FIG. 2B, a standard sample holding member 11 on which a standard sample Ss is mounted is housed in the standard sample holding unit 31. The standard sample holding member 11 has a concave portion for accommodating the standard sample Ss at an upper end thereof, and a screw portion 3l at a lower portion thereof.
It has a male screw that is screwed into 3.

【0023】図1、図2、図8において前記フランジ部
3e上面のガイド溝3gには左右一対の可動部材12がY
軸方向にスライド可能に支持されている。前記各可動部
材12は、L字状の操作用可動部材13(図6参照)と
前記操作用可動部材13の内端部に連結された試料固定
用可動部材14により構成されている。図6、図8から
分かるように、前記各操作用可動部材13の中心側端部
には2個の連結用ネジ孔13aが形成されており、前記
各操作用可動部材13の外方側端部には下方に延びる可
動部材操作部13bが形成されている。前記可動部材操
作部13bには、1つのバネ圧調節用ネジ孔13cが形成
されている。
In FIGS. 1, 2 and 8, a pair of left and right movable members 12 is provided in a guide groove 3g on the upper surface of the flange portion 3e.
It is slidably supported in the axial direction. Each of the movable members 12 includes an L-shaped operation movable member 13 (see FIG. 6) and a sample fixing movable member 14 connected to an inner end of the operation movable member 13. As can be seen from FIGS. 6 and 8, two connection screw holes 13 a are formed at the center side end of each of the operation movable members 13, and the outer side end of each of the operation movable members 13 is formed. A movable member operating portion 13b extending downward is formed in the portion. The movable member operating portion 13b has one screw hole 13c for adjusting spring pressure.

【0024】図7において、前記各試料固定用可動部材
14はネジ孔形成部14aを有しており、前記ネジ孔形
成部14aには前記可動部材連結ネジ15が貫通するネ
ジ貫通孔14b,14bが形成されている。図1、図2に
おいて、前記各操作用可動部材13の中心側端部と前記
試料固定用可動部材14は、前記各可動部材連結用ネジ
孔13aに螺合する可動部材連結ネジ15によって連結
されている。また、前記試料固定用可動部材14は、前
記一対の突出部3hの部分円筒面3i,3iと同一の曲率
を有する部分円筒状の外側面14c(図7B参照)を有
している。前記外側面14cの上端には係合部14dが設
けられ、係合部14dには上方に行くに従って外側に傾
斜する中心孔当接面14eが形成されている。前記中心
孔当接面14e下端は前記外側面14cの上端に滑らかに
接続している。前記中心孔当接面14eは、図2Bに示
すように、前記ドーナツ状の試料Sdが試料ホルダ1に
装着された状態で、前記一対の突出部3hの部分円筒面
3i,3iを含む円周の外側に移動して前記ドーナツ状試
料Sdの中心孔に当接し、前記ドーナツ状試料Sdを固定
する。
In FIG. 7, each of the sample fixing movable members 14 has a screw hole forming portion 14a, and the screw hole forming portion 14a has screw through holes 14b, 14b through which the movable member connecting screws 15 pass. Are formed. In FIGS. 1 and 2, the center side end of each of the operation movable members 13 and the sample fixing movable member 14 are connected by a movable member connection screw 15 screwed into each of the movable member connection screw holes 13 a. ing. The sample fixing movable member 14 has a partial cylindrical outer surface 14c (see FIG. 7B) having the same curvature as the partial cylindrical surfaces 3i of the pair of protrusions 3h. An engaging portion 14d is provided at an upper end of the outer surface 14c, and a center hole contact surface 14e that is inclined outward as it goes upward is formed in the engaging portion 14d. The lower end of the center hole contact surface 14e is smoothly connected to the upper end of the outer surface 14c. As shown in FIG. 2B, the center hole contact surface 14e has a circumference including the partial cylindrical surfaces 3i, 3i of the pair of protrusions 3h when the donut-shaped sample Sd is mounted on the sample holder 1. To abut the center hole of the donut-shaped sample Sd to fix the donut-shaped sample Sd.

【0025】図1B、図8において、前記バネ圧調節用
ネジ貫通孔13cにはバネ圧調節用ネジ16のネジ部1
6aが螺合して、外側から内側に貫通している。前記バ
ネ圧調節用ネジ16は前記ネジ部16aの先端側にネジ
部16aの外径より径の小さい小径先端部16bを有して
いる。前記ネジ部16aおよび小径先端部16bの境界部
にはバネ受けワッシャ17が装着されている。前記小径
先端部16b周囲には圧縮バネ(試料固定用付勢手段)
18が配置されており、圧縮バネ18の内端は前記圧縮
バネ支持面3dに支持され、外端は前記バネ受けワッシ
ャ17に支持されている。前記圧縮バネ18は前記バネ
受けワッシャ17およびバネ圧調節用ネジ16を介して
常時、前記操作用可動部材13を外方に押圧している。
したがって、前記操作用可動部材13および試料固定用
可動部材14により構成される可動部材12は常時外方
に付勢されている。
In FIG. 1B and FIG. 8, the screw portion 1 of the spring pressure adjusting screw 16 is inserted into the spring pressure adjusting screw through hole 13c.
6a is screwed and penetrates from outside to inside. The spring pressure adjusting screw 16 has a small-diameter distal end portion 16b having a smaller diameter than the outer diameter of the screw portion 16a on the distal end side of the screw portion 16a. A spring receiving washer 17 is mounted on a boundary between the screw portion 16a and the small-diameter tip portion 16b. A compression spring (a biasing means for fixing the sample) is provided around the small diameter tip portion 16b.
The compression spring 18 has an inner end supported by the compression spring support surface 3d and an outer end supported by the spring receiving washer 17. The compression spring 18 constantly presses the operation movable member 13 outward through the spring receiving washer 17 and the spring pressure adjusting screw 16.
Therefore, the movable member 12 constituted by the operation movable member 13 and the sample fixing movable member 14 is constantly urged outward.

【0026】図1Bにおいて、前記試料載置面4c上に
ドーナツ状試料Sdが載置されていない場合、前記常時
外方に付勢される可動部材12は、前記突出部材嵌合孔
4bの内周縁に当接して移動が規制されている。したが
って、この実施例1では前記突出部材嵌合孔4bの形成
された前記上側試料支持部材4は、前記可動部材12の
外方への移動を規制する移動規制部材としての機能を有
している。なお、前記移動規制部材は別の部材を用いて
構成することが可能である。前記試料ホルダ1の左右方
向に配置された前記一対の可動部材12を外方に付勢す
る前記一対の圧縮バネ18,18は同様のバネ圧を有す
るように構成されており、前記両圧縮バネ18,18の
バネ圧が異なる場合には、前記各バネ圧調節用ネジ16
を左右方向に移動させて調節できるようになっている。
In FIG. 1B, when the donut-shaped sample Sd is not mounted on the sample mounting surface 4c, the movable member 12 which is constantly urged outward is positioned inside the projecting member fitting hole 4b. Movement is restricted by contacting the periphery. Therefore, in the first embodiment, the upper sample support member 4 in which the projecting member fitting hole 4b is formed has a function as a movement restricting member for restricting the movable member 12 from moving outward. . Note that the movement restricting member can be configured using another member. The pair of compression springs 18, 18 for urging the pair of movable members 12 arranged in the left and right direction of the sample holder 1 outward have the same spring pressure. If the spring pressures of the springs 18 and 18 are different from each other,
Can be adjusted by moving it to the left or right.

【0027】図1、図2において、前記上側試料支持部
材4の試料載置面4cによってドーナツ状の試料Sd(2
点鎖線で示す)が支持される。前記一対の突出部3hの
部分円筒面3iの直径は、前記ドーナツ状の試料Sdの内
周に嵌合する大きさに設定されている。このため、試料
載置面4c上に載置されたドーナツ状の試料Sdは、前記
可動部材12の中心孔当接面14eにより固定される。
本実施例1では、試料載置面4c上のドーナツ状試料Sd
の位置決めはドーナツ状試料Sdの中心孔を用いて行う
ので、試料載置面4cの外径よりも大きな試料Sdを載置
して位置決めすることができる。したがって、外径の小
さな試料ホルダ1を使用して大きな外径の試料の観察、
分析が可能である。
1 and 2, a donut-shaped sample Sd (2) is set by the sample mounting surface 4c of the upper sample support member 4.
(Indicated by a dashed line) is supported. The diameter of the partial cylindrical surfaces 3i of the pair of protrusions 3h is set to a size that fits into the inner periphery of the donut-shaped sample Sd. Therefore, the donut-shaped sample Sd mounted on the sample mounting surface 4c is fixed by the center hole contact surface 14e of the movable member 12.
In the first embodiment, the donut-shaped sample Sd on the sample mounting surface 4c
Is performed using the center hole of the donut-shaped sample Sd, so that the sample Sd larger than the outer diameter of the sample mounting surface 4c can be mounted and positioned. Therefore, observation of a sample with a large outer diameter using the sample holder 1 with a small outer diameter,
Analysis is possible.

【0028】(実施例1の作用)図1、図2において前
記一対の突出部3h上面に形成された各標準試料収容孔
3lの標準試料収容部3h2には標準試料Ssを装着した標
準試料保持部材11をそれぞれ入れて前記標準試料保持
部材11を固定する。図8Aにおいて観察者が前記左右
一対の操作用可動部材13のうちのいずれか一方の外端
側の可動部材操作部13bを内端側に押圧すると、前記
操作用可動部材13の内端部に連結された前記試料固定
用可動部材14がガイド溝3g内でスライド移動し、こ
のとき前記試料固定用可動部材14の係合部14dが前
記一対の突出部3hの部分円筒面3i,3iの円周の内側
に移動する。この状態では前記上側試料支持部材4の試
料載置面4c上にドーナツ状試料Sdを載置することが可
能となる。したがって次に、前記試料載置面4c上にド
ーナツ状の試料Sdを載置する。この状態において前記
ドーナツ状の試料Sdの中心孔の内周が前記一対の突出
部3hの部分円筒面3i,3iおよび前記内側に移動させ
ていない方の中心孔当接面14eに嵌合する。
(Operation of Embodiment 1) In FIGS. 1 and 2, the standard sample holding section 3h2 in each of the standard sample receiving holes 3l formed on the upper surface of the pair of protrusions 3h holds the standard sample Ss. The standard sample holding member 11 is fixed by inserting the members 11 respectively. In FIG. 8A, when the observer presses any one of the pair of left and right operation movable members 13 on the outer end side of the movable member operation portion 13b toward the inner end side, the inner end of the operation movable member 13 The connected movable member 14 for sample fixing slides within the guide groove 3g, and at this time, the engaging portion 14d of the movable member 14 for sample fixing is moved to the circle of the partial cylindrical surfaces 3i, 3i of the pair of protrusions 3h. Move inside the circumference. In this state, the donut-shaped sample Sd can be mounted on the sample mounting surface 4c of the upper sample support member 4. Therefore, next, the donut-shaped sample Sd is mounted on the sample mounting surface 4c. In this state, the inner periphery of the center hole of the donut-shaped sample Sd fits into the partial cylindrical surfaces 3i, 3i of the pair of protrusions 3h and the center hole contact surface 14e which is not moved inward.

【0029】図8Bにおいて、観察者が可動部材操作部
13bの内側への押圧を解除すると、前記操作用可動部
材13を外端側に付勢する圧縮バネ18により、前記操
作用可動部材13および試料固定用可動部材14が外方
に移動する。このとき前記試料固定用可動部材14の係
合部14dが前記一対の部分円筒面3i,3iの円周の外
側に向かって移動する。このとき、前記左右一対の試料
固定用可動部材14の当接面14eがドーナツ状試料Sd
の中心孔の内周縁に当接して、ドーナツ状試料Sdが固
定される。すなわち、ドーナツ状試料Sdはその中心孔
の内周縁を基準に固定される。
In FIG. 8B, when the observer releases the pressure on the inside of the movable member operating portion 13b, the operation movable member 13 and the movable member 13 are pressed by a compression spring 18 which urges the operation movable member 13 to the outer end side. The sample fixing movable member 14 moves outward. At this time, the engaging portion 14d of the sample fixing movable member 14 moves toward the outside of the circumference of the pair of partial cylindrical surfaces 3i, 3i. At this time, the contact surfaces 14e of the pair of left and right sample fixing movable members 14 are
The donut-shaped sample Sd is fixed in contact with the inner peripheral edge of the center hole. That is, the donut-shaped sample Sd is fixed with reference to the inner peripheral edge of the center hole.

【0030】前記ドーナツ状の試料Sdを試料ホルダ1
から取り外す場合には前記操作用可動部材13を内端側
に押圧して前記部分円筒面3i,3iの円周の内側に移動
させる。このとき、前記係合部14dの中心孔当接面1
4eが前記円弧状の部分円筒面3i,3iの円周の内側に
移動して、前記ドーナツ状の試料Sdの内周との当接を
解除する。この状態で前記ドーナツ状試料Sdを試料ホ
ルダ1から取り出すことができる。前記実施例1では、
試料ホルダ1上のドーナツ状試料Sdの位置決めはドー
ナツ状試料Sdの中心孔の内周を基準に行われるので、
試料ホルダ1の座標軸とドーナツ状の試料Sdの内周を
基準にした座標軸とを一致させることができる。したが
って、前記ドーナツ状試料Sdの内周を基準とした座標
軸上における、前記ドーナツ状試料Sd上の観察、測長
または分析する箇所の座標を、電子ビーム照射位置に精
度良く移動させることが可能となる。
The donut-shaped sample Sd is placed in the sample holder 1.
When the operation movable member 13 is to be removed from the inside, the operation movable member 13 is pressed toward the inner end side and moved inside the circumference of the partial cylindrical surfaces 3i, 3i. At this time, the center hole contact surface 1 of the engaging portion 14d
4e moves inside the circumference of the arcuate partial cylindrical surfaces 3i, 3i to release the abutment with the inner circumference of the donut-shaped sample Sd. In this state, the donut-shaped sample Sd can be taken out of the sample holder 1. In the first embodiment,
Since the positioning of the donut-shaped sample Sd on the sample holder 1 is performed with reference to the inner periphery of the center hole of the donut-shaped sample Sd,
The coordinate axes of the sample holder 1 and the coordinate axes based on the inner circumference of the donut-shaped sample Sd can be matched. Therefore, it is possible to accurately move the coordinates of the observation, length measurement, or analysis point on the donut-shaped sample Sd on the coordinate axes based on the inner circumference of the donut-shaped sample Sd to the electron beam irradiation position. Become.

【0031】また、ドーナツ状の試料Sdの内周側を基
準に位置決めするので、前記上側試料支持部材4の外径
は前記試料Sdの外径よりも小さくても本実施例1の試
料ホルダ1を使用して観察等が可能である。したがっ
て、前記試料ホルダ1が大きい場合に真空試料室内の試
料ホルダ1のXY方向の移動が制限されることに起因し
て試料の移動範囲が制限されるようなことはない。ま
た、前記試料ホルダ1が大きく且つ重くならないので、
試料ステージに装着した際、試料ステージに負荷がかか
り、耐震性が悪くなるようなことも生じない。さらに、
前記試料ホルダ1には標準試料Ssを収容するための収
容孔3lが形成されているので、標準試料Ss用の試料ホ
ルダとドーナツ状試料Sd用の試料ホルダとを交換する
手間が省ける。
Since the donut-shaped sample Sd is positioned with reference to the inner peripheral side, the sample holder 1 of the first embodiment can be used even if the outer diameter of the upper sample support member 4 is smaller than the outer diameter of the sample Sd. Can be used for observation and the like. Therefore, when the sample holder 1 is large, the movement range of the sample is not limited due to the restriction of the movement of the sample holder 1 in the XY directions in the vacuum sample chamber. Also, since the sample holder 1 is not large and heavy,
When mounted on the sample stage, the load is not applied to the sample stage, and the seismic resistance does not deteriorate. further,
Since the sample holder 1 is provided with the accommodation hole 31 for accommodating the standard sample Ss, the labor for exchanging the sample holder for the standard sample Ss and the sample holder for the donut-shaped sample Sd can be omitted.

【0032】(実施例2)図9は本発明の実施例2の試
料ホルダの説明図で、図9Aは実施例2の試料ホルダの
平面図、図9Bは前記図9AのIXB−IXB線断面図で
ある。なお、この実施例2の説明において、前記実施例
1の構成要素に対応する構成要素には同一の符号を付し
て、その詳細な説明を省略する。この実施例2は、下記
の点で前記実施例1と相違しているが、他の点では前記
実施例1と同様に構成されている。この実施例2の一対
の突出部3hの上面に形成された可動部材ガイド溝3gの
右側(−Y側)部分には、前記実施例1の試料固定用可
動部材14代わりに試料固定用固定部材14′が固定さ
れている。したがって、前記実施例1の右側(−Y側)
の試料固定用可動部材14に連結される操作用可動部材
13、バネ圧調節用ネジ16および圧縮バネ18は省略
される。この実施例2においても前記実施例1と同様の
作用を奏する。
(Embodiment 2) FIG. 9 is an explanatory view of a sample holder of Embodiment 2 of the present invention. FIG. 9A is a plan view of the sample holder of Embodiment 2, and FIG. 9B is a cross section taken along line IXB-IXB of FIG. 9A. FIG. In the description of the second embodiment, components corresponding to the components of the first embodiment are denoted by the same reference numerals, and detailed description thereof will be omitted. The second embodiment differs from the first embodiment in the following points, but has the same configuration as the first embodiment in other points. On the right side (−Y side) of the movable member guide groove 3g formed on the upper surface of the pair of protrusions 3h of the second embodiment, a sample fixing member is used instead of the sample fixing movable member 14 of the first embodiment. 14 'is fixed. Therefore, the right side (−Y side) of the first embodiment.
The operation movable member 13, the spring pressure adjusting screw 16 and the compression spring 18 connected to the sample fixing movable member 14 are omitted. The second embodiment has the same operation as the first embodiment.

【0033】(実施例3)図10は本発明の実施例3の
試料ホルダの説明図で、図10Aは実施例3の試料ホル
ダの平面図、図10Bは前記図10AのXB−XB線断
面図、図10Cは同試料ホルダの可動部材の斜視図、図
10Dは前記図10Aの矢印XD方向から見た図であ
る。なお、この実施例3の説明において、前記実施例1
の構成要素に対応する構成要素には同一の符号を付し
て、その詳細な説明を省略する。この実施例3は、下記
の点で前記実施例1と相違しているが、他の点では前記
実施例1と同様に構成されている。図10において、こ
の実施例3では可動部材12は、操作用可動部材23と
試料固定用可動部材24とにより構成されている。操作
用可動部材23は、L字型に折り曲げた断面円形のシャ
フトにより構成されており、操作用可動部材23の内端
部には断面円形の外側面の一側が削られて平面部23a
(図10C参照)が形成されている。また、操作用可動
部材23の外端部には下方に延びる可動部材操作部23
bが設けられている。前記可動部材操作部23bの下端部
には断面円形の外側面の両側が切除されて平板部が形成
されており、前記平板部にはネジ孔23cが形成されて
いる。
(Embodiment 3) FIG. 10 is an explanatory view of a sample holder of Embodiment 3 of the present invention. FIG. 10A is a plan view of the sample holder of Embodiment 3, and FIG. 10B is a cross section taken along line XB-XB of FIG. 10A. FIG. 10C is a perspective view of a movable member of the sample holder, and FIG. 10D is a view seen from the arrow XD direction of FIG. 10A. In the description of the third embodiment, the first embodiment
The same reference numerals are given to constituent elements corresponding to the above-mentioned constituent elements, and detailed description thereof will be omitted. The third embodiment differs from the first embodiment in the following points, but has the same configuration as the first embodiment in other points. In FIG. 10, in the third embodiment, the movable member 12 includes a movable member 23 for operation and a movable member 24 for fixing the sample. The operation movable member 23 is formed of an L-shaped bent shaft having a circular cross section, and an inner end portion of the operation movable member 23 has a flat outer surface with a circular outer surface cut off.
(See FIG. 10C). A movable member operating portion 23 extending downward is provided at an outer end of the movable member 23 for operation.
b is provided. At the lower end of the movable member operating portion 23b, both sides of an outer surface having a circular cross section are cut off to form a flat plate portion, and a screw hole 23c is formed in the flat plate portion.

【0034】前記平面部23aに連結されるピンにより
構成された試料固定用可動部材24は、上端部24aが
円柱状に形成されその下側部分は下方に行くに従って直
径がわずかに縮小する円錐状に形成されている。そして
その下端部には直径の小さなネジ24bが形成されてい
る。ネジ24bは前記平面部23aのネジ孔にねじ込まれ
て固定される部分である。前記試料固定用可動部材24
の円柱状の上端部24aは、前記一対の突出部3hの間に
形成された可動部材ガイド溝3gに嵌合してスライド移
動可能な幅に形成されている。前記試料固定用可動部材
24の右方(−Y方向)には試料固定用固定部材24′
が前記ガイド溝3gに固定されている。前記試料固定用
固定部材24′は前記試料固定用可動部材24を長くし
た形状に構成されて、下側試料支持部3に直接固定され
ている。
The movable member 24 for fixing a sample, which is constituted by a pin connected to the flat portion 23a, has a conical shape whose upper end portion 24a is formed in a columnar shape and whose lower portion has a diameter which is slightly reduced as it goes downward. Is formed. A screw 24b having a small diameter is formed at the lower end. The screw 24b is a portion that is screwed into the screw hole of the flat portion 23a and fixed. The sample fixing movable member 24
The cylindrical upper end portion 24a is formed to have a width capable of fitting and sliding in the movable member guide groove 3g formed between the pair of protrusions 3h. To the right (-Y direction) of the sample fixing movable member 24, a sample fixing fixing member 24 'is provided.
Is fixed to the guide groove 3g. The sample fixing fixing member 24 ′ is formed in a shape in which the sample fixing movable member 24 is elongated, and is directly fixed to the lower sample supporting section 3.

【0035】前記操作用可動部材23の前記ネジ孔23
cにはバネ圧調節用ネジ16が螺合して貫通している。
前記バネ圧調節用ネジ16の先端部は前記試料支持部材
2に固定された板バネ27に当接する。前記板バネ27
の一端は試料ホルダ1のフランジ部3eの裏面側に固定
されている。この実施例3も前記実施例2と同様の作用
を奏する。
The screw hole 23 of the operation movable member 23
A screw 16 for adjusting the spring pressure is threaded through c.
The tip of the spring pressure adjusting screw 16 abuts on a leaf spring 27 fixed to the sample support member 2. The leaf spring 27
Is fixed to the back side of the flange portion 3e of the sample holder 1. The third embodiment also has the same operation as the second embodiment.

【0036】(実施例4)図11は本発明の実施例4の
試料ホルダの説明図で、図11Aは実施例4の試料ホル
ダの平面図、図11Bは前記図11AのXIB−XIB線
断面図である。なお、この実施例4の説明において、前
記実施例2の構成要素に対応する構成要素には同一の符
号を付して、その詳細な説明を省略する。この実施例4
は、下記の点で前記図9に示す実施例2と相違している
が、他の点では前記実施例2と同様に構成されている。
この実施例4の試料ホルダ1は、前記実施例2の試料固
定用固定部材14′が省略されている。この実施例4に
おいても、前記ドーナツ状の試料Sdの内周が前記突出
部3hに嵌合して前記試料Sdが位置決めされる。そし
て、前記試料固定用可動部材14の当接面14eがドー
ナツ状試料Sdの中心孔の内周縁に当接して、ドーナツ
状試料Sdが前記試料ホルダ1の試料載置面4cに固定さ
れる。したがって、この実施例4においても前記実施例
2と同様の作用を奏する。
(Embodiment 4) FIG. 11 is an explanatory view of a sample holder of Embodiment 4 of the present invention. FIG. 11A is a plan view of the sample holder of Embodiment 4, and FIG. 11B is a cross section taken along the line XIB-XIB of FIG. 11A. FIG. In the description of the fourth embodiment, the same reference numerals are given to the components corresponding to the components of the second embodiment, and the detailed description is omitted. Example 4
The second embodiment is different from the second embodiment shown in FIG. 9 in the following points, but is configured similarly to the second embodiment in other points.
In the sample holder 1 of the fourth embodiment, the fixing member 14 'for fixing the sample of the second embodiment is omitted. Also in the fourth embodiment, the inner periphery of the donut-shaped sample Sd is fitted into the protruding portion 3h to position the sample Sd. Then, the contact surface 14e of the sample fixing movable member 14 contacts the inner peripheral edge of the center hole of the donut sample Sd, and the donut sample Sd is fixed to the sample mounting surface 4c of the sample holder 1. Therefore, the fourth embodiment has the same operation as the second embodiment.

【0037】(変更例)以上、本発明の実施例を詳述し
たが、本発明は、前記実施例に限定されるものではな
く、特許請求の範囲に記載された本発明の要旨の範囲内
で、種々の変更を行うことが可能である。本発明の変更
実施例を下記に例示する。 (H01)前記各実施例において、試料支持部材2は、前
記下側試料支持部材3および上側試料支持部材4に2分
割して構成する代わりに、3分割以上に分割して構成し
たり、分割せずに一体的に構成したりすることが可能で
ある。 (H02)前記各実施例では標準試料収容孔3lが6個形
成された場合を例示したが、前記標準試料収容孔3lは
1個または複数個を形成することが可能である。 (H03)前記実施例1〜4において、前記可動部材の試
料固定用可動部材の移動を規制する代わりに、操作用移
動部材13の移動を規制するように構成することが可能
である。 (H04)試料固定用付勢手段として圧縮バネ18の代わ
りに引張バネや他の弾性部材(板バネ等)を使用するこ
とが可能であり、また試料固定用付勢手段は、操作用移
動部材13に作用させる代わりに試料固定用可動部材に
作用させることが可能である。 (H05)試料固定用可動部材と操作用可動部材とは別体
に構成してから連結する代わりに、一体に構成すること
が可能である。
(Modifications) Although the embodiments of the present invention have been described in detail, the present invention is not limited to the above-described embodiments, but falls within the scope of the present invention described in the appended claims. Thus, various changes can be made. Modified embodiments of the present invention will be exemplified below. (H01) In each of the above embodiments, the sample supporting member 2 may be divided into three or more, instead of being divided into the lower sample supporting member 3 and the upper sample supporting member 4 or divided. It is possible to form an integral structure without performing this. (H02) In each of the above embodiments, the case where six standard sample receiving holes 31 are formed is illustrated, but one or a plurality of the standard sample receiving holes 31 may be formed. (H03) In the first to fourth embodiments, instead of restricting the movement of the movable member for fixing the sample of the movable member, the movement of the operation movable member 13 may be restricted. (H04) It is possible to use a tension spring or another elastic member (a leaf spring or the like) instead of the compression spring 18 as the urging means for fixing the sample. Instead of acting on 13, it is possible to act on the movable member for fixing the sample. (H05) Instead of forming the movable member for fixing the sample and the movable member for operation separately and then connecting them, they can be integrally formed.

【0038】[0038]

【発明の効果】前述の本発明の試料ホルダは、下記の効
果を奏することができる。 (E01)ドーナツ状の試料の内周を基準にして前記試料
を位置決めすることができる。 (E02)試料ホルダを取替えることなく、標準試料と前
記ドーナツ状の試料の両方の測定が連続して行うことが
できる。
The sample holder of the present invention described above has the following effects. (E01) The sample can be positioned with reference to the inner periphery of the donut-shaped sample. (E02) Measurement of both the standard sample and the donut-shaped sample can be performed continuously without replacing the sample holder.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 図1は本発明の実施例1の試料ホルダの全体
説明図で、図1Aは同実施例1の試料ホルダの平面図、
図1Bは前記図1AのIB−IB線断面図である。
FIG. 1 is an overall explanatory view of a sample holder according to a first embodiment of the present invention; FIG. 1A is a plan view of the sample holder according to the first embodiment;
FIG. 1B is a sectional view taken along the line IB-IB of FIG. 1A.

【図2】 図2は前記図1で示した試料ホルダの説明図
で、図2Aは前記図1の矢印IIA方向から見た図、図2
Bは前記図1Bの矢印IIBで示された部分の拡大図であ
る。
2 is an explanatory view of the sample holder shown in FIG. 1; FIG. 2A is a view seen from the direction of arrow IIA in FIG. 1;
B is an enlarged view of a portion indicated by an arrow IIB in FIG. 1B.

【図3】 図3は試料ホルダを構成する下側試料支持部
材の説明図で、図3Aは下側試料支持部材の平面図、図
3Bは前記図3Aの矢印IIIB方向から見た図である。
3 is an explanatory view of a lower sample supporting member constituting the sample holder, FIG. 3A is a plan view of the lower sample supporting member, and FIG. 3B is a view seen from the direction of the arrow IIIB in FIG. 3A. .

【図4】 図4は前記図3で示した下側試料支持部材の
他の部分の説明図で、図4Aは前記図3AのIVA−IV
A線断面図、図4Bは前記図4Aの矢印IVB方向から
見た図、図4Cは前記図4Aの部分拡大図である。
FIG. 4 is an explanatory view of another portion of the lower sample supporting member shown in FIG. 3, and FIG. 4A is a diagram showing IVA-IV of FIG. 3A.
FIG. 4B is a cross-sectional view taken along the line A, FIG. 4B is a view seen from the direction of the arrow IVB in FIG. 4A, and FIG.

【図5】 図5は上側上側試料支持部材の説明図で、図
5Aは上側試料支持部材の平面図、図5Bは前記図5A
のVB−VB線断面図である。
5 is an explanatory view of an upper sample support member, FIG. 5A is a plan view of the upper sample support member, and FIG. 5B is FIG. 5A.
FIG. 5 is a sectional view taken along line VB-VB of FIG.

【図6】 図6は操作用可動部材の斜視図である。FIG. 6 is a perspective view of a movable member for operation.

【図7】 図7は可動部材の説明図で、図7Aは可動部
材の平面図、図7Bは前記図7AのVIIB−VIIB線断
面図である。
7 is an explanatory view of the movable member, FIG. 7A is a plan view of the movable member, and FIG. 7B is a sectional view taken along the line VIIB-VIIB of FIG. 7A.

【図8】 図8は本発明の実施例1の試料ホルダの作用
説明図で、図8Aは試料ホルダにドーナツ状の試料を装
着しようとする状態を示す図、図8Bは試料ホルダにド
ーナツ状の試料を装着した状態を示す図である。
8A and 8B are explanatory diagrams of the operation of the sample holder according to the first embodiment of the present invention. FIG. 8A is a diagram showing a state where a donut-shaped sample is to be mounted on the sample holder, and FIG. 8B is a donut-shaped sample holder. FIG. 6 is a diagram showing a state where the sample is mounted.

【図9】 図9は本発明の実施例2の試料ホルダの説明
図で、図9Aは実施例2の試料ホルダの平面図、図9B
は前記図9AのIXB−IXB線断面図である。
FIG. 9 is an explanatory view of a sample holder according to a second embodiment of the present invention. FIG. 9A is a plan view of the sample holder of the second embodiment, and FIG. 9B.
FIG. 9B is a sectional view taken along line IXB-IXB of FIG. 9A.

【図10】 図10は本発明の実施例3の試料ホルダの
説明図で、図10Aは実施例3の試料ホルダの平面図、
図10Bは前記図10AのXB−XB線断面図、図10
Cは同試料ホルダの可動部材の斜視図、図10Dは前記
図10Aの矢印XD方向から見た図である。
FIG. 10 is an explanatory view of a sample holder according to a third embodiment of the present invention. FIG. 10A is a plan view of the sample holder according to the third embodiment.
10B is a sectional view taken along line XB-XB of FIG.
10C is a perspective view of a movable member of the sample holder, and FIG. 10D is a view as seen from the direction of the arrow XD in FIG. 10A.

【図11】 図11は本発明の実施例4の試料ホルダの
説明図で、図11Aは実施例4の試料ホルダの平面図、
図11Bは前記図11AのXIB−XIB線断面図であ
る。
FIG. 11 is an explanatory view of a sample holder according to a fourth embodiment of the present invention. FIG. 11A is a plan view of the sample holder according to the fourth embodiment.
FIG. 11B is a sectional view taken along line XIB-XIB of FIG. 11A.

【図12】 図12は試料に対して精密作業を行う装置
(電子顕微鏡等)で使用される試料ホルダの一従来例の
概略説明図である。
FIG. 12 is a schematic explanatory view of a conventional example of a sample holder used in an apparatus (such as an electron microscope) for performing a precision operation on a sample.

【図13】 図13は試料ホルダを支持する試料ステー
ジの説明図で、前記図12の矢印XIII方向から見た図
である。
FIG. 13 is an explanatory view of a sample stage supporting a sample holder, as viewed from the direction of arrow XIII in FIG. 12;

【図14】 図14は従来の試料ホルダの拡大説明図
で、図14Aは試料ホルダの平面図、図14Bは試料ホ
ルダの正面図である。
FIG. 14 is an enlarged explanatory view of a conventional sample holder, FIG. 14A is a plan view of the sample holder, and FIG. 14B is a front view of the sample holder.

【符号の説明】[Explanation of symbols]

Sd…ドーナツ状の試料、Ss…標準試料、2…試料支持
部材2、4c…試料載置面、3g…可動部材ガイド溝、3
h…突出部、3i…部分円筒面、3l…標準試料収容孔、
4…移動規制部材、13…操作用可動部材、18…試料
固定用付勢手段
Sd: donut-shaped sample, Ss: standard sample, 2: sample support member 2, 4c: sample mounting surface, 3g: movable member guide groove, 3
h: Projection, 3i: Partial cylindrical surface, 3l: Standard sample accommodation hole,
4: movement restricting member, 13: operation movable member, 18: sample fixing urging means

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 下記の要件を備えたことを特徴とする試
料ホルダ、(A01)中央部に円形の中心孔が形成された
ドーナツ状の試料を載置する試料載置面と、前記試料載
置面に載置された前記試料の前記中心孔に嵌合する部分
円筒面を有し且つ半径方向に延びる可動部材ガイド溝を
挟んで互いに反対側に配置された一対の突出部と、前記
突出部上面に形成された標準試料を収容する標準試料収
容孔とを有する試料支持部材、(A02)前記半径方向に
延びる可動部材ガイド溝にスライド可能に配置されて、
前記ドーナツ状の試料の前記中心孔に当接して前記試料
を固定する中心孔当接面を有する可動部材、(A03)前
記可動部材を半径方向外方に付勢する試料固定用付勢手
段、(A04)前記試料載置面に試料が載置されていない
ときに前記可動部材の半径方向外方への移動を規制する
移動規制部材、(A05)前記試料固定用付勢手段の付勢
力に抗して前記可動部材を半径方向内方に移動させるた
めの可動部材操作部。
1. A sample holder characterized by the following requirements: (A01) a sample mounting surface for mounting a donut-shaped sample having a circular center hole formed in the center thereof; A pair of protrusions having a partial cylindrical surface fitted into the center hole of the sample mounted on the mounting surface and arranged on opposite sides of a movable member guide groove extending in a radial direction; (A02) a sample support member having a standard sample accommodation hole for accommodating a standard sample formed on the upper surface of the portion, and slidably disposed in the movable member guide groove extending in the radial direction;
A movable member having a center hole contact surface for fixing the sample by contacting the center hole of the donut-shaped sample; (A03) a sample fixing urging means for urging the movable member radially outward; (A04) a movement restricting member for restricting the movement of the movable member outward in the radial direction when the sample is not placed on the sample placing surface; (A05) a movement regulating member for regulating the urging force of the sample fixing urging means; A movable member operation unit for moving the movable member radially inward in opposition to the movable member operation unit;
JP9324860A 1997-10-16 1997-11-26 Sample holder Withdrawn JPH11183337A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9324860A JPH11183337A (en) 1997-10-16 1997-11-26 Sample holder

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP9-284019 1997-10-16
JP28401997 1997-10-16
JP9324860A JPH11183337A (en) 1997-10-16 1997-11-26 Sample holder

Publications (1)

Publication Number Publication Date
JPH11183337A true JPH11183337A (en) 1999-07-09

Family

ID=26555283

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9324860A Withdrawn JPH11183337A (en) 1997-10-16 1997-11-26 Sample holder

Country Status (1)

Country Link
JP (1) JPH11183337A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104511193A (en) * 2013-09-26 2015-04-15 希森美康株式会社 A filter member and a method of obtaining cells using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104511193A (en) * 2013-09-26 2015-04-15 希森美康株式会社 A filter member and a method of obtaining cells using the same

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