JPH11133026A - Detecting device and analyzing device provided with the same - Google Patents

Abstract

PROBLEM TO BE SOLVED: To prevent an analyzing device from malfunctioning and to enlarge the degree of freedom in the placement of a test piece. SOLUTION: In an analyzing device 5 provided with a detecting device to determine whether a test piece 4 is placed at a predetermined position or not, the detecting device is provided with the first supporting body 62A which comprises the first piezoelectric element 62 extended and contracted by the supply of voltage, is vibrated by the extension and contraction of the first piezoetectric element 62a, and is provided so as to be extended over a base member 68 and the second supporting body 62B which comprises the second piezoelectric element 62b to generate voltage by external forces and is provided so as to be extended over the base member 68. The detecting device detects voltage generated by the second piezoelectric element 62b and detects whether the test piece 4 is placed so as to bridge the supporting bodies 62A and 628 or not on the basis of the detection results. The analyzing device 5 is preferably constituted so that the first piezoelectric element 62a and the first supporting body 62A may resonate in the case that the first piezoelectric element 62a is contracted by the supply of voltage.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an analyzer provided with a detector for detecting whether or not a test piece is mounted on a predetermined site, and a detector which can be suitably used in the analyzer.

[0002]

2. Description of the Related Art Conventionally, an analyzer detects whether or not a test piece is mounted on a predetermined portion, and automatically analyzes the test piece when it is detected that the test piece is mounted. Some are configured to do so. As means for detecting whether or not the test piece is mounted, a means using a transmission type or reflection type photo interrupter having a light receiving element and a light emitting element is generally used. As shown in FIG.
For example, there is provided a mounting table 11 in which a slit 12 having a width and a depth corresponding to the width and the thickness of the test piece 4 is formed. FIG. 5A shows an example in which the transmission type photointerrupter 2 is adopted as a detecting means in the analyzer 1 having such a configuration. The reflection type photointerrupter 2A is shown in FIG. FIG. 2B shows an example in which is adopted.

As shown in FIG. 5 (a), when a transmission type photointerrupter 2 is employed in the analyzer 1, for example, an LED light source (light emitting element) 20 that emits infrared light is mounted on the mounting table. The light receiving element 21 is installed so as to face from the slit 12 of the LED 11 and vertically above the LED light source 20. On the other hand, as shown in FIG. 5B, when the reflection type photo interrupter 2A is employed in the analyzer 1, for example, the slit 12 of the mounting table 11 is irradiated with light at a predetermined angle. In this manner, the light receiving elements 21A are arranged such that the LED light source 20A can detect the reflected light from the slit 12. That is, in the analyzer 1 employing any of these photointerrupters 2 and 2A, when the test piece 4 is placed on the slit 12, the amount of light received by the light receiving elements 21 and 21A changes. Therefore, the presence or absence of the test piece 4 is determined by detecting this.

[0004]

However, in the analyzer 1 employing any of the photointerrupters 2 and 2A, the test piece 4 is inserted into the slit 12 of the mounting table 11 from the test piece introduction portion 10 which is open to the outside. Since the test piece 4 is placed on the test piece, external light is taken in from the test piece introduction unit 10. For this reason,
External light as a noise component is generated by the light receiving elements 21 and 21A.
And the photointerrupters 2 and 2A malfunction. In order to avoid such a problem, it is necessary to take measures against stray light so that external light is not received by the light receiving elements 21 and 21A. However, taking measures against stray light is not only disadvantageous in terms of cost. The vicinity of the mounting table 11 becomes dark, and it becomes difficult to mount the test piece 4 on the slit 12.

Further, in the above-mentioned analyzer 1, the portion on which the test piece 4 is placed is on the slit 12 of the mounting table 11, and the portion on which the test piece 4 can be placed is limited and the degree of freedom is small. , It is inconvenient to place the test piece 4. Therefore, in order to increase the degree of freedom of placing the test piece, a plurality of slits 12 may be provided, or the test piece 4 may be placed on the entire upper surface of the mounting table 11. However, in order to be able to detect whichever part of the test piece 4 is placed, a plurality of sets of the light-emitting element 20 (20A) and the light-receiving element 21 (21A) are required, which increases the cost. Will be invited.

Further, in the analyzer 1 configured to analyze components in urine, the test piece 4 immersed in urine and having extra urine attached thereto is placed on the slit 12. While repeating the analysis, the slit 12
Excess urine accumulates on the surface. For this reason, in the transmissive photointerrupter 2, excess urine may accumulate on the surface of the light emitting element 20, and in this case, the light emitting element 20
Light cannot reach the light receiving element 21 in a favorable manner. On the other hand, in the reflection type photo interrupter 2A, the light applied to the surface of the slit 12 is not reflected at a desired angle and is not reflected by the light receiving element 21A. In some cases, reflected light cannot be properly received. In such a case, regardless of whether the test piece 4 is placed on the slit 12 or not, the analysis is started due to malfunction or the test piece 4 is placed. The analysis may not be started without being detected.

The present invention has been conceived in view of the above circumstances, and has as its object to prevent malfunction of an analyzer and to increase the degree of freedom of placing a test piece.

[0008]

DISCLOSURE OF THE INVENTION In order to solve the above problems, the present invention employs the following technical means.

In other words, according to the first aspect of the present invention, there is provided a first piezoelectric element which expands and contracts when a voltage is supplied, and vibrates due to expansion and contraction of the first piezoelectric element. A first support provided so as to extend above the member, a second support having a second piezoelectric element that generates a voltage by an external force, and provided so as to extend above the base member; The second
And detecting means for detecting whether or not a detection target is placed on the support, based on the detection result, while detecting a voltage generated from the piezoelectric element. A sensing device is provided, characterized in that:

In the detection device, a voltage is externally supplied to the first piezoelectric element, and the first piezoelectric element expands and contracts, so that the first support is in a vibrating state. When the detection target is placed so as to bridge between the supports in this vibration state, the detection target vibrates, and the vibration is transmitted to the second support. Then, the vibration of the second support is applied as an external force to the second piezoelectric element to generate a voltage from the second piezoelectric element, and the voltage value is detected by the detecting means. Therefore, in the detection device configured as described above,
The object to be detected may be placed so as to bridge between the above supports, and it is not necessary to place the object to be limited on a limited portion such as on a slit formed on the mounting table as in the related art. Has the advantage of having a high degree of freedom for placing the.

In a preferred embodiment, when a voltage is supplied and the first piezoelectric element expands and contracts, the first piezoelectric element and the first support resonate. .

[0012] In the analyzer having the above structure, when a voltage is supplied to the first piezoelectric element, the first piezoelectric element and the first support are in a resonance state, and the first support is in a state of being resonated. It is made to vibrate greatly. That is, when the detection target is placed in a predetermined posture, the detection target also vibrates greatly, whereby the vibration transmitted to the second support increases. For this reason, when the detection target is placed, the vibration of the second support can be more reliably applied to the second piezoelectric element as an external force, so that the detection target is placed. Can be reliably detected.

In a preferred embodiment, the detecting means determines that the detection target is mounted when a predetermined voltage value is detected.

The second support may vibrate not only when the object to be detected is mounted in a predetermined posture but also due to other factors.
It cannot be said that a voltage is not generated from the second piezoelectric element by the support. In this case, even though the detection target is not mounted, the detection device may erroneously recognize that the detection target is mounted. In the detection device having the above configuration, the detection means has a predetermined voltage value, that is, a voltage value equal to a voltage generated by the vibration state of the second support when the detection target is placed in a predetermined posture. Is determined only when the detection target is detected. For this reason, the detection device can reliably detect that the detection target object has been placed by eliminating erroneous recognition.

In a preferred embodiment, a vibration absorbing member is disposed between the base member and each of the second supports to prevent the vibration of the base member from being transmitted to the second support. ing.

As described above, the second support may vibrate not only when the detection target is placed in a predetermined posture but also due to other factors. That is, the vibration of the base member below each of the supports may be propagated to vibrate the second support. In the above configuration, for example, vibration of rubber or the like for absorbing vibration of the base member between the base member and the second support so as to prevent the vibration of the base member from being transmitted to the second support. An absorbing member is disposed. For this reason, it is possible to eliminate a malfunction caused by the vibration of the base member being transmitted to the second support, and to reliably detect that the detection target is placed.

According to the second aspect of the present invention, the first piezoelectric element includes a first piezoelectric element that expands and contracts when a voltage is supplied and a second piezoelectric element that generates a voltage by an external force, and extends above the base member. The first support member provided as described above and a second support member extending upward from the base member and provided at a predetermined distance from the first support member.
A voltage generated from the support and the second piezoelectric element is detected, and based on the detection result, it is detected whether or not the detection target is placed so as to bridge between the supports. And a detection device.

In the detection device, a voltage is externally supplied to the first piezoelectric element, and the first piezoelectric element expands and contracts, so that the first support is in a vibrating state. This vibration is applied as an external force to the second piezoelectric element, and a voltage is generated from the second piezoelectric element.
This voltage value is detected by the detection means. When the detection target is placed on such a first support,
The vibration state of the first support changes. Of course, the second
The external force applied to the piezoelectric element also changes, and the voltage generated from the second piezoelectric element also changes. For this reason, the voltage detected by the detection means differs between the case where the detection target is placed on the first support and the case where the detection target is not placed on the first support. Can be detected.

In the detecting device configured as described above, similarly to the detecting device described in the first aspect described above, the object to be detected may be placed so as to bridge between the supports. It is not necessary to mount the detection target on a limited portion such as on a slit formed on the mounting table as in the above case, so that there is an advantage that the degree of freedom in mounting the detection target is high.

Further, in the above-described detection device, unlike the detection device described in the first aspect described above, the first support has two piezoelectric elements having different functions. Since the detecting means is connected to the second piezoelectric element, there is an advantage that the piezoelectric elements and the detecting means can be integrated and integrated into the first support. Of course, a circuit for supplying a voltage to the first piezoelectric element can be integrated into the first support.

It is preferable that the volume or weight of the first support is made as close as possible to that of the detection target so that the receiver circuit can more reliably detect that the detection target has been placed. When the volume or weight of the first support is made closer to that of the detection target, the influence of the placement of the detection target on the vibration of the first support becomes relatively large, and the first support The vibration state of the body can be changed more greatly. In other words, the state of the voltage detected by the detection means also greatly differs between the case where the detection target is placed and the case where the detection target is not placed, and it is detected that the detection target is properly placed. can do.

According to a third aspect of the present invention, there is provided an analyzing apparatus provided with a detecting device for detecting that a test piece is mounted, wherein the detecting device is described in the first aspect. An analysis device is provided, wherein any of the detection devices is used.

In the above-described analyzer, any one of the detection devices described in the first and second aspects is used, so that the analyzer is described in the first or second aspect. The effect of any of the detection devices can be enjoyed. That is, the analyzer has an advantage that the degree of freedom for mounting the test piece is high, and does not malfunction even though the test piece is not mounted.

When the analyzer is for analyzing a predetermined component in urine, even if extra urine adheres to the test piece, the test piece is placed by the vibration of the first support. Since the test piece is made to vibrate, this makes it possible to eliminate the excess urine of the test piece to some extent. In addition, since the detection device does not use light, in the present invention, the detection device does not malfunction due to the accumulation of excess urine unlike the conventional photointerrupter, and the detection device does not malfunction. There is no need to take measures against stray light to block external light in order to avoid operation.

[0025] Other features and advantages of the present invention will become more apparent from the detailed description given below with reference to the accompanying drawings.

[0026]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be specifically described below with reference to the drawings.

FIG. 1 is a perspective view of a main part of an analyzer according to a first embodiment of the present invention, and FIG.
It is sectional drawing which follows the II line. In the present embodiment, an analyzer configured to analyze the concentration and the like of a plurality of components in urine using the test piece 4 having a strip shape and having a plurality of reagent pads 42 formed on the surface thereof. 5 will be described.

As shown in FIG. 1, in the analyzer 5,
The test piece 4 is placed, and a detection device 3 for detecting that the test piece 4 is placed is provided. The test piece 4 placed on the detection device 3 is moved to a predetermined portion by a moving member 61. Can be Then, the test piece 4 which has reached a predetermined site
Is transported along the predetermined transport path by the transfer device 7, and in this process, the test device 4 is analyzed by the optical device 50 provided above the transport device 7. Will be

As is best seen in FIGS. 1 and 2,
The detecting device 3 includes first to third supports 62A and 62A, each of which is formed in a strip shape by, for example, stainless steel.
2B and 62C. Each of these supports 62A, 6
The base members 2B and 62C are provided on the base member 68 via a vibration absorbing member 67 made of rubber, for example, so as to extend upright and in parallel with each other in the direction in which the test piece 4 is conveyed. The upper end position is substantially flush. In the detection device 3 configured as described above, the test piece 4 is placed so as to bridge between the above-described supports 62A, 62B, and 62C, and is formed on a mounting table as in the related art. Since it is not necessary to mount the test piece on a limited portion such as on a slit, there is an advantage that the degree of freedom in mounting the test piece 4 is high. Note that the first support 62A and the second support 62B need to be set at substantially the same height, but the first and second support 62A, 62A,
It is desirable that 62B be higher than the third support 62C.

The first and second supports 62A, 62B
First and second elongated piezoelectric elements 62
a and 62b are stuck. The first piezoelectric element 62
a is electrically connected to the driver circuit 30 capable of supplying a voltage to the piezoelectric element 62a.
2b is conductively connected to the receiver circuit 31 which can detect the voltage generated from the piezoelectric element 62b.

As shown in FIGS. 1 and 2, the moving member 61 has a plurality of vertically extending grooves 65 formed on a standing surface 64 on the downstream side, and the third member is provided at a lower central position. A notch 66 is formed so as to straddle the support 62C. The moving member 61 can be reciprocated in the directions indicated by arrows A and B in FIG. 1 by a predetermined driving force (not shown), and each of the support members 62A, 62B, 62C.
Of the test piece 4 placed on the moving member 6
1 is pressed and moved in the direction of arrow A in contact with the upright surface 64. At this time, since the plurality of grooves 65 are formed in the upright surface 64, excess urine attached to the test piece 4 is removed along the plurality of grooves 65 by capillary action.

As shown in FIGS. 1 and 2, the transfer device 7 includes a pair of belt driving mechanisms 70 in which a belt 72 is bridged between two rollers 71, 71 substantially parallel to the transfer path. The belt driving mechanisms 70 are arranged on both sides of the base member 68 so as to be parallel to each other. The belt drive mechanism 70 includes two rollers 71, 71 each having a circular shape in a side view and having an annular groove 73 formed on a peripheral surface. A belt 72 having a loop shape is configured by these rollers 71, 71. It is constructed in such a way that it is erected in the shape of a circular groove 73, 73. The transport of the test piece 4 by the transport device 7 may be intermittent or continuous, but is continuous in consideration of the structure of the transport device 7 and ease of control. More preferred.

The optical device 50 analyzes the test piece 4 while scanning in a direction intersecting the transport path, and the transport of the test piece 4 by the transport device 7 is intermittent, that is, the test piece 4 is analyzed. In the case where the scanning stops when 4 reaches the analysis site, the scanning is performed so as to intersect the transport path substantially vertically,
When the transport of the test piece 4 is continuous, it is configured to scan obliquely so as to intersect the transport path at a predetermined angle. The analysis by the optical device 40 employs, for example, a so-called integrating sphere method.
In the integrating sphere method, the test piece 4 is placed in an integrating sphere whose inner surface is covered with a light diffusing powder such as magnesium oxide, and the test piece 4 is irradiated with light. This is a method for quantifying the concentration of components in urine and the like based on the reflectance obtained from.

As is apparent from FIG. 2, in the detecting device 3 having the above-described configuration, the first piezoelectric element 62a expands and contracts and vibrates when an AC voltage is supplied from the driver circuit 30. The first support 62A is configured to be vibrated with the expansion and contraction vibration of the element 62a. When the test piece 4 is placed so as to bridge the first support 62A and the second support 62B, the test piece 4 also vibrates due to the vibration of the first support 62A. At this time, the surplus urine attached to the test piece 4 is shaken off by the vibration of the test piece 4, and the surplus urine can be eliminated to some extent. Since the second support 62B is in contact with the vibrating test piece 4, the vibration of the test piece 4 is propagated and the second support 62B
Also vibrate. At this time, an external force is applied to the second piezoelectric element 62b by the vibration of the second support body 62B, whereby the second piezoelectric element 62b
Generates an alternating voltage. This alternating voltage depends on the second
Of the test piece 4 is detected by the receiver circuit 31 electrically connected to the piezoelectric element 62b.

When the receiver circuit 31 detects that the test piece 4 is placed, the moving member 61 moves in the direction of arrow A in FIG. 1 and the test piece 4 is pressed to It can be slid on the supports 62A, 62B, 62C. At this time, the test piece 4 is
1 is in contact with the upstanding surface 64 of the moving member 61, even if the test piece 4 is placed in a state not parallel to the upstanding surface 64 of the moving member 61, The posture is corrected to a posture parallel to the upright surface 64. The test piece 4 thus moved to the predetermined position is transferred to the transfer device 7 and transferred, and in the process, the test device 4 is analyzed by the optical device 50.

Incidentally, the second support 62B may vibrate not only when the test piece 4 is placed between the supports 62A and 62B but also due to other factors. It cannot be said that a voltage is not generated from the second piezoelectric element 62b by the second support 62B. In this case, even though the test piece 4 is not mounted, the detection device 3 erroneously recognizes that the test piece 4 is mounted. In the detection device 3, the base member 68 and the support members 62A, 62
Since the vibration absorbing member 67 is disposed between the supporting members 62A and 62B, the vibration of the base member 68 is reduced.
B and 62C are prevented from propagating to the second support 62B in particular, thereby preventing the detection device 3 from malfunctioning.

The means for avoiding the propagation of vibration of other members or the like is not limited to the means for disposing the vibration absorbing member 67 but may be changed to other means. For example, when the test piece 4 is placed in a predetermined posture, the second
When the receiver circuit 31 detects a voltage value equal to the voltage generated by the vibration of the support 62B, it may be determined that the test piece 4 is mounted.
Even in such a detection device 3, it is possible to reliably detect that the test piece 4 has been placed without erroneous operation.

It is preferable that the first piezoelectric element 62a and the first support 62A resonate when a voltage is supplied to the first piezoelectric element 62a. In this case, when the first piezoelectric element 62a and the first support 62A resonate, the first support 62A vibrates greatly, and the placed test piece 4 also vibrates greatly. Becomes For this reason, the vibration transmitted to the second support 62B also increases, and when the test piece 4 is placed in a predetermined posture, the second support 62B
Since the vibration of B can be more reliably applied to the second piezoelectric element 62b as an external force, it is possible to reliably detect that the test piece 4 is placed.

Next, an example of the analyzer according to the second embodiment of the present invention will be described with reference to FIG.

The basic configuration of the analyzer 5 according to the present embodiment is substantially the same as the analyzer 5 according to the first embodiment described above. That is, the analyzer 5 also includes the detector 4 on which the test piece 4 is placed and which detects that the test piece 4 is placed, and the test piece 4 placed on the detector 3 moves. In a process in which the test piece 4 is moved to a predetermined portion by the member 61 and transferred to the transport device 7 and transported along the predetermined transport path, the optical device 50 provided above the transport device 7 is provided. Analyzed by

The difference between the analyzer 5 of the present embodiment and the analyzer 5 of the first embodiment described above is the configuration of the detection device 3. The detection device 3 of the present embodiment includes first to third supports 62A, 62B, and 62C formed in a strip shape by, for example, stainless steel, and the supports 62A, 62B, and 62C are attached to the base member 68. On the other hand, the test pieces 4 are provided side by side so as to extend in parallel with each other in the conveying direction of the test piece 4.

The first and second piezoelectric elements 62a and 62b having a long shape are adhered to the first support 62A, respectively. The first piezoelectric element 62a is conductively connected to the driver circuit 30 that can supply a voltage to the piezoelectric element 62a, and the second piezoelectric element 62b can detect a voltage generated from the piezoelectric element 62b. It is conductively connected to the receiver circuit 31.

Of course, the detecting device 3 configured as described above is also configured such that the test piece 4 is placed so as to bridge between the supports 62A, 62B, and 62C. This has the advantage that the degree of freedom for placing the test piece 4 is high as in the embodiment.

The driver circuit 30 and the receiver circuit 31 may be incorporated in the first support 62A, and the piezoelectric elements 62a and 62b, the driver circuit 30, and the receiver circuit 31 may be integrated. In order to more reliably detect the placement of the test piece 4 by the receiver circuit 31, for example, a part of the first support 62A is cut out as shown by a virtual line in FIG. To reduce the volume or weight of the first support 6
It is preferred that the volume or weight of 2A be as close as possible to that of test specimen 4. When the volume or weight of the first support 62A is close to that of the test piece 4, the first support 62A
The effect of placing the test piece 4 on the vibration of the support 62A becomes relatively large, and the vibration state of the first support 62A can be changed more greatly. That is, the state of the voltage detected by the receiver circuit 31 is also greatly different between the case where the test piece 4 is mounted and the case where the test piece 4 is not mounted. Can be detected.

[Brief description of the drawings]

FIG. 1 is a perspective view of a main part showing an analyzer according to a first embodiment of the present invention.

FIG. 2 is a cross-sectional view taken along the line II-II of FIG.

FIG. 3 is a perspective view of a main part showing an analyzer according to a second embodiment of the present invention.

FIG. 4 is a perspective view of a main part showing an example of a conventional analyzer.

5A is a sectional view corresponding to a sectional view taken along line V-V in FIG. 4, and FIG. 5A is a sectional view of an essential part showing an example in which a transmission type photo interrupter is used as a detecting means; )
FIG. 3 is a sectional view of a main part showing an example in which a reflection type photo interrupter is used as a detecting means.

[Explanation of symbols]

 Reference Signs List 3 detecting device 4 test piece (detection target) 5 analyzing device 62A first support 62a first piezoelectric element 62B second support 62b second piezoelectric element 67 vibration absorbing member 68 base member

Claims (6)

[Claims] A first piezoelectric element that expands and contracts when a voltage is supplied, and is provided so as to vibrate due to expansion and contraction of the first piezoelectric element and extend above the base member. A first support, a second piezoelectric element that generates a voltage by an external force, a second support that is provided to extend above the base member, and a voltage generated from the second piezoelectric element. Detecting means for detecting whether or not the detection target is placed so as to bridge between the supports based on the detection result. . 2. The apparatus according to claim 1, wherein the first piezoelectric element and the first support resonate when a voltage is supplied and the first piezoelectric element expands and contracts. The detecting device according to the above. 3. The detection device according to claim 1, wherein the detection unit is configured to determine that the detection target is mounted when a predetermined voltage value is detected. . 4. A vibration absorbing member is disposed between said base member and said second support for preventing vibration of said base member from being transmitted to said second support. 4. The detecting device according to any one of claims 3 to 3. 5. A first piezoelectric element which expands and contracts by being supplied with a voltage, and a second piezoelectric element which generates a voltage by an external force.
And a first support provided so as to extend above the base member, and a first support provided so as to extend upward from the base member at a predetermined interval from the first support. (2) detecting the voltage generated from the support and the second piezoelectric element, and detecting whether or not the detection target is placed so as to bridge between the supports based on the detection result; And a detecting means for performing the detection. 6. An analyzer provided with a detecting device for detecting that a test piece is mounted, wherein the detecting device according to claim 1 is used as the detecting device. An analyzer, characterized in that: