JPH11133000A - 放電イオン化検出器 - Google Patents
放電イオン化検出器Info
- Publication number
- JPH11133000A JPH11133000A JP10233907A JP23390798A JPH11133000A JP H11133000 A JPH11133000 A JP H11133000A JP 10233907 A JP10233907 A JP 10233907A JP 23390798 A JP23390798 A JP 23390798A JP H11133000 A JPH11133000 A JP H11133000A
- Authority
- JP
- Japan
- Prior art keywords
- discharge
- chamber
- ionization
- ionization chamber
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000012491 analyte Substances 0.000 claims description 34
- 230000007704 transition Effects 0.000 abstract description 3
- 238000007599 discharging Methods 0.000 abstract description 2
- 239000000126 substance Substances 0.000 abstract 5
- 239000007789 gas Substances 0.000 description 71
- 239000012530 fluid Substances 0.000 description 9
- 229910052734 helium Inorganic materials 0.000 description 6
- 239000001307 helium Substances 0.000 description 6
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000004044 response Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 150000002500 ions Chemical class 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 230000001737 promoting effect Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 239000012159 carrier gas Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 229910052756 noble gas Inorganic materials 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000013375 chromatographic separation Methods 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000010893 electron trap Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 150000002835 noble gases Chemical class 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
- G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/64—Electrical detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/64—Electrical detectors
- G01N2030/642—Electrical detectors photoionisation detectors
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US921,412 | 1997-08-29 | ||
| US08/921,412 US5889404A (en) | 1997-08-29 | 1997-08-29 | Discharge ionization detector having efficient transfer of metastables for ionization of sample molecules |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11133000A true JPH11133000A (ja) | 1999-05-21 |
| JPH11133000A5 JPH11133000A5 (https=) | 2005-11-04 |
Family
ID=25445391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10233907A Pending JPH11133000A (ja) | 1997-08-29 | 1998-08-20 | 放電イオン化検出器 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US5889404A (https=) |
| JP (1) | JPH11133000A (https=) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002517887A (ja) * | 1998-06-01 | 2002-06-18 | ユニベルシテ ドゥ モントリオール | 準安定原子衝撃源 |
| JP2003109533A (ja) * | 2001-07-24 | 2003-04-11 | Agilent Technol Inc | 電子回路 |
| JP2006523367A (ja) * | 2003-04-04 | 2006-10-12 | ジェー・イー・オー・エル・ユー・エス・エー，インコーポレーテッド | 大気圧イオン源 |
| JP2013541130A (ja) * | 2010-08-19 | 2013-11-07 | レコ コーポレイション | ソフトイオン化グロー放電及び調整器を備える質量分析計 |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6333632B1 (en) * | 1999-09-16 | 2001-12-25 | Rae Systems, Inc. | Alternating current discharge ionization detector |
| US6457347B1 (en) * | 1999-12-15 | 2002-10-01 | The Regents Of The University Of California | Glow discharge detector |
| US7196525B2 (en) * | 2005-05-06 | 2007-03-27 | Sparkman O David | Sample imaging |
| CN100417939C (zh) * | 2005-10-25 | 2008-09-10 | 中国科学院合肥物质科学研究院 | 场致电离纳米气体传感器及制作方法 |
| US7893408B2 (en) * | 2006-11-02 | 2011-02-22 | Indiana University Research And Technology Corporation | Methods and apparatus for ionization and desorption using a glow discharge |
| US8207497B2 (en) | 2009-05-08 | 2012-06-26 | Ionsense, Inc. | Sampling of confined spaces |
| JP5423439B2 (ja) * | 2010-02-01 | 2014-02-19 | 株式会社島津製作所 | 放電イオン化電流検出器 |
| US9764333B2 (en) * | 2010-03-10 | 2017-09-19 | Msp Corporation | Electrical ionizer for aerosol charge conditioning and measurement |
| US8881576B2 (en) * | 2010-04-09 | 2014-11-11 | Inficon Gmbh | Test device for performing leak detection at a plurality of test sites |
| DE112011103405B4 (de) * | 2010-10-08 | 2023-03-23 | Tsi Inc. | Funkenemissions-Teilchendetektor |
| US8822949B2 (en) | 2011-02-05 | 2014-09-02 | Ionsense Inc. | Apparatus and method for thermal assisted desorption ionization systems |
| US8901488B1 (en) | 2011-04-18 | 2014-12-02 | Ionsense, Inc. | Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system |
| US9791410B2 (en) * | 2011-06-07 | 2017-10-17 | Shimadzu Corporation | Discharge ionization current detector |
| WO2013012405A2 (en) | 2011-07-15 | 2013-01-24 | Wayne State University | Simultaneous ion sensing and gas sampling in combustion engine cylinders and other combustion systems |
| US9337007B2 (en) | 2014-06-15 | 2016-05-10 | Ionsense, Inc. | Apparatus and method for generating chemical signatures using differential desorption |
| US9899196B1 (en) | 2016-01-12 | 2018-02-20 | Jeol Usa, Inc. | Dopant-assisted direct analysis in real time mass spectrometry |
| US10636640B2 (en) | 2017-07-06 | 2020-04-28 | Ionsense, Inc. | Apparatus and method for chemical phase sampling analysis |
| US10825673B2 (en) | 2018-06-01 | 2020-11-03 | Ionsense Inc. | Apparatus and method for reducing matrix effects |
| WO2021086778A1 (en) | 2019-10-28 | 2021-05-06 | Ionsense Inc. | Pulsatile flow atmospheric real time ionization |
| US11913861B2 (en) | 2020-05-26 | 2024-02-27 | Bruker Scientific Llc | Electrostatic loading of powder samples for ionization |
| CN113960231B (zh) * | 2021-10-15 | 2024-03-26 | 昆明龙创新辉科技有限公司 | 一种无放射源的ecd检测器及方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2737852C2 (de) * | 1977-08-23 | 1982-04-22 | Bruker - Franzen Analytik GmbH, 2800 Bremen | Ionenquellen zur chemischen Ionisierung |
| US4304997A (en) * | 1979-02-27 | 1981-12-08 | Hewlett-Packard Company | Electron capture detector with thermionic emission electron source |
| US4739214A (en) * | 1986-11-13 | 1988-04-19 | Anatech Ltd. | Dynamic electron emitter |
| US4789783A (en) * | 1987-04-02 | 1988-12-06 | Cook Robert D | Discharge ionization detector |
| US4934456A (en) * | 1989-03-29 | 1990-06-19 | Phillips Petroleum Company | Method for altering high temperature subterranean formation permeability |
| US4975648A (en) * | 1989-07-24 | 1990-12-04 | Gow-Mac Instrument Co. | Discharge ionization detector |
| US5153519A (en) * | 1991-02-28 | 1992-10-06 | Wentworth Wayne E | High voltage spark excitation and ionization detector system |
| US5192865A (en) * | 1992-01-14 | 1993-03-09 | Cetac Technologies Inc. | Atmospheric pressure afterglow ionization system and method of use, for mass spectrometer sample analysis systems |
-
1997
- 1997-08-29 US US08/921,412 patent/US5889404A/en not_active Expired - Lifetime
-
1998
- 1998-08-20 JP JP10233907A patent/JPH11133000A/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002517887A (ja) * | 1998-06-01 | 2002-06-18 | ユニベルシテ ドゥ モントリオール | 準安定原子衝撃源 |
| JP2003109533A (ja) * | 2001-07-24 | 2003-04-11 | Agilent Technol Inc | 電子回路 |
| JP2006523367A (ja) * | 2003-04-04 | 2006-10-12 | ジェー・イー・オー・エル・ユー・エス・エー，インコーポレーテッド | 大気圧イオン源 |
| JP2013541130A (ja) * | 2010-08-19 | 2013-11-07 | レコ コーポレイション | ソフトイオン化グロー放電及び調整器を備える質量分析計 |
Also Published As
| Publication number | Publication date |
|---|---|
| US5889404A (en) | 1999-03-30 |
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| JPH0376415B2 (https=) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050817 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050817 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080828 |
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| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20090212 |