JPH11133000A - 放電イオン化検出器 - Google Patents

放電イオン化検出器

Info

Publication number
JPH11133000A
JPH11133000A JP10233907A JP23390798A JPH11133000A JP H11133000 A JPH11133000 A JP H11133000A JP 10233907 A JP10233907 A JP 10233907A JP 23390798 A JP23390798 A JP 23390798A JP H11133000 A JPH11133000 A JP H11133000A
Authority
JP
Japan
Prior art keywords
discharge
chamber
ionization
ionization chamber
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10233907A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11133000A5 (enExample
Inventor
Mahmoud F Abdel-Rahman
マモウド・エフ・アブデル・ラーマン
William H Wilson
ウイリアム・エイチ・ウイルソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH11133000A publication Critical patent/JPH11133000A/ja
Publication of JPH11133000A5 publication Critical patent/JPH11133000A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
    • G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/64—Electrical detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/64—Electrical detectors
    • G01N2030/642—Electrical detectors photoionisation detectors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP10233907A 1997-08-29 1998-08-20 放電イオン化検出器 Pending JPH11133000A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US921,412 1997-08-29
US08/921,412 US5889404A (en) 1997-08-29 1997-08-29 Discharge ionization detector having efficient transfer of metastables for ionization of sample molecules

Publications (2)

Publication Number Publication Date
JPH11133000A true JPH11133000A (ja) 1999-05-21
JPH11133000A5 JPH11133000A5 (enExample) 2005-11-04

Family

ID=25445391

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10233907A Pending JPH11133000A (ja) 1997-08-29 1998-08-20 放電イオン化検出器

Country Status (2)

Country Link
US (1) US5889404A (enExample)
JP (1) JPH11133000A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002517887A (ja) * 1998-06-01 2002-06-18 ユニベルシテ ドゥ モントリオール 準安定原子衝撃源
JP2003109533A (ja) * 2001-07-24 2003-04-11 Agilent Technol Inc 電子回路
JP2006523367A (ja) * 2003-04-04 2006-10-12 ジェー・イー・オー・エル・ユー・エス・エー，インコーポレーテッド 大気圧イオン源
JP2013541130A (ja) * 2010-08-19 2013-11-07 レコ コーポレイション ソフトイオン化グロー放電及び調整器を備える質量分析計

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6333632B1 (en) * 1999-09-16 2001-12-25 Rae Systems, Inc. Alternating current discharge ionization detector
US6457347B1 (en) * 1999-12-15 2002-10-01 The Regents Of The University Of California Glow discharge detector
US7196525B2 (en) * 2005-05-06 2007-03-27 Sparkman O David Sample imaging
CN100417939C (zh) * 2005-10-25 2008-09-10 中国科学院合肥物质科学研究院 场致电离纳米气体传感器及制作方法
US7893408B2 (en) * 2006-11-02 2011-02-22 Indiana University Research And Technology Corporation Methods and apparatus for ionization and desorption using a glow discharge
US8207497B2 (en) 2009-05-08 2012-06-26 Ionsense, Inc. Sampling of confined spaces
JP5423439B2 (ja) * 2010-02-01 2014-02-19 株式会社島津製作所 放電イオン化電流検出器
US9764333B2 (en) * 2010-03-10 2017-09-19 Msp Corporation Electrical ionizer for aerosol charge conditioning and measurement
US8881576B2 (en) * 2010-04-09 2014-11-11 Inficon Gmbh Test device for performing leak detection at a plurality of test sites
WO2012048308A2 (en) * 2010-10-08 2012-04-12 Photon Machines, Inc. Spark emission particle detector
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
CN103403536B (zh) * 2011-06-07 2016-03-09 株式会社岛津制作所 放电电离电流检测器
US9945812B2 (en) 2011-07-15 2018-04-17 Wayne State University Simultaneous ion sensing and gas sampling in combustion engine cylinders and other combustion systems
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
EP4052278A4 (en) 2019-10-28 2023-11-22 Ionsense, Inc. REAL-TIME ATMOSPHERIC TIMETIONIZATION WITH PULSATING FLOW
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
CN113960231B (zh) * 2021-10-15 2024-03-26 昆明龙创新辉科技有限公司 一种无放射源的ecd检测器及方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2737852C2 (de) * 1977-08-23 1982-04-22 Bruker - Franzen Analytik GmbH, 2800 Bremen Ionenquellen zur chemischen Ionisierung
US4304997A (en) * 1979-02-27 1981-12-08 Hewlett-Packard Company Electron capture detector with thermionic emission electron source
US4739214A (en) * 1986-11-13 1988-04-19 Anatech Ltd. Dynamic electron emitter
US4789783A (en) * 1987-04-02 1988-12-06 Cook Robert D Discharge ionization detector
US4934456A (en) * 1989-03-29 1990-06-19 Phillips Petroleum Company Method for altering high temperature subterranean formation permeability
US4975648A (en) * 1989-07-24 1990-12-04 Gow-Mac Instrument Co. Discharge ionization detector
US5153519A (en) * 1991-02-28 1992-10-06 Wentworth Wayne E High voltage spark excitation and ionization detector system
US5192865A (en) * 1992-01-14 1993-03-09 Cetac Technologies Inc. Atmospheric pressure afterglow ionization system and method of use, for mass spectrometer sample analysis systems

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002517887A (ja) * 1998-06-01 2002-06-18 ユニベルシテ ドゥ モントリオール 準安定原子衝撃源
JP2003109533A (ja) * 2001-07-24 2003-04-11 Agilent Technol Inc 電子回路
JP2006523367A (ja) * 2003-04-04 2006-10-12 ジェー・イー・オー・エル・ユー・エス・エー，インコーポレーテッド 大気圧イオン源
JP2013541130A (ja) * 2010-08-19 2013-11-07 レコ コーポレイション ソフトイオン化グロー放電及び調整器を備える質量分析計

Also Published As

Publication number Publication date
US5889404A (en) 1999-03-30

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