JPH11126868A - Production of base board for multichip module - Google Patents

Production of base board for multichip module

Info

Publication number
JPH11126868A
JPH11126868A JP6972798A JP6972798A JPH11126868A JP H11126868 A JPH11126868 A JP H11126868A JP 6972798 A JP6972798 A JP 6972798A JP 6972798 A JP6972798 A JP 6972798A JP H11126868 A JPH11126868 A JP H11126868A
Authority
JP
Japan
Prior art keywords
base substrate
chip
manufacturing
mcm
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6972798A
Other languages
Japanese (ja)
Other versions
JP3815033B2 (en
Inventor
Koji Yamada
宏治 山田
Kenji Sekine
健治 関根
Matsuo Yamazaki
松夫 山▲崎▼
Osamu Kagaya
修 加賀谷
Kiichi Yamashita
喜市 山下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP6972798A priority Critical patent/JP3815033B2/en
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to EP98938890A priority patent/EP1030369B1/en
Priority to US09/485,400 priority patent/US6495914B1/en
Priority to DE69838849T priority patent/DE69838849T2/en
Priority to KR1020007001632A priority patent/KR100543836B1/en
Priority to PCT/JP1998/003668 priority patent/WO1999009595A1/en
Priority to CNB988082535A priority patent/CN1167131C/en
Publication of JPH11126868A publication Critical patent/JPH11126868A/en
Application granted granted Critical
Publication of JP3815033B2 publication Critical patent/JP3815033B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L24/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04105Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/19Manufacturing methods of high density interconnect preforms
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L2224/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73267Layer and HDI connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/922Connecting different surfaces of the semiconductor or solid-state body with connectors of different types
    • H01L2224/9222Sequential connecting processes
    • H01L2224/92242Sequential connecting processes the first connecting process involving a layer connector
    • H01L2224/92244Sequential connecting processes the first connecting process involving a layer connector the second connecting process involving a build-up interconnect
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013Alloys
    • H01L2924/0132Binary Alloys
    • H01L2924/01322Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Shaping Metal By Deep-Drawing, Or The Like (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a production method for a base board for MCM in which a semiconductor bare chip, or the like is embedded. SOLUTION: A base board is produced by a two stage machining method which combines etching and pressing. A resist mask 12 is formed on a board 11 and subjected to chemical etching o form protruding connection posts 13. The board provided with the connection posts is then inserted between dies 14, 14' and pressed by gradually applying a load 16 to form a recessed marker 17 tapered at 45 deg.C.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、基板上にベアー半
導体チップおよび導電ポストを実装して成るマルチチッ
プモジュールに関し、特に、ベース基板内にベアー半導
体チップ等を埋設するためのMCM用ベース基板の作製
方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multi-chip module having a bare semiconductor chip and a conductive post mounted on a substrate, and more particularly to a multi-chip module for embedding a bare semiconductor chip or the like in a base substrate. It relates to a manufacturing method.

【0002】[0002]

【従来の技術】電子装置の小型化と高性能化の一手段と
して、ベアー半導体チップと受動素子を複数個相互に接
続して一つのモジュールにする、いわゆるマルチチップ
モジュールがある。
2. Description of the Related Art As one means for reducing the size and improving the performance of electronic devices, there is a so-called multi-chip module in which a plurality of bare semiconductor chips and passive elements are interconnected to form a single module.

【0003】従来のベアー半導体チップの実装方法の一
例は、特開平3‐155144に示すように、ベアー半
導体ICチップの厚さより所定分厚い絶縁フィルムに予
め半導体ベアーICチップの外形寸法より所定分大きい
穴を形成し、支持板に絶縁フィルムを接着剤を介して貼
り合わせ、前記ベアー半導体ICチップを接着剤を介し
て前記貼り合わせ絶縁フィルムの穴部に接着し、ベアー
半導体チップと絶縁フィルムの空隙およびベアー半導体
ICチップの表面を絶縁フィルムと同種の液状樹脂で絶
縁フィルム層と高さが均一になるように塗布した後、熱
硬化し、ベアー半導体ICチップパッド上の樹脂をフォ
トリソ法で除去した後、全面に導体膜を形成し、フォト
リソ法で所定の導体配線形成を行っている。
An example of a conventional method for mounting a bare semiconductor chip is disclosed in Japanese Patent Application Laid-Open No. 3-155144, in which an insulating film having a predetermined thickness larger than the thickness of the bare semiconductor IC chip is previously provided with a hole larger than the outer dimension of the semiconductor bare IC chip by a predetermined amount. Is formed, the insulating film is bonded to the support plate with an adhesive, the bare semiconductor IC chip is bonded to the hole of the bonded insulating film with the adhesive, the gap between the bare semiconductor chip and the insulating film and After applying the surface of the bare semiconductor IC chip with the same kind of liquid resin as the insulating film so as to have a uniform height with the insulating film layer, heat-curing, and removing the resin on the bare semiconductor IC chip pad by a photolithographic method. Then, a conductor film is formed on the entire surface, and a predetermined conductor wiring is formed by a photolithography method.

【0004】また、従来の半導体装置(特にマルチチッ
プモジュール)とその製造方法の一例は、特開平5‐4
7856に示すように、パッケージに配設された少なく
とも1個のステージにチップをマウントし、前記パッケ
ージとチップに絶縁膜を塗着し、前記パッケージ上の接
続パッドと前記チップ上のパッドに導通するバイアホー
ルを前記絶縁膜に設け、前記バイアホール間を配線パタ
ーンによって接続するように構成している。
An example of a conventional semiconductor device (especially a multi-chip module) and a method of manufacturing the same are disclosed in Japanese Patent Laid-Open No. 5-4.
As shown at 7856, a chip is mounted on at least one stage provided in the package, an insulating film is applied to the package and the chip, and conduction is established between connection pads on the package and pads on the chip. Via holes are provided in the insulating film, and the via holes are connected by a wiring pattern.

【0005】[0005]

【発明が解決しようとする課題】特開平3‐15514
4および特開平5‐47856の実施例では、支持板或
いはパッケージが絶縁基板で成っており、一般に絶縁基
板の材料は導電材料および半導体材料に比べ熱伝導率が
1桁以上低いため、消費電力の大きい電力増幅器等の実
装には不適である。
SUMMARY OF THE INVENTION Japanese Patent Laid-Open No. 3-15514
4 and JP-A-5-47856, the supporting plate or the package is made of an insulating substrate. Generally, the material of the insulating substrate has a heat conductivity lower by one digit or more than the conductive material and the semiconductor material. It is not suitable for mounting a large power amplifier or the like.

【0006】さらに、特開平5‐47856の実施例で
は、チップ裏面のマウント用導体層(例えばAu‐Si
共晶または導電性接着剤)と絶縁フィルム上の導体配線
との間に電気的接合が無く、高周波領域での回路動作に
安定性を欠く。
Further, in the embodiment of Japanese Patent Application Laid-Open No. 5-47856, a mounting conductor layer (for example, Au-Si
There is no electrical connection between the eutectic or conductive adhesive) and the conductor wiring on the insulating film, and the circuit operation in a high frequency region lacks stability.

【0007】さらに、特開平3‐155144に示す従
来のベアー半導体チップの実装方法の一例では、ベアー
半導体ICチップと絶縁フィルム間の空隙およびベアー
半導体ICチップの表面を絶縁フィルムと同種の液状樹
脂で絶縁フィルム層と高さが均一になるように塗布した
後、熱硬化する工程において、熱硬化時の液状樹脂の収
縮によりベアー半導体ICチップと絶縁フィルム間の空
隙部に窪みが生じ易い。前記空隙部に窪みが生じると、
前記空隙部の導体配線にショートまたは断線等の不良を
生じる。
Further, in an example of a conventional method for mounting a bare semiconductor chip disclosed in Japanese Patent Application Laid-Open No. 3-155144, the gap between the bare semiconductor IC chip and the insulating film and the surface of the bare semiconductor IC chip are made of a liquid resin of the same kind as the insulating film. In the step of thermosetting after coating so that the height is uniform with the insulating film layer, dents are likely to occur in the gap between the bare semiconductor IC chip and the insulating film due to contraction of the liquid resin during thermosetting. When a dent occurs in the gap,
A defect such as a short circuit or disconnection occurs in the conductor wiring in the gap.

【0008】さらに、特開平5‐47856に示す半導
体装置とその製造方法の一例においても、液状樹脂の熱
硬化工程において、熱硬化時の液状樹脂の収縮によりパ
ッケージとチップ間の空隙部の絶縁膜に窪みが生じ易
く、前記空隙部の配線パターンにショートまたは断線等
の不良が生じ易く信頼性において多くの課題があった。
Further, in an example of a semiconductor device and a method of manufacturing the same as disclosed in Japanese Patent Application Laid-Open No. 5-47856, an insulating film in a gap between a package and a chip due to shrinkage of the liquid resin during the heat curing in the liquid resin thermosetting step. The wiring pattern in the gap is liable to cause a defect such as a short circuit or disconnection, and there are many problems in reliability.

【0009】これを解決する一手段としては、チップ埋
め込み型マツチチップモジュールがある。この方法は、
予め金属べース基板に複数の凹凸を設け、次いで、前記
ベアー半導体チップを埋め込むように樹脂状の絶縁膜で
覆い、前記絶縁膜と前記ベアー半導体チップ上のバンプ
電極とが所定の同じ高さになるように研削等で平坦化加
工し、その上に薄膜受動部品と共に金属層と絶縁膜とに
よって多層配線を設けるものである。しかし,この方法
の課題は、ベース基板に所望の凹凸が容易に作製できな
い点である。
As one means for solving this problem, there is a chip-embedded matching chip module. This method
A plurality of irregularities are provided in advance on the metal base substrate, and then covered with a resin-like insulating film so as to embed the bare semiconductor chip, and the insulating film and the bump electrode on the bare semiconductor chip have a predetermined height. Then, a flattening process is performed by grinding or the like, and a multi-layer wiring is provided thereon by a metal layer and an insulating film together with a thin-film passive component. However, a problem with this method is that desired irregularities cannot be easily formed on the base substrate.

【0010】たとえば、エッチング加工では、複数の凹
凸部分を作製するには工程が複雑となり再現性の点に欠
ける。一方、プレス加工では、高さの異なる複数の凹凸
部分を一括で作製するのは加工上においての課題が多
い。
For example, in the etching process, a process for producing a plurality of uneven portions is complicated and lacks reproducibility. On the other hand, in press working, there are many problems in working to collectively produce a plurality of uneven portions having different heights.

【0011】[0011]

【課題を解決するための手段】本発明は、上述の課題点
を解決するために、エッチングとプレスを併用した2段
加工法によりベース基板の作製を行った。まず、第1段
階のエッチング加工によって、ベース基板の一部から成
る凸状の導電ポストとモジュール間を隔てた囲い壁が作
製される。
According to the present invention, in order to solve the above-mentioned problems, a base substrate is manufactured by a two-step processing method using both etching and pressing. First, by a first-stage etching process, a convex conductive post, which is a part of the base substrate, and an enclosure wall separating the module are formed.

【0012】次いで、予めベース基板に設けられた貫通
孔マーカと金型マーカ間で位置合わせを行った後、第2
段階の凸型金型によるプレス加工によって、ベアー半導
体チップ搭載部の位置合わせ用マーカが作製される。こ
の際、位置合わせマーカ部は凹状となり、その側面には
15〜60度のテーパが設けられる。特に、テーパがあ
るとチップ搭載時にマーカ内へ滑り落ち、自己整合よる
位置合わせが容易になる。
Next, after positioning between the through-hole marker provided on the base substrate and the die marker in advance, the second
By the pressing process using the convex mold at the stage, a marker for positioning the bare semiconductor chip mounting portion is produced. At this time, the alignment marker portion is concave, and its side surface is provided with a taper of 15 to 60 degrees. In particular, if there is a taper, the chip slides down into the marker when the chip is mounted, and positioning by self-alignment becomes easy.

【0013】すなわち,本発明の2段加工法の特徴は、
第1段目のエッチング加工で金属ベース基板面を大きく
掘り下げて複数のベアー半導体チップを埋設する凹部と
接続ポストの凸部を同時に作製する。さらに、第2段目
のプレス加工ではエッチングで粗れた金属表面を平坦化
し凸部金型によりテーパを持つ多段の凹部を容易に作製
する。
That is, the feature of the two-step processing method of the present invention is that
In the first etching process, the surface of the metal base substrate is greatly dug down, and a concave portion for burying a plurality of bare semiconductor chips and a convex portion of the connection post are simultaneously produced. Further, in the second-stage press working, a metal surface roughened by etching is flattened, and a multi-stage concave portion having a taper by a convex mold is easily produced.

【0014】ベース基板作成後、前記チップ搭載用のマ
ーカ上に金属性のバンプを持つ半導体素子またはICチ
ップで成るベアーチップ部品を接着する。次いで、前記
ベアーチップ部品を埋め込むように樹脂状の第1絶縁膜
で覆い、前記絶縁膜と前記ベアーチップ上のバンプとが
所定の同じ高さになるように研削あるいは研磨等で平坦
化加工し、その上に薄膜受動部品と共に金属層と絶縁膜
とによって多層配線パターンを形成し、薄型で小型のマ
ルチチップモジュールが完成する。
After the base substrate is formed, a bare chip component composed of a semiconductor element or an IC chip having a metal bump is bonded to the chip mounting marker. Next, the bare chip component is covered with a resin-like first insulating film so as to be embedded, and the insulating film and the bump on the bare chip are planarized by grinding or polishing so as to have a predetermined height. Then, a multilayer wiring pattern is formed thereon by a metal layer and an insulating film together with the thin-film passive components, and a thin and small multi-chip module is completed.

【0015】[0015]

【発明の実施の形態】BEST MODE FOR CARRYING OUT THE INVENTION

≪実施例1≫以下、本発明について実施例で詳細に説明
する。
Embodiment 1 Hereinafter, the present invention will be described in detail with reference to embodiments.

【0016】図1は、本発明のベース基板の基本作製工
程である。まず、第1段目として、図1(a)におい
て、Cuから成るベース基板11上にエッチング用のレ
ジストマスク12をフオトリソ法によって作製する。次
いで、図1(b)において、塩化第二鉄から成る化学エ
ッチング液によって金属ベース基板11を深さ180μ
mエッチング加工して凸状の接続ポスト13を作製す
る。次いで、図1(c)において、第2段目のプレス加
工にはいる。金型14,14’の間に、接続ポスト13
が作製された金属ベース基板11を挿入し、その後、加
重16を徐々に加えてプレスを開始する(丸印内はテー
パを備えた金型凸部分15を示す)。次いで、図1
(d)において、最後の加重を加えてプレスを完了す
る。
FIG. 1 shows a basic manufacturing process of a base substrate of the present invention. First, as a first step, in FIG. 1A, a resist mask 12 for etching is formed on a base substrate 11 made of Cu by photolithography. Next, in FIG. 1 (b), the metal base substrate 11 was etched to a depth of 180 μm with a chemical etching solution comprising ferric chloride.
The convex connection post 13 is manufactured by m-etching. Next, in FIG. 1 (c), the process enters the second stage of press working. A connection post 13 is provided between the molds 14 and 14 '.
After that, the metal base substrate 11 on which is manufactured is inserted, and thereafter, the weight 16 is gradually applied, and the press is started (the circle indicates the tapered mold convex portion 15). Then, FIG.
In (d), the final weight is applied to complete the press.

【0017】次いで、図1(e)において、金型から取
りだしたベース基板11には、ベアー半導体チップを搭
載,接着する位置に深さ20μm,テーパ角45度の凹
状マーカ17が形成されて、2段加工によるベース基板
の作製が完了する。
Next, in FIG. 1E, a concave marker 17 having a depth of 20 μm and a taper angle of 45 degrees is formed at a position where the bare semiconductor chip is mounted and bonded on the base substrate 11 taken out of the mold. Fabrication of the base substrate by two-stage processing is completed.

【0018】以上のように、2段加工の特徴は、第1段
目のエッチング加工でベース基板面を大きく掘り下げて
ベアー半導体チップを埋設する凹凸部を設け、第2段目
のプレス加工ではテーパを備えた凸状金型でエッチング
で粗れた金属表面を平坦化し低加重によって凹状マーカ
を設けことにある。
As described above, the feature of the two-stage processing is that the base substrate surface is largely dug down in the first-stage etching process to provide a concave and convex portion for burying the bare semiconductor chip, and the second-stage press process is tapered. The present invention is to provide a concave marker by flattening a metal surface roughened by etching with a convex mold provided with a low load.

【0019】≪実施例2≫図2は、本発明による単モジ
ュール用ベース基板の作製工程である。
Embodiment 2 FIG. 2 shows a manufacturing process of a single module base substrate according to the present invention.

【0020】金属ベース基板としては、Cuを用いた。
基板上に形成するモジュールサイズは10mm角であ
る。まず、第1段目として、図2(a)において、ベー
ス基板21上に幅200μmの接続ポストと幅600μ
mのモジュール間を隔てた井桁状の囲い壁を形成するエ
ッチング用のレジストマスク22をフォトリソ法によっ
て作製する。次いで、図2(b)において、塩化第二鉄
系の化学エッチング液によって金属ベース基板21を深
さ約180μmエッチングして接続ポスト23とモジュ
ール間を隔てる囲い壁24を作製する。
Cu was used as the metal base substrate.
The module size formed on the substrate is 10 mm square. First, as a first step, in FIG. 2A, a connection post having a width of 200 μm and a connection post having a width of 600 μm are formed on a base substrate 21.
A resist mask 22 for etching is formed by a photolithography method to form a grid-shaped enclosure wall separating the m modules. Next, in FIG. 2B, the metal base substrate 21 is etched by a depth of about 180 μm with a ferric chloride-based chemical etching solution to form an enclosure wall 24 separating the connection post 23 and the module.

【0021】次いで、図2(c)において、第2段目の
プレス加工にはいる。予めベース基板21に形成してあ
るパイロットマーカと金型25のマーカで位置合わせを
行った後、金型25,25’との間の金属ベース基板2
1に対して加重26を徐々に加えてプレスを開始する
(丸印内はテーパを備えた金型凸部分27を示す)。こ
の際、接続ポスト23,囲い壁24に対して金型は大き
めに作製しておき、プレス時に前記接続ポスト23等の
形状が変形しないように設計しておく必要がある。図2
(d)において、28はプレス加工後のベース基板21
のエッチング面上に形成されたベアー半導体チップ搭載
用の凹状マーカである。この2段加工の工程を経て、接
続ポスト23,モジュール間を隔てた井桁状の囲い壁2
4がエッチング加工によって、また、ベアー半導体チッ
プ搭載用の凹状マーカ28がプレス加工によって、それ
ぞれべース基板内に形成される。
Next, in FIG. 2 (c), the second stage press working is started. After positioning is performed with the pilot marker formed on the base substrate 21 and the marker of the mold 25 in advance, the metal base substrate 2 between the molds 25 and 25 ′ is formed.
Pressing is started by gradually applying a load 26 to 1 (the circled portion indicates a mold convex portion 27 having a taper). At this time, it is necessary to make the die relatively large for the connection post 23 and the surrounding wall 24 and to design it so that the shape of the connection post 23 and the like does not deform during pressing. FIG.
In (d), 28 is the base substrate 21 after the press working.
3 is a concave marker for mounting a bare semiconductor chip formed on the etched surface of FIG. Through this two-stage processing step, the connection post 23 and the double-girder-shaped enclosure wall 2 separating the module
4 is formed in the base substrate by etching, and the concave marker 28 for mounting the bare semiconductor chip is formed in the base substrate by pressing.

【0022】≪実施例3≫図3は、本発明によるベース
基板に設けたパイロットマーカとモジュール間を井桁状
に隔てた囲い壁のレイアウト図である。
Embodiment 3 FIG. 3 is a layout view of an enclosure wall provided between a pilot marker and a module provided on a base substrate according to the present invention in a grid pattern.

【0023】図3(a)は、ベース基板として直径75
mmφ,厚み700μm,モジュールサイズ10mm角
のCuを用いた際の平面図である。パイロットマーカ3
1として基板周辺の4箇所に直径3mmΦの貫通孔が設
けられており、プレス前に金型マーカとの位置合わせを
行う。また、各モジュール間には井桁状の囲い壁32が
設けられており、これはベアーチップ搭載後の絶縁膜埋
め戻し工程における反り防止および単位モジュールとし
て切り出したときのシールド用側壁として用いている。
また、図3(b)は、断面図を示ししている。プレス加
工により形成されたチップ搭載部のマーカ34には、そ
の側面に45度のテーパが設けられている。
FIG. 3A shows a base substrate having a diameter of 75 mm.
It is a top view when using Cu of mmφ, thickness 700 μm, module size 10 mm square. Pilot marker 3
As 1, through-holes having a diameter of 3 mm are provided at four locations around the substrate, and alignment with a die marker is performed before pressing. Further, a grid-shaped enclosure wall 32 is provided between the modules, which is used as a warp prevention in an insulating film backfilling step after the mounting of the bare chip and as a shielding side wall when cut out as a unit module.
FIG. 3B shows a cross-sectional view. The marker 34 of the chip mounting portion formed by press working has a taper of 45 degrees on the side surface.

【0024】≪実施例4≫図4は、本発明を用いたマル
チチップモジュールの作製工程である。
Embodiment 4 FIG. 4 shows a process for manufacturing a multi-chip module using the present invention.

【0025】まず、図4(a)において、予めエッチン
グとプレスの2段加工により作製された接続ポスト4
2,モジュール間を隔てた囲い壁43,電極44および
チップ搭載用マーカ45が設けられたベース基板41上
に、電極上に金属性(例えばAuまたはAl等)のバン
プ46を乗せた複数の半導体素子またはICチップで成
るベアーチップ部品47をAu−Sn共晶半田により接
着し、搭載した。次いで、図2(b)において、ベース
基板41上の凹凸やベアーチップ部品47の第1の絶縁
膜であるエポキシ樹脂48を用いた埋め込みを行った。
次いで、図2(c)において、熱硬化後のエポキシ樹脂
48を研削または研磨によって表面を平坦化し、接続ポ
スト42,囲い壁43およびベアーチップ部品47上の
金属バンプ46を露出させた。次いで、図2(d)にお
いて、平坦化した絶縁膜48上に、薄膜受動部品と多層
配線を形成するための第2の絶縁膜49,第3の絶縁膜
50,金属層にて形成した第1配線パターン51,第1
配線パターン上に形成したコンデンサ52,その上に金
属層にて形成した第2配線パターン53および第2,第
3の絶縁膜を貫通する導電性のスルーホール54を、順
次積層して形成した。この後、マルチチップモジュール
の裏面より研削またはエッチングにより電極44の両端
に絶縁膜48が露出するまで削った。さらに、モジュー
ルを隔てた囲い壁43の真ん中で切断し、単位マルチチ
ップモジュールとした。
First, in FIG. 4A, a connection post 4 previously formed by two-stage processing of etching and pressing.
2. A plurality of semiconductors in which metallic (for example, Au or Al) bumps 46 are placed on the electrodes on a base substrate 41 provided with an enclosure wall 43, an electrode 44, and a chip mounting marker 45 separating the modules. A bare chip component 47 composed of an element or an IC chip was bonded and mounted with Au-Sn eutectic solder. Next, in FIG. 2B, embedding using an epoxy resin 48 as a first insulating film of the unevenness on the base substrate 41 and the bare chip component 47 was performed.
Next, in FIG. 2C, the surface of the thermally cured epoxy resin 48 was flattened by grinding or polishing to expose the connection posts 42, the surrounding wall 43, and the metal bumps 46 on the bare chip components 47. Next, in FIG. 2D, a second insulating film 49, a third insulating film 50, and a metal layer formed of a metal layer on the planarized insulating film 48 for forming a thin-film passive component and multilayer wiring. 1 wiring pattern 51, first
A capacitor 52 formed on the wiring pattern, a second wiring pattern 53 formed of a metal layer thereon, and a conductive through-hole 54 penetrating the second and third insulating films were sequentially laminated and formed. Thereafter, the back surface of the multi-chip module was ground or etched until the insulating film 48 was exposed at both ends of the electrode 44. Furthermore, the module was cut in the middle of the surrounding wall 43 to make a unit multi-chip module.

【0026】導電ポスト44は、溝に充填された埋込樹
脂48によって保持され、ベース基盤から分離独立して
いる。従って、基盤裏面から直接電極が取り出せるた
め、マルチチップモジュールをマザーボードへ直接半田
付けすることができ、リードで電気的に接続した場合に
比べ、実装面積が縮小される。
The conductive post 44 is held by an embedded resin 48 filled in the groove, and is separated and independent from the base substrate. Therefore, since the electrodes can be directly taken out from the back surface of the base, the multichip module can be directly soldered to the motherboard, and the mounting area is reduced as compared with the case where the leads are electrically connected.

【0027】≪実施例5≫図5に、本発明の他の実施例
によるベース基板の作成方法を示す。本実施例では、導
電ポスト及び囲い壁がエッチングで形成された基盤をプ
レス加工する際に、上金型の凸部に対応して下金型に凹
部が設けられた一組の金型を用いる。
Embodiment 5 FIG. 5 shows a method of manufacturing a base substrate according to another embodiment of the present invention. In the present embodiment, when pressing the base on which the conductive posts and the surrounding wall are formed by etching, a set of dies having concave portions provided in the lower die corresponding to the convex portions of the upper die is used. .

【0028】図5aに示すように、導電ポスト61及び
囲い壁65がエッチングで形成された基板60と上金型
70a及び下金型70bとの位置合わせを行い、塑性変
形の一つであるプレス加工により導電ポスト61周辺の
樹脂埋込溝62及びチップ搭載用の凹状マーカー63を
形成する。
As shown in FIG. 5A, the substrate 60 having the conductive posts 61 and the enclosing wall 65 formed by etching is aligned with the upper mold 70a and the lower mold 70b. A resin embedding groove 62 around the conductive post 61 and a concave marker 63 for chip mounting are formed by processing.

【0029】本実施例の場合、上金型70aの凸部に対
応して下金型70bに凹部が形成されているため、上金
型70aの凸部で押しだされた基盤は、下金型70bの
凹部に逃げることができる。従って、平坦な下金型を用
いた場合に比べ、プレス加工後の基盤に反りなどの変形
が生じにくい。
In the case of the present embodiment, since the concave portion is formed in the lower die 70b corresponding to the convex portion of the upper die 70a, the base pushed out by the convex portion of the upper die 70a is the lower die 70b. It can escape to the recess of the mold 70b. Therefore, compared to the case of using a flat lower mold, deformation such as warpage is less likely to occur on the base after press working.

【0030】なお、プレス加工後の基盤には、図5bに
示すように基盤裏面に凸部が形成されるが、導電ポスト
を露出させるために行う基盤裏面の研削工程で除去され
る。
In addition, on the substrate after the press working, a convex portion is formed on the back surface of the substrate as shown in FIG. 5B, but is removed in a grinding step of the back surface of the substrate performed to expose the conductive posts.

【0031】[0031]

【発明の効果】本発明のエッチングとプレスを併用した
2段加工によれば、ベース基板の所定部分に所定の深さ
の凹凸部が再現性よく作製できることが可能となる。ま
た、エッチンングとプレス一括形成技術により、プロセ
スの簡素化とプロセス時間の短縮化が可能となる。
According to the two-step processing of the present invention using both etching and pressing, it is possible to form a concave and convex portion having a predetermined depth on a predetermined portion of the base substrate with good reproducibility. In addition, the etching and the collective press forming technology can simplify the process and shorten the process time.

【0032】また,エッチング時に作られた囲い壁が絶
縁膜埋め戻しの際のベース基板の反りを抑制し、プロセ
スの安定化を実現できる。
Further, the enclosure wall formed at the time of etching suppresses the warpage of the base substrate at the time of backfilling the insulating film, so that the process can be stabilized.

【0033】また、プレス加工によりエッチングで粗れ
た金属表面を平坦化し、ベアーチップ搭載時の接着条件
のマージン拡大が実現できる。即ち、チップと基盤の界
面での気泡無発生と良好な接着性が実現する。また、接
着性が向上するため、チップの放熱性もよくなる。
Further, the metal surface roughened by the etching by the press working is flattened, and the margin of the bonding condition at the time of mounting the bare chip can be expanded. That is, no bubbles are generated at the interface between the chip and the substrate and good adhesiveness is realized. Further, since the adhesiveness is improved, the heat dissipation of the chip is also improved.

【0034】さらに、電極をモジュール裏面から取り出
すリードレス構造が実現可能となる。
Further, a leadless structure in which electrodes are taken out from the back surface of the module can be realized.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のベース基板の基本となる作製工程図で
ある。
FIG. 1 is a basic manufacturing process diagram of a base substrate of the present invention.

【図2】本発明のベース基板の作製工程図である。FIG. 2 is a manufacturing process diagram of a base substrate of the present invention.

【図3】本発明の基板におけるパイロットマーカおよび
囲い壁のレイアウト図である。
FIG. 3 is a layout diagram of a pilot marker and an enclosure wall on the board of the present invention.

【図4】本発明を用いたマルチチップモジュールの作製
工程図である。
FIG. 4 is a manufacturing process diagram of a multichip module using the present invention.

【図5】本発明のベース基板の作製工程図である。FIG. 5 is a manufacturing process diagram of a base substrate of the present invention.

【符号の説明】[Explanation of symbols]

11,21,41,60…ベース基板、12,22…レ
ジストマスク、13,23,33,34,42,61…
導電ポスト、14,14’,25,25’…金型、1
5,27…凸状部、17,28,34,45,63…チ
ップ搭載位置マーカ、24,32,43,65…囲い
壁、46…バンプ、47…ベアー半導体チップ、48…
第1絶縁膜、49…第2絶縁膜、50…第3絶縁膜、4
4…電極、51…第1配線パターン、53…第2配線パ
ターン、52…コンデンサ,54…スルーホール、62
…埋込溝、70a…上金型、70b…下金型。
11, 21, 41, 60 ... base substrate, 12, 22 ... resist mask, 13, 23, 33, 34, 42, 61 ...
Conductive post, 14, 14 ', 25, 25' ... mold, 1
5, 27 ... convex part, 17, 28, 34, 45, 63 ... chip mounting position marker, 24, 32, 43, 65 ... surrounding wall, 46 ... bump, 47 ... bare semiconductor chip, 48 ...
First insulating film, 49: second insulating film, 50: third insulating film, 4
4 ... electrode, 51 ... first wiring pattern, 53 ... second wiring pattern, 52 ... capacitor, 54 ... through hole, 62
... embedding groove, 70a ... upper mold, 70b ... lower mold.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 加賀谷 修 東京都国分寺市東恋ケ窪一丁目280番地 株式会社日立製作所中央研究所内 (72)発明者 山下 喜市 東京都国分寺市東恋ケ窪一丁目280番地 株式会社日立製作所中央研究所内 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Osamu Kagaya 1-280 Higashi Koigakubo, Kokubunji-shi, Tokyo Inside the Central Research Laboratory, Hitachi, Ltd. Inside the Central Research Laboratory

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】金属等で作られた導電性を有するベース基
板の片面に複数のベアーチップ部品を搭載して成るマル
チチップモジュール(MCM)のベース基板の作製方法
において、平板状のベース基板の所定の部分を所定の深
さまでエッチングにより凹ませる第1の工程と、さら
に、金属等の型を用いたプレス加工により上記第1の工
程で形成された凹部の所定の部分を所定の深さまで凹ま
せる第2の工程とを有し、ベース基板に多段の凹凸部を
実現することを特徴するMCM用ベース基板の作製方
法。
1. A method of manufacturing a base substrate of a multi-chip module (MCM) comprising a plurality of bare chip components mounted on one side of a conductive base substrate made of metal or the like. A first step of etching a predetermined portion to a predetermined depth by etching, and further, pressing a predetermined portion of the recess formed in the first step by press working using a mold of metal or the like to a predetermined depth. A method of manufacturing a base substrate for an MCM, comprising: forming a multi-level uneven portion on the base substrate.
【請求項2】請求項1記載のMCM用ベース基板の作製
方法において、少なくとも前記第2の工程前に、前記型
の位置合わせのための2箇所以上の貫通孔から成るパイ
ロットマーカを形成する工程を有することを特徴とする
MCM用ベース基板の作製方法。
2. A method of manufacturing a base substrate for an MCM according to claim 1, wherein at least before said second step, a pilot marker comprising at least two through holes for positioning said mold is formed. A method for manufacturing a base substrate for MCM, comprising:
【請求項3】請求項1記載のMCM用ベース基板の作製
方法において、前記第1の工程により、複数のモジュー
ル間を井桁で隔てた凸状の囲い壁を形成することを特徴
とするMCM用ベース基板の作製方法。
3. The method for manufacturing an MCM base substrate according to claim 1, wherein the first step forms a convex enclosure wall in which a plurality of modules are separated by a grid. Method for manufacturing base substrate.
【請求項4】請求項1記載のMCM用ベース基板の作製
方法において、前記第2の工程により形成される凹部が
前記ベアーチップ部品の搭載位置であり、上記凹部の側
面が15乃至60度のテーパ角を有することを特徴とす
るMCM用ベース基板の作製方法。
4. The method of manufacturing a base substrate for an MCM according to claim 1, wherein the concave portion formed in the second step is a mounting position of the bare chip component, and a side surface of the concave portion is 15 to 60 degrees. A method for manufacturing an MCM base substrate, characterized by having a taper angle.
JP6972798A 1997-08-19 1998-03-19 Manufacturing method of base substrate for multichip module Expired - Fee Related JP3815033B2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP6972798A JP3815033B2 (en) 1997-08-19 1998-03-19 Manufacturing method of base substrate for multichip module
US09/485,400 US6495914B1 (en) 1997-08-19 1998-08-19 Multi-chip module structure having conductive blocks to provide electrical connection between conductors on first and second sides of a conductive base substrate
DE69838849T DE69838849T2 (en) 1997-08-19 1998-08-19 Multi-chip module structure and its manufacture
KR1020007001632A KR100543836B1 (en) 1997-08-19 1998-08-19 Multichip module structure and method for manufacturing the same
EP98938890A EP1030369B1 (en) 1997-08-19 1998-08-19 Multichip module structure and method for manufacturing the same
PCT/JP1998/003668 WO1999009595A1 (en) 1997-08-19 1998-08-19 Multichip module structure and method for manufacturing the same
CNB988082535A CN1167131C (en) 1997-08-19 1998-08-19 Multichip module structure and method for mfg. same

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP22222997 1997-08-19
JP9-222229 1997-08-19
JP6972798A JP3815033B2 (en) 1997-08-19 1998-03-19 Manufacturing method of base substrate for multichip module

Publications (2)

Publication Number Publication Date
JPH11126868A true JPH11126868A (en) 1999-05-11
JP3815033B2 JP3815033B2 (en) 2006-08-30

Family

ID=26410887

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Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006013368A (en) * 2004-06-29 2006-01-12 Sanyo Electric Co Ltd Circuit device and manufacturing method thereof
US8022533B2 (en) 2004-06-29 2011-09-20 Sanyo Electric Co., Ltd. Circuit apparatus provided with asperities on substrate surface

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006013368A (en) * 2004-06-29 2006-01-12 Sanyo Electric Co Ltd Circuit device and manufacturing method thereof
US8022533B2 (en) 2004-06-29 2011-09-20 Sanyo Electric Co., Ltd. Circuit apparatus provided with asperities on substrate surface

Also Published As

Publication number Publication date
JP3815033B2 (en) 2006-08-30

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