JPH1092690A - Capacitance adjusting equipment - Google Patents
Capacitance adjusting equipmentInfo
- Publication number
- JPH1092690A JPH1092690A JP24626796A JP24626796A JPH1092690A JP H1092690 A JPH1092690 A JP H1092690A JP 24626796 A JP24626796 A JP 24626796A JP 24626796 A JP24626796 A JP 24626796A JP H1092690 A JPH1092690 A JP H1092690A
- Authority
- JP
- Japan
- Prior art keywords
- capacitance
- capacity
- reference capacitor
- capacitance value
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、容量を任意の容量
値に調整する容量調整回路に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a capacitance adjusting circuit for adjusting a capacitance to an arbitrary capacitance value.
【0002】[0002]
【従来の技術】従来は、トリマコンデンサを用いて容量
調整を行うか又はレーザビームを用いて容量素体に切条
を入れること、換言すればレーザトリミングにより所要
の容量値を得るようにしている。2. Description of the Related Art Conventionally, a capacitance is adjusted using a trimmer capacitor or a streak is formed in a capacitor element using a laser beam, in other words, a required capacitance value is obtained by laser trimming. .
【0003】[0003]
【発明が解決しようとする課題】上記いずれの従来例に
あっても、調整作業時間が長く調整が困難であり高価に
なる。又、前者では容量の安定性に問題がある。In any of the above-mentioned prior arts, the adjusting operation time is long, the adjustment is difficult and the cost is high. In the former, there is a problem in the stability of the capacity.
【0004】[0004]
【課題を解決するための手段】本発明装置は上記の課題
を解決するため、図1に示すように任意の容量値を持つ
基準のコンデンサC1と、この基準のコンデンサC1の
2x (xは整数)の容量値を持つコンデンサC2,C3
・・・をパターンカット部K1,K2・・・を介して並
列接続してなる並列回路をプリント基板PBに設け、最
小容量を基準のコンデンサC1の容量とし、最大容量を
全コンデンサC1,C2・・・の含み容量としてその範
囲の所望の容量値を、前記パターンカット部K1,K2
・・・を選択してカットすることで調整することを特徴
とする。Since the present invention apparatus SUMMARY OF THE INVENTION To solve the above problems, a reference capacitor C1 with any capacitance value as shown in FIG. 1, 2 x (x of the capacitor C1 of this standard Capacitors C2 and C3 having an integer value
Are provided on the printed circuit board PB by connecting in parallel via the pattern cut portions K1, K2,..., The minimum capacitance is set as the capacitance of the reference capacitor C1, and the maximum capacitance is set to all capacitors C1, C2. .. the desired capacitance value in the range as the included capacitance of the pattern cut portions K1, K2
.. Are selected and cut for adjustment.
【0005】[0005]
【発明の実施の形態】図1は本発明装置の実施形態の第
1例の構成を示す接続図である。この第1形態は、任意
の容量値を持つ基準のコンデンサC1と、この基準のコ
ンデンサC1の2x (xは整数)の容量値を持つコンデ
ンサC2〜C4をパターンカット部K1〜K4を介して
並列接続してなる並列回路をプリント基板PBに形成
し、最小容量を基準のコンデンサC1の容量、例えばC
1=1pFとし、最大容量を全コンデンサC1〜C4の
含み容量、例えば15pFとしてその範囲1〜15pF
内の所望の容量値、例えば7pFにパターンカット部K
1〜K4のうちK4を選択してカットすることで調整す
る。容量値2pFに調整する時はパターンカット部K
1,K3,K4をカットし、容量値10pFに調整する
時はパターンカット部K1,K3をカットし、以下同様
にして1〜15pFの範囲で容量を調整することができ
る。即ち、容量測定部MAで並列回路の容量を測定し、
容量表示部DSで容量を表示しながら、所望の容量値が
得られるようにパターンカット部K1〜K4を選択して
カット手段CUによりカットし、容量値を調整するもの
である。FIG. 1 is a connection diagram showing the configuration of a first embodiment of the apparatus of the present invention. In the first embodiment, a reference capacitor C1 having an arbitrary capacitance value and capacitors C2 to C4 having a capacitance value of 2 x (x is an integer) of the reference capacitor C1 are connected via pattern cut sections K1 to K4. A parallel circuit formed in parallel is formed on the printed circuit board PB, and the capacitance of the capacitor C1 based on the minimum capacitance, for example, C
1 = 1 pF, and the maximum capacitance is the included capacitance of all the capacitors C1 to C4, for example, 15 pF and the range is 1 to 15 pF.
In the desired capacitance value in the pattern cut portion K, for example, 7 pF
Adjustment is made by selecting and cutting K4 from 1 to K4. When adjusting to a capacitance value of 2 pF, the pattern cut portion K
When adjusting the capacitance value to 10 pF by cutting 1, K3, and K4, the pattern cut portions K1 and K3 are cut, and the capacitance can be adjusted in the range of 1 to 15 pF in the same manner. That is, the capacitance of the parallel circuit is measured by the capacitance measuring unit MA,
While the capacitance is displayed on the capacitance display section DS, the pattern cut sections K1 to K4 are selected and cut by the cutting means CU so as to obtain a desired capacitance value, and the capacitance value is adjusted.
【0006】図2は本発明装置の実施形態の第2例の構
成を示す接続図である。この第2形態は、コンベアCV
でプリント基板PBを搬送し、測定位置で容量を測定す
る容量測定部MA、容量表示部DS、測定容量と設定容
量を比較する容量比較部CP、所定の容量を計数する容
量計数部CT及びパターンカット部K1〜K4をカット
するカット手段CUを備える。容量を設定し、総容量を
容量測定部MAにより測定して設定容量と比較し、所定
の容量を容量計数部CTで計数する。所定容量を得るべ
く、パターンカット部K1〜K4を上記のように選択し
てカット手段CUによりカットする。FIG. 2 is a connection diagram showing the configuration of a second embodiment of the apparatus of the present invention. This second form is a conveyor CV
, A capacity measuring unit MA for measuring the capacity at the measuring position, a capacity displaying unit DS, a capacity comparing unit CP for comparing the measured capacity with the set capacity, a capacity counting unit CT for counting a predetermined capacity, and a pattern. A cutting unit CU for cutting the cut portions K1 to K4 is provided. The capacity is set, the total capacity is measured by the capacity measuring unit MA, compared with the set capacity, and the predetermined capacity is counted by the capacity counting unit CT. In order to obtain a predetermined capacity, the pattern cut portions K1 to K4 are selected as described above and cut by the cutting means CU.
【0007】図3は本発明装置により容量調整する場合
の説明図である。目標とする容量値の5%〜20%程度
の部分を、本発明装置により調整する。例えば、目標の
容量値を150pFとし、その±10%程度の部分を容
量調整する場合、140pFを固定コンデンサCfと
し、C1=1pF,C2=2pF,C3=4pF,C4
=8pFを調整コンデンサとする。総容量は140pF
+1pF+2pF+4pF+8pF=155pFとなる
が、140pFのコンデンサそのものに誤差がある場
合、その誤差分を本発明装置の15pFのコンデンサで
調整し、150pFとする。FIG. 3 is an explanatory diagram for adjusting the capacity by the apparatus of the present invention. A portion of about 5% to 20% of the target capacity value is adjusted by the apparatus of the present invention. For example, when the target capacitance value is 150 pF and the capacitance of about ± 10% is adjusted, 140 pF is set as the fixed capacitor Cf, C1 = 1 pF, C2 = 2 pF, C3 = 4 pF, C4.
= 8 pF is used as the adjustment capacitor. 140pF total capacity
+ 1pF + 2pF + 4pF + 8pF = 155pF. If there is an error in the 140pF capacitor itself, the error is adjusted by the 15pF capacitor of the present invention to 150pF.
【0008】[0008]
【発明の効果】上述のように本発明によれば、並列接続
のコンデンサの容量をパターンカット部を選択してカッ
トすることで調整するので、調整作業時間が短く調整が
容易になり、安価で容量が安定する容量調整装置を提供
することができる。As described above, according to the present invention, since the capacitance of the capacitor connected in parallel is adjusted by selecting and cutting the pattern cut portion, the adjustment work time is short, the adjustment is easy, and the cost is low. It is possible to provide a capacity adjusting device having a stable capacity.
【図1】本発明装置の実施形態の第1例の構成を示す接
続図である。FIG. 1 is a connection diagram illustrating a configuration of a first example of an embodiment of a device of the present invention.
【図2】本発明装置の実施形態の第2例の構成を示す接
続図である。FIG. 2 is a connection diagram showing a configuration of a second example of the embodiment of the device of the present invention.
【図3】本発明装置により容量調整する場合の説明図で
ある。FIG. 3 is an explanatory diagram in the case of adjusting the capacity by the device of the present invention.
C1 基準のコンデンサ C2,C3・・・ コンデンサ K1,K2・・・ パターンカット部 PB プリント基板 MA 容量測定部 DS 容量表示部 CU カット手段 CV コンベア CP 容量比較部 CT 容量計数部 Cf 固定コンデンサ C1 Reference capacitor C2, C3 ... Capacitor K1, K2 ... Pattern cut section PB Printed circuit board MA Capacity measurement section DS Capacity display section CU Cut means CV Conveyor CP Capacity comparison section CT Capacity counting section Cf Fixed capacitor
Claims (4)
と、この基準のコンデンサの2x (xは整数)の容量値
を持つコンデンサをパターンカット部を介して並列接続
してなる並列回路をプリント基板に設け、最小容量を基
準のコンデンサの容量とし、最大容量を全コンデンサの
含み容量としてその範囲の所望の容量値を、前記パター
ンカット部を選択してカットすることで調整することを
特徴とする容量調整装置。1. A parallel circuit formed by connecting a reference capacitor having an arbitrary capacitance value and a capacitor having a capacitance value of 2 x (x is an integer) of the reference capacitor in parallel via a pattern cut portion. Provided on the substrate, the minimum capacitance is the capacitance of the reference capacitor, the maximum capacitance is the included capacitance of all capacitors, a desired capacitance value in the range is adjusted by selecting and cutting the pattern cut portion. Capacity adjustment device.
量値を測定することを特徴とする請求項1の容量調整装
置。2. The capacitance adjusting device according to claim 1, wherein a capacitance measuring unit is connected to the parallel circuit to measure a capacitance value.
所定の容量値とするよう計数部で計数し、計数された容
量となるようにパターンカット部をカットすることを特
徴とする請求項2の容量調整装置。3. The total capacity is measured by the capacity measuring unit,
3. The capacity adjusting device according to claim 2, wherein the counting section counts to a predetermined capacity value, and cuts the pattern cut section so as to have the counted capacity.
位置で容量を測定する容量測定部、測定容量と設定容量
を比較する容量比較部、所定の容量を計数する容量計数
部及びパターンカット部をカットするカット手段を備え
ることを特徴とする請求項1の容量調整装置。4. A capacity measuring unit for conveying a printed circuit board by a conveyor and measuring a capacity at a measuring position, a capacity comparing unit for comparing a measured capacity with a set capacity, a capacity counting unit for counting a predetermined capacity, and a pattern cutting unit. 2. The capacity adjusting device according to claim 1, further comprising a cutting means for cutting.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24626796A JPH1092690A (en) | 1996-09-18 | 1996-09-18 | Capacitance adjusting equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24626796A JPH1092690A (en) | 1996-09-18 | 1996-09-18 | Capacitance adjusting equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH1092690A true JPH1092690A (en) | 1998-04-10 |
Family
ID=17145993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24626796A Pending JPH1092690A (en) | 1996-09-18 | 1996-09-18 | Capacitance adjusting equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH1092690A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6407669B1 (en) | 2001-02-02 | 2002-06-18 | 3M Innovative Properties Company | RFID tag device and method of manufacturing |
US6693541B2 (en) | 2001-07-19 | 2004-02-17 | 3M Innovative Properties Co | RFID tag with bridge circuit assembly and methods of use |
EP1403816A2 (en) * | 2002-09-27 | 2004-03-31 | Kabushiki Kaisha Toshiba | Method of mounting a hybrid IC card and hybrid IC card |
CN103293388A (en) * | 2013-05-16 | 2013-09-11 | 国家电网公司 | Method for monitoring capacitance values of parallel capacitors in online manner |
WO2015000818A1 (en) * | 2013-07-03 | 2015-01-08 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Device and method for adapting a resonant circuit for a playing device |
-
1996
- 1996-09-18 JP JP24626796A patent/JPH1092690A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6407669B1 (en) | 2001-02-02 | 2002-06-18 | 3M Innovative Properties Company | RFID tag device and method of manufacturing |
WO2002063551A3 (en) * | 2001-02-02 | 2003-02-13 | 3M Innovative Properties Co | Rfid tag device and method of manufacturing |
US6693541B2 (en) | 2001-07-19 | 2004-02-17 | 3M Innovative Properties Co | RFID tag with bridge circuit assembly and methods of use |
EP1403816A2 (en) * | 2002-09-27 | 2004-03-31 | Kabushiki Kaisha Toshiba | Method of mounting a hybrid IC card and hybrid IC card |
EP1403816A3 (en) * | 2002-09-27 | 2005-06-15 | Kabushiki Kaisha Toshiba | Method of mounting a hybrid IC card and hybrid IC card |
CN103293388A (en) * | 2013-05-16 | 2013-09-11 | 国家电网公司 | Method for monitoring capacitance values of parallel capacitors in online manner |
WO2015000818A1 (en) * | 2013-07-03 | 2015-01-08 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Device and method for adapting a resonant circuit for a playing device |
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