JPH1065041A - Formation of spherical terminal - Google Patents

Formation of spherical terminal

Info

Publication number
JPH1065041A
JPH1065041A JP21758296A JP21758296A JPH1065041A JP H1065041 A JPH1065041 A JP H1065041A JP 21758296 A JP21758296 A JP 21758296A JP 21758296 A JP21758296 A JP 21758296A JP H1065041 A JPH1065041 A JP H1065041A
Authority
JP
Japan
Prior art keywords
melting point
terminal
pin
spherical
point solder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21758296A
Other languages
Japanese (ja)
Inventor
Shiyouji Uegaki
祥司 植垣
Shin Matsuda
伸 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP21758296A priority Critical patent/JPH1065041A/en
Publication of JPH1065041A publication Critical patent/JPH1065041A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3478Applying solder preforms; Transferring prefabricated solder patterns

Landscapes

  • Multi-Conductor Connections (AREA)

Abstract

PROBLEM TO BE SOLVED: To form spherical terminals corresponding to a fine pitch and to easily perform measuring test as to electric characteristics before surface mounting thereof in the case where the spherical terminals for the surface mounting are formed. SOLUTION: A pin-type terminal 1, consisting of high melting point solder 3, whose one end has low melting point solder 2 joined thereto is erected on a pad 5 formed on the surface of a base 4 by fusing the low melting point solder 2, then the pin-type terminal 1 consisting of high melting point solder 3 is heated and fused to be deformed owing to surface tension to form a spherical terminal 6. The difference between the low melting point of 2 and the high melting point is not less than 20 deg.C. Thus, the measuring test as to electric characteristics can easily be carried out in a state wherein the pin-type terminal 1 is erected, and then surface mounting can easily be performed as the spherical terminal 6. Further, the spherical terminals can easily cope with a fine pitch.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体素子を半導体
素子収納用パッケージにあるいは半導体素子収納用パッ
ケージを回路基板に実装する場合などに使用される球状
端子の形成方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a spherical terminal used when a semiconductor element is mounted on a semiconductor element housing package or a semiconductor element housing package is mounted on a circuit board.

【0002】[0002]

【従来の技術】LSI(大規模集積回路素子)等の半導
体素子を収容した表面実装型の半導体素子収納用パッケ
ージを回路基板に実装する場合の実装端子としては、パ
ッケージの基体の実装側主面に配列して形成された端子
部に接続された、金属製のピンを使用したピン状端子ま
たはいわゆる半田バンプ等の球状の金属を使用した球状
端子などが用いられており、通常、前者はPGA(ピン
グリッドアレイ)タイプ、後者はBGA(ボールグリッ
ドアレイ)タイプと言われている。
2. Description of the Related Art When a surface-mount type semiconductor element housing package housing a semiconductor element such as an LSI (large-scale integrated circuit element) is mounted on a circuit board, the mounting terminal is a main surface of a package base. A pin-shaped terminal using a metal pin or a spherical terminal using a spherical metal such as a so-called solder bump, which is connected to a terminal portion formed and arranged in a matrix, is usually used. (Pin grid array) type, and the latter is called BGA (ball grid array) type.

【0003】一般に、PGAタイプの実装端子はピン状
端子をソケット等に挿入することにより電気的特性の測
定試験が容易に行なえるが、回路基板側の多数の挿入孔
にピン状端子を精度良く挿入させることが難しいため表
面実装を行なうのは困難な傾向がある。他方、BGAタ
イプの実装端子は回路基板側の多数の端子部(ランド)
に球状端子を接触させた状態で加熱して球状端子を溶融
させればよいため表面実装を行なうのは容易であるが、
球状端子との接触のみによって良好な電気的接続を得る
には球状端子およびパッケージ本体への大きな荷重が必
要なことから、測定試験のためのソケットが複雑化した
り測定によって球状端子の耐久性に問題が起こり易くな
るため困難な傾向がある。
In general, a PGA type mounting terminal can easily perform an electrical characteristic measurement test by inserting a pin-shaped terminal into a socket or the like. However, the pin-shaped terminal is accurately inserted into a large number of insertion holes on the circuit board side. Since it is difficult to insert, it tends to be difficult to perform surface mounting. On the other hand, the mounting terminals of the BGA type have a large number of terminals (lands) on the circuit board side.
It is easy to perform surface mounting because it is only necessary to heat and melt the spherical terminal while the spherical terminal is in contact with
In order to obtain good electrical connection only by contact with the spherical terminal, a large load is required on the spherical terminal and the package body, so that the socket for the measurement test becomes complicated and the durability of the spherical terminal is problematic due to the measurement. Tends to be difficult to occur.

【0004】また、半導体素子や回路基板の高集積化や
小型化が進むのに対応して、実装端子の密度は高くなり
実装端子間のピッチは狭くなってファインピッチ化が進
んできており、回路基板への半導体素子収納用パッケー
ジの実装は高集積化や小型化に有利なフリップチップ実
装が主流になりつつある。このフリップチップ実装への
対応にはBGAタイプの球状端子が好適であるが、球状
の金属を供給して球状端子を精度良く高密度に配列して
ファインピッチに対応した球状端子を形成するのは、金
属製のピンを供給してピン状端子を配列するのに比べて
困難である。
[0004] In response to the progress of high integration and miniaturization of semiconductor elements and circuit boards, the density of mounting terminals has been increased, the pitch between mounting terminals has been narrowed, and fine pitch has been advanced. Flip chip mounting, which is advantageous for high integration and miniaturization, is becoming mainstream for mounting a semiconductor element storage package on a circuit board. BGA type spherical terminals are suitable for this flip chip mounting. However, it is difficult to supply spherical metal and arrange the spherical terminals with high precision and high density to form spherical terminals corresponding to fine pitch. It is more difficult than arranging pin-shaped terminals by supplying metal pins.

【0005】[0005]

【発明が解決しようとする課題】表面実装のための球状
端子を形成する方法としては、従来より半田ペーストを
用いて印刷する方法、半田槽へのディッピング(浸漬)
法、半田メッキ法、マスクを用いた半田ボールの供給な
どの多くの方法が知られている。しかしながら、いずれ
の方法によってもファインピッチに対応して端子間の短
絡を防止しつつ十分な量の半田を量産性良く供給して所
望の球状端子を形成することが困難であるという問題点
があった。
As a method of forming a spherical terminal for surface mounting, a method of printing using a solder paste and a method of dipping (immersion) in a solder bath have been conventionally used.
Many methods are known, such as a soldering method, a solder plating method, and supplying a solder ball using a mask. However, any of these methods has a problem that it is difficult to form a desired spherical terminal by supplying a sufficient amount of solder with good mass productivity while preventing a short circuit between terminals corresponding to a fine pitch. Was.

【0006】また、半導体素子収納用パッケージの実装
端子として球状端子を採用する場合であっても、その半
導体素子収納用パッケージの電気的特性について表面実
装前に実装端子の耐久性を低下させることなく測定試験
を容易に行なえるようにしたいという要望もあった。
Further, even when a spherical terminal is used as a mounting terminal of a package for storing a semiconductor element, the electrical characteristics of the package for storing a semiconductor element do not deteriorate the durability of the mounting terminal before surface mounting. There was also a demand that the measurement test be easily performed.

【0007】さらに、上記のような問題点や要望は、半
導体素子収納用パッケージに対してのみならず半導体素
子収納用パッケージの搭載部への半導体素子の表面実
装、あるいは回路基板の他の回路基板への表面実装など
において球状端子を使用する場合にも同様であった。
Further, the above-mentioned problems and demands are caused not only in the package for housing the semiconductor element but also in the surface mounting of the semiconductor element on the mounting portion of the package for storing the semiconductor element, or in the case of other circuit boards in the circuit board. The same applies to the case where a spherical terminal is used for surface mounting on a device.

【0008】本発明はこのような従来技術の問題点なら
びに要望に鑑みて案出されたものであり、その目的は、
ファインピッチの実装端子として端子間の短絡を防止し
つつ十分な量の半田を量産性良く供給して所望の球状端
子を形成することができ、しかも表面実装前に実装端子
の耐久性を低下させることなく電気的特性の測定試験を
容易に行なうこともできる球状端子の形成方法を提供す
ることにある。
The present invention has been devised in view of the problems and demands of the prior art, and has the following objects.
As a fine-pitch mounting terminal, a sufficient amount of solder can be supplied with good mass productivity while forming a short circuit between the terminals to form a desired spherical terminal, and the durability of the mounting terminal is reduced before surface mounting. It is an object of the present invention to provide a method of forming a spherical terminal that can easily perform a measurement test of electrical characteristics without using the terminal.

【0009】[0009]

【課題を解決するための手段】本発明の球状端子の形成
方法は、一端に低融点はんだが接合されている高融点は
んだから成るピン状端子を、前記低融点はんだを溶融さ
せることによって基体表面に形成したパッドに立設さ
せ、しかる後、前記高融点はんだから成るピン状端子を
加熱溶融させ、表面張力によって球状に変形せしめるこ
とを特徴とするものである。
According to the method of forming a spherical terminal of the present invention, a pin-shaped terminal made of a high-melting-point solder having a low-melting-point solder joined at one end is melted with the low-melting-point solder. Then, the pin-shaped terminal made of the high melting point solder is heated and melted and deformed into a spherical shape by surface tension.

【0010】また、本発明の球状端子の形成方法は、そ
のような球状端子の形成方法であって、前記低融点はん
だの融点と前記高融点はんだの融点との差が20℃以上で
あることを特徴とするものである。
The method of forming a spherical terminal according to the present invention is a method of forming such a spherical terminal, wherein the difference between the melting point of the low melting point solder and the melting point of the high melting point solder is 20 ° C. or more. It is characterized by the following.

【0011】[0011]

【発明の実施の形態】本発明の球状端子の形成方法によ
れば、まず一端に低融点はんだが接合されている高融点
はんだから成るピン状端子をその低融点はんだを溶融さ
せることによって基体表面に形成したパッドに立設させ
ることから、この状態ではPGAタイプと同等の形状の
実装端子であり、この状態の端子をソケット等に挿入す
ることにより実装端子の耐久性を低下させることなく電
気的特性の測定試験が容易に行なえるものとなる。ま
た、基体表面に形成したパッドにピン状端子を立設させ
ることから、パッドの配列ピッチ、すなわち実装端子間
のピッチが狭い場合であっても容易かつ正確に実装端子
を配列させることができ、実装端子のファインピッチ化
に容易に対応できる。
According to the method of forming a spherical terminal of the present invention, first, a pin-shaped terminal made of a high-melting-point solder having a low-melting-point solder joined at one end is melted with the low-melting-point solder to form a substrate surface. In this state, the mounting terminals have the same shape as that of the PGA type, and the terminals in this state are inserted into a socket or the like so as to be electrically connected without lowering the durability of the mounting terminals. A characteristic measurement test can be easily performed. Further, since the pin-shaped terminals are erected on the pads formed on the surface of the base, even if the arrangement pitch of the pads, that is, the pitch between the mounting terminals is narrow, the mounting terminals can be easily and accurately arranged, It can easily cope with fine pitch of mounting terminals.

【0012】また、本発明の球状端子の形成法によれ
ば、そのようにしてピン状端子を立設させた後に高融点
はんだから成るピン状端子を加熱溶融させ、表面張力に
よって球状に変形せしめることから、この状態ではBG
Aタイプと同等の形状の実装端子となり、実装回路基板
側の多数の端子部(ランド)にこの端子を接触させた状
態で加熱して溶融させることにより表面実装を容易に行
なうことができるものとなる。しかも、基体表面のパッ
ドに精度良く立設させたピン状端子を加熱溶融させて球
状に変形せしめることから、端子間の短絡を防止しつつ
十分な量の半田を量産性良く供給して、ファインピッチ
に対応した所望のBGAタイプの球状端子を形成するこ
とができる。
Further, according to the method of forming a spherical terminal of the present invention, after the pin-like terminal is erected in this manner, the pin-like terminal made of a high melting point solder is melted by heating and deformed into a spherical shape by surface tension. Therefore, in this state, BG
It becomes a mounting terminal of the same shape as the A type, and it can be easily mounted on the surface by heating and melting it in a state where the terminals are in contact with a large number of terminals (lands) on the mounting circuit board side. Become. In addition, the pin-shaped terminals, which are erected accurately on the pads on the surface of the base, are heated and melted and deformed into a spherical shape. A desired BGA type spherical terminal corresponding to the pitch can be formed.

【0013】さらに、本発明の球状端子の形成方法によ
れば、一端に低融点はんだが接合されている高融点はん
だから成るピン状端子の低融点はんだの融点と高融点は
んだの融点との差を20℃以上としたことから、一度に多
数本のピン状端子を供給して基体表面のパッドに立設さ
せる場合であっても、高融点はんだを溶融させずピン状
の形状を変形させることなく低融点はんだのみを溶融さ
せてパッドに融着させて立設させることができ、量産時
においても多数の実装端子を安定して精度良く形成する
ことができる。
Further, according to the method of forming a spherical terminal of the present invention, the difference between the melting point of the low melting point solder and the melting point of the high melting point solder of the pin-shaped terminal composed of the high melting point solder having one end joined to the low melting point solder. Since the temperature is set to 20 ° C or higher, even when a large number of pin-shaped terminals are supplied at one time and are erected on the pads on the surface of the base, the pin-shaped shape must be deformed without melting the high melting point solder. In addition, only the low-melting-point solder can be melted and fused to the pads to be erected, and a large number of mounting terminals can be formed stably and accurately even in mass production.

【0014】以下、本発明を添付図面に基づき説明す
る。図1(a)〜(c)はそれぞれ本発明の球状端子の
形成方法の実施形態の一例を示す断面図である。図1
(a)はピン状端子の例を示す断面図であり、同図にお
いて1はピン状端子であり、一端に低融点はんだ2が接
合されている高融点はんだ3から成るものである。
Hereinafter, the present invention will be described with reference to the accompanying drawings. 1A to 1C are cross-sectional views showing an example of an embodiment of a method for forming a spherical terminal according to the present invention. FIG.
(A) is a cross-sectional view showing an example of a pin-shaped terminal, in which 1 is a pin-shaped terminal, which is composed of a high-melting-point solder 3 to which a low-melting-point solder 2 is joined at one end.

【0015】低融点はんだ2としては、一般に共晶はん
だと言われる例えば63wt%Sn/37wt%Pb(融点 183
℃)のものや46wt%Sn/46wt%Pb/8wt%Bi(融
点 180℃)など、あるいは43wt%Sn/43wt%Pb/14
wt%Bi(融点 140℃)などのいわゆる低融点のはんだ
を用いる。
As the low melting point solder 2, for example, 63 wt% Sn / 37 wt% Pb (melting point: 183 wt.
° C), 46 wt% Sn / 46 wt% Pb / 8 wt% Bi (melting point 180 ° C), or 43 wt% Sn / 43 wt% Pb / 14
A so-called low melting point solder such as wt% Bi (melting point 140 ° C.) is used.

【0016】一方、高融点はんだ3としては、例えば10
wt%Sn/90wt%Pb(融点 300℃)のものや5wt%S
n/95wt%Pb(融点 340℃)などのいわゆる高融点の
ものを用いる。
On the other hand, as the high melting point solder 3, for example, 10
wt% Sn / 90wt% Pb (melting point 300 ℃) or 5wt% Sb
A so-called high melting point such as n / 95 wt% Pb (melting point 340 ° C.) is used.

【0017】ピン状端子1において低融点はんだ2と高
融点はんだ3の体積比は、低融点はんだ:高融点はんだ
=1:10〜1:20程度とすることが、低融点はんだと高
融点はんだとが溶融した際の接合強度が良好であるとい
う点から好ましい。また、ピン状端子1の寸法は、直径
0.35〜0.55mm程度、長さ2〜4mm程度とすること
が、ソケットへのピン状端子1の挿入がしやすく、ま
た、ソケットへの挿入時にピン状端子1が変形しにくい
という点から好ましい。
The volume ratio of the low melting point solder 2 to the high melting point solder 3 in the pin-shaped terminal 1 is preferably about 1:10 to 1:20 for the low melting point solder and the high melting point solder. Is preferable in that the bonding strength is good when they are melted. The dimensions of the pin-shaped terminal 1 are
It is preferable that the pin-like terminal 1 is about 0.35 to 0.55 mm and the length is about 2 to 4 mm because the pin-like terminal 1 is easily inserted into the socket and the pin-like terminal 1 is hardly deformed when inserted into the socket.

【0018】図1(b)はピン状端子1を基体表面に形
成したパッドに立設させた状態を示す断面図であり、同
図において4は基体であり、5はその表面に形成された
実装用電極としてのパッドである。
FIG. 1B is a cross-sectional view showing a state in which the pin-shaped terminals 1 are erected on pads formed on the surface of the substrate. In FIG. Pads as mounting electrodes.

【0019】基体4としては例えば実装回路基板に表面
実装される半導体素子収納用パッケージの絶縁基体や半
導体素子収納用パッケージの搭載部に実装搭載される半
導体素子の基板、あるいは実装回路基板へ実装搭載され
る回路基板などがある。半導体素子収納用パッケージの
絶縁基体であれば、例えば酸化アルミニウム質焼結体や
ムライト質焼結体・炭化珪素質焼結体・窒化アルミニウ
ム質焼結体等のセラミックス、もしくはガラスセラミッ
ク焼結体、あるいはガラスエポキシ樹脂・BTレジン等
の各種の絶縁性プラスチック等が用いられ、半導体素子
の基板であれば、例えばシリコンやガリウム砒素等が用
いられ、回路基板の場合には例えばセラミックスあるい
は樹脂製の基板が用いられる。
The base 4 may be, for example, an insulating base of a semiconductor element storage package surface-mounted on a mounting circuit board, a semiconductor element substrate mounted on a mounting portion of the semiconductor element storage package, or mounted on a mounting circuit board. Circuit board to be used. As the insulating base of the package for housing semiconductor elements, for example, ceramics such as aluminum oxide sintered body, mullite sintered body, silicon carbide sintered body, aluminum nitride sintered body, or glass ceramic sintered body, Alternatively, various insulating plastics such as glass epoxy resin and BT resin are used. For a semiconductor element substrate, for example, silicon or gallium arsenide is used. For a circuit substrate, for example, a ceramic or resin substrate is used. Is used.

【0020】また、パッド5は、WやMo・Cu等によ
り、およびこれらにNi/Auメッキ等を施して形成さ
れる。また、その配列は、例えば1.27mmピッチ等にて
形成される。
The pad 5 is formed of W, Mo.Cu, or the like, and by subjecting them to Ni / Au plating or the like. The array is formed at a pitch of 1.27 mm, for example.

【0021】前記の43wt%Sn/43wt%Pb/14wt%B
i(融点 140℃)の低融点はんだ2が10wt%Sn/90wt
%Pb(融点 300℃)の高融点はんだ3に接合されてい
るピン状端子1(融点の差: 160℃)を用いた場合であ
れば、ピーク温度を約 190℃として低融点はんだ2をパ
ッド5に接合させることにより、低融点はんだ2のみが
溶融して高融点はんだ3が溶融・変形することなく、図
1(b)のようにピン状端子1を立設させることができ
る。
The above 43 wt% Sn / 43 wt% Pb / 14 wt% B
i (melting point 140 ° C) low melting point solder 2 is 10wt% Sn / 90wt
When the pin-shaped terminal 1 (difference in melting point: 160 ° C.) joined to the high melting point solder 3 having a melting point of 300% Pb, the peak temperature is set to about 190 ° C. and the low melting point solder 2 is padded. 5, the pin-shaped terminal 1 can be erected as shown in FIG. 1B without melting only the low melting point solder 2 and melting and deforming the high melting point solder 3.

【0022】このように立設させるときの条件として
は、低融点はんだ2により形成されるフィレットの形状
などを考慮して、約 140〜200 ℃の温度で30秒〜2分程
度保持することとすればよい。
The condition for standing up in this manner is to keep the temperature at about 140 to 200 ° C. for about 30 seconds to 2 minutes in consideration of the shape of the fillet formed by the low melting point solder 2 and the like. do it.

【0023】このとき、低融点はんだ2の融点と高融点
はんだ3の融点との差が20℃未満と小さくなると、低融
点はんだ2を溶融させた際に高融点はんだ3部に変形が
生じ、ピン形状を保持することが困難となる傾向がある
ため、前記の融点の差は20℃以上であることが好まし
い。他方、この融点の差の上限はピン状端子1に使用す
る高融点はんだ3と低融点はんだ2によって定まるもの
であり、いくら以下でなければならないというものでは
ない。
At this time, when the difference between the melting point of the low melting point solder 2 and the melting point of the high melting point solder 3 becomes smaller than 20 ° C., when the low melting point solder 2 is melted, the high melting point solder 3 is deformed. Since the pin shape tends to be difficult to maintain, the difference in the melting points is preferably 20 ° C. or more. On the other hand, the upper limit of the difference in the melting point is determined by the high melting point solder 3 and the low melting point solder 2 used for the pin-shaped terminal 1, and does not have to be lower than the lower limit.

【0024】この状態のピン状端子1をピン挿入タイプ
のようなソケット等に挿入することにより、実装端子と
してのピン状端子1の耐久性を低下させることなく電気
的特性の測定試験が容易に行なえる。
By inserting the pin-like terminal 1 in this state into a socket or the like of a pin insertion type, a measurement test of electrical characteristics can be easily performed without reducing the durability of the pin-like terminal 1 as a mounting terminal. I can do it.

【0025】また、ピン端子と同一ピッチでピン状端子
1を挿入可能な孔を設けた板状治具に多数本のピン状端
子1を挿入設置するなどの方法によって基体4表面にフ
ァインピッチで形成した多数のパッド5に立設させるこ
とができるので、実装端子間のピッチが狭い場合であっ
ても容易かつ正確に多数本のピン状端子1を配列させて
対応することができる。
Further, a fine pitch is formed on the surface of the substrate 4 by a method such as inserting a large number of pin-shaped terminals 1 into a plate jig provided with holes into which the pin-shaped terminals 1 can be inserted at the same pitch as the pin terminals. Since the plurality of pads 5 can be provided upright, even if the pitch between the mounting terminals is narrow, it is possible to easily and accurately arrange a large number of pin-shaped terminals 1 to cope with the problem.

【0026】そして、図1(c)はパッド5に立設させ
たピン状端子1を加熱溶融させ、表面張力によって球状
に変形せしめた状態を示す断面図であり、同図において
6はそのようにしてパッド5上に形成された球状端子で
ある。
FIG. 1C is a sectional view showing a state in which the pin-shaped terminal 1 erected on the pad 5 is heated and melted and deformed into a spherical shape by surface tension. In FIG. Are spherical terminals formed on the pad 5.

【0027】前記の43wt%Sn/43wt%Pb/14wt%B
i(融点 140℃)の低融点はんだ2が10wt%Sn/90wt
%Pb(融点 300℃)の高融点はんだ3に接合されてい
るピン状端子1(融点の差: 160℃)をパッド5に立設
させた場合であれば、ピーク温度を約 350℃としてリフ
ロー炉により加熱することにより、高融点はんだ3が溶
融してその表面張力によってパッド5上で球状に変形
し、図1(c)のように球状端子6を形成することがで
きる。
The above 43 wt% Sn / 43 wt% Pb / 14 wt% B
i (melting point 140 ° C) low melting point solder 2 is 10wt% Sn / 90wt
When the pin-shaped terminal 1 (difference in melting point: 160 ° C.) joined to the high melting point solder 3 of% Pb (melting point 300 ° C.) is erected on the pad 5, the reflow is performed at a peak temperature of about 350 ° C. By heating in a furnace, the high melting point solder 3 is melted and deformed into a spherical shape on the pad 5 by its surface tension, so that a spherical terminal 6 can be formed as shown in FIG.

【0028】このとき、低融点はんだ2は高融点はんだ
3とともに溶融し、それら2種のはんだは相互に拡散し
てほぼ均一なはんだ組成の球状端子6がパッド5上で形
成される。
At this time, the low-melting-point solder 2 is melted together with the high-melting-point solder 3, and the two kinds of solder are mutually diffused to form a spherical terminal 6 having a substantially uniform solder composition on the pad 5.

【0029】従って、低融点はんだ2と高融点はんだ3
の組成や体積比等は、それらが溶融しあってほぼ均一な
組成となる球状端子6に要求される特性も考慮して選択
することが望ましい。
Therefore, the low melting point solder 2 and the high melting point solder 3
Is desirably selected in consideration of the characteristics required for the spherical terminal 6 that is melted and becomes a substantially uniform composition.

【0030】なお、ピン状端子1を球状に変形せしめる
ための加熱溶融手段あるいは方法としては、リフロー炉
を用いる他にも、ヒーターブロックに載置して加熱する
方法やバッチ炉にて加熱する方法などがある。
As a heating and melting means or method for deforming the pin-like terminal 1 into a spherical shape, a method of mounting on a heater block and a method of heating in a batch furnace besides using a reflow furnace. and so on.

【0031】また、加熱溶融の条件としては、ピン状の
高融点はんだ3が表面張力によって球状に変形すること
などを考慮して、例えば窒素雰囲気中で前記の約 350℃
で1分程度保持すればよい。
The conditions for the heating and melting are, for example, about 350 ° C. in a nitrogen atmosphere in consideration of the fact that the pin-shaped high melting point solder 3 is deformed into a spherical shape by surface tension.
For about one minute.

【0032】これにより球状端子6はBGAタイプと同
等の形状の実装端子となり、実装回路基板側の多数の端
子部(ランド)にこの球状端子6を接触させた状態で加
熱して溶融させることにより表面実装を容易に行なうこ
とができる。しかも、基体4表面のパッド5に精度良く
立設させたピン状端子1を加熱溶融させて球状に変形せ
しめることから、端子間の短絡を防止しつつ十分な量の
半田を量産性良く供給して、ファインピッチに対応した
所望のBGAタイプの球状端子6を形成することができ
る。
As a result, the spherical terminal 6 becomes a mounting terminal having the same shape as the BGA type, and is heated and melted while the spherical terminal 6 is in contact with a large number of terminal portions (lands) on the mounting circuit board. Surface mounting can be easily performed. Moreover, since the pin-shaped terminals 1 erected on the pads 5 on the surface of the base 4 with high precision are melted by heating and deformed into spherical shapes, a sufficient amount of solder can be supplied with good mass productivity while preventing short-circuiting between the terminals. Thus, a desired BGA type spherical terminal 6 corresponding to the fine pitch can be formed.

【0033】また、ピン状端子1の低融点はんだ2の融
点と高融点はんだ3の融点との差を20℃以上としたこと
から、一度に多数本のピン状端子1を供給して基体4表
面のパッド5に立設させる場合であっても、高融点はん
だ3を溶融させずピン状の形状を変形させることなく低
融点はんだ2のみを溶融させてパッド5に融着させて立
設させることができ、その後、そのピン状端子1を加熱
溶融させ表面張力によって変形せしめて球状端子6を形
成するという工程を安定して行なうことができるため、
量産時においても多数の球状端子6を安定して精度良く
形成することができる。
Further, since the difference between the melting point of the low melting point solder 2 and the melting point of the high melting point solder 3 of the pin-shaped terminal 1 is set to 20 ° C. or more, a large number of pin-shaped terminals 1 are supplied at one time to Even in the case of standing on the pad 5 on the front surface, only the low-melting-point solder 2 is melted without melting the high-melting-point solder 3 and deforming the pin-like shape, and is fused to the pad 5 to stand. Thereafter, the step of heating and melting the pin-shaped terminal 1 and deforming the pin-shaped terminal 1 by surface tension to form the spherical terminal 6 can be stably performed.
Even during mass production, a large number of spherical terminals 6 can be formed stably and accurately.

【0034】なお、本発明は上述の実施形態に何ら限定
されるものではなく、本発明の要旨を逸脱しない範囲で
種々の変更・改良などを加えることは何ら差し支えな
い。
It should be noted that the present invention is not limited to the above-described embodiment, and that various changes and improvements can be made without departing from the scope of the present invention.

【0035】[0035]

【発明の効果】本発明の球状端子の形成方法によれば、
まず一端に低融点はんだが接合されている高融点はんだ
から成るピン状端子をその低融点はんだを溶融させるこ
とによって基体表面に形成したパッドに立設させ、いわ
ゆるPGAタイプと同等の形状の実装端子とすることか
ら、この状態の端子をソケット等に挿入することにより
実装端子の耐久性を低下させることなく電気的特性の測
定試験を容易に行なうことができた。また、基体表面に
形成したパッドにピン状端子を立設させることから、実
装端子間のピッチが狭い場合でも容易かつ正確に実装端
子を配列させることができ、実装端子のファインピッチ
化に容易に対応できた。
According to the method for forming a spherical terminal of the present invention,
First, a pin-shaped terminal made of a high-melting-point solder having a low-melting-point solder joined to one end thereof is erected on a pad formed on the surface of the base by melting the low-melting-point solder. Therefore, by inserting the terminal in this state into a socket or the like, a measurement test of electrical characteristics could be easily performed without reducing the durability of the mounted terminal. In addition, since the pin-shaped terminals are erected on the pads formed on the surface of the base, even if the pitch between the mounting terminals is narrow, the mounting terminals can be easily and accurately arranged, and the fine pitch of the mounting terminals can be easily achieved. I was able to respond.

【0036】また、本発明の球状端子の形成法によれ
ば、そのようにしてピン状端子を精度良く立設させた後
に高融点はんだから成るピン状端子を加熱溶融させ、表
面張力によって球状に変形せしめることから、いわゆる
BGAタイプと同等の形状の球状端子を、端子間の短絡
を防止しつつ十分な量の半田を量産性良く供給して、所
望のファインピッチに対応させて容易に形成することが
できた。これにより、実装基板側の端子部(ランド)へ
の表面実装を容易に行なうことができるものとなる。
Further, according to the method of forming a spherical terminal of the present invention, the pin-shaped terminal made of high melting point solder is heated and melted after the pin-shaped terminal is accurately erected in this manner, and the pin-shaped terminal is formed into a spherical shape by surface tension. Since it is deformed, a spherical terminal having the same shape as the so-called BGA type can be easily formed in correspondence with a desired fine pitch by supplying a sufficient amount of solder with good mass productivity while preventing a short circuit between the terminals. I was able to. As a result, surface mounting on the terminal portion (land) on the mounting board side can be easily performed.

【0037】さらに、本発明の球状端子の形成方法によ
れば、ピン状端子の低融点はんだの融点と高融点はんだ
の融点との差を20℃以上としたことから、一度に多数本
のピン状端子を供給して基体表面のパッドに立設させる
場合であっても、高融点はんだを溶融させずピン状の形
状を変形させることなく低融点はんだのみを溶融させて
パッドに融着させて立設させることができ、量産時にお
いても多数の実装端子を安定して精度良く形成すること
ができた。
Further, according to the method of forming a spherical terminal of the present invention, since the difference between the melting point of the low melting point solder and the melting point of the high melting point solder of the pin-shaped terminal is set to 20 ° C. or more, a large number of pins can be formed at one time. Even if the terminal is supplied and it is erected on the pad on the surface of the base, only the low melting point solder is melted and fused to the pad without melting the high melting point solder and deforming the pin shape. The mounting terminals could be erected, and a large number of mounting terminals could be formed stably and accurately even during mass production.

【0038】従って、本発明によれば、半導体素子収納
用パッケージの回路基板への表面実装や半導体素子収納
用パッケージの搭載部への半導体素子の表面実装、ある
いは回路基板の他の回路基板への表面実装などにおいて
球状端子を使用する場合に、ファインピッチの実装端子
として端子間の短絡を防止しつつ十分な量の半田を量産
性良く供給して所望の球状端子を形成することができ、
しかも表面実装前に実装端子の耐久性を低下させること
なく電気的特性の測定試験を容易に行なうこともできる
球状端子の形成方法を提供することができた。
Therefore, according to the present invention, the surface mounting of the semiconductor element housing package on the circuit board, the surface mounting of the semiconductor element on the mounting portion of the semiconductor element housing package, or the mounting of the circuit board on another circuit board is performed. When using spherical terminals in surface mounting etc., it is possible to form a desired spherical terminal by supplying a sufficient amount of solder with good mass productivity while preventing short circuit between terminals as a fine pitch mounting terminal,
In addition, a method for forming a spherical terminal that can easily perform a measurement test of electrical characteristics without reducing the durability of the mounted terminal before surface mounting can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)〜(c)はそれぞれ本発明の実施形態の
一例を示す断面図である。
FIGS. 1A to 1C are cross-sectional views each showing an example of an embodiment of the present invention.

【符号の説明】 1・・・・・ピン状端子 2・・・・・低融点はんだ 3・・・・・高融点はんだ 4・・・・・基体 5・・・・・パッド 6・・・・・球状端子[Explanation of Signs] 1 ... Pin-shaped terminal 2 ... Low melting point solder 3 ... High melting point solder 4 ... Base 5 ... Pad 6 ... ..Spherical terminals

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 一端に低融点はんだが接合されている高
融点はんだから成るピン状端子を、前記低融点はんだを
溶融させることによって基体表面に形成したパッドに立
設させ、しかる後、前記高融点はんだから成るピン状端
子を加熱溶融させ、表面張力によって球状に変形せしめ
ることを特徴とする球状端子の形成方法。
1. A pin-shaped terminal made of a high-melting-point solder having one end joined with a low-melting-point solder is erected on a pad formed on the surface of a base by melting the low-melting-point solder. A method for forming a spherical terminal, wherein a pin-shaped terminal made of a melting point solder is heated and melted and deformed into a spherical shape by surface tension.
【請求項2】 前記低融点はんだの融点と前記高融点は
んだの融点との差が20℃以上であることを特徴とする
請求項1記載の球状端子の形成方法。
2. The method according to claim 1, wherein a difference between a melting point of the low melting point solder and a melting point of the high melting point solder is 20 ° C. or more.
JP21758296A 1996-08-19 1996-08-19 Formation of spherical terminal Pending JPH1065041A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21758296A JPH1065041A (en) 1996-08-19 1996-08-19 Formation of spherical terminal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21758296A JPH1065041A (en) 1996-08-19 1996-08-19 Formation of spherical terminal

Publications (1)

Publication Number Publication Date
JPH1065041A true JPH1065041A (en) 1998-03-06

Family

ID=16706547

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21758296A Pending JPH1065041A (en) 1996-08-19 1996-08-19 Formation of spherical terminal

Country Status (1)

Country Link
JP (1) JPH1065041A (en)

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