JPH1064973A - Semiconductor manufacturing device - Google Patents

Semiconductor manufacturing device

Info

Publication number
JPH1064973A
JPH1064973A JP22110496A JP22110496A JPH1064973A JP H1064973 A JPH1064973 A JP H1064973A JP 22110496 A JP22110496 A JP 22110496A JP 22110496 A JP22110496 A JP 22110496A JP H1064973 A JPH1064973 A JP H1064973A
Authority
JP
Japan
Prior art keywords
wafer
chamber
cooling
chambers
external surfaces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22110496A
Other languages
Japanese (ja)
Inventor
Akinobu Yamaoka
明暢 山岡
Kazuhiro Shino
和弘 示野
Takeshi Yasui
毅 保井
Katsuji Toyama
克二 遠山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Electric Corp
Original Assignee
Kokusai Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Electric Corp filed Critical Kokusai Electric Corp
Priority to JP22110496A priority Critical patent/JPH1064973A/en
Publication of JPH1064973A publication Critical patent/JPH1064973A/en
Pending legal-status Critical Current

Links

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PROBLEM TO BE SOLVED: To use the external surfaces of a polygonal transportation chamber for the other purpose than cooling by installing a wafer transporting mechanism which transports wafers between cassette chambers and reaction chambers in the transportation chamber and providing a cooling table within the turning radius of the waver transporting mechanism. SOLUTION: Two cassette chambers 1A and 1B are respectively provided on the two continuous external surfaces of a polygonal transportation chamber 5 and two reaction chambers 2A and 2B are provided on another two continuous external surfaces. A wafer transporting mechanism 4 which transports wafers 3 between the chambers 1A and 1B and 2A and 2B is provided in the chamber 5. Then, for example, two cooling tables 6 are provided at positions higher than the turning plane of the mechanism 4 at cooling time within the turning radius R of the mechanism 4 and, at the same time, the elevating/lowering shaft 8 of the mechanism 4 is vertically erected on the mechanism 4 or tables 6. Therefore, the external surfaces of the chamber 5 which have been used for cooling the chamber 5 can be used for other purposes and the function of an individual wafer type semiconductor manufacturing device can be improved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ウェーハの冷却を
行う半導体製造枚葉装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing single-wafer apparatus for cooling a wafer.

【0002】[0002]

【従来の技術】図2は従来装置の1例を示す説明用平面
図である。この従来例は、多角形の搬送室5の、例えば
2つの外面に2つのカセット室1A,1Bを連設し、他
の2つの外面に2つの反応室2A,2Bを連設すると共
に、その他の2つの外面に2つの冷却室7A,7Bを取
付けた構成になっている。4はウェーハを搬送するウェ
ーハ搬送機構、9は旋回軸、10はウェーハ保持具であ
る。
2. Description of the Related Art FIG. 2 is an explanatory plan view showing an example of a conventional apparatus. In this conventional example, for example, two cassette chambers 1A and 1B are continuously provided on two outer surfaces of a polygonal transfer chamber 5, and two reaction chambers 2A and 2B are continuously provided on the other two outer surfaces. And two cooling chambers 7A and 7B are attached to the two outer surfaces. 4 is a wafer transfer mechanism for transferring a wafer, 9 is a pivot, and 10 is a wafer holder.

【0003】[0003]

【発明が解決しようとする課題】上記従来例にあって
は、多角形搬送室5の少なくとも1つの外面に冷却室を
連設しているので、搬送室5の1つ以上の外面が冷却用
に供されていて、別の膜生成など他用途に使えないとい
う課題がある。
In the above-mentioned prior art, since a cooling chamber is continuously provided on at least one outer surface of the polygonal transfer chamber 5, at least one outer surface of the transfer chamber 5 is used for cooling. And cannot be used for other purposes such as formation of another film.

【0004】[0004]

【課題を解決するための手段】本発明装置は、上記従来
技術の課題を解決するため、カセット室1A,1B・・
・と反応室2A,2B・・・との間でウェーハ3を搬送
するウェーハ搬送機構4を搬送室5内に設置し、前記ウ
ェーハ搬送機構4の旋回範囲内の内側に冷却台6を設け
ることを特徴とする。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems of the prior art, the apparatus of the present invention comprises cassette chambers 1A, 1B,.
., A wafer transfer mechanism 4 for transferring the wafer 3 between the reaction chambers 2A, 2B,... Is installed in the transfer chamber 5, and a cooling table 6 is provided inside the turning range of the wafer transfer mechanism 4. It is characterized by.

【0005】[0005]

【発明の実施の形態】図1(A),(B)はそれぞれ本
発明装置の実施形態を示す説明用平面図及び本発明にお
ける旋回面の高さと冷却台の高さ関係を示す図である。
本形態は、多角形搬送室5の、例えば2つの外面に2つ
のカセット室1A,1Bを連設し、例えば他の2つの外
面に2つの反応室2A,2Bを連設せしめ、前記カセッ
ト室1A,1Bと反応室2A,2Bとの間でウェーハ3
を搬送するウェーハ搬送機構4を前記搬送室5内に設置
し、前記ウェーハ搬送機構4の旋回範囲内Rの内側で、
冷却時に旋回面より高い位置に例えば2つの冷却台6を
設けると共に、前記ウェーハ搬送機構4又は冷却台6に
例えばウェーハ搬送機構4に昇降軸8を垂設する構成と
する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIGS. 1A and 1B are a plan view for explanation showing an embodiment of the apparatus of the present invention and a view showing the relationship between the height of a turning surface and the height of a cooling stand in the present invention. .
In the present embodiment, for example, two cassette chambers 1A and 1B are continuously provided on two outer surfaces of the polygon transfer chamber 5, and two reaction chambers 2A and 2B are continuously provided on the other two outer surfaces, for example. 1A, 1B and the reaction chamber 2A, 2B between the wafer 3
Is installed in the transfer chamber 5, and inside the turning range R of the wafer transfer mechanism 4,
At the time of cooling, for example, two cooling stands 6 are provided at a position higher than the turning surface, and an elevating shaft 8 is vertically attached to the wafer transfer mechanism 4 or the cooling stand 6, for example.

【0006】上記の構成においてその動作を説明する。
ウェーハ搬送機構4のウェーハ保持具10を旋回軸9を
中心に旋回してカセット室1A,1Bのいずれか一方の
カセット室、例えば1Aに向け、ウェーハ保持具10を
伸長させてカセット室1A内に挿入し、しかる後昇降軸
8により少しだけ上動させてウェーハ3をウェーハ保持
具10上に移載してから、ウェーハ保持具10を縮小し
旋回して反応室2A,2Bのいずれか一方の反応室、例
えば2Aに向け、ウェーハ保持具10を伸長させてウェ
ーハ3を反応室2Aに搬入し、しかる後、昇降軸8によ
り少しだけ下動してウェーハ3を反応室2A内のサセプ
タ上に載せ、サセプタ上のウェーハを加熱しながら反応
ガスを流通させることによりウェーハ3上に膜を生成さ
せる。
The operation of the above configuration will be described.
The wafer holder 10 of the wafer transfer mechanism 4 is turned around the turning shaft 9 to be directed to one of the cassette chambers 1A and 1B, for example, 1A, and the wafer holder 10 is extended into the cassette chamber 1A. Then, the wafer 3 is moved slightly upward by the elevating shaft 8 to transfer the wafer 3 onto the wafer holder 10, and then the wafer holder 10 is reduced and turned to rotate one of the reaction chambers 2A and 2B. The wafer 3 is loaded into the reaction chamber 2A by extending the wafer holder 10 toward the reaction chamber, for example, 2A, and then moved down slightly by the elevating shaft 8 to move the wafer 3 onto the susceptor in the reaction chamber 2A. A film is formed on the wafer 3 by flowing the reaction gas while heating the wafer on the susceptor.

【0007】ウェーハ保持具10を伸長させて反応室2
A内に挿入し、しかる後、少しだけ上動させて高温のウ
ェーハ3をウェーハ保持具10上に移動してからウェー
ハ保持具10を縮小し旋回して冷却台7A,7Bのいず
れか一方の、例えば冷却台7A上方位置で停止させ、ウ
ェーハ保持具10を昇降軸8により下動させて高温のウ
ェーハ3を冷却台7A上に移載して冷却する。冷却した
ウェーハ3はウェーハ保持具10に移し替え、カセット
室1Aの空の収納溝に収納する。他の反応室2Bは一方
の反応室2Aとは異なる反応生成膜の生成に供される。
反応室2Aでウェーハ3に膜を生成し、反応室2Bで該
ウェーハ3の膜上に別の膜を生成したり、別々のウェー
ハに別々の膜を生成したりすることができる。両反応室
2A,2Bで膜生成されたウェーハを冷却台7A,7B
により冷却することができる。なお、昇降軸を冷却台6
に設けてこれによりウェーハの移し替えを行ってもよ
い。
The reaction chamber 2 is extended by extending the wafer holder 10.
A, after that, the wafer 3 is moved slightly upward to move the high-temperature wafer 3 onto the wafer holder 10, and then the wafer holder 10 is reduced and turned to rotate one of the cooling tables 7A and 7B. For example, the wafer is stopped at a position above the cooling stand 7A, and the wafer holder 10 is moved down by the elevating shaft 8 to transfer the high-temperature wafer 3 onto the cooling stand 7A for cooling. The cooled wafer 3 is transferred to the wafer holder 10 and stored in an empty storage groove in the cassette chamber 1A. The other reaction chamber 2B is used for forming a reaction product film different from the one reaction chamber 2A.
A film can be formed on the wafer 3 in the reaction chamber 2A, and another film can be formed on the film of the wafer 3 in the reaction chamber 2B, or different films can be formed on different wafers. The wafers formed in the two reaction chambers 2A and 2B are cooled by cooling tables 7A and 7B.
Can be cooled. The elevating shaft is connected to the cooling stand 6.
To transfer the wafer.

【0008】[0008]

【発明が解決しようとする課題】上述のように本発明に
よれば、従来、多角形搬送室の冷却用に供されていた外
面を冷却用以外の用途に使用することができ、枚葉式の
半導体製造の機能を向上することができる。
According to the present invention, as described above, the outer surface conventionally used for cooling the polygonal transfer chamber can be used for purposes other than cooling. Semiconductor manufacturing function can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(A),(B)はそれぞれ本発明装置の実施形
態を示す説明用平面図及び本発明における旋回面の高さ
と冷却台の高さ関係を示す図である。
FIGS. 1A and 1B are a plan view for explanation showing an embodiment of the device of the present invention, and a diagram showing the relationship between the height of a turning surface and the height of a cooling stand in the present invention.

【図2】従来装置の1例を示す説明用平面図である。FIG. 2 is an explanatory plan view showing one example of a conventional device.

【符号の説明】[Explanation of symbols]

1A,1B カセット室 2A,2B 反応室 3 ウェーハ 4 ウェーハ搬送機構 5 搬送室 6 冷却台 7A,7B 冷却室 8 昇降軸 9 旋回軸 10 ウェーハ保持具 1A, 1B Cassette chamber 2A, 2B Reaction chamber 3 Wafer 4 Wafer transfer mechanism 5 Transfer chamber 6 Cooling stand 7A, 7B Cooling chamber 8 Elevating shaft 9 Rotating shaft 10 Wafer holder

───────────────────────────────────────────────────── フロントページの続き (72)発明者 遠山 克二 東京都中野区東中野三丁目14番20号 国際 電気株式会社内 ────────────────────────────────────────────────── ─── Continuing on the front page (72) Katsuji Toyama, Inventor 3--14-20 Higashinakano, Nakano-ku, Tokyo Inside Kokusai Electric Corporation

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 カセット室と反応室との間でウェーハを
搬送するウェーハ搬送機構を搬送室内に設置し、前記ウ
ェーハ搬送機構の旋回範囲内の内側に冷却台を設けるこ
とを特徴とする半導体製造装置。
1. A semiconductor manufacturing method comprising: installing a wafer transfer mechanism for transferring a wafer between a cassette chamber and a reaction chamber in a transfer chamber; and providing a cooling table inside a turning range of the wafer transfer mechanism. apparatus.
JP22110496A 1996-08-22 1996-08-22 Semiconductor manufacturing device Pending JPH1064973A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22110496A JPH1064973A (en) 1996-08-22 1996-08-22 Semiconductor manufacturing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22110496A JPH1064973A (en) 1996-08-22 1996-08-22 Semiconductor manufacturing device

Publications (1)

Publication Number Publication Date
JPH1064973A true JPH1064973A (en) 1998-03-06

Family

ID=16761557

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22110496A Pending JPH1064973A (en) 1996-08-22 1996-08-22 Semiconductor manufacturing device

Country Status (1)

Country Link
JP (1) JPH1064973A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003524897A (en) * 2000-02-25 2003-08-19 ウェーハマスターズ・インコーポレイテッド Wafer processing system
CN100411095C (en) * 2005-08-12 2008-08-13 Ips有限公司 Chamber for vacuum processing device and device having the chamber
JP2010171344A (en) * 2009-01-26 2010-08-05 Tokyo Electron Ltd Vacuum treatment device
JP2012192573A (en) * 2011-03-15 2012-10-11 Ricoh Co Ltd Droplet-discharging-head manufacturing apparatus, droplet-discharging-head manufacturing method, droplet discharging head, droplet discharging device, and printing apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003524897A (en) * 2000-02-25 2003-08-19 ウェーハマスターズ・インコーポレイテッド Wafer processing system
CN100411095C (en) * 2005-08-12 2008-08-13 Ips有限公司 Chamber for vacuum processing device and device having the chamber
JP2010171344A (en) * 2009-01-26 2010-08-05 Tokyo Electron Ltd Vacuum treatment device
JP2012192573A (en) * 2011-03-15 2012-10-11 Ricoh Co Ltd Droplet-discharging-head manufacturing apparatus, droplet-discharging-head manufacturing method, droplet discharging head, droplet discharging device, and printing apparatus

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