JPH105473A - Optical information detection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To correctly provide prescribed information even where pulses of disturbing light exist. SOLUTION: A prescribed object (work to be sewn) is irradiated by a light emitting means 3 which emits pulse light, radiation light irradiating the object is received by light receiving means 4a, 4b, and prescribed information (edge part information) is obtained by an information obtaining means (edge part information obtaining means) 19 based on received light quantity received by the light receiving means 4a, 4b. In the meanwhile, as pulses of disturbing light are detected by a disturbing light pulse detection means 70 in a pulse light emitting timing of the light emitting means 3, the light emitting means 3 again is set to emit pulse light before the next pulse light emitting timing by a light emission control means 55, and the information obtaining means 19 obtains prescribed information based on received light quantity received by the light receiving means 4a, 4b at the time of above second pulse emission, while prescribed information when the pulses of disturbing light are detected is ignored.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to an optical information detecting device, and more particularly to an optical information detecting device applied to a cloth edge control sewing machine.

[0002]

2. Description of the Related Art Conventionally, for example, in the sewing field of sewing machines, two cloths having cloth end curves having different curves are automatically sewn while aligning the cloth ends.
With respect to such a so-called cloth edge control sewing machine, for example, a machine disclosed in Japanese Patent Application Laid-Open No. 6-246081 is known. The device described in JP-A-6-246081 is
Multiple LEDs for each of the two sewing objects
(Light Emitting Diode) A thin-plate LED panel in which elements are juxtaposed and a solar cell are arranged facing each other with a sewing object interposed therebetween, and the LED elements are turned on / off (pulse emission).
By irradiating the interposed sewing object and irradiating light that is not blocked by the sewing object with the solar cell, the edge position information of the sewing object is acquired based on the received light amount. By moving the workpiece so as to obtain a predetermined sewing allowance based on the edge position information, so-called copying sewing along the edge can be performed.

[0003] The above-mentioned apparatus is also provided with a means for removing disturbance light such as indoor light such as incandescent lamps and fluorescent lamps and sunlight from the amount of light received by the solar cell. This disturbance light removing means removes the amount of disturbance light received by the solar cell when the LED element is off from the amount of light received by the solar cell when the LED element is on,
As a result, edge position information that is not affected by disturbance light is acquired, and accurate copying can be performed.

[0004]

However, the above apparatus has the following problems. That is, LED
When the solar cell receives pulsed disturbance light that shines, for example, when the element is turned on, the disturbance light removal means removes the light amount due to the pulsed disturbance light from the received light amount received by the solar cell. However, there is a problem that the obtained edge position information becomes inaccurate, and accurate copying and sewing cannot be performed.

As an apparatus for detecting optical information other than the above-described cloth edge control sewing machine, for example, even in an image sensor or the like, when a predetermined object is irradiated by a light emitting means which emits a pulse light, the irradiation light is emitted. In addition, when the pulse-like disturbance light as described above is received by the light receiving unit, there is a problem that the acquired imaging information becomes inaccurate.

SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide an optical information detecting device capable of accurately obtaining predetermined information even when there is pulsed disturbance light.

[0007]

According to another aspect of the present invention, there is provided an optical information detecting apparatus for a cloth edge applied to a cloth edge control sewing machine, wherein the optical information detecting apparatus emits pulses. A light emitting unit that irradiates the sewing object with the irradiation light, a light receiving unit that receives the irradiation light that irradiates the sewing object, and edge information of the sewing object is obtained based on the amount of light received by the light receiving unit. Edge information acquisition means, and an optical information detection device comprising: a disturbance light pulse detection means for detecting pulse-like disturbance light; and a pulse-like disturbance light is detected at the pulse emission timing of the light-emitting means. Light emission control means for causing the light emitting means to emit pulse light again by the time of the pulse light emission, wherein, when the light emitting means emits pulse light again, By means It is characterized by obtaining edge information of the workpiece on the basis of the quantity of received light to be light.

According to another aspect of the present invention, there is provided an optical information detecting apparatus, comprising: a light emitting means for irradiating a predetermined detection object with irradiation light of pulse emission; and a light receiving means for receiving irradiation light irradiating the detection object. Means, and information acquisition means for obtaining predetermined information based on the amount of light received by the light receiving means, an optical information detection device comprising: a disturbance light pulse detection means for detecting pulse-like disturbance light; When a pulse-like disturbance light is detected at the pulse emission timing of the light emitting unit, a light emission control unit that causes the light emitting unit to emit pulse light again by the next pulse emission timing is provided. When the pulse light is emitted again, predetermined information is obtained based on the amount of light received by the light receiving means when the pulse light is emitted again.

According to the optical information detecting device of the first and second aspects, a predetermined detected object (a sewing object) is irradiated by the light emitting means which emits the pulse light, and the irradiated light irradiated on the detected object is received. The predetermined information (edge information) is acquired by the information acquisition means (edge information acquisition means) based on the amount of light received by the light reception means. When the pulsed disturbance light is detected by the disturbance light pulse detection means, the light emission control means emits the pulse light again by the time of the next pulse light emission, and the information acquisition means performs the pulse emission again when the pulse light is emitted again. The predetermined information is obtained based on the amount of light received by the light receiving means, and the predetermined information when the pulsed disturbance light is detected is ignored.

[0010]

Embodiments of the present invention will be described below with reference to the drawings. The optical information detection device of the present embodiment is applied to a fabric edge control sewing machine that automatically sewes two fabrics (sewed objects) having different fabric edge curves while aligning the fabric edges. In FIG. 1, reference numeral 1 denotes a sewing machine head, 2 denotes a sewing needle, and near the needle drop point of the sewing needle 2, near the surface emitting LED (light emitting diode) panels 3 and 3 'as light emitting means. And single-crystal type solar cells (photodiodes) 4, 4 'as light receiving means, for example, are arranged so as to be overlapped in the vertical direction. The surface emitting LED panels 3 and 3 'and the solar cells 4 and 4' are provided for the upper cloth and the lower cloth via the separation plate 5, and both are superposed. Then, the surface emitting LED panel 3 for the upper cloth and the surface light emitting L for the lower cloth
The ED panel 3 ', the solar cell 4 for the upper cloth, and the solar cell 4' for the lower cloth have the same configuration.

As shown in FIG. 3, the surface-emitting LED panel 3 includes a panel printed board 3b, a plurality of LED element chips 3a arranged in parallel on the panel printed board 3b, and these LED elements. The case 3d includes a case 3d surrounding the chip 3a, and a translucent film 3c for light diffusion covering the opposite side of the case 3d from the panel printed circuit board. When the LED element chip 3a emits light, the surface of the diffusion film 3c is formed. Are configured so that a uniform light amount can be obtained. In FIG. 3, the LED element chip 3a
Are arranged in a vertical and horizontal matrix, but may be arranged at each point on a hexagonal lattice, for example, and many other arrangement patterns are conceivable.

As shown in detail in FIG. 2, the solar cell 4 includes a solar cell 4a for measuring transmittance and a solar cell 4b for measuring a cloth edge position as edge information. A solar cell 4c for detecting disturbance light constituting disturbance light pulse detection means is fixed to the back surface of the member for fixing the surface-emitting LED panel 3, so that disturbance light can be detected. The position of the disturbance light detecting solar cell 4c is not limited to this, and is a position near the solar cell 4 where the disturbance light can be received and the irradiation of the surface light emitting LED panels 3 and 3 'is not received. I just want it.

The above-mentioned surface emitting LED panel 3 and solar cell 4
And between the surface emitting LED panel 3 ′ and the solar cell 4 ′ are respectively separated by a predetermined distance.
As shown in FIG. 2, an upper cloth 7 is provided between the surface emitting LED panel 3 and the solar cell 4, and although not shown, a lower cloth is provided between the surface emitting LED panel 3 ′ and the solar cell 4 ′.
After passing through each of them, an edge position of each cloth is acquired as edge information as described below. When the positions of the cloth end portions are shifted, the sewing is performed while correcting the position of the shifted cloth, and the sewing is automatically performed while aligning the cloth ends.

Next, the above-mentioned surface-emitting LED panel 3, solar cells 4 (4a, 4b) and disturbance light detecting solar cells 4c
The circuit configuration of the optical information detection device having the above will be described below with reference to FIG. In addition, surface emitting LED for lower cloth
For the panel 3 'and the solar cell 4', the surface emitting LE
Since they are the same as the D panel 3 and the solar cell 4, illustration and description thereof are omitted.

In FIG. 1, reference numeral 10 denotes an oscillator for determining an LED lighting cycle. A rectangular wave signal from the oscillator 10 is input to a one-shot generation circuit A. The one-shot generation circuit A generates an LED on-pulse signal synchronized with the rise of the rectangular wave signal from the oscillator 10. The LED on-pulse signal from the one-shot generation circuit A is supplied to the base of the transistor Q1 via the OR gate U1, the buffer U2, and the resistor R1. The surface emitting LED panel 3 is connected to the collector of the transistor Q1 via a resistor R2.

The transmittance measuring light quantity detecting circuit 14a comprises the above-mentioned solar cell 4a, an operational amplifier U6, a resistor R7 and a capacitor C3. The output of the transmittance measuring light quantity detecting circuit 14a is a transistor Q2, an inverter U7,
It is input to a pulse component detection circuit 15a composed of a capacitor C4 and resistors R8, R9, and R10 for removing disturbance light.
A pulse from the OR gate U1 is input to the inverter U7 of the pulse detection circuit 15a. The output of the pulse detection circuit 15a is supplied to the sample and hold circuit 1
6a. This sample and hold circuit 16a
Sample and hold the pulse of the pulse detection circuit 15a according to the pulse from the OR gate U1. The sample hold circuit 16a can be replaced with a peak hold circuit.

The light amount detection circuit 14 also detects the cloth edge position.
b, a pulse detecting circuit 15b and a sample hold circuit 16b are provided. The cloth edge position detecting light amount detecting circuit 14b includes the solar cell 4b, an operational amplifier U8, a resistor R11, and a capacitor C5. Comprises a transistor Q3, an inverter U9, a capacitor C6, and resistors R12, R13, and R14. The sample-and-hold circuit 16b includes an OR gate U1.
The sample of the pulse of the pulse detection circuit 15b is sampled and held in accordance with the pulse from.

The analog multiplexer 17 has a microcomputer (CPU) 19 as edge information acquisition means.
Sample and hold circuits 16a, 16a
b through the A / D converter 18 so that the output signal of the microcomputer 1 can be selected and input to the CPU.
Enter 9 Also, the circuit of FIG.
A one-shot generation circuit 20 for forming a pulse having a predetermined width T1 in response to a pulse from the microcomputer 19 is provided, and a read timing pulse is supplied to the microcomputer 19.

The disturbance light pulse detection circuit 14c is composed of the disturbance light detection solar cell 4c, an operational amplifier U3, a resistor R3, and a capacitor C1, and the output of the disturbance light pulse detection circuit 14c is a high-pass composed of a capacitor C2 and a resistor R4. The signal is input to a level detector 51 including a voltage comparator U4 and resistors R5 and R6 via a filter 50. The disturbance light pulse detection circuit 14c, the high-pass filter 50, and the level detector 51 constitute a disturbance light pulse detection unit 70. This level detector 5
The disturbance light pulse signal from 1 is input to the AND gate U5. The AND gate U5 receives a pulse signal from the OR gate U1 and a signal from the microcomputer 19 in addition to the disturbance light pulse signal, and outputs a processing result to the one-shot generation circuit B.

The one-shot generation circuit B outputs a pulse signal having a time width of T2 to the one-shot generation circuit C when a pulse signal is input from the AND gate U5. When the one-shot generation circuit C receives a pulse signal having a time width of T2, the one-shot generation circuit C outputs an LED re-on pulse signal having a time width of T3 in synchronization with a fall of the signal. The LED restart pulse signal is supplied to the OR gate U1, the buffer U2,
The voltage is supplied to the base of the transistor Q1 via the resistor R1. Here, the light emission control means 55 is constituted by the AND gate U5 and the one-shot generation circuits B and C.

The pulse signal of the T2 time width from the one-shot generation circuit B is also input to the microcomputer 19, and the microcomputer 19 is input via the A / D converter 18 in accordance with the pulse signal. Reading of received light intensity data is prohibited. A rectangular wave signal from the oscillator 10 is input to the microcomputer 19, and the microcomputer 19
When the rising edge of the rectangular wave signal is detected, the one-shot generating circuit B outputs a pulse signal having a time width T2 for a predetermined number of times or more to the AND gate U5 until the falling edge of the rectangular wave signal, The configuration is such that infinite output of a pulse signal having a T2 time width is prevented.

Next, the circuit operation of the optical information detecting device having such a configuration will be described below. First, the oscillator 10 outputs a rectangular wave signal as shown in FIG. In response to the rise of the rectangular wave signal, the one-shot generation circuit A outputs an LED on pulse as shown in FIG. 5B, and the LED on pulse is output via the OR gate U1, the buffer U2, and the resistor R1. When the transistor Q1 is supplied to the base of the transistor Q1, the transistor Q1 conducts, a current flows through the LED element chip 3a via the resistor R2, and the LED element chip 3a is pulsed.

When the LED element chip 3a is lit in a pulsed manner, as shown in FIG. 2, uniform irradiation is performed on the solar cell 4b for measuring the cloth edge position and the cloth 7 during the feeding operation. Accordingly, the solar cell 4a for transmittance measurement is irradiated with the light amount transmitted through the cloth 7, and the solar cell 4b for cloth end position measurement is irradiated with the light amount as it is in the portion not shielded by the cloth 7,
The shielding portion is irradiated with the amount of light transmitted through the cloth 7.

When the solar cell 4a for transmittance measurement is irradiated, a photocurrent proportional to the amount of light is generated.
As a result, the same amount of current as the photocurrent flows to cancel the photocurrent, so that the voltage between the positive and negative inputs of the operational amplifier U6 is maintained at 0 volt. Therefore, the output voltage of the operational amplifier U6 becomes a value obtained by multiplying the photocurrent of the solar cell 4a by the resistance value of the resistor R7, and the output as shown in FIG. You. In FIG. 5 (g), a portion AA protruding upward when the LED element chip 3a emits light is a voltage corresponding to only the amount of light of the LED element chip 3a, and a hatched BB when the LED element chip 3a is off.
Indicates a voltage corresponding to the amount of ambient light such as an incandescent lamp or a fluorescent lamp, or disturbance light such as sunlight.

In the pulse detecting circuit 15a constituted by a differentiating circuit, when the LED element chip 3a is turned off, the transistor Q2 is conducting, so that its output is 0 volt. At this time, the transistor Q2
Conducts both in the normal forward direction and in the reverse direction. here,
Assuming that the output voltage of the transmittance measurement light quantity detection circuit 14a immediately before the LED element chip 3a is turned on is, for example, 4 volts, the capacitor C4 has a charge of 4 volts because the transistor Q2 is on. Here, when the LED element chip 3a is turned on, the transistor Q2 is turned off at the same time, and the output voltage of the transmittance measuring light amount detection circuit 14a becomes
For example, assuming that the voltage has changed to 7 volts, the capacitor C4 has a charge of 4 volts, as described above, so that a pulse voltage of (7-4) = 3 volts is output from the pulse detection circuit 15a. Will be done. However, R8 <R9
And

While the transistor Q2 is off while the LED element chip 3a is on, the voltage of the pulse detection circuit 15a decreases with a time constant of C4 × R10.
Under the condition of 4 × R10> (pulse width when the LED element chip 3a is turned on), the pulse voltage value can be regarded as constant while the LED element chip 3a is turned on. Then, when the LED element chip 3a is turned off again, the transistor Q2 conducts, and its output becomes 0 volt.

If there is no transistor Q2, the time constant of C4.times.R10 is quite large,
The response of the terminal voltage of the capacitor C4 to the voltage due to only the disturbance light when the ED element chip 3a is off is delayed, and the pulse output voltage is not constant.

Thus, the pulse detecting circuit 15a
The voltage output from is shown in FIG. 5 (i). As shown in FIG. 5, the voltage BB corresponding to the amount of disturbance light described with reference to FIG. 5G has been removed, and only the voltage AA corresponding to the amount of light from the LED element chip 3a is output. Become.

The output of the pulse detection circuit 15a is input to a sample-and-hold circuit 16a. In the sample-and-hold circuit 16a, a voltage AA corresponding only to the light amount of the LED element chip 3a is generated at the timing when the LED element chip 3a is turned on. It is held. FIG. 5K shows this waveform.

The output of the sample-and-hold circuit 16a is input to an analog multiplexer 17, in which the sample-and-hold circuit 16a is selected by a switching signal output from a microcomputer 19, and the A / D converter The data is input to a microcomputer 19 via 18. At this time, as shown in FIG. 5 (m), the one-shot generation circuit 20 that outputs a pulse having a time width of T1 in synchronization with the pulse output of the one-shot generation circuit A or C, which is the lighting timing of the LED element chip 3a. In response to the light amount reading timing signal, the microcomputer reads the light amount reading timing signal, and after a time T1 longer than the time required for the light amount to be digitally converted by the A / D converter 18 from the lighting of the LED element chip 3a, to the microcomputer. The received light voltage V due to the light emission of the LED is read into 19 and is held on a register.

Next, the same process as reading the amount of received light in the solar cell 4a for measuring transmittance is also performed in reading the amount of received light in the solar cell 4b for measuring the cloth edge position. At this time,
The light amount detecting circuit 14b for measuring the cloth edge position, the pulse detecting circuit 15b, and the sample and hold circuit 16b are used.
The sample-and-hold circuit 16b is selected by the switching signal output from 9, and the received light voltage obtained from the cloth end position measuring solar cell 4b is input to the microcomputer 19 via the A / D converter 18.

Next, the received light voltage V obtained from the solar cell 4a for transmittance measurement held on the register is divided by the received light voltage V ₀ in the absence of cloth stored in the microcomputer 19 in advance. , This value is the transmittance α of the cloth
Is stored as

FIG. 6 shows the relationship between the received light voltage Vx in the solar cell 4b for measuring the cloth edge position and the distance x (see FIG. 2) from the edge of the solar cell 4b to the cloth edge. That is, when the stroke x is 0, since the cloth covers the entire surface of the solar cell 4b, the curve with the symbol a when the transmittance is close to 0, and the curve with the symbol b when the transmittance is about half, the transmittance is high. In such a case, the curve is indicated by the symbol c. Here, in the case of a straight line, it is assumed that the light transmittance of the cloth is uniform regardless of the location, and that the light amount from the surface-emitting LED panel 3 is also uniform.

Here, assuming that the characteristic of the transmittance is the curve indicated by the symbol b and the received light voltage Vx is obtained, the stroke x is x = {(Vx−V2) / (V1−V2)} × _x0. More required. Here, V1 is a light receiving voltage when the solar cell 4b is fully opened, and is stored in the microcomputer 19 in advance. On the other hand, V2 is the light receiving voltage when the solar cell 4b is completely covered with the cloth, and is obtained as V2 = α · V1 from the transmittance α obtained by the light detection for transmittance measurement. In addition, x ₀ is in the receiving range of the solar cell 4b. That is, in this way, the distance x from the edge of the solar cell 4b to the cloth edge as the edge position information is obtained.

Here, as shown in FIG. 5C, even when pulsed disturbance light is received by the solar cells 4a and 4b, as shown in FIG. If the lighting of the LED element chip 3a (see FIG. 5 (f)) and the disturbance light pulse (see FIG. 5 (c)) do not overlap,
Since the amount of received light received by the solar cells 4a and 4b does not include a disturbance light pulse, the received light voltage Vx of the cloth end position measuring solar cell 4b and the received light voltage V of the transmittance measuring solar cell 4a can be read as they are. As in the case shown in (b), lighting of the LED element chip 3a (FIG. 5)
If the disturbance light pulse P1 (see FIG. 5C) overlaps with the disturbance light pulse P, the amount of light received by the solar cells 4a and 4b includes a disturbance light pulse. V contains an error corresponding to the disturbance light pulse P1.

The operation when the lighting of the LED element chip 3a and the disturbance light pulse P1 overlap as described above is as follows. That is, when the disturbance light pulse P1 is received by the disturbance light detection solar cell 4c, the disturbance light pulse P1 becomes
It is converted into a disturbance light pulse voltage by a disturbance light amount detection circuit 14c, separated and output only by the high-pass filter 50, and the level is detected by a level detector 51. The disturbance light pulse signal from the level detector 51 is AND gated. Input to U5.

The signal from the OR gate U1 and the signal from the microcomputer 19 shown in FIG. 5 (f) are also input to the AND gate U5, and all three inputs of the AND gate U5 become high level signals. Output a pulse signal to trigger the one-shot generation circuit B. The one-shot generation circuit B outputs a pulse signal as shown in FIG.
, A pulse signal having a time width of T2 is output. When the pulse signal of this T2 time width is input to the microcomputer 19, the microcomputer 1
Reference numeral 9 prohibits reading of the received light amount data input via the A / D converter 18.

The pulse signal of T2 time width from the one-shot generation circuit B is also input to the one-shot generation circuit C and is triggered by the falling edge of the pulse signal of T2 time width. 5 (e), a pulse signal having a T3 time width is output.
This pulse signal is supplied to the base of the transistor Q1 via the OR gate U1, the buffer U2, and the resistor R1,
As a result, the transistor Q1 conducts, a current flows through the LED element chip 3a via the resistor R2, and the LED element chip 3a is re-pulsed, as indicated by the symbol d1 in FIG. 5 (f).

At the time of the second lighting of the LED element chip 3a indicated by the symbol d1 in FIG. 5 (f), as shown in FIG. 5 (c), no disturbance light pulse is generated.
A pulse signal is not output from the AND gate U5 to the one-shot generation circuit B, and therefore, a pulse signal having a time width of T2 is not output from the one-shot generation circuit B. That is, the microcomputer 19 has an A / D
Since reading of the received light amount data input through the converter 18 is not prohibited, the solar cell 4b for measuring the cloth edge position is used.
Of the received light voltage Vx and the received light voltage V of the solar cell 4a for transmittance measurement are read.
In the above, the solar cell 4 as the edge position information described above
The distance x from the edge of b to the edge of the cloth is determined.

Further, as in the case shown by the reference numeral (c) in FIG. 5, the second L shown by the reference numeral d1 in FIG.
Even when the ED element chip 3a is turned on, as shown in FIG. 5C, when the disturbance light pulse P2 is generated,
A pulse signal is output from AND gate U5 to one-shot generation circuit B, and a pulse signal having a time width of T2 is output from one-shot generation circuit B. That is, reading of the received light amount data input through the A / D converter 18 to the microcomputer 19 is prohibited, and the received light voltage Vx of the cloth end position measuring solar cell 4b and the transmittance measuring solar cell 4a at this time are prohibited. Reading of the received light voltage V is prohibited, and the pulse signal of the T2 time width is input to the one-shot generation circuit C, and the LED element chip 3a
However, as shown by the symbol d2 in FIG.

When the LED element chip 3a is turned on for the third time, indicated by reference numeral d2 in FIG. 5 (f), no disturbance light pulse is generated as shown in FIG. 5 (c).
Similar to the case indicated by the reference numeral (b) in FIG.
The received light voltage V of the solar cell 4b for measuring the cloth edge position at this time
x, the received light voltage V of the solar cell 4a for transmittance measurement is read, and the microcomputer 19 obtains the distance x from the edge of the solar cell 4b to the cloth edge as the edge position information described above.

When the disturbance light pulse is generated at the time of the third lighting of the LED element chip 3a indicated by reference numeral d2 in FIG. 5 (f), the above operation is performed similarly. Thereafter, when a disturbance light pulse is generated when the LED element chip 3a is turned on, the above operation is repeated a predetermined number of times until the next output of the oscillator 10.

As described above, in the present embodiment, the object to be sewn is subjected to pulse light emission from the surface emitting LED panel 3 (3 ').
Irradiates the object to be sewn, and receives irradiation light from the solar cell 4 (4 ′).
While the microcomputer 19 acquires the edge information of the sewing object based on the amount of light received in (4 ′), the pulse-like disturbance occurs during the pulse emission timing of the surface-emitting LED panel 3 (3 ′). Disturbance light pulse detecting means 70
After the detection, the light emission control means 55 causes the surface light-emitting LED panel 3 (3 ') to emit a pulse light again by the next pulse light emission time.
When the pulse light is emitted again, the solar cell 4
(4 ') The edge information is obtained based on the received light amount received, and the edge information when the pulse-like disturbance light is detected is ignored, so that accurate edge information is obtained. Is available.

FIGS. 7 to 9 show an embodiment in which a bar-shaped LED array 20 is used instead of the surface-emitting LED panel 3. FIG. 7 shows the embodiment in which the bar-shaped LED array 20 is connected to the solar cells 4a and 4a. 4b is an enlarged perspective view together with FIG. 4b, FIG. 8 is a circuit diagram showing an optical information detecting device employing the bar-shaped LED array 20 of FIG. 7, and FIG. 9 is a bar-shaped LE of FIG.
FIG. 3 is an explanatory diagram showing a D array 20 in detail. This rod-shaped LED array 20 has a plurality of LEDs as shown in FIG.
The ED element chip 20a is exposed at equal intervals from the long base 20b that covers the electrode 20c, and can irradiate the opposed solar cell 4b with uniform light, similarly to the surface-emitting LED panel 3. It has become. The circuit diagram is the same as the circuit operation of FIG. 4 except that the surface-emitting LED panel 3 of the circuit diagram shown in FIG.

FIGS. 10 and 11 show an embodiment in which a wide directional LED 22 is used in place of the surface emitting LED panel 3. FIG. 10 shows the wide directional LED 22 together with the solar cells 4a and 4b. An enlarged perspective view,
FIG. 11 is a circuit diagram showing an optical information detection device employing the wide directional LED 22 of FIG. This wide directional LED2
When using the solar cell 4b, as shown in FIG. 10, a wide directional LED 2 is used for the solar cell 4b in order to make it possible to irradiate uniform light to the opposing solar cell 4b.
It is necessary to place the two considerably apart. The circuit diagram is the same as the circuit operation of FIG. 4 except that the surface emitting LED panel 3 of the circuit diagram shown in FIG.

FIGS. 12A and 12B show an embodiment in which an illumination panel 35 is used in place of the above-mentioned surface-emitting LED panel 3. FIG. 12A is a perspective view, and FIG. 12B is a side view.
As shown in the figure, the lighting panel 35 includes a transparent light guide plate 25 made of, for example, acrylic resin and the transparent light guide plate 2.
The light from the LED element chips 3a arranged on both sides of the transparent light guide plate 25 is made uniform by the diffuse reflection plate 26 arranged on the back side of the transparent light guide plate 5, and the solar cells 4a and 4b are irradiated. As is clear from the figure, the lighting panel 35 can be made thinner than the surface-emitting LED panel 3. Although a circuit diagram is not shown, the surface light-emitting LED panel 3 of the circuit diagram shown in FIG. 4 is simply replaced with the lighting panel 35, and the circuit operation is the same as that of FIG.

FIGS. 13 and 14 show the solar cell 4
A wide directional light receiver 40 is used instead of a and 4b,
LE for measuring transmittance in addition to the surface emitting LED panel 3
13 shows an embodiment using the D panel 3X. FIG. 13 is a perspective view of the embodiment, and FIG. 14 is a circuit diagram showing an optical information detecting device employing these. This wide directional light receiver 40
Is used, the wide-directivity light receiver 40, the surface-emitting LED panel 3, and the LED panel 3X for transmittance measurement are arranged more apart than the case shown in FIG. The configuration is such that the amount of the object to be sewn on the panel 3 is detected by a change in the amount of received light received by the wide directional light receiver 40.

When measuring the transmittance of the sewing object, as shown in FIG. 14, a switching signal for selecting the AND gate U3 'is output from the microcomputer 19, and the AND gate U3' When both the output signal from the OR gate U1 and the switching signal become a high level signal, an LED on pulse signal is output from the AND gate U3 '.
1 'is supplied to the base of the transistor Q1' through the transistor Q1 ', so that the transistor Q1' is turned on.
A current flows through the transmittance-measuring LED panel 3X via 2 ', and the transmittance-measuring LED panel 3X is pulse-lit. The irradiation light for irradiating the sewing object is transmitted to the solar cell 4b of the light amount detection circuit 14b.
The light is received by the wide directional light receiver 40 which is used in place of. Then, the microcomputer 19 reads the light reception voltage V received by the wide directional light receiver 40 to determine the transmittance.

On the other hand, when measuring the cloth edge position of the sewing object, a switching signal for selecting the AND gate U3 is output from the microcomputer 19 as shown in FIG. OR gate U1
When both the output signal from the switch and the switching signal become a high level signal, an LED on pulse signal is output from the AND gate U3, and this LED on pulse signal is supplied to the base of the transistor Q1 via the resistor R1. The transistor Q1 conducts, a current flows through the surface-emitting LED panel 3 via the resistor R2, and the surface-emitting LED panel 3 is pulse-lit. Then, the irradiation light for irradiating the sewing object is supplied to the light amount detection circuit 14b.
Is received by the wide directional light receiver 40 used in place of the solar cell 4b. And the microcomputer 1
According to 9, the received light voltage Vx received by the wide directional light receiver 40 is read, and the edge position information is obtained. Note that the lighting panel 35 shown in FIG. 12 may be used instead of the surface-emitting LED panel 3 shown in FIG.

FIG. 15 shows the above-mentioned surface light emitting LE shown in FIG.
A bar-shaped LED array 2 shown in FIG.
0 and the LE for transmittance measurement shown in FIG.
This shows an embodiment using an LED element chip 41 instead of the D panel 3X. As in this embodiment, a bar-shaped LED array 20 without using a surface-emitting LED panel,
When the LED element chip 41 is used, the thickness of the light emitting means can be reduced.

As described above, it is needless to say that the same effects as those of the embodiment described with reference to FIGS. 1 to 6 can be obtained even with the configuration shown in FIGS.

FIG. 16 is a circuit diagram showing still another embodiment of the present invention, and corresponds to FIG. In this embodiment, instead of the rectangular wave signal from the oscillator 10,
The sensor start signal from the microcomputer 19 is input to the one-shot generation circuit A. That is, the one-shot generation circuit A is configured to generate the LED on-pulse signal in synchronization with the rise of the sensor start signal from the microcomputer 19.

Further, in this embodiment, the microcomputer 19 replaces the reading of the light emission voltage by the LED light emission with the light amount reading timing signal by the one-shot generation circuit 20 shown in FIG. The processing is performed according to the T1 timer processing to be performed. Other configurations are the same as those of the embodiment described with reference to FIG.

Next, the operation of the above-configured apparatus will be described with reference to the flowchart shown in FIG. In this embodiment, when the operation of the apparatus is started, for example, a timing at a predetermined interval generated in the microcomputer 19, a pulse train of a predetermined time series or a single timing, for example, the microcomputer 1
9 An operation switch input from the outside or the timing or feed timing of the sewing machine main spindle, and, for example, other than the sewing machine, for example, timing related to movement, rotation, etc. of the measured object is triggered. That is, the operation is started according to the above timing. In the embodiment shown in FIG. 4, a rectangular wave signal (more precisely, its rising edge) emitted from the oscillator 10 at a predetermined interval is triggered.

When the program starts, first, in step 1, the microcomputer 19 opens the AND gate U5 by the microcomputer 19, and proceeds to step 2. In step 2, the number of times that the disturbance light pulse and the LED lighting are overlapped is counted. The value N of the repetition counter is set to 0, and the process proceeds to step 3. In step 3, the microcomputer 19 outputs a sensor start signal to the one-shot generation circuit A (see FIG. 18A).

Then, the one-shot generation circuit A receives the rising edge of the sensor start signal, and
(B), an LED on pulse signal is output, and this LED on pulse is supplied to the base of the transistor Q1 via the OR gate U1, the buffer U2, and the resistor R1, so that the transistor Q1 is turned on and the resistor R2 is turned on. A current flows through the LED element chip 3a via the LED element 3a, and the LED element chip 3a performs pulse lighting (see FIG. 18 (f)), and uniformly irradiates the solar cell 4b for measuring the cloth edge position and the cloth 7 during the feeding operation. Therefore, as in the embodiment described with reference to FIG. 4, the solar cell 4a for transmittance measurement is irradiated with the amount of light transmitted through the cloth 7, and the solar cell 4b for measuring the cloth end position is left untouched by the cloth 7 as it is. And the shielding portion is irradiated with the light amount transmitted through the cloth 7.

Then, the light amount detection circuit for transmittance measurement 14a
18 outputs an output as shown in FIG.
FIG. 18 shows the light amount detection circuit 14b for measuring the cloth edge position.
An output as shown in (h) is made. 18 (g) and 18 (h), similarly to FIG. 5 (g), the portions AA and AA ′ projecting upward when the LED element chip 3a emits light are the same as those in FIG. Element chip 3a
Is a voltage corresponding to only the amount of light of the LED element chip 3
The off-line oblique lines BB and BB ′ of “a” are voltages corresponding to the amount of ambient light such as incandescent lamps and fluorescent lamps, and disturbance light such as sunlight.

Therefore, from the pulse detection circuit 15a,
Voltage BB corresponding to the amount of disturbance light shown in FIG.
Is removed, and only the voltage AA corresponding to only the light amount of the LED element chip 3a is output (see FIG. 18 (i)).
Similarly, from the pulse detection circuit 15b, FIG.
Is removed, and the voltage A corresponding to only the light amount of the LED element chip 3a is removed.
Only A 'is output (see FIG. 18 (j)).

Then, in the sample-and-hold circuit 16a, when the LED element chip 3a is turned on, L
The voltage AA corresponding to only the light amount of the ED element chip 3a is held (see FIG. 18 (k)). Similarly, in the sample-and-hold circuit 16b, the voltage AA 'corresponding to only the light amount of the LED element chip 3a is held at the lighting timing of the LED element chip 3a (FIG. 18 (l)).
reference).

On the other hand, while such an operation is performed, in the flowchart, after the sensor start signal is output (step 3), the elapse of the time T1 is waited (step 4). ,
Check the output of the one-shot generation circuit B.

Here, since the disturbance light pulse detecting means 70 comprising the disturbance light pulse detecting circuit 14c, the high-pass filter 50 and the level detector 51 and the light emission control means 55 are the same as those of the embodiment shown in FIG. Element chip 3a
(See FIG. 18 (f)) and disturbance light pulses (see FIG. 18 (f)).
(C), there is no output from the one-shot generation circuit B, and there is no output from the one-shot generation circuit B, lighting of the LED element chip 3a, a disturbance light pulse, and a signal from the microcomputer 19 (this is a signal from the one-shot generation circuit B). Is output when the number of times reaches a predetermined number), the one-shot generation circuit B outputs a pulse having a time width of T2.

Therefore, in step 5, the output of the one-shot generating circuit B is checked, and FIG.
As shown in the case shown by, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap, and the one-shot generation circuit B
If there is no output, the process proceeds to step 6, in which the sensor start signal is turned off and the process proceeds to step 7, and in step 7, the light amount for transmittance measurement is read.

That is, in the analog multiplexer 17, the sample-and-hold circuit 16 a is selected by the switching signal output from the microcomputer 19, and this output is input to the microcomputer 19 via the A / D converter 18. Read the light amount for transmittance measurement.

Next, the process proceeds to step 8, in which the sample and hold circuit 16b is selected by the switching signal output from the microcomputer 19, and this output is sent to the microcomputer 19 via the A / D converter 18. Input and read the light amount for measuring the cloth edge position.

Then, the process proceeds to step 9, in which the cloth edge position (from the edge of the solar cell 4b as the edge position information to the cloth edge portion) is determined based on the transmittance measurement light amount and the cloth edge position measurement light amount. X) is calculated. This calculation is the same as in the embodiment described with reference to FIG. Then, when the cloth edge position x is obtained in this way, the flow shown in FIG. 17 ends.

On the other hand, in step 5, the output of the one-shot generation circuit B is checked, and the LED element chip 3a is turned on (see FIG. 18 (f)), as in the case indicated by reference numeral (b) in FIG. The disturbance light pulse P1 (FIG. 18)
If the signal from the microcomputer 19 overlaps with the signal from the microcomputer 19 and a pulse having a time width of T2 is output from the one-shot generation circuit B, the process proceeds to step 10, and in step 10, the pulse having the time width of T2 is output. Is received by the microcomputer 19, and the microcomputer 19 does not read the received light amount data input via the A / D converter 18 without performing the one-shot generation circuit B.
Is turned off, and when it is turned off, the process proceeds to step 11. In step 11, the repetition counter value N is added by +1 and the process proceeds to step 12. In step 12, the repetition counter value N It is determined whether a predetermined number N ₀ has been reached. If the repetition counter value N has not reached the predetermined number N ₀ , the process returns to step 4.

At this time, the one-shot generation circuit C triggers on the falling edge of the pulse signal of T2 time width from the one-shot generation circuit B, and the one-shot generation circuit C outputs a pulse signal of T3 time width. (See FIG. 18 (e)), this pulse signal is supplied to the OR gate U1, the buffer U
2. The current is supplied to the base of the transistor Q1 via the resistor R1, thereby turning on the transistor Q1.
The ED element chip 3a is re-pulsed as shown by the symbol d1 in FIG. 18 (f), and the sample-and-hold circuits 16a and 16b correspond to the light amount at the timing when the LED element chip 3a is turned on in the same manner as described above. Voltage A
A and AA 'are respectively held (FIG. 18 (k),
(L)).

While such an operation is performed, the flowchart waits for the elapse of time T1 (step 4).
When the time T1 has elapsed, the process proceeds to step 5, where the output of the one-shot generation circuit B is checked.

Here, in the case indicated by reference numeral (b) in FIG. 18, in the second lighting of the LED element chip 3a, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap, and a one-shot occurs. Since there is no output from the circuit B, the process proceeds to step 6, and thereafter, the same operation as described above is performed.

Also, as in the case indicated by reference numeral (c) in FIG. 18, when the LED element chip 3a indicated by reference numeral d1 in FIG. 18 (f) is turned on for the second time, the state shown in FIG. When the disturbance light pulse P2 is generated, the one-shot generation circuit B outputs a pulse having a time width of T2 (see FIG. 18D). Perform the same operation as described above.
Then, in step 12, the repetition counter value N
There, it is determined whether or not reached a predetermined number N _0, repeat counter value N when it does not reach a predetermined number N ₀ returns to step 4.

At this time, from the one-shot generation circuit C,
As described above, a pulse signal having a time width of T3 is output (see FIG. 18E), and according to this pulse signal, the LED element chip 3a is pulse-lit again as shown by a symbol d2 in FIG. 18F. , The sample and hold circuit 16a,
At 16b, the voltages AA and AA 'corresponding to the light amounts are held at the timing when the LED element chip 3a is turned on (see FIGS. 18 (k) and (l)).

While such an operation is performed, the flowchart waits until the time T1 has elapsed (step 4).
When the time T1 has elapsed, the process proceeds to step 5, where the output of the one-shot generation circuit B is checked.

Here, in the case indicated by the symbol (c) in FIG. 18, in the third lighting of the LED element chip 3a, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap, and a one-shot occurs. Since there is no output from the circuit B, the process proceeds to step 6, and thereafter, the same operation as described above is performed.

If a disturbance light pulse is generated even when the LED element chip 3a is turned on for the third time as indicated by the symbol d2 in FIG.
Operations 10 to 12 are repeated.

On the other hand, if it is determined in step 12 that the repetition counter value N has reached the predetermined number N ₀ , the process proceeds to step 13, where the sensor start signal is turned off and the process proceeds to step 14. In step 14, the AND gate U5 is opened to proceed to step 15, and in step 15, an error is displayed by a predetermined display means.

FIG. 19 is a circuit diagram showing still another embodiment of the present invention, and corresponds to FIG. In this embodiment, the LED from the one-shot generation circuit A
LE from on-pulse signal and one-shot generation circuit C
Microcomputer 1 instead of the D restart pulse signal
The configuration is such that the light emission pulse output from 9 is input to the buffer U2. That is, the LED element chip 3a
Are turned on in synchronization with the emission pulse output from the microcomputer 19.

In this embodiment, a flip-flop 60 is used in place of the one-shot generation circuit B, and the output signal of the AND gate U5 and the reset signal of the microcomputer 19 are input to the flip-flop 60. The output signal of the flip-flop 60 is input to the microcomputer 19.
That is, if there is a disturbance light pulse when the LED element chip 3a is turned on, the flip-flop 60 is set,
The microcomputer 19 is configured to notify the microcomputer 19 that there is a disturbance light pulse when the LED element chip 3a is turned on.
9 is configured to output the re-emission pulse output to the buffer U2. Therefore, the light emission control means 61 is configured by the AND gate U5, the flip-flop 60, and the microcomputer 19.

Next, the operation of the above-configured apparatus will be described with reference to the flowchart shown in FIG. First, in step 1, the microcomputer 1
9, the flip-flop 60 is reset, and the process proceeds to step 2. In step 2, the value N of the repetition counter similar to that described in the previous embodiment is set to 0, and the process proceeds to step 3. The computer 19 outputs an emission pulse output having a T3 time width to the buffer U2 (see FIG. 21A).

Then, the transistor Q1 is turned on by the output of the light emission pulse, and the LED element chip 3a is pulse-lit (see FIG. 21D). At this time, the output as shown in FIG. 21 (e) is output from the light amount detection circuit 14a for transmittance measurement, and the output as shown in FIG. 21 (f) from the light amount detection circuit 14b for cloth edge position measurement. Output is made.
Therefore, from the pulse detection circuit 15a, the signal shown in FIG.
The voltage BB corresponding to the light amount of the disturbance light shown in FIG.
Only A is output (see FIG. 21 (g)). Similarly, from the pulse detection circuit 15b, the voltage BB 'corresponding to the amount of disturbance light shown in FIG.
Only the voltage AA 'corresponding to only the light amount of the element chip 3a is output (see FIG. 21H).

Then, the sample hold circuits 16a, 16
At 6b, the voltages AA and AA 'corresponding to only the light amount of the LED element chip 3a are held at the timing when the LED element chip 3a is turned on (FIG. 18).
(See (i) and (j)).

While such an operation is performed, a light emission pulse output is output in the flowchart (step 3).
Thereafter, the elapse of the time T1 is waited (step 4), and after the elapse of the time T1, the process proceeds to step 5, where the output of the flip-flop 60 is checked.

Here, the lighting of the LED element chip 3a (see FIG. 21 (d)) and the disturbance light pulse (see FIG. 21 (b))
If they do not overlap, there is no output from the flip-flop 60, and if the lighting of the LED element chip 3a and the disturbance light pulse overlap, a disturbance overlap signal is output from the flip-flop 60.

Therefore, in step 5, the output of the flip-flop 60 is checked, and the lighting of the LED element chip 3a and the disturbance light pulse do not overlap with each other, as shown in FIG. If there is no output, the process proceeds to step 6. The operations in steps 6 to 8 are the same as those described in steps 7 to 9 in FIG.

On the other hand, in step 5, the output of the flip-flop 60 is checked, and as shown in FIG. 21, the LED element chip 3a is turned on (see FIG. Pulse P1 (FIG. 21)
When the disturbance overlap signal is output from the flip-flop 60 due to the overlap with (b), the process proceeds to step 9 where the microcomputer 19 receives the disturbance overlap signal and the microcomputer 19 receives the disturbance overlap signal. , Without reading the received light amount data input through the A / D converter 18.
And then proceeds to step 10. In step 10, the repetition counter value N is incremented by one, and the process proceeds to step 11. In step 11, it is determined whether the repetition counter value N has reached a predetermined number N _0. Is determined. If the repetition counter value N has not reached the predetermined number N ₀ , the process proceeds to step 12, and
, The process returns to step 3 after waiting for the time T2.

In step 3, the microcomputer 1
The emission pulse output having a time width of T3 from 9 is output again to the buffer U2.
(See FIG. 21A), and the LED element chip 3a
Is pulse-lit again (see FIG. 21 (d)).
Then, in step 4, after elapse of the time T1, the process proceeds to step 5, and in step 5, the output of the flip-flop 60 is checked.

Here, in the case indicated by reference numeral (b) in FIG. 21, in the second lighting of the LED element chip 3a, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap and the flip-flop 60 is turned on. Does not exist, the process proceeds to step 6, and thereafter, the same operation as described above is performed.

Also, as in the case indicated by reference numeral (c) in FIG. 21, when the LED element chip 3a indicated by reference numeral d1 in FIG. 21 (d) is turned on for the second time, as shown in FIG. As shown in FIG. 21, when the disturbance light pulse P2 is generated, a disturbance overlap signal is output from the flip-flop 60 (see FIG. 21C). Perform various operations. And
In step 11, repeat counter value N, it is determined whether or not reached a predetermined number N _0, if the repetition counter value N has not reached the predetermined number N ₀ Step 1
It returns to step 3 via 2.

In step 3, the microcomputer 1
The output of the light emission pulse having a time width of T3 from 9 is again performed in the buffer U
2 (see FIG. 21A), and the LED element chip 3
The pulse a is again lit (see FIG. 21D), and the process proceeds to step 4. In step 4, the process proceeds to step 5 after elapse of the time T1, and in step 5, the output of the flip-flop 60 is checked.

Here, in the case indicated by the symbol (c) in FIG. 21, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap with each other in the third lighting of the LED element chip 3a. Does not exist, the process proceeds to step 6, and thereafter, the same operation as described above is performed.

If a disturbance light pulse is generated even when the LED element chip 3a is turned on for the third time as indicated by reference numeral d2 in FIG. 21D, steps 3 to 5 are performed.
Operations 9 to 12 are repeated.

On the other hand, if it is determined in step 11 that the repetition counter value N has reached the predetermined number of times N ₀ , the process proceeds to step 13 so that an error display is performed by predetermined display means in step 13. Has become.

FIG. 22 is a circuit diagram showing still another embodiment of the present invention, and corresponds to FIG. In this embodiment, a light quantity detection circuit (light quantity monitor) is used instead of the disturbance light pulse detection circuit 14c and the high-pass filter 50.
14d and a pulse detection circuit 15d are used.

This light amount detection circuit 14d is a surface emitting LED.
This is for detecting fluctuations in light amount due to the temperature of the panel 3, changes over time, and the like, and detecting disturbance light pulses. The configuration of the light quantity detection circuit 14d is substantially the same as the configuration of the disturbance light pulse detection circuit 14c, except that the solar cell 4d for monitoring the light quantity constituting the light quantity detection circuit 14d is configured as shown in FIG.
As shown in FIG.
It is arranged at a position where the irradiation light from the D panel 3 can be received and at a position where the irradiation light is not blocked by the sewing object. That is, it is configured to receive irradiation light from the surface-emitting LED panel 3 together with disturbance light. The configuration of the pulse detection circuit 15d is the same as that of the pulse detection circuits 15a and 15a.
This is the same as the configuration of b.

The output of the pulse detecting circuit 15d is input to one input terminal of a voltage comparator U4 constituting the level detector 51, and the other input terminal corresponds to only the light quantity of the LED element chip 3a. The threshold voltage set to a voltage higher than the threshold voltage AA "is input. That is, the disturbance light pulse is supplied from the voltage comparator U4 to the AND gate U5 in the same manner as in the embodiment described with reference to FIG. The light amount detection circuit 1
4 d, the disturbance light pulse detection means 71 is constituted by the pulse detection circuit 15 d and the level detector 51.

A sample and hold circuit 16d is also connected to the pulse detection circuit 15d. The sample and hold circuit 16d samples and holds the output pulse of the pulse detection circuit 15d according to the pulse from the OR gate U1. The analog multiplexer 17 is connected to the sample-and-hold circuit 16d, and the sample-and-hold circuits 16a, 16b, and 16d are switched according to a switching signal from the microcomputer 19.
Is selected.

The microcomputer 19 selects the sample-and-hold circuit 16d to read the light amount for monitoring the light amount, and based on the read-out light amount, corrects the fluctuation of the light amount due to the temperature of the surface light-emitting LED panel 3, a temporal change, etc. The distance x from the end of the solar cell 4b to the end of the fabric can be accurately obtained.

Next, the operation of the thus configured apparatus will be described with reference to the flowchart shown in FIG. First, in step 1, the microcomputer 1
9. Open the AND gate U5 and proceed to step 2,
In step 2, the value N of the repetition counter similar to that described above is set to 0, and the process proceeds to step 3. In step 3, it waits for the oscillator 10 to output a rectangular wave signal. When a rectangular wave signal as shown in FIG. 24A is output from the oscillator 10, the one-shot generation circuit A receives the rising edge of the rectangular wave signal, and
An LED on pulse as shown in (b) is output,
The LED element chip 3a is pulse-lit (see FIG. 24 (f)) to uniformly irradiate the solar cell 4b for measuring the cloth edge position, the cloth 7 during the feeding operation, and the solar cell 4d for monitoring the amount of light. Therefore, the cloth 7 is attached to the solar cell 4a for transmittance measurement.
Is irradiated on the solar cell 4b for measuring the cloth edge position, the light amount as it is is applied to the portion not shielded by the cloth 7, and the light amount transmitted through the cloth 7 is irradiated to the shielded portion.
The light quantity monitoring solar cell 4d is irradiated with the same light quantity.

Then, the light amount detection circuit for transmittance measurement 14a
Outputs an output as shown in FIG. 24 (g).
FIG. 24 shows the light amount detection circuit 14b for measuring the cloth edge position.
An output as shown in (h) is made, and an output as shown in FIG. 24 (i) is made from the light quantity monitoring circuit 14d for light quantity monitoring.

Therefore, from the pulse detection circuit 15a,
Voltage BB corresponding to the amount of disturbance light shown in FIG.
Are removed, and only the voltage AA corresponding to only the light amount of the LED element chip 3a is output (see FIG. 24 (j)).
Similarly, from the pulse detection circuit 15b, FIG.
Is removed, and the voltage A corresponding to only the light amount of the LED element chip 3a is removed.
Only A 'is output (see FIG. 24 (k)). Similarly, the voltage BB "corresponding to the amount of disturbance light shown in FIG. 24 (i) is removed from the pulse detection circuit 15d.
Voltage AA "corresponding only to the light amount of LED element chip 3a"
Is output (see FIG. 24 (l)).

Then, in the sample and hold circuit 16a, at the timing when the LED element chip 3a is turned on, L
The voltage AA corresponding to only the light amount of the ED element chip 3a is held (see FIG. 24 (m)). Similarly, in the sample-and-hold circuit 16b, the voltage AA 'corresponding to only the light amount of the LED element chip 3a is held at the lighting timing of the LED element chip 3a (FIG. 24 (n)).
reference). Similarly, in the sample-and-hold circuit 16d, when the LED element chip 3a is turned on, L
The voltage AA "corresponding to only the light amount of the ED element chip 3a is held (see FIG. 24 (o)).

At this time, the one-shot generation circuit 20 that outputs a pulse having a time width of T1 in synchronization with the pulse output of the one-shot generation circuit A or C, which is the lighting timing of the LED element chip 3a, is used as shown in FIG. A light amount reading timing signal as shown in FIG.

Therefore, in the flowchart, step 4
In step 5, the light amount reading timing signal is checked and the light amount reading timing signal is generated. When the light amount reading timing signal is generated, the process proceeds to step 5, and in step 5, the output of the one-shot generation circuit B is checked. I do.

Since the output of the level detector 51 is the same as the output of the level detector 51 described with reference to FIG. 4 as described above, the LED element chip 3a is turned on (FIG. 24).
When the disturbance light pulse (see FIG. 24 (c)) does not overlap with the disturbance light pulse (see FIG. 24 (c)), there is no output from the one-shot generation circuit B, and the lighting of the LED element chip 3a, the disturbance light pulse and the microcomputer 19 (Which is output when the output from the one-shot generation circuit B reaches a predetermined number of times), the one-shot generation circuit B outputs a pulse having a time width of T2.

Therefore, in step 5, the output of the one-shot generation circuit B is checked, and reference numeral (a) in FIG.
As shown in the case shown by, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap, and the one-shot generation circuit B
If there is no output, the process proceeds to step 6. In step 6, after a time T1 longer than the time required for the light amount to be converted digitally by the A / D converter 18 from the lighting of the LED element chip 3a, the microcomputer 19
, The received light voltage by the LED light emission is read and held on a register. That is, first, the light reception voltage V corresponding to the light amount for transmittance measurement is read, and the process proceeds to step 7. In step 7, the light reception voltage Vx corresponding to the light amount for the cloth edge position measurement is read, and the process proceeds to step 8. In step 8, the light receiving voltage Vm corresponding to the light amount for light amount monitoring
Is read, and the process proceeds to step 9.

In step 9, the following calculation is performed. That is, first, the light quantity monitor light receiving voltage of the initial value stored in advance in the microcomputer 19 is set to Vmo, and the light quantity correction rate k is obtained by the following equation. k = Vm / Vmo

Next, the light receiving voltage Vo in the absence of cloth, which is stored in the microcomputer 19 in advance, is multiplied by the light quantity correction factor k, and the corrected value kVo is used as the transmission value held in the register. The light receiving voltage V corresponding to the rate measuring light amount is divided. Then, the obtained value is stored as the transmittance α ′ of the cloth in consideration of the light amount fluctuation due to the temperature of the surface-emitting LED panel 3, a temporal change, or the like.

Here, assuming that the characteristic of the transmittance is a curve indicated by the symbol b shown in FIG. 26, the stroke (the distance from the edge of the solar cell 4b for measuring the edge of the cloth edge to the edge of the cloth) x is expressed by the following equation. expressed. x = {(Vx-V2) / (V1'-V2)} · x 0

V1 'is the received light voltage when the solar cell 4b is fully opened. The received light voltage V1 when the solar cell 4b is fully opened and which is stored in advance in the microcomputer 19 is calculated by the light amount correction rate k.
1 ′ = kV1 is a corrected value. On the other hand, V2 is the light receiving voltage when the solar cell 4b is completely covered with the cloth, and is obtained as V2 = α ′ · V1 ′ from the transmittance α ′ obtained by the light detection for transmittance measurement. In addition, x ₀ is in the receiving range of the solar cell 4b. That is, in step 9, the distance x from the edge of the solar cell 4b to the edge of the cloth as edge position information obtained by correcting the light amount fluctuation due to the temperature, the temporal change, etc. of the surface emitting LED panel 3 is obtained. It is supposed to be.

On the other hand, in step 5, the output of the one-shot generation circuit B is checked, and the LED element chip 3a is turned on (see FIG. 24 (f)), as in the case indicated by reference numeral (b) in FIG. The disturbance light pulse P1 (FIG. 24)
If the signal from the microcomputer 19 overlaps with the signal from the microcomputer 19 and a pulse having a time width of T2 is output from the one-shot generation circuit B, the process proceeds to step 10, and in step 10, the pulse having the time width of T2 is output. Is received by the microcomputer 19, the microcomputer 19 inhibits reading of the received light amount data input via the A / D converter 18 and waits until the output of the one-shot generation circuit B is turned off. Step 1 when turned off
Proceeds to 1, in step 11, the process proceeds to Step 12 to +1 adding the repeat counter value N at step 12, determines repetition counter value N, whether or not reached a predetermined number N _0. If the repetition counter value N has not reached the predetermined number N ₀ , the process returns to step 4.

At this time, the one-shot generation circuit C triggers on the falling edge of the pulse signal of T2 time width from the one-shot generation circuit B, and the one-shot generation circuit C outputs a pulse signal of T3 time width. (See FIG. 24 (e)), the pulse signal causes the LED element chip 3a to
As shown by a symbol d1 in FIG. 24 (f), repulse lighting is performed, and the sample-and-hold circuits 16a, 16a,
In 16b and 16d, the voltages AA, AA ', and A corresponding to the amount of light at the timing when the LED element chip 3a is turned on.
A "are respectively held (FIG. 24 (m),
(N) and (o)).

While such an operation is being performed, the flow chart waits for the read timing (step 4) and proceeds to step 5, where the output of the one-shot generation circuit B is checked.

Here, in the case indicated by reference numeral (b) in FIG. 24, when the LED element chip 3a is turned on for the second time, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap, and a one-shot occurs. Since there is no output from the circuit B, the process proceeds to step 6, and thereafter, the same operation as described above is performed.

Also, as in the case indicated by reference numeral (c) in FIG. 24, when the LED element chip 3a indicated by reference numeral d1 in FIG. As shown in FIG. 24, when the disturbance light pulse P2 is generated, a pulse having a T2 time width is output from the one-shot generation circuit B (see FIG. 24D). Perform the same operation as described above.
Then, in step 12, the repetition counter value N
There, it is determined whether or not reached a predetermined number N _0, repeat counter value N when it does not reach a predetermined number N ₀ returns to step 4.

At this time, from the one-shot generation circuit C,
As described above, a pulse signal having a time width of T3 is output (see FIG. 24 (e)), and according to this pulse signal, the LED element chip 3a is pulse-lit again as indicated by the symbol d2 in FIG. 24 (f). , The sample and hold circuit 16a,
In 16b and 16d, the voltages AA, AA ', and A corresponding to the light amount at the timing when the LED element chip 3a is turned on
A "are respectively held (FIG. 24 (m),
(N) and (o)).

While such an operation is performed, the flow chart waits for the read timing (step 4) and proceeds to step 5, where the output of the one-shot generation circuit B is checked.

Here, in the case indicated by the symbol (c) in FIG. 24, when the LED element chip 3a is turned on for the third time, the lighting of the LED element chip 3a and the disturbance light pulse do not overlap, and a one-shot occurs. Since there is no output from the circuit B, the process proceeds to step 6, and thereafter, the same operation as described above is performed.

When a disturbance light pulse is generated even when the LED element chip 3a is turned on for the third time indicated by reference numeral d2 in FIG.
Operations 10 to 12 are repeated.

On the other hand, if it is determined in step 12 that the repetition counter value N has reached the predetermined number N ₀ , the process proceeds to step 13. In step 13, the AND gate U5 is opened and the process proceeds to step 14. In step 14, an error is displayed by a predetermined display means.

FIG. 27 shows an embodiment in which the wide directional LEDs 22 are used in place of the surface emitting LED panel 3 used in FIG. 25. It is used for detecting a change in light amount due to a change in temperature, a change with time, and the like of the directional LED 22 and for detecting a disturbance light pulse.

FIG. 28 is a circuit diagram showing still another embodiment of the present invention, FIG. 29 is a flowchart showing the operation procedure of the circuit shown in FIG. 28, and FIG. 30 is a circuit diagram showing the operation of the circuit shown in FIG. It is a timing chart for explaining the operation, and the present embodiment is a combination of the embodiment shown in FIG. 16 and the embodiment shown in FIG.

That is, in this embodiment, the light amount detection circuit (light amount monitor) 14d and the pulse amount detection circuit 15d described in FIG. 22 are used in place of the disturbance light pulse detection circuit 14c and the high-pass filter 50 shown in FIG. In addition, the sample-and-hold circuit 16d described in FIG. 22 is connected to the pulse detection circuit 15d, and the analog multiplexer 17 is connected to the sample-and-hold circuit 16d. , 16b, and 16d.

Therefore, the operation is substantially the same as that of the flow chart shown in FIG. 17, and the difference is that between step 8 and step 9, the same light quantity monitoring light quantity as step 8 of the flow chart shown in FIG. A reading step 8a is added, and based on this, the distance x from the edge of the solar cell 4b to the edge of the cloth as the edge position information obtained by correcting the light quantity fluctuation due to the temperature of the surface-emitting LED panel 3, a temporal change, etc. The calculation is performed in step 9.

FIG. 31 is a circuit diagram showing still another embodiment of the present invention, FIG. 32 is a flowchart showing an operation procedure of the circuit shown in FIG. 31, and FIG. 33 is a circuit diagram of the circuit shown in FIG. It is a timing chart for explaining the operation, and this embodiment is a combination of the embodiment shown in FIG. 19 and the embodiment shown in FIG.

That is, in this embodiment, the light amount detection circuit (light amount monitor) 14d and the pulse amount detection circuit 15d described in FIG. 22 are used instead of the disturbance light pulse detection circuit 14c and the high-pass filter 50 shown in FIG. The sample and hold circuit 16d described with reference to FIG. 22 is connected to the pulse detection circuit 15d, the analog multiplexer 17 is connected to the sample and hold circuit 16d, and the sample and hold circuit 16a , 16b, and 16d. The light emission control means 62 is constituted by the flip-flop 60 and the microcomputer 19.

Therefore, the operation is substantially the same as that of the flow chart shown in FIG. 20. The difference is that between step 7 and step 8, the same light quantity monitoring light quantity as step 8 of the flow chart shown in FIG. A reading step 7a is added, and based on this, the distance x from the edge of the solar cell 4b to the cloth edge as the edge position information in which the light amount fluctuation due to the temperature of the surface-emitting LED panel 3 and the temporal change is corrected. The calculation is performed in step 8.

FIG. 34 is a circuit diagram showing still another embodiment of the present invention, FIG. 35 is a flowchart showing an operation procedure of the circuit shown in FIG. 34, and FIG. 36 is a circuit diagram of the circuit shown in FIG. 32 is a timing chart for explaining the operation, and the present embodiment corresponds to the circuit diagram shown in FIG.

That is, in this embodiment, the level detector 51 and the flip-flop 60 shown in FIG. 31 are omitted, and the detection and comparison of the level of the disturbance light are read into the microcomputer 19 via the sample and hold circuit 16d and read. This is performed by the microcomputer 19, and the microcomputer 19 outputs the disturbance light pulse to the LED.
It is configured such that it is determined whether or not the pulse lighting is overlapped. If the pulse lighting is overlapped, the microcomputer 19 outputs a light emission pulse output to the buffer U2 to relight the surface light emitting LED panel 3. Therefore, the disturbance light pulse detection means 72 is constituted by the light quantity detection circuit (light quantity monitor) 14d, the pulse detection circuit 15d, the sample hold circuit 16d, and the microcomputer 19, and the light emission control means 63 is constituted by the microcomputer 19. It has become.

Next, the operation of the thus configured device will be described with reference to the flowchart shown in FIG. First, in step 1, the value N of the repetition counter similar to that described above is set to 0, and the process proceeds to step 2. In step 2, an emission pulse output is output (see FIG. 36A), and the surface-emitting LED panel 3 is turned on (see FIG. 36 (c)). At this time, the output as shown in FIG. 36 (d) is output from the transmittance measurement light quantity detection circuit 14a, and the cloth edge position measurement light quantity detection circuit 14b outputs
An output as shown in FIG. 36 (e) is made, and an output as shown in FIG. 36 (f) is made from the light quantity monitoring circuit 14d for light quantity monitoring.

Therefore, from the pulse detection circuit 15a,
Voltage BB corresponding to the amount of disturbance light shown in FIG.
Is removed, and only the voltage AA corresponding to only the light amount of the LED element chip 3a is output (see FIG. 36 (g)).
Similarly, from the pulse component detection circuit 15b, FIG.
Is removed, and the voltage A corresponding to only the light amount of the LED element chip 3a is removed.
Only A 'is output (see FIG. 36 (h)). Similarly, from the pulse detection circuit 15d, the voltage BB "corresponding to the amount of disturbance light shown in FIG.
Voltage AA "corresponding only to the light amount of LED element chip 3a"
Is output (see FIG. 36 (i)).

Then, in the sample-and-hold circuit 16a, when the LED element chip 3a is turned on, L
The voltage AA corresponding to only the light amount of the ED element chip 3a is held (see FIG. 36 (j)). Similarly, in the sample and hold circuit 16b, the voltage AA 'corresponding to only the light amount of the LED element chip 3a is held at the lighting timing of the LED element chip 3a (FIG. 36 (k)).
reference). Similarly, in the sample-and-hold circuit 16d, when the LED element chip 3a is turned on, L
The voltage AA "corresponding to only the light amount of the ED element chip 3a is held (see FIG. 36 (l)).

Then, the process proceeds to Step 4 and Step 4
In step (2), the received light voltage Vm corresponding to the light amount for light amount monitoring is read (see FIG. 36 (l)), and the process proceeds to step 5, where it is determined whether or not there is a disturbance light pulse. This determination is made in advance by the microcomputer 19
, A threshold value of a voltage slightly higher than the voltage AA "is set in advance, and it is determined whether or not a voltage higher than the threshold value is input. Therefore, as shown in FIG. If a voltage higher than the threshold is not input after the elapse of T1 time after the emission pulse output (see FIG. 36 (l)),
Since it is determined that the disturbance light pulse does not overlap with the LED pulse lighting, the process proceeds to step 6, and in step 6, the received light voltage V corresponding to the light amount for transmittance measurement is read.
In step 7, the received light voltage Vx corresponding to the light amount for measuring the cloth edge position is read, and then the process proceeds to step 8. In step 8, the surface light emission L
The distance x from the edge of the solar cell 4b to the cloth edge is calculated as the edge position information obtained by correcting the light amount fluctuation due to the temperature of the ED panel 3 and the temporal change.

On the other hand, in step 5, when a voltage equal to or higher than the threshold is input after a lapse of T1 time after the emission pulse output, as in the case shown by reference numerals (b) and (c) in FIG. l)), the disturbance light pulse is LE
Assuming that the D-pulse lighting overlaps, the process proceeds to step 9, where the repetition counter value N is incremented by 1 and the process proceeds to step 10. In step 10, the repetition counter value N is increased to a predetermined number N ₀ . It is determined whether or not it has reached. If the repetition counter value N has not reached the predetermined number of times N ₀ , the process returns to step 2, and in step 2, the surface-emitting LED panel 3 is turned on again, and the above operation is repeated.

On the other hand, if it is determined in step 10 that the repetition counter value N has reached the predetermined number N ₀ , the process proceeds to step 12, where an error display is performed by predetermined display means. Has become.

As described above, it is needless to say that the same effects as those of the embodiment described with reference to FIGS. 1 to 6 can be obtained even with the configuration shown in FIGS.

Although the invention made by the inventor has been specifically described based on the embodiments, the invention is not limited to the above-described embodiments, and can be variously modified without departing from the gist thereof. Needless to say, for example, in the above embodiment, an example is described in which the optical information detection device is applied to a cloth edge control sewing machine. Alternatively, the present invention can be applied to a measuring device for measuring an object to be measured, which obtains predetermined information such as an edge position of a sheet-like material such as a sheet or presence or absence thereof. Further, as described above, the present invention can be applied to, for example, an image sensor and the like, and imaging information can be accurately obtained by such an application. In addition, the present invention can be applied to not only the transmission system but also the reflection system.

[0136]

As described above, according to the optical information detecting apparatus of the present invention, a predetermined object (a sewing object) is irradiated by the light emitting means which emits the pulse light, and the irradiation light irradiating the detected object is emitted. Is received by the light receiving means, and predetermined information (edge information) is obtained by the information obtaining means (edge information obtaining means) based on the amount of received light received by the light receiving means, while the pulse light emission of the light emitting means is performed. At the time, when the pulse-like disturbance light is detected by the disturbance light pulse detection means, the light emission control means causes the light emission means to re-pulse light by the next pulse light emission time, and the information acquisition means re-pulses the light when the pulse light is emitted again. Since predetermined information is obtained based on the amount of light received by the light receiving means, and the predetermined information when pulsed disturbance light is detected is ignored. It can be obtained accurately predetermined information, it is possible to improve the reliability and accuracy of the device.

[Brief description of the drawings]

FIG. 1 is a front view illustrating a cloth edge control sewing machine to which an optical information detection device according to an embodiment of the present invention is applied.

FIG. 2 is a front view showing in detail a light-emitting and light-receiving means for the upper cloth and a light-receiving means for disturbance light detection which constitutes a disturbance light pulse detection means.

FIG. 3 is a partially cutaway perspective view showing a surface-emitting LED panel.

FIG. 4 is a circuit diagram illustrating an optical information detection device.

FIG. 5 is a timing chart for explaining the operation of the circuit in FIG. 4;

FIG. 6 is a diagram showing a relationship between a voltage based on the amount of received light and an edge position of a sewing object, with the transmittance of the sewing object as a parameter.

FIG. 7 is an enlarged perspective view showing another embodiment of the light emitting means together with the light receiving means.

FIG. 8 is a circuit diagram showing an optical information detecting device employing the light emitting means of FIG.

FIG. 9 is an explanatory diagram showing the light emitting unit of FIG. 7 in detail.

FIG. 10 is an enlarged perspective view showing still another embodiment of the light emitting means together with the light receiving means.

FIG. 11 is a circuit diagram showing an optical information detecting device employing the light emitting means of FIG.

FIGS. 12A and 12B are enlarged views of still another embodiment of the light emitting means, wherein FIG. 12A is a perspective view and FIG. 12B is a side view.

FIG. 13 is an enlarged perspective view of still another embodiment of the light emitting and light receiving means.

FIG. 14 is a circuit diagram showing an optical information detection device employing the light emitting and receiving means of FIG.

FIG. 15 is an enlarged perspective view of still another embodiment of the light emitting and receiving means.

FIG. 16 is a circuit diagram showing still another embodiment of the optical information detecting device.

17 is a flowchart showing an operation procedure of the circuit shown in FIG.

FIG. 18 is a timing chart for explaining the operation of the circuit shown in FIG. 16;

FIG. 19 is a circuit diagram showing still another embodiment of the optical information detecting device.

20 is a flowchart showing an operation procedure of the circuit shown in FIG.

FIG. 21 is a timing chart for explaining the operation of the circuit shown in FIG. 19;

FIG. 22 is a circuit diagram showing still another embodiment of the optical information detecting device.

23 is a flowchart showing an operation procedure of the circuit shown in FIG.

FIG. 24 is a timing chart for explaining the operation of the circuit shown in FIG. 22;

FIG. 25 is a front view showing in detail light emitting and light receiving means for the upper cloth, a disturbance light pulse detecting means, and a light quantity monitoring light receiving means constituting light quantity correcting means in the circuit shown in FIG. 22;

FIG. 26 is a correction diagram corresponding to the diagram shown in FIG. 6;

FIG. 27 is an enlarged perspective view of another embodiment of the light emitting unit shown in FIG. 25 together with the light receiving unit.

FIG. 28 is a circuit diagram showing still another embodiment of the optical information detecting device.

FIG. 29 is a flowchart showing an operation procedure of the circuit shown in FIG. 28;

FIG. 30 is a timing chart for explaining the operation of the circuit shown in FIG. 28;

FIG. 31 is a circuit diagram showing still another embodiment of the optical information detecting device.

FIG. 32 is a flowchart showing an operation procedure of the circuit shown in FIG. 31;

FIG. 33 is a timing chart for explaining the operation of the circuit shown in FIG. 31;

FIG. 34 is a circuit diagram showing still another embodiment of the optical information detecting device.

35 is a flowchart showing an operation procedure of the circuit shown in FIG.

FIG. 36 is a timing chart for explaining the operation of the circuit shown in FIG. 34;

[Explanation of symbols]

 3, 3 ', 3X, 20, 22, 35, 41 Light emitting means 4, 4', 40 Light receiving means 7 Sewing material 19 Edge information obtaining means 55, 61, 62, 63 Light emission control means 70, 71, 72 Disturbance Optical pulse detection means

Claims (2)

[Claims] 1. An optical information detecting device for a cloth edge applied to a cloth edge control sewing machine, comprising: a light emitting means for irradiating an object to be sewn with irradiation light emitting a pulse; A light information detecting device comprising: a light receiving means for receiving light; and an edge information obtaining means for obtaining edge information of the workpiece based on the amount of light received by the light receiving means. Disturbance light pulse detection means to be detected, and when a pulsed disturbance light is detected at the pulse emission timing of the light emission means, light emission control means for causing the light emission means to emit pulse light again by the next pulse emission timing is provided, The edge information acquiring means, when the light emitting means emits a pulse again, obtains edge information of the sewing object based on the amount of light received by the light receiving means when the light emitting means emits the pulse again. To be Optical information detection device. 2. A light emitting means for irradiating a predetermined detection object with irradiation light of pulse emission, a light receiving means for receiving irradiation light irradiating the detection object, and a predetermined light receiving means based on the amount of light received by the light receiving means. An information obtaining means for obtaining the information of the above, wherein the disturbance light pulse detection means for detecting the pulse-like disturbance light, and if the pulse-like disturbance light is detected at the pulse emission timing of the light-emitting means A light emission control means for causing the light emitting means to emit pulse light again by the next pulse light emission timing, wherein the information obtaining means, when the light emitting means emits pulse light again, the light receiving means An optical information detecting device for obtaining predetermined information based on an amount of light received by the means.