JPH1054711A - Method of measuring surface shape - Google Patents
Method of measuring surface shapeInfo
- Publication number
- JPH1054711A JPH1054711A JP21241696A JP21241696A JPH1054711A JP H1054711 A JPH1054711 A JP H1054711A JP 21241696 A JP21241696 A JP 21241696A JP 21241696 A JP21241696 A JP 21241696A JP H1054711 A JPH1054711 A JP H1054711A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- grid
- plane
- unevenness
- shadow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、等高線モアレ縞を
使った物体表面の形状測定方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring the shape of an object surface using contour moire fringes.
【0002】[0002]
【従来の技術】モアレ縞は2つの直線群もしくは曲線群
を重ね合わしたときにその交点の軌跡として生じる別の
縞模様のことを言う。このモアレ縞を用いて物体の表面
形状を求める方法は等高線モアレ縞計測(モアレトポグ
ラフィ)と呼ばれ、格子照射型のモアレトポグラフィに
おいては、平面格子の影を、点状またはスリット状の光
源から出た光によって、被測定物表面上に投影し、この
影を元の格子を通して観察点で得て、平面格子の影によ
って生じるモアレ縞を利用し、表面形状の非接触測定を
可能とするものである。2. Description of the Related Art A moire fringe is another fringe pattern generated as a trajectory of an intersection when two straight line groups or curve groups are superimposed. The method of obtaining the surface shape of an object using the moire fringes is called contour moire fringe measurement (moire topography). In a grid-illuminated moire topography, a shadow of a plane grid is emitted from a point-like or slit-like light source. The light is projected onto the surface of the object to be measured, and this shadow is obtained at the observation point through the original grid, making it possible to perform non-contact measurement of the surface shape using moire fringes generated by the shadow of the plane grid. is there.
【0003】[0003]
【発明が解決しようとする課題】等高線モアレ縞計測で
は、被測定物表面上に格子面から垂直距離の等間隔位置
に縞を生じさせ形状を迅速かつ正確に観察するものであ
る。しかし、この方法では等高線の相対的な高さ、いわ
ゆる凹凸が判断できない。また、その凹凸量のさらに細
かい精度で測定を行うためには、間隔の狭い等高線モア
レ縞を用いることになり、その際使用する格子のピッチ
を細かくする必要がある。そうした場合、コントラスト
が低下するという課題があった。In the contour moiré fringe measurement, fringes are formed on the surface of the object to be measured at equal intervals perpendicular to the lattice plane, and the shape is observed quickly and accurately. However, this method cannot determine the relative height of the contour lines, that is, the so-called unevenness. Further, in order to measure the unevenness with a finer accuracy, contour moire fringes with a narrow interval are used, and it is necessary to make the pitch of a grating used finer. In such a case, there is a problem that the contrast is reduced.
【0004】本発明は、かかる従来技術の課題を解決し
て、被測定物表面の凹凸を判別し、さらにその凹凸量を
モアレ縞の間隔以下の精度で測定できる表面形状測定方
法を得ることを目的とする。An object of the present invention is to solve the problems of the prior art and to obtain a surface shape measuring method capable of determining unevenness on the surface of an object to be measured and measuring the amount of unevenness with an accuracy equal to or less than the interval between moire fringes. Aim.
【0005】[0005]
【課題を解決するための手段】本発明の表面形状計測方
法は、平面格子の影を、点状またはスリット状の光源か
ら出た光によって、被測定物表面上に投影し、この影を
元の格子を通して観察点で得て、平面格子の影によって
生じるモアレ縞を利用して物体表面形状を求める方法に
おいて、被測定物を平面格子の格子面に対し鉛直方向に
移動させることにより被測定物表面の凹凸を判別するこ
とを特徴とする。According to the surface shape measuring method of the present invention, a shadow of a plane grating is projected on the surface of an object to be measured by light emitted from a point-like or slit-like light source, and this shadow is used as an original. In the method of obtaining the surface shape of the object using the moire fringes generated by the shadow of the plane grid obtained at the observation point through the grid, the object to be measured is moved in the vertical direction with respect to the grid plane of the plane grid. The method is characterized in that irregularities on the surface are determined.
【0006】本発明においては、被測定物を格子面に対
して垂直方向に移動させ、その移動方向に対する被測定
物表面上のモアレ縞の移動方向から凹凸を判別すること
ができる。さらには、被測定物の格子面垂直方向に対す
る移動量とその移動前後の被測定物表面上のモアレ縞の
位置から、凹凸の変位量を定量化することで、被測定物
表面の凹凸量を等高線モアレ縞の間隔以下の精度で測定
することができより好ましい。In the present invention, the object to be measured is moved in a direction perpendicular to the lattice plane, and the unevenness can be determined from the moving direction of the moire fringes on the surface of the object to be measured with respect to the moving direction. Furthermore, by quantifying the amount of displacement of the irregularities from the amount of movement of the object to be measured in the direction perpendicular to the lattice plane and the positions of moiré fringes on the surface of the object before and after the movement, the amount of unevenness on the surface of the object is measured. It is more preferable that the measurement can be performed with an accuracy equal to or less than the interval of the contour moire fringes.
【0007】すなわち等高線モアレ縞は、原理的に格子
面に対して相対的な距離によって現れる。これより被測
定物が格子面から遠ざかる場合、モアレ縞は物体表面の
凸方向に移動し、格子面に近づける場合、モアレ縞は凹
方向に移動する。よって、被測定物を格子面から垂直方
向に移動させたときのモアレ縞の移動方向を観察するこ
とによって凹凸の判定が可能となる。さらに被測定物と
格子面の相対的距離の変位量(移動量)は、物体表面上
のモアレ縞の移動前後の位置間の高低差(凹凸量)に等
しいため、被測定物の定量的な移動量の測定とモアレ縞
の移動位置の観察から等高線モアレ縞の間隔以下の細か
い凹凸量が測定可能となる。That is, contour moire fringes appear in principle by a relative distance to the lattice plane. Thus, when the object to be measured moves away from the lattice plane, the moiré fringes move in the convex direction of the object surface, and when it approaches the lattice plane, the moiré fringes move in the concave direction. Therefore, the unevenness can be determined by observing the moving direction of the moire fringes when the object to be measured is moved from the lattice plane in the vertical direction. Further, since the displacement amount (movement amount) of the relative distance between the object and the lattice plane is equal to the height difference (amount of unevenness) between the positions before and after the movement of the moire fringes on the object surface, the quantitative From the measurement of the moving amount and the observation of the moving position of the moiré fringes, it is possible to measure the fine unevenness less than the interval of the contour moiré fringes.
【0008】なおこれらの方法は、等高線モアレ縞を用
いる計測方法であれば、装置・被測定物等で限定される
ものではない。[0008] These methods are not limited to the apparatus and the object to be measured, as long as they are measurement methods using contour moire fringes.
【0009】[0009]
【実施例】図1に示す本発明の実施例に係わる等高線モ
アレ縞計測装置について説明する。レーザー光源1より
出射された偏光はビームエキスパンダー2によって拡大
され、レンズ3により平行光線とされる。この平行光線
を平面格子4を通して被測定物5の表面に照射し平面格
子4の影を、被測定物表面上に投影する。この影を元の
平面格子4、集光レンズ6及び偏光子7を通してCCD
カメラ8で観察する。被測定物5は、移動ステージ付の
ホルダー9に取り付けられる。このステージはステッピ
ングモーターにより平面格子4の格子面に対し垂直方向
に定量的に移動可能である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A contour moire fringe measuring apparatus according to an embodiment of the present invention shown in FIG. 1 will be described. Polarized light emitted from the laser light source 1 is expanded by the beam expander 2 and converted into a parallel light by the lens 3. The parallel rays are radiated to the surface of the DUT 5 through the plane grating 4 and the shadow of the plane grating 4 is projected on the surface of the DUT. This shadow is passed through the original plane grating 4, condensing lens 6 and polarizer 7 to the CCD.
Observe with the camera 8. The DUT 5 is attached to a holder 9 having a moving stage. This stage can be quantitatively moved in a direction perpendicular to the lattice plane of the plane lattice 4 by a stepping motor.
【0010】実施例では、直径130mmの円盤状の物
体表面の観測を行った。平面格子にはピッチ50μmの
ロンキ格子を用いた。平面格子への光の照射角度は45
゜である。現れる等高線モアレ縞は25μm間隔であ
る。さらに本実施例においては、ホルダーの移動ステー
ジを格子面から最初の観測位置から相対的に5μmずつ
25μmまで遠ざける方向に移動させて観測を行った。In the embodiment, the surface of a disk-shaped object having a diameter of 130 mm was observed. A Ronchi grating having a pitch of 50 μm was used as the plane grating. The irradiation angle of light on the plane grating is 45
゜. The contour moiré fringes appear at intervals of 25 μm. Further, in the present example, observation was performed by moving the holder moving stage relatively away from the first observation position by 5 μm from the lattice plane to 25 μm.
【0011】図2には観測した物体表面の等高線モアレ
縞像を示す。図2中で像下の各数値は、ディスク移動距
離(μm)を示す。図2に示すように被測定物を格子面
より遠ざる方向に移動させて観察を行うと、物体表面に
現れるモアレ縞は移動し、実施例の物体表面が主に凹の
形状をしていることが判別できる。さらに図3に示すよ
うに、図2の実施例の観察で得たモアレ縞を重ね合わせ
ると、25μm間隔の等高線モアレ縞の観察から、5μ
m間隔の凹凸量が測定できる。FIG. 2 shows an observed contour moire fringe image of the object surface. Each numerical value below the image in FIG. 2 indicates the disk moving distance (μm). When the object to be measured is moved in a direction away from the lattice plane as shown in FIG. 2, the moire fringes appearing on the object surface move, and the object surface of the embodiment has a mainly concave shape. Can be determined. Further, as shown in FIG. 3, when the moiré fringes obtained in the observation of the embodiment of FIG.
The amount of unevenness at m intervals can be measured.
【0012】[0012]
【発明の効果】以上、本発明の計測方法によれば、被測
定物表面の凹凸を判別し、さらにその凹凸量をモアレ縞
の間隔以下の精度で測定を行うことができる。As described above, according to the measuring method of the present invention, irregularities on the surface of the object to be measured can be determined, and the amount of the irregularities can be measured with an accuracy equal to or less than the interval between moire fringes.
【図1】本発明の計測方法を用いた計測装置の構成FIG. 1 shows the configuration of a measuring device using the measuring method of the present invention.
【図2】本発明の方法で観測した物体表面の等高線モア
レ縞像FIG. 2 is a contour moire fringe image of an object surface observed by the method of the present invention.
【図3】本発明により計測した物体表面の相対的な等高
線FIG. 3 shows relative contours of the object surface measured according to the present invention.
1 レーザー光源 2 ビームエキスパンダー 3 レンズ 4 平面格子 5 被測定物 6 集光レンズ 7 偏光子 8 CCDカメラ 9 移動ステージ付のホルダー DESCRIPTION OF SYMBOLS 1 Laser light source 2 Beam expander 3 Lens 4 Planar grating 5 Object to be measured 6 Condensing lens 7 Polarizer 8 CCD camera 9 Holder with moving stage
Claims (2)
の光源から出た光によって、被測定物表面上に投影し、
この影を元の格子を通して観察点で得て、平面格子の影
によって生じるモアレ縞を利用して物体表面形状を求め
る方法において、被測定物を平面格子の格子面に対し鉛
直方向に移動させることにより被測定物表面の凹凸を判
別することを特徴とする表面形状計測方法。1. A shadow of a plane grating is projected on a surface of an object to be measured by light emitted from a point-like or slit-like light source,
In the method of obtaining this shadow at the observation point through the original grid and obtaining the object surface shape using the moire fringes generated by the shadow of the plane grid, moving the object to be measured in the vertical direction with respect to the grid plane of the plane grid A surface shape measuring method characterized in that irregularities on the surface of an object to be measured are determined by the method.
方向に移動させ、被測定物の移動量と観察される等高線
モアレ縞の移動量から被測定物表面の凹凸量を等高線モ
アレ縞の間隔以下の精度で測定することを特徴とする請
求項1記載の表面形状計測方法。2. An object to be measured is moved in a direction perpendicular to a lattice plane of a plane grating, and an amount of irregularities on the surface of the object to be measured is determined by a contour moire fringe based on a movement amount of the object to be measured and a movement amount of the observed contour moire fringes. 2. The surface shape measuring method according to claim 1, wherein the measurement is performed with an accuracy equal to or less than the interval of.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21241696A JPH1054711A (en) | 1996-08-12 | 1996-08-12 | Method of measuring surface shape |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21241696A JPH1054711A (en) | 1996-08-12 | 1996-08-12 | Method of measuring surface shape |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH1054711A true JPH1054711A (en) | 1998-02-24 |
Family
ID=16622231
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21241696A Pending JPH1054711A (en) | 1996-08-12 | 1996-08-12 | Method of measuring surface shape |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH1054711A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6940608B2 (en) | 2001-03-08 | 2005-09-06 | Ricoh Company, Ltd. | Method and apparatus for surface configuration measurement |
JP2015065178A (en) * | 2014-12-02 | 2015-04-09 | 日本電気株式会社 | Method for manufacturing film exterior battery |
-
1996
- 1996-08-12 JP JP21241696A patent/JPH1054711A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6940608B2 (en) | 2001-03-08 | 2005-09-06 | Ricoh Company, Ltd. | Method and apparatus for surface configuration measurement |
JP2015065178A (en) * | 2014-12-02 | 2015-04-09 | 日本電気株式会社 | Method for manufacturing film exterior battery |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Yamauchi et al. | Microstitching interferometry for x-ray reflective optics | |
US5311286A (en) | Apparatus and method for optically measuring a surface | |
KR20130095211A (en) | Device for noncontact determination of edge profile at a thin disk-shaped object | |
JP2005514606A (en) | Three-dimensional three-dimensional measurement system and method | |
JPH0419545B2 (en) | ||
TW201732263A (en) | Method and system for optical three-dimensional topography measurement | |
CN110702026A (en) | Flatness three-dimensional shape detection device based on complex beam angle adaptive optics and processing method thereof | |
Höfling et al. | Phase reflection: a new solution for the detection of shape defects on car body sheets | |
CN114440789B (en) | Synchronous interferometry method and system for speed, distance and three-dimensional morphology of rotating body | |
US4764014A (en) | Interferometric measuring methods for surfaces | |
KR19990033518A (en) | Non-contact 3D micro-shape measurement method using optical window | |
CN110487219A (en) | A kind of detection system and its detection method of movement mechanism straightness | |
JP3271348B2 (en) | Leveling mating surface measuring method and exposure apparatus | |
US7417747B2 (en) | Method and a device for measuring the three dimension surface shape by projecting moire interference fringe | |
JP3602965B2 (en) | Non-contact three-dimensional measurement method | |
JP2002512384A (en) | Method for measuring position of pattern structure on mask surface | |
JPH1054711A (en) | Method of measuring surface shape | |
US6172757B1 (en) | Lever sensor for stepper field-by-field focus and leveling system | |
Xie et al. | Four-map absolute distance contouring | |
US7471398B2 (en) | Method for measuring contour variations | |
JP2983318B2 (en) | Shape measuring device and measuring method | |
JP2753545B2 (en) | Shape measurement system | |
JPH1054710A (en) | Surface shape measuring device | |
JPH04309804A (en) | Device and method for measuring three dimensional contour | |
JPH03276044A (en) | Method and instrument for measuring radius of curvature of curved surface |