JPH1048150A - Seal-inspection apparatus - Google Patents

Seal-inspection apparatus

Info

Publication number
JPH1048150A
JPH1048150A JP22437296A JP22437296A JPH1048150A JP H1048150 A JPH1048150 A JP H1048150A JP 22437296 A JP22437296 A JP 22437296A JP 22437296 A JP22437296 A JP 22437296A JP H1048150 A JPH1048150 A JP H1048150A
Authority
JP
Japan
Prior art keywords
seal
transparent plate
inspection
ring
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22437296A
Other languages
Japanese (ja)
Other versions
JP3205511B2 (en
Inventor
Katsuya Okamoto
克也 岡本
Shogo Tanno
昌吾 丹野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Cable Industries Ltd
Original Assignee
Mitsubishi Cable Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Cable Industries Ltd filed Critical Mitsubishi Cable Industries Ltd
Priority to JP22437296A priority Critical patent/JP3205511B2/en
Publication of JPH1048150A publication Critical patent/JPH1048150A/en
Application granted granted Critical
Publication of JP3205511B2 publication Critical patent/JP3205511B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PROBLEM TO BE SOLVED: To carry out an automatic visual check of a ring-shaped seal smoothly and efficiently without reversing the seal, by illuminating a transparent plate sent with the seal loaded thereon from the front side and the rear side, and processing images of a front face and a rear face of the seal. SOLUTION: A circular transparent plate 4 loading ring-shaped seals S... is continuously driven and rotated by a motor around an axial center L (direction of an arrow R). CCD cameras 10, 10 are set above and below the transparent plate 4 to face each other, each of which has an illumination lamp. The transparent plate 4 is illuminated from a front face and a rear face thereof, and bright ring-shaped images formed by the reflected illumination at a front and a rear faces of the seal S are processed, thereby visually inspecting the seal, e.g. damage or the like of the seal. Defective product, discharge nozzles 7a, 34a are provided which gush the air and blow the seal S judged to be defective in the visual inspection to an outer diametrical direction. Moreover, two outer dimension-measuring instruments 31, 32 of a laser type are arranged to obtain an average value of outer diameters of the seals S.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、Oリング等の円環
状シールの検査装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device for an annular seal such as an O-ring.

【0002】[0002]

【従来の技術】円環状シールのバリ、欠けの有無、表面
の傷の有無等の検査は、シールをコンベアにて順次送り
つつ、光を照射して固体撮像素子カメラ等にてシール画
像を取り込み、その画像を画像処理して検査して、自動
的に行う方法が知られている。しかし、従来、一般にシ
ールの片面(一面)のみを検査していたが、表面の傷の
検査は、両面について行わなければ、(傷の見落しを生
じ、)信頼性に欠ける。そこで、本発明者等は平成7年
特許願第68633号に於て、シールの表裏両面を検査
できる装置を提案した。
2. Description of the Related Art Inspections of annular seals for burrs, chips, surface scratches, etc. are performed by sequentially illuminating the seals with a conveyor and fetching the seal images with a solid-state imaging device camera or the like. A method is known in which the image is processed, inspected, and automatically performed. However, conventionally, only one side (one side) of the seal is generally inspected. However, if the inspection of the surface flaw is not performed on both sides, the reliability is deteriorated (the flaw is overlooked). In view of this, the present inventors have proposed a device capable of inspecting both front and back surfaces of a seal in Japanese Patent Application No. 68633/1995.

【0003】即ち、その装置は、Oリングを載置して順
次送る第1コンベアと、第1コンベアの表面と直交する
方向から照明をあててOリング表面で反射してなる白色
リング状部の画像を画像処理してOリングの表面傷を検
出する第1検査手段と、第1コンベアの後端側に設けら
れて順次送られてくる上記Oリングを表裏反転させる反
転手段と、反転手段にて表裏反転したOリングを受けて
送りを与える第2コンベアと、第2コンベアの表面と直
交する方向から照明をあててOリング表面で反射してな
る白色リング状部の画像を画像処理してOリングの表面
傷を検出する第2検査手段とを、備えていて、その反転
手段が、第1コンベアの後端側のUターン部を、所定間
隔をもって包囲する弯曲凹面を有する反転ガイド体を備
えていた。
That is, the apparatus comprises a first conveyor on which an O-ring is placed and sequentially fed, and a white ring-shaped portion which is illuminated from a direction perpendicular to the surface of the first conveyor and reflected by the O-ring surface. A first inspection means for processing an image to detect a surface flaw of the O-ring, a reversing means provided at a rear end of the first conveyor for reversing the O-ring sequentially sent, and a reversing means. A second conveyor for receiving and feeding the inverted O-ring, and illuminating from a direction orthogonal to the surface of the second conveyor to image-process an image of a white ring-shaped portion reflected on the O-ring surface; A second inspection means for detecting a surface flaw of the O-ring, wherein the reversing means comprises a reversing guide body having a curved concave surface surrounding the U-turn portion on the rear end side of the first conveyor at a predetermined interval. I had it.

【0004】[0004]

【発明が解決しようとする課題】しかし、シールが小径
・肉薄である(例えば外径が5.4mm で肉厚が0.6mm )場
合、上述のコンベアのUターン部と、反転ガイド体の弯
曲凹面の間で、シールが引っ掛かったり、詰まったりし
て、停滞し、スムースに表裏両面の外観(表面傷)検査
が行えない。
However, if the seal has a small diameter and a small thickness (for example, an outer diameter of 5.4 mm and a thickness of 0.6 mm), the U-turn portion of the above-described conveyor and the curved concave surface of the reversing guide body are required. In between, the seal is caught or clogged, stagnates, and the appearance (surface flaw) inspection of the front and back surfaces cannot be performed smoothly.

【0005】また、寸法公差が(例えば0.01mm等と)厳
しく要求されるシールの外径等の寸法検査は、従来、レ
ーザー外測計等によって、一方向のみの測定にて行い、
合否を判別していたが、一般に、ゴム等の弾性材から成
るシールは(真円ではなくて)僅かな変形が存在し、測
定誤差が大きいという問題もあった。
Conventionally, dimensional inspections such as outer diameters of seals, for which dimensional tolerances are strictly required (eg, 0.01 mm, etc.), are conventionally measured only in one direction using a laser external measuring instrument or the like.
Although pass / fail was determined, the seal made of an elastic material such as rubber generally had a problem that a slight deformation (not a perfect circle) was present and a measurement error was large.

【0006】本発明の目的は、反転なしでスムースに能
率良くシールの外観検査を自動的に行うことが可能であ
って、かつ、高精度の寸法検査を行うことが可能なシー
ル検査装置の提供にある。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a seal inspection apparatus which can automatically and smoothly perform an external appearance inspection of a seal without inversion and can perform a high-precision dimensional inspection. It is in.

【0007】[0007]

【課題を解決するための手段】そこで、本発明は、円環
状シールを載置して送る透明板と、該透明板の表面側か
ら照明をあててシール表面で反射してなる明色リング状
部の画像を画像処理して表面傷等の外観検査を行う第1
検査手段と、上記透明板の裏面側から照明をあててシー
ル裏面で反射してなる明色リング状部の画像を画像処理
して表面傷等の外観検査を行う第2検査手段とを、備え
ている。
SUMMARY OF THE INVENTION Accordingly, the present invention provides a transparent plate on which an annular seal is placed and fed, and a light-colored ring formed by applying illumination from the front side of the transparent plate and reflecting off the seal surface. 1st image processing of the image of the part to inspect the appearance such as surface scratches
Inspection means, and second inspection means for illuminating from the back side of the transparent plate and performing image processing on an image of a light-colored ring-shaped portion reflected on the back side of the seal to perform appearance inspection such as surface scratches. ing.

【0008】また、円環状シールの中心点を原点とする
直交座標のX軸・Y軸に沿っての外径寸法を夫々測定す
るX方向外測計・Y方向外測計と、該X方向外測計とY
方向外測計によって測定されたX方向外径寸法とY方向
外径寸法の平均値を演算する演算手段とを、備えてい
る。そして、透明板が鉛直軸心廻りに回転駆動されるタ
ーンテーブルとなっている。
[0008] An X-direction external measurement device and a Y-direction external measurement device for measuring the outer diameter along the X-axis and the Y-axis, respectively, of the rectangular coordinate system having the origin at the center point of the annular seal; External measurement and Y
Calculating means for calculating an average value of the outer diameter in the X direction and the outer diameter in the Y direction measured by the out-of-direction measuring device. The transparent plate is a turntable that is driven to rotate about a vertical axis.

【0009】[0009]

【発明の実施の形態】以下、図示の実施の形態に基づき
本発明を詳説する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail based on the illustrated embodiments.

【0010】図1の平面図、図2の正面図、図3の要部
簡略斜視説明図及び図4の要部構成説明図に於て、4
は、円環状シールS…を外周縁上面に載置して回転駆動
される円形の透明板であり、この透明板4はいわゆるタ
ーンテーブルとして(図示省略の)モータにて、鉛直軸
心L廻りに(矢印R方向に)連続的に回転駆動され、O
リング、角パッキン、Uパッキン等の弾性材質から成る
シールSを外周縁上面に載置して連続的に送りを与え
る。透明板4の材質はガラスや透明プラスチックが用い
得る。
In the plan view of FIG. 1, the front view of FIG. 2, the simplified perspective view of the main part of FIG. 3, and the structure explanatory view of the main part of FIG.
Is a circular transparent plate that is driven to rotate by placing an annular seal S on the upper surface of the outer peripheral edge. The transparent plate 4 is a so-called turntable that is rotated around a vertical axis L by a motor (not shown). (In the direction of the arrow R).
A seal S made of an elastic material such as a ring, a square packing, a U packing or the like is placed on the upper surface of the outer peripheral edge to continuously feed. The material of the transparent plate 4 can be glass or transparent plastic.

【0011】1は、この透明板(ターンテーブル)4の
外周縁附近に設けられた第1検査手段であって、透明板
4の表面(上面)側から照明をあててシールS表面で反
射してなる明色リング状部21の画像(後述の図8参照)
を画像処理して、表面傷等の外観検査を行う。照明は透
明板4の上方から透明板4表面と直交する方向(鉛直下
方)に照射される。
Reference numeral 1 denotes first inspection means provided near the outer peripheral edge of the transparent plate (turntable) 4, which is illuminated from the surface (upper surface) side of the transparent plate 4 and reflected on the surface of the seal S. Image of the bright colored ring-shaped portion 21 (see FIG. 8 described later)
Is subjected to image processing, and an appearance inspection such as a surface scratch is performed. The illumination is applied from above the transparent plate 4 in a direction perpendicular to the surface of the transparent plate 4 (vertically below).

【0012】2は、この透明板(ターンテーブル)4の
外周附近に設けられた第2検査手段であって、図例では
上述の第1検査手段1の真下位置に配設され、透明板4
の裏面(下面)側から透明板4を通して照明をあてて、
シールS裏面で反射してなる明色リング状部21の画像
(図8参照)を画像処理して、表面傷等の外観検査を行
う。照明は透明板4の下方から透明板4の裏面と直交す
る方向(鉛直上方)に照射される。図例では、第1検査
手段1と第2検査手段2の照射光軸を略一致するよう
に、同一場所に集約して第1・第2検査手段1,2を配
置した場合を示す。第2検査手段2は、透明板4越しに
検査するため、シールSを従来のように上下反転せず
に、両面の検査が可能である。
Reference numeral 2 denotes a second inspection means provided near the outer periphery of the transparent plate (turntable) 4. In the illustrated example, the second inspection means 2 is disposed immediately below the first inspection means 1 described above.
Illuminate through the transparent plate 4 from the back (lower) side of
The image of the light-colored ring-shaped portion 21 reflected on the back surface of the seal S (see FIG. 8) is subjected to image processing, and an appearance inspection such as a surface flaw is performed. The illumination is applied from below the transparent plate 4 in a direction perpendicular to the back surface of the transparent plate 4 (vertically upward). In the illustrated example, a case is shown in which the first and second inspection units 1 and 2 are arranged in the same place so that the irradiation optical axes of the first inspection unit 1 and the second inspection unit 2 substantially coincide with each other. Since the second inspection means 2 inspects through the transparent plate 4, it is possible to inspect both sides without inverting the seal S upside down as in the related art.

【0013】ところで、回転中の透明板4の外周縁上面
へは、パーツフィーダ5から直進フィーダ3を介してシ
ールS…が次々と送り込まれる。8は従って供給部を示
す。6はこの供給部8より僅か下流側───回転方向R
の下流側───に配設されたシールSの位置決めガイド
であり、その傾斜誘導部にて、送り込まれた直後に、透
明板4の外周縁端部から一定寸法だけ内径側にシールS
を動かし、上記外観検査と後述の外径寸法検査を確実に
行えるように位置決めする。
By the way, seals S... Are successively sent from the parts feeder 5 to the upper surface of the outer peripheral edge of the rotating transparent plate 4 via the straight-ahead feeder 3. 8 thus indicates a feed. 6 is slightly downstream from the supply unit 8───rotation direction R
Is a positioning guide for the seal S disposed on the downstream side of the transparent plate 4. Immediately after being fed by the inclined guide portion, the seal S is moved from the outer peripheral edge of the transparent plate 4 to the inner side by a certain distance.
Is moved so that the above-mentioned appearance inspection and the outer diameter dimension inspection described later can be reliably performed.

【0014】第1・第2検査手段1,2はこのガイド6
の下流側───回転方向Rの下流側───に配設され、
さらに、外観検査にて不良と判断されたシールSを排出
して収納する外観不良排出収納器7がその下流側に配設
される。この外観不良排出収納器7は、エアーを間欠的
に噴出して外観不良品を外径方向へ吹き飛ばす不良品排
出ノズル7aを有する。
The first and second inspection means 1 and 2 use this guide 6
Is disposed on the downstream side (downstream side in the rotation direction R) of the
Further, a poor appearance discharge container 7 for discharging and storing the seal S determined to be defective in the visual inspection is disposed downstream thereof. The defective appearance discharge container 7 has a defective product discharge nozzle 7a that intermittently blows air to blow out defective external products in the outer diameter direction.

【0015】次に、この収納器7の下流側に、X方向外
測計31,Y方向外測計32が順次配設されている。即ち、
円環状シールSは弾性材であるから真円ではなく、楕円
等に僅かに変形している場合が多いので、その外径寸法
の平均値を求めるために2台のレーザー式測定器等の外
測計31,32を配設したものであり、円環状シールSの中
心点を原点とする直交座標を仮想した場合のこのX軸・
Y軸に沿っての外径寸法を、夫々、X方向外測計31・Y
方向外測計32にて測定する。図4に於て、このように夫
々測定されたX方向外径寸法とY方向外径寸法の平均値
を演算するパソコン等の演算手段33を示す。
Next, on the downstream side of the container 7, an X-direction outside measuring instrument 31 and a Y-direction outside measuring instrument 32 are sequentially arranged. That is,
Since the annular seal S is an elastic material, it is not a perfect circle, but is often slightly deformed into an ellipse or the like. The X-axis and the X-axis when virtual coordinates having the center point of the annular seal S as the origin are imagined.
The outer diameter dimension along the Y axis is measured in the X-direction
It is measured by an out-of-direction meter 32. FIG. 4 shows a calculating means 33 such as a personal computer for calculating the average value of the X-direction outer diameter and the Y-direction outer diameter thus measured.

【0016】次に、Y方向外測計の下流に、寸法不良排
出収納器34、及び、良品シュータ35を、順次配設する。
寸法不良排出収納器34は、エアーを間欠的に噴出して寸
法不良品を外径方向へ吹き飛ばす不良品排出ノズル34a
を有する。良品シュータ35は、外観不良品・寸法不良品
として排出(除去)されずに残った全てを収納するもの
で、所望により、シールSのサイズ範囲毎に分級して収
納するように、構成する。
Next, a defective-size discharge container 34 and a non-defective shooter 35 are sequentially arranged downstream of the Y-direction outside measurement device.
The defective product discharge container 34a is a defective product discharge nozzle 34a that intermittently blows air to blow out defective products in the outer diameter direction.
Having. The non-defective shooter 35 stores all of the unremoved and unrecognized defective products, which are not discharged (removed). The non-defective shooters 35 are configured so as to be classified and stored according to the size range of the seal S as desired.

【0017】次に、第1検査手段1と第2検査手段2の
具体的構成の一例及びその作動(検査方法)について説
明する。図4、及び、図1,図2,図3に於て、透明板
4の上方・下方に対向状に固体撮像素子カメラ10,10が
設けられ、かつ、該カメラ10,10の各々に同軸落射照明
ランプ11が付設される。また、順次透明板4にて送られ
てくるシールSの位置に対して適正な位置に上記カメラ
10とランプ11をセット(調整)するため、好ましくはX
YZ軸ステージ9に、カメラ10とランプ11を取付ける。
上下のカメラ10,10の光軸は略一致し、(ターンテーブ
ルとしての)回転透明板4の同じ場所にて同時に画像取
り込みが行われる。このカメラ10が設けられた円周位置
が、外観検査位置である。
Next, an example of a specific configuration of the first inspection means 1 and the second inspection means 2 and its operation (inspection method) will be described. 4 and FIGS. 1, 2, and 3, solid-state imaging device cameras 10, 10 are provided above and below the transparent plate 4 so as to face each other, and are coaxial with each of the cameras 10, 10. An epi-illumination lamp 11 is provided. Also, the camera is placed at an appropriate position with respect to the position of the seal S sequentially sent by the transparent plate 4.
To set (adjust) 10 and lamp 11, preferably X
The camera 10 and the lamp 11 are mounted on the YZ axis stage 9.
The optical axes of the upper and lower cameras 10 and 10 substantially coincide with each other, and images are simultaneously captured at the same location on the rotary transparent plate 4 (as a turntable). The circumferential position where the camera 10 is provided is the appearance inspection position.

【0018】図示省略したが、この外観検査位置にセン
サが設けられ、透明板4上に載置されて送られてくるシ
ールSを検出して検出信号を出す。このセンサの検出信
号を※印にて図4中に示すが、該検出信号は制御器16へ
入力される。
Although not shown, a sensor is provided at this appearance inspection position, and detects a seal S placed on the transparent plate 4 and sent to output a detection signal. The detection signal of this sensor is shown in FIG. 4 by an asterisk (*), and the detection signal is input to the controller 16.

【0019】この外観検査位置よりも下流側の前記外観
不良排出収納器7の排出ノズル7aを噴出作動させる信
号が、制御器16から発せられる。即ち、後述の方法にて
固体撮像素子カメラ(以下CCDカメラということがあ
る)10は、電子シャッタを備え、そのシャッタスピード
は例えば1/2000sec と極めて高速であり、(図示省略の
上述の)センサからシールを検出した信号が制御器16へ
送られると、この制御器16からの指令信号は画像処理手
段17を介して(上下一対の)CCDカメラ10,10へ送ら
れ、ランプ11,11から光を照射しつつ上記CCDカメラ
10,10にて、透明板4上のシールSを上下(表裏)両面
から撮影する。(なお、裏面側は透明板4越しに撮影す
ることとなる。)
A controller 16 issues a signal for ejecting the discharge nozzle 7a of the defective appearance discharge container 7 downstream of the visual inspection position. That is, the solid-state imaging device camera (hereinafter sometimes referred to as a CCD camera) 10 is provided with an electronic shutter, and the shutter speed is extremely high, for example, 1/2000 sec. Is sent to the controller 16, the command signal from the controller 16 is sent to the (upper and lower) CCD cameras 10, 10 via the image processing means 17, and from the lamps 11, 11. The above CCD camera while irradiating light
At 10, 10, the seal S on the transparent plate 4 is photographed from both upper and lower (front and back) sides. (The back side is photographed through the transparent plate 4.)

【0020】図5に例示する如く、上下の各CCDカメ
ラ10,10の先端レンズ側の光軸と直交する(横水平方向
の)光軸を有するように、ランプ11が取付けられ、この
ランプ11はハロゲンランプ等の光源12と、平行光線に変
換するための凹面鏡13と、45°傾斜に配設されたハーフ
ミラー15を、備えている。このハーフミラー15は、光の
反射率と透過率が各50%ずつであって、ランプ11の光軸
を反射後は90°変化させて、CCDカメラ10の鉛直状光
軸と一致させる(同軸化する)。このように、CCDカ
メラ10の光軸と同軸化された光軸をもつ照明を、同軸落
射照明と呼び、(図5に示すように、)透明板4上のシ
ールSに対して、上下両方向から同軸落射照明をあて
て、図7に示す如く、シールS表裏両面で各々光を反射
させ、ハーフミラー15を透過した光を、CCDカメラ10
の先端レンズ側に入射させる。
As illustrated in FIG. 5, a lamp 11 is mounted so as to have an optical axis (horizontal horizontal direction) orthogonal to the optical axis on the tip lens side of each of the upper and lower CCD cameras 10, 10. Has a light source 12 such as a halogen lamp, a concave mirror 13 for converting into a parallel light beam, and a half mirror 15 disposed at a 45 ° inclination. The half mirror 15 has a light reflectance and a transmittance of 50% each, and changes the optical axis of the lamp 11 by 90 ° after reflection so as to coincide with the vertical optical axis of the CCD camera 10 (coaxial). Change). Such illumination having an optical axis coaxial with the optical axis of the CCD camera 10 is referred to as coaxial epi-illumination, and is applied to the seal S on the transparent plate 4 (as shown in FIG. 7, the light is reflected on both sides of the seal S, and the light transmitted through the half mirror 15 is transmitted to the CCD camera 10 as shown in FIG.
To the front lens side.

【0021】なお、図11は別の実施の形態を示し、上下
の各CCDカメラ10,10としては(通常の)シャッター
機能の無いものを用いて、光源12としてはストロボを用
いる。ハーフミラー15を各CCDカメラ10,10に対応さ
せることは前述の図5と同じであるが、先端レンズ37,
37側の鉛直状光軸38,39を小寸法ΔXだけずらして、配
置する。このように、小寸法ΔXだけ上下のCCDカメ
ラ10,10の鉛直状光軸38,39をずらせることにより、シ
ールSの表裏の検査時に、一方が他方の光源の影響を受
ける虞が無い点で優れている。このとき、まず、表面用
光源(ストロボ)12を発光させて、表面の画像を取込
み、その直後に、裏面用光源(ストロボ)12を発光して
裏面の画像を取込み、両画像を処理すればよい。
FIG. 11 shows another embodiment, in which the upper and lower CCD cameras 10 and 10 have no (normal) shutter function, and the light source 12 is a strobe. Associating the half mirror 15 with each of the CCD cameras 10 and 10 is the same as in FIG.
The vertical optical axes 38 and 39 on the 37 side are displaced by a small dimension ΔX. In this way, by shifting the vertical optical axes 38, 39 of the upper and lower CCD cameras 10, 10 by the small dimension ΔX, when inspecting the front and back of the seal S, there is no possibility that one of the seals S will be affected by the other light source. Is excellent. At this time, first, the front-side light source (strobe) 12 is caused to emit light, and an image of the front surface is captured. Immediately thereafter, the back-side light source (strobe) 12 is emitted and the image of the back surface is captured, and both images are processed. Good.

【0022】図5〜図10,図11は、シールSとしてOリ
ングの場合を一例として示し、このOリングの場合には
同軸落射照明の光は、(図5と図7のように)シールS
外表面の頂上部近傍18・底部18′では、 360°逆方向に
反転し、ほぼ全反射状態で上下各々のCCDカメラ10,
10に入射する。
FIGS. 5 to 10 and 11 show, as an example, the case of an O-ring as the seal S. In the case of this O-ring, the light of the coaxial epi-illumination is sealed (as in FIGS. 5 and 7). S
In the vicinity of the top 18 and the bottom 18 'of the outer surface, the upper and lower CCD cameras 10 and
It is incident on 10.

【0023】図4に示すように、各CCDカメラ10から
の信号はマイクロコンピュータ等の画像処理手段へ送ら
れるように電気接続され、また、モニタ23へ(後述の)
画像を表示できるように、画像処理手段17とモニタ23と
が電気接続されている。また、22は操作部であって、画
像処理手段17と接続されている。
As shown in FIG. 4, signals from the respective CCD cameras 10 are electrically connected so as to be sent to image processing means such as a microcomputer, and are also connected to a monitor 23 (described later).
The image processing means 17 and the monitor 23 are electrically connected so that an image can be displayed. An operation unit 22 is connected to the image processing unit 17.

【0024】シールSがOリングの場合であって、か
つ、画像処理手段として、2値化する場合から、まず説
明すると、図5と図7の如く反射した光がCCDカメラ
10の先端レンズに入射すると、Oリング表面頂上部近傍
18及び底部18′は白に、Oリングの内周縁19と外周縁20
は黒に、2値化されて、図8と図9に示す如く、明色
(白色)リング状部21を有するOリング画像Gが得られ
る。上記頂上部近傍18(又は底部18′)に表面傷が存在
した場合には、図9に示すように、明色(白色)リング
状部21内に黒色として表面傷26が表われる。
In the case where the seal S is an O-ring and the image processing means is binarized, first, as shown in FIG. 5 and FIG.
When incident on 10 tip lenses, near the top of the O-ring surface
18 and the bottom 18 'are white, the inner peripheral edge 19 and the outer peripheral edge 20 of the O-ring.
Is binarized into black, and an O-ring image G having a light-colored (white) ring-shaped portion 21 is obtained as shown in FIGS. If a surface flaw exists near the top 18 (or bottom 18 '), the surface flaw 26 appears as black in the light-colored (white) ring-shaped part 21 as shown in FIG.

【0025】図6に示すフローチャート図及び図8に示
した2値化した画像図に於て、その後、2値化したOリ
ング画像Gの重心O1 が(図4の)画像処理手段17にて
算出され、(予め操作部22からの入力にて設定しておい
た)ウィンドWの中心O2 を移動させて、重心O1 と中
心O2 とを一致させる。
In the flowchart shown in FIG. 6 and the binarized image shown in FIG. 8, thereafter, the center of gravity O 1 of the binarized O-ring image G is sent to the image processing means 17 (FIG. 4). The center O 2 of the window W (preliminarily set by the input from the operation unit 22) is moved to match the center of gravity O 1 with the center O 2 .

【0026】このウィンドWは、2本のバリ検出用ウィ
ンドW1 ,W2 と、2本の欠け検出用ウィンドW3 ,W
4 と、1本の表面傷検出用ウィンドW5 から成る同心円
であり、このウィンドW及びOリング画像G等は、モニ
タ23(図4参照)にディスプレイされる。
This window W includes two burr detection windows W 1 and W 2 and two chip detection windows W 3 and W 2.
4, a concentric circle composed of one surface flaw detection window W 5, the window W and O-ring image G and the like are displayed on the monitor 23 (see FIG. 4).

【0027】図9は、Oリング画像Gの重心O1 に、ウ
ィンドWの中心O2 を一致させた状態を示しており、O
リング画像Gの外周27及び内周28には、夫々、バリ24と
欠け25が存在し、かつ、明色(白色)リング状部21内に
表面傷26が存在している場合を例示する。Oリング画像
Gの外周27には、2本のウィンドW1 ,W3 が対応して
外周27のバリ24と欠け25を検出し、また、内周28には2
本のウィンドW2 ,W 4 が対応して、内周28のバリ24と
欠け25を検出し、さらに、明色(白色)リング状部21
(の幅方向中央)に沿ってウィンドW5 が対応して表面
傷26を検出する。
FIG. 9 shows the center of gravity O of the O-ring image G.1 And c
The center O of WTwo Are matched, and O
The outer periphery 27 and the inner periphery 28 of the ring image G are provided with burrs 24, respectively.
Chip 25 is present in the light (white) ring-shaped part 21
A case where the surface flaw 26 is present will be exemplified. O-ring image
Two windows W on the outer periphery 27 of G1 , WThree Corresponding
The burr 24 and the chip 25 on the outer periphery 27 are detected.
Book window wTwo , W Four Corresponding to the burr 24 on the inner circumference 28
The chip 25 is detected, and the light-colored (white) ring-shaped part 21 is detected.
(W center in the width direction)Five Is corresponding to the surface
The scratch 26 is detected.

【0028】さらに詳しく説明すれば、図6,図9,図
10に於て、画像処理手段17(図4参照)によってウィン
ドW上の面積を計測───つまりウィンドW上における
白画素数及び黒画素数を図10のようにカウント───し
て、(予め入力しておいた)合否判定基準値と比較し、
許容範囲を越える大きさのバリ24,欠け25又は表面傷26
の有無を検出判定し、Oリングの良否を決定する。例え
ば、Oリングにバリ24,欠け25及び表面傷26が無けれ
ば、ウィンドW1 ,W2 ,W5 上の黒画素数は0で、か
つウィンドW3 ,W4 上の白画素数は0となる。
More specifically, FIGS. 6, 9 and
At 10, the area on the window W is measured by the image processing means 17 (see FIG. 4) {that is, the number of white pixels and the number of black pixels on the window W are counted as shown in FIG. Compare with the pass / fail judgment reference value (pre-input),
Burrs 24, chips 25 or surface flaws 26 that exceed the allowable range
Is detected and determined, and the quality of the O-ring is determined. For example, the burr 24 to O-ring, if there is no chipping 25 and surface scratches 26, in the window W 1, W 2, W number of black pixels on 5 0, and the window W 3, W number of white pixels on the 4 0 Becomes

【0029】このようにして、全てのウィンドW1 ,W
2 ,W3 ,W4 ,W5 上で白・黒各画素数が、合否判定
基準値を越えていなければ、そのOリングは良品と判定
され、逆に、越えていれば不良品と判定されて、良又は
不良の各信号が、図4に示した制御器16に送られて、制
御器16から不良品排出ノズル7aへ作動指令信号が送出
され、ノズル7aが作動してOリング不良品は吹き飛ば
されて収納器7内へ送られる。
Thus, all the windows W 1 , W
2, W 3, W 4, W 5 number of white and black pixels on the, if not exceed the acceptance criteria value, determining the O-ring is determined to be non-defective, conversely, if exceeded defective Then, each signal of good or bad is sent to the controller 16 shown in FIG. 4, and an operation command signal is sent from the controller 16 to the defective product discharge nozzle 7a. The good product is blown off and sent into the container 7.

【0030】上述した図1,図2,図4の実施例では、
第1検査手段1は、CCDカメラ10,同軸落射照明ラン
プ11,図示省略のセンサ,画像処理手段17,制御器16,
操作部22,及び、モニタ23等にて構成されている。第2
検査手段2も同様の構成である。
In the embodiments of FIGS. 1, 2 and 4 described above,
The first inspection means 1 includes a CCD camera 10, a coaxial incident illumination lamp 11, a sensor not shown, an image processing means 17, a controller 16,
It comprises an operation unit 22, a monitor 23, and the like. Second
The inspection means 2 has the same configuration.

【0031】また、図4に示すように、シールSのX方
向外測計31はコントローラXに接続され、Y方向外測計
32はコントローラYに接続され、さらに、演算手段33に
接続される。透明板4上にシールSが載置されて送られ
てくるので、下方からレーザー光を照射して上方にて受
光するレーザー測定器が各外測計31,32として好適に用
いられる。演算手段33に於て、直交するX方向とY方向
の各外径寸法を平均し、弾性変形による測定誤差を小さ
くする。(なお、外径寸法と共に内径寸法をも測定する
のが望ましい。あるいは、外径又は内径寸法と幅寸法を
測定することもできる。)
Further, as shown in FIG. 4, the X-direction outside measuring device 31 of the seal S is connected to the controller X, and the Y-direction outside measuring device 31 is provided.
The reference numeral 32 is connected to the controller Y, and further to the calculation means 33. Since the seal S is placed and sent on the transparent plate 4, a laser measuring device that irradiates a laser beam from below and receives the laser beam from above is preferably used as each of the external meters 31 and 32. The arithmetic means 33 averages the outer diameters in the orthogonal X and Y directions to reduce measurement errors due to elastic deformation. (Note that it is desirable to measure the inner diameter as well as the outer diameter. Alternatively, the outer or inner diameter and the width can also be measured.)

【0032】X方向とY方向の平均値が所定範囲外であ
れば、制御器16から寸法不良排出収納器34の排出ノズル
34aを作動させる信号が出力され、不良品として収納器
34へ吹き飛ばして排出する。
If the average value in the X direction and the Y direction is out of the predetermined range, the controller 16 outputs the discharge nozzle
A signal to activate 34a is output, and
Blow off to 34 and discharge.

【0033】なお、Oリング以外のシールSについては
その反射による明色リングの幅を径方向位置がその種類
(断面形状)によって異なるので、予め、前述のウィン
ドW1 ,W2 ,W3 ,W4 ,W5 の寸法・位置をそのシ
ールの種類(断面形状)に応じて、予め設定(入力)し
ておけば良い。
Since the width of the light-colored ring due to the reflection of the seal S other than the O-ring differs depending on the radial position (cross-sectional shape), the above-mentioned windows W 1 , W 2 , W 3 , The dimensions and positions of W 4 and W 5 may be set (input) in advance in accordance with the type (cross-sectional shape) of the seal.

【0034】また、以上は2値化画像処理について説明
したが、これを多値化して、例えば256段階等の多数の
明度差として処理する、グレー画像処理を、用いるも、
好ましい。
In the above, the binarized image processing has been described. However, gray image processing, in which this is multi-valued and processed as a number of lightness differences of, for example, 256 levels, is also used.
preferable.

【0035】上述したような検査装置と検査方法によれ
ば、Oリング等のシールSの1個当たりを、例えば、0.
5sec以内の高速度で、自動的に検査することができ、特
に、透明板4を用いてその上に載置したシールS…を反
転せずに上下両面から検査するので、シールの両面検査
に要する1個当たりの検査時間はOリング片面の場合と
ほとんど同じで済み、両面検査を効率良く行い得る。か
つ、従来の反転部位にてシールがスムースに送られなく
なるといった不具合も解消する。また、図1と図4の平
面図からも明らかなように装置全体としてコンパクト化
が図られていて、設置場所が狭くて済む利点もある。
According to the inspection apparatus and the inspection method as described above, one seal S such as an O-ring may be used, for example, in a range of 0.
Inspection can be performed automatically at high speed within 5 sec. In particular, since the seal S placed on the transparent plate 4 is inspected from both upper and lower sides without reversing, the seal S can be inspected on both sides. The required inspection time per piece is almost the same as in the case of one side of the O-ring, and the two-sided inspection can be performed efficiently. In addition, the conventional problem that the seal cannot be smoothly fed at the reversal portion is also solved. Further, as is clear from the plan views of FIGS. 1 and 4, there is an advantage that the entire apparatus is downsized and the installation place is small.

【0036】なお、本発明は上述の実施の形態以外にも
設計変更自由であり、例えば、図6に示したフローチャ
ート図に於けるバリ,欠け,表面傷の検査順序を入れ換
えたり、同時に行う等の変更は自由である。また、透明
板4としてターンテーブル以外に、直線往復送りを行う
プレート、あるいは透明材のエンドレスコンベアを用い
ても自由である。不良品排出ノズル7a,34aの代り
に、機械的な接触部材にてシールを跳ね飛ばす方式とす
ることもできる。また、(図11では光軸38,39を小寸法
ΔXだけ僅かに位置を異ならしめているが、これを、さ
らに大きくずらせて、)第1検査手段1と第2検査手段
2とを、平面的に見て上流・下流側に異なる位置に配設
しても、好ましい。
The present invention can be freely changed in design other than the above-described embodiment. For example, the inspection order of burrs, chips, and surface flaws in the flowchart shown in FIG. The changes are free. In addition to the turntable, a plate that performs linear reciprocating feed or an endless conveyor made of a transparent material may be used as the transparent plate 4. Instead of the defective product discharge nozzles 7a and 34a, a system in which the seal is bounced off by a mechanical contact member may be employed. In addition, (in FIG. 11, the positions of the optical axes 38 and 39 are slightly different by a small dimension ΔX, but the positions are further shifted.) The first inspection means 1 and the second inspection means 2 are two-dimensionally arranged. It is also preferable to dispose them at different positions on the upstream and downstream sides as seen in FIG.

【0037】[0037]

【発明の効果】本発明は上述の構成により次のような著
大な効果を奏する。
According to the present invention, the following significant effects can be obtained by the above-described structure.

【0038】 (請求項1によれば、)能率良くシー
ルSの欠陥を表裏両面について自動的に検査できる。し
かも、小径・肉薄のシールSの場合であっても、(従来
の反転する方法では送りが停滞したり詰まったりしたが
このような)送りの停滞、詰まり等のトラブルを生じな
いで、スムースにかつ確実に能率の良い検査が実現でき
る。 勿論、シールSの表面傷を両面検査するので、検査
の信頼性が高まる。 (従来の反転手段が省略できるので)装置の構造の
簡素化及びコンパクト化を図り得る。 (請求項2によれば、)無人でXY平均による寸法
検査が行われ、高速で、かつ、(測定誤差の小さい)高
精度の検査が実現できた。例えば、 120個/分の高速
で、0.01mmの精度にて(外径5.4mm の)小径・肉薄のO
リング等のシールSの寸法の検査が可能となる。 (請求項3によれば、)検査装置全体のコンパクト
化を図り得る。かつ、上下両方向からの検査が、確実・
容易に行い得る。
According to the first aspect, the defect of the seal S can be automatically and efficiently inspected on both front and back surfaces. In addition, even in the case of a small-diameter and thin seal S, troubles such as stagnation and clogging of the feed (such as the stagnant or clogged feed in the conventional reversing method) can be performed smoothly. In addition, an efficient inspection can be reliably realized. Of course, since the surface flaw of the seal S is inspected on both sides, the reliability of the inspection is improved. (Since the conventional reversing means can be omitted), the structure of the device can be simplified and made compact. According to the second aspect, the dimensional inspection based on the XY average is performed unattended, and a high-speed and high-accuracy inspection (with a small measurement error) can be realized. For example, at a high speed of 120 pieces / min.
It is possible to inspect the size of the seal S such as a ring. According to the third aspect, the entire inspection apparatus can be made compact. Inspection from both upper and lower directions
Easy to do.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の一形態を示す平面図である。FIG. 1 is a plan view showing an embodiment of the present invention.

【図2】その正面図である。FIG. 2 is a front view thereof.

【図3】概要説明用斜視図である。FIG. 3 is a schematic perspective view.

【図4】全体の構成説明図である。FIG. 4 is an explanatory diagram of the entire configuration.

【図5】同軸落射照明と撮像の説明図である。FIG. 5 is an explanatory diagram of coaxial epi-illumination and imaging.

【図6】フローチャート図である。FIG. 6 is a flowchart.

【図7】検査方法の説明図である。FIG. 7 is an explanatory diagram of an inspection method.

【図8】画像処理方法の説明図である。FIG. 8 is an explanatory diagram of an image processing method.

【図9】画像処理による検査方法の説明図である。FIG. 9 is an explanatory diagram of an inspection method using image processing.

【図10】ウィンドWの説明図である。FIG. 10 is an explanatory diagram of a window W.

【図11】CCDカメラの光軸を僅かにずらせて配置した
場合の要部説明図である。
FIG. 11 is an explanatory diagram of main parts when the optical axis of the CCD camera is slightly shifted.

【符号の説明】[Explanation of symbols]

S シール L 軸心 1 第1検査手段 2 第2検査手段 4 透明板 17 画像処理手段 21 明色リング状部 31 X方向外測計 32 Y方向外測計 S seal L axis 1 First inspection means 2 Second inspection means 4 Transparent plate 17 Image processing means 21 Light-colored ring-shaped part 31 X-direction outside measurement 32 Y-direction outside measurement

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 円環状シールを載置して送る透明板と、
該透明板の表面側から照明をあててシール表面で反射し
てなる明色リング状部の画像を画像処理して表面傷等の
外観検査を行う第1検査手段と、上記透明板の裏面側か
ら照明をあててシール裏面で反射してなる明色リング状
部の画像を画像処理して表面傷等の外観検査を行う第2
検査手段とを、備えていることを特徴とするシール検査
装置。
1. A transparent plate on which an annular seal is placed and fed,
First inspection means for performing image processing on an image of a light-colored ring-shaped portion reflected on the sealing surface by applying illumination from the front side of the transparent plate to perform an appearance inspection for surface scratches and the like; Image processing of the image of the light-colored ring-shaped portion reflected from the back surface of the seal by illuminating the surface to inspect the appearance such as surface scratches
A seal inspection device, comprising: an inspection unit.
【請求項2】 円環状シールの中心点を原点とする直交
座標のX軸・Y軸に沿っての外径寸法を夫々測定するX
方向外測計・Y方向外測計と、該X方向外測計とY方向
外測計によって測定されたX方向外径寸法とY方向外径
寸法の平均値を演算する演算手段とを、備えている請求
項1記載のシール検査装置。
2. The method of measuring outer diameters along X-axis and Y-axis of orthogonal coordinates having an origin at a center point of an annular seal.
Out-of-direction measurement / Y-direction outside measurement, and calculating means for calculating an average value of the X-direction outside diameter and the Y-direction outside diameter measured by the X-direction outside measurement and the Y-direction outside measurement, The seal inspection device according to claim 1, further comprising:
【請求項3】 透明板が鉛直軸心廻りに回転駆動される
ターンテーブルである請求項1又は2記載のシール検査
装置。
3. The seal inspection apparatus according to claim 1, wherein the transparent plate is a turntable that is driven to rotate about a vertical axis.
JP22437296A 1996-08-06 1996-08-06 Seal inspection device Expired - Fee Related JP3205511B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22437296A JP3205511B2 (en) 1996-08-06 1996-08-06 Seal inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22437296A JP3205511B2 (en) 1996-08-06 1996-08-06 Seal inspection device

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KR100781094B1 (en) * 2006-03-08 2007-12-05 (주)스마트비전텍 Automatic Inspecting Apparatus for O-Ring
JP2008281497A (en) * 2007-05-14 2008-11-20 Daido Steel Co Ltd Inside diameter measuring device for pressed punch hole
KR101217723B1 (en) 2010-11-08 2013-01-09 한국에스케이에프씰 주식회사 valve stem seal's inspection apparatus
JP2012225839A (en) * 2011-04-21 2012-11-15 Yamasho Kikai Co Ltd Appearance tester
JP2013238517A (en) * 2012-05-16 2013-11-28 Mitsubishi Cable Ind Ltd O-ring inspection apparatus and inspection method
CN102878946A (en) * 2012-08-29 2013-01-16 宁波富邦电池有限公司 Battery sealing piece detecting device
CN102941534A (en) * 2012-11-05 2013-02-27 大连理工大学 Surface shape measurement method for seal ring
JP2016070690A (en) * 2014-09-26 2016-05-09 Nok株式会社 Method for identifying item and determining foreign article by image processing
CN106871794A (en) * 2016-12-20 2017-06-20 铜陵市多元微分科技有限公司 A kind of crystal oscillator cover plate appearance and size automatic detection device
JP2019060756A (en) * 2017-09-27 2019-04-18 株式会社ランプハウス Image inspection control system for inspected object
CN109675832A (en) * 2019-01-21 2019-04-26 深圳精创视觉科技有限公司 A kind of ndfeb magnet size and open defect detection device
KR102135009B1 (en) * 2020-02-28 2020-07-16 서민석 Inspection apparatus for o-ring
JP2021188964A (en) * 2020-05-27 2021-12-13 株式会社オオシマ設備 Object imaging device and image inspection device
JP2023028006A (en) * 2021-08-18 2023-03-03 三菱電線工業株式会社 Ring shaped product dimension measurement device and ring shaped product dimension measurement method
CN113714143A (en) * 2021-08-23 2021-11-30 安徽思普泰克智能制造科技有限公司 Commutator size and appearance defect detection equipment based on CCD vision
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CN113959342A (en) * 2021-10-22 2022-01-21 宁波大学 Mechanical detection device for sealing element assembly
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