JPH10311782A - Method and device for regulating analyzed sample - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a compact method and device for regulating an analyzed sample with good inification in which a sample supplied in a red heating state is cooled and regulated with good quality and processed in an analysis appropriate state, and also regulation process can be carried out with good precision and high capability. SOLUTION: As for this method, after a sample S supplied in a red heating state is abruptly cooled at about 400 deg.C to 600 deg.C by a first cooler 2a, its gate part is separated by a cutter 4, and also after the cut sample S2 is cooled at about 50 deg.C to 20 deg.C by a second cooler 2b, a sample face is ground by a grinder 5. Further, this device is provided with the cooler 2a primary-cooling; the cutter 4 cutting a sample S cooled by the cooler 2a; the second cooler 2b secondary-cooling the cut sample; and the grinder 5 grinding the secondary cooled sample, in a conveying route in a first conveyor 3. In a conveying route of the first conveyor 3, there is also provided a puncher 7 punching a sample piece obtained by secondary-cutting the sample S via a second conveyor 8.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for preparing a sample (analytical sample) collected from a steelmaking site for analyzing elements in a metal such as steelmaking.

[0002]

2. Description of the Related Art Conventionally, the above-mentioned sample (hereinafter referred to as "sample") is obtained by manually removing a sample carried from a steelmaking site by a pneumatic tube or the like from the pneumatic tube or the like, and cutting the sample with a grinder type cutting device. Emission spectroscopy (emission analysis)
Sample, and then slice the sample into coin-shaped sample pieces with a grinder-type cutting machine, and then punch out this sample piece with a press to process and adjust a sample for gas analysis as a small piece of about 1 g. And try to get it. However, the production of an analysis sample by hand as described above is inefficient, and it is difficult to obtain precision such as cutting.
The present applicant previously disclosed in Japanese Utility Model Laid-Open No. 3-1155841, a sample receiving device, a grindstone cutting device, a grindstone polishing device, a transport device and the like were individually and planarly arranged, and these were handled by a handling device such as a transport conveyor. An organically coupled analytical sample processing device was presented.

[0003]

However, the analytical sample processing apparatus having the above-described configuration has been developed exclusively for producing a single sample, for example, only an luminescence analysis sample. It has been impossible to simultaneously prepare a plurality of analysis samples used for various types of analysis, for example, an emission analysis sample and a gas analysis sample. In addition, in general, the analysis sample is used by cutting the large-diameter gate side of the sample formed in a tapered trapezoidal shape, so it is necessary to securely grip the small-diameter portion side. No consideration has been given to this, and the sample is transported and processed in an unstable state, and there is a problem in sample accuracy.

[0004] Further, the cutting of a sample sent in a red heat state of 1000 ° C to 900 ° C is performed by means of a saw blade plate cutter (or a grinder cutter) in a red heat temperature range.
Alternatively, cutting means such as cutting at once from the above temperature range to 250 ° C. to a normal temperature range and cutting with a grinder cutter is performed. However, in the former case, the high temperature and high viscosity cause the blade of the cutter to be deteriorated at an early stage. In addition to clogging, there is a drawback that a coarse and uneven pearlite structure is liable to be formed by subsequent slow cooling, and it is not possible to accurately grasp the components by a laser beam irradiated at the time of analysis. In the case of the latter, there are disadvantages in that the sample is hardened and quenching cracks and the like are likely to occur, and it takes time to cut, and there is contamination in cutting the grinder cutter.

[0005]

In order to solve the above-mentioned problems, the method for preparing an analysis sample according to the present invention is as follows.
After being rapidly cooled to about 0 ° C. to 600 ° C., the sprue is cut off by the cutting device 4 and the cut sample S2 is cooled to about 50 ° C. to 20 ° C. by the second cooling device 2b, and then the sample surface is cut by the grinding device 5. It is characterized by grinding.

The second feature is that the primary cooled sample S is cut and cooled and the sample surface is ground while being held by the chuck 35 of the first transfer device 3.

Third, a sample S3 is formed by cutting the sample S secondarily by the cutting device 4, and the sample S3 is transferred to the puncher 7 to form a sample S4 for gas analysis. And

A fourth feature is that the sample S is heated and heated by the heating device 9 and cut in a pre-process in which the sample S is cut.

The apparatus for preparing an analysis sample according to the present invention includes a cooling device 2a for receiving a sample S sent in a red hot state and performing primary cooling, and a cutting device for cutting the sample S cooled by the cooling device 2a. Apparatus 4 and 2 of cut sample S2
A second cooling device 2b for performing the secondary cooling and a grinding device 5 for grinding the sample S2 subjected to the secondary cooling are provided in the transport path of the first transport device 3, and the transport of the first transport device 3 is performed. A puncher 7 for punching out a sample piece S3 obtained by secondarily cutting the sample S via a second transfer device 8 is provided along the path.

A grinding device 5 for grinding the sample S2 is
It is characterized in that a single arc-shaped cutting blade 52 is provided on the outer periphery of the upper part of a cutter holder 53 that rotates in the vertical axis.

[0011]

An embodiment of the present invention will be described with reference to the drawings. An analysis sample adjusting device (adjusting device) A shown in FIGS. 1 to 4 includes a receiving device (automatic receiving cooling device) 2 that freely receives a sample S from the left side of the machine body 1 by automatic supply or manual supply by manual feeding or the like. A transfer device 3a that takes out the sample S from a cooling unit (first cooling unit) 2a, which will be described later, formed in the receiving device 2 and transforms the sample S to an inverted posture.
And a first transporting device (XZ axis handling device) 3 that inherits the transformed sample S from the relaying device 3a and transports the sample S rightward, and is arranged side by side in the horizontal direction. Is connected to the horizontal frame 3F via the horizontal linear guide 3R in the horizontal direction (X
Shaft) and a vertical linear guide 3
It is supported so that it can reciprocate in the vertical direction (Z axis) via T.

On the front side of the horizontal frame 3F of the first transport device 3, the sample S transported by the first transport device 3 is cut in a plurality of stages including a first cut and a second cut. , A cutting device 4 for obtaining a sample S2 for emission spectroscopy and a sample piece S3 for gas analysis, and a cooling unit (second cooling unit) 2b for recooling the sample S2 for emission spectroscopy after the second cutting. A grinding device 5 for cutting (or polishing) the surface of the sample S2 after the second cooling;
The take-out / discharge devices 6 and the like that take over the transfer device 3 and take it out of the machine (for example, in an emission spectroscopic analysis process) are arranged in a horizontal row.

On the front side of the horizontal frame 3 and on the upstream side of the grinding device 5, a puncher (press) 7 for punching a sample S3 obtained by the second cutting into a sample S4 for gas analysis, and the sample S4 are taken out. A housing section 7a for housing and a shooter 7b for discharging the punched sample piece S3 are arranged, and the sample piece S3 cut by the cutting device 4 is received and passed to the puncher 7 between them. Piece S
A second transfer device (robot hand) 8 that discharges 3 to the shooter 7b is provided.

The adjusting device A according to the present invention having the above-mentioned layout has a receiving device 2 as shown in FIG.
Between the cutting device 4 and the transfer device 3a
A heating device 9 for supplementarily heating and raising the temperature of the sample S supplied in a low temperature state is provided in the handling locus of No. 3 so that the sample S in the low temperature state is supplied to the heating device 9 by the chuck 33. It is transported and freely heated to a predetermined temperature so that the subsequent processing such as cutting can be performed efficiently and favorably.

In this embodiment, the heating device 9 is of a high-frequency heating type for heating the sample S by an induced current, and the heating coil 90 has a heating gap so that the sample S can be inserted vertically. It is formed in a ring shape. Reference numeral 1c denotes an operation panel capable of automatically performing the operation described below of each of the above devices and freely operating any manual operation.

The adjusting device A is taken out of the furnace and fed when the respective devices are operated for a required time according to the procedure shown in the operation flowchart of FIG. 11 and the process chart (operation time chart) of FIG. The sample S in a red-hot state (a red-hot steel material or the like) can be subjected to each adjustment processing so as to efficiently and accurately obtain the samples S2 and S4 of the respective shapes shown in FIG. The sample S in the illustrated example shows a frustoconical bomb sample in the shape of a truncated cone heated to about 900 ° C. at the time of receiving. The standard size is such that the small diameter part is about 33 mm in diameter and the large diameter part ( (Gate) is about 38 mm in diameter and about 55 mm in length,
The sample material is made of carbon steel, alloy steel, stainless steel, or the like.

Next, referring to FIGS. 1 to 3 and FIGS. 4 to 6, the detailed configuration and operation of each of the devices 2 to 8 of the adjusting device A will be described. [Receiving device 2] As shown in FIGS. 4 and 5, the receiving device 2 has a first cooling device 2a provided above a bowl-shaped support cylinder 21 with a predetermined gap below a pneumatic tube 20; The support cylinder 2
A push-up cylinder 22 is provided at the center of the bottom wall in 1, and a drain port 21a and a gas vent 21b are provided on the side. Further, the first cooling device 2a includes a cooling nozzle 2 for supplying cooling water.
3, 23a in the upper and lower stages, and a water passage 23b is provided inside a cooling cylinder 23c formed in an annular slot.
A plurality of nozzle holes 25a are formed, and a guide tube 25 that forms the cooling chamber 21c is fitted therein.
The head of the push-up cylinder 22 is inserted into the lower portion so as to be vertically movable.

With this configuration, the receiving device 2 is connected to the pneumatic tube 2
0 or the sample S manually supplied through the removal gap,
At the position where the lifting cylinder 22 is lowered in the cooling chamber 21c, after receiving and holding the large-diameter gate section in the solid line posture with the upward facing, the cooling operation is performed while the lifting cylinder 22 is lifted to the delivery posture indicated by the dotted line by the ascending operation. The entire circumference is rapidly and uniformly cooled by the cooling water spouting from the nozzle hole 25a of the chamber 21c in a shower shape. By this primary cooling, the sample S is rapidly cooled from the temperature of about 900 ° C. to 1000 ° C. in the state of the glowing material at the time of receiving to about 400 ° C. to 600 ° C., and the microstructure becomes a fine pearlite structure. Analytical tests and the like of the samples obtained by the adjusting device A can be accurately grasped under appropriate conditions, and when quenched from 900 ° C. to 100 ° C. or less at once, some elements such as carbon (C) can be obtained. Although the hardness of the steel is increased due to the characteristics, a sample S that cannot be cut by the saw blade cutter is generated. However, according to the cooling unit, the cutting by the saw blade cutter can be performed well as described later. The advantage of can be created. When the cooling is performed, the cooling may be performed uniformly by rotating the sample S about the vertical axis by an appropriate means.

[Relaying Device 3a] As shown in FIGS. 4 and 5, the relaying device 3a is provided with a rotary cylinder 3 which is capable of reciprocatingly rotating about 90 degrees about a vertical axis.
1 and a guide cylinder 32 into which the sample S, which has been taken out by the receiving device 2, is fitted via a mounting rod 32 a to the head of a piston for reciprocating operation of the transfer cylinder 31. A chuck 33 for gripping the sample S in the guide tube 32 from both sides is provided, and both of them can be inverted and transformed from a take-out posture shown by a solid line in FIG. doing.

As a result, as shown in FIG. 4, the transfer device 3a moves the sample S which has been taken out by the first cooling device 2a.
With the chuck 3 inserted in the guide cylinder 32.
The first transporting device 3 is gripped precisely by the rotation of the first transporting device 3 and turned to the vertical position while being turned upside down to be transferred to a transfer position P of the chuck 35 of the first transporting device 3 to be accurately positioned. In this stopped state, when the gripping of the sample S by the chuck 33 is released, the lifting cylinder 36 waiting below the guide cylinder 32 lifts the sample S in the free state, and the chuck 35 waiting above. In this way, the small diameter portion can be properly grasped so that the sample S can be satisfactorily transferred.

[First Transporting Apparatus 3] As shown in FIGS. 1 to 3, the first transporting apparatus 3 is a linear guide 3R of a horizontal frame 3F which is provided almost vertically over the back of the machine base 1. The chuck 35 described above is provided on the head portion 36 supported so as to be reciprocable in the horizontal and vertical directions via the vertical linear guide 3T so as to be vertically movable and rotatable about the vertical axis of the chuck center. . In a state where the small-diameter portion (sample portion) that has inherited the sample S from the transfer device 3 a is gripped by the chuck 35, the first transfer device 3 is first transferred to the cutting device 4 and lengthened by the cutter (saw blade) 40. The first cutting of the middle part is performed, the gate side is cut off, and this is discharged outside the machine.

Next, the sample S1 (FIG. 12) in a state where the gate side is cut off is cut by a second thickness to a predetermined thickness (about 3 mm) by the automatic operation of the first transfer device 3. The sample piece S3 for gas analysis is cut off and transferred to the puncher 7 by a second transfer device 8 described below, which stands by below, and the chuck 35 separates the sample S3 from the sample piece S3.
After the sample S2 is transferred to the second cooling device 2b and the grinding device 5 and subjected to each processing, the sample S2 for which the sample adjustment is completed is transferred to the extracting device 6, taken out of the machine and discharged, and a series of operations are performed. Complete.

[Regarding the Cutting Apparatus 4] As shown in FIGS. 1, 2, 7 and 8, the cutting apparatus 4 mounts a cutter 40 made of a carbide round saw plate on an upper part of a motor shaft 41 which rotates longitudinally. At the same time, the upper part of the cutter 40 is covered with a cutter cover 43 in which a cutout portion 42 is formed. The cutting device 4 performs the first and second cutting of the sample S while the sample S is in a cutting suitable state at a temperature of about 400 ° C. to 600 ° C. at which a fine pearlite structure is generated by primary cooling. , And by cutting under these conditions, even when cutting with a saw blade, a large cutting resistance is not generated, so that the cut surface finish is good and high efficiency cutting work is performed well, and red heat like conventional ones Compared to cutting at a high temperature in the state, there is an advantage that the generation of contamination can be prevented while significantly improving the durability of the saw blade.

[Second Cooling Apparatus 2b] As shown in FIG. 9, the second cooling apparatus 2b has a cooling nozzle 27 for jetting cooling water into a box 26 having an open upper portion forming a second cooling chamber. By rotating the vertical axis in a state where the second cut sample S2 is gripped by the chuck 35 and spraying the cooling water spouted from the cooling nozzle 27,
After the primary cooling, the sample S2, which has been cooled to about 200 ° C. to 300 ° C. by natural cooling, is cooled to about 30 ° C., so that the next grinding device 5 can perform cutting well. The cooling of the sample S2 may be performed by ejecting a cooling gas from the cooling nozzle 27.

[Regarding the Grinding Apparatus 5 and the Extraction Apparatus 6] As shown in FIGS. 1, 2 and 10, the grinding apparatus 5 has a milling cutter 50 mounted in a box-shaped cutter box 51 so as to be rotatable in the vertical axis. At the same time, the milling cutter 50 is configured such that one cutting blade (tip) 52 having a circular blade surface is attached to a cutter holder 53 via a mounting screw 55 so that the mounting blade angle is adjustable and detachable. . With this configuration, the sample surface of the sample S2 is sequentially and satisfactorily cut by a predetermined cutting amount by one tip 52 that rotates in the vertical axis with the rightward movement of the chuck 35.

Therefore, according to the above-mentioned cutting means, the conventional milling cutter which performs cutting with a plurality of chips in the cutter holder has a slightly different mounting blade surface height of each chip. C) Since a cutting surface with a non-uniform cutting trace height as shown by the dotted line in C) has to be formed, irregular reflection of laser light is generated irregularly and largely at the time of measurement such as emission spectroscopy. Although the milling cutter 50 according to the present embodiment has a problem in that the analysis sample adjustment cannot be performed accurately, the analysis sample adjustment is flattened so as to obtain a uniform and precise cutting surface as shown by a solid line in FIG. In this way, it is possible to finish the sample surface with high accuracy and to suppress irregular reflection of laser light when performing measurement such as emission spectroscopic analysis, thereby enabling accurate data comprehension.

According to the above-mentioned cutting means, there is also an advantage that the contamination can be efficiently and favorably cut on the sample surface without causing contamination unlike the cutting by the grinder cutter. That is, in the grindstone polishing of the grinder method, the polishing is performed by scraping off the sample surface while removing the abrasive particles by bringing the polishing abrasive particles such as alumina forming the grindstone into contact with the sample surface. Dropped abrasive grains tend to stick into the surface of the sample, which has the disadvantage of being detected at the time of luminescence analysis, causing an error with the actual component.Friction heat generated at this time differs depending on the sample component. However, since the temperature rises by about 20 ° C. to 100 ° C., it takes a long time for the subsequent cooling (second cooling or the like) and becomes inefficient. There are advantages such that the temperature can be kept low and contamination can be easily prevented. Also take-out device 6
Is to properly receive the finished sample S2 by releasing the grip of the chuck 35, and to smoothly send the received sample S2 to a next-order cantback device (not shown) or the like. I have. The sample S2 at this time is
It is discharged at an appropriate temperature for performing emission spectroscopy at about 40 ° C. raised and lowered by about 10 ° C. by cutting heat generated by the cutting of the grinding device 5.

[Puncher 7] As shown in FIGS. 7 and 8, the puncher 7 has a diameter of 6 mm from the sample piece 3 below the driving unit 70 and the punching unit 71 having the same configuration as the conventional one. An accommodating portion 7a for accommodating three to four samples S4 punched out to a sufficient degree is provided, and a shooter 7b for discharging the punched sample pieces S3 is provided alongside the accommodating portion 7a. The puncher 7 is set so as to punch out the sample piece S3 at a temperature of about 200 ° C. to 300 ° C. or a temperature naturally lowered by the material, including the time of cutting after the primary cooling. Gas analysis can be performed accurately and satisfactorily without accompanying structural change due to generation of excessive internal stress, and the sample S4 can be stamped and formed efficiently. doing.

[Second Conveying Apparatus 8] As shown in FIGS. 7 and 8, the second conveying apparatus 8 has a guide rail 80 erected on the rear side of the puncher 7 and can move laterally on the guide rail 80. Head 81 supported by the head, and the head 8
A second chuck 8 in which a rotary chuck is switched between a cutting portion position and a puncher portion position so as to be able to reciprocate.
And 2. With this configuration, when the chuck 35 completes the cutting of the sample S2 in the cutting section 42, the second transfer device 8 moves the second chuck 82 to the sample S2.
7, the cut sample piece S3 is accurately grasped while facing the standby position shown by the solid line in FIG.
2 is rotated by approximately 90 degrees as shown by the dotted line,
1 to move leftward to perform the next operation.

That is, the sample piece S3 gripped by the second chuck 82 is transferred to the punch 71 and released from being gripped. In this state, the sample piece S3 is punched out of the sample S4 as described above. The subsequent sample piece S3 is conveyed to the right chute 7b while being held again by the second chuck 82 and released from being held, whereby the sample piece S3 is smoothly discharged out of the apparatus and a series of operations of the second transfer device 8 is performed. Complete.

The analytical sample preparation apparatus A configured as described above has a cutting apparatus 4 using a cemented saw plate that performs the first cutting when the sample S is received in the receiving apparatus 2 in one apparatus, and performs primary cooling. Since the first cooling device 2a for performing the second cooling device 2b for performing the secondary cooling and the grinding device 5 for cutting the sample S2 subjected to the secondary cooling while preventing the contamination by the milling cutter 50 are provided in series, Processing adjustment of the sample S can be performed efficiently and favorably as follows. That is, the sample S in a red-hot state at 900 ° C. to 1000 ° C. which is taken out of a converter or the like (not shown) and supplied into the receiving device 2 through the pneumatic tube 20 has the small-diameter portion facing downward and the gate portion facing upward. In the supply position, primary cooling is performed by the first cooling device 2a as described above.

In this case, the supply of the sample S, which is performed by hand if necessary, can be freely performed through a manual sample supply port (not shown) provided separately from the air supply pipe 20. By this primary cooling, the sample S becomes 400
Since it is quenched by a shower cooling method to about 600C to about 600C, the austenite structure can be efficiently and uniformly changed to a fine pearlite structure. Sample S
Since the pearlite transformation is completed at a relatively high temperature and is maintained as a viscous elastic body, it is possible to suppress excessive force in the structure during the transformation expansion, to prevent problems such as burning cracks, and to perform high-precision analysis. There is an advantage that allows.

Thereafter, the sample S is transferred to the lifting cylinder 36 while being inverted and transformed by the transfer device 3a. The small diameter portion is gripped by the chuck 35 by lifting the lifting cylinder 36, and is transferred to the cutting device 4. Is done. Then, the sample S transported to the joining portion by the first transport device 3 is subjected to a primary cutting by the cutter 40, the gate portion is cut off, and discharged out of the machine. In this case, the chuck 35
Is to perform a good cutting action without causing burrs and the like by rotating.

Next, after the first cutting operation is completed, the first transfer device 3 once retreats, lowers the chuck 35 to the thickness dimension of the sample piece S3, and advances again to move to the second position.
The next cutting is started, and the sample piece S3 cut off by the secondary cutting is transferred to the chuck 82 of the second transporting device 8 waiting below the chuck 35 and is gripped by the chuck 35. The moving sample S2 is moved and lowered into the second cooling device 2b, and the cooling water (or cooling air) jetted from the nozzle 27 at this time causes
A sample S2 at a natural cooling temperature between 0 ° C. and 400 ° C. is placed at 30 ° C.
Secondary cooling is performed so that the temperature becomes about the same.

According to the present invention, when cutting with the cutter 40, in the present invention, the sample S is cooled to about 400 ° C. to 600 ° C. by the rapid cooling means of the primary cooling so that the structure becomes fine pearlite and the elasticity which suppresses hardening is suppressed. Since the primary and secondary cuts are performed in a series using a carbide saw blade plate in the form of a body, cutting by the saw blade is not accompanied by a large cutting load, and wear of the saw blade is reduced. In addition to the above, the cutting can be performed efficiently and smoothly, and the cutting can be performed without the need for a cutting means using a disk grinder (grinder cutter) as in the conventional apparatus. The life of the cutting blade can be extended.

Then, after this, the first transfer device 3 is set at 30 ° C.
The sample S2 having a stable tissue state is transferred to the grinding device 5 while holding the small diameter portion with the chuck 35,
As described above, the single-blade tip 52 of the cutter 50 can be satisfactorily ground. Thus, the sample S2 can be efficiently and highly accurately finished without a contaminant or the like on the finishing accuracy of the ground surface, and is suitable for emission spectroscopy at about 40 ° C. which is naturally raised by about 10 ° C. by the above-mentioned grinding. When the temperature reaches the temperature, there is an advantage that the heating performed at the time of emission spectroscopy or the like to be performed later can be assisted, and the data can be satisfactorily obtained while saving labor. Further, since a series of cutting and grinding are performed by holding the sample S with the same chuck 35 without holding, there is an advantage that the processing accuracy does not decrease due to holding.

The sample S2 having undergone the above steps is transferred to the starting end of the take-out device 6 by the first transfer device 3 and is dropped to this portion by releasing the grip of the chuck 35, and is transferred by the transfer operation of the take-out device 6. It is taken out and subjected to analysis work such as emission spectroscopy. In this analysis work, the temperature of the sample S2 in the state of the glowing material at the time of receiving from about 900 ° C. to 1000 ° C. to 400 ° C. to 6 ° C. by primary cooling.
After being quenched uniformly to about 00 ° C. to form a fine pearlite structure, and after secondary cooling, the grinding apparatus 5
As a result, the surface is finished to be a flat surface with no contamination, so that data such as analysis tests can be accurately grasped under appropriate conditions.

On the other hand, the sample piece S3 obtained by the above-mentioned secondary cutting is gripped by the chuck 82 of the second transfer device 8 and transferred to the puncher 7, and while the chuck 82 is once released from gripping, the sample piece S3 is released. S4 is punched out, and the punched sample piece S3 after punching is gripped again by the chuck 82, transferred to the shooter 7b as shown by the dotted line in FIG. 7, released by dropping, and discharged out of the machine. You. In the step of punching the sample S3 from the sample S3, the sample S3 is a fine pearlite and an elastic body which is maintained at a high temperature while being naturally cooled to 300 ° C to 400 ° C. There is an advantage that punching for up to 4 pieces can be performed smoothly with a low load without causing excessive force in the tissue.

Accordingly, the sample S4 thus obtained
Is collected in the storage section 7a and during this time, 2
There is an advantage that the temperature is set to a temperature suitable for gas analysis of 00 ° C. to 300 ° C., and that subsequent analysis operations such as gas analysis can be performed well. As described above, the present invention provides the processing path for the emission spectroscopic analysis adjustment sample and the processing path for the gas analysis adjustment sample in one apparatus, so that the sample S sent in the red-hot state can be subjected to the emission spectrometry. The sample S2 for gas analysis and the sample S4 for gas analysis are adjusted and processed at the same time without being separately performed by a separate device as in the prior art, so that the processing adjustment time can be shortened and the apparatus can be made compact. The feature is that it can be performed efficiently and with high accuracy while achieving the structure.

As described above, when processing a sample S in a normal temperature range, for example, in addition to the sample S in the red-hot state, the receiving device 2
Is supplied to the heating device 9 without being cooled by the first cooling device 2a, and is transferred to the heating device 9 by the chuck 33 of the transfer device 3a.
After the temperature is raised to about 600 ° C., the primary and secondary cutting by the cutting device 4 is smoothly performed by the same operation as described above, and the sample S2 obtained by this is cut into the second.
Cooling is performed by the cooling device 2b, surface grinding is performed by the grinding device 5, and the sample is appropriately finished.
The sample S4 can be satisfactorily obtained by punching.

By providing the heating device 9 in the adjusting device A as described above, the same adjusting device A can be used for the sample in a low temperature state other than the sample immediately after being taken out of the furnace. By raising the temperature to an appropriate temperature for processing, the sample structure is tempered, cutting is performed promptly in the same manner as described above, and processing such as punching is performed efficiently without early wear of the cutting tool etc. Can do well,
There is an advantage that each subsequent analysis can be satisfactorily performed with high accuracy.

[0042]

As described above, the present invention has the following advantages. According to the first aspect of the present invention, a sample supplied in a red-hot state is rapidly cooled by primary cooling to be efficiently and uniformly converted to a fine pearlite structure, and has a viscous elasticity in which pearlite transformation is completed at a relatively high temperature. Since it is maintained in the body, the generation of excessive force in the tissue during transformation expansion can be suppressed, and problems such as burning cracks can be properly prevented. In addition, the cutter can be smoothly cut and the cutter can be worn, etc. Can be satisfactorily prevented. In addition, after the above sample is made into a stable structure at a low temperature by secondary cooling, the surface is ground precisely, so that the finishing accuracy of the ground surface can be efficiently and precisely finished without involving contamination etc., and emission spectroscopy Data can be satisfactorily grasped while saving labor.

According to the second aspect of the present invention, the cooled sample is not held while being held by the chuck of the first transfer device, but is held by the same chuck to perform cutting and grinding of the sample surface. It is possible to efficiently and highly accurately process by preventing a decrease in processing accuracy.

According to the third aspect of the present invention, the sample piece S3 obtained by secondary cutting the primary cut sample is
Since it is in an elastic state with a fine pearlite structure that maintains a high temperature state, punching with a puncher can be performed smoothly with a low load without causing excessive force in the structure, and analysis such as gas analysis performed later Work can be performed satisfactorily and with high accuracy.

According to the fourth aspect of the present invention, it is possible to easily raise the temperature of a sample in a low temperature state to an appropriate processing temperature by using the same adjusting device and a heating device provided therewith. In addition, there is an advantage that, in addition to the above, the wear of the cutter or the like can be prevented and the analysis can be performed efficiently and satisfactorily, and the subsequent analysis work and the like can be performed satisfactorily.

According to the fifth aspect of the present invention, by providing a processing path for an emission spectroscopic analysis adjustment sample and a processing path for a gas analysis adjustment sample in one sample preparation apparatus, a sample fed in a red-hot state can be obtained. The sample for emission spectroscopy and the sample for gas analysis can be adjusted and processed simultaneously without using separate devices in separate steps as in the prior art, so that the processing adjustment time can be reduced. At the same time, the device can be manufactured with high accuracy with a simple configuration while reducing the size of the device.

According to the sixth aspect of the present invention, by providing a grinding device in which a single arc-shaped cutting blade is provided on the upper outer periphery of a cutter holder that rotates in the vertical axis, the finishing accuracy of the grinding surface can be reduced without contaminants or the like. A highly accurate flat surface can be finished, and data can be grasped well during analysis work while saving labor.

[Brief description of the drawings]

FIG. 1 is a front view showing an apparatus for preparing an analysis sample according to the present invention.

FIG. 2 is a plan view of FIG. 1;

FIG. 3A is a left side view of FIG. (B) is a right side view of FIG.

FIG. 4 is a sectional view showing an embodiment of a first cooling device and a transfer device.

FIG. 5 is a plan view of the transfer device.

FIG. 6 is a side view of FIG. 5;

FIG. 7 is a plan view illustrating aspects of a second transport device and a puncher unit.

FIG. 8 is a front view of FIG. 7;

FIG. 9 is a sectional view of a second cooling device.

FIG. 10A is a front view of a grinding device. (B) is a perspective view showing a grinding action of the grinding device. (C) is an enlarged sectional view of the ground surface.

FIG. 11 is an operation flowchart of the adjustment device.

FIG. 12 is a schematic view showing a mode of processing adjustment of a sample.

FIG. 13 is an operation time chart of the adjustment device.

[Explanation of symbols]

 Reference Signs List A adjustment device (analytical sample adjustment device) 2 receiving device 2a first cooling device (cooling unit) 2b second cooling device (cooling unit) 2c cooling chamber 3 first transport device 3a transfer device 3F horizontal frame 4 cutting device 5 grinding Apparatus 7 Puncher 8 Second transfer device 9 Heating device 32 Guide tube 33, 35, 82 Chuck 40 Cutter (saw blade) 50 Milling cutter 52 Cutting blade (chip) S, S1, S2, S4 Sample S3 Sample piece

Claims (6)

[Claims] 1. A sample (S) supplied in a red-hot state is rapidly cooled to about 400 ° C. to 600 ° C. by a first cooling device (2a), and then a gate is cut off by a cutting device (4) and cut. The sample (S2) after the second cooling device (2b)
A method for preparing an analysis sample, wherein the sample surface is cooled to about 50 ° C. to 20 ° C. and then the sample surface is ground by a grinding device (5). 2. The method according to claim 1, wherein the primary cooled sample (S) is cut and cooled and the sample surface is ground while holding the chuck (35) of the first transfer device (3). Adjustment method. 3. A sample piece (S3) is formed by subjecting the sample (S) to secondary cutting with a cutting device (4).
3. The method for preparing an analysis sample according to claim 1, wherein 3) is transferred to a puncher (7) to form a sample (S4) for gas analysis. 4. The method for preparing an analysis sample according to claim 1, wherein the sample (S) is heated and heated by a heating device (9) in a pre-process for cutting the sample (S). 5. A cooling device (2a) for receiving a sample (S) fed in a red hot state and performing primary cooling, and a cutting device for cutting the sample (S) cooled by the cooling device (2a). (4) a second cooling device (2b) for performing secondary cooling of the cut sample (S2), and a grinding device (5) for grinding the sample (S2) subjected to secondary cooling. A sample piece (S3) obtained by second-cutting the sample S is provided in the transport path of the first transport apparatus (3) in the transport path of the first transport apparatus (3). 8) A device for preparing an analysis sample, which is provided with a puncher (7) for punching through the sample. 6. A grinding device (5) for grinding a sample (S2).
6. An arc-shaped cutting blade (52) is provided on the outer periphery of an upper part of a cutter holder (53) that rotates on a vertical axis.
For adjusting the analysis sample.