JPH102932A - Environment tester - Google Patents

Environment tester

Info

Publication number
JPH102932A
JPH102932A JP8157815A JP15781596A JPH102932A JP H102932 A JPH102932 A JP H102932A JP 8157815 A JP8157815 A JP 8157815A JP 15781596 A JP15781596 A JP 15781596A JP H102932 A JPH102932 A JP H102932A
Authority
JP
Japan
Prior art keywords
temperature
test
upstream
downstream
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8157815A
Other languages
Japanese (ja)
Other versions
JP3138802B2 (en
Inventor
Kenji Yoda
健司 依田
Hitoshi Toda
仁 戸田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Orion Machinery Co Ltd
Original Assignee
Orion Machinery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orion Machinery Co Ltd filed Critical Orion Machinery Co Ltd
Priority to JP08157815A priority Critical patent/JP3138802B2/en
Publication of JPH102932A publication Critical patent/JPH102932A/en
Application granted granted Critical
Publication of JP3138802B2 publication Critical patent/JP3138802B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To perform the highly accurate temperature control and to achieve the quick movement to the different temperature environment. SOLUTION: This tester has an upstream-side temperature sensor part 5, which is arranged at the upstream side of an air blowing path 3 in a testing tank 3, and a downstream-side temperature sensor part 6, which is arranged at the downstream side of the air blowing path 3. At the same time, by providing a set-temperature changing part 7, a normal set temperature Tc is changed into a set temperature of Ts=Tc-(to-ti)/2 based on the detected temperature ti obtained from the upstream-side temperature sensor part 5 and the detected temperature to obtained from the downstream-side temperature part 6.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体実装ボード等
の発熱部を有する被試験物の温度試験を行う試験装置等
に用いて好適な環境試験装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an environmental test apparatus suitable for use in a test apparatus for performing a temperature test on a device under test having a heating portion such as a semiconductor mounting board.

【0002】[0002]

【従来の技術】従来、発熱部を有する被試験物を収容可
能に構成し、かつ送風路の一部を構成する試験槽を備え
るとともに、この試験槽にに冷熱風を循環させ、かつ設
定温度と検出温度に基づいて当該試験槽の温度を制御す
る温度制御部を備える環境試験装置は知られている。
2. Description of the Related Art Conventionally, there is provided a test tank which is configured to be capable of accommodating a test object having a heat-generating part and also constitutes a part of an air passage, circulates cool and hot air through the test tank, and sets a predetermined temperature. An environmental test apparatus including a temperature control unit that controls the temperature of the test tank based on the temperature and the detected temperature is known.

【0003】この種の環境試験装置は、試験槽に半導体
実装ボード等の被試験物を収容するとともに、被試験物
の発熱部を発熱させた状態にして、例えば、125℃程
度の熱風を所定時間循環供給することにより高温試験を
行うもので、試験槽の温度は、温度制御部によって、当
該試験槽内に配設した温度センサ部から得る検出温度と
予め設定した設定温度に基づいてフィードバック制御さ
れる。
In this type of environmental test apparatus, a test object such as a semiconductor mounting board is housed in a test tank, and a heating section of the test object is heated so that hot air of, for example, about 125.degree. A high-temperature test is performed by circulating time, and the temperature of the test chamber is feedback-controlled by a temperature control unit based on a detected temperature obtained from a temperature sensor unit disposed in the test chamber and a preset set temperature. Is done.

【0004】[0004]

【発明が解決しようとする課題】しかし、このような環
境試験装置は被試験物の発熱部を発熱させた状態で試験
を行うため、次のような問題があった。
However, such an environmental test apparatus has the following problems since the test is performed with the heat generating portion of the DUT heated.

【0005】第一に、発熱部の発熱により、試験槽にお
ける送風路下流側の温度は、送風路上流側の温度よりも
高くなるとともに、その温度差は被試験物の種類や収容
状況によって異なる。このため、温度センサ部によって
試験槽内における特定部位の温度を検出しても、的確な
温度状態を把握できず、精度の高い温度制御を行うこと
ができない。
[0005] First, due to the heat generated by the heat generating portion, the temperature of the test tank on the downstream side of the ventilation path becomes higher than the temperature on the upstream side of the ventilation path, and the temperature difference varies depending on the type of the DUT and the accommodation state. . For this reason, even if the temperature of the specific part in the test tank is detected by the temperature sensor section, it is not possible to accurately grasp the temperature state, and it is not possible to perform highly accurate temperature control.

【0006】第二に、高温又は低温試験後は速やかに常
温に戻して試験結果を検査する必要があるが、設定温度
に対する一般的なフィードバック制御では、他の異なる
温度環境に速やかに移行させることができない。
Second, after the high or low temperature test, it is necessary to quickly return to normal temperature and inspect the test result. In general feedback control for the set temperature, it is necessary to promptly shift to another different temperature environment. Can not.

【0007】本発明はこのような従来の技術に存在する
課題を解決したものであり、精度の高い温度制御を行う
ことができるとともに、他の異なる温度環境に速やかに
移行させることができる環境試験装置の提供を目的とす
る。
[0007] The present invention has been made to solve the problems existing in the prior art, and provides an environmental test capable of performing high-accuracy temperature control and promptly shifting to another different temperature environment. The purpose is to provide the device.

【0008】[0008]

【課題を解決するための手段及び実施の形態】本発明
は、発熱部を有する被試験物Wを収容可能に構成し、か
つ送風路3の一部を構成する試験槽2を備えるととも
に、この試験槽2に冷熱風Aを循環させ、かつ設定温度
Tsと検出温度に基づいて試験槽2の温度を制御する温
度制御部4を備える環境試験装置1を構成するに際し
て、試験槽2における送風路3上流側に配設した上流側
温度センサ部5及び送風路3下流側に配設した下流側温
度センサ部6を備えるとともに、上流側温度センサ部5
から得る検出温度ti及び下流側温度センサ部6から得
る検出温度toに基づいて、正規設定温度Tcを、設定
温度Ts=Tc−(to−ti)/2に変更する設定温
度変更部7を備えることを特徴とする。この場合、正規
設定温度Tcは温度上昇時に所定温度だけ高くし、かつ
温度下降時に所定温度だけ低くすることができる。
According to the present invention, there is provided a test tank 2 which is configured to be capable of accommodating a test object W having a heat-generating part and forms a part of an air passage 3. When configuring the environmental test apparatus 1 including the temperature control unit 4 that circulates the hot and cold air A through the test tank 2 and controls the temperature of the test tank 2 based on the set temperature Ts and the detected temperature, the air path in the test tank 2 3 comprises an upstream temperature sensor section 5 disposed on the upstream side and a downstream temperature sensor section 6 disposed on the downstream side of the air duct 3;
And a set temperature changing unit 7 for changing the regular set temperature Tc to the set temperature Ts = Tc- (to-ti) / 2 based on the detected temperature ti obtained from the temperature sensor and the detected temperature to obtained from the downstream temperature sensor unit 6. It is characterized by the following. In this case, the regular set temperature Tc can be increased by a predetermined temperature when the temperature rises, and lowered by a predetermined temperature when the temperature falls.

【0009】これにより、試験槽2における送風路3上
流側に配設した上流側温度センサ部5と送風路3下流側
に配設した下流側温度センサ部6によって、試験槽2内
の温度状態を的確に把握できるとともに、特に、設定温
度Tsは、Ts=Tc−(to−ti)/2に基づいて
逐次変更されるため、例えば、試験槽2の温度を高温環
境から低温環境に移行させる際には、検出温度tiと検
出温度toの温度勾配が大きくなり、(to−ti)が
大きくなることから、設定温度Tsは低い値に変更され
る。この結果、急速冷却が行われるとともに、設定温度
Tsに近付けば、(to−ti)は小さくなり、次第に
冷却は緩やかになるため、正規設定温度Tcに近付く。
したがって、他の異なる温度環境に速やかに移行させる
ことができるとともに、精度の高い温度制御を行うこと
ができる。
Thus, the temperature condition in the test tank 2 is determined by the upstream temperature sensor unit 5 disposed on the upstream side of the air passage 3 and the downstream temperature sensor unit 6 disposed on the downstream side of the air passage 3 in the test tank 2. In particular, since the set temperature Ts is sequentially changed based on Ts = Tc- (to-ti) / 2, for example, the temperature of the test chamber 2 is shifted from a high-temperature environment to a low-temperature environment. At this time, since the temperature gradient between the detected temperature ti and the detected temperature to becomes large and (to-ti) becomes large, the set temperature Ts is changed to a low value. As a result, rapid cooling is performed, and when the temperature approaches the set temperature Ts, (to-ti) becomes smaller, and the cooling becomes gradually slower, so that the temperature approaches the regular set temperature Tc.
Therefore, it is possible to promptly shift to another different temperature environment and perform highly accurate temperature control.

【0010】[0010]

【実施例】次に、本発明に係る好適な実施例を挙げ、図
面に基づき詳細に説明する。
Next, preferred embodiments according to the present invention will be described in detail with reference to the drawings.

【0011】まず、本実施例に係る環境試験装置1の構
成について、図1及び図2を参照して説明する。
First, the configuration of an environmental test apparatus 1 according to the present embodiment will be described with reference to FIGS.

【0012】図中、10は環境試験装置1の外ハウジン
グであり、この外ハウジング10の内部には内ハウジン
グ11を備える。内ハウジング11は試験槽2を構成
し、内部には一定間隔置きに複数段に配した被試験物W
…を収容できる。この場合、被試験物W…は半導体実装
ボード等のように発熱部を有するため、試験槽2の内部
には被試験物W…の発熱部に通電するための給電用コネ
クタ(コンセント)が設けられている。
In FIG. 1, reference numeral 10 denotes an outer housing of the environmental test apparatus 1, and an inner housing 11 is provided inside the outer housing 10. The inner housing 11 constitutes the test tank 2 and has a plurality of test pieces W
... can be accommodated. In this case, since the DUT has a heat-generating portion like a semiconductor mounting board, a power supply connector (outlet) for supplying electricity to the heat-generating portion of the DUT is provided inside the test tank 2. Have been.

【0013】また、内ハウジング11の上板部11uと
外ハウジング10の上板部10u間には空調室3uを設
け、冷却器12,ヒータ13及び送風機(シロッコファ
ン)14,15を配設する。一方、内ハウジング11の
左右側板部11s,11tと外ハウジング10の左右側
板部10s,10t間には、通気ダクト3s,3tを設
け、この通気ダクト3s,3tは空調室3uに連通させ
る。また、内ハウジング11の左右側板部11s,11
tには多数の通気孔16…を設け、この通気孔16…を
通して、通気ダクト3s,3tと試験槽2の内部を連通
させる。これにより、試験槽2を含む循環構造の送風路
3が形成される。なお、図2中、17,18は開閉ドア
を示す。
An air-conditioning room 3u is provided between an upper plate 11u of the inner housing 11 and an upper plate 10u of the outer housing 10, and a cooler 12, a heater 13, and fans (sirocco fans) 14, 15 are provided. . On the other hand, ventilation ducts 3s, 3t are provided between the left and right side plate parts 11s, 11t of the inner housing 11 and the left and right side plate parts 10s, 10t of the outer housing 10, and these ventilation ducts 3s, 3t communicate with the air conditioning room 3u. Also, the left and right side plate portions 11s, 11
At t, a large number of ventilation holes 16 are provided, through which the ventilation ducts 3 s and 3 t communicate with the inside of the test tank 2. As a result, a ventilation path 3 having a circulation structure including the test tank 2 is formed. In FIG. 2, reference numerals 17 and 18 denote opening and closing doors.

【0014】他方、環境試験装置1には温度制御部4を
備える。温度制御部4は、試験槽2における送風路3上
流側に配設した上流側温度センサ部5と送風路3下流側
に配設した下流側温度センサ部6を備える。この場合、
各温度センサ部5,6は内ハウジング11の左右側板部
11s,11tの中央内方に配設する。なお、各温度セ
ンサ部5,6としては、白金センサ或いは熱電対等を利
用できる。
On the other hand, the environmental test apparatus 1 includes a temperature control unit 4. The temperature control unit 4 includes an upstream temperature sensor unit 5 disposed on the upstream side of the air passage 3 in the test tank 2 and a downstream temperature sensor unit 6 disposed on the downstream side of the air passage 3. in this case,
The temperature sensors 5 and 6 are disposed inside the center of the left and right side plates 11 s and 11 t of the inner housing 11. In addition, as each of the temperature sensor units 5 and 6, a platinum sensor or a thermocouple can be used.

【0015】また、温度制御部4は制御本体部22を備
え、この制御本体部22の入力側には上流側温度センサ
部5及び下流側温度センサ部6、さらに、設定温度変更
部7を介して温度設定部21を接続する。一方、制御本
体部22の出力側には冷却器12及びヒータ13を接続
する。この場合、温度設定部21は正規設定温度Tcを
設定する機能を有する。また、設定温度変更部7は、上
流側温度センサ部5から得る検出温度ti及び下流側温
度センサ部6から得る検出温度toに基づいて、正規設
定温度Tcを、設定温度Ts=Tc−(to−ti)/
2に変更する機能を有する。これにより、制御本体部2
2は、設定温度変更部7から得る設定温度Tsと温度セ
ンサ部5から得る検出温度tiに基づいて試験槽2の温
度をフィードバック制御する。
The temperature control unit 4 includes a control main unit 22. The input side of the control main unit 22 is connected to an upstream temperature sensor unit 5, a downstream temperature sensor unit 6, and a set temperature change unit 7. To connect the temperature setting unit 21. On the other hand, the cooler 12 and the heater 13 are connected to the output side of the control main unit 22. In this case, the temperature setting unit 21 has a function of setting the regular set temperature Tc. In addition, the set temperature changing unit 7 sets the regular set temperature Tc based on the detected temperature ti obtained from the upstream temperature sensor unit 5 and the detected temperature to obtained from the downstream temperature sensor unit 6, and sets the set temperature Ts = Tc− (to −ti) /
It has a function to change to 2. Thereby, the control main unit 2
2 feedback-controls the temperature of the test tank 2 based on the set temperature Ts obtained from the set temperature changing unit 7 and the detected temperature ti obtained from the temperature sensor unit 5.

【0016】次に、本実施例に係る環境試験装置1の動
作について、図1〜図4を参照して説明する。
Next, the operation of the environmental test apparatus 1 according to the present embodiment will be described with reference to FIGS.

【0017】まず、試験槽2の温度を高温環境にして高
温試験を行う場合について説明する。この場合、ヒータ
13に通電し、かつ送風機14,15を作動させる。こ
れにより、図1に点線矢印で示す熱風Aが送風路3を循
環、即ち、空調室3u,通気ダクト3t,試験槽2,通
気ダクト3sの経路で循環する。今、温度設定部21に
より正規設定温度Tcが125℃に設定され、かつ試験
槽2の温度が定常状態に制御されるとともに、送風路3
上流側の検出温度tiと送風路3下流側の検出温度to
に2℃の差があるものとする。設定温度変更部7では、
与えられた正規設定温度Tc=125℃と、検出温度t
iとtoの差、つまり、(to−ti)=2℃に基づい
て、設定温度Tsが算出される。例示の場合には、Ts
=Tc−(to−ti)/2=125−2/2=124
℃となり、このTs=124℃は制御本体部22に付与
される。
First, a case where a high-temperature test is performed by setting the temperature of the test tank 2 to a high-temperature environment will be described. In this case, power is supplied to the heater 13 and the blowers 14 and 15 are operated. Thereby, the hot air A indicated by the dotted arrow in FIG. 1 circulates in the air passage 3, that is, circulates in the air-conditioning room 3 u, the ventilation duct 3 t, the test tank 2, and the ventilation duct 3 s. Now, the temperature setting unit 21 sets the regular set temperature Tc to 125 ° C., controls the temperature of the test tank 2 to a steady state, and
The detected temperature ti on the upstream side and the detected temperature to on the downstream side of the ventilation path 3
Have a difference of 2 ° C. In the set temperature change section 7,
Given regular set temperature Tc = 125 ° C. and detected temperature t
The set temperature Ts is calculated based on the difference between i and to, that is, (to-ti) = 2 ° C. In the case of illustration, Ts
= Tc- (to-ti) / 2 = 125-2-2 = 124
° C, and this Ts = 124 ° C is given to the control main unit 22.

【0018】一方、制御本体部22は上流側温度センサ
部5から得る検出温度tiと設定温度Tsを比較し、両
者の偏差を零、即ち、上流側温度センサ部5から得る検
出温度tiが124℃になるように、ヒータ13を通電
制御する。この場合、(to−ti)=2℃であるか
ら、送風路3上流側の検出温度tiと試験槽2の内部中
央の温度差は1℃と見做すことができ、試験槽2の内部
中央の温度は124+1=125℃に制御される。これ
により、送風路3上流側の検出温度tiと送風路3下流
側の検出温度toの差が変化したとしても、常に、試験
槽2の内部中央の温度は設定温度Tsになるようにフィ
ードバック制御される。
On the other hand, the control main unit 22 compares the detected temperature ti obtained from the upstream temperature sensor unit 5 with the set temperature Ts, and eliminates the difference between them, that is, the detected temperature ti obtained from the upstream temperature sensor unit 5 becomes 124 The energization control of the heater 13 is controlled so that the temperature becomes ° C. In this case, since (to-ti) = 2 ° C., the difference between the detected temperature ti on the upstream side of the air passage 3 and the temperature in the center of the inside of the test tank 2 can be regarded as 1 ° C. The central temperature is controlled at 124 + 1 = 125 ° C. Thus, even if the difference between the detected temperature ti on the upstream side of the air passage 3 and the detected temperature to on the downstream side of the air passage 3 changes, the feedback control is performed so that the temperature at the center of the inside of the test tank 2 always becomes the set temperature Ts. Is done.

【0019】他方、高温試験が終了し、試験槽2の温度
を25℃(常温)まで低下させる場合を想定する。この
場合、制御本体部22はヒータ13の通電を停止し、冷
却器12を運転させることにより冷却を行う。これによ
り、送風路3を点線矢印で示す冷風Aが循環する。
On the other hand, it is assumed that the high temperature test is completed and the temperature of the test tank 2 is lowered to 25 ° C. (normal temperature). In this case, the control main unit 22 performs cooling by stopping the energization of the heater 13 and operating the cooler 12. Thereby, the cool air A indicated by the dotted arrow in the air passage 3 circulates.

【0020】この場合、冷却された直後の冷風Aは最初
に送風路3上流側に到達し、この後、被試験物W…によ
り加熱されて送風路3下流側に到達するため、検出温度
tiとtoの差が大きくなるとともに、図3に示すよう
に検出温度tiとtoの温度勾配の傾斜も大きくなり、
結果的に(to−ti)が大きくなる。今、(to−t
i)=Δtが20℃であるとする。この場合、設定温度
Tsは、Ts=Tc−(to−ti)/2=25−20
/2=15℃となり、制御本体部22は、設定温度Ts
=15℃を目標にして急速冷却を行う。そして、図3に
示すように、設定温度Ts=15℃に近付けば、冷却は
次第に緩やかになるとともに、これにより、(to−t
i)も小さくなるため、設定温度Tsの値も次第に正規
設定温度Tc=25℃に近付くように修正される。
In this case, the cool air A immediately after being cooled first reaches the upstream side of the air passage 3 and then is heated by the DUT W to reach the downstream side of the air passage 3, so that the detected temperature ti As the difference between to and to increases, the slope of the temperature gradient between the detected temperatures ti and to also increases, as shown in FIG.
As a result, (to-ti) increases. Now, (to-t
i) = Δt is assumed to be 20 ° C. In this case, the set temperature Ts is Ts = Tc- (to-ti) / 2 = 25-20
/ 2 = 15 ° C., and the control main unit 22 sets the set temperature Ts
= 15 ° C. for rapid cooling. Then, as shown in FIG. 3, when the set temperature Ts approaches 15 ° C., the cooling gradually becomes slower, and as a result, (to-t
Since i) also becomes smaller, the value of the set temperature Ts is also modified so as to gradually approach the normal set temperature Tc = 25 ° C.

【0021】よって、試験槽2の内部中央の温度は、図
4に示す変化曲線Tmのようになり、高温環境から低温
環境、即ち、他の異なる温度環境に速やかに移行させる
ことができる。なお、変化曲線Trは従来制御、即ち、
設定設定温度Tc=25℃を設定温度変更部7に付与す
ることなく、制御本体部22に直接付与することにより
フィードバック制御を行った場合を示す。
Therefore, the temperature at the center of the inside of the test tank 2 is as shown by a change curve Tm shown in FIG. 4, and it is possible to quickly shift from a high temperature environment to a low temperature environment, that is, another different temperature environment. Note that the change curve Tr is conventionally controlled, that is,
The case where the feedback control is performed by directly giving the set set temperature Tc = 25 ° C. to the control main body unit 22 without giving the set temperature change unit 7 is shown.

【0022】以上、実施例について詳細に説明したが、
本発明はこのような実施例に限定されるものではない。
例えば、正規設定温度Tcは低温環境から高温環境に移
行させる温度上昇時に所定温度だけ高くし、かつ高温環
境から低温環境に移行させる温度下降時に所定温度だけ
低くしてもよい。その他、細部の構成,数値,手法等に
おいて、本発明の要旨を逸脱しない範囲で任意に変更で
きる。
The embodiment has been described in detail above.
The present invention is not limited to such an embodiment.
For example, the regular set temperature Tc may be increased by a predetermined temperature when the temperature rises from a low temperature environment to a high temperature environment, and may be lowered by a predetermined temperature when the temperature falls from a high temperature environment to a low temperature environment. In addition, it is possible to arbitrarily change the detailed configuration, numerical values, method, and the like without departing from the gist of the present invention.

【0023】[0023]

【発明の効果】このように、本発明は試験槽における送
風路上流側に配設した上流側温度センサ部及び送風路下
流側に配設した下流側温度センサ部を備えるとともに、
上流側温度センサ部から得る検出温度ti及び下流側温
度センサ部から得る検出温度toに基づいて、正規設定
温度Tcを、設定温度Ts=Tc−(to−ti)/2
に変更する設定温度変更部を備えるため、精度の高い温
度制御を行うことができるとともに、他の異なる温度環
境に速やかに移行させることができるという顕著な効果
を奏する。
As described above, the present invention includes the upstream temperature sensor section disposed on the upstream side of the air passage in the test tank and the downstream temperature sensor section disposed on the downstream side of the air path in the test tank.
Based on the detected temperature ti obtained from the upstream temperature sensor section and the detected temperature to obtained from the downstream temperature sensor section, the regular set temperature Tc is set to the set temperature Ts = Tc- (to-ti) / 2.
Since the set temperature changing unit for changing the temperature is provided, it is possible to perform the temperature control with high accuracy and to bring about a remarkable effect that the temperature can be promptly shifted to another different temperature environment.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る環境試験装置の原理的正面構成
図、
FIG. 1 is a schematic front view showing the configuration of an environmental test apparatus according to the present invention;

【図2】同環境試験装置の原理的平面構成図、FIG. 2 is a schematic plan view showing the configuration of the environmental test apparatus.

【図3】同環境試験装置における検出温度の変化特性
図、
FIG. 3 is a graph showing a change characteristic of a detected temperature in the environmental test apparatus.

【図4】同環境試験装置における試験槽の内部中央の温
度の変化特性図、
FIG. 4 is a diagram showing a change characteristic of a temperature at the center of a test tank in the environmental test apparatus.

【符号の説明】[Explanation of symbols]

1 環境試験装置 2 試験槽 3 送風路 4 温度制御部 5 上流側温度センサ部 6 下流側温度センサ部 7 設定温度変更部 W 被試験物 A 冷熱風 Ts 設定温度 Tc 正規設定温度 ti 検出温度 to 検出温度 DESCRIPTION OF SYMBOLS 1 Environmental test apparatus 2 Test tank 3 Blow path 4 Temperature control unit 5 Upstream temperature sensor unit 6 Downstream temperature sensor unit 7 Set temperature change unit W DUT A Cold / hot air Ts Set temperature Tc Regular set temperature ti Detected temperature to detection temperature

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 発熱部を有する被試験物を収容可能に構
成し、かつ送風路の一部を構成する試験槽を備えるとと
もに、この試験槽に冷熱風を循環させ、かつ設定温度と
検出温度に基づいて試験槽の温度を制御する温度制御部
を備える環境試験装置において、試験槽における送風路
上流側に配設した上流側温度センサ部及び送風路下流側
に配設した下流側温度センサ部を備えるとともに、前記
上流側温度センサ部から得る検出温度ti及び前記下流
側温度センサ部から得る検出温度toに基づいて、正規
設定温度Tcを、設定温度Ts=Tc−(to−ti)
/2に変更する設定温度変更部を備えることを特徴とす
る環境試験装置。
1. A test chamber having a heat generating portion capable of accommodating a test object, and a test tank forming a part of an air passage, circulating cold and hot air through the test tank, and setting a set temperature and a detected temperature. An environmental test apparatus comprising a temperature control unit that controls the temperature of a test tank based on an upstream temperature sensor unit disposed on an upstream side of an air passage in a test tank and a downstream temperature sensor unit disposed on a downstream side of an air passage in the test tank. Based on the detected temperature ti obtained from the upstream-side temperature sensor section and the detected temperature to obtained from the downstream-side temperature sensor section, and sets the regular set temperature Tc to the set temperature Ts = Tc- (to-ti).
An environmental test apparatus, comprising: a set temperature changing unit for changing the temperature to / 2.
【請求項2】 前記正規設定温度Tcは温度上昇時に所
定温度だけ高くし、かつ温度下降時に所定温度だけ低く
することを特徴とする請求項1記載の環境試験装置。
2. The environmental test apparatus according to claim 1, wherein the normal set temperature Tc is increased by a predetermined temperature when the temperature rises, and lowered by a predetermined temperature when the temperature falls.
JP08157815A 1996-06-19 1996-06-19 Environmental test equipment Expired - Fee Related JP3138802B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP08157815A JP3138802B2 (en) 1996-06-19 1996-06-19 Environmental test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP08157815A JP3138802B2 (en) 1996-06-19 1996-06-19 Environmental test equipment

Publications (2)

Publication Number Publication Date
JPH102932A true JPH102932A (en) 1998-01-06
JP3138802B2 JP3138802B2 (en) 2001-02-26

Family

ID=15657910

Family Applications (1)

Application Number Title Priority Date Filing Date
JP08157815A Expired - Fee Related JP3138802B2 (en) 1996-06-19 1996-06-19 Environmental test equipment

Country Status (1)

Country Link
JP (1) JP3138802B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006336916A (en) * 2005-05-31 2006-12-14 Tokyo Electric Power Co Inc:The Effect measuring equipment for conditioning floor cooling
KR20150019102A (en) * 2013-08-12 2015-02-25 오션브릿지 주식회사 Apparatus for testing of semiconductor
KR101982518B1 (en) * 2018-10-02 2019-08-28 안병도 Apparatus for testing of semiconductor including structures that improve wind direction
CN112415230A (en) * 2020-10-20 2021-02-26 杭州长川科技股份有限公司 Temperature control test bench and temperature control test device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006336916A (en) * 2005-05-31 2006-12-14 Tokyo Electric Power Co Inc:The Effect measuring equipment for conditioning floor cooling
KR20150019102A (en) * 2013-08-12 2015-02-25 오션브릿지 주식회사 Apparatus for testing of semiconductor
KR101982518B1 (en) * 2018-10-02 2019-08-28 안병도 Apparatus for testing of semiconductor including structures that improve wind direction
CN112415230A (en) * 2020-10-20 2021-02-26 杭州长川科技股份有限公司 Temperature control test bench and temperature control test device

Also Published As

Publication number Publication date
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