JPH10284584A - Method for packing wafer product case - Google Patents

Method for packing wafer product case

Info

Publication number
JPH10284584A
JPH10284584A JP10251597A JP10251597A JPH10284584A JP H10284584 A JPH10284584 A JP H10284584A JP 10251597 A JP10251597 A JP 10251597A JP 10251597 A JP10251597 A JP 10251597A JP H10284584 A JPH10284584 A JP H10284584A
Authority
JP
Japan
Prior art keywords
bag
welded
atm
packaging
packing bags
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10251597A
Other languages
Japanese (ja)
Inventor
Chikayuki Takashima
親行 高嶋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Sitix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Sitix Corp filed Critical Sumitomo Sitix Corp
Priority to JP10251597A priority Critical patent/JPH10284584A/en
Publication of JPH10284584A publication Critical patent/JPH10284584A/en
Pending legal-status Critical Current

Links

Landscapes

  • Packages (AREA)
  • Packaging Frangible Articles (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PROBLEM TO BE SOLVED: To maintain silicon wafers at the same cleanliness as that when the wafers are manufactured without causing pinholes in the welded sections of resin-made packing bags at the time of transporting wafer product cases by specifying the atmospheric pressures in the packing bags. SOLUTION: The atmospheric pressures in packing bags are adjusted within a range of 0.90-0.99 atm, preferably, 0.95-0.99 atm. Various kinds of resins can be used for the packing bags, but an aluminum-coated polyester which is coated with aluminum so as to prevent moisture from getting in polyester that discharges a little amount of material, can resist friction, and can be welded is preferable. After one bag containing product cases is set on a sealer machine and the inside of the bag is deaerated with a pump, the mouth of the bag is welded. Therefore, silicon wafers can be transported in clean states even when the bag is transported by air, because no pinhole occurs in the welded section and the fluctuation of humidity with time can be suppressed.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、半導体材料とし
て利用されるシリコンウェーハを所要の製品ケースに収
納して搬送に供する際の包装方法に係り、包装袋内の気
圧を僅かな減圧、すなわち脱気処理状態となして、袋の
溶着部に発生するピンホールを防止し、シリコンウェー
ハの大気汚染等を防止したウェーハ製品ケースの包装方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a packaging method when a silicon wafer used as a semiconductor material is stored in a required product case and transported, and the pressure inside the packaging bag is slightly reduced, that is, the pressure is reduced. The present invention relates to a method of packaging a wafer product case in which a pinhole generated in a welded portion of a bag is prevented in an air-treated state, thereby preventing air pollution and the like of a silicon wafer.

【0002】[0002]

【従来の技術】半導体材料として利用されるシリコンウ
ェーハは、今日の半導体デバイスの高密度化の要求に応
じて、ますます高精度化と高清浄化が強く要求されるた
め、製品として出荷後、需要家先で半導体デバイスプロ
セスに投入されるまでの搬送、保管中に汚染されること
のないように取り扱われる。
2. Description of the Related Art Silicon wafers used as semiconductor materials are required to have higher precision and higher cleanliness in accordance with today's demand for higher density of semiconductor devices. It is handled so that it will not be contaminated during transportation and storage until it is put into the semiconductor device process at home.

【0003】すなわち、シリコンウェーハはクラス1の
クリーンルームで製作しているため、輸送、保管に供す
る際はこのクリーン度を保持する必要があり、このクリ
ーン度を保つ手段として、シリコンウェーハを製品ケー
ス内に収納してパッキンを有する蓋を閉め、これを樹脂
製袋に入れて溶着にて密封する包装方法が採用されてい
る。
[0003] That is, since silicon wafers are manufactured in a class 1 clean room, it is necessary to maintain this degree of cleanness when transporting and storing them. A packing method is adopted in which a lid having a packing is housed, the lid is closed, and this is put in a resin bag and sealed by welding.

【0004】[0004]

【発明が解決しようとする課題】ウェーハ製品ケースは
樹脂製袋にて密封包装された後に、陸送、船便、空輸等
の形態で輸送され、製品ケース内の不活性ガスは蓋と本
体とがパッキンを介して密閉されるが、樹脂製袋内の雰
囲気と入れ換わり得るもので、特に、空輸を経た場合に
包装袋の溶着部にピンホールを生じることが多く、ピン
ホールが発生すると大気(外気)と直接製品ケースが接
してしまうためにシリコンウェーハに大気による汚染を
発生させることになり、輸送に際しての大きな問題とな
っていた。
After the wafer product case is hermetically sealed and packed in a resin bag, it is transported by land transportation, sea transportation, air transportation, or the like. Although it is sealed through a plastic bag, it can replace the atmosphere inside the resin bag. In particular, pinholes often occur at the welded part of the packaging bag after air transportation. ) And the product case are in direct contact with each other, causing atmospheric contamination of the silicon wafer, which has been a major problem in transportation.

【0005】発明者は、ウェーハ製品ケースの樹脂製袋
にピンホールが発生する原因を追求した結果、空輸の場
合、陸上では大気圧である1atmの状態であるが、飛
行中は0.8atmまで減圧されることになり、この
時、包装袋の状態は大気中では変化はないものの、空輸
中では気圧の変化、すなわち袋内は1atm、空中では
0.8atmとなることにより、包装袋は膨張し、この
袋の伸縮に耐えきれずに、袋の一番弱い部分である袋両
端の溶着部からピンホールが発生し、これに起因して破
れを生じていることを知見した。
[0005] The inventor pursued the cause of the occurrence of pinholes in the resin bag of the wafer product case. As a result, in the case of air transportation, the air pressure was 1 atm, which is the atmospheric pressure on land, but was reduced to 0.8 atm during flight. At this time, the state of the packaging bag does not change in the atmosphere, but the pressure changes during air transportation, that is, 1 atm in the bag and 0.8 atm in the air, so that the packaging bag expands. However, it was found that a pinhole was generated from the welded portion at both ends of the bag, which is the weakest portion of the bag, and the bag was torn due to this, without being able to withstand the expansion and contraction of the bag.

【0006】この発明は、ウェーハ製品ケースの輸送に
際して、該ケースの包装に用いられる樹脂製包装袋の溶
着部に発生するピンホールを生じることなく、シリコン
ウェーハの製造時のクリーン度を保持できるウェーハ製
品ケースの包装方法の提供を目的としている。
According to the present invention, there is provided a wafer product case capable of maintaining a clean degree during the production of a silicon wafer without producing pinholes in a welded portion of a resin packaging bag used for packaging the case when transporting the wafer product case. It aims to provide a packaging method for product cases.

【0007】[0007]

【課題を解決するための手段】発明者は、シリコンウェ
ーハの製造時のクリーン度を保持できるウェーハ製品ケ
ースの包装方法について検討し、従来より、減圧密封包
装することは公知(特開平4−128139号、特開平
6−92386号)で、種々の包装形態に利用されてお
り、減圧処理することにより空輸中に発生するピンホー
ルは確実に抑制できるが、製品ケースに問題が生じるこ
とに着目し、さらに種々検討したところ、空輸中の外気
圧と同様に減圧するのではなく、包装袋内を脱気処理し
て空輸中に包装袋はある程度膨張する程度にしておくこ
とにより、製品ケースが変形したり、開かなくなったり
することなく、包装袋の溶着部に発生するピンホールを
確実に防止できることを知見し、この発明を完成した。
The inventor has studied a packaging method of a wafer product case which can maintain a clean degree at the time of manufacturing a silicon wafer, and it has been known that vacuum packaging is conventionally performed (Japanese Patent Laid-Open No. 4-128139). No., JP-A-6-92386), which is used in various packaging forms, and can reduce pinholes generated during air transportation by performing decompression treatment. In addition, after various investigations, the product case was deformed by degassing the inside of the packaging bag and expanding the packaging bag to some extent during air transportation, instead of reducing the pressure in the same way as the outside air pressure during air transportation. The present inventors have found that pinholes generated in the welded portion of the packaging bag can be reliably prevented without being caught or opened.

【0008】すなわち、この発明は、輸送、保管に供す
るため、シリコンウェーハを収納して蓋を閉めた製品ケ
ースを樹脂製袋に入れて密封する包装方法において、包
装袋内の気圧が0.90atm〜0.99atmである
ことを特徴とするウェーハ製品ケースの包装方法であ
る。
That is, according to the present invention, in a packaging method in which a product case in which a silicon wafer is stored and a lid is closed is sealed in a resin bag for transportation and storage, the pressure in the packaging bag is 0.90 atm. 0.90.99 atm.

【0009】[0009]

【発明の実施の形態】この発明において、包装袋の溶着
部にピンホールを発生させないためには、少なくとも包
装袋内の気圧を0.99atm以下に脱気処理する必要
があるが、0.90atm未満に減圧すると耐ピンホー
ル性はよくなるものの、製品ケースにはパッキン材を使
用するために気密性があり、かかる減圧にてケースが開
かなくなったり、ケースの肉厚が薄い場合にはケースが
変形するため、包装袋内の気圧は0.90atm〜0.
99atmの範囲とする。更に好ましくは、0.95a
tm〜0.99atmの範囲である。なお、気圧は地上
標準スタンダードにおける測定値である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS In the present invention, in order to prevent pinholes from being generated at the welded portion of the packaging bag, it is necessary to deaerate the pressure in the packaging bag to at least 0.99 atm. Although the pinhole resistance is improved when the pressure is reduced below, the product case is airtight because the packing material is used, and the case cannot be opened due to such reduced pressure, or the case is deformed when the case thickness is thin. Therefore, the air pressure in the packaging bag is 0.90 atm to 0.
The range is 99 atm. More preferably, 0.95a
tm to 0.99 atm. The barometric pressure is a value measured by the ground standard standard.

【0010】この発明において、包装袋の脱気処理方法
としては、市販の脱気シーラー機による処理が可能であ
り、製品ケースを包装袋に詰めシーラー機にセットし、
ポンプによる包装袋内の脱気を完了後に、包装袋口を溶
着することで包装袋内の気圧を0.90atm〜0.9
9atmとすることができる。
In the present invention, as a method for degassing the packaging bag, a commercially available degassing sealer can be used. The product case is packed in a packaging bag and set in the sealer.
After completing the deaeration of the inside of the packaging bag by the pump, the pressure inside the packaging bag is adjusted to 0.90 atm to 0.9 by welding the mouth of the packaging bag.
9 atm.

【0011】この発明において、包装袋には種々の樹脂
製袋が採用でき、特に限定しないが、樹脂からの物質放
出が少なく、摩擦に強く、溶着が可能なポリエステル
に、湿気の進入防止のためにアルミニウムをコーティン
グしたポリエステル袋が好ましい。
In the present invention, various resin bags can be used for the packaging bag, and there is no particular limitation. However, it is possible to prevent moisture from penetrating into the polyester, which emits little substance from the resin, is resistant to friction, and can be welded. Polyester bags coated with aluminum are preferred.

【0012】[0012]

【実施例】【Example】

実施例1 包装袋にアルミニウムをコーティングしたポリエステル
袋を用いて、製品ケースを入れた後に袋口部を溶着する
通常の包装方法と、0.95atmに脱気した後に袋口
部を溶着するこの発明による包装方法とを実施し、減圧
室にて大気圧から0.8atmに減圧3時間保持した
後、再度大気圧に戻す試験を行い、包装の破れを目視並
びに浸透液を用いて確認したところ、通常方法の場合は
約半数が溶着部にピンホールを生じていたが、この発明
による包装の場合は皆無であった。
Example 1 A normal packaging method in which a product case is put in and then a bag mouth is welded using a polyester bag in which aluminum is coated on a packaging bag, and a bag mouth is welded after degassing to 0.95 atm. After carrying out a packaging method according to and holding the pressure from the atmospheric pressure to 0.8 atm in the decompression chamber for 3 hours, a test to return to the atmospheric pressure was again performed, and the tearing of the packaging was confirmed visually and by using a permeate. In the case of the normal method, about half the pinholes were formed in the welded portions, but in the case of the package according to the present invention, there was no such hole.

【0013】実施例2 実施例1の包装方法を実施したのち、日本より米国へ航
空機を利用した輸送を行い、経時的に包装袋内の湿度変
化を測定し、輸送後にシリコンウェーハ表面のイオンレ
ベルをイオンクロマト法にて確認したところ、通常包装
は外気の湿度変化に対応した細かく大きな変動が見ら
れ、溶着部にピンホールを生じたと見られる包装では、
NO2 -、SO4 2-、NO3 -の各イオンの増加が一ケタ以
上と顕著であったが、この発明の包装では比較的緩やか
で小さな変動しか見られず、イオンレベルには全く変動
が見られなかった。
Example 2 After the packaging method of Example 1 was carried out, transportation by air from Japan to the United States was performed, and the change in humidity in the packaging bag was measured over time. When confirmed by ion chromatography, the normal packaging showed fine and large fluctuations corresponding to changes in the humidity of the outside air, and in the packaging where a pinhole appeared at the welded part,
Although the increase of each of NO 2 , SO 4 2− , and NO 3 ions was remarkable at one digit or more, the packaging of the present invention showed a relatively slow and small change, and the ion level did not change at all. Was not seen.

【0014】[0014]

【発明の効果】この発明による包装方法は、包装袋内を
脱気処理した状態で溶着密封するため、航空機を利用し
た輸送においても溶着部にピンホールを発生させること
なく、経時的な湿度変化も抑制でき、シリコンウェーハ
を製造時のクリーンな状態で輸送することが可能になっ
た。
According to the packaging method of the present invention, since the inside of the packaging bag is welded and sealed in a degassed state, even during transportation using an aircraft, pinholes are not generated in the welded portion, and the humidity changes with time. And the silicon wafer can be transported in a clean state at the time of manufacturing.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 輸送、保管に供するため、シリコンウェ
ーハを収納して蓋を閉めた製品ケースを樹脂製袋に入れ
て密封する包装方法において、包装袋内の気圧が0.9
0atm〜0.99atmであることを特徴とするウェ
ーハ製品ケースの包装方法。
1. A packaging method in which a product case in which a silicon wafer is stored and a lid is closed is sealed in a resin bag for transportation and storage, wherein the pressure in the packaging bag is 0.9.
A method of packaging a wafer product case, wherein the method is 0 atm to 0.99 atm.
【請求項2】 請求項1において、樹脂製袋がアルミニ
ウムをコーティングしたポリエステル袋であるウェーハ
製品ケースの包装方法。
2. The method of packaging a wafer product case according to claim 1, wherein the resin bag is a polyester bag coated with aluminum.
JP10251597A 1997-04-04 1997-04-04 Method for packing wafer product case Pending JPH10284584A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10251597A JPH10284584A (en) 1997-04-04 1997-04-04 Method for packing wafer product case

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10251597A JPH10284584A (en) 1997-04-04 1997-04-04 Method for packing wafer product case

Publications (1)

Publication Number Publication Date
JPH10284584A true JPH10284584A (en) 1998-10-23

Family

ID=14329505

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10251597A Pending JPH10284584A (en) 1997-04-04 1997-04-04 Method for packing wafer product case

Country Status (1)

Country Link
JP (1) JPH10284584A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8381493B2 (en) 2008-04-02 2013-02-26 Sumitomo Electric Industries, Ltd. Method of packaging compound semiconductor substrates

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8381493B2 (en) 2008-04-02 2013-02-26 Sumitomo Electric Industries, Ltd. Method of packaging compound semiconductor substrates

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