JPH10275926A - Photovoltaic device and module - Google Patents
Photovoltaic device and moduleInfo
- Publication number
- JPH10275926A JPH10275926A JP9095277A JP9527797A JPH10275926A JP H10275926 A JPH10275926 A JP H10275926A JP 9095277 A JP9095277 A JP 9095277A JP 9527797 A JP9527797 A JP 9527797A JP H10275926 A JPH10275926 A JP H10275926A
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- Japan
- Prior art keywords
- transparent conductive
- electrode
- conductive film
- semiconductor layer
- semiconductor
- Prior art date
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Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
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Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体接合として
結晶系シリコンと非晶質シリコンとの接合を備えた光起
電力装置及びその装置から構成されたモジュールに関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photovoltaic device provided with a junction of crystalline silicon and amorphous silicon as a semiconductor junction, and a module comprising the device.
【0002】[0002]
【従来の技術】従来、単結晶シリコン或いは多結晶シリ
コン等の結晶系シリコン半導体と、非晶質シリコンに代
表される非晶質半導体との半導体接合を備えた光起電力
装置として、例えば、特開平4−130671号公報
(H01L 31/04)に記載されているHIT構造
の光起電力装置が知られている。2. Description of the Related Art Conventionally, as a photovoltaic device having a semiconductor junction of a crystalline silicon semiconductor such as single crystal silicon or polycrystalline silicon and an amorphous semiconductor represented by amorphous silicon, for example, A photovoltaic device having a HIT structure described in Japanese Unexamined Patent Publication No. 4-130671 (H01L 31/04) is known.
【0003】このHIT構造の光起電力装置において
は、互いに逆導電型の関係を有する単結晶半導体と非晶
質半導体との間に、真性の非晶質半導体層を介在させる
ことで、その光起電力特性を大幅に向上させている。In this photovoltaic device having the HIT structure, an intrinsic amorphous semiconductor layer is interposed between a single crystal semiconductor and an amorphous semiconductor having a relationship of opposite conductivity type to each other, so that the The electromotive force characteristics are greatly improved.
【0004】ところで、かかる結晶系シリコンを用いた
光起電力装置にあっては、材料費の節減のため、結晶系
シリコン基板の厚さを150μm程度にまで薄膜化する
ことが検討されている。Meanwhile, in such a photovoltaic device using crystalline silicon, it has been studied to reduce the thickness of the crystalline silicon substrate to about 150 μm in order to reduce material costs.
【0005】しかしながら、光入射側電極として透明導
電膜/受光面電極構造を用い、裏面側電極として金属膜
/集電極構造を用いた従来の光起電力装置にあっては、
基板の薄膜化に伴い、前記透明導電膜と金属膜との熱膨
張係数の差に起因するストレスの影響が増大し、基板に
反りが生じるという課題がある。そして、かかる課題を
解決するために、裏面側電極も透明導電膜/集電極構造
にすることが検討されている。However, in a conventional photovoltaic device using a transparent conductive film / light receiving surface electrode structure as a light incident side electrode and a metal film / collector electrode structure as a back side electrode,
As the thickness of the substrate is reduced, the effect of stress caused by the difference in the coefficient of thermal expansion between the transparent conductive film and the metal film increases, and the substrate is warped. In order to solve such a problem, studies have been made to make the rear electrode also have a transparent conductive film / collector electrode structure.
【0006】従来のこの種光起電力装置につき、断面図
の図3を参照して説明する。同図において、1はn型の
単結晶シリコンの半導体からなる基板、2,3は真性の
非晶質シリコンからなるi型層及びp型非晶質シリコン
からなるp型層であり、基板1の光入射側、即ち表面に
順次積層されている。4はi型層2及びp型層3からな
る表面半導体層、5は酸化スズ(SnO2 ),酸化イン
ジウム(In2 O3 )又はIn2 O3 にSnを添加した
ITOの表面透明導電膜であり、p型層3上に形成され
ている。6はAgからなる線状の受光面電極であり、表
面透明導電膜5上に形成されている。A conventional photovoltaic device of this type will be described with reference to FIG. In FIG. 1, reference numeral 1 denotes a substrate made of an n-type single crystal silicon semiconductor, and reference numerals 2 and 3 denote an i-type layer made of intrinsic amorphous silicon and a p-type layer made of p-type amorphous silicon. Are sequentially laminated on the light incident side, that is, the surface. 4 is a surface semiconductor layer composed of an i-type layer 2 and a p-type layer 3 and 5 is a surface transparent conductive film of ITO in which Sn is added to tin oxide (SnO 2 ), indium oxide (In 2 O 3 ) or In 2 O 3. And is formed on the p-type layer 3. Reference numeral 6 denotes a linear light-receiving surface electrode made of Ag, which is formed on the surface transparent conductive film 5.
【0007】そして、基板1の光入射側とは反対側、即
ち裏面に、i型層2及びn型非晶質シリコンからなるn
型層7が積層された裏面半導体層8が形成され、その裏
面半導体層8上に裏面透明導電膜9が形成され、裏面透
明導電膜9上にAgからなる線状の集電極10が形成さ
れている。On the opposite side of the substrate 1 from the light incident side, that is, on the back surface, an n-type layer 2 and an n-type amorphous silicon
A backside semiconductor layer 8 on which a mold layer 7 is laminated is formed, a backside transparent conductive film 9 is formed on the backside semiconductor layer 8, and a linear collector electrode 10 made of Ag is formed on the backside transparent conductive film 9. ing.
【0008】[0008]
【発明が解決しようとする課題】従来の前記装置の場
合、金属が酸化することにより、表面透明導電膜5,受
光面電極6間及び裏面透明導電膜9,集電極10間の密
着性が低下し、両電極6,10が剥離して信頼性が低下
するという問題点がある。In the case of the conventional device, the metal is oxidized, so that the adhesion between the front transparent conductive film 5 and the light receiving surface electrode 6 and between the rear transparent conductive film 9 and the collector electrode 10 is reduced. However, there is a problem that the two electrodes 6 and 10 are peeled off and the reliability is reduced.
【0009】本発明は、前記の点に留意し、透明導電膜
と電極との密着性を向上し、電極の剥離を防止して信頼
性を向上できる光起電力装置及びモジュールを提供する
ことを目的とする。The present invention has been made in view of the above points, and has as its object to provide a photovoltaic device and a module capable of improving adhesion between a transparent conductive film and an electrode, preventing separation of the electrode and improving reliability. Aim.
【0010】[0010]
【課題を解決するための手段】前記課題を解決するため
に、本発明の請求項1記載の光起電力装置は、半導体の
光入射側とは反対側の裏面半導体層に裏面透明導電膜を
形成し、前記裏面半導体層と前記裏面透明導電膜との界
面に金属からなる集電極を部分的に介在したものであ
る。According to a first aspect of the present invention, there is provided a photovoltaic device comprising a back transparent semiconductor film on a back semiconductor layer opposite to a light incident side of a semiconductor. And a collector electrode made of metal is partially interposed at the interface between the backside semiconductor layer and the backside transparent conductive film.
【0011】したがって、電極が半導体層に直接接し、
電極と半導体層との界面に極薄い合金層が形成され、こ
の合金層により電極と半導体層との密着性が向上し、電
極の剥離を防止することができ、信頼性を向上すること
ができる。Therefore, the electrode is in direct contact with the semiconductor layer,
An extremely thin alloy layer is formed at the interface between the electrode and the semiconductor layer, and the adhesion between the electrode and the semiconductor layer is improved by the alloy layer, the separation of the electrode can be prevented, and the reliability can be improved. .
【0012】また、本発明の請求項2記載の光起電力装
置は、半導体の光入射側の表面半導体層に金属からなる
受光面電極を、光入射側とは反対側の集電極と面対称に
形成したものである。In the photovoltaic device according to a second aspect of the present invention, the light receiving surface electrode made of metal is provided on the surface semiconductor layer on the light incident side of the semiconductor in plane symmetry with the collector electrode on the side opposite to the light incident side. It is formed in.
【0013】さらに本発明の請求項3記載の光起電力装
置は、半導体の光入射側の表面半導体層に表面透明導電
膜及び受光面電極を、光入射側とは反対側の裏面透明導
電膜及び集電極と面対称に形成したものである。According to a third aspect of the present invention, there is provided a photovoltaic device, wherein a front transparent conductive film and a light receiving surface electrode are provided on a surface semiconductor layer on a light incident side of a semiconductor, and a rear transparent conductive film on a side opposite to the light incident side. And the collector electrode is formed in plane symmetry.
【0014】したがって、半導体の両面の電極を面対称
に形成することにより、熱処理によるそりをなくすこと
ができる。Therefore, by forming the electrodes on both surfaces of the semiconductor in plane symmetry, warpage due to heat treatment can be eliminated.
【0015】また、本発明の請求項4記載のモジュール
は、請求項1,2又は3記載の光起電力装置から構成さ
れたものであり、電極の剥離がなく、信頼性の高いモジ
ュールを得ることができる。A module according to a fourth aspect of the present invention comprises the photovoltaic device according to the first, second, or third aspect, and a highly reliable module having no electrode peeling. be able to.
【0016】[0016]
【発明の実施の形態】実施の1形態につき、断面図の図
1及び製造プロセスの説明図の図2A,B,Cを参照し
て説明する。それらの図において、図3と同一符号は同
一もしくは相当するものを示し、異なる点は、つぎの通
りである。DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment will be described with reference to FIG. 1 of a sectional view and FIGS. 2A, 2B and 2C of an explanatory view of a manufacturing process. In these figures, the same reference numerals as those in FIG. 3 indicate the same or corresponding elements, and the differences are as follows.
【0017】n型の単結晶シリコンの半導体からなる基
板1の表面半導体層4のp型層3と表面透明導電膜5と
の界面に受光面電極6を介在し、裏面半導体層8のn型
層7と裏面透明導電膜9との界面に集電極10を介在
し、かつ、集電極10と受光面電極6との電極パターン
を略同一パターン,即ち面対称にし、かつ、表面透明導
電膜5及び受光面電極6と、裏面透明導電膜9及び集電
極10とを面対称、即ち基板1側に両電極6,10を配
置し、この上にそれぞれ両透明導電膜5,9を配置して
いる。A light-receiving surface electrode 6 is interposed at the interface between the p-type layer 3 of the surface semiconductor layer 4 of the substrate 1 made of an n-type single crystal silicon semiconductor and the front transparent conductive film 5, and the n-type of the back surface semiconductor layer 8 is formed. The collector electrode 10 is interposed at the interface between the layer 7 and the back transparent conductive film 9, and the electrode patterns of the collector electrode 10 and the light receiving surface electrode 6 are made substantially the same pattern, that is, plane symmetrical. The light-receiving surface electrode 6 and the back transparent conductive film 9 and the collecting electrode 10 are plane-symmetrical, that is, both electrodes 6 and 10 are arranged on the substrate 1 side, and both transparent conductive films 5 and 9 are arranged thereon. I have.
【0018】つぎに製造方法について説明する。まず、
図2Aに示すように、基板1の表面にi型層2及びp型
層3をプラズマCVD法により順次積層して表面半導体
層4を形成し、つぎに、図2Bに示すように、基板1の
裏面にi型層2及びn型層7をプラズマCVD法により
順次積層して裏面半導体層8を形成する。Next, the manufacturing method will be described. First,
As shown in FIG. 2A, an i-type layer 2 and a p-type layer 3 are sequentially laminated on the surface of the substrate 1 by a plasma CVD method to form a surface semiconductor layer 4, and then, as shown in FIG. An i-type layer 2 and an n-type layer 7 are sequentially laminated on the back surface of the substrate by a plasma CVD method to form a back surface semiconductor layer 8.
【0019】そして、図2Cに示すように、p型層3上
にペースト状の受光面電極6をスクリーン印刷法を用い
てパターン形成し、受光面電極6と同様に、n型層7上
に集電極10を形成し、所定の温度で焼成する。その
後、図1に示すように、p型層3及びn型層7上に表
面,裏面透明導電膜5,9をスパッタ法により形成す
る。Then, as shown in FIG. 2C, a paste-like light-receiving surface electrode 6 is formed on the p-type layer 3 by patterning using a screen printing method. The collector electrode 10 is formed and fired at a predetermined temperature. Thereafter, as shown in FIG. 1, front and rear transparent conductive films 5 and 9 are formed on the p-type layer 3 and the n-type layer 7 by a sputtering method.
【0020】なお、前記形態の場合、装置の裏面側は透
光性を有するため、装置単体では、特性が大きく低下す
ることになる。In the case of the above-described embodiment, since the rear surface of the device has a light-transmitting property, the characteristics of the device alone are greatly reduced.
【0021】しかし、実際にモジュールとして使用する
場合は、装置の裏面に、白色の、ポリビニルフロライド
(PVF)、ポリエチレンテレフタレート(PET)、
ポリエチレンナフタレート(PEN)等の樹脂或いは金
属からなる高反射材料を設けることにより、特性の低下
を防ぐことができる。However, when actually used as a module, white polyvinyl fluoride (PVF), polyethylene terephthalate (PET),
By providing a high-reflection material made of a resin such as polyethylene naphthalate (PEN) or a metal, it is possible to prevent deterioration in characteristics.
【0022】また、前記形態の場合、HIT構造の光起
電力装置の半導体層と透明導電膜との界面に電極を介在
させるようにしたが、他の構造の光起電力装置にも適用
することができ、信頼性の向上に有効である。In the above-described embodiment, the electrode is interposed at the interface between the semiconductor layer and the transparent conductive film of the photovoltaic device having the HIT structure. However, the present invention is applicable to a photovoltaic device having another structure. And is effective in improving reliability.
【0023】さらに、ITOからなる透明導電膜とAg
からなる電極との組み合わせを例にとって説明したが、
透明導電膜としてSnO2 ,酸化亜鉛(ZnO)、電極
として鉛(Pb),チタン(Ti)を用いた組み合わせ
であってもよい。Further, a transparent conductive film made of ITO and Ag
Although the combination with the electrode consisting of is described as an example,
A combination using SnO 2 and zinc oxide (ZnO) as the transparent conductive film and lead (Pb) and titanium (Ti) as the electrode may be used.
【0024】(実施例)つぎに実施例について説明す
る。基板の両面に形成したHIT構造の半導体層及び透
明導電膜の形成条件を表1に示す。(Embodiment) Next, an embodiment will be described. Table 1 shows the conditions for forming the HIT structure semiconductor layer and the transparent conductive film formed on both surfaces of the substrate.
【0025】[0025]
【表1】 [Table 1]
【0026】なお、透明導電膜は、電極形成後、130
℃〜250℃の温度で焼成し、表1の条件を用いて形成
した。After the formation of the electrode, the transparent conductive film is
It was fired at a temperature of from about 250C to about 250C and formed using the conditions in Table 1.
【0027】つぎに、図1及び図3の光起電力装置の熱
サイクル試験を実施し比較した。熱サイクルは、−40
℃で1時間保持した後に、2時間かけて+90℃に昇温
し、次いで+90℃で1時間保持した後に、2時間かけ
て再度−40℃に降温し、このプロセスを200回行っ
た。その結果を表2に示す。Next, a thermal cycle test of the photovoltaic devices of FIGS. 1 and 3 was performed and compared. Thermal cycle is -40
After holding at 1 ° C. for 1 hour, the temperature was raised to + 90 ° C. over 2 hours, and then held at + 90 ° C. for 1 hour, and then lowered again to −40 ° C. over 2 hours, and this process was performed 200 times. Table 2 shows the results.
【0028】[0028]
【表2】 [Table 2]
【0029】図1の装置の場合、図3の装置に比して特
性の低下が抑えられていることが明らかであり、図3の
装置の特性の低下は、主に曲線因子であり、電極の剥離
による抵抗増大が原因である。It is clear that the device of FIG. 1 suppresses the deterioration of the characteristics as compared with the device of FIG. 3, and the deterioration of the characteristics of the device of FIG. This is due to an increase in resistance due to peeling of the metal.
【0030】なお、両電極6,10の形成には通常銀ペ
ースト等の、ペースト状の樹脂に金属を混入させたもの
をp型層3或いはn型層7上に塗布し、焼成工程を経て
形成するが、この際、前記樹脂材料がp型層3或いはn
型層7中に混入するおそれがある。The electrodes 6 and 10 are usually formed by applying a paste-like resin, such as a silver paste, into which a metal is mixed, on the p-type layer 3 or the n-type layer 7, followed by a firing step. At this time, the resin material is formed on the p-type layer 3 or n
There is a possibility of being mixed into the mold layer 7.
【0031】このうちp型層3への混入した樹脂材料が
基板1との界面にまで達すると、p/n接合に悪影響を
及ぼし、光起電力特性を劣化させる場合が生じる。When the resin material mixed into the p-type layer 3 reaches the interface with the substrate 1, the p / n junction is adversely affected and the photovoltaic characteristics may be deteriorated.
【0032】したがって、特にp型層3及びi型層2の
膜厚を薄くする場合には、受光面電極6は表面透明導電
膜5上に備えても良い。Therefore, especially when the thicknesses of the p-type layer 3 and the i-type layer 2 are reduced, the light receiving surface electrode 6 may be provided on the front surface transparent conductive film 5.
【0033】[0033]
【発明の効果】本発明は、以上説明したように構成され
ているため、つぎに記載する効果を奏する。本発明の光
起電力装置は、半導体の光入射側又はそれとは反対側の
半導体層に透明導電膜を形成し、半導体層と透明導電膜
との界面に金属からなる電極を部分的に形成したため、
電極が半導体層に直接接し、電極と半導体層との界面に
極薄い合金層が形成され、この合金層により電極と半導
体層との密着性が向上し、電極の剥離を防止することが
でき、信頼性を向上することができる。Since the present invention is configured as described above, it has the following effects. In the photovoltaic device of the present invention, a transparent conductive film is formed on the semiconductor layer on the light incident side of the semiconductor or on the opposite side thereof, and an electrode made of metal is partially formed on the interface between the semiconductor layer and the transparent conductive film. ,
The electrode is in direct contact with the semiconductor layer, an extremely thin alloy layer is formed at the interface between the electrode and the semiconductor layer, and the adhesiveness between the electrode and the semiconductor layer is improved by this alloy layer, and peeling of the electrode can be prevented, Reliability can be improved.
【0034】さらに、半導体の両面の受光面電極と集電
極とを面対称に形成したため、熱処理による電極のそり
をなくすことができる。Further, since the light receiving surface electrodes and the collector electrodes on both surfaces of the semiconductor are formed in plane symmetry, the warpage of the electrodes due to the heat treatment can be eliminated.
【0035】また、前記装置を用いてモジュールを構成
することにより、信頼性を向上できるモジュールを得る
ことができる。Further, by configuring a module using the above-described device, a module having improved reliability can be obtained.
【図1】本発明の実施の1形態の断面図である。FIG. 1 is a cross-sectional view of one embodiment of the present invention.
【図2】A,B,Cは図1の製造プロセスの説明図であ
る。FIGS. 2A, 2B, and 2C are explanatory diagrams of the manufacturing process of FIG. 1;
【図3】従来例の断面図である。FIG. 3 is a sectional view of a conventional example.
4 表面半導体層 5 表面透明導電膜 6 受光面電極 8 裏面半導体層 9 裏面透明導電膜 10 集電極 Reference Signs List 4 front semiconductor layer 5 front transparent conductive film 6 light receiving surface electrode 8 back semiconductor layer 9 back transparent conductive film 10 collector electrode
Claims (4)
体層に裏面透明導電膜を形成し、 前記裏面半導体層と前記裏面透明導電膜との界面に金属
からなる集電極を部分的に介在したことを特徴とする光
起電力装置。1. A backside transparent conductive film is formed on a backside semiconductor layer opposite to a light incident side of a semiconductor, and a collector electrode made of metal is partially provided at an interface between the backside semiconductor layer and the backside transparent conductive film. A photovoltaic device characterized by being interposed.
体層に裏面透明導電膜を形成し、 前記裏面半導体層と前記裏面透明導電膜との界面に金属
からなる集電極を部分的に介在し、 かつ、前記半導体の光入射側の表面半導体層に金属から
なる受光面電極を前記集電極と面対称に形成したことを
特徴とする光起電力装置。2. A backside transparent conductive film is formed on a backside semiconductor layer opposite to a light incident side of a semiconductor, and a collector electrode made of metal is partially provided at an interface between the backside semiconductor layer and the backside transparent conductive film. A photovoltaic device, wherein a light receiving surface electrode made of a metal is formed on a surface semiconductor layer on the light incident side of the semiconductor in a plane-symmetric manner with the collector electrode.
体層に裏面透明導電膜を形成し、 前記裏面半導体層と前記裏面透明導電膜との界面に金属
からなる集電極を部分的に介在し、 かつ、前記半導体の光入射側の表面半導体層に表面透明
導電膜及び受光面電極を、前記裏面透明導電膜及び前記
集電極と面対称に形成したことを特徴とする光起電力装
置。3. A backside transparent conductive film is formed on a backside semiconductor layer opposite to a light incident side of a semiconductor, and a collector electrode made of metal is partially formed at an interface between the backside semiconductor layer and the backside transparent conductive film. A photovoltaic device interposed therebetween, wherein a front transparent conductive film and a light receiving surface electrode are formed in a surface semiconductor layer on the light incident side of the semiconductor in plane symmetry with the rear transparent conductive film and the collector electrode. .
から構成されたことを特徴とするモジュール。4. A module comprising the photovoltaic device according to claim 1, 2, or 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP09527797A JP3209700B2 (en) | 1997-03-28 | 1997-03-28 | Photovoltaic device and module |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP09527797A JP3209700B2 (en) | 1997-03-28 | 1997-03-28 | Photovoltaic device and module |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH10275926A true JPH10275926A (en) | 1998-10-13 |
JP3209700B2 JP3209700B2 (en) | 2001-09-17 |
Family
ID=14133288
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---|---|---|---|
JP09527797A Expired - Fee Related JP3209700B2 (en) | 1997-03-28 | 1997-03-28 | Photovoltaic device and module |
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JP (1) | JP3209700B2 (en) |
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US7772486B2 (en) | 2004-01-13 | 2010-08-10 | Sanyo Electric Co., Ltd. | Photovoltaic device |
JP2011181963A (en) * | 2011-06-20 | 2011-09-15 | Sanyo Electric Co Ltd | Method of manufacturing solar cell module |
WO2011115206A1 (en) * | 2010-03-19 | 2011-09-22 | 三洋電機株式会社 | Solar cell, solar cell module using solar cell, and manufacturing method for solar cell |
WO2012105148A1 (en) * | 2011-01-31 | 2012-08-09 | 三洋電機株式会社 | Photoelectric conversion element |
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US7772486B2 (en) | 2004-01-13 | 2010-08-10 | Sanyo Electric Co., Ltd. | Photovoltaic device |
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WO2012105148A1 (en) * | 2011-01-31 | 2012-08-09 | 三洋電機株式会社 | Photoelectric conversion element |
JPWO2012105148A1 (en) * | 2011-01-31 | 2014-07-03 | 三洋電機株式会社 | Photoelectric conversion element |
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JPWO2013094233A1 (en) * | 2011-12-21 | 2015-04-27 | 三菱電機株式会社 | Manufacturing method of solar cell |
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JP2015220236A (en) * | 2014-05-14 | 2015-12-07 | シャープ株式会社 | Photoelectric conversion element |
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---|---|
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