JPH10267757A - Spectrophotometer of multipurpose type - Google Patents

Abstract

PROBLEM TO BE SOLVED: To ensure an easy-to-handle and accurate measurement in using a sample lighting source by focusing an image at a specified position of an optical system in a spectrophotometer on a specified position of a sample measurement base. SOLUTION: A relay lens 35 focuses an image at a diffraction grating of a spectrophotometer 1 or at a sample position on a surface of a diaphragm 31. A troidal mirror 34 focuses the image at the diaphragm 37 on a sample S on a cryostat. A relay lens 36 effectively leads the light passing through the lens 35 to the mirror 34 by forming the image at the lens 5 on the mirror 34. The mirror 34 is adapted to be adjusted finely in its direction and to adjust an irradiation position on the sample S. Accordingly, the excellent characteristics of spectrophotometer as a single color optical source can be used not only for only the fine measurement of light absorption as well as light transmission of sample but also for the measurement of non-optical physical light irradiation effect, thereby increasing the use of the specrophotometer.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a spectrophotometer with expanded applications.

[0002]

2. Description of the Related Art The measurement of irradiating a sample with light and observing a change in physical properties thereof is one of widely used experimental techniques in the field of electronic physical physics and the like. In this experiment, it is important to examine the wavelength characteristics of the change in physical properties. Conventionally, a simple monochromatic light generator using a light source, a filter, and the like has been used for this kind of purpose. While these devices are simple, they have the problem that the monochromaticity of the irradiation light beam and the degree of freedom in wavelength control are low. On the other hand, a spectrophotometer is a device whose main purpose is to irradiate a sample with monochromatic light and to measure transmission and reflection characteristics by photometry, but use measurement means other than photometry for physical property research. In case,
If it can be used as a high-precision spectral irradiation device using the excellent monochromaticity of the measurement light and the ease of wavelength control, a more accurate light irradiation property change measurement experiment can be performed.
Conventionally, for this purpose, a method has been used in which a measurement light beam of a spectrophotometer is led out of the apparatus by an optical fiber and irradiated on a sample. This method has a large degree of freedom in the position and shape of the sample, but has limitations such as a reduction in the amount of light and a limitation on a usable wavelength range due to coupling loss and transmission loss of the optical fiber.

[0003]

In using a spectrophotometer as a sample irradiation light source in the above-mentioned measurement which is different from the original measurement method of measuring the transmitted light and reflected light of the sample by photometry, It is intended to overcome the limitations of the prior art and to enable easy-to-use and high-precision measurement.

[0004]

Means for Solving the Problems In addition to the main body of the spectrophotometer,
A sample measuring table such as a cryostat is installed at a fixed position with respect to the spectrophotometer, and a sample irradiation optical system replaceable with the sample chamber of the spectrophotometer is prepared.This optical system is used as a monochromator of the spectrophotometer. The monochromatic light emitted from the section to the sample chamber is reflected in a direction outside the optical system plane of the monochromator,
Further, it comprises means for reflecting light toward a predetermined position on the sample measuring table, and image forming means for forming an image at a predetermined position of the optical system of the spectrophotometer on the predetermined position on the sample measuring table.

[0005]

FIG. 1 shows one embodiment of the present invention. FIG. 3 shows the overall arrangement. In this example, a cryostat is used as a sample measuring table to measure various optical properties of a sample at a low temperature, for example, photoconductivity, photoelectromotive force, or a change in hardness of a photocurable substance. In FIG. 1, 1 is a spectrophotometer,
Reference numeral 2 denotes a cryostat of a sample measurement table, and reference numeral 3 denotes a sample irradiation optical system. This sample irradiating optical system is installed at the place where the sample chamber of the spectrophotometer has been removed. In this figure, the photometric portion of the spectrophotometer is cut away, and a and b are the centers of the sample light beam and the reference light beam emitted from the monochromator portion M (see FIG. 3) of the spectrophotometer. Is shown. That is, the light is emitted from the monochromator from a direction perpendicular to the plane of FIG. The light irradiating the sample on the cryostat uses the sample light out of the two light beams emitted from the monochromator. Of course, the contrast light may be used. Reference numeral 4 denotes an optical surface plate on which the spectrophotometer is mounted, on which both the spectrophotometer 1 and the sample measuring table 2 are placed. FIG. 1 illustrates the spectrophotometer excluding the photometric unit H seen in the plan view of FIG. 3, so that the sample irradiation optical system 3 placed in the sample chamber is exposed and visible.

The sample irradiating optical system 3 reflects a sample light beam a emitted from the monochromator section vertically upward with respect to the plane of the monochromator optical system, and bends the sample light reflected by this mirror in a vertical plane. Two plane mirrors 3 to be made
The toroidal concave mirror 34 reflects the sample light reflected and bent by the mirrors 32 and 33 toward the sample S through the window W of the cryostat 2. Mirror 31-3
A pair of relay lenses 35 and 36 is inserted between the mirrors 31 and 32 in the optical path to 4, and a stop 37 having a diameter of about 10 mm is arranged immediately before the relay lens 36.

The relay lens 35 forms an image of the diffraction grating of the spectrophotometer or the image of the sample position on the surface of the stop 37. The toroidal mirror 34 forms an image of the aperture 37 on the sample S on the cryostat 2. The relay lens 36 effectively guides the light passing through the lens 35 to the toroidal mirror 34 by forming an image of the relay lens 35 on the toroidal mirror 34. The direction of the toroidal mirror 34 can be finely adjusted, and the irradiation position on the sample S can be adjusted. This adjustment can be performed, for example, as follows. The monochromator of the spectrophotometer is set to the position of the wavelength 0, and the entrance / exit slit is opened to the maximum. In this case, the monochromator has a strong 0
Since the next light is emitted, the irradiation light spot on the sample surface on the sample measurement table 2 can be visually observed. Fine adjustment of the toroidal mirror may be performed by viewing this spot from the window W provided on the opposite side of the light entrance window W of the sample measuring table.

[0008] The spectrophotometer 1 and the cryostat 2 of the sample measuring table are mounted on an optical platen 4, and after adjusting the positions of the two, positioning fittings previously fitted to the three legs of the spectrophotometer 1. 5 is fixed to the optical surface plate 4 with screws. When this apparatus is used as a normal spectrophotometer, the sample chamber removed in the figure is attached to the sample irradiation optical system 3. Since the sample irradiation optical system 3 is attached to the sample chamber trace of the spectrophotometer,
The position is determined with respect to the spectrophotometer by the positioning pin 6 common to the sample chamber and fixed to the spectrophotometer by the fixing screw 7.

The sample irradiation optical system 3 is tilted L as shown in FIG.
The above-mentioned optical elements 31 to 37 are attached to the letter-shaped substrate B, and two external lights are shielded by cover members C1 and C surrounding the optical elements. Let me do it. The cover C3 can be removed and a polarizer can be installed there, and the sample can be irradiated with polarized light. The sample irradiation optical system 3 is provided with a light-shielding tube D that guides control light emitted from the monochromator to the photometric unit of the spectrophotometer. This cylinder has the same length as the width of the sample chamber of the spectrophotometer, fits between the reference light exit port of the monochromator section of the spectrophotometer and the control light entrance port of the photometer section, and external light is metered. The control light is guided to the photometric unit while preventing the light from entering the unit. With this structure, the blinking of the light source of the spectrophotometer can be detected by the output of the photometer, or the light irradiating the sample on the cryostat can be monitored by the photometer of the spectrophotometer.

In the above embodiment, the sample measuring table is a cryostat, but the sample measuring table is not limited to this. It is possible to use a sample measuring table at room temperature or a sample measuring table for performing measurement under various conditions such as applying a voltage or applying magnetism.

[0011]

As described above, the spectrophotometer can obtain high-purity monochromatic light as a monochromatic light source, and its wavelength can be varied over a wide range. According to the present invention, the excellent properties of the spectrophotometer as such a monochromatic light source is such that the light transmittance of the sample is not only a measurement of the absorbance, but also the effect of light irradiation of other non-optical properties is accurately measured. The use as a spectrophotometer device is expanded.

[Brief description of the drawings]

FIG. 1 is a side view showing an embodiment of the present invention.

FIG. 2 is a plan view and a side view of a sample irradiation optical system in the embodiment.

FIG. 3 is a plan view showing the arrangement of the entire apparatus.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Spectrophotometer 2 Sample measuring table 3 Sample irradiation optical system 4 Optical surface plate 5 Positioning bracket

Claims (1)

[Claims] 1. A spectrophotometer, comprising: a sample measuring table installed at a fixed position with respect to the spectrophotometer; and a sample irradiation optical system replaceable with a sample chamber of the spectrophotometer. Means for reflecting monochromatic light emitted from the monochromator section to the sample chamber in a direction outside the plane of the optical system of the monochromator, and further reflecting the monochromatic light toward a predetermined position on the sample measurement table, and an optical system of the spectrophotometer. A multipurpose spectrophotometer comprising: an image forming means for forming an image at a predetermined position on a predetermined position on the sample measuring table; and means for adjusting the image position.