JPH10232793A - Method and circuit device for debugging semiconductor devices - Google Patents

Abstract

PROBLEM TO BE SOLVED: To improve the reliability of debugging by monitoring a state for each function block consisting of a semiconductor device when developing software on the semiconductor device. SOLUTION: By reproducing the same sequence plural times based on a signal applied from the outside of a user logic mixed microcomputer, the same conditions are produced in the extraction of bus information due to probes 15-17. Then, the bus information of function block different everytime is extracted from each main function block 7 by a selector 18 in time dividing manner and outputted through a bus state monitor circuit 19 to an external device 21. The bus information extracted for each main function block in time dividing manner and outputted to the external device 21 is compared with an expected value or the last bus information at the external device 21, for example, so that all the bus information of main function blocks can be monitored and the software to be operated by a semiconductor device 20 such as the user logic mixed microcomputer is debugged.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device debugging method and a debugging circuit device which enable reliable debugging of a semiconductor device such as a user logic mixed microcomputer.

[0002]

2. Description of the Related Art FIG. 4 is a block diagram showing a configuration of a debug circuit device for realizing a conventional semiconductor device debug method. In the figure, reference numeral 1 denotes a microprocessing unit which is a functional block constituting the semiconductor device 7, 2 denotes a memory, 3 denotes an ASIC (Application Splicing Unit).
effective Integrated Circuit
t). Reference numeral 4 denotes a bus state monitoring circuit for monitoring bus information, which is a signal input / output to / from each of the functional blocks via the bus 6, and 5 detects the signal input / output to / from each of the functional blocks via the bus 6. This is a probe provided on a bus 6 for performing the operation. Reference numeral 7 denotes each functional block such as the microprocessing unit 1, the memory 2 and the ASIC 3, the bus state monitoring circuit 4, the probe 5, and the bus 6.
It is a semiconductor device provided with the above.

Next, the operation will be described. When developing software with a semiconductor device such as a user logic mixed microcomputer, a probe 5 for monitoring the state of each functional block and a bus state monitoring circuit 4 are added as shown in FIG. This is performed by sending debug data, which is the state of each functional block, to the outside of the user logic mixed microcomputer, and analyzing the data outside. In this case, the position where the probe 5 for monitoring each of the functional blocks is provided is not a plurality of positions but, for example, one end of the bus 6.

[0004]

Since the conventional semiconductor device debugging method and the conventional debugging circuit device are configured as described above, all the states of the respective functional blocks are externally provided by limiting the number of pins of the package of the semiconductor device. When debugging data is analyzed outside the semiconductor device because it cannot be taken out and monitored, a lot of guess parts are included,
There was a problem that accurate state monitoring was difficult.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problems, and makes it possible to monitor the state of each functional block constituting the semiconductor device when developing software on the semiconductor device. It is another object of the present invention to provide a semiconductor device debugging method and a debugging circuit device which can improve the reliability of debugging.

[0006]

According to a first aspect of the present invention, there is provided a method for debugging a semiconductor device, comprising: detecting a signal input / output in each functional block of the semiconductor device by sampling each functional block; A detection signal output step of sequentially outputting a signal for each of the functional blocks detected in the signal detection step from a predetermined output terminal to the outside of the semiconductor device; And a determination step of determining the signal output to the CPU.

According to a second aspect of the present invention, a semiconductor device debugging method monitors and detects bus information input / output to / from each functional block on a data path connected to each functional block. The bus information output to the outside is determined.

According to a third aspect of the present invention, in the semiconductor device debugging method, in the signal detecting step, signals input / output in each functional block are sampled in the same sequence based on an externally applied command. A signal input / output for each functional block is detected.

According to a fourth aspect of the present invention, there is provided a debugging method of a semiconductor device, wherein a signal input / output in each functional block is provided for each functional block at an operating speed increased according to the number of functional blocks of the semiconductor device. A signal detecting step of sampling and detecting in the same sequence, and a detecting signal outputting step of sequentially outputting the signal of each of the functional blocks detected at the increased operation speed from a predetermined output terminal to the outside of the semiconductor device And a determining step of determining in real time the signal of each of the functional blocks output in the detection signal outputting step.

According to a fifth aspect of the present invention, there is provided a debugging method for a semiconductor device, comprising: a latching step of latching a signal for each functional block sequentially output to the outside of the semiconductor device in a detection signal outputting step; And determining a signal for each of the functional blocks in real time.

According to a sixth aspect of the present invention, there is provided a debug circuit device for a semiconductor device, comprising: signal detection means for detecting a signal input / output in each functional block of the semiconductor device on each data path connected to each functional block; Detection signal output means for sequentially outputting the signal for each of the functional blocks detected by the signal detection means from a predetermined output terminal to the outside of the semiconductor device, wherein the detection signal output means outputs The signal for each functional block is determined by a determination unit provided outside the semiconductor device.

According to a seventh aspect of the present invention, a debug circuit device for a semiconductor device monitors bus information input / output in each of the functional blocks on a data path connected to each of the functional blocks, and the signal detecting means detects the bus information. Then, the determination means determines the bus information output to the outside of the semiconductor device.

According to another aspect of the present invention, a debug circuit device for a semiconductor device is provided for each data path for extracting a signal input / output in each functional block from a data path connected to each functional block. A bus information extracting unit, selecting means for selecting one of the signals extracted by the respective bus information extracting units based on external control, and extracting the bus information of the signal selected by the selecting means. A bus state monitoring circuit for controlling the extraction by the unit based on the same sequence based on an externally applied signal; and a signal detection unit, wherein the detection signal output unit is selected by the selection unit, and the bus state monitoring unit Sequentially outputting the signals extracted by the bus information extraction unit controlled by a circuit from a predetermined output terminal to the outside of the semiconductor device In which was to so that.

According to a ninth aspect of the present invention, in the debug circuit device for a semiconductor device, the signal detecting means detects a signal input / output in each functional block by an operation speed increased according to the number of functional blocks of the semiconductor device. The selected signal is sampled and detected by the same sequence for each of the functional blocks, and the signal for each of the functional blocks detected by the signal detecting means is output from a predetermined output terminal to the outside of the semiconductor device by a detection signal output means. The output is sequentially performed at an increased speed, and the determination unit determines the signal for each of the functional blocks output by the detection signal output unit in real time.

According to a tenth aspect of the present invention, in the debug circuit device for a semiconductor device, the detection signal output means includes a latch circuit for latching a signal for each functional block sequentially output to the outside of the semiconductor device, wherein the latch circuit The determination means determines the signal for each of the functional blocks latched by the determination means in real time.

A debug circuit device for a semiconductor device according to the present invention is provided for each data path for extracting bus information input / output in each function block from a data path connected to each function block. Bus information extracting unit, selecting means for selecting one of bus information input and output in each functional block extracted by each bus information extracting unit, and the bus information of the bus information selected by the selecting means The signal detection unit includes a bus state monitoring circuit that controls extraction by the extraction unit, and an operation speed control unit that operates the selection unit and the bus state monitoring circuit at an operation speed increased according to the number of the functional blocks. It is prepared for.

According to a twelfth aspect of the present invention, there is provided a debug circuit device for a semiconductor device, comprising: The bus state monitoring circuit controls the extraction of the bus information selected by the selection means and selected by the selection means by the bus information extraction unit based on an externally applied signal.

[0018]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below. Embodiment 1 FIG. FIG. 1 is a block diagram showing a configuration of a debug circuit device for realizing a semiconductor device debug method according to Embodiment 1 of the present invention. In the figure, reference numeral 11 denotes a microprocessing unit which is a functional block constituting a semiconductor device such as a microcomputer incorporating user logic, 12 denotes a memory, and 13 denotes an ASIC. 14 is a microprocessing unit 11, a memory 12, an ASI
A bus connected to C13 or the like; 14a, a data path branched from the bus 14 and connected to the microprocessing unit 11; 14b, a data path branched from the bus 14 and connected to the memory 2; ASI
This is a data path connected to C13. 15 is the data path 14
a (a signal detecting means, a bus information extracting unit) for detecting a signal input to and output from the microprocessing unit 11 via the data path, and 16 a memory configured via the data path 14b 1
A probe (signal detecting means, bus information extracting unit) 17 for detecting a signal input / output at 2; Means, bus information extraction unit). 18 is a probe 15, 16, 1
A selector (selection means, detection signal output means) for selecting a signal detected by the selector 7 based on an external control; and 19, the probe 15, 16, 17 extracts the signal selected by the selector 18. A bus state monitoring circuit (detection signal output means) for controlling the same sequence based on an externally applied signal; 20 is a microprocessing unit 11, a memory 12, and an ASIC
13, functional blocks such as 13, bus 14, probe 15,
It is a semiconductor device such as a user logic mixed microcomputer provided with 16, 17, a selector 18, a bus state monitoring circuit 19 and the like. Reference numeral 21 denotes an external device (determination means) provided outside the semiconductor device 20, and compares the bus information output from the bus state monitoring circuit 19 with, for example, an expected value or with previous bus information. Note that a reference clock signal that defines the operation of each block of the semiconductor device 20 is supplied to the selector 18 and the bus state monitoring circuit 19. Further, a reference clock signal synchronized with a reference clock signal supplied to the semiconductor device 20 is supplied to the external device 21.

Next, the operation will be described. In the debug circuit device for realizing the semiconductor device debugging method, the micro processing unit 11, the memory 12, and the data paths 14a, 14b, and 14c that connect the ASIC 13 and the bus 14, which are main functional blocks in the user logic mixed microcomputer, respectively. Bus information, which is a signal input / output to / from the microprocessing unit 11, the memory 12, and the ASIC 13 via the respective data paths, is extracted by the probes 15, 16, 17 provided.

The bus information extracted by the probes 15, 16, and 17 cannot be extracted all at once due to the limitation of the number of pins of the microcomputer package with user logic. Therefore, by reproducing the same sequence a plurality of times based on signals supplied from the outside of the user logic mixed microcomputer, the probes 15, 1
The same conditions in taking out the bus information by 6, 17 are reproduced, and the bus information of different functional blocks is
The data is extracted in a time-division manner by the selector 18 for each main functional block, and is output to the external device 21 via the bus state monitoring circuit 19. The bus information extracted in a time-division manner for each main functional block and output to the external device 21 is compared with, for example, an expected value or the previous bus information in the external device 21 to obtain the main functional block. And debugs software operating on the semiconductor device 20 such as a user logic mixed microcomputer.

FIG. 2 is a flowchart showing the operation of the debug circuit device for realizing the semiconductor device debugging method of the first embodiment described above.
The selector 18 selects one of the bus information extracted by 5, 16, and 17 based on external control (step ST1). Next, debug conditions are input from outside the semiconductor device such as the user logic mixed microcomputer (step ST2). And the selector 18
The bus information according to the debugging condition selected by the external device 21 via the bus state monitoring circuit 19
(Step ST3). Subsequently, the selector 18
Is changed (step ST4), and it is determined whether or not debugging is completed (step ST5).
If not completed, the processing from step ST1 to step ST5 for detecting bus information input / output via the data path connected to the next functional block is repeated for the next functional block. On the other hand, if the processing has been completed, the bus information output to the external device 21 is compared with, for example, an expected value, or synthesized with the previous bus information (step ST6), and the microprocessing unit 11, the memory 12, It monitors all bus information of major functional blocks such as the ASIC 13 and debugs software operating on a semiconductor device such as a user logic mixed microcomputer.

As described above, according to the first embodiment, the bus information input / output to / from each functional block is time-divisionally synchronized with the reference clock signal defining the operation of the semiconductor device 20. Because it is output to the external device 21,
A semiconductor device debugging method and a debugging method capable of monitoring and debugging all bus information of main functional blocks based on bus information of each functional block sequentially obtained for each cycle of a reference clock signal of the semiconductor device 20 There is an effect that a circuit device can be obtained.

Although the first embodiment has been described with reference to a case where the present invention is applied to a semiconductor device such as a microcomputer with embedded user logic, the present invention can also be applied to a semiconductor device which is not configured as such a microcomputer.

Embodiment 2 FIG. FIG. 3 is a block diagram showing a configuration of a debug circuit device for realizing the semiconductor device debug method according to the second embodiment of the present invention. 3, the same or corresponding parts as those in FIG. 1 are denoted by the same reference numerals, and description thereof will be omitted. In the figure, 30 is the selector 18,
An operation speed control means for operating the bus state monitoring circuit 19 at an operation speed increased according to the number of each functional block such as the microprocessing unit 11, the memory 12, and the ASIC 13, and when there are three functional blocks, In order to operate the selector 18 and the bus state monitoring circuit 19 at three times the operation speed of the semiconductor device, the period of the reference clock signal supplied to the semiconductor device 31 is 1/1/3.
The reference clock signal having three periods is supplied to the selector 18 and the bus state monitoring circuit 19. Reference numeral 32 denotes a latch circuit that latches bus information for each functional block sequentially output to the outside of the semiconductor device 31. Reference numeral 31 denotes functional blocks such as the microprocessing unit 11, the memory 12, and the ASIC 13, the bus 14, the probes 15, 16, and 1.
7, a semiconductor device such as a user logic mixed microcomputer provided with a selector 18, a bus state monitoring circuit 19, an operation speed control means 30, a latch circuit 32 and the like. Instead of providing the operating speed control means 30, a reference clock signal for setting the operating speed of the selector 18 and the bus state monitoring circuit 19 to three times the operating speed of the semiconductor device 31 is supplied from the outside to the selector 18 and the bus. It may be configured to supply to the state monitoring circuit 19. The latch circuit 32 may be provided in the external device 21.

Next, the operation will be described. Also in the second embodiment, the same sequence is reproduced a plurality of times to reproduce the same conditions in the extraction of the bus information by the probes 15, 16, and 17, and the bus information of the different functional blocks is changed every main functional block. The data is extracted in a time-division manner by the selector 18. In this case, the selector 18 and the bus state monitoring circuit 19 determine that the operating speed of the semiconductor device 31 is 3
It operates at twice the speed, and the selector 18
The bus information of each functional block extracted from 16 and 17 is all selected during one cycle of the reference clock signal supplied to the semiconductor device 31 which regulates the operation of the semiconductor device 31, and the selected bus information is the bus state. The signal is output from the monitoring circuit 19, latched by the latch circuit 32, and output to the external device 21. The bus information output to the external device 21 in this manner is monitored in the external device 21 by comparing all of the bus information of the main functional blocks, for example, by comparing with the expected value or with the previous bus information. Debugging of software operating on the semiconductor device 31 such as a user logic mixed microcomputer is performed.

Therefore, in this embodiment, the bus information input / output in each functional block is detected within one cycle of the reference clock signal defining the operation of the semiconductor device 31, and is output to the external device 21 in a time division manner. Therefore, there is an effect that a semiconductor device debugging method and a debugging circuit device that can monitor bus information of each functional block of the semiconductor device 31 in real time can be obtained.

[0027]

As described above, according to the first aspect of the present invention, a signal input / output in each functional block of the semiconductor device is sampled and detected for each functional block, and each of the detected signals is detected. Since the signal for each functional block is sequentially output from a predetermined output terminal to the outside of the semiconductor device and determined, it is possible to monitor the state of each of the functional blocks constituting the semiconductor device. ,
This has the effect of improving the reliability of debugging.

According to the second aspect of the present invention, bus information input / output in each of the function blocks is sampled in the same sequence for each of the function blocks on a data path connected to each of the function blocks of the semiconductor device. And the detected bus information for each of the functional blocks is sequentially output from a predetermined output terminal to the outside of the semiconductor device, so that the number of output pins is limited. Also in the device, it is possible to monitor the state of each functional block constituting the semiconductor device, and it is possible to improve the reliability of debugging.

According to the third aspect of the present invention, signals input / output in each functional block are sampled in the same sequence based on an externally applied command,
Since the input / output signal is detected for each functional block, the state of each functional block constituting the semiconductor device can be monitored based on the command given from the outside. This has the effect of improving reliability.

According to the fourth aspect of the present invention, a signal input / output in each functional block is sampled in the same sequence for each functional block at an operating speed increased according to the number of functional blocks of the semiconductor device. And sequentially outputs the signal of each of the functional blocks detected at the increased operation speed from a predetermined output terminal to the outside of the semiconductor device, and outputs the signal of each of the functional blocks sequentially output to the outside. Since the signal is configured to be determined in real time, the state of each functional block configuring the semiconductor device is detected within one cycle of a reference clock signal that defines the operation speed of the semiconductor device. The signal enables monitoring in real time, which has the effect of improving the reliability of debugging.

According to the fifth aspect of the present invention, a signal for each functional block sequentially output to the outside of the semiconductor device is latched, and the latched signal for each functional block is determined in real time. With this configuration, the state of each functional block constituting the semiconductor device is detected in real time by latching the signal of each functional block detected within one cycle of a reference clock signal defining the operation speed of the semiconductor device. Monitoring can be performed at a high speed, and the reliability of debugging can be improved.

According to the invention of claim 6, signal detection means for detecting signals input / output in each function block of the semiconductor device on each data path connected to each function block, and the signal detection means Detection signal output means for sequentially outputting the detected signal of each of the functional blocks from a predetermined output terminal to the outside of the semiconductor device,
Since the signal output from the detection signal output means for each of the functional blocks is determined by the determination means provided outside the semiconductor device, the signal for each of the functional blocks constituting the semiconductor device is determined. It is possible to monitor the state, which has the effect of improving the reliability of debugging.

According to the seventh aspect of the present invention, the bus information input / output in each of the functional blocks via the data path connected to each of the functional blocks of the semiconductor device is transmitted to each of the functional blocks connected to each of the functional blocks. Signal detection means for detecting on a data path, and detection signal output means for sequentially outputting the bus information of each of the functional blocks detected by the signal detection means from a predetermined output terminal to the outside of the semiconductor device, Since the bus information for each of the functional blocks output by the detection signal output unit is determined by a determination unit provided outside the semiconductor device, the bus information detected on each of the data paths is determined by the bus information. It is possible to monitor the state of each of the functional blocks constituting the semiconductor device, and it is possible to improve the reliability of debugging.

According to the eighth aspect of the present invention, a bus information extraction unit provided for each data path for extracting a signal input / output in each function block from a data path connected to each function block, Selecting means for selecting any of the signals extracted by each of the bus information extracting sections based on external control; and extracting the signals selected by the selecting means by the bus information extracting section to an external device. And a bus state monitoring circuit that controls in the same sequence based on the signal given from the signal detection means, and the detection signal output means is selected by the selection means and controlled by the bus state monitoring circuit. Since the signals extracted by the bus information extraction unit are sequentially output from a predetermined output terminal to the outside of the semiconductor device, each of the data The detected signal data path it is possible to monitor the state of the respective functional blocks included in the semiconductor device, there is an effect capable of improving the debugging reliability.

According to the ninth aspect of the present invention, the signal detecting means selects a signal to be input / output in each functional block and operates at each of the functional blocks according to the operation speed increased according to the number of functional blocks of the semiconductor device. The same signal is sampled and detected by the same sequence every time, and the signal for each of the functional blocks detected by the signal detection means is output from a predetermined output terminal to the outside of the semiconductor device by the detection signal output means at the increased operation speed. Since the determination unit is configured to sequentially output and output the signal for each of the functional blocks output by the detection signal output unit in real time,
The state of each functional block constituting the semiconductor device is represented by one of the reference clock signals defining the operation speed of the semiconductor device.
Monitoring can be performed in real time by the signal of each of the functional blocks detected within a cycle, and there is an effect that reliability of debugging can be improved.

According to the tenth aspect of the present invention, the detection signal output means includes a latch circuit for latching a signal for each functional block sequentially output to the outside of the semiconductor device, and each of the functions latched by the latch circuit is provided. Since the determination means is configured to determine the signal for each block in real time,
The state of each functional block constituting the semiconductor device is represented by one of the reference clock signals defining the operation speed of the semiconductor device.
By latching the signal for each of the functional blocks detected within a cycle by the latch circuit, monitoring can be performed in real time, and the effect of improving the reliability of debugging can be obtained.

According to the eleventh aspect of the present invention, a bus information extracting unit provided for each data path for extracting bus information input / output in each functional block from a data path connected to each functional block, Selecting means for selecting any one of the bus information input and output in each functional block extracted by each bus information extracting unit, and controlling extraction of the bus information selected by the selecting means by the bus information extracting unit. The signal detection unit is configured to include a bus state monitoring circuit that operates, and an operation speed control unit that operates the selection unit and the bus state monitoring circuit at an operation speed increased according to the number of the functional blocks. A state of each of the functional blocks constituting the semiconductor device within one cycle of a reference clock signal defining an operation speed of the semiconductor device. It is possible to monitor in real time to detect the said bus information of each function block,
This has the effect of improving the reliability of debugging.

According to the twelfth aspect of the present invention, the selection means selects one of the bus information input and output in each functional block extracted by each bus information extraction unit based on external control. Since the bus state monitoring circuit controls the extraction of the bus information selected by the selection means by the bus information extraction unit based on an externally applied signal, each of the functional blocks constituting the semiconductor device is The state can be monitored based on the external control, and the effect of improving the reliability of debugging can be obtained.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a debug circuit device for realizing a semiconductor device debug method according to a first embodiment of the present invention;

FIG. 2 is a flowchart showing an operation of the debug circuit device for realizing the semiconductor device debug method according to the first embodiment of the present invention;

FIG. 3 is a block diagram showing a configuration of a debug circuit device for realizing a semiconductor device debug method according to a second embodiment of the present invention;

FIG. 4 is a block diagram illustrating a configuration of a debug circuit device that implements a conventional semiconductor device debug method.

[Explanation of symbols]

14a, 41b, 14c Data path, 15, 16, 17
Probe (signal detection means, bus information extraction unit), 18
Selector (selection means, detection signal output means), 19 bus state monitoring circuit (detection signal output means), 21 external device (determination means), 20, 31 semiconductor device, 30 operation speed control means, 32 latch circuit.

Claims (12)

[Claims] A signal detection step of sampling and detecting a signal input / output in each functional block of the semiconductor device for each of the functional blocks, and a signal for each of the functional blocks detected in the signal detecting step. A method for debugging a semiconductor device, comprising: a detection signal output step of sequentially outputting a predetermined output terminal to the outside of the semiconductor device; and a determination step of determining a signal output to the outside of the semiconductor device by the detection signal output step. 2. The signal input / output in each functional block of the semiconductor device is bus information input / output in each functional block on a data path connected to each functional block. Item 2. The method for debugging a semiconductor device according to Item 1. 3. The signal detecting step includes sampling signals input / output in each functional block in the same sequence based on a command given from the outside, and detecting signals input / output in each functional block. 3. The method for debugging a semiconductor device according to claim 1, wherein: 4. The signal detection step detects a signal input / output in each functional block by sampling the same sequence for each functional block according to an operation speed increased according to the number of functional blocks of the semiconductor device. A detecting signal output step of sequentially outputting the signals for each of the functional blocks detected at the increased operating speed from a predetermined output terminal to the outside of the semiconductor device; and a determining step includes the detecting signal outputting step. 4. The debugging method for a semiconductor device according to claim 1, wherein the signal for each of the functional blocks output by the method is determined in real time. 5. A latching step of latching a signal for each functional block sequentially output to the outside of the semiconductor device by a detection signal outputting step, wherein the determining step includes the step of latching each of the functional blocks latched in the latching step. 5. The method according to claim 4, wherein the signal is determined in real time. 6. A signal detecting means for detecting a signal input / output in each functional block of the semiconductor device on each data path connected to each functional block, and for each of the functional blocks detected by the signal detecting means. Detecting signal output means for sequentially outputting the signal from a predetermined output terminal to the outside of the semiconductor device, and outputting the signal for each of the functional blocks output by the detection signal output means to the outside of the semiconductor device. A debug circuit device for a semiconductor device, which is determined by a determination unit provided in the semiconductor device. 7. A signal input / output in each functional block of the semiconductor device is bus information input / output in each functional block via a data path connected to each functional block. The debug circuit device for a semiconductor device according to claim 6. 8. A bus information extractor provided for each data path for extracting a signal input / output in each function block from a data path connected to each function block, the signal detection means; Selecting means for selecting any of the signals extracted by the information extracting section based on external control; and extracting the signal selected by the selecting means by the bus information extracting section from the outside. A bus state monitoring circuit that controls the signals in the same sequence on the basis of a signal, and a detection signal output unit is selected by the selection unit and extracted by the bus information extraction unit controlled by the bus state monitoring circuit. 8. The semiconductor according to claim 6, wherein the signal is sequentially output from a predetermined output terminal to the outside of the semiconductor device. Location of the debugging circuit device. 9. The signal detecting means selects a signal input / output in each functional block according to an operation speed increased according to the number of functional blocks of the semiconductor device, and performs sampling in the same sequence for each functional block. The detection signal output means sequentially outputs the signal for each of the functional blocks detected by the signal detection means from a predetermined output terminal to the outside of the semiconductor device at the increased speed, and the determination means 8. The debug circuit device for a semiconductor device according to claim 6, wherein a signal for each of said functional blocks output by said detection signal output means is determined in real time. 10. The detection signal output means includes a latch circuit for latching a signal for each function block sequentially output to the outside of the semiconductor device, and the determination means includes a latch circuit for each of the function blocks latched by the latch circuit. 10. The debug circuit device for a semiconductor device according to claim 9, wherein the signal is determined in real time. 11. A bus information extraction unit provided for each data path for extracting bus information input / output in each function block from a data path connected to each function block, the signal detection unit comprising: Selecting means for selecting any one of the bus information input and output in each functional block extracted by the bus information extracting unit; and a bus state for controlling extraction of the bus information selected by the selecting means by the bus information extracting unit. 10. A monitoring circuit, comprising: an operating speed control unit that operates the selecting unit and the bus state monitoring circuit at an operating speed increased according to the number of the functional blocks. Item 11. A debug circuit device for a semiconductor device according to item 10. 12. The selecting means selects one of bus information input / output in each functional block extracted by each bus information extracting unit based on external control. 2. The method according to claim 1, wherein the extraction of the bus information selected by the selection means by the bus information extraction unit is controlled based on an externally applied signal.
2. A debug circuit device for a semiconductor device according to claim 1.