JPH10216092A5 - - Google Patents
Info
- Publication number
- JPH10216092A5 JPH10216092A5 JP1997042940A JP4294097A JPH10216092A5 JP H10216092 A5 JPH10216092 A5 JP H10216092A5 JP 1997042940 A JP1997042940 A JP 1997042940A JP 4294097 A JP4294097 A JP 4294097A JP H10216092 A5 JPH10216092 A5 JP H10216092A5
- Authority
- JP
- Japan
- Prior art keywords
- eye
- light beam
- optical characteristic
- illumination
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04294097A JP3684462B2 (ja) | 1997-02-12 | 1997-02-12 | 光学特性測定装置 |
| US09/023,058 US6234978B1 (en) | 1997-02-12 | 1998-02-12 | Optical characteristic measuring apparatus |
| US09/809,978 US6540692B2 (en) | 1997-02-12 | 2001-03-16 | Optical characteristic measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP04294097A JP3684462B2 (ja) | 1997-02-12 | 1997-02-12 | 光学特性測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10216092A JPH10216092A (ja) | 1998-08-18 |
| JPH10216092A5 true JPH10216092A5 (cs) | 2005-02-24 |
| JP3684462B2 JP3684462B2 (ja) | 2005-08-17 |
Family
ID=12650020
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP04294097A Expired - Fee Related JP3684462B2 (ja) | 1997-02-12 | 1997-02-12 | 光学特性測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3684462B2 (cs) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69906779T2 (de) * | 1998-11-13 | 2004-01-29 | Jean Benedikt | Verfahren und vorrichtung zur gleichzeitigen erfassung der oberflächentopographie und der biometrie eines auges |
| US6264328B1 (en) * | 1999-10-21 | 2001-07-24 | University Of Rochester | Wavefront sensor with off-axis illumination |
| JP4692939B2 (ja) * | 1999-11-15 | 2011-06-01 | 株式会社トプコン | 眼特性測定装置 |
| JP4618593B2 (ja) * | 2000-10-20 | 2011-01-26 | 株式会社トプコン | 眼特性測定装置 |
| US6525883B2 (en) * | 1999-12-27 | 2003-02-25 | Kabushiki Kaisha Topcon | Optical characteristic measuring instrument |
| JP4517211B2 (ja) * | 2000-05-12 | 2010-08-04 | 株式会社トプコン | 眼特性測定装置 |
| JP2001340299A (ja) * | 2000-06-02 | 2001-12-11 | Topcon Corp | 眼光学特性測定装置 |
| JP4649035B2 (ja) | 2000-10-18 | 2011-03-09 | 株式会社トプコン | 眼特性測定装置 |
| JP2002209854A (ja) * | 2000-10-18 | 2002-07-30 | Topcon Corp | 光学特性測定装置 |
| US6905209B2 (en) | 2000-10-18 | 2005-06-14 | Kabushiki Kaisha Topcon | Optical characteristics measuring device |
| US6808266B2 (en) * | 2001-04-18 | 2004-10-26 | Bausch And Lomb, Inc | Objective manifest refraction |
| JP4846938B2 (ja) * | 2001-08-14 | 2011-12-28 | 株式会社トプコン | 眼特性測定装置 |
| JP4102058B2 (ja) | 2001-11-09 | 2008-06-18 | 株式会社トプコン | 眼の光学特性測定装置 |
| JP4987408B2 (ja) | 2006-09-29 | 2012-07-25 | 株式会社ニデック | 眼科装置 |
| JP5546112B2 (ja) * | 2008-07-07 | 2014-07-09 | キヤノン株式会社 | 眼科撮像装置および眼科撮像方法 |
| JP5517571B2 (ja) * | 2009-11-18 | 2014-06-11 | キヤノン株式会社 | 撮像装置および撮像方法 |
| JP6007466B2 (ja) | 2010-12-27 | 2016-10-12 | 株式会社ニデック | 角膜形状測定装置 |
| EP2835098B1 (en) | 2012-04-06 | 2016-07-20 | Nidek Co., Ltd. | Ophthalmic measurement device, and ophthalmic measurement system equipped with ophthalmic measurement device |
| JP6515478B2 (ja) | 2014-10-07 | 2019-05-22 | 株式会社ニデック | 眼科装置、および、眼科測定プログラム |
-
1997
- 1997-02-12 JP JP04294097A patent/JP3684462B2/ja not_active Expired - Fee Related
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