JPH10206741A - Optical microscope variable in numerical aperture of objective - Google Patents

Optical microscope variable in numerical aperture of objective

Info

Publication number
JPH10206741A
JPH10206741A JP2010797A JP2010797A JPH10206741A JP H10206741 A JPH10206741 A JP H10206741A JP 2010797 A JP2010797 A JP 2010797A JP 2010797 A JP2010797 A JP 2010797A JP H10206741 A JPH10206741 A JP H10206741A
Authority
JP
Japan
Prior art keywords
lens
numerical aperture
objective lens
objective
aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2010797A
Other languages
Japanese (ja)
Other versions
JP3957351B2 (en
Inventor
Yoshimi Saito
佳美 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOKYO AIRCRAFT INSTR CO
Tokyo Koku Keiki KK
Original Assignee
TOKYO AIRCRAFT INSTR CO
Tokyo Koku Keiki KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TOKYO AIRCRAFT INSTR CO, Tokyo Koku Keiki KK filed Critical TOKYO AIRCRAFT INSTR CO
Priority to JP02010797A priority Critical patent/JP3957351B2/en
Publication of JPH10206741A publication Critical patent/JPH10206741A/en
Application granted granted Critical
Publication of JP3957351B2 publication Critical patent/JP3957351B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide the optical microscope which is easily variable in the numerical aperture of the objective without replacing the objective. SOLUTION: The rear focus of the objective 7 is relayed to above an image forming lens 4. Namely, the conjugation point of the rear focus of the objective 7 is formed and a stop 2 is arranged at the position. The numerical aperture of the objective 7 can be varied by the stop 2. This one microscope makes it possible to observe a sample with a high step by increasing the depth of focus by the stop 2 without replacing the objective and also observe a sample with a low step which requires resolving power by detaching the stop.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、対物レンズの開口
数可変の光学顕微鏡に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical microscope having a variable numerical aperture of an objective lens.

【0002】[0002]

【従来の技術】半導体DRAMの高集積化に伴い、プロ
セスウェーハは平坦化による低段差と多層化による高段
差の二極化する方向にある。上記ウェーハを検査する装
置として微少位置ズレ検査装置が用いられている。この
検査装置は光学顕微鏡を主構成要素としており、上記低
段差,高段差の両ウェーハいずれに対しても最適なコン
トラストを得ることが必要である。低段差のウェーハに
対しては焦点深度が浅く解像度が高くなるように光学系
を設定し、高段差のウェーハに対しては解像度は少し低
下するが焦点深度を深くなるように設定することとな
る。
2. Description of the Related Art As semiconductor DRAMs become more highly integrated, process wafers tend to be bipolar with low steps due to flattening and high steps due to multilayering. As a device for inspecting the wafer, a minute positional displacement inspection device is used. This inspection apparatus has an optical microscope as a main component, and it is necessary to obtain an optimum contrast for both the low step and the high step wafers. The optical system is set so that the depth of focus is shallow and the resolution is high for wafers with low steps, while the resolution is slightly reduced but the depth of focus is set deep for wafers with high steps. .

【0003】[0003]

【発明が解決しようとする課題】この場合、光学顕微鏡
の対物レンズの開口数を変えなければならない。しかし
ながら、従来は1本の対物レンズでは対応しきれず、同
一倍率で異なる開口数の対物レンズに付け変える必要が
あり、一般には、レボルバに開口数の異なる対物レンズ
を取り付け、切り換える方法が考えられる。しかし、レ
ボルバの切り換え時の光軸変化があるため、微少位置ズ
レ検出装置では使用できない。また、同一倍率の対物レ
ンズで開口数の異なるものが多数供給されている訳では
ない。
In this case, the numerical aperture of the objective lens of the optical microscope must be changed. However, conventionally, a single objective lens cannot be used, and it is necessary to replace the objective lens with the same magnification and a different numerical aperture. In general, a method of attaching an objective lens with a different numerical aperture to a revolver and switching can be considered. However, since there is a change in the optical axis when the revolver is switched, it cannot be used in the minute positional deviation detecting device. Also, many objective lenses having the same magnification but different numerical apertures are not supplied.

【0004】本発明の課題は、上記欠点を解決するもの
で、対物レンズを交換しなくても、簡単に対物レンズの
開口数を変えることができる光学顕微鏡を提供すること
にある。
[0004] An object of the present invention is to solve the above-mentioned drawbacks and to provide an optical microscope which can easily change the numerical aperture of an objective lens without replacing the objective lens.

【0005】[0005]

【課題を解決するための手段】前記課題を解決するため
に本発明による光学顕微鏡は、対物レンズの後焦点位置
をリレー系レンズにより観察側方向に移動させて光学的
共役点を形成し、前記共役点に絞りを配置し、前記絞り
によって前記対物レンズの開口数を変更するように構成
してある。上記構成において、前記リレー系レンズは、
前記対物レンズに対面させて配置した結像レンズと、前
記結像レンズにより形成された共役点に配置したリレー
レンズより構成してある。また、上記構成において、前
記共役点に絞り脱着機構を設け、絞りの脱着により絞り
値を変更するように構成してある。
In order to solve the above-mentioned problems, an optical microscope according to the present invention forms an optical conjugate point by moving a rear focal position of an objective lens toward an observation side by a relay lens. A stop is arranged at a conjugate point, and the numerical aperture of the objective lens is changed by the stop. In the above configuration, the relay lens is
It comprises an imaging lens arranged to face the objective lens and a relay lens arranged at a conjugate point formed by the imaging lens. Further, in the above configuration, a diaphragm attachment / detachment mechanism is provided at the conjugate point, and the aperture value is changed by attaching / detaching the aperture.

【0006】[0006]

【作用】上記構成によれば、使用した対物レンズの開口
数以下の任意の開口数にすることができ、1台の顕微鏡
で、絞りを入れ焦点深度を深くして高段差の試料の観察
が、絞りを外して解像力を必要とする低段差の試料の観
察が可能となる。また、本光学系にオートフォーカス系
を組み込んだときは、開口数を下げたときでも対物レン
ズ部は、レンズそのものの開口数であるので、瞳径の大
きい分、フォーカス系の光路の成す角度は、開口数の小
さいレンズを使ったときよりも大きくとれ、検出に有利
である。
According to the above arrangement, the numerical aperture of the objective lens used can be set to an arbitrary numerical aperture smaller than the numerical aperture of the objective lens used. In addition, it becomes possible to observe a sample with a low step requiring a resolving power by removing the stop. Also, when an autofocus system is incorporated in the optical system, the objective lens section has the numerical aperture of the lens itself even when the numerical aperture is reduced. This is larger than when a lens with a small numerical aperture is used, which is advantageous for detection.

【0007】[0007]

【発明の実施の形態】以下、図面を参照して本発明の実
施の形態を詳しく説明する。図1は、レンズの開口数の
求め方を説明するための図である。屈折率nの媒質中に
ある光軸上の物点が入射瞳の半径を見込む角をαとする
とき、開口数(NA)はn×sinαとなる。
Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 is a diagram for explaining how to determine the numerical aperture of a lens. When the angle at which the object point on the optical axis in the medium having the refractive index n looks into the radius of the entrance pupil is α, the numerical aperture (NA) is n × sin α.

【0008】焦点深度は次の式で計算される。 Df=λ/(NA)2 ここで Df:焦点深度 (μm) λ :光線の波長(μm) NA:レンズの開口数 また、解像力は(暗黒の背景に明るい2点が近接して存
在するとき、その2点が2点として見分けられる最小距
離)は、次の式であらわされる。 d=0.61λ/(NA) ここで d :解像力 (μm) λ :光線の波長(μm) NA:レンズの開口数
[0008] The depth of focus is calculated by the following equation. Df = λ / (NA) 2 where Df: depth of focus (μm) λ: wavelength of light beam (μm) NA: numerical aperture of lens Further, the resolving power is (when two bright points are close to each other on a dark background). , The minimum distance at which the two points can be distinguished as two points) is expressed by the following equation. d = 0.61λ / (NA) where d: resolution (μm) λ: wavelength of light beam (μm) NA: numerical aperture of lens

【0009】具体的な数値を入れてレンズの開口数と焦
点深度および解像力を比較すると以下の通りである。
A comparison of the numerical aperture of the lens, the depth of focus, and the resolving power, taking into account specific numerical values, is as follows.

【表1】 [Table 1]

【0010】図2は、本発明による対物レンズの開口数
可変の光学顕微鏡の基本構成を説明するための光路概略
図である。試料8に対し対物レンズ7が対面している。
対物レンズ7の上方には結像レンズ4が配置されてい
る。結像レンズ4は、結像レンズ4の焦点距離fの2倍
の位置と対物レンズ7の後焦点位置が一致する位置に配
置されている。さらに結像レンズ4の上方には結像レン
ズ4の焦点距離fの2倍の位置に絞り2が配置されてい
る。この位置にリレーレンズ3も配置されることとな
る。リレーレンズ3の上方の像面1にはCCDカメラ等
が設置される。リレー系レンズは、結像レンズ4とリレ
ーレンズ3より構成される。
FIG. 2 is a schematic view of an optical path for explaining a basic configuration of an optical microscope having a variable numerical aperture of an objective lens according to the present invention. The objective lens 7 faces the sample 8.
The imaging lens 4 is arranged above the objective lens 7. The imaging lens 4 is arranged at a position where the position twice the focal length f of the imaging lens 4 and the rear focal position of the objective lens 7 coincide. Further, a stop 2 is disposed above the imaging lens 4 at a position twice the focal length f of the imaging lens 4. The relay lens 3 is also arranged at this position. A CCD camera or the like is installed on the image plane 1 above the relay lens 3. The relay system lens includes an imaging lens 4 and a relay lens 3.

【0011】結像レンズ4は対物レンズ7の後焦点を等
倍でリレーレンズ3の位置にリレーする。すなわち、後
焦点の共役点はリレーレンズ3の位置に形成される。結
像レンズ4と対物レンズ7の間には半透過形ミラー6が
挿入されており、照明光10が照明用絞り9を通り照明
レンズ5を介して試料8の面を照明する。絞り2により
対物レンズ7の開口数を変化させることができる。ここ
で、所定の総合倍率となるようにリレー系レンズの焦点
距離を決め、使用する対物レンズの開口数を0.8、こ
の時のレンズの瞳径を、φ5.76とすると、挿入すべ
き絞りの径は、 5.76÷0.8×(NA) で求めることができる。
The imaging lens 4 relays the rear focus of the objective lens 7 to the position of the relay lens 3 at the same magnification. That is, the back focal point conjugate point is formed at the position of the relay lens 3. A semi-transmissive mirror 6 is inserted between the imaging lens 4 and the objective lens 7, and the illumination light 10 passes through the illumination diaphragm 9 and illuminates the surface of the sample 8 via the illumination lens 5. The aperture 2 allows the numerical aperture of the objective lens 7 to be changed. Here, assuming that the focal length of the relay lens is determined so as to have a predetermined total magnification, the numerical aperture of the objective lens used is 0.8, and the pupil diameter of the lens at this time is φ5.76, the lens should be inserted. The diameter of the stop can be determined by 5.76 ÷ 0.8 × (NA).

【0012】上記説明では、等倍で対物レンズの後焦点
をリレーする例を説明したが、等倍である必要はない。
対物レンズの後焦点の共役点をリレー系レンズで形成
し、その位置に絞りを配置すれば同様に開口数を変更す
ることができる。
In the above description, an example in which the rear focus of the objective lens is relayed at the same magnification has been described.
If the conjugate point of the rear focal point of the objective lens is formed by a relay lens and a stop is arranged at that position, the numerical aperture can be similarly changed.

【0013】図3は、本発明による対物レンズの開口数
可変の光学顕微鏡の第1の実施の形態を示す光路概略図
である。この例は、反射形の光学顕微鏡であり、図2と
構成は同じである。ただし、結像レンズ15の配置位置
から対物レンズ17の後焦点までの距離は2f(等倍)
の距離も含め種々の距離を取ることができる。照明光2
0はコンデンサレンズ19により集光され、半透過形ミ
ラー16を介して試料18に達する。対物レンズ17の
後焦点に対し結像レンズ15によりリレーレンズ14の
位置に共役点が形成される。絞り13は絞り脱着機構に
より脱着が可能であり、絞りを外したり絞り値を変えた
りすることにより対物レンズ17の開口数を変えること
ができる。リレーレンズ14と共役点の位置(絞り13
の設置位置)は同じ位置となるので、レンズの主点の位
置を変えることによりレンズと干渉しない位置に絞りを
入れることができる。
FIG. 3 is a schematic optical path diagram showing a first embodiment of an optical microscope in which the numerical aperture of an objective lens is variable according to the present invention. This example is a reflection type optical microscope, and has the same configuration as that of FIG. However, the distance from the arrangement position of the imaging lens 15 to the back focus of the objective lens 17 is 2f (1 ×).
Various distances can be taken, including the distance of. Illumination light 2
0 is condensed by the condenser lens 19 and reaches the sample 18 via the transflective mirror 16. A conjugate point is formed at the position of the relay lens 14 by the imaging lens 15 with respect to the rear focus of the objective lens 17. The aperture 13 can be attached and detached by an aperture attachment / detachment mechanism, and the numerical aperture of the objective lens 17 can be changed by removing the aperture or changing the aperture value. Position of the conjugate point with the relay lens 14 (aperture 13
Is set at the same position, the stop can be set at a position that does not interfere with the lens by changing the position of the principal point of the lens.

【0014】図4は、本発明による対物レンズの開口数
可変の光学顕微鏡の第2の実施の形態を示す光路概略図
である。この例は、透過形の光学顕微鏡である。透過形
の試料26の下方に、照明光28とコンデンサレンズ2
7が配置されている。結像レンズ24の配置位置から対
物レンズ25の後焦点までの距離は2fの距離も含め種
々の距離を取ることができる。照明光28はコンデンサ
レンズ27により集光され、試料26を照明する。対物
レンズ25の後焦点に対し結像レンズ24によりリレー
レンズ23の位置に共役点が形成される。絞り22は図
3と同様、絞り脱着機構により脱着が可能であり、絞り
を外したり絞り値を変えたりすることにより対物レンズ
25の開口数を変えることができる。
FIG. 4 is a schematic optical path diagram showing a second embodiment of the optical microscope according to the present invention, in which the numerical aperture of the objective lens is variable. This example is a transmission type optical microscope. An illumination light 28 and a condenser lens 2 are provided below a transmission type sample 26.
7 are arranged. The distance from the arrangement position of the imaging lens 24 to the back focal point of the objective lens 25 can take various distances including 2f. The illumination light 28 is collected by the condenser lens 27 and illuminates the sample 26. A conjugate point is formed at the position of the relay lens 23 by the imaging lens 24 with respect to the rear focus of the objective lens 25. 3, the aperture 22 can be attached and detached by an aperture attachment / detachment mechanism, and the numerical aperture of the objective lens 25 can be changed by removing the aperture or changing the aperture value.

【0015】上述したように光学顕微鏡の焦点深度と解
像力は、対物レンズの開口数(NA値)により決定され
る。本発明では、対物レンズの後焦点をリレーし、そこ
に絞りを入れることにより、使用した対物レンズの開口
数以下の任意の開口数にすることができ、1台の顕微鏡
で、絞りを入れて焦点深度を深くして厚みのある試料の
観察を、絞りを外して解像力を必要とする試料の観察
を、それぞれ可能にする。
As described above, the depth of focus and the resolving power of the optical microscope are determined by the numerical aperture (NA value) of the objective lens. In the present invention, by relaying the rear focus of the objective lens and setting an aperture there, it is possible to set an arbitrary numerical aperture equal to or less than the numerical aperture of the objective lens used. It enables observation of a thick sample by increasing the depth of focus, and observation of a sample requiring resolution by removing the aperture.

【0016】[0016]

【発明の効果】以上、説明したように本発明によれば、
一本の対物レンズで開口数を小さくできるので、解像力
は低下するが、焦点深度を深くすることができ、厚みの
ある試料でも観察が可能となる。また、絞りを外せば、
対物レンズ本来の開口数となり、焦点深度は浅いが解像
力を必要とする試料に対して、本来の機能を引き出すこ
とができる。したがって、従来のように倍率が同一の開
口数が異なる対物レンズを用意する必要はなく、対物レ
ンズを交換しなくても簡単に開口数を変えることができ
るという効果がある。
As described above, according to the present invention,
Since the numerical aperture can be reduced with a single objective lens, the resolving power decreases, but the depth of focus can be increased, and observation is possible even with a thick sample. Also, if you remove the aperture,
The original numerical aperture of the objective lens is obtained, and the original function can be brought out for a sample having a small depth of focus but requiring a resolving power. Therefore, there is no need to prepare an objective lens having the same magnification and a different numerical aperture as in the related art, and there is an effect that the numerical aperture can be easily changed without replacing the objective lens.

【図面の簡単な説明】[Brief description of the drawings]

【図1】対物レンズの開口数の求め方を説明するための
図である。
FIG. 1 is a diagram for explaining how to find a numerical aperture of an objective lens.

【図2】本発明による対物レンズの開口数可変の光学顕
微鏡の基本構成を説明するための光路概略図である。
FIG. 2 is an optical path schematic diagram for explaining a basic configuration of an optical microscope having a variable numerical aperture of an objective lens according to the present invention.

【図3】本発明による対物レンズの開口数可変の光学顕
微鏡の第1の実施の形態を示す光路概略図である。
FIG. 3 is a schematic optical path diagram showing a first embodiment of an optical microscope having a variable numerical aperture of an objective lens according to the present invention.

【図4】本発明による対物レンズの開口数可変の光学顕
微鏡の第2の実施の形態を示す光路概略図である。
FIG. 4 is an optical path schematic diagram showing a second embodiment of an optical microscope having a variable numerical aperture of an objective lens according to the present invention.

【符号の説明】[Explanation of symbols]

1…像面 2,13,22…絞り 3,14,23…リレーレンズ 4,15,24…結像レンズ 5…照明レンズ 6,16…半透過形ミラー 7,17,25…対物レンズ 8,18,26…試料 9…照明用絞り 10,20,28…照明光 12,21…CCDカメラ 19,27…コンデンサレンズ DESCRIPTION OF SYMBOLS 1 ... Image surface 2,13,22 ... Aperture 3,14,23 ... Relay lens 4,15,24 ... Imaging lens 5 ... Illumination lens 6,16 ... Semi-transmissive mirror 7,17,25 ... Objective lens 8, 18, 26: Sample 9: Illumination diaphragm 10, 20, 28: Illumination light 12, 21: CCD camera 19, 27: Condenser lens

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 対物レンズの後焦点位置をリレー系レン
ズにより観察側方向に移動させて光学的共役点を形成
し、 前記共役点に絞りを配置し、 前記絞りによって前記対物レンズの開口数を変更するこ
とを特徴とする対物レンズの開口数可変の光学顕微鏡。
1. A rear focus position of an objective lens is moved in a direction of an observation side by a relay lens to form an optical conjugate point, a stop is arranged at the conjugate point, and a numerical aperture of the objective lens is set by the stop. An optical microscope having a variable numerical aperture of an objective lens, wherein the numerical aperture is changed.
【請求項2】 前記リレー系レンズは、前記対物レンズ
に対面させて配置した結像レンズと、 前記結像レンズにより形成された共役点に配置したリレ
ーレンズよりなることを特徴とする請求項1記載の対物
レンズの開口数可変の光学顕微鏡。
2. The relay system lens according to claim 1, wherein the relay lens includes an imaging lens arranged to face the objective lens, and a relay lens arranged at a conjugate point formed by the imaging lens. An optical microscope with a variable numerical aperture of the objective lens described.
【請求項3】 前記共役点に絞り脱着機構を設け、絞り
の脱着により絞り値を変更することを特徴とする請求項
1記載の対物レンズの開口数可変の光学顕微鏡。
3. The optical microscope according to claim 1, wherein an aperture attachment / detachment mechanism is provided at the conjugate point, and the aperture value is changed by attaching / detaching the aperture.
JP02010797A 1997-01-17 1997-01-17 Optical microscope with variable numerical aperture of objective lens Expired - Lifetime JP3957351B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP02010797A JP3957351B2 (en) 1997-01-17 1997-01-17 Optical microscope with variable numerical aperture of objective lens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02010797A JP3957351B2 (en) 1997-01-17 1997-01-17 Optical microscope with variable numerical aperture of objective lens

Publications (2)

Publication Number Publication Date
JPH10206741A true JPH10206741A (en) 1998-08-07
JP3957351B2 JP3957351B2 (en) 2007-08-15

Family

ID=12017902

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02010797A Expired - Lifetime JP3957351B2 (en) 1997-01-17 1997-01-17 Optical microscope with variable numerical aperture of objective lens

Country Status (1)

Country Link
JP (1) JP3957351B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002090654A (en) * 2000-09-12 2002-03-27 Olympus Optical Co Ltd Intermediate lens barrel having projection optical system, and microscope having projection optical system
US7855844B2 (en) 2007-05-17 2010-12-21 Mitutoyo Corporation Objective lens and optical measuring device
WO2018061429A1 (en) * 2016-09-28 2018-04-05 富士フイルム株式会社 Captured image evaluation device, method, and program

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002090654A (en) * 2000-09-12 2002-03-27 Olympus Optical Co Ltd Intermediate lens barrel having projection optical system, and microscope having projection optical system
US6560012B2 (en) 2000-09-12 2003-05-06 Olympus Optical Co., Ltd. Microscope apparatus and method
US7855844B2 (en) 2007-05-17 2010-12-21 Mitutoyo Corporation Objective lens and optical measuring device
WO2018061429A1 (en) * 2016-09-28 2018-04-05 富士フイルム株式会社 Captured image evaluation device, method, and program
JP2018054425A (en) * 2016-09-28 2018-04-05 富士フイルム株式会社 Photographed image evaluation device, method, and program
US11169079B2 (en) 2016-09-28 2021-11-09 Fujifilm Corporation Captured image evaluation apparatus, captured image evaluation method, and captured image evaluation program

Also Published As

Publication number Publication date
JP3957351B2 (en) 2007-08-15

Similar Documents

Publication Publication Date Title
US6075646A (en) Observation optical apparatus
US7379176B2 (en) Mask defect inspection apparatus
JPH0442601B2 (en)
JPS59100805A (en) Device for observing object
JP2897330B2 (en) Mark detection device and exposure device
JPH1010419A (en) Focal point detector
JP3957351B2 (en) Optical microscope with variable numerical aperture of objective lens
JPH10239037A (en) Observation device
JPS6026311A (en) Focus detector for dark field microscope
JP2007093431A (en) Defect inspection apparatus
JPS6257008B2 (en)
US5026976A (en) Double-focus detector utilizing chromatic aberration
JP2000035540A (en) Differential interference microscope
JP3757529B2 (en) Microscope illumination optics
JP3237023B2 (en) Position detection device
JPH0359568B2 (en)
JPH0344242B2 (en)
JPH075397A (en) Schlieren microscope device
JP2794764B2 (en) Defect inspection equipment
JP3275407B2 (en) Micro size measuring device
JP3846608B2 (en) Reflective dark field illumination device
JP4269378B2 (en) Observation method and observation apparatus
JPH11271597A (en) Focus position detecting device
JPH0784187A (en) Pupil projection optical system
JP2946818B2 (en) Epi-illumination device for fluorescent microscope and illumination adjustment method for the device

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20060104

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070130

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070323

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070424

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20070508

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110518

Year of fee payment: 4

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110518

Year of fee payment: 4

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120518

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120518

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130518

Year of fee payment: 6

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term