JPH0933387A - Inspecting device having marking function and inspection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To continuously inspect a plurality of subjects and shorten the time required for the inspection treatment by continuously sending a plurality of optical members to be inspected to an image pickup position and a marking position in this order, judging the quality of the member on the basis of the input image of the photographed image, and transferring it to the marking position to mark the judgment result. SOLUTION: A lens 1 to be inspected is formed, for example, by use of a four-piece taking metal mold, and inspected still being connected to a spool and runner R. The lenses 1 are provided at an interval of 90 deg. around the spool. Two lenses 1 are arranged in photographing positrons separating 180 deg.. Two lenses 1 different from each photographing position by 90 deg. are arranged in marking positions of marking devices 200, 210. A part feeding device 60 integrally rotates the lenses 1 by 90 deg. around the spool, thereby alternately sending the lenses 1 to the photographing positions and the marking positions. When the lenses 1 pass the four positions by the rotation of the spool, the inspection of the four lenses 1 is ended, and another set of lenses 1 to be inspected is then inspected.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is an inspection having a marking function of determining whether or not an object to be inspected such as an optical member satisfies a predetermined performance, and if necessary, marking the inspection result on the object to be inspected. Regarding the device.

[0002]

2. Description of the Related Art A conventional inspection apparatus includes an inspection means for inspecting the optical performance of a molded plastic lens, for example.
Marking means for marking defective products that do not satisfy predetermined performance based on the inspection result. The lens, which is the object to be inspected, is placed at a predetermined inspection position and is inspected by the inspection means. If the determination is defective, the marking means marks a defective product at the inspection position.

[0003]

However, in the conventional inspection apparatus, since the lens position at the time of inspection and the lens position at the time of marking are the same, the following three processes are performed until inspection, determination, and marking are all completed. However, there is a problem that it takes a long time to process when a plurality of lenses are continuously inspected / marked.

The present invention has been made in view of the above-mentioned problems of the prior art, and provides an inspection apparatus capable of shortening the processing time when a plurality of inspection objects are inspected continuously. With the goal.

[0005]

In order to achieve the above object, an inspection apparatus having a marking function according to the present invention is characterized in that the inspection and the marking are performed at different positions. Specifically, an inspection apparatus having a marking function according to the present invention is provided with a component supply unit that sequentially feeds each of a plurality of optical members that are objects to be inspected in the order of a photographing position and a marking position, and is supplied to a photographing position. Image input means for photographing the optical member, judgment means for judging the quality of the optical member based on the input image of the image input means, and judgment means for the optical member sent to the marking position after photographing at the photographing position. And a marking unit that adds a mark based on the determination result.

The inspection / marking method according to the present invention further includes an inspection step for inspecting the performance of the inspection object at the inspection position and an inspection object at the inspection position at a marking position different from the inspection position. Marking step to move the inspected object from the inspection position to the marking position and at the same time send the uninspected object to the inspection position to mark the inspected object. , The inspection of the uninspected object is performed in parallel.

[0007]

BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of an inspection apparatus having a marking function according to the present invention will be described below. First, the schematic configuration of the apparatus will be described with reference to FIG.

The inspection apparatus includes two CCD cameras 30a and 30b, which are image input means for inputting images of the lenses 1 and 1 to be inspected, which are objects to be inspected arranged at a photographing position, and a marking position different from the photographing position. Two marking devices 200 and 210 for marking the lens 1 to be inspected
And a component supply device 60 that continuously feeds each of the plurality of lenses 1 to be tested in the order of the photographing position and the marking position.

The light source devices 120a and 120b composed of light sources 10a and 10b and diffusing means 20a and 20b are provided at positions facing the CCD cameras with the lens to be inspected 1 placed at the image input position interposed therebetween. Is provided. The inspection item can be specified by setting the light source device or the CCD camera.

The images of the lenses 1 and 1 to be inspected taken by the CCD cameras 30a and 30b are input to the image processing device 40 one by one by the input switching means 41. The image processing device 40 detects information such as a defect included in the lens 1 to be inspected and outputs the information to the determination means 42. Based on this information, the determination means 42 determines whether or not the defect detected for each inspection item is equal to or greater than a predetermined reference value, and displays the determination result on the monitor display 50.

The control means 43 controls the component supply device 60 so that the lens 1 to be inspected is fed in the order of the inspection position and the mark position, and when the lens to be inspected in which a defect is detected by inspection is sent to the marking position. Then, the marking devices 200 and 210 at the corresponding positions are controlled to mark the lens to be inspected with a mark indicating that the lens is defective.

In this example, different items are inspected based on the signals of the two image input means, and if the inspection result based on the output of the first CCD camera 30a is defective, the first marking device 210 is detected. The second CCD
When the inspection result based on the output of the camera 30b is defective, the second marking device 210 marks the mark.

According to the above construction, the first and second CCD cameras 30a and 30 are moved by sequentially feeding the lenses to be inspected.
The presence or absence of a defect can be determined based on the output of b, and the next lens to be inspected can be inspected while marking is performed by the marking device based on the determination result.

FIG. 2 is a perspective view showing a specific arrangement of each means in the above apparatus. In this example, the lens 1 to be inspected is molded by a four-cavity mold as shown in FIG. 3, and is inspected in a state of being connected to the sprue Sp and the runner R. The lenses 1 to be inspected are provided at 90 ° intervals with the sprue Sp as the center.

At the photographing positions of the CCD cameras 30a and 30b, two lenses 1 to be inspected are arranged at positions separated by 180 °. At the marking positions of the marking devices 200 and 210, two lenses 1 to be inspected are arranged at positions different from each photographing position by 90 °.

In this example, the component supply device 60 has a sprue S.
By rotating the lenses to be examined 90 ° each around p, the lenses to be examined are alternately sent to the photographing position and the marking position. When the sprue rotates 360 ° and each lens passes through the four positions, the inspection of the four test lenses is completed, and another set of test lenses is set as the test target.

Next, the structure of an optical system for forming an image photographed by each CCD camera will be described with reference to FIG. Since the configuration of the optical system is common, the description will be given here with common reference numerals.

The optical system of the apparatus includes a light source 10 (10a, 10a, 10a).
b) and diffusing means 2 composed of first and second diffusing plates 21 and 22 for diffusing the light flux emitted from the light source 10.
0 (20a, 20b), a light beam that has passed through the diffusing means 20 and has passed through the lens 1 to be inspected, and a light beam that has passed around the lens 1 to be inspected, and the CCD camera 30 (3
0a, 30b).

The light source 10 and the lens 1 to be inspected are arranged on the optical axis of the CCD camera 30. CCD camera 30
Is composed of a taking lens 31 and a CCD sensor 32, and is adjusted so that the vicinity of the center in the thickness direction of the lens 1 to be inspected is a focus plane P. That is, the focus plane P and CC
The image receiving surface of the D sensor 32 is optically conjugate with the image pickup lens 31, and the image of the lens 1 under test on the focus plane P is
It is formed in the range indicated by the symbol O on the CCD sensor.

The first and second diffusing plates 21 and 22 are substantially similar to the planar shape of the lens 1 to be tested, and the second diffusing plate 22 has a smaller area than the first diffusing plate 21. . These diffuser plates 21 and 22 are provided perpendicular to the optical axis so that the optical axis passes through the respective centers. Also,
These diffusers have the same or different diffuse transmittances. Therefore, considering the diffuser 20 as a whole, the central region where the first and second diffusers overlap has a low diffuse transmittance, and The diffused transmittance is relatively high in the peripheral region that does not become.

The size of the second diffusing plate 22 is determined so that the range of light vertically emitted from the second diffusing plate 22 is substantially the same as that of the lens 1 to be inspected. As a result, all the vertical emission components from the central region enter the lens 1 under test, and
The component that vertically passes through the diffusion plate 21 and does not pass through the second diffusion plate 22, that is, the vertical emission component from the peripheral region does not enter the lens 1 to be inspected. Further, the planar shape of the first diffusion plate 21 is formed to be similar to the shape of the object to be inspected so that the oblique emission component from the peripheral region is uniformly incident on the object from all directions.

FIG. 5 shows an example of the planar shape of the lens to be inspected and the diffusion plates 21 and 22. As shown in FIG. 5 (A-1), when the lens under test is the finder lens 1a having a rectangular planar shape, the planar shapes of the first and second diffusion plates 21 and 22 are as shown in FIG. It is desirable to make the rectangle as shown in A-2). Further, as shown in FIG. 5 (B-1), when the test lens is a general circular lens 1b, each diffusion plate 2
The plane shapes of 1 and 22 are preferably circular as shown in FIG. 5 (B-2). A gate G connects the lens to be inspected and the runner R.

In the photographed image, as shown in FIG. 6, a high-brightness background area B formed mainly by high-brightness components in the peripheral area reaching without passing through the second diffusion plate 22, The image (component region) S of the lens to be inspected which is mainly formed by the low-luminance component of the central region that has passed through the two diffusion plates is included.

By making the shape of the second diffusing plate 22 similar to the planar shape of the lens 1 to be inspected, the component area where the lens to be inspected is arranged and the background area are clear in the image as described above. It is possible to divide into target areas, and the separation processing of the target area in the image processing described later becomes extremely easy.

Here, if there is a defect that absorbs light on the surface or inside of the lens 1 to be inspected, for example, black dust contained in the optical member, part of the transmitted light from the central region forming the lens image is absorbed. Since the light does not reach the CCD sensor 32, a defect image DL having a brightness lower than that of the component area is generated in the component area S of intermediate luminance as shown in FIG.

Further, if there is a defect that scatters light on the surface of the lens 1 to be inspected, for example, if white dust or scratches are present on the surface of the optical member, the light scatters due to this defect, and if there is no defect, C
A part of the high-intensity oblique emission component from the peripheral region that does not reach the range O of the lens image on the CD sensor 32 is part of the range O of the lens image.
As shown in FIG. 8, a defect image DH having a brightness higher than that of the component area is generated in the component area S having the intermediate luminance.

For example, when a low-brightness image DL due to an absorptive defect and a high-brightness image DH due to a scattering defect are present on a certain X-axis scanning line, the output of the pixel row along this scanning line is present. Is as shown in FIG. The image processing device 40 binarizes using two threshold values SH1 and SH2, so that the image processing device 40 has different characteristics as shown in FIGS. 9 (B) and 9 (C).
Each type of defect can be extracted independently.

The inspection device determines whether or not the figure extracted as described above corresponds to a defect based on a predetermined determination criterion. If it is determined that the defect is a defect, the marking device fails to detect the lens. Engrave a mark of good product. In the post-inspection process, only lenses without marks are selected and used as non-defective products.

[0029]

As described above, according to the present invention, the inspection and the marking are performed in parallel at different positions, so that the inspection and the marking are performed in comparison with the case where the inspection and the marking are performed at the same position. The processing speed can be improved even if the time taken for the same is the same.

[Brief description of drawings]

FIG. 1 is a block diagram showing a processing system of an optical member inspection device according to an embodiment of the present invention.

FIG. 2 is a perspective view showing a specific arrangement of each means of the optical member inspection device according to the embodiment of the present invention.

FIG. 3 is a perspective view showing a state of being connected by a runner of a positive lens molded by a four-cavity mold as an example of a test object.

FIG. 4 is an explanatory diagram showing an optical system of the optical member inspection device according to the embodiment of the present invention.

5A and 5B are explanatory views showing the shape of a test object and the shape of a diffusing means in the apparatus of FIG. 4 in comparison.

FIG. 6 is an explanatory diagram showing an image when there is no defect in the lens to be inspected imaged by the apparatus of FIG.

FIG. 7 is an explanatory diagram showing an image when the lens to be inspected taken by the apparatus of FIG. 4 has an absorptive defect.

FIG. 8 is an explanatory diagram showing an image when the test lens imaged by the apparatus of FIG. 4 has a scattering defect.

9 shows an example of a luminance distribution on one scanning line of an image photographed by the apparatus of FIG. 4, where (A) is a signal of an original image, (B) is a signal obtained by binarizing a low luminance component, and (C ) Is a signal obtained by binarizing the high luminance component.

[Explanation of symbols]

 1 Lens to be inspected 10 (10a, 10b) Light source 120a, 120b Light source device 20 (20a, 20b) Diffusing means 200, 210 Marking device 30 (30a, 30b) CCD camera 40 Image processing device 41 Input switching means 42 Judging means 43 Control Means 50 Monitor Display 60 Parts Supply Device

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Atsushi Kida 2-36-9 Maenocho, Itabashi-ku, Tokyo Asahi Kogaku Kogyo Co., Ltd.

Claims (5)

[Claims] 1. A component supply means for continuously feeding each of a plurality of optical members, which are objects to be inspected, in the order of a photographing position and a marking position, and image input means for photographing the optical member supplied to the photographing position. A determination unit that determines pass / fail of the optical member based on an image input by the image input unit, and an optical member that has been sent to the marking position after image capturing at the image capturing position is marked on the basis of the determination result by the determination unit. Marking means for attaching an inspected object is moved from the inspection position to the marking position, and at the same time, an uninspected object is sent to the inspection position to mark the inspected object. An inspection apparatus having a marking function, wherein the inspection and the inspection of an uninspected object are performed in parallel. 2. The inspection device having a marking function according to claim 1, wherein the marking means makes a mark only when the object to be inspected is a defective product that does not satisfy a predetermined performance. 3. The component supply means rotates a plurality of optical members integrally with each other by rotating the plurality of optical members at the photographing position.
The inspection device having a marking function according to claim 1, wherein the inspection device is sequentially sent to the marking position. 4. An inspection / marking method for inspecting the performance of an object to be inspected and marking the object to be inspected on the basis of the inspection result, wherein inspection and marking processes for the object are parallel at different positions. An inspection / marking method, which is characterized by being carried out. 5. An inspection step for inspecting the performance of an object to be inspected at an inspection position, and a marking step for making a mark on the object to be inspected at a marking position different from the inspection position based on an inspection result in the inspection step. And moving the inspected object from the inspection position to the marking position, at the same time, sending the uninspected object to the inspection position, marking the inspected object and the uninspected object. An inspection / marking method characterized by performing inspection of an object to be inspected in parallel.