JPH09287936A - Method for processing data of three-dimensional surface shape - Google Patents

Method for processing data of three-dimensional surface shape

Info

Publication number
JPH09287936A
JPH09287936A JP9838396A JP9838396A JPH09287936A JP H09287936 A JPH09287936 A JP H09287936A JP 9838396 A JP9838396 A JP 9838396A JP 9838396 A JP9838396 A JP 9838396A JP H09287936 A JPH09287936 A JP H09287936A
Authority
JP
Japan
Prior art keywords
dimensional surface
data
surface shape
dimensional
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP9838396A
Other languages
Japanese (ja)
Inventor
Katsumi Ando
克己 安藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP9838396A priority Critical patent/JPH09287936A/en
Publication of JPH09287936A publication Critical patent/JPH09287936A/en
Withdrawn legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide the method for processing the data of three-dimensional surface shape, which can give the accurate data of three-dimensional surface undulation and three-dimensional surface roughness that has been difficult to obtain by the conventional method. SOLUTION: The data of three-dimensional surface roughness and three- dimensional surface undulation are obtained from the three-dimensional surface- shape data obtained from a three-dimensional surface-shape/roughness meter or the like. In this data processing of the three-dimensional surface shape, the height matrix data of the three-dimensional surface roughness is obtained by subtracting the height matrix data of the three-dimensional surface undulation obtained by the two-dimensional low-filter-region processing of the matrix data from the height matrix data of the three-dimensional surface shape.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、3次元表面形状・
粗さ計等により得られる3次元表面形状データの処理方
法に関するものである。
TECHNICAL FIELD The present invention relates to a three-dimensional surface shape
The present invention relates to a method of processing three-dimensional surface shape data obtained by a roughness meter or the like.

【0002】[0002]

【従来の技術】材料の表面粗さ、表面うねり等の表面形
状データは、工業分野において、機械加工部品や電子部
品等の機能や表面品質の評価に広く使用されているばか
りでなく、学術分野においては、互いに接触する材料表
面の摩擦や摩耗の特性を解析するために広く用いられて
いる。
2. Description of the Related Art Surface shape data such as surface roughness and surface waviness of materials are widely used in industrial fields for evaluation of functions and surface quality of machined parts and electronic parts, as well as in academic fields. Is widely used for analyzing the characteristics of friction and wear of the material surfaces in contact with each other.

【0003】表面形状の評価方法として、表面の微細な
凹凸の性質を示す諸パラメータすなわち表面粗さについ
ては、JIS B 0601「表面粗さ−定義及び表
示」で規定されており、表面のおおまかな凹凸の性質を
示す諸パラメータすなわち表面うねりについては、JI
S B 0610「表面うねりの定義と表示」に規定さ
れている。表面形状は、表面形状データすなわち計測に
より得られるデータ、および計測データをフィルタ処理
して得られる表面粗さデータ、表面うねりデータの3種
類のデータを必要に応じて選択して用い、JISに規定
された諸パラメータで評価することが一般的に行われて
いる。
As a method of evaluating the surface shape, various parameters indicating the characteristics of fine irregularities on the surface, that is, surface roughness, are specified in JIS B 0601 "Surface roughness-definition and display", and the surface is roughly estimated. Regarding various parameters showing the property of unevenness, that is, surface waviness, see JI
S B 0610 "Definition and display of surface waviness". As the surface shape, three types of data, surface shape data, that is, data obtained by measurement, surface roughness data obtained by filtering measurement data, and surface waviness data, are selected and used as required, and are specified in JIS. It is generally performed to evaluate with various parameters.

【0004】JISの規定は、表面形状・粗さ計等によ
り得られる断面曲線すなわち2次元表面形状データに関
するものである。近年、表面形状をより的確かつ視覚的
に把握するために、表面を3次元で計測する3次元表面
形状・粗さ計が普及してきている。3次元表面形状・粗
さ計の計測方式は、触針式、光学式等種々の方式がある
が、いずれの方式においても3次元表面形状データは、
計測面の高さ方向の行列データとして記録される。すな
わち、計測面がx−y平面にある場合は、3次元表面形
状データはz方向の高さ行列データ[z(x,y)]で
表示される。
The JIS regulation relates to cross-sectional curves obtained by a surface shape / roughness meter, that is, two-dimensional surface shape data. In recent years, in order to more accurately and visually grasp the surface shape, a three-dimensional surface shape / roughness meter that measures the surface in three dimensions has become popular. There are various methods such as a stylus method and an optical method for measuring the three-dimensional surface shape / roughness meter. In any method, the three-dimensional surface shape data is
It is recorded as matrix data in the height direction of the measurement surface. That is, when the measurement surface is on the xy plane, the three-dimensional surface shape data is displayed as height matrix data [z (x, y)] in the z direction.

【0005】3次元表面形状・粗さ計等により得られる
3次元表面形状データから、3次元表面粗さおよび3次
元表面うねりデータを正確に求める方法は知られておら
ず、従来法では、x方向またはy方向にデータを1次元
フィルタ処理し、これをy方向またはx方向に並べ、3
次元表面粗さおよび3次元表面うねりとして表示する方
法がとられている。
There is no known method for accurately obtaining the three-dimensional surface roughness and the three-dimensional surface waviness data from the three-dimensional surface shape data obtained by a three-dimensional surface shape / roughness meter or the like. One-dimensionally filter the data in the y-direction or the y-direction and arrange it in the y-direction or the x-direction.
A method of displaying as three-dimensional surface roughness and three-dimensional surface waviness is adopted.

【0006】図4は、3次元表面形状データをワイヤフ
レーム表示した例を示す。グラフィックス表示の手法
は、ワイヤフレーム表示の他にカラーコンタ図表示等が
あり、グラフィックスソフトにより種々の表示が可能で
ある。いずれの場合も、x−y平面に計測面がある場
合、計測データとしては、z方向の高さ行列データ[z
(x,y)]が用いられている。本例で用いた計測デー
タは、z=±1μmの範囲で、高さ行列データ[z
(x,y)]をランダム生成したものであり、x方向お
よびy方向に異方性はない。
FIG. 4 shows an example in which three-dimensional surface shape data is displayed in wire frame. In addition to wire frame display, color contour diagram display and the like can be used as a graphic display method, and various displays can be made by graphics software. In any case, when the measurement surface is on the xy plane, the height matrix data in the z direction [z
(X, y)] is used. The measurement data used in this example is the height matrix data [z
(X, y)] is randomly generated, and there is no anisotropy in the x direction and the y direction.

【0007】図5は、図4で用いた計測データを、x方
向に低域フィルタ処理して得られる3次元表面うねりデ
ータのワイヤフレーム表示である。x方向はなだらかな
凹凸になっているが、y方向には細かな凹凸が残ってい
ることがわかる。本例で用いた低域フィルタは、JIS
B 0601で規定されている位相補償型フィルタで
ある。
FIG. 5 is a wireframe display of three-dimensional surface waviness data obtained by low-pass filtering the measurement data used in FIG. 4 in the x direction. It can be seen that there are gentle irregularities in the x direction, but fine irregularities remain in the y direction. The low-pass filter used in this example is JIS
It is a phase compensation type filter defined by B0601.

【0008】図6は、図4で用いた計測データから、x
方向に低域フィルタ処理して得られる3次元表面うねり
データを減算処理することにより得られる3次元表面粗
さデータのワイヤフレーム表示である。x方向は細かな
凹凸になっているが、y方向は大きな凹凸が残っている
ことがわかる。
FIG. 6 shows x from the measurement data used in FIG.
3 is a wireframe display of 3D surface roughness data obtained by subtracting 3D surface waviness data obtained by low-pass filtering in the direction. It can be seen that there are fine irregularities in the x direction, but large irregularities remain in the y direction.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、従来法
による3次元表面うねりおよび3次元表面粗さデータ
は、図5および図6から明らかなように、擬似的な3次
元データであり、本来の3次元表面形状の特徴をあらわ
すデータではないことがわかる。
However, as is apparent from FIGS. 5 and 6, the three-dimensional surface waviness and the three-dimensional surface roughness data obtained by the conventional method are pseudo three-dimensional data, and the original three-dimensional data are obtained. It can be seen that the data does not represent the characteristics of the three-dimensional surface shape.

【0010】また、3次元表面うねりおよび3次元表面
粗さの諸パラメータは、JIS B0601、JIS
B 0610で規定されている2次元パラメータの定義
を3次元に拡張することにより得ることができるが、従
来法では、諸パラメータ算出の根拠となるデータが正確
でないため、諸パラメータの数値も本来の3次元表面形
状を正確に評価できるものではない。
Various parameters of the three-dimensional surface waviness and the three-dimensional surface roughness are defined in JIS B0601 and JIS.
It can be obtained by expanding the definition of the two-dimensional parameter defined in B 0610 into three dimensions, but in the conventional method, since the data that is the basis for calculating the various parameters is not accurate, the numerical values of the various parameters are also the original values. It cannot accurately evaluate the three-dimensional surface shape.

【0011】そこで、本発明は、従来の3次元表面形状
データの処理方法では困難であった、3次元表面うねり
および3次元表面粗さの正確なデータを得ることのでき
る3次元表面形状データの処理方法を提供することを目
的とするものである。
Therefore, according to the present invention, it is difficult to obtain the accurate data of the three-dimensional surface waviness and the three-dimensional surface roughness, which is difficult with the conventional method of processing the three-dimensional surface shape data. It is intended to provide a processing method.

【0012】[0012]

【課題を解決するための手段】本発明者らは、上記課題
を解決するために、3次元表面形状データを処理する方
法を種々検討した結果、2次元低域フィルタを用いて3
次元表面形状データを処理することにより、正確な3次
元表面うねりおよび3次元表面粗さデータを求められる
ことを見出した。
In order to solve the above-mentioned problems, the present inventors have studied various methods for processing three-dimensional surface shape data, and as a result,
It was found that accurate 3D surface waviness and 3D surface roughness data can be obtained by processing the 3D surface shape data.

【0013】本発明の要旨は、(1)3次元表面形状・
粗さ計等により得られる3次元表面形状データから、3
次元表面うねりデータを求める3次元表面形状データの
処理において、3次元表面形状の高さ行列データに、2
次元低域フィルタ処理を行い、3次元表面うねりの高さ
行列データを得ることを特徴とする3次元表面形状デー
タの処理方法、(2)3次元表面形状・粗さ計等により
得られる3次元表面形状データから、3次元表面粗さお
よび3次元表面うねりデータを求める3次元表面形状デ
ータの処理において、3次元表面形状の高さ行列データ
から、該行列データの2次元低域フィルタ処理により得
られる3次元表面うねりの高さ行列データを減算するこ
とにより、3次元表面粗さの高さ行列データを得ること
を特徴とする3次元表面形状データの処理方法、(3)
低域フィルタが位相補償型フィルタであることを特徴と
する、前記(1)または(2)に記載の3次元表面形状
データの処理方法である。
The gist of the present invention is (1) three-dimensional surface shape
3 from the three-dimensional surface shape data obtained by a roughness meter etc.
In the processing of the three-dimensional surface shape data for obtaining the three-dimensional surface waviness data, the height matrix data of the three-dimensional surface shape is set to 2
3D surface shape data processing method characterized by obtaining 3D surface waviness height matrix data by performing 3D low-pass filter processing, (2) 3D obtained by 3D surface shape / roughness meter, etc. Obtaining 3-dimensional surface roughness and 3-dimensional surface waviness data from surface shape data. Obtaining 3-dimensional surface shape data from the height matrix data of the 3-dimensional surface shape by 2-dimensional low-pass filtering of the matrix data. Processing method of three-dimensional surface shape data, characterized in that height matrix data of three-dimensional surface roughness is obtained by subtracting height matrix data of three-dimensional surface waviness,
The method of processing three-dimensional surface shape data according to (1) or (2) above, wherein the low-pass filter is a phase compensation filter.

【0014】[0014]

【発明の実施の形態】以下、本発明の実施の形態を実施
例にもとづいて説明する。図1は、本発明によるフロー
チャートを示す。本例は、計測面がx−y平面にあり、
高さ方向の行列データが3次元表面形状データ[z
(x,y)]として記録されている場合を示す。3次元
表面形状データ[z(x,y)]に2次元低域フィルタ
処理を行うことにより、3次元表面うねりデータ[zw
(x,y)]を得る。2次元フィルタ処理は、x方向デ
ータにまずフィルタ処理を行い、次に得られたデータに
y方向のフィルタ処理を行う処理である。まずy方向、
次にx方向にフィルタ処理を行っても結果は同じとな
る。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below based on examples. FIG. 1 shows a flow chart according to the present invention. In this example, the measurement plane is in the xy plane,
The matrix data in the height direction is three-dimensional surface shape data [z
(X, y)] is recorded. By performing the two-dimensional low-pass filter processing on the three-dimensional surface shape data [z (x, y)], the three-dimensional surface waviness data [zw
(X, y)] is obtained. The two-dimensional filtering process is a process of first filtering the x-direction data and then filtering the obtained data in the y-direction. First in the y direction,
The same result will be obtained if filter processing is performed in the x direction next.

【0015】3次元表面形状データ[z(x,y)]か
ら3次元表面うねりデータ[zw(x,y)]を減算処
理することにより、3次元表面粗さデータ[zr(x,
y)]を得る。
By subtracting the three-dimensional surface waviness data [zw (x, y)] from the three-dimensional surface shape data [z (x, y)], the three-dimensional surface roughness data [zr (x,
y)] is obtained.

【0016】本実施例で用いた低域フィルタは、JIS
B 0601で規定されている位相補償型フィルタで
ある。位相補償型低域フィルタを用いたのは、フィルタ
としての機能が優れていることと、JISで規定されて
いる2次元の諸パラメータとの互換性を保つためであ
る。
The low-pass filter used in this embodiment is JIS
It is a phase compensation type filter defined by B0601. The reason why the phase compensation type low pass filter is used is that the function as a filter is excellent and the compatibility with the two-dimensional parameters defined by JIS is maintained.

【0017】図2に、図4のグラフィックス表示に用い
た計測データを、本発明によるデータ処理方法により求
めた3次元表面うねりデータのワイヤフレーム表示を示
す。従来法による図5と比較すれば明らかなように、x
方向およびy方向いずれもなだらかな凹凸のみが抽出さ
れており、3次元表面うねりデータを正確に表示できて
いることがわかる。
FIG. 2 shows a wire frame display of the three-dimensional surface waviness data obtained by the data processing method according to the present invention from the measurement data used for the graphic display of FIG. As is clear from comparison with FIG. 5 by the conventional method, x
Only the smooth unevenness is extracted in both the direction and the y direction, and it can be seen that the three-dimensional surface waviness data can be accurately displayed.

【0018】図3に、図4のグラフィックス表示に用い
た計測データを、本発明による方法でデータ処理し求め
た3次元表面粗さデータのワイヤフレーム表示を示す。
従来法による図6と比較すれば明らかなように、x方向
およびy方向いずれも細かな凹凸のみが抽出されてお
り、3次元表面粗さデータを正確に表示できていること
がわかる。
FIG. 3 shows a wire frame display of the three-dimensional surface roughness data obtained by processing the measurement data used for the graphic display of FIG. 4 by the method according to the present invention.
As is clear from comparison with FIG. 6 according to the conventional method, only fine irregularities are extracted in both the x direction and the y direction, and it can be seen that the three-dimensional surface roughness data can be displayed accurately.

【0019】[0019]

【発明の効果】本発明による3次元形状データの処理方
法によれば、従来法では困難であった3次元表面うねり
および3次元表面粗さの正確なデータを得ることがで
き、機械加工部品や電子部品等の機能や表面品質の評価
が正確に行えるばかりでなく、互いに接触する材料表面
の摩擦や摩耗の特性をより正確に解析することができる
ようになり、工業分野および学術分野における効果は大
きい。
According to the three-dimensional shape data processing method of the present invention, it is possible to obtain accurate data of three-dimensional surface waviness and three-dimensional surface roughness, which were difficult to obtain by the conventional method. Not only can the functions and surface quality of electronic parts be accurately evaluated, but the friction and wear characteristics of the material surfaces that come into contact with each other can be analyzed more accurately. large.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による表面形状データの処理方法のフロ
ーチャートである。
FIG. 1 is a flowchart of a method for processing surface shape data according to the present invention.

【図2】本発明による3次元表面うねりデータのグラフ
ィックス表示の実施例である。
FIG. 2 is an example of a graphic display of three-dimensional surface waviness data according to the present invention.

【図3】本発明による3次元表面粗さデータのグラフィ
ックス表示の実施例である。
FIG. 3 is an example of a graphic display of three-dimensional surface roughness data according to the present invention.

【図4】データ処理前の3次元表面形状データのグラフ
ィックス表示の一例である。
FIG. 4 is an example of a graphic display of three-dimensional surface shape data before data processing.

【図5】従来法による3次元表面うねりデータのグラフ
ィックス表示の一例である。
FIG. 5 is an example of a graphic display of three-dimensional surface waviness data by a conventional method.

【図6】従来法による3次元表面粗さデータのグラフィ
ックス表示の一例である。
FIG. 6 is an example of a graphic display of three-dimensional surface roughness data by a conventional method.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 3次元表面形状・粗さ計等により得られ
る3次元表面形状データから、3次元表面うねりデータ
を求める3次元表面形状データの処理方法において、3
次元表面形状の高さ行列データに、2次元低域フィルタ
処理を行い、3次元表面うねりの高さ行列データを得る
ことを特徴とする3次元表面形状データの処理方法。
1. A method of processing three-dimensional surface shape data for obtaining three-dimensional surface waviness data from three-dimensional surface shape data obtained by a three-dimensional surface shape / roughness meter or the like.
A method of processing three-dimensional surface shape data, characterized in that height matrix data of a three-dimensional surface shape is subjected to two-dimensional low-pass filter processing to obtain height matrix data of three-dimensional surface waviness.
【請求項2】 3次元表面形状・粗さ計等により得られ
る3次元表面形状データから、3次元表面粗さおよび3
次元表面うねりデータを求める3次元表面形状データの
処理方法において、3次元表面形状の高さ行列データか
ら、該行列データの2次元低域フィルタ処理により得ら
れる3次元表面うねりの高さ行列データを減算すること
により、3次元表面粗さの高さ行列データを得ることを
特徴とする3次元表面形状データの処理方法。
2. From the three-dimensional surface shape data obtained by a three-dimensional surface shape / roughness meter, etc., the three-dimensional surface roughness and 3
In a method of processing three-dimensional surface shape data for obtaining three-dimensional surface waviness data, height matrix data of three-dimensional surface shape is obtained from height matrix data of the three-dimensional surface shape by three-dimensional low-pass filtering of the matrix data. A method of processing three-dimensional surface shape data, characterized in that height matrix data of three-dimensional surface roughness is obtained by subtraction.
【請求項3】 低域フィルタが位相補償型フィルタであ
ることを特徴とする、請求項1または請求項2記載の3
次元表面形状データの処理方法。
3. The low-pass filter according to claim 1, wherein the low-pass filter is a phase compensation filter.
Dimensional surface shape data processing method.
JP9838396A 1996-04-19 1996-04-19 Method for processing data of three-dimensional surface shape Withdrawn JPH09287936A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9838396A JPH09287936A (en) 1996-04-19 1996-04-19 Method for processing data of three-dimensional surface shape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9838396A JPH09287936A (en) 1996-04-19 1996-04-19 Method for processing data of three-dimensional surface shape

Publications (1)

Publication Number Publication Date
JPH09287936A true JPH09287936A (en) 1997-11-04

Family

ID=14218353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9838396A Withdrawn JPH09287936A (en) 1996-04-19 1996-04-19 Method for processing data of three-dimensional surface shape

Country Status (1)

Country Link
JP (1) JPH09287936A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013096175A (en) * 2011-11-02 2013-05-20 Taisei Corp Evaluation device for concrete placing joint surface
JP2021025220A (en) * 2019-07-31 2021-02-22 株式会社大林組 Roughness evaluation device for construction joint surface and roughness evaluation system for construction joint surface

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013096175A (en) * 2011-11-02 2013-05-20 Taisei Corp Evaluation device for concrete placing joint surface
JP2021025220A (en) * 2019-07-31 2021-02-22 株式会社大林組 Roughness evaluation device for construction joint surface and roughness evaluation system for construction joint surface

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