JPH09264805A - Dynamic balancing machine - Google Patents

Abstract

PROBLEM TO BE SOLVED: To obtain a dynamic balancing machine in which the degree of freedom of the selection of a correctable place is increased irrespective of the order of a correction. SOLUTION: A plurality of correctable places at a sample are stored in a memory M1 in advance as a component-force pattern, and the component force pattern is stored in a working memory M2 in a correction operation. In the component-force pattern, the plurality of correctable places C1 to C16 are expressed as a circle so as to be arranged on the circumference at equal intervals, and they are displayed on a display device DP. The correctable places which are used in a correction are selected from the plurality of correctable places, and a component-force correction amount in the selected places is computed. The correctable places which are cut by a correction device CD are deleted from the component-force pattern which is stored in the working memory M2. The component-force pattern is displayed on the display device DP. In a first-order correction, all the correctable places in the component-force pattern can be used. In a second-order correction, the correctable places which are not used in the first-order correction are used so as to be corrected. Since the correctable places can be used irrespective of the order of a correction, the degree of freedom of the correction is enhanced.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dynamic balance tester capable of correcting a measured imbalance.

[0002]

2. Description of the Related Art In a rotating test piece such as the motor rotor MT shown in FIG. 4, the detected unbalance amount is often removed by component force correction. Further, when the peripheral surface of the sample is removed by a cutting tool such as a milling cutter (shown by reference numeral 30 in FIG. 4) to correct the imbalance, it is difficult to cut the same portion a plurality of times to correct. In the second revision,
It is necessary to cut the parts that were not cut in the primary correction. Therefore, conventionally, for example, as shown in FIG. 5, a correction point A that can be cut by the primary correction and a correction point B that can be cut by the secondary correction are separately defined in advance, and when the secondary correction is performed. The primary correction points are not cut again.

[0003]

However, since the primary correctable portion and the secondary correctable portion are previously assigned to different portions, the degree of freedom of correction is small and effective correction may not be possible.

An object of the present invention is to provide a dynamic balance tester which can increase the degree of freedom in selecting a correctable portion regardless of the correction order.

[0005]

According to the present invention, a storage means for storing a plurality of correctable portions of a specimen and a plurality of correctable portions stored in the storage means according to a detected imbalance are stored. Comprising: a calculating means for selecting at least one place from the inside and calculating a correction amount at the correctable portion; and a prohibiting means for preventing the correctable portion selected by the calculating means from being selected in the next correction. To do.

Since the correctable portion stored in the storage means is not associated with the correction order, it is possible to select at least one of the stored correction portions for any correction order. The prohibiting means prevents selection from being made in the correction operation next to the correctable portion once selected as the correction portion.

[0007]

FIG. 1 is a diagram showing a case where a dynamic balance tester according to the present invention is configured as an automatic machine. This automatic machine mainly comprises an unbalance measuring device DT, a correction device CD for cutting and correcting the measured unbalance, a robot RB for transporting a specimen between the two devices, and a control circuit for comprehensively controlling the whole. A CU and a display device DP for displaying various information are provided.

The unbalance measuring device DT detects the amount of unbalance of the specimen rotated by the motor 1 with the unbalance detection sensor 2 and detects the reference position signal indicating the reference position of the specimen with the reference position sensor 3. To the control circuit CU. The control circuit CU has an arithmetic unit AL, which calculates an unbalance amount and an unbalance position based on signals from the unbalance detection sensor 2 and the reference position sensor 3, and further corrects by a component force calculation. Calculate the location and cutting depth. These correction locations and cutting depths are supplied to a correction device CD.

The robot RB grips the test sample set in the measuring device DT, transports it to the correction device CD, and sets it. The correction device CD causes the corrected portion of the specimen to face the tool based on the corrected portion information sent from the measuring device DT, and cuts by the calculated cutting depth. That is, while the specimen is rotated by the motor 11, a corrected portion is determined by a signal from the position sensor 12, and the determined corrected portion is cut to a predetermined depth by the cutting tool 13 to correct the imbalance.

The control circuit CU includes a memory M1 and a working memory M.
2 and the component force pattern shown in FIG. 2A is stored in the memory M1. The component force pattern is set for each specimen shape, and in this example, a 16-pole motor rotor is targeted, and component force correction points C1 to C16 divided every 22.5 degrees are circled on the circumference. It is represented by a mark.
A plurality of parts capable of component force correction stored in the memory M1 are erased when used for component force correction. The control circuit CU selects from among the parts capable of correcting the component force stored in the memory M1,
A portion corresponding to the detected unbalanced position and the unbalanced amount is selected, and the correction amount of the selected portion is calculated as a component force. The component force pattern is displayed on the display device DP.

FIG. 3 is a flow chart showing the procedure of imbalance measurement and imbalance correction processing in the control circuit CU. In step S1, the unbalance of the sample is measured by the unbalance measuring device DT by a known method, and the unbalance amount and the unbalance position are calculated. In step S2, it is determined from the magnitude of the unbalance amount whether correction is necessary. If the amount of unbalance is equal to or smaller than the predetermined value, the determination is negative and the process ends. If correction is required, the process proceeds to step S3. When it is determined in step S3 that the primary correction is performed, the process proceeds to step S4, and the component force pattern shown in FIG. 2A which is set in advance for each specimen is read from the memory M1 and set in the work memory M2, and displayed. It is displayed on the device DP.

In step S5, the cutting location and the cutting amount of the location are calculated based on the correctable portion of the read component force pattern, the detected unbalance amount, and the unbalance position. The component force pattern as shown in 2 (b) is displayed on the display device DP. In step S7, those cutting locations and cutting depths are output to the correction device CD. The correction device CD drives the cutting tool 13 to cut the test piece and perform the correction work. When the correction work is completed, the process proceeds to step S8, and the cutting location where the correction work is performed is stored in step S7. In step S9, the cut portion is erased from the component force pattern of the working memory M2, and the component force pattern after the deletion is displayed on the display device DP. After that, the process proceeds to step S10, and the corrected component force pattern is stored again in the work memory M2. If it is determined in step S12 that the correction work is completed, this process is ended, and if it is determined that the correction work is continued, the process returns to step S1 and unbalanced measurement is performed. Step S3 is denied in the secondary measurement, and the correction force and the cutting depth in step S5 at the time of the secondary correction use the component force pattern of the working memory M2 stored again in step S10.

The processing according to the above procedure is shown in FIG.
A more specific description will be given with reference to (d). The component force pattern set in the work memory M2 at the start of work is shown in FIG.
As shown in (a), 16 component force correction points divided every 22.5 degrees are represented by circles on the circumference. The correction amount of each correction point is 2 mg, and 2 mg can be corrected in all the component force correction points before the primary correction, and 16 circles are displayed. As a result of the unbalance measurement, the unbalance vector U1 is calculated, and when the correction points C1 to C3 are selected in the primary correction by the component force correction calculation, the correction points C1 to C1 selected as shown in FIG. C3 is hatched. The unbalance vector U1 is also displayed.

By the primary correction, each of the cutting points C1 and C2 is corrected by 2 mg, and the cutting point C3 is adjusted to 1 m.
When the correction of g is performed, after the cutting correction, as shown in FIG. 2C, the cutting positions C1 and C2 are erased from the component force pattern, and the cutting position C3 becomes a semicircle display. The semi-circular correctable portion C3 indicates that 1 mg can be further corrected. After that, the specimen is disproportionately measured DT
Set to and measure the imbalance again. The measured imbalance vector is indicated by U2 as shown in FIG. 2D, and the cutting points C16, C3, and C4 are selected. FIG.
In (d), the cutting points C16 and C4 are corrected by 2 mg, and the cutting point C3 is corrected by 1 mg. The specimen is set on the correction device CD, and the correction data is supplied to the correction device CD to perform the correction work.

When the correction work is completed by the secondary correction, step S10 is affirmed and the imbalance measurement and the correction work are completed. If the unbalance measurement and correction are performed until the unbalance amount becomes equal to or less than the predetermined value, step S
This process is continued until it is determined in step 2 that the correction is unnecessary.

The object to be measured is not limited to the motor rotor, but is a test piece whose component force is to be corrected, that is, a flywheel, a clutch plate, a cooling fan, etc., in which the correction position cannot be freely selected. The present invention can be applied to a device. Further, the component force pattern is not limited to that shown in FIG. 2, and may be any pattern as long as it is a display form in which the correctable portion is shown. Furthermore, displaying the component force pattern is not essential to the present invention, and it suffices that the component force correctable portion can be freely selected regardless of the correction order. Therefore, a display device that displays the component force pattern as shown in FIG. It may be omitted. Furthermore, the case where the imbalance correction is automatically performed from the imbalance measurement has been described. However, the present invention can be applied to the case where the imbalance correction is automatically performed and the operator puts the measured specimen into the repair machine. .
In addition, in (c) and (d) of FIG. 2, if the correctable portion selected in the primary correction can be further selected in the secondary correction, the display form is changed (in this example, a semicircle). Although the component force pattern is displayed, it may not be displayed if selected in the primary correction. Alternatively, although the correctable portion used in the primary correction is deleted from the component force pattern stored in the memory M2, the use may be prohibited by some method.

In the embodiment configured as described above, the arithmetic unit AL serves as the arithmetic means and the prohibition means in the memories M1 and M.
2 corresponds to the storage means, respectively.

[0018]

According to the present invention, a plurality of correctable portions of a specimen that can be selected regardless of the correction order are stored, and the portion used for the correction is specified among the correctable portions to perform the next correction. Since the use of that portion is prohibited, the degree of freedom in selecting the corrected portion is increased regardless of the correction order, and the correction efficiency is improved.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment in which a dynamic balance testing machine according to the present invention is an automatic machine.

FIG. 2 is a diagram showing an example of a component force pattern.

FIG. 3 is a flowchart showing a processing procedure of the automatic machine.

FIG. 4 is a perspective view of a motor rotor that is a measurement correction target.

FIG. 5 is a diagram illustrating a conventional method of assigning a modifiable location.

[Explanation of symbols]

 DT imbalance measuring device CD correction device CU control circuit AL arithmetic unit M1 memory M2 working memory

Claims (1)

[Claims] 1. A dynamic balance tester for detecting an imbalance of a rotating specimen and correcting the imbalance, wherein a storage means for storing a plurality of correctable portions of the specimen and the detected imbalance. Accordingly, at least one location is selected from a plurality of modifiable locations stored in the storage means, and a computing means for computing a modification amount at the modifiable location; and the modifiable location selected by the computing means A dynamic balance testing machine, characterized in that it is provided with a prohibiting means that prevents a portion from being selected by a calculation in the next correction.