JPH09243334A - Quality inspecting device of padding part - Google Patents

Abstract

PROBLEM TO BE SOLVED: To interpolate a foreign matter, even if present around a padding part, and provide a precise inspection result by emitting a slit-like light so that a projected line is right-angled to the padding part, and taking the image of the reflected light followed by storing. SOLUTION: A slit-like light is emitted so that a projected line 2 is substratially right-angled to a padding part, the reflected light is taken by a CCD camera 22, and the two-dimensional image data is stored 26. A rotating means 30 relatively rotates the camera 22 and a subject P to be inspected so that the whole circumference of the padding part can be photographed. A one- dimensional converting part 42 converts the image-picked up two-dimensional data into a one-dimensional data and stores 44 it. A reference plane interpolating arithmetic part 52 verifies the uniformity of the reference plane positions on both sides of the padding part of the one-dimensional data, interpolates a non- uniform reference plane position with the value of a master data, and then stores 54 it as an interpolated measurement data. The characteristic value of the interpolates measurement data is compared with a set standard value to judge the quality of the padding part.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for inspecting the quality of a portion that has been subjected to build-up processing (hereinafter referred to as a build-up processing section). The present invention relates to a quality inspection device for a built-up processing section that can obtain accurate inspection results by interpolating this even if there is.

[0002]

2. Description of the Related Art A piston for an automobile engine is formed of an aluminum alloy in order to reduce the weight and enhance the thermal conductivity. While supplying a copper-based build-up alloy powder between the upper portion of the piston and the skirt portion. A so-called padding process of irradiating a laser beam is performed.

In this type of build-up processing step, since it is necessary to perform a quality inspection of all the build-up processing parts in real time, a non-contact inspection device to which the optical cutting method is applied is used. The conventional inspection device converts the two-dimensional image data of the surface shape including the build-up portion into one-dimensional data, distinguishes the build-up portion from other general surfaces, and then determines the height or width of the build-up portion as a reference. Goods and defectives are discriminated depending on whether or not it has reached (for example, JP-A-5-7).
No. 1,932).

[0004]

However, in the conventional inspection apparatus, since the bead height and the like of the build-up portion are calculated with reference to the general surface outside the build-up portion, foreign matter such as spatter is generated on the general surface. If they are attached, the height of the reference general surface itself includes an error, and it is not uncommon for the height of the standard surface to be determined to be a defective product even though it is a good product.

The present invention has been made in view of the above problems of the prior art. Even if a foreign substance is present around the buildup portion, the foreign substance is interpolated to obtain an accurate inspection result. It is an object of the present invention to provide a quality inspection device for a built-up processing unit that can perform the above.

[0006]

In order to achieve the above object, a quality inspection device for a built-up portion of the present invention according to claim 1 is provided on a side surface of a cylindrical inspection object along a circumferential direction. A quality inspection device for a built-up processing part, which inspects the processing quality of the built-up processing part, wherein the projection light irradiates a slit-shaped light so that the projection line is substantially perpendicular to the built-up processing part. A light means, an image pickup means for picking up the reflected light of the projection line irradiated to the build-up processing section and storing it as two-dimensional image data, and the whole circumference of the build-up processing section so that it can be picked up. Rotation driving means for relatively rotating the light projecting means and the imaging means and the inspection object, and one-dimensional data conversion means for converting the two-dimensional image data imaged by the imaging means into one-dimensional data and storing the one-dimensional data. And the overlay in each of the one-dimensional data The uniformity of the reference surface positions on both sides of the processed part is verified, and the non-uniform reference surface position is interpolated by the value of the master data of the preset reference surface position, and then the reference surface interpolation means is stored as the interpolated measurement data. And a quality determination unit that compares the characteristic value of the interpolated measurement data with a preset reference value to determine whether the quality of the buildup processing portion is good or bad.

According to another aspect of the present invention, there is provided a quality inspection device for a built-up processing part, in which the rotation driving means can pick up an image of the entire circumference of the built-up processing part of an object to be inspected. While relatively rotating the inspection object, the light projecting means irradiates slit-shaped light so that the projection line is substantially perpendicular to the buildup portion of the inspection object. Then, the reflected light is sequentially stored as two-dimensional image data while being imaged by the imaging means, and then the one-dimensional data conversion means
Each of these two-dimensional image data is converted into one-dimensional data and stored. As described above, according to the present invention, two-dimensional image data is converted without using the two-dimensional image data as it is.
Since the dimensional data is used, the time required for the data conversion process can be shortened.

Next, the one-dimensional data stored in the one-dimensional data converting means is taken out, and the uniformity of the reference plane positions on both sides of the buildup portion, that is, the variation is verified. If the one-dimensional data of the reference plane position is uniform and does not vary, the value of the reference plane position for the one-dimensional data is used as it is, but if the reference plane position is not uniform in a certain one-dimensional data, Means that foreign matter such as spatter may adhere to both sides of the built-up portion.
For the one-dimensional data, 1 of the non-uniform reference plane position
The dimension data is discarded and replaced with the value of the master data of the preset reference plane position.

After performing the above interpolation on all the one-dimensional data, these are stored as interpolation measurement data. As a result, even if a foreign substance adheres to the periphery of the buildup portion and an error occurs in the one-dimensional data, the interpolation measurement data after the interpolation can be data that does not include an error because the interpolation can be performed using the accurate reference plane position data. .

Finally, the above-mentioned interpolated measurement data is fetched into the quality judgment means, the characteristic value of the interpolated measurement data is compared with a preset reference value, and if it is within the allowable range, the object to be inspected is determined to be non-defective. If it is out of the allowable range, it is determined as a defective product.

Further, in the quality inspection device for the build-up processing part according to the second aspect, the object to be inspected is a cylindrical object having a non-perfect circular cross section.

When the reference plane position is non-uniform, the above-mentioned master data is used for interpolation. However, for the object to be inspected whose cross section is not a perfect circle, the distance between the image pickup means and the reference plane position is periodic. Paying attention to the fluctuation in the profile, the phase of the master data is slid to superimpose the one-dimensional data and the master data to interpolate the one-dimensional data of the non-uniform reference plane position.

[0013]

According to the quality inspection device for the build-up processing section according to the first aspect of the present invention, the 2D image data can be used as it is without using the 2D image data.
Since the one-dimensional data obtained by converting the three-dimensional image data is used,
The time required for the data conversion processing can be shortened.
Further, even if foreign matter adheres to the periphery of the build-up processing portion and an error occurs in the one-dimensional data, interpolation is performed using the master data of the accurate reference plane position, so the interpolated measurement data after interpolation does not include an error. Becomes

Further, according to the quality inspection device for the build-up processing section according to the second aspect, since the reference plane position changes in a periodic profile is used, even if the cross section is a non-perfect circle, the master data is used. The interpolation process by can be performed very easily.

[0015]

Embodiments of the present invention will be described below with reference to the drawings. FIG. 6A is an exploded perspective view showing a general piston P, and FIG. 6B is a cross-sectional view of the piston P taken along the line BB in FIG. 6A. The piston P made of an aluminum alloy is The piston pin PP is connected to the connecting rod C, and the rotation of the crankshaft (not shown) is converted into vertical movement. Further, the piston P is shown in FIG.
As shown in (B), since the portion P1 supporting the piston pin PP is formed thick, thermal expansion easily occurs in the horizontal direction with respect to the vertical direction in the figure. Therefore, the piston P
The cross section of is a short ellipse in the left-right direction. In such a piston P, the piston upper part and the skirt part are connected at the upper part of the piston pin PP, and a buildup process is performed here.

The overlay processing on the aluminum base material has been previously proposed by the applicant of the present application, for example, Japanese Patent Laid-Open No. 4-17.
The technique disclosed in Japanese Patent No. 2,193 can be used. That is, a copper-based alloy powder for overlay welding, which has excellent heat resistance, wear resistance, corrosion resistance, etc., is supplied to the overlay processing unit 1 while irradiating a high-density energy source such as a laser beam, and thereby the aluminum-based base metal To build up the alloy. However, the quality inspection device for the build-up processing portion of the present invention is not limited to the build-up processing method at all, and it is also applicable to the build-up processing portion formed by another build-up processing method. Not to mention. Further, it can be applied to the quality inspection of the weld bead outside the build-up processing part.

The build-up processing portion 1 of this type is quality-inspected by its appearance, for example, its height and width, to see whether it has been properly alloyed. FIG. 1 is a configuration diagram showing an embodiment of a quality inspection device for a built-up processing part of the present invention, in which a piston P as an object to be inspected is placed on a rotary table 32 with its top part facing down. The rotary table 32 is rotated at a constant speed by a motor 34, and the entire circumference of the buildup processing portion 1 provided on the side surface of the piston P is imaged by a CCD camera 22 described later. In the present embodiment, the rotary table 32
The motor 34 constitutes a rotation driving means, but as another form, the piston P may be fixed in position and the semiconductor laser 10 and the CCD camera 22 may be rotated around the piston.

Since the inspected object P of this embodiment has an elliptical cross section as described above, the distance between the side surface of the piston P and the CCD camera 22 regularly fluctuates as the rotary table 32 rotates. FIG. 4 is a conceptual diagram showing this state, and the elliptical piston P is exaggeratedly shown. However, as the piston P rotates, the larger diameter is the CCD camera 22.
The distance from the CCD camera 22 is the shortest when the image is captured by the CCD camera 22 and the distance from the CCD camera 22 is the largest when the smaller diameter is captured by the CCD camera 22, so the CCD camera 22 is the closest. When the image data captured in 1 is converted into one-dimensional data, it becomes regular profile data as shown in the right diagram of FIG. Points A, B, C and D shown on the left side of the figure correspond to points A, B, C and D on the right side of the one-dimensional data, respectively. Therefore, by utilizing this property, the position of the piston P in the circumferential direction can be confirmed without providing the rotary table 32 with a detector such as an encoder.

The side surface of the above-mentioned piston P is irradiated with slit-shaped light from a semiconductor laser 10 which is a light-projecting means, and this slit-shaped light is vertically projected with a built-up portion 1 interposed therebetween. 1 is formed so that
Is irradiated at a substantially right angle to the extending direction of. Projecting means 10
Has a function of condensing laser light from, for example, a laser oscillator with a collimator lens and converting it into slit-shaped laser light with a cylindrical lens.

In the quality inspection apparatus of this embodiment, a CCD camera 22 for picking up the projection line 2 of the laser light emitted from the light projecting means 10 is installed, and an image of the side surface of the piston P including the reflected light is displayed. It is read as an analog signal at predetermined time intervals. Also, this analog signal is A / D
After being converted into a digital signal by the conversion unit 24, each image information is stored in the image storage unit 26 as two-dimensional image data. The CCD camera 22, the A / D conversion unit 24, and the image storage unit 26 constitute the image pickup means 20 of the present invention.

If the two-dimensional image data stored in the image storage unit 26 is subjected to image processing as it is, an enormous amount of pixels will be processed, and a large amount of time will be required for processing using a general-purpose computer. Therefore, in the present embodiment, in order to shorten the inspection time of the quality inspection of the build-up processing unit 1, the two-dimensional image data converted into one-dimensional data is used. That is, in the one-dimensional conversion unit 42, the two-dimensional image data stored in the image storage unit 26 is read one by one, the projected line 2 having the highest brightness is extracted for each horizontal scanning line, and the coordinates thereof are obtained and obtained. 1-dimensional data obtained
It is stored in the dimension data storage unit 44.

Specifically, as shown in the right diagram of step 100 in FIG. 2, the horizontal scanning line S of the CCD camera 22 and the light projecting line 2 are made orthogonal to each other in the one-dimensional conversion unit 42. , The binarization processing by the luminance is performed for each horizontal scanning line S. As a result, one point having the highest brightness is determined for each horizontal scanning line S, so that the two-dimensional image data can be converted into one-dimensional data. The obtained one-dimensional data is stored in the one-dimensional data storage unit 44 in xy coordinates as shown on the right side of step 200 in FIG.

Here, as shown in the right diagram of step 100 in FIG. 2, when the sputter SP at the time of processing adheres to the periphery of the built-up processing portion 1, the laser light projecting line 2 also makes this spatter. In response to SP, the one-dimensional data after conversion becomes a curve SP 'as shown in the right diagram of step 200 in FIG. This is essentially unnecessary data, and causes an error when calculating the height h of the overlay processing portion 1.

That is, the height h of the build-up processing portion 1 is determined by subtracting the average value of the reference plane position K from the maximum value of the one-dimensional data, as shown in the diagram on the right of step 300 in FIG. The height of the spatter SP is included when obtaining the average value of the surface position K, and the average value is larger than the original reference surface position K, and as a result, a value smaller than the actual height h of the build-up processing portion 1. Is calculated as the height h of the buildup processing portion 1.

In this embodiment, such a sputter SP is used.
In order to remove the error of the reference surface position K due to foreign matter such as
The reference plane interpolation means 50 is provided. Reference plane interpolation means 50
Confirms the uniformity of the reference plane position K of each one-dimensional data, that is, the variation, and if this variation is large,
A reference surface interpolation calculation unit 52 that recognizes that some foreign matter is attached to the reference surface and replaces the data of the reference surface position K with the value of the master data, and the one-dimensional data interpolated in this way. Is stored as interpolation measurement data.

The reference plane interpolation calculation section 52 reads the one-dimensional data stored in the one-dimensional data storage section 44 one by one, and first verifies the degree of variation in the reference plane position K. If this variation is within a preset allowable range, the one-dimensional data is used as it is and stored in the interpolated measurement data storage unit 54 without being interpolated. If the variation of the reference plane position K exceeds the permissible range, the coordinates of the reference plane position K are discarded and the blank data is used only for the one-dimensional data.

Such an operation is performed for all the one-dimensional data, and only the data of the reference plane position K is taken out as shown in FIG. 5 (A). In this example, two empty data a and b exist while the piston P makes one rotation. Here, as described above, since the cross section of the piston P is an ellipse,
The collective data of the reference planes will show a regular profile along the circumferential direction, and this profile matches the master data of the reference planes measured in advance for the pistons P having the same shape.

However, since it is unknown from which position in the circumferential direction the measurement of the piston P mounted on the rotary table 32 is started, the master data is superimposed on the measurement data in the reference plane interpolation calculation section 52. Is done. Specifically, as shown in FIG. 5A, first, one-dimensional data is read out, and the average value x _AV of the reference plane position K of this one-dimensional data is obtained. Then, it calculates the difference Δx between the average value x _AV reference plane position x ₁ of the measurement-start point m _1. FIG. 5B shows master data of the reference plane position K stored in advance in the reference plane calculation unit 52. When a position away from the average value X _AV of this master data by the difference Δx of the measurement data is obtained, 2 is obtained. Two points n ₁ and n ₂ are determined. FIG.
The measurement start point m ₁ in (A) is one of the two points n ₁ and n ₂ in FIG. Here, the next measurement point data m ₂ in FIG.
₂ -x ₁ by calculating the checks whether the second measurement point m ₂ with respect to the data of the measurement start point m ₁ is reduced what is increasing. Two points n ₁ and n ₂ shown in FIG.
While n ₁ is increased next measurement point, since the other n ₂ is reduced, the x ₁ -x ₂ + or - by determining the one of the two points n _1, n ₂ You can

With this, since the position of the measurement start point with respect to the master data is obtained, next, as shown in FIG. 5C, the phase of the profile of the master data is shifted, and as shown in FIG. Overlay the data on the measurement data. After this superposition is performed, the reference plane data at two points a and b, which are empty data in FIG. 5A, are quoted from the master data a ′ and b ′, and replaced with this, and then the interpolated measurement data is obtained. Is stored in the interpolated measurement data storage unit 54 as

By the above processing, step 300 in FIG.
1D data in which the reference plane is interpolated into accurate data as shown in the right diagram of FIG.
The one-dimensional interpolation measurement data stored in the interpolation measurement data storage unit 54 is compared with the reference data to determine the quality of the buildup processing unit 1. In this embodiment, the height h and the width w of the build-up processing unit 1 are adopted as the characteristic values of the build-up processing unit 1, and the quality determination unit 60 stores the reference values of the respective allowable ranges in advance. Then, the interpolated measurement data stored in the interpolated measurement data storage unit 54 are read out one by one to the quality determination unit 60, and the determination result is output by comparing the coordinates with the reference value.

Reference numeral "70" shown in FIG. 1 is a display unit composed of a CRT or the like, and includes two-dimensional image data stored in the image storage unit 26, one-dimensional data stored in the one-dimensional data storage unit 44, and interpolation measurement data. The interpolation measurement data stored in the storage unit 54 is displayed on the screen as needed. In addition, the variation reference value of the reference plane interpolation calculation unit 52 and the quality determination unit 60.
An input / output unit 80 including a floppy disk drive or the like is provided for exchanging the reference values of 1., and inputs information via various media and outputs processed determination results. In addition, each arithmetic unit has a data bus 9
It is connected by 0 so that data can be exchanged.

Next, the information processing procedure will be described. 2 is a flow chart showing the information processing procedure of the embodiment and a conceptual diagram of data, and FIG. 3 is a flow chart showing the procedure of FIG. 2 in more detail.

First, the piston P to be inspected is placed on the rotary table 32, and the motor 34 is driven to drive the piston P.
Rotate at a constant speed. At the same time, the semiconductor laser 10 irradiates the side surface of the piston P including the built-up portion 1 with slit-shaped laser light, and the reflected light is captured by the CCD camera 22 at predetermined time intervals. The analog signal from the CCD camera 22 is converted into a digital signal by the A / D conversion section 24 and then stored in the image storage section 26 as two-dimensional image data. This operation is executed until the piston P is rotated once to store all the two-dimensional image data in the image storage unit 26 (step 100 in FIG. 2 and steps 101 and 102 in FIG. 3).

Next, the two-dimensional image data stored in the image data storage unit 26 is converted into one-dimensional data conversion unit 42 one by one.
Then, the projected line 2 having the highest brightness is extracted for each horizontal scanning line S to obtain its coordinates, and the obtained one-dimensional data is stored in the one-dimensional data storage unit 44. That is, as shown in the right diagram of step 100 in FIG. 2, the horizontal scanning line S of the CCD camera 22 and the light projecting line 2 are orthogonalized in the one-dimensional conversion unit 42, and each horizontal scanning line S is scanned. Then, the binarization processing by the luminance is performed. As a result, one point having the highest brightness is determined for each horizontal scanning line S, so that the two-dimensional image data can be converted into one-dimensional data. The obtained one-dimensional data is used in step 20 of FIG.
0 is stored in the one-dimensional data storage unit 44 in xy coordinates as shown in the right diagram (step 200 in FIG. 2 and FIG.
Steps 201 and 202).

When the processing up to this point is completed, interpolation of the reference surface position K corresponding to the general surface of the piston P other than the built-up portion 1 is executed (step 300 in FIG. 2 and steps 301 to 301 in FIG. 3). 310). In this process, first, the one-dimensional data converted in step 202 and stored in the one-dimensional data storage section 44 is read one by one into the reference plane interpolation calculation section 52 (step 301), and only the data of the reference plane position K is taken out. Then, it is determined whether or not this data variation is within a preset range (step 302). If the variation in the reference plane position K is small, step 400
Since there is no effect on the build-up quality determination in (3), the data of the reference plane position K is temporarily stored as it is in the reference plane interpolation calculation unit 52 (step 303), but shown in the right diagram of step 200 in FIG. As described above, when the variation of the reference surface position K exceeds the allowable range due to the adhesion of the foreign matter SP or the like, the data of the reference surface position K is temporarily stored in the reference surface interpolation calculation unit 52 as empty data (step Thirty
4). This operation is executed for all the data stored in the one-dimensional data storage unit 44 (step 305).

Reference plane position K for all one-dimensional data
When the verification of the variation of the one-dimensional data is completed, one one-dimensional data is read out as shown in FIG. 5A, and the average value x _AV of the reference plane position K of this one-dimensional data is obtained (step 30
6), the reference plane position x ₁ and the average value x of the measurement start point m ₁
The difference Δx from _AV is calculated (step 307). FIG.
(B) is the master data of the reference plane position K stored in the reference plane calculation unit 52 in advance. When a position separated from the average value X _AV of this master data by the difference Δx of the measurement data is obtained, two points are obtained. n ₁ and n ₂ are determined, and the measurement start point m ₁ in FIG. 5A is one of the two points n ₁ and n ₂ in FIG. 5B.

Here, by reading the data of the next measurement point m ₂ in FIG. 5A and calculating x ₂ −x ₁ , the second measurement point m _{2 with} respect to the data of the measurement start point m _1. Check if is increasing or decreasing (step 30
7). While n ₁ of FIG. 5 2 points shown in (B) n _1, n ₂ is the increase in the next measurement point, since the other n ₂ is reduced, the x ₁ -x ₂ + or - by 2 Either of the points n ₁ and n ₂ can be defined.

With this, the position n ₁ of the measurement start point m ₁ with respect to the master data is obtained.
5, the phase of the profile of the master data is shifted, and the master data is superimposed on the measurement data as shown in FIG. 5D (step 308). After this superposition is performed, the reference plane data at two locations a and b, which are blank data in FIG. 5A, are quoted from the master data a ′ and b ′ and replaced with this (step 309). , Are stored in the interpolated measurement data storage unit 54 as interpolated measurement data (step 310).

By the above processing, step 300 in FIG.
As shown in the right diagram of FIG. 1, one-dimensional data in which the reference surface is interpolated into accurate data can be obtained.
At 0, the one-dimensional interpolated measurement data stored in the interpolated measurement data storage unit 54 is compared with the reference data, and the overlay processing unit 1
Of the quality is determined (step 400 in FIG. 2 and steps 401 to 403 in FIG. 3). In this embodiment, the height h and the width w of the build-up processing part 1 are the characteristic values of the build-up processing part 1.
Is adopted, and the reference value of each allowable range is stored in advance in the quality determination unit 60. Then, the interpolated measurement data stored in the interpolated measurement data storage unit 54 is read out one by one to the quality judgment unit 60, and the judgment result is output to the CRT 70 or the input / output unit 80 by comparing the coordinates with the reference value.

As described above, in the present embodiment, when the quality of the build-up processing portion 1 is determined, the determination is performed after the position K of the reference surface is interpolated, so that the reliability of the quality result is significantly increased. Become.

The embodiments described above are described for facilitating the understanding of the present invention, and are not described for limiting the present invention. Therefore, each element disclosed in the above embodiment is intended to include all design changes and equivalents belonging to the technical scope of the present invention. Although the piston having the elliptical cross section is used as the inspection object in the above-described embodiment, the quality inspection device of the present invention can be applied to the inspection object having the perfect circular cross section.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing an embodiment of a quality inspection device for a build-up processing portion of the present invention.

FIG. 2 is a conceptual diagram of a flowchart and data showing an information processing procedure of the same embodiment.

FIG. 3 is a flowchart showing the procedure of FIG. 2 in more detail.

FIG. 4 is a conceptual diagram showing master data of reference plane positions.

5A to 5D are conceptual diagrams showing an interpolation procedure using master data.

6A is an exploded perspective view showing the piston, and FIG. 6B is a transverse sectional view of the piston taken along the line BB of FIG. 6A.

[Explanation of symbols]

 P ... Piston (inspection object) 1 ... Overlay processing part 2 ... Projection line 10 ... Semiconductor laser (projection means) 20 ... Imaging means 22 ... CCD camera 24 ... A / D conversion part 26 ... Image storage part 30 ... Rotation drive means 32 ... Rotation table 34 ... Motor 40 ... One-dimensional data conversion means 42 ... One-dimensional conversion part 44 ... One-dimensional data storage part 50 ... Reference plane interpolation means 60 ... Quality determination part (quality determination means)

Claims (2)

[Claims] 1. A quality inspection device for a build-up processing portion, which is provided on a side surface of a cylindrical object to be inspected along a circumferential direction, for inspecting the processing quality of the build-up processing portion, wherein the projection line is the meat. A light projecting unit that irradiates a slit-shaped light so as to be substantially perpendicular to the embossing processing unit, and an image of the reflected light of the light projecting line that is applied to the buildup processing unit and is stored as two-dimensional image data. Image capturing means, rotation driving means for relatively rotating the light projecting means and the image capturing means, and the object to be inspected so that the entire circumference of the buildup processing portion can be imaged, and image capturing by the image capturing means. And a one-dimensional data conversion means for converting the two-dimensional image data into one-dimensional data and storing the same, and the uniformity of the reference plane positions on both sides of the build-up processing portion in each of the one-dimensional data is verified to obtain a non-uniform reference. The surface position is based on the preset reference surface position. After interpolating with the value of the star data, a reference plane interpolating means for storing as interpolated measurement data and a characteristic value of the interpolated measurement data and a preset reference value are compared to determine the quality of the buildup processing portion. A quality inspection device for a build-up processing section, comprising: a quality determination means for determining. 2. The quality inspection apparatus for a built-up processing portion according to claim 1, wherein the object to be inspected is a cylindrical object having a non-round cross section.