JPH09237288A - Device for analyzing dynamic characteristic of system - Google Patents

Abstract

PROBLEM TO BE SOLVED: To easily obtain a precise output waveform without executing complicated simulation. SOLUTION: A unit step input generation means 1 gives a unit step input signal to a system 2 being an evaluation object. A waveform integration means 3 obtains an integration waveform based on the output waveform which is taken out. The integration waveform is stored in a waveform storage means 4. The waveform which is τ-shifted in the direction of a time base is generated in a waveform shift means 6 based on the shift time τ of ramp input, which is extracted in a shift time/slew rate extraction means 5 and the integration waveform stored in the waveform storage means 4. A waveform difference between the integration waveform stored in the waveform storage means 4 and a waveform shifted by the waveform shift means 6 is obtained in a waveform subtraction means 7. The amplitude of the waveform obtained in the waveform subtraction means 7 is multiplied by a slew rate extracted by the shift time/slew rate extraction means in a slew rate multiplication means 8.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a system dynamic characteristic analyzing apparatus, and more particularly to measures for speeding up analysis.

[0002]

2. Description of the Related Art Conventionally, in an electric circuit or control system in which the system characteristics can be approximated as a linear system and the input can be approximated by a ramp input, when the dynamic characteristics are accurately analyzed, the information of the input waveform is input for each input waveform. Is used in detail to analyze input / output characteristics.

[0003]

However, in the conventional method as described above, since input / output characteristics are analyzed by using the information of the input waveform for each input waveform in detail, a huge processing time is required. As a result, many analyzes cannot be performed in a short time.

The present invention has been made in view of the above points, and an object thereof is to easily obtain an output waveform of an arbitrary lamp input.

[0005]

In order to achieve the above-mentioned object, according to the present invention, the dynamic characteristics of the system are previously obtained in detail by step input, and the transition time of the input waveform and the slew of the input waveform with respect to an arbitrary ramp input are obtained. It is characterized by giving a rate and.

More specifically, the present invention is directed to an apparatus for analyzing the dynamic characteristics of an evaluation target system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input. I took it.

That is, the first solving means of the present invention is provided with unit step input generating means for giving a unit step input signal which changes at time 0 to the system to be evaluated. Furthermore, based on the output waveform extracted from the system to be evaluated, if the ramp input transition start time to the system to be evaluated is 0, the integral represented by the integrated value of the output waveform from time 0 to t A waveform integrating means for obtaining a waveform is provided. Further, a waveform storage means for storing the integrated waveform obtained by the waveform integration means is provided. In addition, transition time / slew rate extraction means for extracting the transition time τ of the ramp input and the slew rate is provided. Further, there is provided a waveform shift means for creating a waveform τ shifted in the time axis direction based on the integrated waveform stored in the waveform storage means and the transition time τ extracted by the transition time / slew rate extraction means. Further, there is provided a waveform subtraction means for obtaining a waveform difference between the integrated waveform stored in the waveform storage means and the waveform shifted by the waveform shift means. Furthermore, a slew rate multiplication means for multiplying the amplitude of the waveform obtained by the waveform subtraction means by the slew rate extracted by the transition time / slew rate extraction means is provided.

A second solving means of the present invention is provided with a unit step input generating means for giving a unit step input signal which changes at time 0 to the system to be evaluated. Furthermore, based on the output waveform extracted from the evaluation target system, assuming that the ramp input transition start time to the evaluation target system is 0, the value at time t is the integral of the output waveform from t-τ to t based on the parameter τ. A waveform integrating means for obtaining an integrated waveform represented by a value is provided. Further, a waveform storage means for storing the integrated waveform obtained by the waveform integration means based on the two variables t and τ is provided. Further, a transition time / slew rate extraction means for extracting the transition time τ1 of the ramp input and the slew rate is provided. In addition, slew rate multiplication means for reading the integrated waveform stored in the waveform storage means as τ = τ1 and multiplying the amplitude of the read waveform by the slew rate extracted by the transition time / slew rate extraction means is provided. It is characterized by

A third solving means of the present invention is provided with a unit step input generating means for giving a unit step input signal which changes at time 0 to the evaluation target system. Further, a waveform storage means for storing the output waveform extracted from the system to be evaluated is provided. Further, a transition time / slew rate extraction means for extracting the transition time τ of the ramp input and the slew rate is provided. In addition, based on the output waveform stored in the waveform storage means and the transition time τ extracted by the transition time / slew rate extraction means, when the ramp input transition start time to the evaluation target system is 0, the time t Waveform integrator is provided for obtaining an integrated waveform in which the value at is integrated by the output waveform from time t-τ to t. Further, a slew rate multiplication means for multiplying the amplitude of the integrated waveform obtained by the waveform integration means by the slew rate extracted by the transition time / slew rate extraction means is provided.

With the above arrangement, in the first to third means of the present invention, the dynamic characteristics of the system are once obtained in detail by step input, so that the transition time of the input waveform with respect to an arbitrary lamp input is increased. An accurate output waveform can be easily obtained only by giving the slew rate and

[0011]

BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings.

First, before explaining the system dynamic characteristic analyzing apparatus according to the first to third embodiments of the present invention, the theoretical background of the present invention will be explained.

Since the present invention is intended for a system that can be approximated to have linear system characteristics,
A description will be given of a linear system after linearly approximating the original system. Moreover, since the input is similar to the ramp input, the input to the system u
Let (t) be the ramp input of FIG.

If U (s) is the Laplace transform of the input u (t) as shown in the following equation 1,

[Equation 1]

U (s) can be expressed by the following equation 2.

[0016]

[Equation 2]

Here, input Y (s) as shown in the following equation 3.
Given the Laplace transform of the system output y (t) for u (t),

(Equation 3)

Y (s) is expressed by the following equation 4 using the transfer function H (s) of the system.

[0019]

(Equation 4)

On the other hand, the Laplace transform of the output ys (t) when the unit step input of FIG.
If Ys (s) like

(Equation 5)

Ys (s) is given by the following equation 6 using the transfer function H (s) of the system,

(Equation 6)

As a result, the following expression 7 is derived from the above expressions 4 and 6.

[0023]

(Equation 7)

From this equation 7, the output y (t) of the system is expressed by the following equation 8 using the output ys (t) when a unit step input is given.

[0025]

(Equation 8)

Here, when P (t) is defined by the following equation 9,

[Equation 9]

The output y (t) is expressed by the following equation 10.

[0028]

(Equation 10)

Further, the above equation 8 is the following equation 11 when the integral terms are put together into one,

[Equation 11]

Defining Q (τ; t) in equation 12 below,

(Equation 12)

The output y (t) is expressed by the following equation 13.

[0032]

(Equation 13)

Next, based on this theoretical background, the system dynamic characteristic analyzing apparatus according to the first to third embodiments of the present invention will be described.

(Embodiment 1) FIG. 1 is a block diagram of a system dynamic characteristic analyzing apparatus according to Embodiment 1 of the present invention.

The evaluation target system 2 used for analysis is an electric circuit or control system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input.

In the figure, reference numeral 1 denotes a unit step input generating means, which is adapted to give a unit step input signal which changes at time 0 to the evaluation target system 2.

Reference numeral 3 denotes a waveform integrator. This waveform integrator 3 is based on the output waveform extracted from the evaluation target system 2, and when the ramp input transition start time to the evaluation target system 2 is 0, the time t is reached. The integrated waveform represented by the integrated value of the output waveform from 0 to t is calculated.

Reference numeral 4 is a waveform storage means for storing the integrated waveform obtained by the waveform integration means 3, and reference numeral 5 is a transition time / slew rate extraction means for extracting the transition time τ and the slew rate of the ramp input.

Reference numeral 6 denotes a waveform shift means, and this waveform shift means has the integrated waveform stored in the waveform storage means 4,
Based on the transition time and the transition time τ extracted by the slew rate extraction means 5, a waveform shifted by τ in the time axis direction is created.

Reference numeral 7 is a waveform subtracting means, and this waveform subtracting means 7 is adapted to obtain a waveform difference between the integrated waveform stored in the waveform storing means 4 and the waveform shifted by the waveform shifting means 6. .

Reference numeral 8 is a slew rate multiplying means. This slew rate multiplying means multiplies the amplitude of the waveform obtained by the waveform subtracting means 7 by the slew rate extracted by the transition time / slew rate extracting means 5. Has become.

Next, a description will be given of a method of analyzing the dynamic characteristic of the evaluation target system 2 by the system dynamic characteristic analyzing apparatus according to the first embodiment of the present invention configured as described above.

First, in FIG. 1, a unit step input signal is applied from the unit step input generation means 1 to the evaluation target system 2, and the output signal ys (t) is input to the waveform integration means 3.
At this time, ys (t) may be data measured by the actual evaluation target system 2 or may be simulated data.

Next, the waveform integration means 3 performs integration based on the equation 9, and the resulting waveform P (t) is stored in the waveform storage means 4.

In this way, after the above processing is once performed for the step input, output waveforms for various actual lamp inputs are obtained as follows.

That is, the transition time τ of the input signal u (t) and the slew rate E / τ are extracted by the transition time / slew rate extraction means 5, and the extracted transition time τ is given to the waveform shift means 6. On the other hand, the waveform P stored in the waveform storage means 4
(t) is read out to the waveform shift means 6, and the waveform shift means 6 shifts the waveform by τ in the time axis direction to obtain the waveform P (t-τ).
And the waveform P (t-τ) is given to the waveform subtracting means 7.

The waveform P (t) stored in the waveform storage means 4 is also read out by the waveform subtraction means 7, and the waveform subtraction means 7 changes the waveform P (t) from the original waveform P (t). t-
τ) is subtracted and the result is given to the slew rate multiplication means 8. The slew rate multiplication means 8 multiplies the amplitude of the waveform resulting from the subtraction by the slew rate E / τ. The resulting waveform y (t) is an output signal when the input u (t) is given to the evaluation target system 2 by Expression 10.

That is, by using only the transition time τ and the slew rate E / τ in the information of the ramp input signal u (t), the accurate output waveform of the evaluation target system 2 can be obtained. An example of each signal waveform in this processing is shown in FIG.

(Second Embodiment) FIG. 2 is a block diagram of a system dynamic characteristic analyzing apparatus according to a second embodiment of the present invention.

The evaluation target system 2 used for analysis is an electric circuit or control system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input.

In the figure, reference numeral 1 is a unit step input generating means, and the unit step input generating means 1 supplies a unit step input signal which changes at time 0 to the evaluation target system 2.

Reference numeral 3 denotes a waveform integrator. This waveform integrator 3 is based on the output waveform extracted from the evaluation target system 2 and when the ramp input transition start time to the evaluation target system 2 is 0, the time t is reached. Based on the parameter τ, the integrated waveform represented by the integrated value of the output waveform from t-τ to t is obtained.

Reference numeral 5 is a transition time / slew rate extraction means for extracting the transition time τ 1 of the ramp input and the slew rate.

Reference numeral 4 denotes a waveform storage means, and the waveform storage means 4 uses the integrated waveform obtained by the waveform integration means 3 as two variables.
It is designed to be memorized based on t and τ.

Reference numeral 8 is a slew rate multiplying means. This slew rate multiplying means 8 reads the integrated waveform stored in the waveform storage means 4 as τ = τ 1, and the amplitude of the read waveform is set to the transition time / through. The slew rate extracted by the rate extracting means 5 is multiplied.

Next, an explanation will be given of the analysis method of the dynamic characteristic of the evaluation target system 2 by the system dynamic characteristic analyzing apparatus according to the second embodiment of the present invention configured as described above.

First, in FIG. 2, a unit step input signal is supplied from the unit step input generating means 1 to the evaluation target system 2 and the output signal ys (t) is input to the waveform integrating means 3.
At this time, ys (t) may be data measured by the actual evaluation target system 2 or may be simulated data.

Next, the waveform integrating means 3 performs integration using the parameter τ according to the equation 11, and the resulting waveform Q (τ; t) is stored in the waveform storing means 4.

In this way, after the above processing is once performed on the step input, output waveforms for various actual lamp inputs are obtained as follows.

That is, the transition time slew rate extraction means 5 calculates the transition time τ of the input signal u (t) and the slew rate E / τ1.
And the extracted transition time τ 1 is extracted by
By giving the waveform Q (τ; t) stored in the waveform storage means 4 as τ = τ1 and multiplying the slew rate with the slew rate E / τ1 extracted by the transition time / slew rate extraction means 5 by slew rate multiplication. The slew rate multiplication means 8 multiplies the amplitude of the read waveform by the slew rate E / τ1. The resulting waveform y (t) is
It is an output signal when the input u (t) is given to the evaluation target system 2 by Expression 13.

That is, by using only the transition time τ1 and the slew rate E / τ1 in the information of the ramp input signal u (t), the accurate output waveform of the evaluation target system 2 can be obtained. An example of the signal waveform Q (τ; t) in this processing is shown in FIG.

(Embodiment 3) FIG. 3 shows a block diagram of a system dynamic characteristic analyzing apparatus according to Embodiment 3 of the present invention.

The evaluation target system 2 provided for analysis is an electric circuit or control system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input.

In the figure, 1 is a unit step input generating means, and this unit step input generating means 1 is adapted to give a unit step input signal which changes at time 0 to the evaluation target system 2.

Reference numeral 4 is a waveform storage means for storing the output waveform extracted from the evaluation target system 2.

Reference numeral 5 is a transition time / slew rate extraction means for extracting the transition time τ of the ramp input and the slew rate.

Reference numeral 3 denotes a waveform integrating means, which evaluates the above based on the output waveform stored in the waveform storing means 4 and the transition time τ extracted by the transition time / slew rate extracting means 5. When the ramp input transition start time to the target system 2 is set to 0, an integrated waveform whose value at time t 1 is expressed by a value obtained by integrating the above output waveform from time t-τ to t is calculated.

Reference numeral 8 is a slew rate multiplication means, and this slew rate multiplication means 8 multiplies the amplitude of the integrated waveform obtained by the waveform integration means 3 by the slew rate extracted by the transition time / slew rate extraction means 5. It is like this.

Next, an explanation will be given of the analysis method of the dynamic characteristic of the evaluation target system 2 by the system dynamic characteristic analyzing apparatus according to the third embodiment of the present invention configured as described above.

First, in FIG. 3, a unit step input signal is applied from the unit step input generation means 1 to the evaluation target system 2 and the output signal ys (t) is stored in the waveform storage means 4.
At this time, ys (t) may be data measured by the actual evaluation target system 2 or may be simulated data.

In this way, after the above processing is once performed on the step input, output waveforms for various actual lamp inputs are obtained as follows.

That is, the transition time τ of the input signal u (t) and the slew rate E / τ are extracted by the transition time / slew rate extraction means 5, and the extracted transition time τ is given to the waveform integration means 3. On the other hand, the waveform ys stored in the waveform storage means 4
(t) is read and the read waveform ys (t) is given to the waveform integrating means 3.

Next, the waveform integrating means 3 performs integration based on the equation 11, and gives the integrated waveform to the slew rate multiplying means 8 together with the slew rate E / τ1 extracted by the transition time / slew rate extracting means 5, The slew rate E / τ is added to the amplitude of the waveform read by the slew rate multiplication means 8.
Multiply by The resulting waveform y (t) is input according to Equation 13.
This is an output signal when u (t) is given to the evaluation target system 2.

That is, by using only the transition time τ and the slew rate E / τ in the information of the ramp input signal u (t), the accurate output waveform of the evaluation target system 2 can be obtained.

[0075]

As described above, according to the present invention according to claims 1 to 3, the system characteristics can be approximated as a linear system, and the dynamic characteristics of an evaluation target system whose input can be approximated by a ramp input are analyzed. As a device, a transition time / slew rate extraction means for extracting the transition time and the slew rate of the ramp input is attached, so once the detailed dynamic characteristics of the system are obtained by step input, any ramp input An accurate output waveform can be easily obtained without performing a complicated simulation simply by giving the transition time and the slew rate of the input waveform.

[Brief description of drawings]

FIG. 1 is a block diagram of a system dynamic characteristic analysis device according to a first embodiment of the present invention.

FIG. 2 is a block diagram of a system dynamic characteristic analysis device according to a second embodiment of the present invention.

FIG. 3 is a block diagram of a system dynamic characteristic analysis device according to a third embodiment of the present invention.

FIG. 4 is a diagram showing a general ramp input provided to the system to be evaluated in the present invention.

FIG. 5 is a diagram showing a unit step input used for initial analysis of the evaluation target system in the present invention.

FIG. 6 is a diagram showing an example of each waveform in FIG.

7 is a diagram showing an example of a waveform Q (τ; t) in FIG.

[Explanation of symbols]

 1 unit step input generation means 2 evaluation target system 3 waveform integration means 4 waveform storage means 5 transition time / slew rate extraction means 6 waveform shift means 7 waveform subtraction means 8 slew rate multiplication means

Claims (3)

[Claims] 1. An apparatus for analyzing the dynamic characteristics of an evaluation target system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input, wherein a unit step input signal that changes at the time 0 to the evaluation target system. Based on the unit step input generation means that gives the output waveform and the output waveform extracted from the evaluation target system, the ramp input transition start time to the evaluation target system is
In the case of, the waveform integrating means for obtaining the integrated waveform represented by the integrated value of the output waveform from time 0 to t, the waveform storing means for storing the integrated waveform obtained by the waveform integrating means, and the lamp Based on the transition time / slew rate extraction means for extracting the input transition time τ and the slew rate, the integral waveform stored in the waveform storage means, and the transition time τ extracted by the transition time / slew rate extraction means, The waveform shifting means for creating a waveform shifted by τ in the time axis direction, the waveform subtracting means for obtaining the waveform difference between the integrated waveform stored in the waveform storing means, and the waveform shifted by the waveform shifting means, and the waveform subtracting means. The transition time
And a slew rate multiplying unit for multiplying the slew rate extracted by the slew rate extracting unit. 2. A device for analyzing the dynamic characteristics of an evaluation target system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input, wherein a unit step input signal that changes at time 0 to the evaluation target system. Based on the unit step input generation means that gives the output waveform and the output waveform extracted from the evaluation target system, the ramp input transition start time to the evaluation target system is set to 0.
, The value at time t is based on the parameter τ
a waveform integrating means for obtaining an integrated waveform represented by an integrated value of an output waveform from t-τ to t; a waveform storing means for storing the integrated waveform obtained by the waveform integrating means based on two variables t, τ; The transition time / slew rate extraction means for extracting the input transition time τ1 and the slew rate, and the integrated waveform stored in the waveform storage means are read as τ = τ1, and the transition time And a slew rate multiplication means for multiplying the slew rate extracted by the rate extraction means. 3. An apparatus for analyzing the dynamic characteristics of an evaluation target system whose system characteristics can be approximated as a linear system and whose input can be approximated by a ramp input, wherein the evaluation target system has a unit step input signal that changes at time 0. Unit step input generating means, a waveform storage means for storing the output waveform extracted from the evaluation target system, a transition time / slew rate extracting means for extracting the transition time τ and the slew rate of the ramp input, and the waveform The output waveform stored in the storage means and the transition time
Based on the transition time τ extracted by the slew rate extraction means, when the ramp input transition start time to the evaluation target system is 0, the value at time t is the value obtained by integrating the output waveform from time t-τ to t. And a slew rate multiplication means for multiplying the amplitude of the integrated waveform obtained by the waveform integration means by the slew rate extracted by the transition time / slew rate extraction means. An apparatus for analyzing dynamic characteristics of a system characterized by: