JPH09229880A - X-ray diffraction apparatus - Google Patents

X-ray diffraction apparatus

Info

Publication number
JPH09229880A
JPH09229880A JP8041715A JP4171596A JPH09229880A JP H09229880 A JPH09229880 A JP H09229880A JP 8041715 A JP8041715 A JP 8041715A JP 4171596 A JP4171596 A JP 4171596A JP H09229880 A JPH09229880 A JP H09229880A
Authority
JP
Japan
Prior art keywords
sample
rotating
ray
rays
goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8041715A
Other languages
Japanese (ja)
Other versions
JP3168902B2 (en
Inventor
Kazuyuki Watanabe
一之 渡辺
Toru Takashima
徹 高島
Tadayuki Fujiwara
忠幸 藤原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP04171596A priority Critical patent/JP3168902B2/en
Publication of JPH09229880A publication Critical patent/JPH09229880A/en
Application granted granted Critical
Publication of JP3168902B2 publication Critical patent/JP3168902B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide an X-ray diffraction apparatus with a rotary sample stage which functions both as a rotary powder sample stage and a fiber sample stage, thereby saving the adjustment labor. SOLUTION: An axial part 4 of a rotary sample stage 1 is supported by a bearing 6 to be rotatable to a bracket 13. A sample holder-holding part 5 is a couplet to a front end of the axial part 4, and a sample holder 17 is detachably fitted to the holding part 5. A pulley 7 is mounted to the axial part 4, which is coupled by a stepping motor 11 and a timing belt 12 thereby to rotate the axial part 4. A collimator 10 is built in the axial part 4, making it possible to project X rays also from a rear face of a sample. A disk 8 and a sensor 9 are set at a rear end of the axial part 4 to detect a rotational origin. A projection 3 is fitted in an engaging hole formed at the center of a goniometer, so that a center axis of the projection, virtually a surface of the sample held by the sample holder 17 agrees with a rotary shaft 16 of the goniometer.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、試料をその試料面
内で回転自在に保持する回転試料台をゴニオメータ上に
備えたX線回折装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray diffractometer equipped with a rotating sample table on a goniometer for holding a sample rotatably within its sample surface.

【0002】[0002]

【従来の技術】X線回折装置は、X線源からのX線をゴ
ニオメータのθ軸中心に置かれた試料に照射し、ゴニオ
メータの2θ軸に固定されたX線検出器を試料の回りで
回動させながら試料から放射される回折X線の強度を測
定し、その検出角度と測定強度に基づいて試料の定性・
定量分析を行う装置である。
2. Description of the Related Art An X-ray diffractometer irradiates an X-ray from an X-ray source onto a sample placed at the center of the θ axis of a goniometer, and an X-ray detector fixed to the 2θ axis of the goniometer is placed around the sample. While rotating, measure the intensity of the diffracted X-rays emitted from the sample and qualitatively determine the sample based on the detected angle and the measured intensity.
This is a device for quantitative analysis.

【0003】このX線回折装置で粉末状の試料を分析す
る場合には、板状の試料ホルダに形成された試料充填孔
に粉末試料を詰め、ゴニオメータのθ軸中心に設置され
た試料台に装着し、X線検出器を試料の回りで回動させ
て回折パターンを測定する。ところが、混合が不十分で
あったり個々の結晶粒の大きな粉末試料ではひとつの方
向への回折線の発生に寄与する結晶粒の数が少なくなっ
て回折X線強度が小さくなるため、測定結果に誤差を含
むという問題がある。このような場合に、試料面内で試
料を比較的早い速度で回転させ回折に寄与する結晶粒の
数を増加させる目的で、回転粉末試料台が用いられる。
When analyzing a powdery sample with this X-ray diffractometer, the powder sample is filled in a sample filling hole formed in a plate-shaped sample holder and placed on a sample table placed at the center of the θ axis of a goniometer. After mounting, the X-ray detector is rotated around the sample and the diffraction pattern is measured. However, in a powder sample with insufficient mixing or large individual crystal grains, the number of crystal grains that contribute to the generation of diffraction lines in one direction decreases and the diffracted X-ray intensity decreases. There is a problem of including an error. In such a case, a rotating powder sample stage is used for the purpose of rotating the sample in the sample plane at a relatively high speed and increasing the number of crystal grains contributing to diffraction.

【0004】一方、配向性のある試料、あるいは、繊維
状の試料などを分析する場合、固定式の試料台では試料
ホルダへの試料の詰め込み方および試料ホルダの試料台
への装着の仕方によって入射X線および回折X線の検出
方向に対する試料の向きが変わるため、本来検出できる
はずの回折X線が明瞭に得られないことがある。このよ
うな場合に試料を回転させることにより入射X線および
回折X線の検出方向に対する試料の向きを変え、明瞭に
回折X線を検出できるようにするために、試料面内で試
料を回転させて向きを変える繊維試料台が用いられる。
通常この繊維試料台では試料の背面からX線管からのX
線を照射し、試料を透過した回折X線を検出するように
している。このとき、照射X線の方向と照射幅を規制す
るコリメータをX線管のX線放射口付近に設置し、細く
絞られたX線が細い繊維状試料に照射されるように、あ
らかじめ光軸調整を行っておく必要がある。
On the other hand, in the case of analyzing an oriented sample or a fibrous sample, in the case of a fixed type sample table, the sample is incident depending on how the sample is packed in the sample holder and how the sample holder is mounted on the sample table. Since the orientation of the sample changes with respect to the detection directions of the X-rays and the diffracted X-rays, the diffracted X-rays that should originally be detected may not be clearly obtained. In such a case, the sample is rotated in the plane of the sample in order to change the direction of the sample with respect to the detection directions of the incident X-rays and the diffracted X-rays so that the diffracted X-rays can be clearly detected. A fiber sample stand that changes its orientation by being used is used.
Normally, in this fiber sample stand, X from the X-ray tube from the back of the sample
The sample is irradiated with a ray and the diffracted X-ray transmitted through the sample is detected. At this time, a collimator that controls the direction and width of the irradiation X-ray is installed near the X-ray emission port of the X-ray tube, and the X-ray that is narrowed down is irradiated in advance on the optical axis so that the thin fibrous sample is irradiated. It is necessary to make adjustments.

【0005】以上説明したように粉末試料と繊維状試料
では測定の方法が異なっており、それに伴って使用する
試料台も異なる形式のものを使用していた。すなわち、
粉末試料の測定では、通常θ−2θ連動でゴニオメータ
を駆動し、試料表面から反射する方向の回折X線を測定
する。一方、繊維状試料の測定では、試料面を回動させ
るθ回転は行わずに試料の背面からX線を固定的に照射
し、検出器のみを試料の回りで回動させる2θ回転を行
って試料を透過した回折X線を検出するようにしてい
る。従来、粉末試料に使用される回転粉末試料台は反射
法の測定のみを前提として設計され、試料の背後には回
転のためのモータなどが配置されているので、透過法を
実施するための試料台としては使用できないものであっ
た。したがって、従来、回転粉末試料台と繊維試料台は
X線回折装置の別々の付属品として用意されており、分
析対象試料に応じてその都度ゴニオメータにとり付けて
光軸調整などをしたのち分析に使用していた。
As described above, the measurement method is different between the powder sample and the fibrous sample, and accordingly, the sample table used has a different type. That is,
In the measurement of a powder sample, a goniometer is usually driven in conjunction with θ-2θ to measure a diffracted X-ray in a direction reflected from the sample surface. On the other hand, in the measurement of a fibrous sample, X-rays are radiated fixedly from the back surface of the sample without performing θ rotation for rotating the sample surface, and 2θ rotation for rotating only the detector around the sample is performed. The diffracted X-ray transmitted through the sample is detected. Conventionally, the rotating powder sample table used for powder samples is designed only for the measurement of the reflection method, and a motor for rotation is arranged behind the sample, so the sample for performing the transmission method is used. It could not be used as a stand. Therefore, the rotating powder sample stand and the fiber sample stand are conventionally prepared as separate accessories of the X-ray diffractometer, and they are attached to the goniometer according to the sample to be analyzed and used for analysis after adjusting the optical axis. Was.

【0006】[0006]

【発明が解決しようとする課題】以上のように、従来の
X線回折装置には回転粉末試料台と繊維試料台が個別に
用意されているが、汎用的に用いられるX線回折装置は
粉末試料を分析することが多いので、通常、回転粉末試
料台をゴニオメータに装着していることが多い。したが
って、繊維状試料などを分析する場合には試料台を専用
の繊維試料台にその都度交換することが必要であり、多
くの手間がかかった。また試料台を繊維試料台に交換し
た場合には、管球からのX線を絞るためのコリメータの
光軸調整もその都度必要となる。これらの作業はたいへ
ん面倒な作業であった。
As described above, the conventional X-ray diffractometer is provided with the rotating powder sample stage and the fiber sample stage separately. Since a sample is often analyzed, a rotating powder sample stage is usually mounted on the goniometer. Therefore, when a fibrous sample or the like is analyzed, it is necessary to replace the sample table with a dedicated fiber sample table each time, which requires a lot of trouble. Also, when the sample table is replaced with a fiber sample table, it is necessary to adjust the optical axis of the collimator for narrowing the X-ray from the tube each time. These tasks were very troublesome.

【0007】本発明は、このような事情に鑑みてなされ
たものであって、回転粉末試料台と繊維試料台の機能を
合わせ持ち、かつ、光軸調整の手間を省いた回転試料台
を備えたX線回折装置を提供することを目的とする。
The present invention has been made in view of the above circumstances, and is provided with a rotating sample stage which has the functions of a rotating powder sample stage and a fiber sample stage, and which saves the trouble of adjusting the optical axis. Another object of the present invention is to provide an X-ray diffractometer.

【0008】[0008]

【課題を解決するための手段】本発明は、上記課題を解
決するために、試料を試料面内で回転する機構を有する
回転試料台を備えたX線回折装置において、試料を回転
させる回転軸の内部に背後からの照射X線が通過できる
空間を設けるとともに、この空間部にコリメータを内臓
させたことを特徴とする。
In order to solve the above-mentioned problems, the present invention provides an X-ray diffractometer equipped with a rotating sample stage having a mechanism for rotating a sample in a sample plane, and a rotating shaft for rotating the sample. A space through which irradiation X-rays from the back can pass is provided inside, and a collimator is built into this space.

【0009】本発明のX線回折装置は上記のように構成
されており、試料を試料面内で回転する機構を備え、か
つ、試料を回転させる回転軸の内部に照射X線が通過で
きる空間をあけ、この空間部にコリメータを内蔵したの
で、粉末試料に対しては試料の表面からX線を照射して
反射法で回折X線を測定でき、繊維状試料に対しては試
料に背面からX線を照射して透過法で測定できる。さら
に、コリメータが予め調整された状態で内蔵されている
ので従来必要であったコリメータの光軸調整が不要にな
る。
The X-ray diffractometer of the present invention is constructed as described above, has a mechanism for rotating the sample in the sample plane, and has a space through which the irradiated X-rays can pass inside the rotating shaft for rotating the sample. Since a collimator is built in this space, the powder sample can be irradiated with X-rays from the surface of the sample to measure the diffracted X-rays by the reflection method, and the fibrous sample can be measured from the back of the sample. It can be measured by a transmission method by irradiating X-rays. Further, since the collimator is built in in a pre-adjusted state, it is not necessary to adjust the optical axis of the collimator, which was required in the past.

【0010】[0010]

【発明の実施の形態】本発明の一実施の形態を図面を参
照して説明する。図1は本発明のX線回折装置の要部で
ある回転試料台を示す縦断面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a vertical cross-sectional view showing a rotating sample stage which is a main part of an X-ray diffraction apparatus of the present invention.

【0011】回転試料台1は軸部4がブラケット13に
対して回転可能にベアリング6によって支承されてい
る。この軸部4の先端に試料ホルダ保持部5が連結さ
れ、試料ホルダ保持部5に試料ホルダ17が着脱自在に
装着される。また、軸部4にはプーリー7が取り付けら
れており、これがステッピングモータ11とタイミング
ベルト12で連結され、ステッピングモータ11を駆動
することにより軸部4に回転が与えられる。ステッピン
グモータ11を連続的に駆動することによって試料ホル
ダは連続的に回転し、また、ステッピングモータ11を
ある角度だけ駆動すればその角度に応じて試料ホルダも
ある角度だけ傾き、ステッピングモータ11のホールデ
ィングトルクによってその位置に保持される。軸部4の
後端には光を透過するスリットの入った円板8が取り付
けられており、このスリットをLEDとフォトトランジ
スタなどからなるセンサ9が検出して回転の原点とす
る。
The rotating sample table 1 has a shaft 4 rotatably supported by a bearing 6 with respect to a bracket 13. A sample holder holder 5 is connected to the tip of the shaft portion 4, and a sample holder 17 is detachably attached to the sample holder holder 5. Further, a pulley 7 is attached to the shaft portion 4, and the pulley 7 is connected to the stepping motor 11 by a timing belt 12. By driving the stepping motor 11, the shaft portion 4 is rotated. The sample holder is continuously rotated by continuously driving the stepping motor 11, and when the stepping motor 11 is driven by a certain angle, the sample holder is also tilted by a certain angle according to the angle, and the stepping motor 11 is held. Held in that position by torque. A disk 8 having a slit for transmitting light is attached to the rear end of the shaft portion 4, and a sensor 9 including an LED and a phototransistor detects this slit and serves as an origin of rotation.

【0012】これらの構成物はブラケット13を介して
中央に突起3のついた底板2の上に固定されているが、
その位置関係は突起3の中心軸と試料ホルダ17の表面
が一致するようになっている。底板2につけられている
突起3は図示していないゴニオメータの中心に設けられ
ている嵌合穴にはまり込んで、この突起の中心軸、さら
には、試料ホルダ17に保持されている試料表面がゴニ
オメータの回転軸16と一致するようになる。
These components are fixed on the bottom plate 2 having the protrusion 3 at the center through the bracket 13,
The positional relationship is such that the central axis of the protrusion 3 and the surface of the sample holder 17 coincide with each other. The projection 3 attached to the bottom plate 2 is fitted into a fitting hole provided at the center of a goniometer (not shown), and the central axis of this projection and further the surface of the sample held by the sample holder 17 are attached to the goniometer. It becomes to coincide with the rotating shaft 16 of.

【0013】軸部4の中心には、その軸方向に貫いて貫
通孔が形成され照射X線が通過できる空間が設けられて
おり、さらに、コリメータ10が内蔵されている。軸部
4の後端と先端にはめ込まれた小孔をもつ部材がコリメ
ータとして働き、管球で発生したX線14が試料の中心
部に照射されるように制限している。このときX線がと
おる光軸15は軸部4の中心軸すなわち回転軸と一致し
ている。
At the center of the shaft portion 4, a through hole is formed penetrating in the axial direction of the shaft portion 4 to provide a space through which the irradiation X-rays can pass, and a collimator 10 is built in. A member having a small hole fitted in the rear end and the front end of the shaft portion 4 functions as a collimator, and limits the X-ray 14 generated by the tube to irradiate the central portion of the sample. At this time, the optical axis 15 through which the X-rays coincide with the central axis of the shaft portion 4, that is, the rotation axis.

【0014】試料ホルダ17は、図2に例示したよう
に、粉末試料と繊維状試料という試料の種類に応じて適
した形状のものを使用する。図2(a)は粉末試料用の
ホルダであり、所定の大きさ及び厚さの板の中央部に円
形や四角形の穴をあけ、その穴に粉末試料21を充填す
る。粉末試料の表面が試料ホルダ板の表面と一致するよ
うに、平らな面を持つガラス板などの上で試料を充填す
るようにするとよい。図2(b)は繊維状試料用のホル
ダであり、所定の大きさ及び厚さの板の中央の空間の上
下に設けられた挟み板に繊維状試料の両端を挟むことで
中央に試料を固定し、上端をネジ機構によって引っ張る
ようにして繊維状試料を伸ばした状態にする。これらの
試料ホルダはいずれも図1の試料ホルダ保持部5に装着
することができ、その状態で試料表面がゴニオメータ回
転軸16と一致するようになっている。
As the sample holder 17, as shown in FIG. 2, a sample holder having a shape suitable for the kind of sample such as a powder sample and a fibrous sample is used. FIG. 2A shows a holder for a powder sample. A circular or quadrangular hole is formed in the center of a plate having a predetermined size and thickness, and the powder sample 21 is filled in the hole. The sample may be filled on a flat glass plate or the like so that the surface of the powder sample matches the surface of the sample holder plate. FIG. 2 (b) shows a holder for a fibrous sample, in which both ends of the fibrous sample are sandwiched by sandwiching plates provided above and below the central space of a plate having a predetermined size and thickness. The fiber sample is fixed, and the fibrous sample is stretched by pulling the upper end by a screw mechanism. Each of these sample holders can be mounted on the sample holder holding portion 5 of FIG. 1, and in this state, the sample surface is made to coincide with the goniometer rotation shaft 16.

【0015】次に、本発明のX線回折装置を用いて試料
の種類に応じて反射法と透過法で回折X線を測定する方
法を説明する。図3および図4において、X線管31は
X線の発生源であり、試料に照射する1次X線を発生す
る。ゴニオメータ34はθ軸と2θ軸が独立して駆動で
きる形式のものであり、回転試料台33がゴニオメータ
34の中心すなわちθ軸に固定されて自由にθ回転で
き、また、検出器35はゴニオメータの2θ軸に固定さ
れ試料の回りを回動できるようになっている。回転試料
台33に取り付けられる試料ホルダはその表面がゴニオ
メータの回転中心に位置するようになっており、X線管
からの一次X線はその回転中心にある試料に向けて照射
される。その状態で、検出器35(2θ軸)を回動させ
ながら、試料によっていろいろな方向に放射される回折
X線の回折角度と強度を測定することによって、その試
料の定性・定量分析を行うことができる。なお、図3と
図4はゴニオメータの回転面が鉛直方向に立つように配
置した、いわゆる縦形ゴニオメータを例示しているが、
回転面が水平になるように配置した水平ゴニオメータで
もよいことは勿論である。
Next, a method for measuring diffracted X-rays by the reflection method and the transmission method according to the type of sample using the X-ray diffractometer of the present invention will be described. 3 and 4, the X-ray tube 31 is an X-ray generation source and generates primary X-rays for irradiating the sample. The goniometer 34 is of a type in which the θ axis and the 2θ axis can be driven independently, the rotating sample stage 33 is fixed to the center of the goniometer 34, that is, the θ axis, and can freely rotate by θ, and the detector 35 is a goniometer. It is fixed to the 2θ axis and can rotate around the sample. The surface of the sample holder attached to the rotating sample table 33 is positioned at the rotation center of the goniometer, and the primary X-rays from the X-ray tube are irradiated toward the sample at the rotation center. In that state, while rotating the detector 35 (2θ axis), qualitative and quantitative analysis of the sample is performed by measuring the diffraction angle and intensity of the diffracted X-rays emitted in various directions by the sample. You can 3 and 4 exemplify a so-called vertical type goniometer in which the rotation surface of the goniometer is arranged so as to stand in the vertical direction.
It goes without saying that a horizontal goniometer arranged so that the surface of rotation is horizontal may be used.

【0016】図3は粉末試料の測定に使われる反射法の
配置を説明する図である。粉末試料は図2(a)に示し
たような粉末試料ホルダに充填されて、その試料ホルダ
が図1で説明したような回転試料台33に装着されてい
る。そして回転試料台33は試料の表面にX線36が照
射されるような角度までゴニオメータのθ軸によって回
転させられ、試料の表面方向からX線管31からの一次
X線36が照射され、試料表面から反射される方向に放
射される回折X線を検出器35によって検出する。回折
X線の測定時には回転試料台33と検出器35は、いわ
ゆるθ−2θ連動の関係でそれぞれ矢印Aと矢印Bのよ
うにゴニオメータの中心軸を中心として回転走査され
る。この測定のときに、試料の粒子が荒いなどの理由に
よって、必要があれば粉末試料ホルダ37は回転試料台
33に備えられた試料回転機構によって試料面内で比較
的早い速度で回転させられる。こうすることによってX
線の回折に寄与する粒子の数が増し、なめらかな回折パ
ターンを得ることができる。なお、試料面内の回転速度
はなるべく速い方が好ましいが、検出器35の走査速度
などに応じていくつかの回転速度を選択できるようにし
てもよい。
FIG. 3 is a view for explaining the arrangement of the reflection method used for measuring a powder sample. The powder sample is filled in the powder sample holder as shown in FIG. 2A, and the sample holder is mounted on the rotary sample table 33 as described in FIG. Then, the rotating sample table 33 is rotated by the θ axis of the goniometer to such an angle that the surface of the sample is irradiated with the X-rays 36, and the primary X-rays 36 from the X-ray tube 31 are irradiated from the surface direction of the sample. The detector 35 detects the diffracted X-rays emitted in the direction reflected from the surface. During measurement of diffracted X-rays, the rotary sample stage 33 and the detector 35 are rotationally scanned around the central axis of the goniometer as indicated by arrows A and B, respectively, in a so-called θ-2θ interlocking relationship. At the time of this measurement, the powder sample holder 37 is rotated at a relatively high speed in the sample plane by the sample rotating mechanism provided on the rotating sample table 33 if necessary because of the coarse particles of the sample. By doing this X
The number of particles contributing to the diffraction of the line is increased, and a smooth diffraction pattern can be obtained. It is preferable that the rotation speed in the sample plane is as high as possible, but some rotation speeds may be selected according to the scanning speed of the detector 35.

【0017】一方、図4は繊維試料の場合に用いられる
透過法の配置を説明する図である。この配置では回転試
料台33は内蔵されたコリメータ39がX線管31のX
線発生点に向くように固定され、散乱防止スリット32
とコリメータ39を通過したX線36は繊維試料ホルダ
38に取り付けられた繊維状試料の背後から照射され、
試料によって回折されたX線は検出器35によって検出
される。回折X線の測定時にはゴニオメータのθ軸は動
かさずに(すなわち回転試料台33は上記したように固
定しておき)、2θ軸上の検出器35は矢印Bのように
ゴニオメータの中心軸を中心として回転走査される。こ
の測定のときに、必要があれば繊維試料ホルダ38は回
転試料台33に備えられた回転機構によって試料面内で
必要な角度まで回転させられ、その位置で固定される。
On the other hand, FIG. 4 is a view for explaining the arrangement of the transmission method used in the case of a fiber sample. In this arrangement, the collimator 39 built in the rotary sample table 33 is the X-ray tube X-axis.
The scattering prevention slit 32 is fixed so as to face the line generation point.
The X-ray 36 that has passed through the collimator 39 and the collimator 39 is irradiated from behind the fibrous sample attached to the fiber sample holder 38,
The X-ray diffracted by the sample is detected by the detector 35. When measuring diffracted X-rays, the θ axis of the goniometer is not moved (that is, the rotary sample stage 33 is fixed as described above), and the detector 35 on the 2θ axis is centered on the central axis of the goniometer as indicated by arrow B. Is rotated and scanned. At the time of this measurement, if necessary, the fiber sample holder 38 is rotated to a required angle in the sample plane by the rotating mechanism provided on the rotating sample table 33, and fixed at that position.

【0018】図4のように繊維試料を測定する場合には
コリメータを使って照射X線を細く絞り、この照射X線
が細い繊維試料にちょうど照射されるようにする必要が
あるが、本発明の回転試料台ではコリメータを回転試料
台に内蔵してあらかじめ軸調整が完了しているので、繊
維試料を測定するときにもコリメータの調整をあらため
て行う必要はない。
When measuring a fiber sample as shown in FIG. 4, it is necessary to use a collimator to narrow down the irradiated X-rays so that the irradiated X-rays are exactly irradiated onto the thin fiber sample. In the rotating sample table, the collimator is built in the rotating sample table and the axis adjustment is completed in advance, so that it is not necessary to newly adjust the collimator when measuring the fiber sample.

【0019】[0019]

【発明の効果】本発明のX線回折装置に備えられた回転
試料台は、試料を試料面内で回転する機構を有し、か
つ、試料の背後に照射X線が通過できる空間をあけ、こ
の空間部にコリメータを内蔵したので、粉末試料に対し
ては試料の表面からX線を照射して反射法で回折X線を
測定することができ、繊維状試料に対しては試料に背面
からX線を照射して透過法で測定できる。したがって、
試料が粉末試料であっても繊維状試料であっても試料台
を交換する必要がなく、交換した場合に必然的に行わな
ければならないゴニオメータのθ角度の原点設定を行う
必要がなくなった。さらに、コリメータが予め調整され
た状態で内蔵されているので、繊維状試料を測定する場
合に従来必要であったコリメータの光軸調整が不要にな
った。すなわち本発明によれば、一つの回転試料台を備
えることによって回転粉末試料台と繊維試料台の機能を
合わせ持ったX線回折装置を提供でき、調整の手間がほ
とんどかからないという顕著な効果を奏する。
The rotating sample table provided in the X-ray diffraction apparatus of the present invention has a mechanism for rotating the sample in the sample plane, and opens a space behind the sample through which the irradiated X-rays can pass. Since the collimator is built in this space, it is possible to irradiate the powder sample with X-rays from the surface of the sample and measure the diffracted X-rays by the reflection method. It can be measured by a transmission method by irradiating X-rays. Therefore,
Whether the sample is a powder sample or a fibrous sample, it is not necessary to replace the sample table, and it is no longer necessary to set the origin of the θ angle of the goniometer, which is inevitable when the sample table is replaced. Furthermore, since the collimator is built in in a pre-adjusted state, the optical axis adjustment of the collimator, which has been conventionally required when measuring a fibrous sample, becomes unnecessary. That is, according to the present invention, it is possible to provide an X-ray diffractometer having both the functions of the rotating powder sample stage and the fiber sample stage by providing one rotating sample stage, and there is a remarkable effect that it takes almost no adjustment work. .

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のX線回折装置の要部である回転試料台
の実施の一形態である。
FIG. 1 is an embodiment of a rotating sample stage which is a main part of an X-ray diffraction apparatus of the present invention.

【図2】本発明要部の回転試料台に使用する試料ホルダ
の例である。
FIG. 2 is an example of a sample holder used for the rotary sample table of the main part of the present invention.

【図3】本発明のX線回折装置を用いて反射法で回折X
線を測定する配置である。
FIG. 3 shows a diffraction X-ray by a reflection method using the X-ray diffractometer of the present invention.
It is an arrangement for measuring a line.

【図4】本発明のX線回折装置を用いて透過法で回折X
線を測定する配置である。
FIG. 4 shows a diffraction X-ray by a transmission method using the X-ray diffractometer of the present invention.
It is an arrangement for measuring a line.

【符号の説明】[Explanation of symbols]

1…回転試料台、2…底板、3…突起、4…軸部、5…
試料ホルダ保持部、6…ベアリング、7…プーリー、8
…円盤、9…センサ、10…コリメータ、11…ステッ
ピングモータ、12…タイミングベルト、13…ブラケ
ット、14…X線、15…光軸、16…ゴニオメータ回
転軸、17…試料ホルダ、31…X線管、32…X線散
乱防止スリット、33…回転試料台、34…ゴニオメー
タ、35…検出器、36…X線、37…粉末試料ホル
ダ、38…繊維試料ホルダ、39…コリメータ
1 ... Rotating sample table, 2 ... Bottom plate, 3 ... Protrusion, 4 ... Shaft part, 5 ...
Sample holder holding part, 6 ... Bearing, 7 ... Pulley, 8
... disk, 9 ... sensor, 10 ... collimator, 11 ... stepping motor, 12 ... timing belt, 13 ... bracket, 14 ... X-ray, 15 ... optical axis, 16 ... goniometer rotation axis, 17 ... sample holder, 31 ... X-ray Tube, 32 ... X-ray scattering prevention slit, 33 ... Rotating sample stand, 34 ... Goniometer, 35 ... Detector, 36 ... X-ray, 37 ... Powder sample holder, 38 ... Fiber sample holder, 39 ... Collimator

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 試料を試料面内で回転する機構を有する
回転試料台を備えたX線回折装置において、試料を回転
させる回転軸の内部に背後からの照射X線が通過できる
空間を設けるとともに、この空間部にコリメータを内臓
させたことを特徴とするX線回折装置。
1. An X-ray diffraction apparatus equipped with a rotating sample stage having a mechanism for rotating a sample in a sample plane, wherein a space through which irradiation X-rays from behind can pass is provided inside a rotating shaft for rotating the sample. An X-ray diffractometer characterized in that a collimator is incorporated in this space.
JP04171596A 1996-02-28 1996-02-28 X-ray diffractometer Expired - Lifetime JP3168902B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04171596A JP3168902B2 (en) 1996-02-28 1996-02-28 X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04171596A JP3168902B2 (en) 1996-02-28 1996-02-28 X-ray diffractometer

Publications (2)

Publication Number Publication Date
JPH09229880A true JPH09229880A (en) 1997-09-05
JP3168902B2 JP3168902B2 (en) 2001-05-21

Family

ID=12616127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04171596A Expired - Lifetime JP3168902B2 (en) 1996-02-28 1996-02-28 X-ray diffractometer

Country Status (1)

Country Link
JP (1) JP3168902B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10224019B4 (en) * 2002-05-24 2006-02-23 Leibniz-Institut für Festkörper- und Werkstoffforschung e.V. Rotatable sample carrier receiving device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10224019B4 (en) * 2002-05-24 2006-02-23 Leibniz-Institut für Festkörper- und Werkstoffforschung e.V. Rotatable sample carrier receiving device

Also Published As

Publication number Publication date
JP3168902B2 (en) 2001-05-21

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