JPH09210884A - Sample holder for x-ray diffraction apparatus - Google Patents
Sample holder for x-ray diffraction apparatusInfo
- Publication number
- JPH09210884A JPH09210884A JP8035605A JP3560596A JPH09210884A JP H09210884 A JPH09210884 A JP H09210884A JP 8035605 A JP8035605 A JP 8035605A JP 3560596 A JP3560596 A JP 3560596A JP H09210884 A JPH09210884 A JP H09210884A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample plate
- plate
- holder
- main body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Description
【０００１】[0001]
【発明の属する技術分野】本発明は、Ｘ線回折装置用サ
ンプルホルダに関し、詳しくは、微量な粉末試料に好適
なＸ線回折装置用サンプルホルダに関する。TECHNICAL FIELD The present invention relates to a sample holder for an X-ray diffractometer, and more particularly to a sample holder for an X-ray diffractometer which is suitable for a small amount of powder sample.
【０００２】[0002]
【従来の技術】Ｘ線回折装置において微量な粉末試料を
取扱う際、図４に示すようなサンプルホルダが一般に使
用されている。このサンプルホルダは、板ばね式下蓋
（ａ）を着脱自在に装着したリング状のホルダ本体
（ｂ）と、ホルダ本体（ｂ）内に収容されて上方に抜け
止め係止され、且つ、板ばね式下蓋（ａ）により上方に
付勢され試料板（ｃ）とを備えている。2. Description of the Related Art When handling a small amount of powder sample in an X-ray diffractometer, a sample holder as shown in FIG. 4 is generally used. This sample holder includes a ring-shaped holder body (b) to which a leaf spring type lower lid (a) is detachably mounted, a holder body (b) that is housed in the holder body (b) and is locked so as not to come off upward, and It is provided with a sample plate (c) which is biased upward by a spring type lower lid (a).
【０００３】前記サンプルホルダは、ホルダ本体（ｂ）
の上面が試料測定面の成形基準面（ｄ）を成し、この成
形基準面（ｄ）より所定量下がった位置に試料板（ｃ）
の上面が臨んでいる。斯かるサンプルホルダにおいて
は、図５に示す様に、微量な粉末試料（ｅ）は、試料板
（ｃ）上に載置され、ホルダ本体（ｂ）の成形基準面
（ｄ）にガラス板（ｆ）が押圧されることによって平滑
な試料測定面（ｇ）が形成される。The sample holder has a holder body (b).
Upper surface of the sample plate forms a molding reference surface (d) of the sample measurement surface, and the sample plate (c) is located at a position lower than the molding reference surface (d) by a predetermined amount.
The upper surface of is facing. In such a sample holder, as shown in FIG. 5, a small amount of powder sample (e) is placed on a sample plate (c) and a glass plate (d) is attached to the molding reference surface (d) of the holder body (b). A smooth sample measuring surface (g) is formed by pressing f).
【０００４】[0004]
【発明が解決しようとする課題】ところで、従来のサン
プルホルダは、ホルダ本体（ｂ）の成形基準面（ｄ）と
試料板（ｃ）の上面との段差が予め所定量に設定されて
いるため、用意した粉末試料（ｅ）の量によっては、平
滑な試料測定面（ｇ）を形成することが出来ない虞れが
ある。By the way, in the conventional sample holder, the step between the molding reference surface (d) of the holder body (b) and the upper surface of the sample plate (c) is set to a predetermined amount in advance. Depending on the amount of the prepared powder sample (e), it may not be possible to form a smooth sample measuring surface (g).
【０００５】本発明は、斯かる実情に鑑みなされたもの
であり、その目的は、粉末試料の量の多少に拘らず、微
量の粉末試料に対しても的確に試料測定面を形成するこ
とが出来るＸ線回折装置用サンプルホルダを提供するこ
とにある。The present invention has been made in view of the above circumstances, and an object thereof is to accurately form a sample measuring surface even on a minute amount of a powder sample regardless of the amount of the powder sample. An object is to provide a sample holder for an X-ray diffractometer that can be used.
【０００６】[0006]
【課題を解決するための手段】前記の目的を達成する手
段として、本発明のＸ線回折装置用サンプルホルダは、
試料測定面の成形基準面を成す上面に凹所が開口するホ
ルダ本体と、粉末試料が載置される試料板とを備え、試
料板は、コンパウンドを介し、ホルダ本体の凹所内に押
込み高さを調節自在に設置されることを特徴とする。As a means for achieving the above object, a sample holder for an X-ray diffraction apparatus according to the present invention comprises:
It is equipped with a holder body with a recess opening on the upper surface that forms the molding reference surface of the sample measurement surface, and a sample plate on which the powder sample is placed.The sample plate is pushed through the compound into the recess of the holder body It is characterized by being installed so that it can be adjusted.
【０００７】また、本発明は、ホルダ本体の底部に試料
板の押出し作業孔を有していることも特徴とし、試料板
がシリコン無反射板であることも特徴とする。The present invention is also characterized in that the bottom of the holder main body has an extrusion work hole for the sample plate, and the sample plate is a silicon non-reflective plate.
【０００８】[0008]
【発明の実施の形態】以下、本発明の実施形態を図面を
参照して説明する。図１に示す様に、本発明のＸ線回折
装置用サンプルホルダは、ホルダ本体（１）と試料板
（２）とコンパウンド（３）とを主体に構成されてい
る。Embodiments of the present invention will be described below with reference to the drawings. As shown in FIG. 1, the sample holder for an X-ray diffraction apparatus of the present invention is mainly composed of a holder body (1), a sample plate (2), and a compound (3).
【０００９】ホルダ本体（１）は、試料測定面の成形基
準面（１ａ）を成す上面に円形の凹所（１ｂ）が開口す
る概略円板状の形態を備え、底部には凹所（１ｂ）に通
じる押出し作業孔（１ｃ）が形成されている。The holder body (1) has a substantially disc-like shape in which a circular recess (1b) is opened on the upper surface which constitutes the molding reference surface (1a) of the sample measurement surface, and the recess (1b) is formed on the bottom. ), An extrusion work hole (1c) is formed.
【００１０】試料板（２）としては、ハロー現象の生じ
ないシリコン無反射板が特に使用されている。斯かる試
料板（２）は、ホルダ本体（１）の凹所（１ｂ）内に収
容可能な外径を有し、且つ凹所（１ｂ）の深さより小さ
い厚みに設定されている。また、コンパウンド（３）
は、油粘土などの塑性変形可能な素材からなる。そし
て、試料板（２）は、ホルダ本体（１）の凹所（１ｂ）
内にコンパウンド（３）を介して収容されることによ
り、その押込み高さを自在に調節できる様に為されてい
る。As the sample plate (2), a silicon antireflection plate which does not cause a halo phenomenon is particularly used. Such a sample plate (2) has an outer diameter that can be accommodated in the recess (1b) of the holder body (1) and is set to have a thickness smaller than the depth of the recess (1b). Also, compound (3)
Is made of a plastically deformable material such as oil clay. Then, the sample plate (2) is the recess (1b) of the holder body (1).
By being accommodated in the interior via the compound (3), the pushing height can be freely adjusted.
【００１１】次に、以上の様に構成されたＸ線回折装置
用サンプルホルダの一実施形態の使用例を説明する。使
用に際しては、例えば図２に示す様な試料押圧ブロック
（４）を用意する。試料押圧ブロック（４）は、ホルダ
本体（１）の凹所（１ｂ）を覆って周囲の成形基準面
（１ａ）に平面接触可能な押圧面（４ａ）と、ホルダ本
体（１）の外周面を案内可能な、例えば３本のガイドピ
ン（４ｂ）とを有する。Next, an example of use of one embodiment of the sample holder for the X-ray diffraction apparatus configured as described above will be described. In use, a sample pressing block (4) as shown in FIG. 2 is prepared. The sample pressing block (4) includes a pressing surface (4a) which covers the recess (1b) of the holder body (1) and can be brought into flat contact with the surrounding molding reference surface (1a), and an outer peripheral surface of the holder body (1). , Which has, for example, three guide pins (4b).
【００１２】先ず、用意した粉末試料（５）を試料押圧
ブロック（４）の押圧面（４ａ）上に載置する。続い
て、粉末試料（５）上に試料板（２）を被せ、試料板
（２）の上面周縁近傍にボール状に形成した例えば３〜
４個のコンパウンド（３）を周方向に略均等に配して載
せる。その際、押圧面（４ａ）から各コンパウンド
（３）の頂点までの高さは、ホルダ本体（１）の凹所
（１ｂ）の深さより大きくしておく。First, the prepared powder sample (5) is placed on the pressing surface (4a) of the sample pressing block (4). Subsequently, the powder sample (5) is covered with the sample plate (2) and formed into a ball shape in the vicinity of the peripheral edge of the upper surface of the sample plate (2).
Place the four compounds (3) in a circumferentially even arrangement. At that time, the height from the pressing surface (4a) to the apex of each compound (3) is made larger than the depth of the recess (1b) of the holder body (1).
【００１３】次に、凹所（１ｂ）を下向きにしてホルダ
本体（１）をコンパウンド（３）及び試料板（２）に被
せる。その際、ホルダ本体（１）の外周面を試料押圧ブ
ロック（４）の各ガイドピン（４ｂ）の内側に合わせ
る。そしてこの状態で、ホルダ本体（１）を押圧し、そ
の成形基準面（１ａ）を試料押圧ブロック（４）の押圧
面（４ａ）に密着させる。Next, the holder body (1) is put on the compound (3) and the sample plate (2) with the recess (1b) facing downward. At that time, the outer peripheral surface of the holder body (1) is aligned with the inside of each guide pin (4b) of the sample pressing block (4). Then, in this state, the holder main body (1) is pressed to bring the molding reference surface (1a) into close contact with the pressing surface (4a) of the sample pressing block (4).
【００１４】斯かる操作により、粉末試料（５）は試料
板（２）と試料押圧ブロック（４）との間で圧縮され且
つコンパウンド（３）が塑性変形する。そして、粉末試
料（５）の下面は、試料押圧ブロック（４）の押圧面
（４ａ）に倣ってホルダ本体（１）の成形基準面（１
ａ）と同一面を成す。そこで、試料押圧ブロック（４）
及びホルダ本体（１）を上下に反転し、試料押圧ブロッ
ク（４）を取り外す。これにより、図３に示す様に、ホ
ルダ本体（１）の成形基準面（１ａ）と同一面を成す試
料測定面（５ａ）が粉末試料（５）に形成される。By such an operation, the powder sample (5) is compressed between the sample plate (2) and the sample pressing block (4) and the compound (3) is plastically deformed. The lower surface of the powder sample (5) follows the pressing surface (4a) of the sample pressing block (4) and the molding reference surface (1) of the holder body (1).
It forms the same plane as a). Therefore, the sample pressing block (4)
And the holder body (1) is turned upside down and the sample pressing block (4) is removed. As a result, as shown in FIG. 3, a sample measurement surface (5a) that is flush with the molding reference surface (1a) of the holder body (1) is formed on the powder sample (5).
【００１５】即ち、本発明では、試料板（２）の押込み
高さがコンパウンド（３）の塑性変形量に応じて調節さ
れるため、粉末試料（５）の量の多少に拘らず、極微量
の粉末試料（５）に対しても、的確に試料測定面（５
ａ）を形成することが出来る。That is, in the present invention, since the indentation height of the sample plate (2) is adjusted according to the amount of plastic deformation of the compound (3), regardless of the amount of the powder sample (5), an extremely small amount is obtained. For the powder sample (5) of
a) can be formed.
【００１６】試料測定面（５ａ）が形成された粉末試料
（５）は、ホルダ本体（１）と共に図示省略したＸ線回
折装置にセットされ、各種分析に供せられる。この分析
において、粉末試料（５）を載置した試料板（２）は、
シリコン無反射板であってハロー現象が生じないため、
高精度の分析が可能となる。The powder sample (5) on which the sample measurement surface (5a) is formed is set together with the holder main body (1) in an X-ray diffractometer (not shown) and used for various analyses. In this analysis, the sample plate (2) carrying the powder sample (5)
Since it is a silicon non-reflective plate and the halo phenomenon does not occur,
Highly accurate analysis is possible.
【００１７】分析作業が終了し、ホルダ本体（１）から
試料板（２）を分離する際には、ホルダ本体（１）底部
の押出し作業孔（１ｃ）から指などを挿入して試料板
（２）を押し出す。これにより、ホルダ本体（１）から
試料板（２）を簡単に取り外すことが出来る。When the sample plate (2) is separated from the holder main body (1) after the analysis work is completed, a finger or the like is inserted from the extrusion work hole (1c) at the bottom of the holder main body (1) to insert the sample plate ( 2) Push out. This allows the sample plate (2) to be easily removed from the holder body (1).
【００１８】なお、一実施形態のホルダ本体（１）は、
成形基準面（１ａ）及び凹所（１ｂ）を有する上部半体
と、押出し作業孔（１ｃ）を有する下部半体とに分割
し、両者を着脱自在に構成しても良い。The holder body (1) of one embodiment is
Alternatively, the upper half body having the molding reference surface (1a) and the recess (1b) and the lower half body having the extrusion work hole (1c) may be divided and both may be detachably configured.
【００１９】また、コンパウンド（３）はリング状に成
形して試料板（２）上に載せても良い。さらに、図１の
様に、ホルダ本体（１）の成形基準面（１ａ）より突出
する状態で試料板（２）をコンパウンド（３）を介して
ホルダ本体（１）の凹所（１ｂ）内に設置し、試料板
（２）上に粉末試料（５）を載せてその上から試料押圧
ブロック（４）を押圧する様にしても良い。Further, the compound (3) may be formed in a ring shape and placed on the sample plate (2). Further, as shown in FIG. 1, the sample plate (2) is protruded from the molding reference surface (1a) of the holder body (1) through the compound (3) in the recess (1b) of the holder body (1). Alternatively, the powder sample (5) may be placed on the sample plate (2) and the sample pressing block (4) may be pressed from above.
【００２０】[0020]
【発明の効果】以上説明した様に、本発明によれば、試
料板の押込み高さがコンパウンドの塑性変形量に応じて
調節されるため、粉末試料の量の多少に拘らず、微量の
粉末試料に対しても的確に試料測定面を形成することが
出来る。As described above, according to the present invention, since the indentation height of the sample plate is adjusted according to the amount of plastic deformation of the compound, a small amount of powder is used regardless of the amount of powder sample. The sample measurement surface can be formed accurately even on the sample.
【図１】本発明によるＸ線回折装置用サンプルホルダの
一実施形態の全体構造を示す断面図である。FIG. 1 is a sectional view showing the overall structure of an embodiment of a sample holder for an X-ray diffraction device according to the present invention.
【図２】一実施形態の使用例を示す断面図である。FIG. 2 is a cross-sectional view showing a usage example of an embodiment.
【図３】一実施形態の使用例を示す断面図である。FIG. 3 is a cross-sectional view showing a usage example of an embodiment.
【図４】一従来例の全体構造を示す断面図である。FIG. 4 is a sectional view showing an overall structure of a conventional example.
【図５】一従来例の使用例を示す断面図である。FIG. 5 is a cross-sectional view showing a usage example of a conventional example.
１ ：ホルダ本体 １ａ ：成形基準面 １ｂ ：凹所 １ｃ ：押出し作業孔 ２ ：試料板 ３ ：コンパウンド ４ ：試料押圧ブロック ４ａ ：押圧面 ４ｂ ：ガイドピン ５ ：粉末試料 ５ａ ：試料測定面 1: Holder body 1a: Molding reference surface 1b: Recess 1c: Extrusion work hole 2: Sample plate 3: Compound 4: Sample pressing block 4a: Pressing surface 4b: Guide pin 5: Powder sample 5a: Sample measuring surface
Claims (3)
上面に凹所（１ｂ）が開口するホルダ本体（１）と、粉
末試料が載置される試料板（２）とを備え、試料板
（２）は、コンパウンド（３）を介し、ホルダ本体
（１）の凹所（１ｂ）内に押込み高さを調節自在に設置
されることを特徴とするＸ線回折装置用サンプルホル
ダ。1. A holder main body (1) having a concave (1b) opening on an upper surface which constitutes a molding reference surface (1a) of a sample measurement surface, and a sample plate (2) on which a powder sample is placed, A sample holder for an X-ray diffractometer, characterized in that the sample plate (2) is installed via a compound (3) into a recess (1b) of the holder body (1) so that the height of the sample can be adjusted freely.
出し作業孔（１ｃ）を底部に有している請求項１記載の
Ｘ線回折装置用サンプルホルダ。2. The sample holder for an X-ray diffraction apparatus according to claim 1, wherein the holder body (1) has an extrusion work hole (1c) in the bottom of the sample plate (2).
る請求項１又は２記載のＸ線回折装置用サンプルホル
ダ。3. The sample holder for an X-ray diffractometer according to claim 1, wherein the sample plate (2) is a silicon non-reflection plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8035605A JPH09210884A (en) | 1996-01-30 | 1996-01-30 | Sample holder for x-ray diffraction apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8035605A JPH09210884A (en) | 1996-01-30 | 1996-01-30 | Sample holder for x-ray diffraction apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH09210884A true JPH09210884A (en) | 1997-08-15 |
Family
ID=12446469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8035605A Withdrawn JPH09210884A (en) | 1996-01-30 | 1996-01-30 | Sample holder for x-ray diffraction apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH09210884A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009150911A (en) * | 2005-08-30 | 2009-07-09 | Rigaku Corp | Device for x-ray diffraction quantitative determination |
| JP2012112697A (en) * | 2010-11-22 | 2012-06-14 | Sumitomo Electric Ind Ltd | X-ray diffraction jig, x-ray diffraction device, and measuring method of x-ray diffraction |
| CN105723210A (en) * | 2013-09-19 | 2016-06-29 | Fl史密斯公司 | Front-loading sample preparation apparatus and methods thereof |
| CN106323715A (en) * | 2016-09-29 | 2017-01-11 | 四川理工学院 | Powder sample clamping and fixing device and clamping and fixing method for reflection spectrum detection |
| CN106442699A (en) * | 2016-10-11 | 2017-02-22 | 中山大学 | Sample tray for sample cell of Geolas series laser ablation system |
-
1996
- 1996-01-30 JP JP8035605A patent/JPH09210884A/en not_active Withdrawn
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009150911A (en) * | 2005-08-30 | 2009-07-09 | Rigaku Corp | Device for x-ray diffraction quantitative determination |
| JP2012112697A (en) * | 2010-11-22 | 2012-06-14 | Sumitomo Electric Ind Ltd | X-ray diffraction jig, x-ray diffraction device, and measuring method of x-ray diffraction |
| CN105723210A (en) * | 2013-09-19 | 2016-06-29 | Fl史密斯公司 | Front-loading sample preparation apparatus and methods thereof |
| CN106323715A (en) * | 2016-09-29 | 2017-01-11 | 四川理工学院 | Powder sample clamping and fixing device and clamping and fixing method for reflection spectrum detection |
| CN106323715B (en) * | 2016-09-29 | 2019-04-23 | 四川理工学院 | A kind of powder sample clamping device for reflection spectrum detection and clamping method |
| CN106442699A (en) * | 2016-10-11 | 2017-02-22 | 中山大学 | Sample tray for sample cell of Geolas series laser ablation system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20030401 |