JPH09197002A - Electronic mechanical parts and connection failure detection circuit and method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To automatically judge whether the contact of such electronic mechanical part as a socket and the terminal of an electronic part are electrically and positively connected or not. SOLUTION: A voltage is supplied from a signal generation circuit 302 to a first contact out of a pair of contacts which are electrically and mutually insulated and the voltage is propagated to a second contact via a connection terminal when the connection terminal is connected properly. By monitoring the output of ANDs 1-33 and NOT 1 with a voltage generated at the second contact and the output voltage of the signal generation circuit 302 as input is using LEDs 2 and 4-66, connection failure can be found. Also, by monitoring the output voltage of the signal generation circuit 302 using LEDs 1 and 3-65, the trouble of the signal generation circuit 302 can be found. Further, by monitoring the output of the AND 34 using the LED 68, the connection failure of the grounding terminal of an LSI 206, all connection failures, and the trouble of the signal generation circuit 302 can be found.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic mechanism component that can be used in a portion requiring electrical connection such as a socket, a connector, a plug or a jack.
The present invention relates to a technique effectively applied when the electronic mechanism component is applied to aging of an electronic component or an electrical characteristic test.

[0002]

2. Description of the Related Art In an electrical characteristic test of an electronic component such as an LSI or in an aging (preliminary depleted electrical characteristic removal) performed prior to the electronic component, the electronic component is mounted on an electronic mechanical component such as a socket provided on a dedicated board. Aging is carried out as a preliminary of screening by an electrical characteristic test.

Here, it is determined whether the AC or DC voltage or both voltages applied to the terminals of the electronic component are surely transmitted, or whether the connection for measuring the terminal voltage or the current is surely made. It is an important check item that is a prerequisite for aging treatment for screening and evaluation of electrical characteristics.

However, in the aging treatment or the electrical characteristic test, whether the metal leads, which are the terminals of the electronic component when the electronic component is mounted on the socket, are electrically contacted with the metal contact portion of the socket. It is not easy to check.

That is, to check the connection, the probe tip of an oscilloscope, which is an electric signal waveform observing device, is brought into contact with all the pins of the lead exposed portion of the electronic component mounted in the electronic component socket on a pin-by-pin basis. While doing so, it is necessary to individually visually observe whether the waveform is correct.

A detailed description of the LSI test evaluation and apparatus is given on November 30, 1984.
Published by Ohmsha Co., Ltd., "LSI Handbook" p
649 to p669.

[0007]

However, in the above-mentioned manual connection confirmation, if the electronic component is a multi-pin package such as an LSI, for example, a 100-pin package, all the pins are erroneously confirmed or overlooked. Is difficult.

That is, a dedicated board used in the aging process in a mass production factory usually has a large number of LSIs per board.
Since a socket is mounted and more than 100 dedicated boards are usually set with one aging device, all leads of 100,000 or more of the 1000 or more LSIs mounted on it are manually mistaken. It is practically impossible to observe the waveform without it.

Also, in this manual connection confirmation system,
It cannot be observed in real time, and depending on the structure of the LSI socket, there are some types in which the leads are not exposed, and it may not be possible to confirm even a small number of leads.

Further, when conducting an electrical characteristic test, the work as described above, that is, the probe of an oscilloscope for all pins of an electronic component, is performed before starting the test.
Although it is necessary to visually observe waveforms while making contact with each other, this selection method, which involves manual manipulation, requires a few minutes even for a skilled worker.
This method is unacceptable in terms of manufacturing cost in the screening process of a mass-production factory, which is more than a rationalization of several seconds for the measurement of I.

For this reason, reliable aging cannot be performed, and screening is incomplete, which may cause poor marketability due to reliability.

Further, in the electrical characteristic test, it is difficult to distinguish whether the contact is defective due to the contact failure between the contact and the lead or the defect is due to the functional defect of the electronic component. There is also the burden of.

An object of the present invention is to provide a technique capable of automatically determining whether or not the electrical connection between a contactor of an electronic mechanism component such as a socket and a terminal of the electronic component is reliably established. Especially.

Another object of the present invention is to provide a technique capable of easily detecting a defect such as a defective connection between a contactor of an electronic mechanism part and a terminal of the electronic part in an aging process or an electrical characteristic test. is there.

Still another object of the present invention is that the detected malfunction is caused by a poor connection between a contact of the electronic mechanism part and a terminal of the electronic part, or is used for an aging treatment or an electrical characteristic test. It is an object of the present invention to provide a technique capable of easily discriminating whether or not it is caused by the circuit of the signal source.

Still another object of the present invention is to issue an alarm and promptly alert an operator if there is a defect such as a defective connection in even one place in an aging treatment device or an electrical characteristic test device having a huge number of connection parts. It provides the technology that can be done.

Still another object of the present invention is to reduce producer risk and reduce marketability defects by selecting only those which are truly judged to be defective due to functional defects in electronic components.

The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

[0019]

SUMMARY OF THE INVENTION Among the inventions disclosed in the present application, the outline of a representative one will be briefly described.
It is as follows.

(1) The electronic mechanical component of the present invention is an electronic mechanical component that electrically connects an electronic component and an external circuit by inserting connection terminals of the electronic component into a plurality of connecting portions. Provided at each connection part where the terminal is inserted,
At least the first contactor having at least its surface made of a conductive material and the first contactor, which is electrically insulated from the first contactor, is provided at a distance from the first contactor for each connection portion. It includes a second contactor whose surface is made of a conductive material, and an electrically insulating substrate that supports the first and second contactors.

According to such an electronic mechanism component, since the first and second contacts which are electrically insulated from each other are provided for each connection portion, the terminal of the electronic component inserted in this connection portion. The state of connection between the contact of the electronic component and the contact of the electronic mechanism component can be determined for each connection portion. That is, when the terminal is in contact with both contacts, the impedance between the contacts approaches zero, and when the terminal is in contact with either one of the contacts or both are not in contact, contact is made. It can be determined that the connection between the terminal and the contact is good when the impedance between the contacts is large and at least the impedance between the contacts is small.

(2) In the connection failure detection circuit of the present invention, the signal generation circuit connected to each first contact provided for each connection portion of the electronic mechanism component and each connection portion of the electronic mechanism component. A detection circuit provided for each connection portion of the electronic mechanism parts that receives each signal generated in each provided second contactor and each output signal of the signal generation circuit, and a detection circuit for detecting the output of the detection circuit And a display circuit for displaying each.

According to such a connection failure detection circuit, the signal generated by the signal generation circuit is applied to the first contactor, and the first contactor and the second contactor are terminals of the electronic component. When electrically connected via the, the signal voltage is generated in the second contact. By detecting the signal generated in the second contactor by the detection circuit, it is possible to determine whether or not the terminal of the electronic component and the contactor are reliably connected. In addition, this determination result can be displayed by the display circuit. These determinations and the display of the results can be performed for each connection portion, and it is also possible to determine in which portion the connection is defective.

(3) In addition to the configuration of the connection failure detection circuit described in (2) above, the connection failure detection circuit receives as input all output signals of the detection circuit provided for each connection part of the electronic mechanism parts. The integrated detection circuit, a display circuit for displaying the output of the integrated detection circuit, and a warning means for issuing a warning when necessary according to the output result of the integrated detection circuit.

According to such a connection failure detection circuit, since a comprehensive detection circuit that receives all output signals of the detection circuit is provided, if a connection failure exists even at one of the connection portions, it is detected. It becomes possible to detect. Further, the defect can be displayed and a warning can be issued. By this warning, the operator can promptly take measures such as removing obstacles, ensure processing such as electrical characteristic test or aging, and improve productivity. It goes without saying that the display can also indicate that the display is in a good state with no defects.

(4) In the connection failure detection circuit of the present invention, in addition to the configuration of the connection failure detection circuit described in (2) or (3) above, at least one of the detection circuits has A rectifier circuit is provided in the input stage.

With such a connection failure detection circuit, not only a DC signal but also an AC signal or a pulsed signal can be used as a signal for detecting a connection failure. Since a test signal used for an electrical characteristic test of an electronic component or a bias voltage used for processing during aging is often an alternating current or a pulsed voltage, it is possible to detect a rectifier circuit such as that of the present invention at its input. In the connection failure detection circuit having a circuit, the test signal or the bias voltage can be directly used as an input signal for detecting the connection failure.

(5) In the connection failure detection circuit of the present invention, the signal generation circuit of the connection failure detection circuit described in the above (2) to (4) is replaced with AC, DC or both for aging of electronic parts. Bias voltage generation circuit that generates voltage,
Alternatively, it is a test signal generation circuit used in an electrical characteristic test of an electronic component.

According to such a connection failure detection circuit, it is not necessary to provide a signal generation circuit specially, and a bias voltage generation circuit used therefor is used at the time of aging,
At the time of the electrical characteristic test, the test signal generating circuit used therein can be used to detect the connection failure.

(6) The connection failure detection method of the present invention is a connection failure detection method using the connection failure detection circuit described in (2) to (5) above, and is applied to the first contact. Second display for performing logical AND operation of the output signal voltage from the signal generating circuit or its rectified output signal voltage and the voltage generated in the second contactor or its rectified voltage, and displaying the result by lighting or extinguishing And the first display for displaying the output signal voltage or the rectified output signal voltage by lighting or extinguishing, and when only the second display indicates “false”, the electrical mechanism part If it is determined that the terminal of the electronic component in the connection part of the connection is defective, and both the first and second displays indicate "false", it is determined that there is an abnormality in the signal generation circuit. To do.

According to such a connection failure detecting method, not only the connection failure in the connection portion is detected, but also the supply of the DC or AC bias voltage to the contactor of the connection portion is detected. It is possible to This makes it possible to determine whether there is a poor connection at the connection part or an abnormality on the signal generation circuit side, and it is possible to give effective information to the operator when a failure occurs, and the operator's prompt Can enable appropriate treatment.

The display of "false" means that a light emitting diode (LED) or the like programmed to emit light in advance is emitting light when there is a problem such as disconnection. It may be displayed so that it emits light and turns off or blinks when there is a problem. When a known logic circuit (AND circuit, NOT circuit, etc.) is used, it is normal to set the high voltage state “H” to “true” and the low voltage state “L” to “false”. It suffices to configure the logic circuit so as to have an inverse logic without being caught, and to be "false" if there is a defect as a result.

(7) In addition to the configuration of the connection failure detection method described in (6), the connection failure detection method of the present invention has an output voltage of a circuit for performing a logical product operation and an output supplied from a signal generation circuit. Performs a logical product operation on all voltages of the signal voltage or rectified output signal voltage, and the result is "false"
If so, it is determined that there is a defect such as a poor connection of the terminal of the electronic component or an abnormality of the signal generating circuit in the connection portion of the electronic mechanism component.

According to such a connection failure detecting method, during the aging or the electric characteristic test,
When a connection failure or a failure occurs in either of the signal generation circuits, it can be detected promptly, and the operator can take prompt action. In addition, even in an aging or electrical characteristic test system having an enormous number of connections, it is possible to automatically and easily detect a defect. Needless to say, a warning can be issued if necessary.

(8) In the connection failure detection method in the electric characteristics test of the present invention, the signal generation circuit of the connection failure detection method described in (6) or (7) is used in the electric characteristics test of electronic parts. This is a test signal generation circuit, and when the terminal of the electronic component is dedicated for output or is inputting or outputting and is in output operation, the output signal itself is detected as a connection failure with respect to the first and second connectors. It is a signal.

According to such a connection failure detection method, it is possible to detect a connection failure of a terminal of an electronic component that is dedicated to output or is input or output and is in output operation in an electrical characteristic test. That is, it is possible to detect the connection failure using the signal during the input operation and confirm that there is no connection failure by applying the same means as in (b) above, and further, the output voltage generated by the electronic component itself during the output operation. If it is not detected, it can be determined that the defect is due to the functional defect of the electronic component, and it is possible to reduce the risk of the producer erroneously determining a good product as a defective product.

[0037]

Embodiments of the present invention will be described below in detail with reference to the drawings. In all the drawings for describing the embodiments, the same members are denoted by the same reference numerals, and a repeated description thereof will be omitted.

(Embodiment) FIG. 1 is a circuit diagram showing an example of a connection failure detection circuit which is an embodiment of the present invention, and FIG. 2 is an electronic mechanism which is an embodiment of the present invention. FIG. 3 is a rear view showing an LSI socket as an example of a component, and FIG. 3 is a sectional view showing a section taken along line III-III in FIG. 2. In FIG. 3, the LSI socket has an L component which is an electronic component.
The state in which the SI is inserted is also shown at the same time.

First, the electronic mechanism component of the present embodiment shown in FIG. 2 will be described.

The LSI socket 201 is provided on the base 202.
34 connection parts 203-1 to 203-34 are provided. The respective connection parts 203-1 to 203-
34 is provided with inner contacts 204-1 to 204-34 and outer contacts 205-1 to 205-34. In FIG. 2, the connecting portions 203-1 to 203-34, the inner contactors 204-1 to 204-34 and the outer contactors 2 are shown.
Concerning 05-1 to 205-34, only the first one of them is shown for convenience, and the notation of the reference is omitted for the second to 34th ones. According to the terminal numbering of the socket, 1, 2, 3, 4, ..., 33, 34 or 1 ', 2',
3 ', 4', ..., 33 ', 34' are written. In addition,
In the following description, when referring to all of the 1st to 34th positions, they are simply referred to as the connecting portion 203, the inner contactor 204 or the outer contactor 205.

The base 202 is electrically insulating and is made of a material such as ceramics or resin.

Inner contact 204 and outer contact 205
Both are made of a conductive material such as a metal or a material whose surface is coated with a conductive metal film or the like. As will be described later, when the connection terminal 207 of the LSI 206 is inserted between them, the connection terminal It has elasticity to some extent so as to come into contact with 207. Further, the inner contactor 204 and the outer contactor 205 are held by the base body 202 while being insulated from each other.

When the LSI 206 is inserted into the LSI socket 201, as shown in FIG.
In, the inner contacts 204-1 to 204-34 and the outer contacts 205-1 to 205-34 come into contact with the connection terminals 207-1 to 207-34, respectively, due to the elastic force thereof.

According to such an LSI socket 201, since the inner contactor 204 and the outer contactor 205 which are electrically insulated from each other are provided for each connection portion 203, the connection terminal 207 of the inserted LSI 206 and The state of connection between the inner contactor 204 and the outer contactor 205 of the LSI socket 201 can be determined for each connecting portion 203. That is, the connection terminal 207
Is in contact with both the inner contact 204 and the outer contact 205, the impedance between the contacts approaches zero, and the connecting terminal 207 contacts either one of the inner contact 204 and the outer contact 205. If the impedance between the contacts is large, or both are not in contact with each other, at least when the impedance between the contacts is small, the connection terminal 207 and the inner contact 2
04 and the outer contact 205 can be determined to be good.

Next, the connection failure detection circuit of this embodiment shown in FIG. 2 and its operation will be described.

The connection failure detection circuit of this embodiment uses the above-mentioned LSI socket 201, and the connection portion 2
A signal generation circuit 302 having an output for each 03 and a connection unit 2
A detection circuit 303 for each 03, a display circuit 304 that displays each output of the detection circuit 303, a comprehensive detection circuit 305 that receives all output signals of the detection circuit 303 as input, and a comprehensive display that displays the output of the comprehensive detection circuit 305. It is composed of a display circuit 306 and an alarm buzzer BZ that issues a warning when necessary according to the output result of the comprehensive detection circuit 305.

The detection circuit 303 is actually realized on a board, is set as a board outside the constant temperature chamber in the housing of the aging device when used for aging, and is a test board with a socket when used for an electrical characteristic test. Is set.

The signal generating circuit 302 is the LSI socket 2
The output is provided for each of the connecting portions 203 of No. 01, and each output is connected to each of the inner contacts 204. Depending on the input / output specifications of the LSI 206 to be loaded, the power supply voltage Vdd
Alternatively, a bias voltage is output as an input signal necessary for the LSI. In the case of the present embodiment, the power supply voltage Vdd is connected to the inner contactor 204-1 of the connecting portion 203-1 and the inner contactor 204-2 of the connecting portions 203-2 to 203-33 is connected.
Signals corresponding to the input specifications are applied to ~ 204-33. In addition, the connection portion 203-of the ground terminal of the LSI 206-
The outer contactor 205-34 provided in 34 is not connected to the signal generating circuit 302, but is grounded via the resistor R100.

At the output of the signal generation circuit 302, buffers BF (hereinafter, simply referred to as BF) 102 to 133 are provided except the power supply voltage supply terminal. Also, BF1
The inputs of 02 to 133 are resistors R (hereinafter, simply referred to as R).
It is grounded via 202 to 233.

The detection circuit 303 includes an outer contactor 205-provided in the connection portion 203-1 of the power supply terminal of the LSI 206.
1 and a power supply voltage output signal of the signal generation circuit 302 are input to an AND circuit AND (hereinafter simply referred to as AN
1) and the connecting portion 2 of the input / output terminal of the LSI 206
03-2 to 203-33 provided on the outer contact 205
Signals generated in −2 to 205-33 and the signal generation circuit 30
AND2 to 33 which receive each output signal of 2 and LS
Input 206 is a signal generated in the inner contactor 204-34 provided in the ground terminal connection portion 203-34 of the I206.
An OT circuit NOT (hereinafter, simply referred to as NOT) 1 is included.

The AND circuit is "H" when both input signals are in the high voltage state "H" (hereinafter simply referred to as "H").
It is well known that the NOT circuit outputs a low voltage state "L" (hereinafter simply referred to as "L") when the input signal is "H".

BF1 to 66 are provided at the inputs of AND1 to 33, and BF57 is provided at the input of NOT1.

A connected to the input / output terminal of the LSI 206
Rectifier circuits re3 to 66 are provided at the inputs of ND2 to 33. The reason why the rectifier circuits re3 to 66 are provided is that
This is to convert the signal into a direct current when a pulsed signal is applied as the input signal. The specifications of the rectifier circuits re3 to 66 are shown in FIG. It is composed of a parallel circuit of a diode D and a buffer BF and a resistor R and a capacitor C. Circuit impedance Zid to which the input part on the diode side is connected
And the input impedance Zibf of the buffer BF and the total combined impedance Zip of the resistor R are Zip = 1 / (1 / (Zid +
Rd) + 1 / Zibf + 1 / R), and the time constant τ = Zip · C of the circuit is selected such that τ> t with respect to the cycle t of the clock pulse applied to this circuit. It

The inputs of AND1 to 33 are grounded via R1 to 66, and the input of NOT1 is connected to the power supply voltage Vcc via R99.

R1-66 and R202-233
When the input terminal is broken or the outer contact 205 causes a contact failure with respect to the connection terminal 207, the circuit impedance becomes large, and the electric signal "H".
The purpose is to maintain the "L" level signal reliably by avoiding the unstable fluctuation between the "L" levels. Also, the impedance Z of the input terminal of BF67
The relationship between i, R99 and R100 is Zi> R99 >> R1
It is necessary to select a value that 00 is satisfactory.

The display circuit 304 is provided for each detection circuit 303, and is a light emitting diode LED (hereinafter, simply referred to as LED) 2, 4, 6 to 66 for displaying the outputs of the ANDs 1 to 33.
And LED1, which displays each output of the signal generation circuit 302
LED 67 for displaying the output of NOT 1 and 3, 5 to 65
It is composed of The cathodes of the LEDs 1 to 67 are connected to the respective outputs, and the anodes are series resistors R101 to 167.
Is connected to the power supply voltage Vcc via.

The total detection circuit 305 comprises an AND 34 which receives the outputs of AND1 to 33 and the output of NOT1, and the total display circuit 306 which displays the output is LE.
It consists of D68. The cathode of the LED 68 is connected to the output of the AND 34, and the anode is connected to the power supply voltage Vcc via the series resistor R168.

The alarm buzzer BZ is connected to NOT2 which receives the output of the AND34, and the output of NOT2 is "L".
If, the warning buzzer sound is not emitted.

Next, the operation of this connection failure detection circuit will be described.

When the LSI 206 is mounted in the LSI socket 201, the connection terminal 207 of the LSI 206 is inserted between the facing surfaces of the inner contact 204 and the outer contact 205 provided in each connecting portion 203.

When the respective contact portions are normally in contact with each other, the inner contactor 204 and the outer contactor 205 are short-circuited by the connection terminal 207, and the impedance between both contactors approaches zero.

As a result, when the contact state is normal,
The signal level of each AND circuit is maintained at "H", and the signal level at the time of occurrence of a defect is changed to "L".

In this situation, LE for displaying the connection state of the connection terminal 207-1 for supplying the power of the LSI 206
The D1 and the LED 2 will be described.

The LED1 has the anode side connected to one end of R101, the cathode side connected to the input terminal of AND1, and the other end of R101 connected to the power supply voltage Vcc.

If a prescribed power supply voltage of, for example, 5.0 V is supplied from the power supply terminal of the signal generating circuit 302,
The H level signal is applied to the input terminal of BF1 and the H level signal is also taken out from the output terminal.

Then, the cathode side of the LED1 becomes high potential and approaches the potential of the anode side, so that no current flows through the LED1 and the LED 1 remains in the extinguished state, indicating that there is no problem.

If an abnormality occurs in the circuit, the signal generating circuit 30
When the power supply voltage is not supplied from the second power supply terminal or the circuit is broken, the operation reverse to the above is performed, and a current flows through the LED 1 to indicate that a malfunction has occurred.

The LED2 has the anode side connected to one end of R102, the cathode side connected to the output terminal of AND1, and the other end of R102 connected to the power supply voltage Vcc.

Here, if the specified power supply voltage of 5.0 V is supplied from the power supply terminal of the signal generating circuit 302, the inner contact 204-1, the connection terminal 207-1 of the LSI 206,
AND1 via outer contactor 205-1 and BF2
If the "H" level signal is applied to one of the input terminals of the input terminal and the other input terminal side is normal, the "H" level signal is applied, so that the "H" level signal is output from the output terminal.

Then, the cathode side of the LED 2 becomes high potential and approaches the potential of the anode side, so that no current flows through the LED 2 and the LED 2 remains in the extinguished state, indicating that there is no problem.

If an abnormality occurs in the circuit, the signal generating circuit 3
02, power supply voltage is not supplied, circuit disconnection occurs, or connection terminal 207-1 of LSI 206
And the inner contactor 204-1 or the outer contactor 205-
In the case of poor contact with 1, the operation is the reverse of the above, and LE
A current flows through D2, and it becomes a lighting state to indicate that a defect has occurred.

Next, another connection terminal 207 of the LSI 206
-2 and LE for displaying the connection status of the -2
D4 will be described.

The LED 3 has the anode side connected to one end of R103, the cathode side connected to the output terminal of the rectifier circuit re3, and the other end of R103 is the power supply voltage Vcc.
It is connected to the.

If a specified clock pulse is supplied from the corresponding terminal of the signal generating circuit 302, BF10
Alternate signal of "H" and "L" is added to the input terminal of 2, and BF
Similar signals are taken out from the output terminal of 102.

Then, a similar waveform-shaped signal is taken out via BF3, added to the input terminal of the rectifier circuit re3, and a DC-converted "H" level signal is taken out from the output terminal of re3.

Then, the cathode side of the LED 3 has a high potential, and no current flows through the LED 3 to maintain the extinguished state, indicating that there is no problem.

If an abnormality occurs in the circuit, the signal generating circuit 3
If the specified clock pulse is not supplied from the corresponding terminal of 02 or the circuit is broken, the operation is the reverse of the above, the cathode side of LED3 becomes low potential, current flows to LED3, and the lighting state is maintained. Then, it will indicate that a failure has occurred.

The LED 4 has the anode side connected to one end of R104, the cathode side connected to the output terminal of AND2, and the other end of R104 connected to the power supply voltage Vcc.

Here, if a specified clock pulse is supplied from the corresponding terminal of the signal generating circuit 302, an alternating signal of "H" and "L" is added to the input terminal of BF4, and a similar signal is also output from the output terminal. Taken out.

Inner contact 204-2, connection terminal 207-2 of LSI 206, outer contact 205-2 and BF4
A similar signal whose waveform has been shaped is taken out via, is applied to the input terminal of the rectifier circuit re4, and a DC-converted "H" level signal is taken out from its output terminal.

Now, the DC-converted "H" level signal is applied to one of the input terminals of the AND2, and the "H" level signal is also applied to the other side of the input terminal if it is normal. The "H" level signal is taken out.

Then, the cathode side of the LED 4 becomes a high potential and approaches the potential of the anode side, so that no current flows through the LED 4 and the LED 4 remains in the off state, indicating that there is no problem.

If an abnormality occurs in the circuit, the signal generating circuit 3
02, a clock pulse is not supplied, a circuit disconnection occurs, or a connection terminal 207-
2 and inner contactor 204-2 or outer contactor 205-2
If the contact with the
A current flows to the No. 4 to turn on the light to indicate that a defect has occurred.

The LEDs 5 to 66 operate similarly to the above.

Next, with respect to the connection terminal 207-34 which is the ground terminal of the LSI 206, an L indicating the connection state is displayed.
The operation of the ED 67 will be described.

The LED 67 has the anode side connected to one end of R167, the cathode side connected to the output terminal of NOT1, and the other end of R167 connected to the power supply voltage Vcc.

Here, the outer contacts 205-34, the LSI
Connection terminal 207-34 of 206, inner contactor 204-3
The "L" level signal is taken out via the signal line 4 and the BF 67.

As a result, the "L" level signal is also applied to the input terminal of NOT1, and the "H" level signal is taken out from the output terminal.

Then, the cathode side of the LED 67 becomes a high potential and approaches the potential of the anode side.
No current flows through 7, and it indicates that there is no malfunction while maintaining the off state.

If an abnormality occurs in the circuit and the circuit is broken, or if there is a poor contact between the connection terminal 207-34 of the LSI 206 and the inner contact 204-34 or the outer contact 205-34, the reverse operation is performed. , LED67
A current will flow into the LED, and the LED will turn on to indicate that a problem has occurred.

Next, when any of the circuits in the detection circuit 303 detects a defect, a comprehensive detection circuit 305 for further detecting it and a comprehensive display circuit 306 for displaying the state thereof.
The operation of the alarm buzzer BZ will be described.

The LED 68, which constitutes the integrated display circuit 306 for displaying the state of the integrated detection circuit 305, has the anode side connected to one end of R168, the cathode side connected to the output terminal of the AND34, and the other end of R168. It is connected to the power supply voltage Vcc.

Here, if it is detected that all the operations of the detection circuit 303 described above are normal, each input terminal of the AND 34 becomes a signal of "H" level, and a logical product (AND) operation is performed. Thus, an "H" level signal is taken out from the output terminal.

Then, the cathode side of the LED 68 has a high potential and approaches the potential of the anode side.
No current flows through 8, and the light-off state is maintained.

Furthermore, the "H" level signal from the output terminal of the AND 34 changes to the "L" level signal after passing through NOT2, and it is possible to confirm that the alarm buzzer BZ does not sound and there is no problem.

If one or more defects are detected in the detection circuit 303, any one of the input terminals of the AND 34 becomes an "L" level signal, and the logical product (AND) operation determines An "L" level signal is also taken out from the output terminal.

Then, the cathode side of the LED 68 has a low potential and the potential difference from the anode side becomes large, so that a current flows through the LED 68 and the lighting state is maintained.

Further, the L level signal from the output terminal of the AND 34 changes to the "H" level signal after passing through NOT2, and the alarm buzzer BZ sounds and it becomes possible to confirm that a defect has occurred.

When the connection failure detection circuit of the present embodiment is used for aging, it is not necessary to supply a signal while the output function is operating at the input / output connection terminal and the output-only connection terminal. Therefore, no electrical contact is made, and therefore it is meaningless to confirm whether or not a defect has occurred, so that no confirmation is made. When using for an electrical characteristic test, while the input function is working for these connection terminals, a dedicated signal for contact confirmation is given to each connection terminal from the test signal generation circuit (not shown), but a failure has occurred. Something is detected.

Further, the connection terminal 207-2 of the LSI 206
Nos. 207-33 have the functions of input only or output only / input / output combined, and the lead having the input / output function among these terminals has a time interval having the input function and the output function. If the input function is switched alternately, it is possible to detect whether or not a malfunction has occurred by synchronizing the input functions.

According to the connection failure detection circuit and the connection failure detection method of this embodiment, the following effects can be obtained.

(1) The signal generated by the signal generation circuit 302 is applied to the inner contactor 204, and if the signal is normal, the inner contactor 204 and the outer contactor 205 are integrated into the LSI 206.
Are electrically connected through the connection terminals 207 of the
The detection circuit 303 can detect a poor connection between the connection terminal 207 of 206 and the inner contactor 204 or the outer contactor 205, and determine whether there is a bad connection. Further, this result can be displayed by the display circuit 304.
These determinations and the display of the results can be performed for each connection unit 203, and it is also possible to determine at which place the connection is defective.

(2) By providing the total detection circuit 305 which receives all the output signals of the detection circuit 303, if there is a connection failure even at one place in the connection portion 203,
It becomes possible to detect it, display the defect,
A warning can be issued. By this warning, the operator can promptly take measures such as removing obstacles, ensure processing such as electrical characteristic test or aging, and improve productivity.

(3) The rectifier circuit r is connected to the input of the detection circuit 303.
Since e3 to 66 are provided, not only a DC signal but also an AC signal or a pulsed signal can be used as a signal for detecting connection failure. As a result, it is possible to detect the connection failure by utilizing the bias voltage generating circuit used therein during the aging and utilizing the test signal generating circuit used therein during the electrical characteristic test.

(4) It is possible to detect not only the connection failure in the connecting portion 203, but also whether or not the voltage supply from the signal generating circuit 302 to the contactor of the connecting portion 203 is normal. Is. This makes it possible to determine whether there is a poor connection in the connection unit 203 or an abnormality in the signal generating circuit 302, and it is possible to give effective information to the operator when a failure occurs, A quick and appropriate treatment can be enabled.

It should be noted that Vdd is the power supply voltage of the MOS device and is supplied to the Vdd terminal of the MOS LSI.
Vcc is the power supply voltage of the bipolar device. FIG.
Although the logic circuit element of is shown as a bipolar type, this terminal line is omitted according to the convention.

Although the invention made by the present inventor has been specifically described based on the embodiments of the present invention, the present invention is not limited to the above embodiments and various modifications can be made without departing from the scope of the invention. It goes without saying that it can be changed.

For example, in the above-described embodiment, an example of a dual in-line (DIL) 34pin package LSI and a dedicated socket has been described. However, the present invention is not limited to this. For example, an imposition type flat (QF, S
O, etc.) Package LSI and dedicated socket may be used.

Also, male socket / female socket, male connector / female connector, plug /
It goes without saying that it may be applied between jacks and the like.

[0110]

The effects obtained by typical ones of the inventions disclosed in the present application will be briefly described as follows.

(1) The state of connection between the connection terminal of the electronic component inserted in the connection portion and the contact of the electronic mechanism component can be determined for each connection portion.

(2) By detecting the connection state of the connection terminal with the detection circuit, it is possible to determine whether or not the terminal of the electronic component and the contact are securely connected. In addition, this determination result can be displayed by the display circuit. These determinations and the display of the results can be performed for each connection portion, and it is also possible to determine in which portion the connection is defective.

(3) If there is a connection failure even at one of the connection parts, it can be detected. Further, the defect can be displayed and a warning can be issued.

(4) Not only a DC signal but also an AC signal or a pulsed signal can be used as a signal for detecting connection failure.

(5) It is not necessary to provide a signal generation circuit specially, and the bias voltage generation circuit used there is used during aging, and the test signal generation circuit used there is used during the electrical characteristic test. Defects can be detected, which enables reliable aging and reduces marketable defects.

(6) It is possible to detect not only the connection failure at the connection portion, but also whether the supply of the power supply or the bias voltage to the contactor of the connection portion is normal.

(7) During the aging or the electrical characteristic test, if a connection failure or a failure occurs in any of the signal generating circuits, it can be detected promptly, and the operator can take prompt action. It will be possible. In addition, even in an aging or electric characteristic test system having many connecting portions, it is possible to automatically and easily detect a defect.

(8) It is possible to detect the connection failure of the terminal of the electronic component which is dedicated to the output in the electrical characteristic test or is being used for the input or the output and is in the output operation. As a result, if the response of the terminal to the test signal deviates from the expected value, it is possible to clearly determine whether the failure is due to a functional defect of the electronic component or a defective connection. It is possible to reduce the person's risk.

[Brief description of drawings]

FIG. 1 is a circuit diagram showing an example of a connection failure detection circuit according to an embodiment of the present invention.

FIG. 2 is a back view showing an LSI socket as an example of an electronic mechanism component according to an embodiment of the present invention.

3 is a cross-sectional view showing a III-III cross section of the LSI socket shown in FIG.

FIG. 4 is a circuit diagram showing details of a rectifier circuit used in the connection failure detection circuit shown in FIG.

[Explanation of symbols]

 201 LSI socket 202 Base body 203 Connection part 204 Inner contact 205 Outer contact 206 LSI 207 Connection terminal 302 Signal generation circuit 303 Detection circuit 304 Display circuit 305 General detection circuit 306 General display circuit AND1 to 34 AND circuit NOT1 and NOT circuit BF1 ~ 133 buffer BZ alarm buzzer C capacitor D diode R resistance LED1 to 68 light emitting diode R1 to 233 resistance Vcc power supply voltage Vdd power supply voltage Zi impedance re3 to 66 rectifier circuit

Claims (8)

[Claims] 1. An electronic mechanical component for electrically connecting the electronic component and an external circuit by inserting the connection terminal of the electronic component into a plurality of connection parts, each of which the connection terminal is inserted. A first contactor provided at the connection part of the first contactor, at least the surface of which is made of a conductive material, and the first contactor are electrically insulated from each other, and are separated from the first contactor. Is provided for each of the connection parts,
An electronic mechanism component, comprising: a second contact at least the surface of which is made of a conductive material; and an electrically insulating substrate that supports the first and second contacts. 2. A connection failure detection circuit having the electronic mechanism component according to claim 1, wherein the signal generation circuit is connected to each first contact provided for each connection portion of the electronic mechanism component. Provided for each connection part of the electronic mechanism part to which each signal generated in each second contact provided for each connection part of the electronic mechanism part and each output signal of the signal generating circuit is inputted And a display circuit for displaying the output of the detection circuit for each of the detection circuits. 3. The connection failure detection circuit according to claim 2, wherein a comprehensive detection circuit that inputs all output signals of the detection circuit provided for each connection portion of the electronic mechanism component, and the comprehensive detection circuit And a warning means for issuing a warning when necessary according to the output result of the comprehensive detection circuit. 4. The connection failure detection circuit according to claim 2, wherein at least one detection circuit of the detection circuits is provided with a rectification circuit at an input stage thereof. Defect detection circuit. 5. The connection failure detection circuit according to claim 2, 3 or 4, wherein the signal generation circuit generates a voltage of alternating current, direct current or both for aging of electronic parts. Or a connection failure detection circuit, which is a test signal generation circuit used in an electrical characteristic test of an electronic component. 6. A connection failure detection method using the connection failure detection circuit according to claim 2, wherein the output signal voltage from the signal generation circuit is applied to the first contact. Alternatively, a logical product operation of a rectified output signal voltage obtained by rectifying the output signal voltage and a voltage generated at the second contactor or a rectified voltage obtained by rectifying the voltage is performed,
A second display for displaying the result, and a first display for displaying the output signal voltage or the rectified output signal voltage,
When only the second display indicates "false", the electronic component at the connection portion of the electronic mechanism component provided with the first and second contacts is referred to. When the terminal connection is determined to be poor and both the first and second displays indicate “false”, it is determined that there is an abnormality in the signal generating circuit. Connection failure detection method. 7. The connection failure detection method according to claim 6, wherein a logical product operation is performed on all voltages of the output voltage of the circuit that performs the logical product operation and the output signal voltage or the rectified output signal voltage, If the result is “false”, it is determined that there is a connection failure of the terminal of the electronic component or an abnormality of the signal generating circuit in the connection portion of the electronic mechanism component, the connection failure detection method. 8. The connection failure detection method according to claim 6, wherein the signal generation circuit is a test signal generation circuit used in an electrical characteristic test of an electronic component, and a terminal of the electronic component is an output only. Alternatively, when the input / output is also used and the output is in operation, the output signal of the electronic component itself becomes a connection failure detection signal for the first and second contacts, and a connection failure detection is performed. Method.