JPH09183685A - Method for building double crucible into furnace - Google Patents

Method for building double crucible into furnace

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Publication number
JPH09183685A
JPH09183685A JP34417595A JP34417595A JPH09183685A JP H09183685 A JPH09183685 A JP H09183685A JP 34417595 A JP34417595 A JP 34417595A JP 34417595 A JP34417595 A JP 34417595A JP H09183685 A JPH09183685 A JP H09183685A
Authority
JP
Japan
Prior art keywords
crucible
furnace
assembly
raw material
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP34417595A
Other languages
Japanese (ja)
Other versions
JP3444071B2 (en
Inventor
Hiroaki Taguchi
裕章 田口
Takashi Atami
貴 熱海
Hisashi Furuya
久 降屋
Michio Kida
道夫 喜田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Silicon Corp
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Silicon Corp
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Silicon Corp, Mitsubishi Materials Corp filed Critical Mitsubishi Materials Silicon Corp
Priority to JP34417595A priority Critical patent/JP3444071B2/en
Publication of JPH09183685A publication Critical patent/JPH09183685A/en
Application granted granted Critical
Publication of JP3444071B2 publication Critical patent/JP3444071B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PROBLEM TO BE SOLVED: To decrease lattice defects, such as dislocation, as far as possible and to improve the working rate of a single crystal pulling-up device by lessening the occurrence of contamination. SOLUTION: An initial raw material is previously put (preset) into an outside crucible 11 in a clean chamber 31 and a crucible assembly 23 for supporting an inside crucible 12 is previously assembled at the time of charging the initial raw material in a method for assembling the double crucible consisting of the outside crucible 11 and the inside crucible 12 into the furnace of the single crystal pulling-up device. The outside crucible 11 and a susceptor 15 are thereafter transported into the furnace and are mounted on a revolving shaft. The inside crucible assembly 23 is mounted into the furnace. The inside crucible assembly 23 is previously assembled and is transported into the furnace and is mounted in addition to the presetting of the outside crucible 11, by which the occurrence of the contamination in the furnace is lessened and the working efficiency is improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、二重構造のルツボ
を用いて貯留された半導体融液より半導体単結晶を引き
上げる単結晶引上装置において、二重ルツボの炉内への
組み込み方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for incorporating a double crucible into a furnace in a single crystal pulling apparatus for pulling a semiconductor single crystal from a semiconductor melt stored by using a double structure crucible. Is.

【0002】[0002]

【従来の技術】従来、シリコン(Si)やガリウムひ素
(GaAs)等の半導体単結晶を成長する方法の一つと
して、CZ法が知られている。このCZ法は、大口径、
高純度の単結晶が無転位あるいは格子欠陥の極めて少な
い状態で容易に得られること等の特徴を有することか
ら、様々な半導体結晶の成長に用いられている方法であ
る。
2. Description of the Related Art Conventionally, the CZ method is known as one of the methods for growing a semiconductor single crystal such as silicon (Si) or gallium arsenide (GaAs). This CZ method has a large diameter,
It is a method used for the growth of various semiconductor crystals because it has characteristics such that a high-purity single crystal can be easily obtained without dislocations or with very few lattice defects.

【0003】近年、単結晶の大口径化、高純度化、酸素
濃度および不純物濃度等の均一化の要求に伴いこのCZ
法も様々に改良され実用に供されている。上記CZ法の
改良型の一つにいわゆる二重ルツボを用いた連続チャー
ジ型磁界印加CZ法(以下、CMCZ法と省略する)が
提案されている。この方法は、外部からルツボ内の半導
体融液に磁界を印加することにより、前記半導体融液内
の対流を抑制し極めて酸素濃度の制御性が良く単結晶化
率が良い単結晶を成長させることができ、外側のルツボ
から原料を連続供給し長尺の半導体単結晶を容易に得る
ことができる等の特徴を有する。したがって、大口径か
つ長尺の半導体単結晶を得るには最も優れた方法の一つ
であると言われている。
In recent years, with the demand for a single crystal having a large diameter, high purity, and uniform oxygen concentration and impurity concentration, the CZ
The method has been variously improved and put to practical use. As one of the improved types of the CZ method, a continuous charge type magnetic field applying CZ method using a so-called double crucible (hereinafter abbreviated as CMCZ method) has been proposed. This method is to apply a magnetic field to the semiconductor melt in the crucible from the outside, to suppress convection in the semiconductor melt and to grow a single crystal with a very good controllability of oxygen concentration and a good single crystallization rate. And the raw material can be continuously supplied from the outer crucible to easily obtain a long semiconductor single crystal. Therefore, it is said to be one of the most excellent methods for obtaining a large-diameter and long semiconductor single crystal.

【0004】図2は、上記のCMCZ法を用いたシリコ
ンの単結晶引上装置の一例の断面図である。この単結晶
引上装置1は、中空の炉であるチャンバ2内に二重ルツ
ボ3、ヒーター4、原料供給管5がそれぞれ配置され、
前記チャンバ2の外部にマグネット9が配置されてい
る。なお、チャンバ2は、上部2aと本体部2bと底部
2cとからなり、上下に分割可能に構成されている。
FIG. 2 is a cross-sectional view of an example of a silicon single crystal pulling apparatus using the above CMCZ method. In this single crystal pulling apparatus 1, a double crucible 3, a heater 4 and a raw material supply pipe 5 are arranged in a chamber 2 which is a hollow furnace,
A magnet 9 is arranged outside the chamber 2. The chamber 2 is composed of an upper portion 2a, a main body portion 2b, and a bottom portion 2c, and is configured to be vertically separable.

【0005】二重ルツボ3は、略半球状の石英(SiO
2)製の外ルツボ11と、該外ルツボ11内に設けられ
た円筒状の仕切り体である石英(SiO2)製の内ルツ
ボ12とから形成され、該内ルツボ12の側壁には、内
ルツボ12と外ルツボ11との間(原料融解領域)と内
ルツボ12の内側(結晶成長領域)とを連通する連通孔
(不図示)が複数個形成されている。
The double crucible 3 is made of substantially hemispherical quartz (SiO 2).
2 ) An outer crucible 11 made of quartz and an inner crucible 12 made of quartz (SiO 2 ) which is a cylindrical partition body provided in the outer crucible 11, and the side wall of the inner crucible 12 has an inner A plurality of communication holes (not shown) are formed to communicate between the crucible 12 and the outer crucible 11 (raw material melting region) and the inner side of the inner crucible 12 (crystal growth region).

【0006】この二重ルツボ3は、チャンバ2の中央下
部に垂直に立設された回転シャフト14の上部フランジ
部10上に載置されており、前記回転シャフト14の軸
線を中心として水平面上で所定の角速度で回転する構成
になっている。そして、この二重ルツボ3内には半導体
融液(加熱融解された半導体単結晶の原料)21が貯留
されている。
The double crucible 3 is placed on an upper flange portion 10 of a rotary shaft 14 which is vertically provided upright in the lower center of the chamber 2, and is arranged on a horizontal plane centered on the axis of the rotary shaft 14. It is configured to rotate at a predetermined angular velocity. A semiconductor melt (raw material for a semiconductor single crystal that has been heated and melted) 21 is stored in the double crucible 3.

【0007】ヒーター4は、半導体の原料をルツボ内で
加熱・融解するとともに生じた半導体融液21を保温す
るもので、通常、抵抗加熱が用いられる。原料供給管5
は、チャンバ2の上部2aを貫通し、その下端開口5a
から、所定量の半導体の原料を外ルツボ11と内ルツボ
12との間の半導体融液21面上に連続的に投入するも
のである。
The heater 4 heats and melts the semiconductor raw material in the crucible and keeps the temperature of the generated semiconductor melt 21, and normally resistance heating is used. Raw material supply pipe 5
Penetrates through the upper part 2a of the chamber 2 and its lower end opening 5a
From this, a predetermined amount of semiconductor raw material is continuously charged onto the surface of the semiconductor melt 21 between the outer crucible 11 and the inner crucible 12.

【0008】マグネット9は、二重ルツボ3の外方から
二重ルツボ3内の半導体融液21に磁界を印加すること
で、半導体融液21内で発生するローレンツ力により該
半導体融液21の対流の制御および酸素濃度の制御、液
面振動の抑制等を行うものである。
The magnet 9 applies a magnetic field from the outside of the double crucible 3 to the semiconductor melt 21 in the double crucible 3, whereby the Lorentz force generated in the semiconductor melt 21 causes the semiconductor melt 21 to move. Control of convection, control of oxygen concentration, suppression of liquid level vibration, etc. are performed.

【0009】上記の原料としては、例えば、多結晶シリ
コンのインゴットを破砕機等で破砕してフレーク状にし
たもの、あるいは、気体原料から熱分解法により粒状に
析出させた多結晶シリコンの顆粒が好適に用いられ、必
要に応じてホウ素(B)(p型シリコン単結晶を作る場
合)やリン(P)(n型シリコン単結晶を作る場合)等
のドーパントと呼ばれる添加元素がさらに供給される。
また、ガリウムヒ素(GaAs)の場合も同様で、この
場合、添加元素は亜鉛(Zn)もしくはシリコン(S
i)等となる。
Examples of the above-mentioned raw material include those obtained by crushing an ingot of polycrystalline silicon with a crusher or the like to form flakes, or granules of polycrystalline silicon deposited in a granular form from a gas raw material by a thermal decomposition method. It is preferably used, and if necessary, an additional element called a dopant such as boron (B) (when making a p-type silicon single crystal) or phosphorus (P) (when making an n-type silicon single crystal) is further supplied. .
The same applies to the case of gallium arsenide (GaAs), in which case the additive element is zinc (Zn) or silicon (S).
i) and so on.

【0010】上記の単結晶引上装置1により、内ルツボ
12の上方かつ軸線上に配された引上軸34に種結晶3
5を吊下げ、半導体融液21上部において種結晶35を
核として半導体単結晶33を成長させる。
By the single crystal pulling apparatus 1 described above, the seed crystal 3 is attached to the pulling shaft 34 arranged above the inner crucible 12 and axially.
5, the semiconductor single crystal 33 is grown on the semiconductor melt 21 with the seed crystal 35 as a nucleus.

【0011】ところで、上記の単結晶引上装置では、特
開昭63−303894号公報に記載されているよう
に、単結晶を成長させる前工程において、外ルツボ11
に予め多結晶シリコン塊等の多結晶原料を融解させて半
導体融液21を貯留し、外ルツボ11の上方に配された
内ルツボ12を、外ルツボ11内に載置して、二重ルツ
ボ3を形成している。このように多結晶原料の融解後に
二重ルツボを形成するのは、多結晶原料を完全に融解し
て半導体融液21を得るために、ヒーター4によって外
ルツボ11内の原料を単結晶成長温度以上の温度まで高
温加熱する必要があり、この際に、予め内ルツボ12を
外ルツボ11内に形成させていると、内ルツボ12に大
きな熱変形が生じてしまうからである。
By the way, in the above-mentioned single crystal pulling apparatus, as described in Japanese Patent Application Laid-Open No. 63-303894, the outer crucible 11 is used in the previous step of growing the single crystal.
A polycrystalline raw material such as a polycrystalline silicon ingot is melted in advance to store the semiconductor melt 21, and the inner crucible 12 arranged above the outer crucible 11 is placed in the outer crucible 11 to form a double crucible. 3 is formed. In this way, the double crucible is formed after melting the polycrystalline raw material because the raw material in the outer crucible 11 is heated by the heater 4 to obtain the semiconductor melt 21 by completely melting the polycrystalline raw material. This is because it is necessary to heat at a high temperature to the above temperature, and at this time, if the inner crucible 12 is formed in the outer crucible 11 in advance, large thermal deformation will occur in the inner crucible 12.

【0012】したがって、原料を完全に融解した後、ヒ
ーター4による加熱をある程度弱めてから内ルツボ12
を外ルツボ11に形成させることによって、初期原料融
解保持時の高温加熱を避け、内ルツボ12の変形を抑制
している。
Therefore, after the raw material is completely melted, the heating by the heater 4 is reduced to some extent before the inner crucible 12 is melted.
Is formed in the outer crucible 11, thereby avoiding high-temperature heating at the time of holding the initial raw material melt and suppressing the deformation of the inner crucible 12.

【0013】また、内ルツボ12に形成された前記連通
孔は、原料供給時に 半導体融液21を外ルツボ11側
から内ルツボ12内にのみ流入させるように一定の開口
面積以下に設定されている。この理由は、結晶成長領域
から半導体融液21が対流により原料融解領域に戻る現
象が生じると単結晶成長における不純物温度および融液
温度等の制御が困難になってしまうためである。
Further, the communication hole formed in the inner crucible 12 is set to have a certain opening area or less so that the semiconductor melt 21 flows only from the outer crucible 11 side into the inner crucible 12 when the raw material is supplied. . This is because if the semiconductor melt 21 returns from the crystal growth region to the raw material melt region by convection, it becomes difficult to control the impurity temperature and the melt temperature during single crystal growth.

【0014】チャンバ2のガス導入口6aからはアルゴ
ンガス(Ar)がチャンバ2内に供給され、このアルゴ
ンガス(Ar)は半導体融液21から発生するSiOを
吹き流したうえ、チャンバ2の下端部のガス排出口8か
ら順次排出される。
Argon gas (Ar) is supplied into the chamber 2 from the gas inlet 6a of the chamber 2. The argon gas (Ar) blows off SiO generated from the semiconductor melt 21 and also the lower end portion of the chamber 2. Are sequentially discharged from the gas discharge port 8.

【0015】ここで、内ルツボ組立体23の構造の一例
について説明する。保温筒16の上端にはアッパーリン
グ部材24が載置され、ここには内ルツボ12の上端部
に固定された円管状の内ルツボ支持部材13の上端部に
係止可能な複数本の係止部材7a,7b(本例では3本
あり、一本の係止部材は不図示)が垂下されている。こ
の複数本の係止部材7a,7bはアッパーリング部材2
4の周方向に並んで配置されている。上記原料供給管5
は、チャンバ2の上部から垂設され、アッパーリング部
材24の係止部材7a,7bと干渉しない位置を貫通す
る。
Here, an example of the structure of the inner crucible assembly 23 will be described. An upper ring member 24 is placed on the upper end of the heat insulating cylinder 16, and a plurality of locking members that can be locked to the upper end portion of the circular tube-shaped inner crucible support member 13 fixed to the upper end portion of the inner crucible 12 are mounted on the upper ring member 24. Members 7a and 7b (in this example, there are three, and one locking member is not shown) are suspended. The plurality of locking members 7a and 7b are the upper ring member 2
4 are arranged side by side in the circumferential direction. The raw material supply pipe 5
Is hung from the upper part of the chamber 2 and penetrates the upper ring member 24 at a position where it does not interfere with the locking members 7a and 7b.

【0016】上記構成の単結晶引上装置における原料の
初期投入方法については、先ず、チャンバ2の上部2a
を上昇させて開放する。これと並行して、所定のクリー
ン室内において、サセプタ15に保持された外ルツボ1
1内に原料を入れる。前記サセプタ15に支持された外
ルツボ11を回転シャフト14に搭載して装着する。
Regarding the initial charging method of the raw material in the single crystal pulling apparatus having the above structure, first, the upper part 2a of the chamber 2 is
Raise to open. In parallel with this, the outer crucible 1 held by the susceptor 15 in a predetermined clean room.
Put the ingredients in 1. The outer crucible 11 supported by the susceptor 15 is mounted on the rotating shaft 14 by mounting.

【0017】この後、チャンバ2内において内ルツボ組
立体23を組立る。すなわち、先ず、3本の係止部材7
a,7b(1つの係止部材は不図示)を吊下げ支持した
アッパーリング部材24を、保温筒16に載せる。ここ
で、内ルツボ12と一体の内ルツボ支持部材13を係止
部材7a,7bに係止する。最後に、チャンバ2の上部
2aを閉じる。この際、原料供給管5はアッパーリング
部材24を貫通する。
After that, the inner crucible assembly 23 is assembled in the chamber 2. That is, first, the three locking members 7
The upper ring member 24 suspending and supporting a and 7b (one locking member is not shown) is placed on the heat insulating cylinder 16. Here, the inner crucible support member 13 integrated with the inner crucible 12 is locked to the locking members 7a and 7b. Finally, the upper part 2a of the chamber 2 is closed. At this time, the raw material supply pipe 5 penetrates the upper ring member 24.

【0018】[0018]

【発明が解決しようとする課題】しかしながら、上記従
来技術は、外ルツボのプリセツトを行うものの、炉内に
おいて内ルツボ組立体を組立るので、この組立体の各構
成部品同士の擦れによりコンタミネーションが発生しや
すく、この発生したコンタミネーションが外ルツボ内の
材料に混入し、単結晶成長工程において、転位等の格子
欠陥が発生するという問題点がある。また、内ルツボ組
立体の組立時における組立順序を間違いやすく、作業効
率が低く、結果的に、炉を開放する時間が長くなり、単
結晶引上装置の稼動率も低くなるという問題点がある。
さらに、外ルツボや内ルツボ組立体を組み込み時に、大
型な炉全体の雰囲気をクリーンな状態にしなければなら
ず、時間や手間がかかるとともに、そのための設備コス
トが嵩むという問題点がある。
However, in the above-mentioned prior art, although the outer crucible is pre-set, the inner crucible assembly is assembled in the furnace, so that the contamination of each component of this assembly causes contamination. It is liable to occur, and the generated contamination mixes with the material inside the outer crucible, resulting in the occurrence of lattice defects such as dislocations in the single crystal growth step. In addition, there is a problem that the assembly order of the inner crucible assembly is apt to be mistaken, work efficiency is low, and as a result, the furnace opening time is long and the operation rate of the single crystal pulling apparatus is low. .
Further, when the outer crucible and the inner crucible assembly are assembled, the atmosphere of the entire large furnace must be kept in a clean state, which takes time and labor, and there is a problem that equipment cost for that increases.

【0019】本発明は、上記従来技術の有する問題点に
鑑みてなされたものであり、コンタミネーションの発生
を低減して、転位等の格子欠陥を極力少なくするととも
に、単結晶引上装置の稼動率も向上する、二重ルツボの
炉内への組み込み方法を提供することを目的としてい
る。
The present invention has been made in view of the above problems of the prior art. It reduces the occurrence of contamination, minimizes lattice defects such as dislocations, and operates the single crystal pulling apparatus. It is an object of the present invention to provide a method for assembling a double crucible in a furnace, which also improves the rate.

【0020】[0020]

【課題を解決するための手段】上記目的を達成するため
の本発明は、上下に分割可能な炉と、前記炉内の回転シ
ャフト上にサセプタを介して搭載される外ルツボと、少
なくとも内ルツボを吊下げて支持する内ルツボ組立体と
を備えた単結晶引上装置において、前記外ルツボおよび
前記内ルツボからなる二重ルツボを前記炉内へ組み込む
方法において、初期原料投入の際に、予めクリーン室内
において、前記サセプタに支持された前記外ルツボ内に
初期原料を入れておくとともに、クリーン室内にて前記
内ルツボ組立体を組立てておき、先ず、前記外ルツボお
よび前記サセプタを前記炉内へ搬送して前記回転シャフ
ト上に搭載し、この後、前記内ルツボ組立体を前記炉内
に装着する、ことを特徴とするものである。
SUMMARY OF THE INVENTION To achieve the above object, the present invention provides a furnace that can be divided into upper and lower parts, an outer crucible mounted on a rotary shaft in the furnace via a susceptor, and at least an inner crucible. In an apparatus for pulling a single crystal with an inner crucible assembly that suspends and supports, in a method of incorporating a double crucible consisting of the outer crucible and the inner crucible into the furnace, at the time of initial raw material charging, In a clean room, the initial raw material is put in the outer crucible supported by the susceptor, and the inner crucible assembly is assembled in the clean room.First, the outer crucible and the susceptor are put into the furnace. It is characterized in that it is transported and mounted on the rotary shaft, and thereafter, the inner crucible assembly is mounted in the furnace.

【0021】また、他の本発明は、前記クリーン室内に
おいて、前記外ルツボ内に原料を入れた後にこの外ルツ
ボに蓋を被せるとともに、前記内側ルツボ組立体に防塵
部材を被せ、前記外ルツボを前記炉内に装着後に前記蓋
を取り外し、また、前記内ルツボ組立体を前記炉の付近
へ搬送後に前記防塵部材を取り外すことを特徴とするも
のである。
Further, in another aspect of the present invention, in the clean chamber, after putting the raw material into the outer crucible, the outer crucible is covered with a lid, and the inner crucible assembly is covered with a dustproof member to cover the outer crucible. It is characterized in that the lid is removed after mounting in the furnace, and the dustproof member is removed after the inner crucible assembly is transported to the vicinity of the furnace.

【0022】以下、本発明の作用について説明する。請
求項1に記載の発明では、クリーン室内において、外ル
ツボのプリセットを行う他に、内ルツボ組立体を予め構
築しておき、これらを、炉内へ搬送して順次組み込むこ
とにより、従来のような、炉内において内ルツボ組立体
を組み立てる必要はない。したがって、炉内におけるコ
ンタミネーションの発生が低減するとともに、作業効率
も向上する。また、請求項2に記載の発明のように、プ
リセットしておいた内ルツボ組立体を炉へ搬送する際
に、塵や埃が付かないように、防塵部材を被せることが
好ましい。また、外ルツボに原料を入れてから前記内ル
ツボ組立体の炉内への装着直前までの間に、外ルツボに
蓋を被せておくことにより、外ルツボ内への塵や埃の侵
入を阻止できる。
The operation of the present invention will be described below. According to the first aspect of the present invention, in addition to presetting the outer crucible in the clean room, the inner crucible assembly is constructed in advance, and these are transferred into the furnace and sequentially assembled, thereby making it possible to achieve the conventional structure. However, it is not necessary to assemble the inner crucible assembly in the furnace. Therefore, the occurrence of contamination in the furnace is reduced and the work efficiency is improved. Further, as in the second aspect of the present invention, it is preferable to cover the inner crucible assembly, which is preset, with a dustproof member so as not to be dusted when the inner crucible assembly is transported to the furnace. Also, by covering the outer crucible with a lid between the time when the raw material is put in the outer crucible and immediately before the inner crucible assembly is installed in the furnace, dust and dirt are prevented from entering the outer crucible. it can.

【0023】[0023]

【発明の実施の形態】次に、本発明の一実施形態例につ
いて図面を参照して説明する。図1はクリーン室内にお
いて、シリコン引上装置の構成部品である外ルツボ、お
よび内ルツボ組立体がプリセットされている状態を示す
図である。
Next, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a diagram showing a state in which an outer crucible and an inner crucible assembly, which are components of a silicon pulling apparatus, are preset in a clean room.

【0024】先ず、図1に示すように、クリーン室(ク
リーンブース)31内において、台車28上に、カーボ
ン台(サセプタ受け台)29を介して、外ルツボ11を
保持するサセプタ15が搭載されている。多結晶シリコ
ン塊等の多結晶原料を所定量だけ外ルツボ11内に入れ
る(外ルツボ11のプリセット)。この後、外ルツボ1
1に防塵用の蓋30を被せる。一方、別な台車27にカ
ーボン製の台26a,26bを載せ、この台26a,2
6b上に、上記のようにして内ルツボ組立体23を構築
しておく。ここで、内ルツボ組立体23のアッパーリン
グ部材24に、その周方向に等間隔をおいて複数本の吊
り具としてのIボルト25a,25b(本例では4本で
あり、2本のIボルトは不図示)をねじ込んで装着して
おく。また、内ルツボ組立体23に防塵シート(防塵部
材)32を被せておく。なお、防塵シート32には、I
ボルト25a,25bを露出させるための孔が4ヶ所形
成されている。なお、符号27a,28aはそれぞれ、
台車27,28の取っ手を示している。
First, as shown in FIG. 1, in a clean room (clean booth) 31, a susceptor 15 for holding an outer crucible 11 is mounted on a carriage 28 via a carbon stand (susceptor receiving stand) 29. ing. A predetermined amount of polycrystalline raw material such as polycrystalline silicon ingot is put into the outer crucible 11 (presetting of the outer crucible 11). After this, the outer crucible 1
1 is covered with a dustproof lid 30. On the other hand, carbon pedestals 26a and 26b are placed on another trolley 27, and the pedestals 26a and 26b
The inner crucible assembly 23 is built on 6b as described above. Here, on the upper ring member 24 of the inner crucible assembly 23, a plurality of I bolts 25a and 25b (four in this example, two I bolts) as a suspending tool are arranged at equal intervals in the circumferential direction. (Not shown) is screwed in and attached. Further, the inner crucible assembly 23 is covered with a dustproof sheet (dustproof member) 32. The dustproof sheet 32 has an I
Four holes are formed to expose the bolts 25a and 25b. The reference numerals 27a and 28a respectively indicate
The handles of the carriages 27 and 28 are shown.

【0025】上記のようにプリセットした外ルツボ11
を搭載する台車28を、クリーン室31から出して、チ
ャンバ2付近まで搬送するとともに、台車27もクリー
ン室31から出してチャンバ2付近まで搬送する。ここ
で、サセプタ15および外ルツボ11をチャンバ2内へ
組み込み、蓋30を取り外す。この後、内ルツボ組立体
23から防塵シート32を取り外し、図示しないクレー
ン等により内ルツボ組立体23を複数のIボルト25
a,25bを介して吊り上げ、チャンバ2内に装着す
る。ここで、Iボルト25a,25bをアッパーリング
部材24から取り外す。
Outer crucible 11 preset as described above
The trolley 28 on which is mounted is taken out of the clean chamber 31 and conveyed to the vicinity of the chamber 2, and the dolly 27 is also taken out of the clean chamber 31 and conveyed to the vicinity of the chamber 2. Here, the susceptor 15 and the outer crucible 11 are assembled into the chamber 2 and the lid 30 is removed. Thereafter, the dustproof sheet 32 is removed from the inner crucible assembly 23, and the inner crucible assembly 23 is attached to the plurality of I bolts 25 by a crane or the like (not shown).
It is lifted via a and 25b and mounted in the chamber 2. Here, the I bolts 25a and 25b are removed from the upper ring member 24.

【0026】チャンバ2内を真空ポンプで排気し真空状
態とする。次に、該チャンバ2内にアルゴンガス(A
r)等の不活性ガスを導入し、回転シャフト14を軸線
を中心として所定の角速度で水平面上で回転させること
で、外ルツボ11を所定の角速度で回転させながら、ヒ
ーター4に通電し、外ルツボ11内の多結晶原料を単結
晶成長温度以上の温度まで加熱し、この原料を完全に融
解する。この融解した原料は半導体融液21と呼ばれ
る。
The inside of the chamber 2 is evacuated by a vacuum pump to create a vacuum state. Next, the argon gas (A
r) or the like is introduced, and the rotary shaft 14 is rotated on the horizontal plane at a predetermined angular velocity about the axis to rotate the outer crucible 11 at a predetermined angular velocity while energizing the heater 4. The polycrystalline raw material in the crucible 11 is heated to a temperature higher than the single crystal growth temperature to completely melt the raw material. This melted raw material is called a semiconductor melt 21.

【0027】原料が完全に融解した後、ヒーター4によ
る加熱を若干弱めるとともに、外ルツボ11の上方に軸
線を同じくして配される内ルツボ12を半導体融液21
内に載置する。このとき、内ルツボ支持部材13は係止
部材7a,7bとの係止が解除される。そして、内ルツ
ボ12が外ルツボ11内に載置されて二重ルツボ3を形
成した状態では、内ルツボ12の前記連通孔は、半導体
融液21を内部に流入させる連通部となる。
After the raw material is completely melted, the heating by the heater 4 is slightly weakened, and the inner crucible 12 arranged with the same axis above the outer crucible 11 is used as the semiconductor melt 21.
Place it inside. At this time, the inner crucible support member 13 is released from the engagement with the engagement members 7a and 7b. Then, when the inner crucible 12 is placed in the outer crucible 11 to form the double crucible 3, the communication hole of the inner crucible 12 serves as a communication portion through which the semiconductor melt 21 flows.

【0028】二重ルツボ3を形成した後、マグネット9
に通電し所定の磁界を印加し、ヒーター4の電力を調整
して半導体融液21の中央液面付近を単結晶成長温度に
保ち、引上軸34により吊下げられた種結晶35を半導
体融液21になじませた後、この種結晶35を核として
半導体単結晶33を成長させる。
After forming the double crucible 3, the magnet 9 is formed.
And a predetermined magnetic field is applied to adjust the electric power of the heater 4 to maintain the temperature near the central liquid surface of the semiconductor melt 21 at the single crystal growth temperature, and the seed crystal 35 suspended by the pulling shaft 34 is used to melt the semiconductor. After being soaked in the liquid 21, a semiconductor single crystal 33 is grown with the seed crystal 35 as a nucleus.

【0029】この結晶成長過程においては、半導体単結
晶33の成長量(引上量)に応じて、原料供給管5より
シリコンの粒状の原料が連続的に投入され、この投入さ
れた原料は外ルツボ11内で融解し、内ルツボ12の前
記連通孔を通って内ルツボ12内に連続的に供給され
る。以上のようにして、半導体単結晶33を成長させる
ことができる。上記の原料供給管5から供給される原料
としては、例えば、多結晶シリコンのインゴットを破砕
機等で破砕してフレーク状にしたもの、あるいは、気体
原料から熱分解法により粒状に析出させた多結晶シリコ
ンの顆粒が好適に用いられ、必要に応じてホウ素(B)
(p型シリコン単結晶を作る場合)やリン(P)(n型
シリコン単結晶を作る場合)等のドーパントと呼ばれる
添加元素がさらに供給される。
In the crystal growth process, a granular silicon raw material is continuously charged from the raw material supply pipe 5 in accordance with the growth amount (pulling amount) of the semiconductor single crystal 33, and the charged raw material is the outside. It melts in the crucible 11 and is continuously supplied into the inner crucible 12 through the communication hole of the inner crucible 12. As described above, the semiconductor single crystal 33 can be grown. The raw material supplied from the raw material supply pipe 5 is, for example, a polycrystalline silicon ingot crushed by a crusher or the like into flakes, or a granular material deposited by a thermal decomposition method from a gas raw material. Granules of crystalline silicon are preferably used, and if necessary, boron (B)
An additional element called a dopant such as (when making a p-type silicon single crystal) or phosphorus (P) (when making an n-type silicon single crystal) is further supplied.

【0030】半導体単結晶製造後、内ルツボ組立体23
および外ルツボ11を、上記の装着時とは逆の操作によ
りチャンバ2外へ取り出し、この後、前段の単結晶製造
中にプリセットしておいた外ルツボおよび内ルツボ組立
体をチャンバ2内へ順次装着して使用する。
After manufacturing the semiconductor single crystal, the inner crucible assembly 23
Then, the outer crucible 11 and the outer crucible 11 are taken out of the chamber 2 by the reverse operation to the above-mentioned mounting, and thereafter, the outer crucible and the inner crucible assembly preset during the production of the single crystal in the preceding stage are sequentially introduced into the chamber 2. Attach and use.

【0031】上述のように、本実施形態例では、クリー
ン室31でプリセットしておいた外ルツボ11をチャン
バ2内に装着し、この後に、プリセットしておいた内ル
ツボ組立体23をチャンバ2内に装着することにより、
チャンバ2内において内ルツボ組立体23の構成部品同
士が擦れず、コンタミネーションの発生が低減する上
に、内ルツボ組立体23のプリセット時における組立順
序の間違いが起こりにくく、作業効率が向上し、結果的
に、チャンバ2を開放する時間が短く済み、単結晶引上
装置1の稼動率も向上する。また、外ルツボ11や内ル
ツボ組立体23を複数組用意しておき、単結晶引上装置
1の稼動中に、使用していない外ルツボおよび内ルツボ
組立体をそれぞれプリセットしておき、前記稼動の終了
後に、このプリセットしておいた外ルツボおよび内ルツ
ボ組立体を直ちにチャンバ内へ装着して、単結晶引上装
置を稼動できるので、稼動率のさらなる向上を図れる。
さらに、プリセットしておいた内ルツボ組立体23をチ
ャンバ2へ搬送する際に、塵や埃が付かないように、防
塵シート32を被せることが好ましい。また、外ルツボ
11に原料を入れてから内ルツボ組立体23のチャンバ
2内への装着直前までの間に、外ルツボ11に蓋30を
被せておくことにより、外ルツボ11内への塵や埃の侵
入を阻止できる。
As described above, in the present embodiment, the outer crucible 11 preset in the clean chamber 31 is mounted in the chamber 2, and then the preset inner crucible assembly 23 is set in the chamber 2. By installing inside,
In the chamber 2, the constituent parts of the inner crucible assembly 23 are not rubbed with each other, and the occurrence of contamination is reduced. In addition, mistakes in the assembly sequence at the time of presetting the inner crucible assembly 23 are less likely to occur, and work efficiency is improved. As a result, the time for opening the chamber 2 is short and the operation rate of the single crystal pulling apparatus 1 is improved. Further, a plurality of sets of the outer crucible 11 and the inner crucible assembly 23 are prepared, and the outer crucible and the inner crucible assembly which are not used are preset while the single crystal pulling apparatus 1 is in operation, and the operation is performed. After completion of the above step, the preset outer crucible and inner crucible assembly can be immediately mounted in the chamber and the single crystal pulling apparatus can be operated, so that the operating rate can be further improved.
Further, when the preset inner crucible assembly 23 is transported to the chamber 2, it is preferable to cover the dustproof sheet 32 so as not to be dusty. Further, by covering the outer crucible 11 with the lid 30 between the time when the raw material is put in the outer crucible 11 and immediately before the inner crucible assembly 23 is mounted in the chamber 2, dust inside the outer crucible 11 is prevented. Prevents dust from entering.

【0032】上記実施形態例では、同一のクリーン室内
において外ルツボ内への初期原料投入や、内ルツボ組立
体のプリセットを行ったが、これに限らず、別々のクリ
ーン室においてそれぞれの作業を行ってもよい。また、
外ルツボおよび内ルツボ組立体を同一の台車に載せて搬
送してもよい。さらに、外ルツボの蓋や内ルツボ組立体
の防塵シートは必ずしも使用しなくてもよい。単結晶引
上装置としてCMCZ法を採用したが、二重ルツボ構成
であるなら、他の単結晶製造装置を提供しても構わな
い。例えば、磁場印加を行わない連続チャージ型(CC
Z法)を採用してもよい。
In the above embodiment, the initial raw material was put into the outer crucible and the inner crucible assembly was preset in the same clean chamber, but the present invention is not limited to this, and each work is performed in different clean chambers. May be. Also,
The outer crucible and the inner crucible assembly may be placed on the same carriage and transported. Furthermore, the lid of the outer crucible and the dustproof sheet of the inner crucible assembly do not necessarily have to be used. Although the CMCZ method was adopted as the single crystal pulling apparatus, another single crystal manufacturing apparatus may be provided as long as it has a double crucible structure. For example, continuous charge type (CC
Z method) may be adopted.

【0033】[0033]

【発明の効果】本発明は、以上説明したとおりに構成さ
れているので、以下に記載するような効果を奏する。請
求項1に記載の発明は、クリーン室で原料を組み込んで
プリセットしておいた外ルツボを炉内へ装着し、この後
に、プリセットしておいた内ルツボ組立体を炉内へ装着
することにより、炉内において内ルツボ組立体の構成部
品同士が擦れず、コンタミネーションの発生が低減する
上に、内ルツボ組立体のプリセット時における組立順序
の間違いを起こしにくい。結果的に、転位等の格子欠陥
の発生を極力低減できるとともに、作業効率が向上し、
また、炉を開放する時間が短くて済み、単結晶引上装置
の稼動率も向上する。また、外ルツボや内ルツボ組立体
を複数組ずつ用意しておき、単結晶引上装置の稼動中
に、使用していない外ルツボおよび内ルツボ組立体をそ
れぞれプリセットしておき、前記稼動の終了後に、この
プリセットしておいた外ルツボおよび内ルツボ組立体を
直ちに炉内へ装着して、単結晶引上装置を稼動できるの
で、稼動率のさらなる向上を図れる。請求項2に記載の
発明は、上記効果の他、プリセットした内ルツボ組立体
を炉へ搬送する際に、塵や埃が付かないように、防塵部
材を被せることが好ましい。また、外ルツボに原料を入
れてから前記内ルツボ組立体の炉内への装着直前までの
間に、外ルツボに蓋を被せておくことにより、外ルツボ
内への塵や埃の侵入を阻止できる。
Since the present invention is configured as described above, it has the following effects. According to the first aspect of the present invention, the outer crucible preset by incorporating the raw material in the clean room is mounted in the furnace, and then the preset inner crucible assembly is mounted in the furnace. The components of the inner crucible assembly are not rubbed with each other in the furnace, the occurrence of contamination is reduced, and the assembly order of the inner crucible assembly during presetting is unlikely to occur. As a result, the occurrence of lattice defects such as dislocations can be reduced as much as possible, and work efficiency is improved.
Further, the time for opening the furnace is short, and the operation rate of the single crystal pulling apparatus is improved. Also, prepare a plurality of sets of outer crucible and inner crucible assembly, and preset the outer crucible and inner crucible assembly that are not in use while the single crystal pulling apparatus is in operation, and finish the operation. After that, the preset outer crucible and inner crucible assembly can be immediately mounted in the furnace to operate the single crystal pulling apparatus, so that the operating rate can be further improved. In the invention described in claim 2, in addition to the above effects, it is preferable to cover the inside of the preset inner crucible assembly with a dustproof member so as not to be dusty when it is transported to the furnace. Also, by covering the outer crucible with a lid between the time when the raw material is put in the outer crucible and immediately before the inner crucible assembly is installed in the furnace, dust and dirt are prevented from entering the outer crucible. it can.

【図面の簡単な説明】[Brief description of the drawings]

【図1】クリーン室内において外側ルツボ、および内側
ルツボ組立体がプリセットされている状態を示す図であ
る。
FIG. 1 is a diagram showing a state in which an outer crucible and an inner crucible assembly are preset in a clean chamber.

【図2】単結晶引上装置の一例を示す縦断面図である。FIG. 2 is a vertical sectional view showing an example of a single crystal pulling apparatus.

【符号の説明】[Explanation of symbols]

1 単結晶引上装置 2 チャンバ(炉) 2a 上部 2b 本体部 2c 底部 3 二重ルツボ 4 ヒーター 5 原料供給管 5a 下端開口 6a ガス導入口 7a,7b 係止部材 8 ガス排出口 10 上部フランジ部 11 外ルツボ 12 内ルツボ 13 内ルツボ支持部材 14 回転シャフト 15 サセプタ 16 保温筒(熱シールド部材) 21 半導体融液 23 内ルツボ組立体 24 アッパーリング部材 25a,25b Iボルト(吊り具) 26a,26b 台 27,28 台車 29 台 30 蓋 31 クリーンルーム(クリーンブース) 32 防塵シート(防塵部材) 33 半導体単結晶 34 引上軸 35 種結晶 1 Single crystal pulling apparatus 2 Chamber (furnace) 2a Upper part 2b Main body part 2c Bottom part 3 Double crucible 4 Heater 5 Raw material supply pipe 5a Lower end opening 6a Gas introduction port 7a, 7b Locking member 8 Gas discharge port 10 Upper flange part 11 Outer crucible 12 Inner crucible 13 Inner crucible support member 14 Rotating shaft 15 Susceptor 16 Heat retaining cylinder (heat shield member) 21 Semiconductor melt 23 Inner crucible assembly 24 Upper ring member 25a, 25b I bolt (hanger) 26a, 26b stand 27 , 28 trucks 29 trucks 30 lids 31 clean room (clean booth) 32 dust-proof sheet (dust-proof member) 33 semiconductor single crystal 34 pull-up shaft 35 seed crystal

───────────────────────────────────────────────────── フロントページの続き (72)発明者 降屋 久 東京都千代田区大手町一丁目5番1号 三 菱マテリアルシリコン株式会社内 (72)発明者 喜田 道夫 埼玉県大宮市北袋町1丁目297番地 三菱 マテリアル株式会社総合研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hisashi Furuya 1-5-1, Otemachi, Chiyoda-ku, Tokyo Sanritsu Material Silicon Co., Ltd. (72) Inventor Michio Kita 1-297 Kitabukuro-cho, Omiya-shi, Saitama Address Mitsubishi Materials Corporation, Research Institute

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 上下に分割可能な炉と、前記炉内の回転
シャフト上にサセプタを介して搭載される外ルツボと、
少なくとも内ルツボを吊下げて支持する内ルツボ組立体
とを備えた単結晶引上装置において、前記外ルツボおよ
び前記内ルツボからなる二重ルツボを前記炉内へ組み込
む方法において、 初期原料投入の際に、予めクリーン室内において、前記
サセプタに支持された前記外ルツボ内に初期原料を入れ
ておくとともに、クリーン室内にて前記内ルツボ組立体
を組立てておき、 先ず、前記外ルツボおよび前記サセプタを前記炉内へ搬
送して前記回転シャフト上に搭載し、 この後、前記内ルツボ組立体を前記炉内に装着する、こ
とを特徴とする、二重ルツボの炉内への組み込み方法。
1. A furnace that is vertically separable, and an outer crucible that is mounted on a rotating shaft in the furnace via a susceptor,
In a single crystal pulling apparatus including an inner crucible assembly that suspends and supports at least an inner crucible, in a method of incorporating a double crucible consisting of the outer crucible and the inner crucible into the furnace, at the time of initial raw material charging In advance, in the clean room, while putting the initial raw material in the outer crucible supported by the susceptor in advance, and assembling the inner crucible assembly in the clean room, first, the outer crucible and the susceptor are A method for assembling a double crucible in a furnace, which comprises transporting the crucible into a furnace, mounting the crucible on the rotating shaft, and then mounting the inner crucible assembly in the furnace.
【請求項2】 請求項1に記載の組み込み方法におい
て、前記クリーン室内において、前記外ルツボ内に原料
を入れた後にこの外ルツボに蓋を被せるとともに、前記
内側ルツボ組立体に防塵部材を被せ、 前記外ルツボを前記炉内に装着後に前記蓋を取り外し、
また、前記内ルツボ組立体を前記炉の付近へ搬送後に前
記防塵部材を取り外すことを特徴とする、二重ルツボの
炉内への組み込み方法。
2. The assembling method according to claim 1, wherein in the clean chamber, after putting the raw material in the outer crucible, the outer crucible is covered with a lid, and the inner crucible assembly is covered with a dustproof member. After mounting the outer crucible in the furnace, remove the lid,
Further, the method for assembling the double crucible in the furnace is characterized in that the dustproof member is removed after the inner crucible assembly is transported to the vicinity of the furnace.
JP34417595A 1995-12-28 1995-12-28 How to incorporate a double crucible into the furnace Expired - Fee Related JP3444071B2 (en)

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WO2010140352A1 (en) * 2009-06-02 2010-12-09 ジャパンスーパークォーツ株式会社 Lid for fused quartz crucible, fused quartz crucible and method for handling same
WO2011074847A2 (en) * 2009-12-14 2011-06-23 주식회사 케이씨씨 Apparatus and method for extracting a silicon ingot
JP2022039874A (en) * 2020-08-28 2022-03-10 晶科▲緑▼能(上海)管理有限公司 Continuous type single crystal lifting device, and continuous lifting method for single crystal rod

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010140352A1 (en) * 2009-06-02 2010-12-09 ジャパンスーパークォーツ株式会社 Lid for fused quartz crucible, fused quartz crucible and method for handling same
JP2010280518A (en) * 2009-06-02 2010-12-16 Japan Siper Quarts Corp Lid for quartz glass crucible, quartz glass crucible, and method for handling the same
WO2011074847A2 (en) * 2009-12-14 2011-06-23 주식회사 케이씨씨 Apparatus and method for extracting a silicon ingot
WO2011074847A3 (en) * 2009-12-14 2011-11-10 주식회사 케이씨씨 Apparatus and method for extracting a silicon ingot
US9017478B2 (en) 2009-12-14 2015-04-28 Kcc Corporation Apparatus and method for extracting a silicon ingot made by an electromagnetic continuous casting method
JP2022039874A (en) * 2020-08-28 2022-03-10 晶科▲緑▼能(上海)管理有限公司 Continuous type single crystal lifting device, and continuous lifting method for single crystal rod
US11739436B2 (en) 2020-08-28 2023-08-29 Jinko Green Energy (Shanghai) Management Co., LTD Apparatus and method for continuous crystal pulling

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