JPH09153075A - Screen collating method - Google Patents

Screen collating method

Info

Publication number
JPH09153075A
JPH09153075A JP7311265A JP31126595A JPH09153075A JP H09153075 A JPH09153075 A JP H09153075A JP 7311265 A JP7311265 A JP 7311265A JP 31126595 A JP31126595 A JP 31126595A JP H09153075 A JPH09153075 A JP H09153075A
Authority
JP
Japan
Prior art keywords
screen
display
discrepant
detected
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7311265A
Other languages
Japanese (ja)
Other versions
JP2927224B2 (en
Inventor
Mitsuhiro Matsuo
充弘 松尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP7311265A priority Critical patent/JP2927224B2/en
Publication of JPH09153075A publication Critical patent/JPH09153075A/en
Application granted granted Critical
Publication of JP2927224B2 publication Critical patent/JP2927224B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To make it easy to find a discrepant part and prevent it from being overlooked by detecting the width of the discrepant part to be displayed when the detected discrepant part is displayed on a screen, and displaying it more than the pattern which actually becomes discrepant when the detected width is smaller than an arbitrary value. SOLUTION: Waveform data (A and B) are read in and the discrepant pattern between the both is detected (S8 and S9). Further, the pattern widths PW of individual discrepant parts which are stored in a buffer are detected (S10 and S11). The number PA of patterns which are displayed over the entire screen is detected and the ratio α=PW/PA of the numbers of patterns between the whole screen and discrepant part is calculated (S12 and S13) and compared with a reference value (S14). When the ratio α is smaller than the reference value, the patterns before and after the discrepant pattern are added as dummy display patterns for exaggerated display are added (S15). Then display color control data is added to the data of the exaggerated display part (S16) to adds colors to the respective parts, which are displayed more.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、画面照合方法に関
し、特にシミュレーション結果の波形データ(状態値)
と予測した波形データ(期待値)との比較結果を表示す
る画面照合方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a screen collating method, and more particularly to waveform data (state value) of simulation results.
The present invention relates to a screen collating method for displaying the result of comparison with the predicted waveform data (expected value).

【0002】[0002]

【従来の技術】従来の画面照合方法は、波形データの比
較結果の一致部分と不一致部分を画面に表示する時に、
不一致部分の表示が画面全体に占める比率は考慮されて
いない。
2. Description of the Related Art A conventional screen collating method is to display a matching portion and a non-matching portion of a comparison result of waveform data on a screen.
The ratio of the display of the non-matching portion to the entire screen is not considered.

【0003】従来の手法を、図3に示すフローを参照し
て説明する。波形データA(期待値)および波形データ
B(状態値)のそれぞれを読み込み(ステップ8)、両
データ間の不一致パタンの検出を行う(ステップ9)。
次に、不一致パタンが検出されると、不一致であったパ
タン番号をバッファへ格納する(ステップ10)。さら
に、不一致が検出されたパタン番号の波形を強調する
(ステップ18)。もとの波形と強調したデータを重ね
て画面に表示する(ステップ17)。このような従来の
照合方法は、例えば、特開昭59−198356号公報
に開示されている。
A conventional method will be described with reference to the flow shown in FIG. Each of the waveform data A (expected value) and the waveform data B (state value) is read (step 8), and a mismatch pattern between both data is detected (step 9).
Next, when an unmatched pattern is detected, the unmatched pattern number is stored in the buffer (step 10). Further, the waveform of the pattern number for which the mismatch is detected is emphasized (step 18). The original waveform and the emphasized data are superimposed and displayed on the screen (step 17). Such a conventional matching method is disclosed in, for example, Japanese Patent Laid-Open No. 59-198356.

【0004】図4は、従来の照合方法を適用した場合の
画面表示イメージで、2つの波形データである期待値波
形データ41と状態値波形データ42とを比較し、波形
データの一致,不一致を区別して比較結果表示波形43
を表示する。図4中の波形は一致部分44と不一致部分
45を有している。
FIG. 4 is an image displayed on the screen when the conventional collating method is applied. The expected value waveform data 41 and the state value waveform data 42, which are two waveform data, are compared to determine whether the waveform data match or do not match. Comparison result display waveform 43
Is displayed. The waveform in FIG. 4 has a matching portion 44 and a non-matching portion 45.

【0005】一致部分と不一致部分を区別するための強
調方法は、特定パタンの点滅表示である。
An emphasizing method for distinguishing a matching portion and a non-matching portion is blinking display of a specific pattern.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、画面に
波形を数点パタン以上表示し、不一致部分が数パタンし
かない場合、従来の表示方法では不一致部分の表示は、
画面上で非常に小さな面積しか占めないため、認識する
のは難しく見落とすことが多々ある。したがって、従来
の表示方法で不一致部分を認識するには、不一致部分表
示を画面上で認識できる十分な面積になるまで波形を拡
大表示し、その拡大レベルで全波形データの不一致部分
を確認して行かなければならない。そのため通常数万パ
タンある波形データを数百回に分けて確認することにな
り、そのための時間がかかる問題点があった。
However, when the waveform is displayed on the screen in several patterns or more and there are only a few mismatched patterns, the conventional display method displays the mismatched portions as follows.
It occupies a very small area on the screen and is often difficult to recognize and often overlooked. Therefore, in order to recognize the mismatched portion by the conventional display method, the waveform is enlarged and displayed until there is enough area to recognize the mismatched portion display on the screen, and the mismatched portion of all the waveform data is confirmed at the magnification level. Must go. Therefore, the waveform data, which usually has tens of thousands of patterns, is to be checked several hundred times, and there is a problem in that it takes time.

【0007】[0007]

【課題を解決するための手段】本発明の画面照合方法
は、2つ以上の波形データを照合し前記波形データの一
致部分と不一致部分を区別して画面に表示する画面照合
方法において、前記不一致部分の表示幅を検出し、検出
した前記不一致部分の前後に任意の幅で誇張表示部分を
追加して波形データを表示する構成である。
A screen collating method of the present invention is a screen collating method for collating two or more waveform data and distinguishing a matching portion and a non-matching portion of the waveform data and displaying them on the screen. The display width is detected, and an exaggerated display portion is added with an arbitrary width before and after the detected non-coincidence portion to display the waveform data.

【0008】また、本発明の画面照合方法は、本発明の
画面照合方法の前記一致部分と前記不一致部分と前記誇
張表示部分のそれぞれの色を変える構成とすることもで
きる。さらに、本発明の画面照合方法の前記一致部分と
前記不一致部分と前記誇張表示部分のそれぞれの輝度を
変える構成とすることもできる。さらにまた、本発明の
画面照合方法の前記一致部分と前記不一致部分と前記誇
張表示部分のそれぞれの点滅周期を変える構成とするこ
ともできる。
Further, the screen collating method of the present invention may be configured such that the colors of the matching portion, the non-matching portion and the exaggerated display portion of the screen collating method of the present invention are changed. Further, the screen matching method of the present invention may be configured to change the brightness of each of the matching portion, the mismatching portion, and the exaggerated display portion. Furthermore, the screen matching method of the present invention may be configured such that the blinking cycle of each of the matching portion, the mismatching portion, and the exaggerated display portion is changed.

【0009】すなわち、本発明の画面照合方法は、検出
した不一致部分を画面に表示する場合、表示する不一致
部分の幅を検出し、その幅がある任意の値よりも小さい
場合、実際に不一致が発生したパタンよりも多く表示す
ることにより、不一致部分の発見を容易にし、見落とし
を防止する。
That is, in the screen collation method of the present invention, when displaying the detected non-matching portion on the screen, the width of the non-matching portion to be displayed is detected. By displaying more than the generated pattern, it is easy to find the mismatched portion and prevent oversight.

【0010】[0010]

【発明の実施の形態】本発明の画面照合方法の一実施の
形態について図1および図2を参照して説明する。
BEST MODE FOR CARRYING OUT THE INVENTION An embodiment of the screen collating method of the present invention will be described with reference to FIGS.

【0011】本実施の形態では、パタンごとに値を持っ
た波形データの期待値波形データ1と状態値波形データ
2とを比較する場合、期待値とは、あらかじめ予測した
波形をエディタ、又はCADで入力した波形データを指
す。状態値とは、論理シミュレーション等で出力された
波形データを指す(図2参照)。
In this embodiment, when comparing the expected value waveform data 1 of the waveform data having a value for each pattern with the state value waveform data 2, the expected value is the waveform predicted in advance in the editor or CAD. Indicates the waveform data input in. The state value refers to the waveform data output by logic simulation or the like (see FIG. 2).

【0012】図1を参照すると、本実施の形態の画面照
合方法は、波形データ(A,B)を読み込み(ステップ
8)、両データ間の不一致パタンの検出を行う(ステッ
プ9)。さらに、不一致が発生したパタン番号をバッフ
ァに格納する(ステップ10)。ステップ10でバッフ
ァに格納した不一致部分のパタン番号中の連続している
パタン数を計算することにより、個々の不一致部分のパ
タン幅PWを検出する(ステップ11)。
Referring to FIG. 1, the screen collating method according to the present embodiment reads waveform data (A, B) (step 8) and detects a mismatch pattern between both data (step 9). Further, the pattern number in which the mismatch occurs is stored in the buffer (step 10). The pattern width PW of each non-matching portion is detected by calculating the number of consecutive patterns in the pattern numbers of the non-matching portions stored in the buffer in step 10 (step 11).

【0013】一方、ステップ12で画面全体に表示する
パタン数PAを検出し、ステップ13で画面全体と不一
致部分のパタン数の比率α=PW/PAを計算する。ス
テップ14でこの比率とαと基準値(例えば1/20)
と大小比較をおこなう。比率αの値が基準値より小さい
場合、ステップ10で格納した不一致パタンの前後のパ
タンを誇張表示用のダミー表示パタンとして付加する
(ステップ15)。ダミー表示パタンの幅は、不一致パ
タンとダミー表示パタンの和で示す表示幅の比率が基準
値と同じ大きさになるように制御する。比率αの値が基
準値よりも大きい場合、誇張表示部分の付加は行わな
い。次に、ステップ10でバッファに格納したデータと
ステップ15で付加した誇張表示部分のデータに表示の
色を制御するデータを付加する(ステップ16)。そし
て、図2の波形3に示す様に、基本となる波形に対し
て、一致部分4,不一致部分5および誇張表示部分6の
それぞれの色を加えて表示する。
On the other hand, in step 12, the number PA of patterns displayed on the entire screen is detected, and in step 13, the ratio α = PW / PA of the number of patterns in the non-matching portion with the entire screen is calculated. In step 14, this ratio, α and reference value (eg 1/20)
And compare the size. If the value of the ratio α is smaller than the reference value, the patterns before and after the mismatch pattern stored in step 10 are added as dummy display patterns for exaggerated display (step 15). The width of the dummy display pattern is controlled so that the ratio of the display width indicated by the sum of the non-matching pattern and the dummy display pattern is the same as the reference value. When the value of the ratio α is larger than the reference value, the exaggerated display portion is not added. Next, data for controlling the display color is added to the data stored in the buffer in step 10 and the exaggerated display portion data added in step 15 (step 16). Then, as shown by the waveform 3 in FIG. 2, respective colors of the matching portion 4, the mismatching portion 5, and the exaggerated display portion 6 are added to the basic waveform and displayed.

【0014】以上、波形の比較方法、不一致部分の誇張
表示方法、及び不一致部分と誇張表示部分のそれぞれの
色を変えて表示する方法を説明したが、色を変える代わ
りに輝度あるいは点滅周期を変える方法も可能である。
これらの方法は、ステップ16の部分で表示の色を制御
するデータを付加する代わりに、それぞれを制御するデ
ータを付加するステップを有する。
The method of comparing the waveforms, the method of exaggerating the non-coincidence portion, and the method of displaying the non-coincidence portion and the exaggeration display portion in different colors have been described above. A method is also possible.
Instead of adding the data for controlling the color of the display in the part of step 16, these methods have a step of adding data for controlling each of them.

【0015】[0015]

【発明の効果】本発明により、波形データを多パタン表
示した場合でも不一致部分の有無を容易に見つけること
ができる。よって、シミュレーション結果解析の能率を
あげることができ、不一致部分の見落としも防止でき
る。
According to the present invention, it is possible to easily find the presence / absence of a mismatched portion even when waveform data is displayed in multiple patterns. Therefore, the efficiency of simulation result analysis can be improved, and oversight of mismatched portions can be prevented.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態の画面照合方法を示す流
れ図。
FIG. 1 is a flowchart showing a screen matching method according to an embodiment of the present invention.

【図2】本発明の一実施の形態を説明するための表示
図。
FIG. 2 is a display diagram for explaining an embodiment of the present invention.

【図3】従来方法の流れ図。FIG. 3 is a flowchart of a conventional method.

【図4】従来方法を説明するための表示図。FIG. 4 is a display diagram for explaining a conventional method.

【符号の説明】[Explanation of symbols]

1,41 期待値波形データ 2,42 状態値波形データ 3,43 比較結果表示波形 4,44 一致表示部分 5,45 不一致表示部分 6 誇張表示部分 7 波形データ 8 波形データ読み込みステップ 9 不一致パタン検出ステップ 10 不一致パタンのバッファへの格納ステップ 16 表示制御データ付加ステップ 11 パタン幅検出ステップ 12 画面幅認識ステップ 13 不一致表示比率検出ステップ 14 比率の大小比較ステップ 15 誇張部分付加ステップ 17 画面表示ステップ 18 パタン強調ステップ 1,41 Expected value waveform data 2,42 State value waveform data 3,43 Comparison result display waveform 4,44 Match display part 5,45 Mismatch display part 6 Exaggerated display part 7 Waveform data 8 Waveform data reading step 9 Mismatch pattern detection step 10 step of storing mismatch pattern in buffer 16 display control data addition step 11 pattern width detection step 12 screen width recognition step 13 mismatch display ratio detection step 14 ratio comparison step 15 exaggerated part addition step 17 screen display step 18 pattern emphasis step

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 2つ以上の波形データを照合し前記波形
データの一致部分と不一致部分を区別して画面に表示す
る画面照合方法において、前記不一致部分の表示幅を検
出し、検出した前記不一致部分の前後に任意の幅で誇張
表示部分を追加して波形データを表示することを特徴と
する画面照合方法。
1. A screen collating method of collating two or more waveform data and distinguishing a matching portion and a non-matching portion of the waveform data and displaying them on a screen. The display width of the non-matching portion is detected, and the detected non-matching portion A screen collation method characterized by displaying the waveform data by adding an exaggerated display part with an arbitrary width before and after.
【請求項2】 前記一致部分と前記不一致部分と前記誇
張表示部分のそれぞれの色を変える事を特徴とする特許
請求の範囲第1項記載の画面照合方法。
2. The screen matching method according to claim 1, wherein colors of the matching portion, the non-matching portion, and the exaggerated display portion are changed.
【請求項3】 前記一致部分と前記不一致部分と前記誇
張表示部分のそれぞれの輝度を変える事を特徴とする特
許請求の範囲第1項記載の画面照合方法。
3. The screen matching method according to claim 1, wherein the brightness of each of the matching portion, the non-matching portion, and the exaggerated display portion is changed.
【請求項4】 前記一致部分と前記不一致部分と前記誇
張部分のそれぞれの点滅周期を変える事を特徴とする特
許請求の範囲第1項記載の画面照合方法。
4. The screen matching method according to claim 1, wherein the blinking cycle of each of the matching portion, the non-matching portion, and the exaggerated portion is changed.
JP7311265A 1995-11-29 1995-11-29 Screen collation method Expired - Lifetime JP2927224B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7311265A JP2927224B2 (en) 1995-11-29 1995-11-29 Screen collation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7311265A JP2927224B2 (en) 1995-11-29 1995-11-29 Screen collation method

Publications (2)

Publication Number Publication Date
JPH09153075A true JPH09153075A (en) 1997-06-10
JP2927224B2 JP2927224B2 (en) 1999-07-28

Family

ID=18015065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7311265A Expired - Lifetime JP2927224B2 (en) 1995-11-29 1995-11-29 Screen collation method

Country Status (1)

Country Link
JP (1) JP2927224B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003028929A (en) * 2001-07-13 2003-01-29 Advantest Corp Sequence monitor for semiconductor testing device
JP2019124596A (en) * 2018-01-17 2019-07-25 横河電機株式会社 Measured value prediction module, measured value prediction program, and measured value prediction method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05274386A (en) * 1992-03-26 1993-10-22 Ricoh Co Ltd Logic circuit simulation result display device
JPH05312906A (en) * 1992-05-14 1993-11-26 Mitsubishi Electric Corp Simulating apparatus
JPH0658968A (en) * 1992-08-11 1994-03-04 Mitsubishi Electric Corp Waveform edditor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05274386A (en) * 1992-03-26 1993-10-22 Ricoh Co Ltd Logic circuit simulation result display device
JPH05312906A (en) * 1992-05-14 1993-11-26 Mitsubishi Electric Corp Simulating apparatus
JPH0658968A (en) * 1992-08-11 1994-03-04 Mitsubishi Electric Corp Waveform edditor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003028929A (en) * 2001-07-13 2003-01-29 Advantest Corp Sequence monitor for semiconductor testing device
JP2019124596A (en) * 2018-01-17 2019-07-25 横河電機株式会社 Measured value prediction module, measured value prediction program, and measured value prediction method

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JP2927224B2 (en) 1999-07-28

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