JPH0886742A - Transparent sample jig for use in device for measuring transmitted light characteristic - Google Patents

Abstract

PURPOSE: To reduce measuring errors resulting from the interference of light due to reflection from the surface of a sample for measurement by enabling the sample for measurement to be pressed with a uniform force, and enabling measuring light to impinge on the surface from a desired direction. CONSTITUTION: This jig is for securing a sample for measurement to a device for measuring transmitted light characteristics, and its portion 3 through which measuring light is transmitted is made of a material through which light of wavelength used in the measurement is transmitted and whose refractive index is close to that of the sample, and machining is carried out so that light reflected from the surface 4 of a portion that does not make contact with the sample for measurement is reduced, or so that the light does not affect the measurement.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is used as a jig for fixing a measurement sample in an apparatus for measuring various optical characteristics of the sample by transmitted light.

[0002]

2. Description of the Related Art As a jig for a measurement sample of a conventional device, a jig made of metal has been used. In this case, when the light transmitted through the sample is measured, as shown in FIG. 1, the light is transmitted by forming a hole in the portion through which the light passes.

[0003]

When the transmitted light is measured by such a method, when the sample is soft, mechanical deformation such as deformation of the sample at the hole or insufficient fixation of the sample is caused. However, there is a problem in that when light is obliquely incident, the light is blocked depending on the shape of the hole, so that the incident direction of the light is limited.

Furthermore, in the case of a sample in the form of a film, since light interference occurs due to reflection on the surfaces on both sides of the sample,
With conventional jigs, the measurement results vary as shown in Fig. 2.
There was an essential problem in that accurate measured values could not be obtained.

Therefore, in order to solve these problems,
The object of the present invention is to realize a sample jig having a new structure that can uniformly suppress the entire sample, eliminate the restriction of the direction of incident light, and solve the problem of light interference.

[0006]

[Means for Solving the Problems] As a material for forming a sample jig,
If a material that transmits light of the measurement wavelength is used, the entire sample can be uniformly pressed, and the optical characteristics of the sample can be measured in a state where there is almost no restriction on the incident direction of light. Therefore, for example, when light having a wavelength in the visible light region is used as the measurement light, a transparent material such as glass or plastic is used to realize the sample table and the portion for pressing the sample as shown in FIG.

Further, if a jig is made of a material having a refractive index value close to that of the sample, it is possible to suppress the reflection of light generated on the surface of the sample on the side in contact with the jig, so that the interference of the film-like sample Can reduce problems. Therefore, the jig is characterized by using a material whose difference in refractive index between the material of the jig and the sample is smaller than that between air and the sample.

However, if this is left as it is, a similar problem will occur due to the reflection of light from the side of the jig which is not in contact with the sample. Therefore, in order to prevent this effect, the surface of the jig that is not in contact with the sample is processed. As this method,
An anti-reflection film is attached so as not to reflect the light of the wavelength to be measured, a surface is inclined to prevent the reflected light from returning to the incident direction, and interference is generated by breaking the phase of the reflected light. A method of making the surface shape to be eliminated uneven is effective, and the problem can be avoided by performing the measurement by using any one or a plurality of methods in combination.

[0009]

By using this transparent sample jig, even a soft measurement sample can be fixed, and since it is transparent, there is no restriction on the incident direction of light, and measurement errors due to light interference can be suppressed.

[0010]

[Examples] Using the above examination results, precise measurement of the incident angle dependence of the birefringence amount of light was performed on a soft polymer film. The measurement result is shown in FIG. From these results, it was confirmed that by using the sample jig of the present invention, the optical characteristics for various incident directions can be accurately measured while the sample is fixed. In this case, the method of inclining the surface of the jig on the side not in contact with the sample was used, but the effectiveness of other methods can also be confirmed from this result.

[0011]

Since the present invention is constructed as described above, it has the following effects.

Since the sample jig of the device for measuring the transmitted light characteristic is made of a transparent material, it is possible to fix a soft sample which could not be measured in the past and to measure the incident direction which could not be measured in the past. Furthermore, the problem of light interference due to surface reflection in the film-shaped sample can be reduced.

[Brief description of drawings]

FIG. 1 is a schematic view of a conventional sample jig.

FIG. 2 is a result of measuring the optical characteristics of a film-shaped sample using a conventional sample jig.

FIG. 3 is a schematic view of a sample jig of the present invention.

FIG. 4 is a result of measuring the optical characteristics of a film-shaped sample using the sample jig according to the present invention.

[Explanation of Codes] Metal sample stand 2. Hole 3. Sample stand made of transparent material 4. Surface processed to suppress reflected light or not affect measurement

Claims (3)

[Claims] 1. A solid material that transmits light of a wavelength used for measurement is used in a portion exposed to light used for measurement, and the difference between the refractive index of this material and the refractive index of the sample is the difference between the refractive index of air and that of the sample. To fix the measurement sample used in the device for measuring the transmitted light characteristics, which is characterized by having an antireflection film on the surface of the part that is smaller than the difference in refractive index and through which light does not come into contact with the sample. Jig. 2. A solid material that transmits light having a wavelength used for measurement is used in a portion exposed to light used for measurement, and the difference between the refractive index of the material of this portion and the refractive index of the sample is the refractive index of air. The transmitted light is smaller than the difference in the refractive index of the sample, and has a structure that changes the direction of the surface-reflected light from the incident light direction by inclining the surface of the part through which light passes on the side not in contact with the sample. A jig for fixing a measurement sample used in a device for measuring characteristics. 3. A solid material that transmits light having a wavelength used for measurement is used in a portion exposed to light used for measurement, and the difference between the refractive index of the material of this portion and the refractive index of the sample is the refractive index of air. Fixing the measurement sample used in the device for measuring transmitted light characteristics, which is smaller than the difference in the refractive index of the sample and has a fine uneven shape on the surface of the part where the light passes on the side not in contact with the sample A jig for doing.