JPH0854434A - Method and device for detecting interlayer short-circuiting of superconductive coil - Google Patents

Method and device for detecting interlayer short-circuiting of superconductive coil

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Publication number
JPH0854434A
JPH0854434A JP6189265A JP18926594A JPH0854434A JP H0854434 A JPH0854434 A JP H0854434A JP 6189265 A JP6189265 A JP 6189265A JP 18926594 A JP18926594 A JP 18926594A JP H0854434 A JPH0854434 A JP H0854434A
Authority
JP
Japan
Prior art keywords
inductance
superconducting coil
coil
superconducting
short circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6189265A
Other languages
Japanese (ja)
Inventor
Koichi Inoue
浩一 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chodendo Hatsuden Kanren Kiki Zairyo Gijutsu Kenkyu Kumiai
Original Assignee
Chodendo Hatsuden Kanren Kiki Zairyo Gijutsu Kenkyu Kumiai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chodendo Hatsuden Kanren Kiki Zairyo Gijutsu Kenkyu Kumiai filed Critical Chodendo Hatsuden Kanren Kiki Zairyo Gijutsu Kenkyu Kumiai
Priority to JP6189265A priority Critical patent/JPH0854434A/en
Publication of JPH0854434A publication Critical patent/JPH0854434A/en
Pending legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To surely and easily detect the interlayer short-circuiting of a superconductive coil by judging that the interlayer short-circuiting of a coil has occurred when the value of inductance of a superconductor wound around the superconductive coil at normal temperature changes exceeding a certain value within a preset reference time. CONSTITUTION:A superconductive coil 1 is manufactured by withdrawing a superconductor 3 from a drum 2 for winding halfway during winding operation. A lead wire 4 for measurement is connected to both terminals of the conductor 3 and an inductance measuring instrument 5 and a sequential comparator 6 are connected. The measuring instrument 5 measures the inductance of the conductor 3 wound around the coil 1 at normal temperature. The comparator 6 obtains the change rate with time of the inductance measured by the measuring instrument 5, compares the rate with a preset change rate, and then judges whether the interlayer short-circuiting of the coil 1 occurs or not, thus positively detecting the interlayer short-circuiting of the coil 1 in real time.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えば超電導発電機等
の超電導コイルの層間短絡を検出する方法および装置に
係り、特にインダクタンスが変化する超電導コイルの製
作途中(巻線作業時)のような段階においても、超電導
コイルの層間短絡の発生を確実にかつ簡単な構成でしか
も低コストで検出できるようにした超電導コイルの層間
短絡検出方法および装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and a device for detecting an inter-layer short circuit of a superconducting coil such as a superconducting generator, especially in the course of manufacturing a superconducting coil whose inductance varies (during winding work). The present invention also relates to a method and a device for detecting an interlayer short circuit of a superconducting coil, which can detect the occurrence of an interlayer short circuit of the superconducting coil with a reliable and simple structure and at low cost.

【0002】[0002]

【従来の技術】一般に、例えば超電導発電機等の超電導
コイルにおいては、超電導導体を多数回巻回して超電導
コイルを形成する。そして、超電導導体には導体絶縁が
施されており、多数回巻回した超電導導体が層間短絡す
るのを防止するようになっている。
2. Description of the Related Art Generally, in a superconducting coil such as a superconducting generator, a superconducting conductor is wound many times to form a superconducting coil. The superconducting conductor is conductor-insulated to prevent the superconducting conductor wound a large number of times from being short-circuited between layers.

【0003】しかしながら、超電導コイルにおいては、
超電導状態を維持するために、超電導導体の層間に液体
ヘリウム等の冷媒の細かい流路が設けられている場合が
多く、この流路に微細な金属屑が混入したりすると、層
間短絡を発生する場合がある。そして、超電導コイルに
層間短絡が発生すると、電気抵抗の非常に小さいループ
が作られることになり、コイルの電流を変化させて磁場
を変化させようとするとする際に、これを阻止しようと
するループ電流が発生して、本来の超電導コイルの性能
が実現できなくなってしまう。従って、超電導コイルに
層間短絡が発生した場合には、速やかに層間短絡部分を
改善する必要があり、層間短絡の発生を検出することが
重要となっている。
However, in the superconducting coil,
In order to maintain the superconducting state, there are many cases where a fine flow path for a coolant such as liquid helium is provided between the layers of the superconducting conductor, and if minute metal chips are mixed in this flow path, an interlayer short circuit will occur. There are cases. When an inter-layer short circuit occurs in the superconducting coil, a loop with very low electrical resistance is created, and when trying to change the coil current by changing the coil current, the loop that tries to prevent this An electric current is generated and the original performance of the superconducting coil cannot be realized. Therefore, when an inter-layer short circuit occurs in the superconducting coil, it is necessary to promptly improve the inter-layer short circuit portion, and it is important to detect the occurrence of the inter-layer short circuit.

【0004】ところで、このような超電導コイルの層間
短絡の発生を検出するには、インダクタンスの測定が極
めて有効であり、かかる測定によりほとんどの層間短絡
の発生を検出することはできる。すなわち、これは短絡
ループによってインダクタンスが大きく変化することを
利用したものである。
By the way, in order to detect the occurrence of such an inter-layer short circuit of the superconducting coil, it is extremely effective to measure the inductance, and most of the inter-layer short circuits can be detected by such measurement. That is, this utilizes the fact that the inductance changes greatly due to the short circuit loop.

【0005】しかしながら、超電導コイルの製作途中、
すなわち巻線作業時においては、ドラム状に巻かれた長
尺の超電導導体を、ドラムより引き出しながら超電導コ
イルに巻回していくため、巻線作業中のインダクタンス
は変化しており、層間短絡の発生検出は困難である。
However, during the manufacture of the superconducting coil,
That is, during winding work, the long superconducting conductor wound in a drum shape is wound around the superconducting coil while being pulled out from the drum, so the inductance changes during winding work, causing an interlayer short circuit. Difficult to detect.

【0006】また、超電導導体に導体絶縁が施されてい
る場合には、超電導導体の途中に計測用のリード線を取
り付けられない場合もある。従って、この場合には、超
電導コイルが完成した時点で、インダクタンス測定によ
る層間短絡の発生検出を行なうようにしている。
In addition, when the superconducting conductor is conductor-insulated, a lead wire for measurement may not be attached in the middle of the superconducting conductor. Therefore, in this case, when the superconducting coil is completed, the occurrence of the interlayer short circuit is detected by measuring the inductance.

【0007】しかしながら、この超電導コイルが巻回終
了した時点で、インダクタンス測定による層間短絡の発
生が検出されたような時には、層間短絡部分の改善には
かなりの戻し作業を必要とする場合があり、製造工程を
遅らせる要因になるという問題がある。
However, at the time when the winding of the superconducting coil is completed, if it is detected that an interlayer short circuit occurs due to the inductance measurement, there is a case that a considerable work of returning is required to improve the interlayer short circuit portion. There is a problem that it becomes a factor that delays the manufacturing process.

【0008】[0008]

【発明が解決しようとする課題】以上のように、従来の
超電導コイルの層間短絡発生の検出方法においては、イ
ンダクタンスが変化する超電導コイルの製作途中(巻線
作業時)の段階では、超電導コイルのインダクタンスが
変化することから、層間短絡の発生を検出することが難
しいという問題があった。
As described above, in the conventional method for detecting the occurrence of the interlayer short circuit of the superconducting coil, the inductance of the superconducting coil is changed during the manufacturing process (at the time of winding work). Since the inductance changes, it is difficult to detect the occurrence of the interlayer short circuit.

【0009】本発明の目的は、インダクタンスが変化す
る超電導コイルの製作途中(巻線作業時)のような段階
においても、超電導コイルの層間短絡の発生を確実にか
つ簡単な構成でしかも低コストで検出することが可能な
超電導コイルの層間短絡検出方法および装置を提供する
ことにある。
An object of the present invention is to reliably and easily generate an interlayer short circuit of a superconducting coil even at a stage such as during manufacturing of a superconducting coil (during winding work) where the inductance changes, and at a low cost. It is an object of the present invention to provide a method and a device for detecting an inter-layer short circuit of a superconducting coil which can be detected.

【0010】[0010]

【課題を解決するための手段】上記の目的を達成するた
めに、まず、請求項1に係る発明では、超電導導体を多
数回巻回して超電導コイルを形成する巻線作業時に、超
電導コイルの層間短絡を検出する方法において、超電導
コイルに巻回される超電導導体材料の常温でのインダク
タンスの値が、あらかじめ任意に設定した基準時間内に
一定値以上変化した場合に、超電導コイルの層間短絡が
発生したと判定するようにしている。
In order to achieve the above object, first, in the invention according to claim 1, at the time of winding work for forming a superconducting coil by winding a plurality of superconducting conductors, an interlayer of the superconducting coil is formed. In the method of detecting a short circuit, an interlayer short circuit of the superconducting coil occurs when the value of the inductance of the superconducting conductor material wound around the superconducting coil at room temperature changes by a certain value or more within a preset reference time. I have decided to do.

【0011】また、請求項2に係る発明では、超電導導
体を多数回巻回して超電導コイルを形成する巻線作業時
に、超電導コイルの層間短絡を検出する装置において、
超電導コイルに巻回される超電導導体材料の常温でのイ
ンダクタンスを測定するインダクタンス測定手段と、イ
ンダクタンス測定手段により測定されたインダクタンス
の時間変化率を算出し、かつ当該インダクタンスの時間
変化率とあらかじめ任意に設定した基準時間変化率とを
比較し、当該比較結果に基づいて超電導コイルの層間短
絡の発生を判定する層間短絡判定手段とを備えて成る。
Further, in the invention according to claim 2, in a device for detecting an interlayer short circuit of a superconducting coil during a winding work for forming a superconducting coil by winding a plurality of superconducting conductors,
Inductance measuring means for measuring the inductance of the superconducting conductor material wound around the superconducting coil at room temperature, and calculating the time change rate of the inductance measured by the inductance measuring means, and the time change rate of the inductance can be arbitrarily set in advance. An inter-layer short-circuit determination means for comparing the set reference time change rate and determining the occurrence of the inter-layer short circuit of the superconducting coil based on the comparison result.

【0012】[0012]

【作用】従って、本発明の超電導コイルの層間短絡検出
方法および装置においては、超電導コイルに巻回される
超電導導体材料の常温でのインダクタンスを測定するイ
ンダクタンス測定手段と、インダクタンス測定手段によ
り測定されたインダクタンスの時間変化率を算出し、か
つ当該インダクタンスの時間変化率とあらかじめ任意に
設定した基準時間変化率とを比較し、当該比較結果に基
づいて超電導コイルの層間短絡の発生を判定する層間短
絡判定手段とを備え、超電導コイルの層間短絡を検出す
る際に、超電導コイルに巻回される超電導導体材料の常
温でのインダクタンスの値が、あらかじめ任意に設定し
た基準時間内に一定値以上変化した場合に、超電導コイ
ルの層間短絡が発生したと判定することにより、インダ
クタンスが変化する超電導コイルの製作途中(巻線作業
時)のような段階においても、超電導コイルの層間短絡
の発生を確実に検出することができる。
Therefore, in the method and apparatus for detecting the interlayer short circuit of the superconducting coil of the present invention, the inductance measuring means for measuring the inductance of the superconducting conductor material wound around the superconducting coil at room temperature and the inductance measuring means are used. Inter-layer short-circuit judgment that calculates the time-varying rate of inductance and compares the time-varying rate of the inductance with a previously set reference time-varying rate and determines the occurrence of an inter-layer short circuit of the superconducting coil based on the comparison result. When the inter-layer short circuit of the superconducting coil is detected, the value of the inductance of the superconducting conductor material wound around the superconducting coil at room temperature changes by a certain value or more within a preset reference time. In addition, the inductance changes when it is determined that an inter-layer short circuit has occurred in the superconducting coil. Also in step like way fabrication of superconducting coils (when winding operation), it is possible to reliably detect the occurrence of interlayer short of the superconducting coil.

【0013】[0013]

【実施例】以下、本発明の一実施例について図面を参照
して詳細に説明する。図1は、本発明による超電導コイ
ルの層間短絡検出装置の構成例を示す概要図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings. FIG. 1 is a schematic diagram showing a configuration example of an inter-layer short-circuit detecting device for a superconducting coil according to the present invention.

【0014】図1において、超電導コイル1は巻線作業
途中の段階であり、ドラム2より引き出した超電導導体
3を巻回して、超電導コイル1を製作している。また、
超電導導体3の両端部には、計測用のリード線4を接続
し、この計測用リード線4には、インダクタンス測定器
5、さらに層間短絡判定手段である逐次比較器6を接続
している。
In FIG. 1, the superconducting coil 1 is in the process of winding, and the superconducting conductor 3 drawn from the drum 2 is wound to manufacture the superconducting coil 1. Also,
A measuring lead wire 4 is connected to both ends of the superconducting conductor 3, and an inductance measuring instrument 5 and a successive comparator 6 which is an interlayer short-circuit judging means are connected to the measuring lead wire 4.

【0015】ここで、インダクタンス測定器5は、例え
ばLCRメータ等の測定器からなり、超電導コイル1に
巻回される超電導導体3材料の常温でのインダクタンス
を測定するものである。
The inductance measuring device 5 is composed of a measuring device such as an LCR meter, and measures the inductance of the material of the superconducting conductor 3 wound around the superconducting coil 1 at room temperature.

【0016】一方、逐次比較器6は、例えば演算比較器
からなり、インダクタンス測定器5により測定されたイ
ンダクタンスの時間変化率を算出し、かつこのインダク
タンスの時間変化率とあらかじめ任意に設定した基準時
間変化率とを比較し、その比較結果に基づいて超電導コ
イル1の層間短絡の発生を判定するものである。
On the other hand, the successive approximation comparator 6 is composed of, for example, an operational comparator, calculates the time variation rate of the inductance measured by the inductance measuring instrument 5, and determines the time variation rate of this inductance and a reference time preset arbitrarily. The rate of change is compared, and the occurrence of an interlayer short circuit of the superconducting coil 1 is determined based on the comparison result.

【0017】次に、以上のように構成した本実施例の超
電導コイルの層間短絡検出装置における層間短絡検出方
法について説明する。本実施例では、基本的には、超電
導導体3材料全長の常温でのインダクタンスの減少を検
出して、超電導コイル1の層間短絡の発生が検出され
る。
Next, an inter-layer short-circuit detecting method in the super-conducting coil inter-layer short-circuit detecting apparatus of the present embodiment having the above-mentioned structure will be described. In this embodiment, basically, the decrease in the inductance of the entire length of the material of the superconducting conductor 3 at room temperature is detected, and the occurrence of the interlayer short circuit of the superconducting coil 1 is detected.

【0018】すなわち、まず、インダクタンス測定器5
により、超電導コイル1に巻回される超電導導体3材料
全長の常温でのインダクタンスを測定する。このインダ
クタンス測定器5の精度としては、超電導コイル1の1
ターンが短絡してインダクタンスが減少したことを検出
できる精度が必要である。
That is, first, the inductance measuring device 5
Thus, the inductance of the entire length of the material of the superconducting conductor 3 wound around the superconducting coil 1 at room temperature is measured. The accuracy of the inductance measuring device 5 is 1 of the superconducting coil 1.
It is necessary to have an accuracy that can detect that the turn is short-circuited and the inductance is reduced.

【0019】ここで問題となるのは、超電導導体3の巻
線作業中のインダクタンスが、超電導コイル1の巻具合
により変化することであり、ドラム2に巻かれた超電導
導体3の量や、超電導コイル1に巻かれた超電導導体3
の量が変化しているため、超電導導体3の両端部より見
た全体のインダクタンスは、超電導コイル1の巻具合に
より変化することになる。
The problem here is that the inductance of the superconducting conductor 3 during the winding operation changes depending on the winding condition of the superconducting coil 1. The amount of the superconducting conductor 3 wound on the drum 2 and the superconducting conductor 3 are different. Superconducting conductor 3 wound around coil 1
Therefore, the total inductance seen from both ends of the superconducting conductor 3 changes depending on the winding condition of the superconducting coil 1.

【0020】そこで、このような巻具合によるインダク
タンス変化の要因を排除するために、インダクタンスの
測定を巻具合の変化よりも短い任意の時間間隔で繰り返
し行ない、逐次比較器6により、直前のインダクタンス
測定値との比較を行なう。
Therefore, in order to eliminate such a factor of the inductance change due to the winding condition, the inductance measurement is repeatedly performed at an arbitrary time interval shorter than the change of the winding condition, and the immediately preceding inductance measurement is performed by the successive comparator 6. Compare with the value.

【0021】この場合、巻線作業時のドラム2や超電導
コイル1のターン数変化が滑らかで、インダクタンス測
定時間間隔内でのインダクタンス変化が、1ターンの短
絡によるインダクタンス減少よりも小さければ、インダ
クタンスの逐次比較により、超電導コイル1の層間短絡
の発生を検出することが可能となる。
In this case, if the change in the number of turns of the drum 2 or the superconducting coil 1 during the winding work is smooth and the change in the inductance within the inductance measurement time interval is smaller than the decrease in the inductance due to a short circuit of one turn, the inductance is reduced. The successive comparison makes it possible to detect the occurrence of an interlayer short circuit in the superconducting coil 1.

【0022】すなわち、測定したインダクタンスデータ
と前回測定したインダクタンスデータとを比較し、両者
のインダクタンスの差の絶対値が、あらかじめ設定した
インダクタンス値の範囲内であれば、層間短絡無しと判
定し、あらかじめ設定したインダクタンス値以上の場合
には、層間短絡したと判定する。
That is, the measured inductance data is compared with the previously measured inductance data, and if the absolute value of the difference between the two inductances is within the preset inductance value range, it is determined that there is no interlayer short circuit, and When the inductance value is equal to or more than the set inductance value, it is determined that the interlayer short circuit has occurred.

【0023】この場合、インダクタンス変化の設定値
は、巻具合の変化による最大のインダクタンス増加よ
り、1ターンの短絡によるインダクタンス減少値を引い
た値の絶対値以下の大きさとする。なお、巻具合の変化
が激しい場合には、インダクタンスの測定間隔をより短
くして、上記の条件を満たすようにすればよい。
In this case, the set value of the inductance change is set to a magnitude less than the absolute value of the value obtained by subtracting the inductance decrease value due to a short circuit of one turn from the maximum inductance increase due to the change in winding condition. If the winding condition changes drastically, the inductance measurement interval may be shortened to satisfy the above condition.

【0024】このような方法を採ることにより、超電導
コイル1の層間短絡の発生をリアルタイムで検出するこ
とができ、修復のための巻回した超電導コイル1の巻戻
し作業が基本的には不要となる。
By adopting such a method, the occurrence of the interlayer short circuit of the superconducting coil 1 can be detected in real time, and the rewinding work of the wound superconducting coil 1 for repair is basically unnecessary. Become.

【0025】上述したように、本実施例では、超電導コ
イル1に巻回される超電導導体3材料の常温でのインダ
クタンスを測定するインダクタンス測定器5と、インダ
クタンス測定器5により測定されたインダクタンスの時
間変化率を算出し、かつこのインダクタンスの時間変化
率とあらかじめ任意に設定した基準時間変化率とを比較
し、その比較結果に基づいて超電導コイル1の層間短絡
の発生を判定する逐次比較器6とを備え、超電導導体3
を多数回巻回して超電導コイル1を形成する巻線作業時
に、超電導コイル1の層間短絡を検出する際に、超電導
コイル1に巻回される超電導導体3材料の常温でのイン
ダクタンスの値が、あらかじめ任意に設定した基準時間
内に一定値以上変化した場合に、超電導コイル1の層間
短絡が発生したと判定するようにしたものである。
As described above, in this embodiment, the inductance measuring instrument 5 for measuring the inductance of the material of the superconducting conductor 3 wound around the superconducting coil 1 at room temperature and the time of the inductance measured by the inductance measuring instrument 5 are measured. A sequential comparator 6 for calculating a change rate, comparing the time change rate of the inductance with a reference time change rate arbitrarily set in advance, and determining the occurrence of an interlayer short circuit of the superconducting coil 1 based on the comparison result. With superconducting conductor 3
During the winding work to form the superconducting coil 1 by winding a large number of times, when detecting an interlayer short circuit of the superconducting coil 1, the value of the inductance of the superconducting conductor 3 material wound around the superconducting coil 1 at room temperature is This is to determine that an inter-layer short circuit of the superconducting coil 1 has occurred when the value changes by a predetermined value or more within a preset reference time.

【0026】従って、インダクタンスが変化する超電導
コイル1の製作途中(巻線作業時)のような段階におい
ても、超電導コイル1の層間短絡の発生をリアルタイム
で確実に検出することが可能となる。
Therefore, it becomes possible to reliably detect the occurrence of the interlayer short circuit of the superconducting coil 1 in real time even at the stage of manufacturing the superconducting coil 1 in which the inductance changes (during the winding work).

【0027】また、インダクタンスが変化する超電導コ
イルの製作途中(巻線作業時)の段階で、超電導コイル
1の層間短絡の発生を検出できるため、従来のように修
復のための巻回した超電導コイル1の巻戻し作業が基本
的には不要となり、製造工程を遅らせるという問題を解
消することが可能となる。
Further, since it is possible to detect the occurrence of the interlayer short circuit of the superconducting coil 1 during the manufacturing process (during the winding work) of the superconducting coil in which the inductance changes, the wound superconducting coil for repair as in the conventional case can be detected. The rewinding work of No. 1 is basically unnecessary, and the problem of delaying the manufacturing process can be solved.

【0028】さらに、インダクタンス測定器5と逐次比
較器6を備えるだけでよいため、極めて簡単な構成でし
かも低コストで、超電導コイル1の層間短絡の発生を検
出することが可能となる。
Further, since it is sufficient to provide only the inductance measuring device 5 and the successive comparator 6, it is possible to detect the occurrence of the interlayer short circuit of the superconducting coil 1 with an extremely simple structure and at a low cost.

【0029】尚、本発明は上記実施例に限定されるもの
ではなく、例えば超電導導体3の全抵抗の測定と組み合
わせる等、その要旨を変更しない範囲で種々に変形して
実施できるものである。
The present invention is not limited to the above-described embodiment, but can be carried out in various modifications without departing from the scope of the invention, such as combination with measurement of the total resistance of the superconducting conductor 3.

【0030】[0030]

【発明の効果】以上説明したように本発明によれば、超
電導コイルに巻回される超電導導体材料の常温でのイン
ダクタンスを測定するインダクタンス測定手段と、イン
ダクタンス測定手段により測定されたインダクタンスの
時間変化率を算出し、かつ当該インダクタンスの時間変
化率とあらかじめ任意に設定した基準時間変化率とを比
較し、当該比較結果に基づいて超電導コイルの層間短絡
の発生を判定する層間短絡判定手段とを備え、超電導コ
イルの層間短絡を検出する際に、超電導コイルに巻回さ
れる超電導導体材料の常温でのインダクタンスの値が、
あらかじめ任意に設定した基準時間内に一定値以上変化
した場合に、超電導コイルの層間短絡が発生したと判定
するようにしたので、インダクタンスが変化する超電導
コイルの製作途中(巻線作業時)のような段階において
も、超電導コイルの層間短絡の発生を確実にかつ簡単な
構成でしかも低コストで検出することが可能な超電導コ
イルの層間短絡検出方法および装置が提供できる。
As described above, according to the present invention, the inductance measuring means for measuring the inductance of the superconducting conductor material wound around the superconducting coil at room temperature, and the time variation of the inductance measured by the inductance measuring means. An inter-layer short-circuit determination means for calculating the rate, comparing the time variation rate of the inductance with a reference time variation rate set arbitrarily beforehand, and determining the occurrence of the inter-layer short circuit of the superconducting coil based on the comparison result. , When detecting an interlayer short circuit of the superconducting coil, the value of the inductance of the superconducting conductor material wound around the superconducting coil at room temperature is
It was determined that an inter-layer short circuit occurred in the superconducting coil if it changed more than a certain value within a preset reference time.Therefore, the inductance may change during superconducting coil production (during winding work). It is possible to provide a method and a device for detecting an interlayer short circuit of a superconducting coil that can reliably detect the occurrence of an interlayer short circuit of the superconducting coil even at any stage, with a simple structure and at low cost.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による超電導コイルの層間短絡検出装置
の一実施例を示す概要図。
FIG. 1 is a schematic diagram showing an embodiment of an inter-layer short-circuit detecting device for a superconducting coil according to the present invention.

【符号の説明】[Explanation of symbols]

1…超電導コイル、2…ドラム、3…超電導導体、4…
計測用リード線、5…インダクタンス測定器、6…逐次
比較器。
1 ... Superconducting coil, 2 ... Drum, 3 ... Superconducting conductor, 4 ...
Measurement leads, 5 ... Inductance measuring device, 6 ... Successive comparator.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 超電導導体を多数回巻回して超電導コイ
ルを形成する巻線作業時に、前記超電導コイルの層間短
絡を検出する方法において、 前記超電導コイルに巻回される超電導導体材料の常温で
のインダクタンスの値が、あらかじめ任意に設定した基
準時間内に一定値以上変化した場合に、前記超電導コイ
ルの層間短絡が発生したと判定するようにしたことを特
徴とする超電導コイルの層間短絡検出方法。
1. A method for detecting an interlayer short circuit of a superconducting coil during winding work for forming a superconducting coil by winding a plurality of superconducting conductors, the method comprising: A method for detecting an inter-layer short circuit in a superconducting coil, characterized in that it is determined that an inter-layer short circuit occurs in the superconducting coil when the value of the inductance changes by a certain value or more within a preset reference time.
【請求項2】 超電導導体を多数回巻回して超電導コイ
ルを形成する巻線作業時に、前記超電導コイルの層間短
絡を検出する装置において、 前記超電導コイルに巻回される超電導導体材料の常温で
のインダクタンスを測定するインダクタンス測定手段
と、 前記インダクタンス測定手段により測定されたインダク
タンスの時間変化率を算出し、かつ当該インダクタンス
の時間変化率とあらかじめ任意に設定した基準時間変化
率とを比較し、当該比較結果に基づいて前記超電導コイ
ルの層間短絡の発生を判定する層間短絡判定手段と、 を備えて成ることを特徴とする超電導コイルの層間短絡
検出装置。
2. A device for detecting an inter-layer short circuit of a superconducting coil during winding work for forming a superconducting coil by winding a plurality of superconducting conductors at a room temperature of a superconducting conductor material wound around the superconducting coil. Inductance measuring means for measuring the inductance, calculating the time change rate of the inductance measured by the inductance measuring means, and comparing the time change rate of the inductance with a reference time change rate set in advance, the comparison An inter-layer short-circuit detecting device for a super-conducting coil, comprising:
JP6189265A 1994-08-11 1994-08-11 Method and device for detecting interlayer short-circuiting of superconductive coil Pending JPH0854434A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6189265A JPH0854434A (en) 1994-08-11 1994-08-11 Method and device for detecting interlayer short-circuiting of superconductive coil

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6189265A JPH0854434A (en) 1994-08-11 1994-08-11 Method and device for detecting interlayer short-circuiting of superconductive coil

Publications (1)

Publication Number Publication Date
JPH0854434A true JPH0854434A (en) 1996-02-27

Family

ID=16238423

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6189265A Pending JPH0854434A (en) 1994-08-11 1994-08-11 Method and device for detecting interlayer short-circuiting of superconductive coil

Country Status (1)

Country Link
JP (1) JPH0854434A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104422852A (en) * 2013-08-27 2015-03-18 中国船舶重工集团公司第七研究院 Superconducting magnet coil interturn insulation detecting device and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104422852A (en) * 2013-08-27 2015-03-18 中国船舶重工集团公司第七研究院 Superconducting magnet coil interturn insulation detecting device and method

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