JPH08313421A - Material tester - Google Patents

Abstract

PURPOSE: To efficiently perform the sampling of a material testing result. CONSTITUTION: In a material tester, a data processor 20 operates the number Nd of data sampled at a short sampling cycle Ts on the basis of a sampling cycle, the capacity of an RAM card 18 and sampling data length. A measuring device 10 samples a test result at the short sampling cycle Ts until reaching the number Nd of data to store the same in the RAM card 18 and further transmits a result sampled at a sampling cycle longer than the sampling cycle Ts to the data processor 20. A test is completed at a point of time when a sample is ruptured and the measuring device 10 transmits the sampling data stored in the RAM card 18 to the data processor 20 and the data processor 20 synthesizes the respective sampling data stored in the RAM card 18 and an RAM 23 so as not to contain overlap data.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a material testing machine for performing data analysis after sampling the results of various tests of materials at a predetermined sampling cycle.

[0002]

2. Description of the Related Art A material testing machine system is known in which a load-displacement characteristic test is performed by a material testing machine (hereinafter referred to as a measuring device), and the test result is transmitted to a data processing device for data analysis. (For example, see Japanese Patent Publication No. 5-20690).

In the material testing machine system described in the above publication, the test result data shown by the solid line in FIG. 10 is sampled at a predetermined sampling cycle (black circles in the drawing) and sequentially stored in the RAM inside the measuring device, and n Sampling data is extracted at a ratio of one to one (white circle in the figure) and transmitted to the data processing device, and after the test is completed, all data stored in the RAM is transmitted to the data processing device. By doing so, it is possible to perform a rough data analysis in real time by the data processing device while performing a test with the measuring device, and to perform a detailed data analysis on the necessary part after the test is completed.

[0004]

When performing a tensile test, for example, the elongation of a sample under the same load varies depending on the material of the sample. Therefore, it is necessary to sample the elongation in consideration of the material of the sample. desirable. That is, when testing a sample having high rigidity such as ceramics, accuracy is improved by sampling at shorter time intervals.
However, in the past, since the sampling rate was always constant, the accuracy could vary depending on the material of the sample.

Even when testing the same sample, sampling is performed at short time intervals for important periods such as immediately after the start of loading or immediately before the sample breaks, and rough sampling is performed for less important periods. This will reduce the memory capacity. However, in the past, because the sampling period could not be changed during the test,
In some cases, the RAM storage capacity may be full before the test is completed. Even if the sampling period can be changed, both the data length and the storage capacity of the RAM are fixed (for example, if the data length is 20 bytes and the RAM is
Storage capacity of 512 kilobytes), the time until the RAM becomes full differs depending on the sampling cycle, so it was difficult to predict when the RAM will become full.

Further, conventionally, the sampling data stored in the RAM of the measuring device was transmitted to the data processing device after the test was completed. However, in the data processing device, the data transmitted from the measuring device during the test, Since the data transmitted from the measuring device was managed separately after the test, some data would be duplicated,
As the memory capacity increases, data management may become complicated.

An object of the present invention is to provide a material testing machine capable of efficiently sampling material test results and storing sampling data.

[0008]

The present invention will be described with reference to FIG. 1 showing an embodiment. The present invention comprises a measuring device 10 and a data processing device 20, and the measuring device 10 has a predetermined sampling period. While collecting various data with
It is applied to a material testing machine that transmits the collected data to the data processing device 20 at predetermined time intervals, is provided on the measuring device 10 side, and stores a variety of data collected at a predetermined sampling cycle; The data stored in the storage means 18 is provided with a data total number calculation means 21 for calculating the number of data stored in the storage means 18 based on the data length per time, the storage capacity of the storage device, and the length of the sampling cycle. The above object is achieved by configuring the measuring device 10 to collect various data at a predetermined sampling cycle until the number reaches the calculated number of data. The invention according to claim 2 is provided with the measuring device 10 and the data processing device 20, and various data is collected at a predetermined sampling cycle on the measuring device 10 side, and at the same time, the collected data is collected at predetermined time intervals. In the material testing machine that transmits to the data processing device 20, the measuring device 1
The first storage unit 18 provided on the 0 side for storing various data collected at the first sampling cycle, and the second storage cycle provided on the data processing device 20 side and longer than the first sampling cycle. By providing the second storage means 23 for storing various data, and providing the data processing device for synthesizing the sampling data stored in the first and second storage means 23 so as not to include duplicated data, The above object is achieved.

[0009]

According to the first aspect of the invention, the number of data to be stored in the storage means 18 is calculated based on the data length per sampling, the storage capacity of the storage device, and the length of the sampling period, and actually Until the number of data stored in the storage unit 18 reaches the calculated number of data, various data are collected at a predetermined sampling cycle and stored in the storage unit 18. According to the second aspect of the invention, the first storage means 18 (for example, a RAM card) is provided on the measuring device 10 side,
The second storage means 23 (for example,
RAM) is provided. The first storage means 18 stores various data collected in the first sampling cycle, and the second storage means 23 stores various data collected in a cycle longer than the first sampling cycle. The data processing device 20 is
After the test is completed, the sampling data stored in the first storage means 18 is read out and combined with the sampling data stored in the second storage means 23 so that duplicated data is not included.

Incidentally, in the section of means and action for solving the above problems for explaining the constitution of the present invention, the drawings of the embodiments are used for the purpose of making the present invention easy to understand. It is not limited to.

[0011]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be described below with reference to FIGS. FIG. 1 is a block diagram showing a schematic configuration of the material testing machine of this embodiment. The material testing machine shown in the figure is used for testing tensile / compression characteristics and the like.
0 and the data processing device 20. Measuring device 1
0 and the data processing device 20 are both CPUs 11 and 21.
And read-only fixed memory (ROM) 12, 22
And rewritable variable memories (RAM) 13 and 23. The measuring device 10 and the data processing device 20 are provided with the transmission interface circuits 14 and 24, and exchange data with each other via the transmission line L.

The measuring device 10 comprises a load cell 15 for measuring the load acting on the sample, an extensometer 16 for measuring the deformation of the sample due to the load, and an A / A for converting the analog output of each of the measuring instruments 15, 16 into a digital signal. D converter 17 and RA
Card reader 19 for controlling reading / writing of M card 18
It has and. The RAM card 18 stores data obtained by sampling the test result at a predetermined sampling cycle.

On the other hand, the data processing device 20 includes the keyboard 2
5, the CRT 26, and the XY plotter 27.
Various commands are issued to 0 and the analysis result is confirmed by the CRT 26. The data processing device 20 is usually composed of a personal computer and its peripheral devices.

FIG. 2 is a test condition creation mode process performed by the CPU 21 of the data processing device 20, FIGS. 3 and 4 are test mode processes performed by the CPU 21 of the data processing device 20, and FIGS. 5 and 6 are tests performed by the CPU 11 of the measuring device 10. It is a flowchart showing a control process, and the operation of the present embodiment will be described below based on these flowcharts.

When the operator operates the keyboard 25 of the data processor 20 to select the test condition creation mode, the CP
U21 starts the process of FIG. In step S1 of FIG. 2, normal test conditions such as test content and sample type are set based on the keyboard operation by the operator. In step S2, based on the keyboard operation by the operator,
Sampling cycle when collecting test result data,
The capacity of the RAM card 18 connected to the measuring device 10 and the sampling data length per sampling are set. In step S3, the various test conditions set in steps S1 and S2 are stored in the RA as a test condition file.
Store in M23 and return.

On the other hand, when the operator selects the test mode by the keyboard, the CPU 21 starts the processing shown in FIG.
In step S11 of FIG. 3, the test condition file stored in the RAM 23 is read. In step S12,
The sample attachment in the measuring device 10 is controlled. Step S1
In 3, the general information about the test and the batch information input by the operator using the keyboard 25 are fetched.

In step S14, step S2 in FIG.
The test conditions of the three items set in step 3 are displayed on the CRT 26, and processing for confirming whether or not to change these test conditions is performed.
For example, when the operator inputs new test conditions via the keyboard 25, the RAM 2 should be changed to change the test conditions.
Rewrite the contents of 3.

In step S15, the period Tr for sampling in the sampling cycle Ts and the total number Nd of sampling data stored in the RAM card 18 are calculated based on the above-mentioned three test conditions.

In step S16, the following data items 1 to 3 are transmitted to the measuring device 10 via the transmission interface circuits 14 and 24. Normal test condition data Three item data set in step S2 of FIG. 2, that is, the sampling cycle, the capacity of the RAM card 18, and the sampling data length The total number of sampling data Nd stored in the RAM card 18

In step S17 of FIG. 4, a signal instructing to start the test is transmitted to the measuring device 10 via the transmission interface circuits 14 and 24. In response to this signal, the measuring device 10 drives an actuator (not shown) to apply a load to the sample and start the test. In step S18, the sampling data transmitted from the measuring device 10 is received. In step S19, the received sampling data is stored in the RAM 23. In step S20, the load applied to the sample is changed by controlling the actuator of the measuring device 10.

In step S21, it is determined whether the test is completed. For example, in the case of the tensile test, if the information indicating that the sample is broken is transmitted from the measuring device 10, it is determined that the test is completed. If the determination is negative, the process returns to step S18, and if the determination is affirmative, the process proceeds to step S22.

In step S22, a signal instructing the end of the test is transmitted to the measuring device 10. In step S23,
The measuring device 10 is instructed to transmit the sampling data stored in the RAM card 18. Step S
In 24, the RAM card 1 transmitted from the measuring device 10
Receive sampling data from 8.

In step S25, the data rearrangement process described later is performed using the sampling data stored in the RAM 23 and the sampling data received in step S24. In step S26, various data analysis and data processing, for example, a test result is displayed on the CRT 26, a graph showing the test result is displayed on the XY plotter 27, and then the process returns.

On the other hand, when the operator turns on the measuring device 10, the CPU 11 inside the measuring device 10 performs the test control process of FIGS. In step S51 of FIG. 5, it is determined whether or not the test condition transmitted from the data processing device 20 has been received. If the determination is negative, the process stays in step S51, and if the determination is affirmative, the process proceeds to step S52. In step S52, it is determined whether or not the signal transmitted from the data processing device 20 and instructing to start the test is received.
If the determination is negative, the process stays in step S52, and if the determination is affirmative, the process proceeds to step S53.

In step S53, an actuator (not shown) is driven to apply a load to the sample, and the test is started. In step S54, a variable N indicating the number of data stored in the RAM card 18 is initialized to "0". Step S55
Then, it is determined whether or not the variable N is equal to a preset maximum number Nd. It should be noted that the maximum number Nd is determined in step S of FIG.
It is set in the process of 15.

If the determination at step S55 is negative, the process proceeds to step S56, at which time T has passed since the last sampling.
It is determined whether s has elapsed. If the determination is negative, the process stays in step S56, and if the determination is affirmative, step S56 is performed.
Proceed to 57. In step S57, the test result is sampled and the sampled data is sampled in the next step S58.
Then, it is stored in the RAM card 18. In step S59,
The variable N is incremented by "1".

As described above, in steps S55 to S59, the test result is sampled at each sampling time Ts and the result is stored in the RAM card 18. In addition,
The sampling time Ts is, for example, 5 ms.

In step S60 of FIG. 6, it is determined whether or not a predetermined time Td, for example, 50 ms has elapsed since the sampling data was last transmitted to the data processing device 20.
If the determination in step S55 is affirmative, that is, if the number of data stored in the RAM card 18 reaches the preset total number Nd of data, the process of step S60 is performed. As described above, after the number of data stored in the RAM card 18 reaches Nd, sampling is not performed at a short sampling period (for example, 5 ms) but only at a long sampling period (for example, 50 ms). I do.

If the determination in step S60 is negative, the process returns to step S55, and if the determination is positive, step S61
Proceed to. In step S61, the test result is sampled, and the sampled data is transmitted to the data processing device 20 in step S62.

As described above, in steps S60 to S62, the test result is sampled at a period longer than the sampling period Ts and the result is transmitted to the data processing device 20. As described above, the RAM card 18 of the measuring device 10 stores the data sampled at the short sampling period Ts, while the data processing device 20 stores the data sampled at the long sampling period Td. The sampling period Td transmitted to the data processing device 20 is preferably an integral multiple of the sampling period Ts stored in the RAM card 18. By making it an integral multiple, the sampling data transmitted to the data processing device 20 can be easily replaced with the sampling data stored in the RAM card 18 after the test.

In step S63, it is determined whether the test is completed. For example, in the case of a tensile / compression test, it is determined that the test is completed when the sample breaks. If the determination is negative, the process returns to step S55, and if the determination is affirmative, step S6.
Go to 4. In step S64, a signal notifying the end of the test is transmitted to the data processing device 20 and the process returns.

FIG. 7 is a detailed flowchart of the data reduction process in step S25 of FIG. Step S1 in FIG.
In 01, the data having the maximum displacement amount is extracted from the sampling data transmitted from the RAM card 18. In step S102, the sampling data stored in the RAM 23 is read. In step S103, of the sampling data read in step S102, data whose displacement amount is smaller than the data extracted in step S101 is deleted. In step S104, RA
The M23 and each sampling data stored in the RAM card 18 are combined.

As described above, in the processing of FIG.
The sampling accuracy is improved by searching for the data with the maximum displacement amount among the sampling data stored in and replacing the data collected before this data with the detailed data stored in the RAM card 18. I am trying.

The data reduction process of FIG. 7 is performed by the CPU 2
Reference numeral 1 denotes an internal process performed using the RAM 23. Before performing the process of FIG. 7, the CPU 21 reads the sampling data from the RAM card 18 and stores it in the RAM 23, and uses only the RAM 23 to access the RAM card 18. The processing of FIG. 7 is performed (without performing). The same applies to FIGS. 8 and 9 shown below.

FIG. 8 is a detailed flowchart showing a modification of the data reduction process. In step S111 of FIG.
The sampling data (data transmitted from the measuring device 10 during the test) stored in the RAM 23 is read.
In step S112, the sampling data read in step S111 is compared with the sampling data transmitted from the RAM card 18, and the respective sampling data are arranged in ascending order of the values or in the descending order of the values. In step S113, it is detected whether or not there is duplicated data in the sampling data arranged in step S112, and the duplicated data is deleted. In step S114, the processing result of step S113 is stored in the RAM 23 and the process returns. As a result, all the duplicated data in the RAM 23 are deleted and the memory capacity can be reduced.

FIG. 9 is a detailed flowchart showing another modification of the data reduction process. In step S121 of FIG. 9, the sampling data (data transmitted from the measuring device 10 during the test) stored in the RAM 23 is read. In step S122, it is detected whether, out of the sampling data read in step S121, data of the same sampling time exists in the RAM card 18, and if there is the same data, the data is stored in the RAM2.
Delete from 3. In step S123, the data stored in the RAM 23 and the data transmitted from the RAM card 18 are combined. In step S124, the processing result of step S123 is stored in the RAM 23 and the process returns.

2 to 9 described above are summarized, the data processing device 20 has three test condition items (sampling period, capacity of the RAM card 18, and Sampling data length) is set in advance, and the total number N of data to be sampled in a short sampling period Ts based on these test conditions.
Calculate d.

The measuring device 10 calculates the total number N of calculated data.
The test result is sampled at a short sampling period Ts until the value reaches d, and the result is stored in the RAM card 18. On the other hand, during the test, the result of sampling at the sampling period longer than the sampling period Ts is transmitted to the data processing device 20. When the number of data stored in the RAM card 18 reaches the total number Nd of data before the end of the test, the data is not stored in the RAM card 18 thereafter, and the data processing device 20 performs sampling at a cycle Td longer than the sampling cycle Ts. Transmit the sampling data to. The test is terminated when the sample breaks.

When the test is completed, the measuring device 10 is in the RAM.
The sampling data stored in the card 18 is transmitted to the data processing device 20, and the data processing device 20 is a RAM.
The sampling data from the card 18 and the sampling data stored in the RAM 23 are combined so as not to include overlapping data, and the combined result is stored in the RAM 23.
Then, the data processing device 20 performs data analysis using the synthetic data stored in the RAM 23.

As described above, according to this embodiment, the number of data that can be stored in the RAM card 18 is calculated in advance before the test is started, so that the RAM card 18 is less likely to be full before the test is completed. That is, the sampling period can be changed based on the calculated number of data, and the RA
You can prevent the M card from becoming full. Alternatively, the operator may be warned by displaying the calculated data number on the CRT 26 or the like. Further, according to the present embodiment, when the data is stored in the RAM card 18 by the number calculated in advance, sampling is stopped at the short sampling period Ts and RA is performed at the long sampling period Td.
Since the sampling data is stored in M23, the test can be continued for a relatively long time. On the other hand, when the test is completed, the data stored in the RAM card 18 and the data stored in the RAM 23 are combined to eliminate duplicate data, so that the memory capacity can be reduced.

In the above-described embodiment, when the sampling data is stored in the RAM card 18 by the number of data calculated in advance by the data processing device 20, the storage of the data in the RAM card 18 is stopped, but the RAM card 18 has some free space. When the number of data is calculated so that the capacity remains, and the sampling data is stored in the RAM card 18 by the calculated number of data, the sampling cycle may be lengthened and the sampled data may be stored in the free space of the RAM card 18. In this way, all the test data can be stored in the RAM card 18, and there is no need to combine with the data in the RAM 23 after the test is completed.

In the above embodiment, the measuring device 19 side has R
Although the example of storing the sampling data inside the AM card 18 has been described, it may be stored in the RAM 13. Also, R
When storing the sampling data in the AM card 18, a RAM card having a larger capacity can be used by using a memory management method such as bank switching.

In the embodiment constructed as described above, R
The AM card 18 stores C in the storage means and the first storage means.
The PU 21 corresponds to the total data calculation means, and the RAM 23 corresponds to the second storage means.

[0044]

As described in detail above, according to the present invention, the number of data to be stored in the storage means is pre-calculated before the test is started, and the number of the data is sampled at a predetermined sampling cycle and stored in the storage means. Since it is stored in the memory, there is less risk that the memory means will be full before the end of the test. That is, by changing the sampling cycle during the test based on the calculated number of data, it is possible to prevent the storage means from being full. According to the second aspect of the present invention, various data collected at a short sampling cycle is stored in the first storage means, various data collected at a long sampling cycle is stored in the second storage means, and these storage means are stored. Since the storage contents of are combined so as not to include duplicated data, the test result data can be stored with a small memory capacity.

[Brief description of drawings]

FIG. 1 is a block diagram showing a schematic configuration of a material testing machine of this embodiment.

FIG. 2 is a flowchart showing a test condition creation mode process performed by the CPU of the data processing device.

FIG. 3 is a flowchart showing a test mode process performed by the CPU of the data processing device.

FIG. 4 is a flowchart following FIG. 3;

FIG. 5 is a flowchart showing a test control process performed by the CPU of the measuring device.

FIG. 6 is a flowchart following FIG. 5;

7 is a detailed flowchart of the data reduction process of step S25 of FIG.

FIG. 8 is a detailed flowchart showing a modified example of the data reduction process.

FIG. 9 is a detailed flowchart showing a modified example of the data reduction process.

FIG. 10 is a diagram illustrating a sampling method in a conventional material machine tester system.

[Explanation of symbols]

 10 Measuring device 11,21 CPU 18 RAM card 20 Data processing device 23 RAM

Claims (2)

[Claims] 1. A measuring device and a data processing device are provided, and various data are collected at a predetermined sampling cycle on the measuring device side, and at the same time, the collected data is transmitted to the data processing device at predetermined time intervals. In the material testing machine,
Storage means provided on the measuring device side for storing various data collected at the predetermined sampling period; data length per sampling; storage capacity of the storage device;
And the total number of data calculating means for calculating the number of data stored in the storage means based on the length of the sampling cycle, and the measuring device is the data in which the number of data stored in the storage means is calculated. A material testing machine, which collects various data at the predetermined sampling cycle until the number of materials reaches a certain number. 2. A measuring device and a data processing device are provided, and various data are collected at a predetermined sampling period on the measuring device side, and at the same time, the collected data is transmitted to the data processing device at predetermined time intervals. In the material testing machine,
A first storage unit provided on the measuring device side for storing various data collected at a first sampling period; and a second sampling period provided on the data processing device side and longer than the first sampling period. A second storage unit that stores various kinds of collected data, wherein the data processing device combines the sampling data stored in the first and second storage units so as not to include duplicated data. Characteristic material testing machine.