JP2004212172A - Measuring instrument - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To efficiently perform the sampling of measurement data on a material test. <P>SOLUTION: Sampling is performed on load data and displacement data at low speeds and at high speeds on a testing machine body 100 side. Low-speed sampled data are transmitted to a data processor 200 at prescribed time intervals and stored in a RAM 203. High-speed sampled data are temporarily stored in a ring buffer 110. When an instruction to collect data is issued from an instruction button 111, from among data stored in the ring buffer 110, data of a prescribed time period before and the subsequent data are read out in order for a prescribed term and stored in a memory card 108. After testing is terminated, high-speed sampled data stored in the memory card 108 are transmitted to the data processor 200 and the data processor 200 synthesizes the low-speed and high-speed sampled data. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a measurement device represented by a material tester that performs data analysis after sampling measurement data at a predetermined sampling cycle.
[0002]
[Prior art]
There is known a material testing machine which performs a load-displacement characteristic test or the like on a testing machine main body and transmits the test data to a data processing device for data analysis (for example, Japanese Patent Publication No. 5-20690).
[0003]
In the material testing machine described in the above publication, the measurement data is sampled at a predetermined first sampling cycle and sequentially stored in the memory of the testing machine main body, and at the second sampling cycle slower than the first sampling cycle. The sampled measurement data is transmitted to the data processing device and stored. Then, after the test is completed, the data stored in the memory of the tester main body is transmitted to the data processing device, and two data having different sampling periods are combined to perform data analysis. In this way, while performing the test with the tester main body, the data processing device performs a rough data analysis in real time and displays it on the monitor, and the detailed data analysis can be performed after the test is completed.
[0004]
[Patent Document 1] Japanese Patent Publication No. 5-20690
[Problems to be solved by the invention]
In such a material testing machine, for example, when a tensile test is performed, since the load-displacement characteristics vary depending on the material of the sample, the data sampling conditions are determined in consideration of the material of the sample. For example, conditions are set such that sampling is performed at short time intervals during an important period, such as immediately after starting to apply a load or immediately before a sample breaks. However, depending on the material of the sample, it may be difficult to specify the important period in advance.
[0006]
The present invention provides a measuring device that can appropriately acquire sampling data such as material test data.
[0007]
[Means for Solving the Problems]
The present invention includes a measurement device main body and a data processing device, and performs various data collection at a predetermined sampling cycle on the measurement device main body side, and transmits the collected data to the data processing device at predetermined time intervals. It is applied to a measuring device and is configured as follows. That is, the measuring device is provided on the main body of the measuring device with instructing means for instructing the start of data collection in the high-speed sampling cycle, and temporarily stores data in the high-speed sampling cycle irrespective of the presence or absence of the data collecting instruction from the instructing means. Temporary storage means for temporarily storing, and when the data acquisition instruction is issued from the instruction means, the data stored in the temporary storage means is the data after the data before a predetermined time. A first storage means for sequentially reading and storing the data over a predetermined period; a second storage means provided on the data processing device side for storing data collected at a low sampling period transmitted from the measurement device main body; A synthesizing unit that is provided on the data processing device side and synthesizes the sampling data stored in the first and second storage units.
It is preferable to include a display unit for displaying the remaining capacity of the first storage unit. Further, when data acquisition is continuously instructed by the instruction means during measurement, the data sampling start time of the subsequent data is set so that the data sampled by the previous instruction and the data sampled by the subsequent instruction do not overlap. It is preferable to delay it.
[0008]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, an embodiment of a measuring device according to the present invention will be described with reference to FIGS. In the material testing machine of the present embodiment, data is sampled and analyzed as follows. The tester body constantly samples the measurement data at a high-speed sampling cycle and temporarily stores the measurement data in the ring buffer. Then, when the operator instructs the start of high-speed sampling data collection during the test, the data stored in the ring buffer is used as a starting point at a point in time preceding the instruction time by a predetermined time, and from the sampling point of the starting point data. The sequential data collected and temporarily stored for a predetermined time is transferred to a memory card as high-speed sampling data and stored. In parallel with the high-speed data sampling, the tester main body samples data even at a low-speed sampling period. This low-speed sampling data is transmitted to a data processing device provided separately from the tester main body. After the test, data analysis is performed by synthesizing the high-speed sampling data and the low-speed sampling data. Hereinafter, a material testing machine according to an embodiment will be described with reference to the drawings.
[0009]
FIG. 1 is a block diagram showing a schematic configuration of the material testing machine of the present embodiment. The material testing machine shown in the figure performs a tensile or compression test and the like, and comprises a testing machine main body 100 and a data processing device 200. The tester main body 100 and the data processing device 200 each include CPUs 101 and 201, ROMs 102 and 202, and RAMs 103 and 203. The tester main body 100 and the data processing device 200 include transmission interface circuits 104 and 204, respectively, and exchange data with each other via the transmission line L.
[0010]
The tester main body 100 includes a load cell 105 for measuring the load applied to the sample, a displacement meter 106 for measuring the deformation of the sample due to the load, and an A / D converter for converting the analog output of each of the measuring devices 105 and 106 into a digital signal. Device 107, a card reader 109 for controlling reading and writing of the memory card 108, a ring buffer 110 for storing the digital signal of the measurement result at a high sampling pitch, for example, 800 Hz, and data of the ring buffer 110 to the memory card 108. And an instruction button 111 for instructing the transfer. Measurement data that is traced back a predetermined time before the operation of the instruction button 111 is transferred from the ring buffer 110 to the memory card 108 and stored.
[0011]
On the other hand, the data processing device 200 includes a keyboard 205, a monitor 206, and a printer 207. The operator issues various commands from the data processing device 200 to the tester main body 100, Confirm the intermediate results of the test and the analysis results after the test. The data processing device 200 is generally composed of a personal computer and its peripheral devices.
[0012]
2 is a test condition creation mode process performed by the CPU 201 of the data processing device 200, FIGS. 3 and 4 are test mode processes performed by the CPU 201 of the data processing device 200, and FIGS. 5 and 6 are test control processes performed by the CPU 101 of the tester main body 100. The data processing based on the material test will be described below based on these flowcharts.
[0013]
When the operator operates the keyboard 205 of the data processing device 200 to select the test condition creation mode, the CPU 201 starts the processing in FIG. In step S1 of FIG. 2, normal test conditions, such as test contents and sample type, are set based on an operator's keyboard operation. In step S2, based on a keyboard operation by the operator, a sampling cycle for collecting test data, a period for collecting high-speed sampling data (ΔT1, ΔT2 described later), or a predetermined time (Δt1 described later) that goes back to data collection. , Δt2) and the like. In step S3, the various test conditions set in steps S1 and S2 are stored in the RAM 203 as a test condition file, and the process returns.
[0014]
On the other hand, when the operator selects the test mode using the keyboard 205, the CPU 201 starts the processing in FIG. In step S11 of FIG. 3, the test condition file stored in the RAM 203 is read. In step S12, mounting of the sample in the tester main body 100 is controlled. In step S13, general information and batch information relating to the test input by the operator via the keyboard 205 are fetched.
[0015]
In step S14, the test conditions and the like set in step S2 in FIG. 2 are displayed on the monitor 206, and a process of confirming whether or not to change these test conditions is performed. For example, when the operator inputs new test conditions via the keyboard 205, the contents of the RAM 203 are rewritten to change the test conditions.
[0016]
In step S15, data such as test condition data, a sampling cycle, or a high-speed sampling period is transmitted to the tester main body 100 via the transmission interface circuits 104 and 204.
[0017]
In step S16 in FIG. 4, a signal instructing the start of the test is transmitted to the tester main body 100 via the transmission interface circuits 104 and 204. In response to this signal, the tester main body 100 drives an actuator (not shown) to apply a load to the sample, and starts the test. In step S17, the sampling data transmitted from the tester main body 100 with a slow sampling cycle is received. In step S18, the received sampling data is stored in the RAM 203. In step S19, a graph during the test is displayed on the monitor 206 based on the received low-speed sampling data. In step S20, the load applied to the sample is changed by controlling the actuator of the tester main body 100.
[0018]
In step S21, it is determined whether the test has been completed. For example, in the case of a tensile test, if information indicating that the sample has been broken is transmitted from the tester main body 100, it is determined that the test has been completed. If the determination is negative, the process returns to step S17, and if the determination is positive, the process proceeds to step S22.
[0019]
In step S22, a signal instructing the end of the test is transmitted to the tester main body 100. In step S23, the tester main body 100 is instructed to transmit the sampling data stored in the memory card 108. In step S24, the high-speed sampling data transmitted from the tester main body 100 is received and stored in the RAM 203.
[0020]
In step S25, data synthesis processing is performed using the low-speed sampling data and high-speed sampling data stored in the RAM 203. In step S26, various data analysis and data processing, for example, displaying test data on the monitor 206 and displaying a graph showing the test data on the printer 27, and then returning.
[0021]
On the other hand, when the operator turns on the power of the tester main body 100, the CPU 101 inside the tester main body 100 performs the test control processing of FIGS. In step S51 of FIG. 5, it is determined whether the test condition transmitted from the data processing device 200 has been received. If the determination is negative, the process remains at step S51, and if the determination is positive, the process proceeds to step S52. In step S52, it is determined whether or not a signal transmitted from the data processing device 200 and indicating a start of a test has been received. If the determination is negative, the process remains at step S52, and if the determination is positive, the process proceeds to step S53.
[0022]
In step S53, a test is started by driving an actuator (not shown) to apply a load to the sample. In step S54, it is determined whether the time Ts has elapsed from the start of the test or from the immediately preceding sampling time. The time Ts corresponds to a high-speed sampling period. If step S54 is denied, the process remains at step S54, and if affirmative, the process proceeds to step S55. In step S55, the load data and the displacement data as the measurement data are sampled and stored in the ring buffer 110. In step S56, it is determined whether or not the instruction button 111 has been operated. If it has not been operated, the process proceeds to step S57, and if it has been operated, the process proceeds to step S58. In step S58, starting from the data stored in the ring buffer 110 a predetermined time before the time when the instruction button 111 is operated, the subsequent data is transferred to the memory card 108 as high-speed sampling data and stored.
[0023]
In step S57, it is determined whether or not a predetermined time Td, for example, 50 ms, has elapsed since the previous transmission of the low-speed sampling data to the data processing device 200. The predetermined time Td is a time corresponding to the low-speed sampling cycle. If the determination in step S57 is negative, the process returns to step S54, and if the determination is positive, the process proceeds to step S59. In step S59, the data is sampled and stored in the transmission buffer. Then, in the next step S60, the low-speed sampling data is transmitted to the data processing device 200 via the transmission interface 104.
[0024]
By executing steps S54 to S59 in this manner, high-speed sampling data and low-speed sampling data are collected. That is, the test data is sampled every sampling time Ts, and the high-speed sampled data is temporarily stored in the ring buffer 110. When the instruction button 111 is operated, high-speed sampling data subsequent to the data stored in the ring buffer 110 a predetermined time before the time of the operation is transferred to the memory card 108 and stored. The sampling time Ts is, for example, 5 ms. The low-speed sampling data sampled at the sampling period Td longer than the high-speed sampling period Ts is transmitted to the processing device 200.
[0025]
In step S61, it is determined whether the test has been completed. For example, in the case of a tensile or compression test, when the sample breaks, it is determined that the test is completed. If the determination is negative, the process returns to step S54, and if the determination is positive, the process proceeds to step S62. In step S62, a signal notifying the end of the test is transmitted to the data processing device 200, and the process returns.
[0026]
As described above, the tester main body 100 samples the measurement data at the short sampling period Ts and stores it in the ring buffer 110. When the instruction button 111 is operated, data subsequent to the data stored in the ring buffer 110 a predetermined time before that point is transferred to the memory card 108 and stored. On the other hand, during the test, the measurement data sampled at the sampling period Td longer than the sampling period Ts is transmitted to the data processing device 200 and stored in the RAM 203. The test is terminated when the sample breaks.
[0027]
When the test is completed, the tester main body 100 transmits the high-speed sampling data stored in the memory card 108 to the data processing device 200, and the data processing device 200 stores the high-speed sampling data from the memory card 108 and the RAM 203. The low-speed sampling data is synthesized, and the synthesis result is stored in the RAM 203. Then, the data processing device 200 performs data analysis using the synthesized data stored in the RAM 203 and displays the data on the monitor 206.
[0028]
Note that the sampling period Td transmitted to the data processing device 200 is preferably an integral multiple of the sampling period Ts stored in the memory card 108. By using an integral multiple, the sampling data transmitted to the data processing device 200 can be easily replaced with the sampling data stored in the memory card 108 after the test is completed.
[0029]
The operation timing of the instruction button 111 and the data sampling period will be described with reference to FIG. When the test is started at time t0, load data and displacement data are collected at a high-speed sampling period, as indicated by black circles. These data are temporarily stored in a ring buffer 110 which is a temporary storage memory. On the other hand, as indicated by white circles, load data and displacement data are collected at a low sampling rate. These data are transmitted to the data processing device 200. When the instruction button 111 is operated at the time point t2, the data sampled at the time point t1 and stored in the ring buffer 110 by the time Δt1 is used as a starting point, and thereafter, the data sampled at high speed during a period ΔT1 up to a time point t3. Is transferred from the ring buffer 110 to the memory card 108.
[0030]
A load-displacement graph in which white circles in FIG. 7 are plotted is displayed on the monitor 206. When the operator operates the instruction button 111 while looking at the monitor 206, the high-speed sampling data within a period of a predetermined time period from the point of the instruction is stored in the memory card 108, and after the test is completed, the high-speed sampling data is used for data analysis. use. Therefore, it is not necessary to determine a high-speed sampling period in advance, and even a skilled operator can collect desired measurement data and analyze the data.
[0031]
The instruction of the data collection period by the instruction button 111 may be performed a plurality of times during the test. For example, in FIG. 7, when the instruction button 111 is operated again at the time t22, the data is sampled at the time t21 and stored in the ring buffer 110 at the time t21 before the time t23. The sampled data is transferred from the ring buffer 110 to the memory card 108. Δt1, Δt2, ΔT1, and ΔT2 can be arbitrarily set by the operator.
[0032]
Instead of the periods ΔT1 and ΔT2 in which the data is collected in the high-speed sampling cycle, the period in which the data is collected in the high-speed sampling cycle may be defined by the amount of load fluctuation and the amount of displacement fluctuation from the time points t1 and t21. If the next data sample is instructed by operating the instruction button 111 before the end of the data sample by the previous data sample instruction, the next high-speed data sampling start time is delayed so that the high-speed sampling data does not overlap. Is preferred.
[0033]
Furthermore, when the remaining memory capacity of the memory card 108 is low or low, when the instruction button 111 is operated, it is operated that the remaining capacity of the memory card 108 is insufficient or that high-speed data sampling cannot be performed. It is preferable to notify the person. The remaining capacity of the memory card 108 may be displayed as a bar graph on the monitor 206.
[0034]
In the above-described embodiment, an example has been described in which the sampling data collected at a high-speed sampling period is stored in the memory card 108 of the tester main body 100. However, the sampling data may be stored in the RAM 103.
[0035]
In the above, the material testing machine for performing the tension / compression test has been described. The present invention can be applied to various material testing machines such as a peeling test and a full-scale test, and can also be applied to other various measuring devices.
[0036]
In the embodiment described above, the first storage unit is realized by the memory card 108, the temporary storage unit is realized by the ring buffer 110, and the second storage unit is realized by the RAM 203. However, these are only examples, and can be realized by other elements. That is, the present invention is not at all limited to the above-described embodiment as long as the configuration can achieve the characteristic functions of the present invention.
[0037]
【The invention's effect】
According to the present invention, the data sampled in a period that is a predetermined time earlier than the high-speed sampling data sampling instruction time and the data thereafter can be used as high-speed sampling data, so it is necessary to determine the start timing of high-speed sampling in advance. There is no. As a result, desired measurement data can be collected and analyzed even by an unskilled operator.
[Brief description of the drawings]
FIG. 1 is a block diagram illustrating a schematic configuration of a material testing machine according to an embodiment.
FIG. 2 is a flowchart illustrating test condition creation mode processing performed by a CPU of the data processing apparatus.
FIG. 3 is a flowchart showing a test mode process performed by a CPU of the data processing device.
FIG. 4 is a flowchart following FIG. 3;
FIG. 5 is a flowchart illustrating a test control process performed by a CPU of the measuring apparatus main body.
FIG. 6 is a flowchart following FIG. 5;
FIG. 7 is a diagram illustrating a sampling method in a material testing machine.
[Explanation of symbols]
100: Test machine main body 101, 201: CPU
108: Memory card 110: Ring buffer 111: Instruction button 200: Data processing device 203: RAM

Claims (3)

A measuring device comprising a measuring device main body and a data processing device, wherein the measuring device main body collects various data at a predetermined sampling cycle and simultaneously transmits the collected data to the data processing device at predetermined time intervals. ,
Instruction means for instructing the start of data collection in a high-speed sampling cycle;
Temporary storage means provided on the measuring device main body side and temporarily storing data at the high-speed sampling period, regardless of the presence or absence of a data collection instruction from the instruction means,
When the data acquisition instruction is issued from the instruction means provided on the measurement device main body side, the data stored in the temporary storage means is sequentially read out from the data after a predetermined time before the data over a predetermined period of time. First storage means for storing
A second storage unit that is provided on the data processing device side and stores data collected at a low sampling period transmitted from the measurement device main body;
A measuring device, provided on the data processing device side, for synthesizing the sampling data stored in the first and second storage devices. The measuring device according to claim 1,
A measuring device comprising a display unit for displaying a remaining capacity of the first storage unit. In the measuring device according to claim 1 or 2,
When data acquisition is continuously instructed by the instruction means during measurement, the later data sampling start time is delayed so that the data sampled by the earlier instruction and the data sampled by the later instruction do not overlap. A measuring device characterized by the above-mentioned.

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